74LV132BQ

74LV132 Quad 2-input NAND Schmitt trigger Rev. 05 — 2 July 2009 Product data sheet 1. General description The 74LV132 is a low-voltage Si-gate CMOS device that is pin and function compatible with 74HC132 and 74HCT132. The 74LV132 contains four 2-input NAND gates which accept standard input signals. They are capable of transforming slowly changing input signals into sharply defined, jitter-free output signals. The gate switches at different points for positive and negative-going signals. The difference between the positive voltage VT+ and the negative voltage VT− is defined as the input hysteresis voltage VH. 2. Features I I I I I Wide operating voltage: 1.0 V to 5.5 V Optimized for low voltage applications: 1.0 V to 3.6 V Accepts TTL input levels between VCC = 2.7 V and VCC = 3.6 V Typical output ground bounce < 0.8 V at VCC = 3.3 V and Tamb = 25 °C Typical HIGH-level output voltage (VOH) undershoot: > 2 V at VCC = 3.3 V and Tamb = 25 °C I ESD protection: N HBM JESD22-A114E exceeds 2000 V N MM JESD22-A115-A exceeds 200 V I Multiple package options I Specified from −40 °C to +85 °C and from −40 °C to +125 °C 3. Applications I Wave and pulse shapers for highly noisy environments I Astable multivibrators I Monostable multivibrators NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger 4. Ordering information Table 1. Ordering information Package Temperature range 74LV132N 74LV132D 74LV132DB 74LV132PW 74LV132BQ −40 °C to +125 °C −40 °C to +125 °C −40 °C to +125 °C −40 °C to +125 °C −40 °C to +125 °C Name DIP14 SO14 SSOP14 TSSOP14 Description plastic dual in-line package; 14 leads (300 mil) plastic small outline package; 14 leads; body width 3.9 mm plastic shrink small outline package; 14 leads; body width 5.3 mm plastic thin shrink small outline package; 14 leads; body width 4.4 mm Version SOT27-1 SOT108-1 SOT337-1 SOT402-1 SOT762-1 Type number DHVQFN14 plastic dual in-line compatible thermal enhanced very thin quad flat package; no leads; 14 terminals; body 2.5 × 3 × 0.85 mm 5. Functional diagram 1A 1Y 2 1B 1 2 4 2A 2Y 5 2B 6 4 5 9 3Y 10 3B 10 8 12 13 12 4A mna408 1 3 & 3 & 6 9 3A & 8 & 11 A Y B mna409 4Y 13 4B 11 mna407 Fig 1. Logic symbol Fig 2. IEC logic symbol Fig 3. Logic diagram (one gate) 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 2 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger 6. Pinning information 6.1 Pinning 74LV132 terminal 1 index area 1B 1A 1B 1Y 2A 2B 2Y GND 1 2 3 4 5 6 7 001aac203 2 3 4 5 6 7 GND 3Y 8 VCC (1) 14 VCC 13 4B 12 4A 11 4Y 10 3B 9 3A 14 VCC 13 4B 12 4A 1Y 2A 2B 2Y 132 11 4Y 10 3B 9 8 3A 3Y 1 1A 001aah099 Transparent top view (1) The die substrate is attached to the exposed die pad using conductive die attach material. It cannot be used as a supply pin or input. Fig 4. Pin configuration DIP14, SO14 and (T)SSOP14 Fig 5. Pin configuration DHVQFN14 6.2 Pin description Table 2. Symbol 1A 1B 1Y 2A 2B 2Y GND 3Y 3A 3B 4Y 4A 4B VCC Pin description Pin 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Description data input data input data output data input data input data output ground (0 V) data output data input data input data output data input data input supply voltage 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 3 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger 7. Functional description Table 3. Function table H = HIGH voltage level; L = LOW voltage level. Input nA L L H H nB L H L H Output nY H H H L 8. Limiting values Table 4. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to GND (ground = 0 V). Symbol VCC IIK IOK IO ICC IGND Tstg Ptot Parameter supply voltage input clamping current output clamping current output current supply current ground current storage temperature total power dissipation DIP14 package SO14 package (T)SSOP14 package DHVQFN14 package [1] [2] [3] [4] [5] Conditions VI < −0.5 V or VI > VCC + 0.5 V VO < −0.5 V or VO > VCC + 0.5 V VO = −0.5 V to (VCC + 0.5 V) [1] [1] Min −0.5 −50 −65 Max +7.0 ±20 ±50 ±25 50 +150 750 500 500 500 Unit V mA mA mA mA mA °C mW mW mW mW Tamb = −40 °C to +125 °C [2] [3] [4] [5] - The input and output voltage ratings may be exceeded if the input and output current ratings are observed. Ptot derates linearly with 12 mW/K above 70 °C. Ptot derates linearly with 8 mW/K above 70 °C. Ptot derates linearly with 5.5 mW/K above 60 °C. Ptot derates linearly with 4.5 mW/K above 60 °C. 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 4 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger 9. Recommended operating conditions Table 5. Recommended operating conditions Voltages are referenced to GND (ground = 0 V). Symbol VCC VI VO Tamb [1] Parameter supply voltage[1] input voltage output voltage ambient temperature Conditions Min 1.0 0 0 −40 Typ 3.3 +25 Max 5.5 VCC VCC +125 Unit V V V °C The static characteristics are guaranteed from VCC = 1.2 V to VCC = 5.5 V, but LV devices are guaranteed to function down to VCC = 1.0 V (with input levels GND or VCC). 10. Static characteristics Table 6. Static characteristics Voltages are referenced to GND (ground = 0 V). Symbol Parameter VOH HIGH-level output voltage Conditions VI = VT+ or VT− lO = −100 µA; VCC = 1.2 V lO = −100 µA; VCC = 2.0 V lO = −100 µA; VCC = 2.7 V lO = −100 µA; VCC = 3.0 V lO = −100 µA; VCC = 4.5 V lO = −6 mA; VCC = 3.0 V lO = −12 mA; VCC = 4.5 V VOL LOW-level output voltage VI = VT+ or VT− IO = 100 µA; VCC = 1.2 V IO = 100 µA; VCC = 2.0 V IO = 100 µA; VCC = 2.7 V IO = 100 µA; VCC = 3.0 V IO = 100 µA; VCC = 4.5 V IO = 6 mA; VCC = 3.0 V IO = 12 mA; VCC = 4.5 V II ICC ∆ICC CI [1] −40 °C to +85 °C Min 1.8 2.5 2.8 4.3 2.4 3.6 Typ[1] 1.2 2.0 2.7 3.0 4.5 2.82 4.2 0 0 0 0 0 0.25 0.35 3.5 Max 0.2 0.2 0.2 0.2 0.40 0.55 1.0 20.0 500 - −40 °C to +125 °C Unit Min 1.8 2.5 2.8 4.3 2.2 3.5 Max 0.2 0.2 0.2 0.2 0.50 0.65 1.0 40 850 V V V V V V V V V V V V V V µA µA µA pF input leakage current supply current additional supply current input capacitance VI = VCC or GND; VCC = 5.5 V VI = VCC or GND; IO = 0 A; VCC = 5.5 V per input; VI = VCC − 0.6 V; VCC = 2.7 V to 3.6 V Typical values are measured at Tamb = 25 °C. 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 5 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger 11. Dynamic characteristics Table 7. Dynamic characteristics GND = 0 V; For test circuit see Figure 7. Symbol Parameter tpd propagation delay Conditions nA, nB to nY; see Figure 6 VCC = 1.2 V VCC = 2.0 V VCC = 2.7 V VCC = 3.0 V to 3.6 V; CL = 15 pF VCC = 3.0 V to 3.6 V VCC = 4.5 V to 5.5 V CPD power dissipation capacitance CL = 50 pF; fi = 1 MHz; VI = GND to VCC [3] [3] [3] [4] [2] −40 °C to +85 °C Min Typ[1] 65 18 15 10 12 9.0 24 Max 34 24 20 14 - −40 °C to +125 °C Min Max 43 30 25 17 - Unit ns ns ns ns ns ns pF [1] [2] [3] [4] All typical values are measured at Tamb = 25 °C. tpd is the same as tPLH and tPHL. Typical values are measured at nominal supply voltage (VCC = 3.3 V and VCC = 5.0 V). CPD is used to determine the dynamic power dissipation (PD in µW). PD = CPD × VCC2 × fi × N + Σ(CL × VCC2 × fo) where: fi = input frequency in MHz, fo = output frequency in MHz CL = output load capacitance in pF VCC = supply voltage in V N = number of inputs switching Σ(CL × VCC2 × fo) = sum of the outputs. 12. Waveforms VI nA, nB input GND t PHL VOH nY output VOL VM 001aaa662 VM t PLH Measurement points are given in Table 8. VOL and VOH are typical voltage output levels that occur with the output load. Fig 6. The input (nA, nB) to output (nY) propagation delays 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 6 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger Table 8. VCC < 2.7 V Measurement points Input VM 0.5VCC 1.5 V 0.5VCC Output VM 0.5VCC 1.5 V 0.5VCC Supply voltage 2.7 V to 3.6 V ≥ 4.5 V VCC PULSE GENERATOR VI DUT RT CL 50 pF RL 1 kΩ VO 001aaa663 Test data is given in Table 9. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. RL = Load resistance. CL = Load capacitance including jig and probe capacitance. Fig 7. Load circuit for switching times Table 9. VCC < 2.7 V 2.7 V to 3.6 V ≥ 4.5 V Test data Input VI VCC 2.7 V VCC tr, tf ≤ 2.5 ns ≤ 2.5 ns ≤ 2.5 ns Supply voltage 13. Transfer characteristics Table 10. Transfer characteristics GND = 0 V; For test circuit see Figure 7. Symbol Parameter VT+ positive-going threshold voltage Conditions see Figure 6 VCC = 1.2 V VCC = 2.0 V VCC = 2.7 V VCC = 3.0 V VCC = 3.6 V VCC = 4.5 V VCC = 5.5 V 0.8 1.0 1.2 1.5 1.7 2.1 0.70 1.10 1.45 1.60 1.95 2.50 3.00 1.4 2.0 2.2 2.4 3.2 3.9 0.8 1.0 1.2 1.5 1.7 2.1 1.4 2.0 2.2 2.4 3.2 3.9 V V V V V V V −40 °C to +85 °C Min Typ[1] Max −40 °C to +125 °C Min Max Unit 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 7 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger Table 10. Transfer characteristics …continued GND = 0 V; For test circuit see Figure 7. Symbol Parameter VT− negative-going threshold voltage Conditions see Figure 6 VCC = 1.2 V VCC = 2.0 V VCC = 2.7 V VCC = 3.0 V VCC = 3.6 V VCC = 4.5 V VCC = 5.5 V VH hysteresis voltage (VT+ − VT−); see Figure 6 VCC = 1.2 V VCC = 2.0 V VCC = 2.7 V VCC = 3.0 V VCC = 3.6 V VCC = 4.5 V VCC = 5.5 V [1] All typical values are measured at Tamb = 25 °C. −40 °C to +85 °C Min 0.3 0.4 0.6 0.8 0.9 1.2 0.2 0.3 0.4 0.4 0.4 0.6 Typ[1] 0.34 0.65 0.90 1.05 1.30 1.60 2.00 0.3 0.55 0.60 0.65 0.70 0.80 1.00 Max 0.9 1.4 1.5 1.8 2.0 2.6 0.8 1.1 1.2 1.2 1.4 1.5 −40 °C to +125 °C Min 0.3 0.4 0.6 0.8 0.9 1.2 0.2 0.3 0.4 0.4 0.4 0.6 Max 0.9 1.4 1.5 1.8 2.0 2.6 0.8 1.1 1.2 1.2 1.4 1.5 Unit V V V V V V V V V V V V V V 14. Waveforms transfer characteristics VO VT+ VI VT− VH VO VH VT− VT+ VI mna207 mna208 VT+ and VT− limits at 70 % and 20 %. Fig 8. Transfer characteristic Fig 9. Definition of VT+, VT− and VH 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 8 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger 12 ICC (µA) 8 001aaa659 100 ICC (µA) 80 001aaa660 60 40 4 20 0 0 0.3 0.6 0.9 VI (V) 1.2 0 0 0.4 0.8 1.2 1.6 VI (V) 2 VCC = 1.2 V. VCC = 2.0 V. Fig 10. Typical 74LV132 transfer characteristics Fig 11. Typical 74LV132 transfer characteristics 300 ICC (µA) 200 001aaa661 100 0 0 0.6 1.2 1.8 2.4 VI (V) 3 VCC = 3.0 V. Fig 12. Typical 74LV132 transfer characteristics 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 9 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger 15. Package outline DIP14: plastic dual in-line package; 14 leads (300 mil) SOT27-1 D seating plane ME A2 A L A1 c Z e b1 b 14 8 MH wM (e 1) pin 1 index E 1 7 0 5 scale 10 mm DIMENSIONS (inch dimensions are derived from the original mm dimensions) UNIT mm inches A max. 4.2 0.17 A1 min. 0.51 0.02 A2 max. 3.2 0.13 b 1.73 1.13 0.068 0.044 b1 0.53 0.38 0.021 0.015 c 0.36 0.23 0.014 0.009 D (1) 19.50 18.55 0.77 0.73 E (1) 6.48 6.20 0.26 0.24 e 2.54 0.1 e1 7.62 0.3 L 3.60 3.05 0.14 0.12 ME 8.25 7.80 0.32 0.31 MH 10.0 8.3 0.39 0.33 w 0.254 0.01 Z (1) max. 2.2 0.087 Note 1. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included. OUTLINE VERSION SOT27-1 REFERENCES IEC 050G04 JEDEC MO-001 JEITA SC-501-14 EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-13 Fig 13. Package outline SOT27-1 (DIP14) 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 10 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger SO14: plastic small outline package; 14 leads; body width 3.9 mm SOT108-1 D E A X c y HE vMA Z 14 8 Q A2 pin 1 index θ Lp 1 e bp 7 wM L detail X A1 (A 3) A 0 2.5 scale 5 mm DIMENSIONS (inch dimensions are derived from the original mm dimensions) UNIT mm A max. 1.75 A1 0.25 0.10 A2 1.45 1.25 A3 0.25 0.01 bp 0.49 0.36 c 0.25 0.19 D (1) 8.75 8.55 E (1) 4.0 3.8 0.16 0.15 e 1.27 0.05 HE 6.2 5.8 L 1.05 Lp 1.0 0.4 Q 0.7 0.6 0.028 0.024 v 0.25 0.01 w 0.25 0.01 y 0.1 Z (1) 0.7 0.3 θ 0.010 0.057 inches 0.069 0.004 0.049 0.019 0.0100 0.35 0.014 0.0075 0.34 0.244 0.039 0.041 0.228 0.016 0.028 0.004 0.012 8 o 0 o Note 1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included. OUTLINE VERSION SOT108-1 REFERENCES IEC 076E06 JEDEC MS-012 JEITA EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-19 Fig 14. Package outline SOT108-1 (SO14) 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 11 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger SSOP14: plastic shrink small outline package; 14 leads; body width 5.3 mm SOT337-1 D E A X c y HE vM A Z 14 8 Q A2 A1 pin 1 index Lp L 1 bp 7 wM detail X (A 3) θ A e 0 2.5 scale 5 mm DIMENSIONS (mm are the original dimensions) UNIT mm A max. 2 A1 0.21 0.05 A2 1.80 1.65 A3 0.25 bp 0.38 0.25 c 0.20 0.09 D (1) 6.4 6.0 E (1) 5.4 5.2 e 0.65 HE 7.9 7.6 L 1.25 Lp 1.03 0.63 Q 0.9 0.7 v 0.2 w 0.13 y 0.1 Z (1) 1.4 0.9 θ 8 o 0 o Note 1. Plastic or metal protrusions of 0.25 mm maximum per side are not included. OUTLINE VERSION SOT337-1 REFERENCES IEC JEDEC MO-150 JEITA EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-19 Fig 15. Package outline SOT337-1 (SSOP14) 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 12 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger TSSOP14: plastic thin shrink small outline package; 14 leads; body width 4.4 mm SOT402-1 D E A X c y HE vMA Z 14 8 Q A2 pin 1 index A1 θ Lp L (A 3) A 1 e bp 7 wM detail X 0 2.5 scale 5 mm DIMENSIONS (mm are the original dimensions) UNIT mm Notes 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. 2. Plastic interlead protrusions of 0.25 mm maximum per side are not included. OUTLINE VERSION SOT402-1 REFERENCES IEC JEDEC MO-153 JEITA EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-18 A max. 1.1 A1 0.15 0.05 A2 0.95 0.80 A3 0.25 bp 0.30 0.19 c 0.2 0.1 D (1) 5.1 4.9 E (2) 4.5 4.3 e 0.65 HE 6.6 6.2 L 1 Lp 0.75 0.50 Q 0.4 0.3 v 0.2 w 0.13 y 0.1 Z (1) 0.72 0.38 θ 8 o 0 o Fig 16. Package outline SOT402-1 (TSSOP14) 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 13 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger DHVQFN14: plastic dual in-line compatible thermal enhanced very thin quad flat package; no leads; SOT762-1 14 terminals; body 2.5 x 3 x 0.85 mm D B A A A1 E c terminal 1 index area detail X terminal 1 index area e 2 L e1 b 6 vMCAB wM C y1 C C y 1 Eh 14 7 e 8 13 Dh 0 9 X 2.5 scale 5 mm DIMENSIONS (mm are the original dimensions) UNIT mm A(1) max. 1 A1 0.05 0.00 b 0.30 0.18 c 0.2 D (1) 3.1 2.9 Dh 1.65 1.35 E (1) 2.6 2.4 Eh 1.15 0.85 e 0.5 e1 2 L 0.5 0.3 v 0.1 w 0.05 y 0.05 y1 0.1 Note 1. Plastic or metal protrusions of 0.075 mm maximum per side are not included. OUTLINE VERSION SOT762-1 REFERENCES IEC --JEDEC MO-241 JEITA --EUROPEAN PROJECTION ISSUE DATE 02-10-17 03-01-27 Fig 17. Package outline SOT762-1 (DHVQFN14) 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 14 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger 16. Abbreviations Table 11. Acronym CMOS DUT ESD HBM MM TTL Abbreviations Description Complementary Metal Oxide Semiconductor Device Under Test ElectroStatic Discharge Human Body Model Machine Model Transistor-Transistor Logic 17. Revision history Table 12. 74LV132_5 Modifications: 74LV132_4 74LV132_3 74LV132_2 74LV132_1 Revision history Release date 20090702 Data sheet status Product data sheet Change notice Supersedes 74LV132_4 Document ID • Table 6: the conditions for HIGH-level output voltage and LOW-level output voltage have been changed. Product data sheet Product specification Product specification Product specification 74LV132_3 74LV132_2 74LV132_1 - 20071112 20040415 19980428 19970204 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 15 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger 18. Legal information 18.1 Data sheet status Document status[1][2] Objective [short] data sheet Preliminary [short] data sheet Product [short] data sheet [1] [2] [3] Product status[3] Development Qualification Production Definition This document contains data from the objective specification for product development. This document contains data from the preliminary specification. This document contains the product specification. Please consult the most recently issued document before initiating or completing a design. The term ‘short data sheet’ is explained in section “Definitions”. The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 18.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. 18.3 Disclaimers General — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental 18.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 19. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com 74LV132_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 2 July 2009 16 of 17 NXP Semiconductors 74LV132 Quad 2-input NAND Schmitt trigger 20. Contents 1 2 3 4 5 6 6.1 6.2 7 8 9 10 11 12 13 14 15 16 17 18 18.1 18.2 18.3 18.4 19 20 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 3 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3 Functional description . . . . . . . . . . . . . . . . . . . 4 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4 Recommended operating conditions. . . . . . . . 5 Static characteristics. . . . . . . . . . . . . . . . . . . . . 5 Dynamic characteristics . . . . . . . . . . . . . . . . . . 6 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 Transfer characteristics. . . . . . . . . . . . . . . . . . . 7 Waveforms transfer characteristics . . . . . . . . . 8 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 10 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 15 Legal information. . . . . . . . . . . . . . . . . . . . . . . 16 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 16 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Contact information. . . . . . . . . . . . . . . . . . . . . 16 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2009. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com Date of release: 2 July 2009 Document identifier: 74LV132_5