1N5266B

1N5223B thru 1N5271B Zener Diode, 1/2 Watt 5% Tolerance Features: D Zener Voltage 2.7 to 100V D DO35 Package Absolute Maximum Ratings: (TA = +25C unless otherwise specified) Operating Junction Temperature Range, Topr . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65 to +200C Storage Temperature Range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65 to +200C DC Power Dissipation, PD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500mW Derate Above 75C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.0mW/C Forward Voltage (IF = 200mA), VF . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.1V Electrical Characteristics: (TC = +25C, unless otherwise specified) Maximum Dynamic Impedance (Note 3) Zener Test Current (Izt) Zzt @ Izt Zzk @ 0.25mA (Izk) Volts mA Ohms Ohms A Volts 1N5223B 2.7 20 30 1300 75 1.0 −0.080 1N5225B 3.0 20 29 1600 50 1.0 −0.075 1N5226B 3.3 20 28 1600 25 1.0 −0.070 1N5227B 3.6 20 24 1700 15 1.0 −0.065 1N5228B 3.9 20 23 1900 10 1.0 −0.060 1N5229B 4.3 20 22 2000 5 1.0 0.055 1N5230B 4.7 20 19 1900 5 2.0 0.030 Device Number Maximum Leakage Current IR @ VR Typical Temperature Coefficient (Note 2) vz Nominal Zener Voltage Vz @ Izt (Note 1) %/C Note 1. Nominal zener voltage is measured with the device junction in thermal equilibrium at the lead temperature of 30C +1C and 3/8” lead length. Note 2. Test conditions for temperature coefficient are as follows: a.Izt = 7.5mA, T1 = +25C, T2 = +125C (1N5223B thru 1N5242B) b.Izt = Rated Izt, T1 = +25C, T2 = +125C (1N5243B thru 1N5271B) Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temperature. Note 3. ZZT an ZZK are measured by dividing the AC voltage drop across the device by the AC current applied. The specific limits are for IZ(AC) = 0.1 IZ(DC) with the AC frequency = 60Hz. Electrical Characteristics (Cont’d): (TC = +25C, unless otherwise specified) Maximum Dynamic Impedance (Note 3) Zener Test Current (Izt) Zzt @ Izt Zzk @ 0.25mA (Izk) Volts mA Ohms Ohms A 1N5231B 5.1 20 17 1600 5 2.0 0.030 1N5232B 5.6 20 11 1600 5 3.0 +0.038 1N5233B 6.0 20 7 1600 5 3.5 +0.038 1N5234B 6.2 20 7 1000 5 4.0 0.045 1N5235B 6.8 20 5 750 3 5.0 0.050 1N5236B 7.5 20 6 500 3 6.0 0.058 1N5237B 8.2 20 8 500 3 6.5 0.062 1B5238B 8.7 20 8 600 3 6.5 0.065 1N5239B 9.1 20 10 600 3 7.0 0.068 Device Numbe Maximum Leakage Current IR @ VR Typical Temperature Coefficient (Note 2) vz Nominal Zener Voltage Vz @ Izt (Note 1) Volts %/C 1N5240B 10 20 17 600 3 8.0 0.075 1N5241B 11 20 22 600 2 8.4 0.076 1N5242B 12 20 30 600 1 9.1 0.077 1N5243B 13 9.5 13 600 0.5 9.9 0.079 1N5244B 14 9.0 15 600 0.1 10 0.082 1N5245B 15 8.5 16 600 0.1 11 0.082 1N5246B 16 7.8 17 600 0.1 12 0.083 1N5247B 17 7.4 19 600 0.1 13 0.084 1N5248B 18 7.0 21 600 0.1 14 0.085 1N5249B 19 6.6 23 600 0.1 14 0.086 1N5250B 20 6.2 25 600 0.1 15 0.086 1N5251B 22 5.6 29 600 0.1 17 0.087 1N5252B 24 5.2 33 600 0.1 18 0.088 1N5253B 25 5.0 35 600 0.1 19 0.089 Note 1. Nominal zener voltage is measured with the device junction in thermal equilibrium at the lead temperature of 30C +1C and 3/8” lead length. Note 2. Test conditions for temperature coefficient are as follows: a.Izt = 7.5mA, T1 = +25C, T2 = +125C (1N5223B thru 1N5242B) b.Izt = Rated Izt, T1 = +25C, T2 = +125C (1N5243B thru 1N5271B) Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temperature. Note 3. ZZT an ZZK are measured by dividing the AC voltage drop across the device by the AC current applied. The specific limits are for IZ(AC) = 0.1 IZ(DC) with the AC frequency = 60Hz. Electrical Characteristics (Cont’d): (TC = +25C, unless otherwise specified) Maximum Dynamic Impedance (Note 3) Zener Test Current (Izt) Zzt @ Izt Zzk @ 0.25mA (Izk) Volts mA Ohms Ohms A Volts 1N5254B 27 4.6 41 600 0.1 21 0.090 1N5255B 28 4.5 44 600 0.1 21 0.091 1N5256B 30 4.2 49 600 0.1 23 0.091 1N5257B 33 3.8 58 700 0.1 25 0.092 1N5258B 36 3.4 70 700 0.1 27 0.093 1N5259B 39 3.2 80 800 0.1 30 0.094 1N5260B 43 3.0 93 900 0.1 33 0.095 1N5261B 47 2.7 105 1000 0.1 36 0.095 1N5262B 51 2.5 125 1100 0.1 39 0.096 1N5263B 56 2.2 150 1300 0.1 43 0.096 1N5266B 68 1.8 230 1600 0.1 52 0.097 1N5267B 75 1.7 270 1700 0.1 56 0.098 1N5270B 91 1.4 400 2300 0.1 69 0.099 1N5271B 100 1.3 500 2600 0.1 76 0.110 Device Numbe Maximum Leakage Current IR @ VR Typical Temperature Coefficient (Note 2) vz Nominal Zener Voltage Vz @ Izt (Note 1) %/C Note 1. Nominal zener voltage is measured with the device junction in thermal equilibrium at the lead temperature of 30C +1C and 3/8” lead length. Note 2. Test conditions for temperature coefficient are as follows: a.Izt = 7.5mA, T1 = +25C, T2 = +125C (1N5223B thru 1N5242B) b.Izt = Rated Izt, T1 = +25C, T2 = +125C (1N5243B thru 1N5271B) Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temperature. Note 3. ZZT an ZZK are measured by dividing the AC voltage drop across the device by the AC current applied. The specific limits are for IZ(AC) = 0.1 IZ(DC) with the AC frequency = 60Hz. 1.000 (25.4) Min .200 (5.08) Max .022 (.509) Dia Max Color Band Denotes Cathode .090 (2.28) Dia Max