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74AHC574PW

74AHC574PW

  • 厂商:

    NXP(恩智浦)

  • 封装:

  • 描述:

    74AHC574PW - Octal D-type flip-flop; positive edge-trigger; 3-state - NXP Semiconductors

  • 数据手册
  • 价格&库存
74AHC574PW 数据手册
74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state Rev. 02 — 24 January 2008 Product data sheet 1. General description The 74AHC574; 74AHCT574 are high-speed Si-gate CMOS devices and are pin compatible with Low Power Schottky TTL (LSTTL). They are specified in compliance with JEDEC standard no. 7A. The 74AHC574; 74AHCT574 are octal D-type flip-flops featuring separate D-type inputs for each flip-flop and 3-state outputs for bus oriented applications. A clock (CP) and an output enable (OE) input are common to all flip-flops. The 8 flip-flops will store the state of their individual D-inputs that meet the set-up and hold times requirements on the LOW-to-HIGH CP transition. When OE is LOW the contents of the 8 flip-flops are available at the outputs. When OE is HIGH, the outputs go to the high-impedance OFF-state. Operation of the OE input does not affect the state of the flip-flops. The 74AHC574; 74AHCT574 is functionally identical to the 74AHC564; 74AHCT564, but has non-inverting outputs. The 74AHC574; 74AHCT574 is functionally identical to the 74AHC374; 74AHCT374, but has a different pinning. 2. Features I I I I I I I I I Balanced propagation delays All inputs have a Schmitt-trigger action 3-state non-inverting outputs for bus orientated applications 8-bit positive, edge-triggered register Independent register and 3-state buffer operation Common 3-state output enable input For 74AHC574 only: operates with CMOS input levels For 74AHCT574 only: operates with TTL input levels ESD protection: N HBM JESD22-A114E exceeds 2000 V N MM JESD22-A115-A exceeds 200 V N CDM JESD22-C101C exceeds 1000 V I Multiple package options I Specified from −40 °C to +85 °C and from −40 °C to +125 °C NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state 3. Ordering information Table 1. Ordering information Package Temperature range 74AHC574D 74AHCT574D 74AHC574PW 74AHCT574PW 74AHC574BQ 74AHCT574BQ −40 °C to +125 °C DHVQFN20 −40 °C to +125 °C TSSOP20 −40 °C to +125 °C Name SO20 Description plastic small outline package; 20 leads; body width 7.5 mm plastic thin shrink small outline package; 20 leads; body width 4.4 mm Version SOT163-1 SOT360-1 Type number plastic dual in-line compatible thermal enhanced SOT764-1 very thin quad flat package; no leads; 20 terminals; body 2.5 × 4.5 × 0.85 mm 4. Functional diagram 2 3 4 5 6 7 8 9 D0 D1 D2 D3 D4 D5 D6 D7 FF1 to FF8 3-STATE OUTPUTS Q0 19 Q1 18 Q2 17 Q3 16 Q4 15 Q5 14 Q6 13 Q7 12 11 CP 1 OE mna800 Fig 1. Functional diagram D0 D1 D2 D3 D4 D5 D6 D7 D CP Q D CP Q D CP Q D CP Q D CP Q D CP Q D CP Q D CP Q FF1 CP FF2 FF3 FF4 FF5 FF6 FF7 FF8 OE Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7 001aah077 Fig 2. Logic diagram © NXP B.V. 2008. All rights reserved. 74AHC_AHCT574_2 Product data sheet Rev. 02 — 24 January 2008 2 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state 11 1 11 2 3 4 5 6 7 8 9 CP D0 D1 D2 D3 D4 D5 D6 D7 OE 1 mna798 C1 EN 2 Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7 19 18 17 16 15 14 13 12 8 9 3 4 5 6 7 1D 19 18 17 16 15 14 13 12 mna446 Fig 3. Logic symbol Fig 4. IEC logic symbol 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 3 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state 5. Pinning information 5.1 Pinning 74AHC574 74AHCT574 terminal 1 index area 20 VCC 19 Q0 18 Q1 17 Q2 16 Q3 15 Q4 14 Q5 GND(1) GND 10 CP 11 13 Q6 12 Q7 OE 2 3 4 5 6 7 8 9 1 D0 D1 OE D0 D1 D2 D3 D4 D5 D6 D7 1 2 3 4 5 6 7 8 9 20 VCC 19 Q0 18 Q1 17 Q2 16 Q3 15 Q4 14 Q5 13 Q6 12 Q7 11 CP 001aah037 74AHC574 74AHCT574 D2 D3 D4 D5 D6 D7 GND 10 001aah666 Transparent top view (1) The die substrate is attached to this pad using conductive die attach material. It can not be used as a supply pin or input. Fig 5. Pin configuration SO20, TSSOP20 Fig 6. Pin configuration DHVQFN20 5.2 Pin description Table 2. Symbol OE D[0:7] GND CP Q[0:7] VCC Pin description Pin 1 2, 3, 4, 5, 6, 7, 8, 9 10 11 20 Description 3-state output enable input (active LOW) data input ground (0 V) clock input (LOW-to-HIGH, edge triggered) supply voltage 19, 18, 17, 16, 15, 14, 13, 12 3-state flip-flop output 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 4 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state 6. Functional description Table 3. Function table[1] Input OE Load and read register Load register and disable output L L H H [1] Operating mode CP ↑ ↑ ↑ ↑ Dn l h l h Internal flip-flop L H L H Output Qn L H Z Z H = HIGH voltage level; h = HIGH voltage level one setup time prior to the HIGH-to-LOW CP transition; L = LOW voltage level; l = LOW voltage level one setup time prior to the HIGH-to-LOW CP transition; Z = high-impedance OFF-state; ↑ = LOW-to-HIGH clock transition. 7. Limiting values Table 4. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to GND (ground = 0 V). Symbol VCC VI IIK IOK IO ICC IGND Tstg Ptot Parameter supply voltage input voltage input clamping current output clamping current output current supply current ground current storage temperature total power dissipation SO20 package TSSOP20 package DHVQFN20 package [1] [2] [3] [4] Conditions Min −0.5 −0.5 Max +7.0 +7.0 ±20 ±25 75 +150 500 500 500 Unit V V mA mA mA mA mA °C mW mW mW VI < −0.5 V VO < −0.5 V or VO > VCC + 0.5 V VO = −0.5 V to (VCC + 0.5 V) [1] [1] −20 −75 −65 Tamb = −40 °C to +125 °C [2] [3] [4] - The input and output voltage ratings may be exceeded if the input and output current ratings are observed. Ptot derates linearly with 8 mW/K above 70 °C. Ptot derates linearly with 5.5 mW/K above 60 °C. Ptot derates linearly with 4.5 mW/K above 60 °C. 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 5 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state 8. Recommended operating conditions Table 5. Recommended operating conditions Voltages are referenced to GND (ground = 0 V). Symbol Parameter VCC VI VO Tamb ∆t/∆V supply voltage input voltage output voltage ambient temperature input transition rise and fall rate VCC = 3.3 V ± 0.3 V VCC = 5.0 V ± 0.5 V Conditions Min 2.0 0 0 −40 74AHC574 Typ 5.0 +25 Max 5.5 5.5 VCC +125 100 20 Min 4.5 0 0 −40 74AHCT574 Typ 5.0 +25 Max 5.5 5.5 VCC +125 20 V V V °C ns/V ns/V Unit 9. Static characteristics Table 6. Static characteristics Voltages are referenced to GND (ground = 0 V). Symbol Parameter For type 74AHC574 VIH HIGH-level input voltage VCC = 2.0 V VCC = 3.0 V VCC = 5.5 V VIL LOW-level input voltage VCC = 2.0 V VCC = 3.0 V VCC = 5.5 V VOH HIGH-level VI = VIH or VIL output voltage IO = −50 µA; VCC = 2.0 V IO = −50 µA; VCC = 3.0 V IO = −50 µA; VCC = 4.5 V IO = −4.0 mA; VCC = 3.0 V IO = −8.0 mA; VCC = 4.5 V VOL LOW-level VI = VIH or VIL output voltage IO = 50 µA; VCC = 2.0 V IO = 50 µA; VCC = 3.0 V IO = 50 µA; VCC = 4.5 V IO = 4.0 mA; VCC = 3.0 V IO = 8.0 mA; VCC = 4.5 V IOZ OFF-state VI = VIH or VIL; output current VO = VCC or GND; VCC = 5.5 V input leakage current VI = 5.5 V or GND; VCC = 0 V to 5.5 V 1.5 2.1 3.85 1.9 2.9 4.4 2.58 3.94 2.0 3.0 4.5 0 0 0 0.5 0.9 1.65 0.1 0.1 0.1 0.36 0.36 ±0.25 1.5 2.1 3.85 1.9 2.9 4.4 2.48 3.8 0.5 0.9 1.65 0.1 0.1 0.1 0.44 0.44 ±2.5 1.5 2.1 3.85 1.9 2.9 4.4 2.40 3.70 0.5 0.9 1.65 0.1 0.1 0.1 0.55 0.55 ±10.0 V V V V V V V V V V V V V V V V µA Conditions Min 25 °C Typ Max −40 °C to +85 °C −40 °C to +125 °C Unit Min Max Min Max II ICC - - 0.1 4.0 - 1.0 40 - 2.0 80 µA µA supply current VI = VCC or GND; IO = 0 A; VCC = 5.5 V 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 6 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state Table 6. Static characteristics …continued Voltages are referenced to GND (ground = 0 V). Symbol Parameter CI CO input capacitance output capacitance HIGH-level input voltage LOW-level input voltage VCC = 4.5 V to 5.5 V VCC = 4.5 V to 5.5 V Conditions Min 25 °C Typ 3.0 4.0 Max 10 −40 °C to +85 °C −40 °C to +125 °C Unit Min Max 10 Min Max 10 pF pF For type 74AHCT574 VIH VIL VOH 2.0 0.8 2.0 0.8 2.0 0.8 V V HIGH-level VI = VIH or VIL; VCC = 4.5 V output voltage IO = −50 µA IO = −8.0 mA LOW-level VI = VIH or VIL; VCC = 4.5 V output voltage IO = 50 µA IO = 8.0 mA OFF-state per input pin; VI = VIH or VIL; output current VCC = 5.5 V; IO = 0 A; VO = VCC or GND; other pins at VCC or GND input leakage current VI = 5.5 V or GND; VCC = 0 V to 5.5 V 4.4 3.94 - 4.5 0 - 0.1 0.36 ±0.25 4.4 3.8 - 0.1 0.44 ±2.5 4.4 3.70 - 0.1 0.55 ±10.0 V V V V µA VOL IOZ II ICC ∆ICC - - 0.1 4.0 1.35 - 1.0 40 1.5 - 2.0 80 1.5 µA µA mA supply current VI = VCC or GND; IO = 0 A; VCC = 5.5 V additional per input pin; supply current VI = VCC − 2.1 V; IO = 0 A; other pins at VCC or GND; VCC = 4.5 V to 5.5 V input capacitance output capacitance CI CO - 3 4.0 10 - - 10 - - 10 - pF pF 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 7 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state 10. Dynamic characteristics Table 7. Dynamic characteristics GND = 0 V. For test circuit see Figure 10. Symbol Parameter For type 74AHC574 tpd propagation delay CP to Qn; see Figure 7 VCC = 3.0 V to 3.6 V CL = 15 pF CL = 50 pF VCC = 4.5 V to 5.5 V CL = 15 pF CL = 50 pF ten enable time OE to Qn; see Figure 9 VCC = 3.0 V to 3.6 V CL = 15 pF CL = 50 pF VCC = 4.5 V to 5.5 V CL = 15 pF CL = 50 pF tdis disable time OE to Qn; see Figure 9 VCC = 3.0 V to 3.6 V CL = 15 pF CL = 50 pF VCC = 4.5 V to 5.5 V CL = 15 pF CL = 50 pF fmax maximum frequency CP; see Figure 7 VCC = 3.0 V to 3.6 V CL = 15 pF CL = 50 pF VCC = 4.5 V to 5.5 V CL = 15 pF CL = 50 pF tW pulse width CP; HIGH or LOW; see Figure 7 VCC = 3.0 V to 3.6 V; CL = 50 pF VCC = 4.5 V to 5.5 V; CL = 50 pF 5.0 5.0 5.0 5.0 5.0 5.0 ns ns 130 85 180 115 110 75 110 75 MHz MHz 80 50 125 75 65 45 65 45 MHz MHz 4.3 6.9 9.0 10.1 1.0 1.0 10.5 11.5 1.0 1.0 11.5 13.0 ns ns 6.3 9.1 13.0 15.0 1.0 1.0 15.0 17.0 1.0 1.0 16.5 19.0 ns ns [2] [1] [2] Conditions Min 25 °C Typ[1] Max −40 °C to +85 °C −40 °C to +125 °C Unit Min Max Min Max - 6.5 9.3 4.4 6.2 13.2 16.7 8.6 10.6 1.0 1.0 1.0 1.0 15.5 19.0 10.0 12.0 1.0 1.0 1.0 1.0 16.5 21.0 11.0 13.5 ns ns ns ns - 5.7 8.2 4.2 5.9 12.8 16.3 9.0 11.0 1.0 1.0 1.0 1.0 15.0 18.5 10.5 12.5 1.0 1.0 1.0 1.0 16.0 20.5 11.5 14.0 ns ns ns ns 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 8 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state Table 7. Dynamic characteristics …continued GND = 0 V. For test circuit see Figure 10. Symbol Parameter tsu set-up time Conditions Min Dn to CP; see Figure 8 VCC = 3.0 V to 3.6 V; CL = 50 pF VCC = 4.5 V to 5.5 V; CL = 50 pF th hold time Dn to CP; see Figure 8 VCC = 3.0 V to 3.6 V; CL = 50 pF VCC = 4.5 V to 5.5 V; CL = 50 pF CPD CL = 50 pF; fi = 1 MHz; power dissipation VI = GND to VCC capacitance propagation delay CP to Qn; see Figure 7 VCC = 4.5 V to 5.5 V CL = 15 pF CL = 50 pF ten enable time OE to Qn; see Figure 9 VCC = 4.5 V to 5.5 V CL = 15 pF CL = 50 pF tdis disable time OE to Qn; see Figure 9 VCC = 4.5 V to 5.5 V CL = 15 pF CL = 50 pF fmax maximum frequency CP; see Figure 7 VCC = 4.5 V to 5.5 V CL = 15 pF CL = 50 pF tW pulse width CP; HIGH or LOW; see Figure 7 VCC = 4.5 V to 5.5 V; CL = 50 pF tsu set-up time Dn to CP; see Figure 8 VCC = 4.5 V to 5.5 V; CL = 50 pF 3.0 3.5 3.5 ns 5.0 5.5 5.5 ns 130 85 180 115 110 75 110 75 MHz MHz 4.3 6.2 9.0 10.1 1.0 1.0 10.5 11.5 1.0 1.0 11.5 13.0 ns ns [2] [3] 25 °C Typ[1] Max - −40 °C to +85 °C −40 °C to +125 °C Unit Min 3.5 3.0 Max Min 3.5 3.0 Max ns ns 3.5 3.0 1.5 1.5 - 10 - 1.5 1.5 - - 1.5 1.5 - - ns ns pF For type 74AHCT574 tpd [2] - 4.4 6.3 8.6 10.6 1.0 1.0 10.0 12.0 1.0 1.0 11.0 13.5 ns ns - 4.3 6.1 9.0 11.0 1.0 1.0 10.5 12.5 1.0 1.0 11.5 14.0 ns ns 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 9 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state Table 7. Dynamic characteristics …continued GND = 0 V. For test circuit see Figure 10. Symbol Parameter th hold time Conditions Min Dn to CP; see Figure 8 VCC = 4.5 V to 5.5 V; CL = 50 pF CPD power per buffer; dissipation CL = 50 pF; f = 1 MHz; capacitance VI = GND to VCC [3] 25 °C Typ[1] 12 Max - −40 °C to +85 °C −40 °C to +125 °C Unit Min 1.5 Max Min 1.5 Max ns pF 1.5 - [1] [2] Typical values are measured at nominal supply voltage (VCC = 3.3 V and VCC = 5.0 V). tpd is the same as tPLH and tPHL. ten is the same as tPZL and tPZH. tdis is the same as tPLZ and tPHZ. CPD is used to determine the dynamic power dissipation PD (µW). PD = CPD × VCC2 × fi + ∑ (CL × VCC2 × fo) where: fi = input frequency in MHz; fo = output frequency in MHz; CL = output load capacitance in pF; VCC = supply voltage in V. [3] 10.1 Waveforms 1/fmax VI CP input GND tW t PHL VOH Qn output VOL VM mna802 VM t PLH Measurement points are given in Table 8. VOL and VOH are typical voltage output levels that occur with the output load. Fig 7. Propagation delay input (CP) to output (Qn), clock input (CP) pulse width and the maximum frequency (CP) 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 10 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state VI CP input GND t su th VI Dn input GND VM t su th VM VOH Qn output VOL mna803 VM Measurement points are given in Table 8. VOL and VOH are typical voltage output levels that occur with the output load. The shaded areas indicate when the input is permitted to change for predicable output performance. Fig 8. The data input (D) to clock input (CP) set-up times and clock input (CP) to data input (D) hold times VI OE input GND tPLZ VCC Qn output LOW-to-OFF OFF-to-LOW VOL tPHZ VOH Qn output HIGH-to-OFF OFF-to-HIGH GND outputs enabled VY VM VM VX tPZH tPZL VM outputs disabled outputs enabled 001aah078 Measurement points are given in Table 8. VOL and VOH are typical voltage output levels that occur with the output load. Fig 9. Table 8. Type Enable and disable times Measurement points Input VM 0.5VCC 1.5 V Output VM 0.5VCC 0.5VCC VX VOL + 0.3 V VOL + 0.3 V VY VOH − 0.3 V VOH − 0.3 V 74AHC574 74AHCT574 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 11 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state VI negative pulse 0V tW 90 % VM 10 % tf tr tr tf 90 % VM 10 % tW VM VM VI positive pulse 0V VCC VCC PULSE GENERATOR VI VO RL S1 DUT RT CL open 001aad983 Test data is given in Table 9. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch. Fig 10. Load circuitry for switching times Table 9. Type 74AHC574 74AHCT574 Test data Input VI VCC 3.0 V tr, tf 3.0 ns 3.0 ns Load CL 15 pF, 50 pF 15 pF, 50 pF RL 1 kΩ 1 kΩ S1 position tPHL, tPLH open open tPZH, tPHZ GND GND tPZL, tPLZ VCC VCC 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 12 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state 11. Package outline SO20: plastic small outline package; 20 leads; body width 7.5 mm SOT163-1 D E A X c y HE vMA Z 20 11 Q A2 A1 pin 1 index Lp L 1 e bp 10 wM detail X (A 3) θ A 0 5 scale 10 mm DIMENSIONS (inch dimensions are derived from the original mm dimensions) UNIT mm inches A max. 2.65 0.1 A1 0.3 0.1 A2 2.45 2.25 A3 0.25 0.01 bp 0.49 0.36 c 0.32 0.23 D (1) 13.0 12.6 0.51 0.49 E (1) 7.6 7.4 0.30 0.29 e 1.27 0.05 HE 10.65 10.00 L 1.4 Lp 1.1 0.4 Q 1.1 1.0 0.043 0.039 v 0.25 0.01 w 0.25 0.01 y 0.1 Z (1) θ 0.9 0.4 0.012 0.096 0.004 0.089 0.019 0.013 0.014 0.009 0.419 0.043 0.055 0.394 0.016 0.035 0.004 0.016 8 o 0 o Note 1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included. OUTLINE VERSION SOT163-1 REFERENCES IEC 075E04 JEDEC MS-013 JEITA EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-19 Fig 11. Package outline SOT163-1 (SO20) 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 13 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state TSSOP20: plastic thin shrink small outline package; 20 leads; body width 4.4 mm SOT360-1 D E A X c y HE vMA Z 20 11 Q A2 pin 1 index A1 (A 3) A θ Lp L 1 e bp 10 wM detail X 0 2.5 scale 5 mm DIMENSIONS (mm are the original dimensions) UNIT mm A max. 1.1 A1 0.15 0.05 A2 0.95 0.80 A3 0.25 bp 0.30 0.19 c 0.2 0.1 D (1) 6.6 6.4 E (2) 4.5 4.3 e 0.65 HE 6.6 6.2 L 1 Lp 0.75 0.50 Q 0.4 0.3 v 0.2 w 0.13 y 0.1 Z (1) 0.5 0.2 θ 8 o 0 o Notes 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. 2. Plastic interlead protrusions of 0.25 mm maximum per side are not included. OUTLINE VERSION SOT360-1 REFERENCES IEC JEDEC MO-153 JEITA EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-19 Fig 12. Package outline SOT360-1 (TSSOP20) 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 14 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state DHVQFN20: plastic dual in-line compatible thermal enhanced very thin quad flat package; no leads; SOT764-1 20 terminals; body 2.5 x 4.5 x 0.85 mm D B A A A1 E c terminal 1 index area detail X terminal 1 index area e 2 L e1 b 9 vMCAB wM C y1 C C y 1 Eh 20 10 e 11 19 Dh 0 12 X 2.5 scale 5 mm DIMENSIONS (mm are the original dimensions) UNIT mm A(1) max. 1 A1 0.05 0.00 b 0.30 0.18 c 0.2 D (1) 4.6 4.4 Dh 3.15 2.85 E (1) 2.6 2.4 Eh 1.15 0.85 e 0.5 e1 3.5 L 0.5 0.3 v 0.1 w 0.05 y 0.05 y1 0.1 Note 1. Plastic or metal protrusions of 0.075 mm maximum per side are not included. OUTLINE VERSION SOT764-1 REFERENCES IEC --JEDEC MO-241 JEITA --EUROPEAN PROJECTION ISSUE DATE 02-10-17 03-01-27 Fig 13. Package outline SOT764-1 (DHVQFN20) 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 15 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state 12. Abbreviations Table 10. Acronym CDM CMOS DUT ESD HBM MM TTL Abbreviations Description Charged-Device Model Complementary Metal Oxide Semiconductor Device Under Test ElectroStatic Discharge Human Body Model Machine Model Transistor-Transistor Logic 13. Revision history Table 11. Revision history Release date 20080124 Data sheet status Product data sheet Change notice Supersedes 74AHC_AHCT574_1 Document ID 74AHC_AHCT574_2 Modifications: • • • • • The format of this data sheet has been redesigned to comply with the new identity guidelines of NXP Semiconductors. Legal texts have been adapted to the new company name where appropriate. Section 3: DHVQFN20 package added. Section 7: derating values added for DHVQFN20 package. Section 11: outline drawing added for DHVQFN20 package. Product specification - 74AHC_AHCT574_1 19990616 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 16 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state 14. Legal information 14.1 Data sheet status Document status[1][2] Objective [short] data sheet Preliminary [short] data sheet Product [short] data sheet [1] [2] [3] Product status[3] Development Qualification Production Definition This document contains data from the objective specification for product development. This document contains data from the preliminary specification. This document contains the product specification. Please consult the most recently issued document before initiating or completing a design. The term ‘short data sheet’ is explained in section “Definitions”. The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 14.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. 14.3 Disclaimers General — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or 14.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 15. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com 74AHC_AHCT574_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 24 January 2008 17 of 18 NXP Semiconductors 74AHC574; 74AHCT574 Octal D-type flip-flop; positive edge-trigger; 3-state 16. Contents 1 2 3 4 5 5.1 5.2 6 7 8 9 10 10.1 11 12 13 14 14.1 14.2 14.3 14.4 15 16 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 4 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 4 Functional description . . . . . . . . . . . . . . . . . . . 5 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 5 Recommended operating conditions. . . . . . . . 6 Static characteristics. . . . . . . . . . . . . . . . . . . . . 6 Dynamic characteristics . . . . . . . . . . . . . . . . . . 8 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 13 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 16 Legal information. . . . . . . . . . . . . . . . . . . . . . . 17 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 17 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Contact information. . . . . . . . . . . . . . . . . . . . . 17 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2008. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com Date of release: 24 January 2008 Document identifier: 74AHC_AHCT574_2
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