74LVC2G00

74LVC2G00 Dual 2-input NAND gate Rev. 08 — 26 October 2009 Product data sheet 1. General description The 74LVC2G00 provides a 2-input NAND gate function. Inputs can be driven from either 3.3 V or 5 V devices. This feature allows the use of these devices as translators in a mixed 3.3 V and 5 V environment. This device is fully specified for partial power-down applications using IOFF. The IOFF circuitry disables the output, preventing the damaging backflow current through the device when it is powered down. 2. Features I I I I I I Wide supply voltage range from 1.65 V to 5.5 V 5 V tolerant outputs for interfacing with 5 V logic High noise immunity ±24 mA output drive (VCC = 3.0 V) CMOS low power consumption Complies with JEDEC standard: N JESD8-7 (1.65 V to 1.95 V) N JESD8-5 (2.3 V to 2.7 V) N JESD8-B/JESD36 (2.7 V to 3.6 V) Latch-up performance exceeds 250 mA Direct interface with TTL levels Inputs accept voltages up to 5 V ESD protection: N HBM JESD22-A114F exceeds 2000 V N MM JESD22-A115-A exceeds 200 V Multiple package options Specified from −40 °C to +85 °C and −40 °C to +125 °C I I I I I I NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate 3. Ordering information Table 1. Ordering information Package Temperature range Name 74LVC2G00DP 74LVC2G00DC 74LVC2G00GT 74LVC2G00GD 74LVC2G00GM −40 °C to +125 °C −40 °C to +125 °C −40 °C to +125 °C −40 °C to +125 °C −40 °C to +125 °C TSSOP8 VSSOP8 XSON8 XSON8U XQFN8U Description plastic thin shrink small outline package; 8 leads; body width 3 mm; lead length 0.5 mm Version SOT505-2 Type number plastic very thin shrink small outline package; 8 leads; SOT765-1 body width 2.3 mm plastic extremely thin small outline package; no leads; SOT833-1 8 terminals; body 1 × 1.95 × 0.5 mm plastic extremely thin small outline package; no leads; SOT996-2 8 terminals; UTLP based; body 3 × 2 × 0.5 mm plastic extremely thin quad flat package; no leads; 8 terminals; UTLP based; body 1.6 × 1.6 × 0.5 mm SOT902-1 4. Marking Table 2. Marking codes Marking code[1] V2G00 V00 V00 V00 V00 Type number 74LVC2G00DP 74LVC2G00DC 74LVC2G00GT 74LVC2G00GD 74LVC2G00GM [1] The pin 1 indicator is located on the lower left corner of the device, below the marking code. 5. Functional diagram & 1A 1B 2A 2B 1Y B 2Y & Y 001aah749 001aah748 A mna099 Fig 1. Logic symbol Fig 2. IEC logic symbol Fig 3. Logic diagram (one gate) 74LVC2G00_8 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 08 — 26 October 2009 2 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate 6. Pinning information 6.1 Pinning 74LVC2G00 1A 1 8 VCC 1B 2 7 1Y 74LVC2G00 1A 1B 2Y GND 1 2 3 4 001aab736 8 7 6 5 VCC 1Y 2B 2A 2Y 3 6 2B GND 4 5 2A 001aab737 Transparent top view Fig 4. Pin configuration SOT505-2 (TSSOP8) and SOT765-1 (VSSOP8) Fig 5. Pin configuration SOT833-1 (XSON8) 74LVC2G00 terminal 1 index area 1Y 1 VCC 8 74LVC2G00 1A 1B 2Y GND 1 2 3 4 8 7 6 5 VCC 7 1A 2B 1Y 2B 2A 2A 2 6 1B 3 4 5 2Y GND 001aae980 001aai251 Transparent top view Transparent top view Fig 6. Pin configuration SOT996-2 (XSON8U) Fig 7. Pin configuration SOT902-1 (XQFN8U) 6.2 Pin description Table 3. Symbol Pin description Pin SOT505-2, SOT765-1, SOT833-1 and SOT996-2 1A, 2A 1B, 2B GND 1Y, 2Y VCC 74LVC2G00_8 Description SOT902-1 7, 3 6, 2 4 1, 5 8 data input data input ground (0 V) data output supply voltage © NXP B.V. 2009. All rights reserved. 1, 5 2, 6 4 7, 3 8 Product data sheet Rev. 08 — 26 October 2009 3 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate 7. Functional description Table 4. Input nA L L H H [1] Function table[1] Output nB L H L H nY H H H L H = HIGH voltage level; L = LOW voltage level. 8. Limiting values Table 5. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to GND (ground = 0 V). Symbol VCC VI VO IIK IOK IO ICC IGND Tstg Ptot [1] [2] [3] Parameter supply voltage input voltage output voltage input clamping current output clamping current output current supply current ground current storage temperature total power dissipation Conditions [1] Min −0.5 −0.5 −0.5 −0.5 −50 −100 −65 Max +6.5 +6.5 VCC + 0.5 +6.5 ±50 ±50 100 +150 300 Unit V V V V mA mA mA mA mA °C mW Active mode Power-down mode VI < 0 V VO < 0 V or VO > VCC VO = 0 V to VCC [1] [1][2] Tamb = −40 °C to +125 °C [3] - The input and output voltage ratings may be exceeded if the input and output current ratings are observed. When VCC = 0 V (Power-down mode), the output voltage can be 5.5 V in normal operation. For TSSOP8 package: above 55 °C the value of Ptot derates linearly with 2.5 mW/K. For VSSOP8 package: above 110 °C the value of Ptot derates linearly with 8 mW/K. For XSON8, XSON8U and XQFN8U packages: above 45 °C the value of Ptot derates linearly with 2.4 mW/K. 74LVC2G00_8 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 08 — 26 October 2009 4 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate 9. Recommended operating conditions Table 6. Symbol VCC VI VO Tamb ∆t/∆V Operating conditions Parameter supply voltage input voltage output voltage ambient temperature input transition rise and fall rate VCC = 1.65 V to 2.7 V VCC = 2.7 V to 5.5 V Active mode Power-down mode Conditions Min 1.65 0 0 0 −40 Max 5.5 5.5 VCC 5.5 +125 20 10 Unit V V V V °C ns/V ns/V 10. Static characteristics Table 7. Static characteristics At recommended operating conditions; voltages are referenced to GND (ground = 0 V). Symbol Parameter Tamb = −40 °C to +85 VIH °C[1] VCC = 1.65 V to 1.95 V VCC = 2.3 V to 2.7 V VCC = 2.7 V to 3.6 V VCC = 4.5 V to 5.5 V VIL LOW-level input voltage VCC = 1.65 V to 1.95 V VCC = 2.3 V to 2.7 V VCC = 2.7 V to 3.6 V VCC = 4.5 V to 5.5 V VOH HIGH-level output voltage VI = VIH or VIL IO = −100 µA; VCC = 1.65 V to 5.5 V IO = −4 mA; VCC = 1.65 V IO = −8 mA; VCC = 2.3 V IO = −12 mA; VCC = 2.7 V IO = −24 mA; VCC = 3.0 V IO = −32 mA; VCC = 4.5 V VOL LOW-level output voltage VI = VIH or VIL IO = 100 µA; VCC = 1.65 V to 5.5 V IO = 4 mA; VCC = 1.65 V IO = 8 mA; VCC = 2.3 V IO = 12 mA; VCC = 2.7 V IO = 24 mA; VCC = 3.0 V IO = 32 mA; VCC = 4.5 V II IOFF input leakage current VI = 5.5 V or GND; VCC = 0 V to 5.5 V power-off leakage current VI or VO = 5.5 V; VCC = 0 V 0.08 0.14 0.19 0.37 0.43 ±0.1 ±0.1 0.1 0.45 0.3 0.4 0.55 0.55 ±5 ±10 V V V V V V µA µA VCC − 0.1 1.2 1.9 2.2 2.3 3.8 1.53 2.13 2.50 2.60 4.10 V V V V V V 0.65 × VCC 1.7 2.0 0.7 × VCC 0.7 0.8 0.3 × VCC V V V V V V V HIGH-level input voltage Conditions Min Typ Max Unit 0.35 × VCC V 74LVC2G00_8 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 08 — 26 October 2009 5 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate Table 7. Static characteristics …continued At recommended operating conditions; voltages are referenced to GND (ground = 0 V). Symbol Parameter ICC ∆ICC Ci VIH supply current additional supply current input capacitance HIGH-level input voltage VCC = 1.65 V to 1.95 V VCC = 2.3 V to 2.7 V VCC = 2.7 V to 3.6 V VCC = 4.5 V to 5.5 V VIL LOW-level input voltage VCC = 1.65 V to 1.95 V VCC = 2.3 V to 2.7 V VCC = 2.7 V to 3.6 V VCC = 4.5 V to 5.5 V VOH HIGH-level output voltage VI = VIH or VIL IO = −100 µA; VCC = 1.65 V to 5.5 V IO = −4 mA; VCC = 1.65 V IO = −8 mA; VCC = 2.3 V IO = −12 mA; VCC = 2.7 V IO = −24 mA; VCC = 3.0 V IO = −32 mA; VCC = 4.5 V VOL LOW-level output voltage VI = VIH or VIL IO = 100 µA; VCC = 1.65 V to 5.5 V IO = 4 mA; VCC = 1.65 V IO = 8 mA; VCC = 2.3 V IO = 12 mA; VCC = 2.7 V IO = 24 mA; VCC = 3.0 V IO = 32 mA; VCC = 4.5 V II IOFF ICC ∆ICC input leakage current supply current additional supply current VI = 5.5 V or GND; VCC = 0 V to 5.5 V VI = 5.5 V or GND; VCC = 1.65 V to 5.5 V; IO = 0 A per pin; VI = VCC − 0.6 V; IO = 0 A; VCC = 2.3 V to 5.5 V power-off leakage current VI or VO = 5.5 V; VCC = 0 V 0.1 0.70 0.45 0.60 0.80 0.80 ±20 ±20 40 5000 V V V V V V µA µA µA µA VCC − 0.1 0.95 1.7 1.9 2.0 3.4 V V V V V V Conditions VI = 5.5 V or GND; VCC = 1.65 V to 5.5 V; IO = 0 A per pin; VI = VCC − 0.6 V; IO = 0 A; VCC = 2.3 V to 5.5 V Min Typ 0.1 5 2.5 Max 10 500 0.7 0.8 0.3 × VCC Unit µA µA pF V V V V V V V Tamb = −40 °C to +125 °C 0.65 × VCC 1.7 2.0 0.7 × VCC - 0.35 × VCC V [1] All typical values are measured at Tamb = 25 °C. 74LVC2G00_8 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 08 — 26 October 2009 6 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate 11. Dynamic characteristics Table 8. Dynamic characteristics Voltages are referenced to GND (ground 0 V); for test circuit see Figure 9. Symbol Parameter tpd Conditions [2] −40 °C to +85 °C Min Typ[1] 3.5 2.3 3.0 2.2 1.8 14 Max 8.6 4.8 5.6 4.3 3.3 - −40 °C to +125 °C Unit Min 1.2 0.7 0.7 0.7 0.5 Max 10.8 6.0 7.0 5.4 4.2 ns ns ns ns ns pF propagation delay nA, nB to nY; see Figure 8 VCC = 1.65 V to 1.95 V VCC = 2.3 V to 2.7 V VCC = 2.7 V VCC = 3.0 V to 3.6 V VCC = 4.5 V to 5.5 V 1.2 0.7 0.7 0.7 0.5 [3] CPD power dissipation capacitance per gate; VI = GND to VCC - [1] [2] [3] Typical values are measured at nominal VCC and at Tamb = 25 °C. tpd is the same as tPLH and tPHL CPD is used to determine the dynamic power dissipation (PD in µW). PD = CPD × VCC2 × fi × N + Σ(CL × VCC2 × fo) where: fi = input frequency in MHz; fo = output frequency in MHz; CL = output load capacitance in pF; VCC = supply voltage in V; N = number of inputs switching; Σ(CL × VCC2 × fo) = sum of outputs. 12. Waveforms VI nA, nB input GND t PHL VOH nY output VOL VM 001aae972 VM t PLH Measurement points are given in Table 9. VOL and VOH are typical output voltage levels that occur with the output load. Fig 8. Input (nA, nB) to output (nY) propagation delays 74LVC2G00_8 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 08 — 26 October 2009 7 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate Table 9. VCC Measurement points Input VM 0.5VCC 0.5VCC 1.5 V 1.5 V 0.5VCC Output VM 0.5VCC 0.5VCC 1.5 V 1.5 V 0.5VCC Supply voltage 1.65 V to 1.95 V 2.3 V to 2.7 V 2.7 V 3.0 V to 3.6 V 4.5 V to 5.5 V VI negative pulse 0V tW 90 % VM 10 % tf tr tr tf 90 % VM 10 % tW VM VM VI positive pulse 0V VEXT VCC PULSE GENERATOR VI DUT RT CL RL RL VO 001aae235 Test data is given in Table 10. Definitions for test circuit: RL = Load resistor. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. VEXT = Test voltage for switching times. Fig 9. Table 10. VCC Load circuit for measuring switching times Test data Input VI VCC VCC 2.7 V 2.7 V VCC tr, tf ≤ 2.0 ns ≤ 2.0 ns ≤ 2.5 ns ≤ 2.5 ns ≤ 2.5 ns Load CL 30 pF 30 pF 50 pF 50 pF 50 pF RL 1 kΩ 500 Ω 500 Ω 500 Ω 500 Ω VEXT tPLH, tPHL open open open open open Supply voltage 1.65 V to 1.95 V 2.3 V to 2.7 V 2.7 V 3.0 V to 3.6 V 4.5 V to 5.5 V 74LVC2G00_8 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 08 — 26 October 2009 8 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate 13. Package outline TSSOP8: plastic thin shrink small outline package; 8 leads; body width 3 mm; lead length 0.5 mm SOT505-2 D E A X c y HE vMA Z 8 5 A pin 1 index A2 A1 (A3) Lp L θ 1 e bp 4 wM detail X 0 2.5 scale 5 mm DIMENSIONS (mm are the original dimensions) UNIT mm A max. 1.1 A1 0.15 0.00 A2 0.95 0.75 A3 0.25 bp 0.38 0.22 c 0.18 0.08 D(1) 3.1 2.9 E(1) 3.1 2.9 e 0.65 HE 4.1 3.9 L 0.5 Lp 0.47 0.33 v 0.2 w 0.13 y 0.1 Z(1) 0.70 0.35 θ 8° 0° Note 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. OUTLINE VERSION SOT505-2 REFERENCES IEC JEDEC --JEITA EUROPEAN PROJECTION ISSUE DATE 02-01-16 Fig 10. Package outline SOT505-2 (TSSOP8) 74LVC2G00_8 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 08 — 26 October 2009 9 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate VSSOP8: plastic very thin shrink small outline package; 8 leads; body width 2.3 mm SOT765-1 D E A X c y HE vMA Z 8 5 Q A pin 1 index A2 A1 (A3) θ Lp L 1 e bp 4 wM detail X 0 2.5 scale 5 mm DIMENSIONS (mm are the original dimensions) UNIT mm A max. 1 A1 0.15 0.00 A2 0.85 0.60 A3 0.12 bp 0.27 0.17 c 0.23 0.08 D(1) 2.1 1.9 E(2) 2.4 2.2 e 0.5 HE 3.2 3.0 L 0.4 Lp 0.40 0.15 Q 0.21 0.19 v 0.2 w 0.13 y 0.1 Z(1) 0.4 0.1 θ 8° 0° Notes 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. 2. Plastic or metal protrusions of 0.25 mm maximum per side are not included. OUTLINE VERSION SOT765-1 REFERENCES IEC JEDEC MO-187 JEITA EUROPEAN PROJECTION ISSUE DATE 02-06-07 Fig 11. Package outline SOT765-1 (VSSOP8) 74LVC2G00_8 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 08 — 26 October 2009 10 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate XSON8: plastic extremely thin small outline package; no leads; 8 terminals; body 1 x 1.95 x 0.5 mm SOT833-1 1 2 3 b 4 4× L (2) L1 e 8 e1 7 e1 6 e1 5 8× (2) A A1 D E terminal 1 index area 0 DIMENSIONS (mm are the original dimensions) UNIT mm A(1) max 0.5 A1 max 0.04 b 0.25 0.17 D 2.0 1.9 E 1.05 0.95 e 0.6 e1 0.5 L 0.35 0.27 L1 0.40 0.32 1 scale 2 mm Notes 1. Including plating thickness. 2. Can be visible in some manufacturing processes. OUTLINE VERSION SOT833-1 REFERENCES IEC --JEDEC MO-252 JEITA --EUROPEAN PROJECTION ISSUE DATE 07-11-14 07-12-07 Fig 12. Package outline SOT833-1 (XSON8) 74LVC2G00_8 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 08 — 26 October 2009 11 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate XSON8U: plastic extremely thin small outline package; no leads; 8 terminals; UTLP based; body 3 x 2 x 0.5 mm SOT996-2 D B A E A A1 detail X terminal 1 index area e1 L1 1 e b 4 v w M M CAB C C y1 C y L2 L 8 5 X 0 1 scale 2 mm DIMENSIONS (mm are the original dimensions) UNIT mm A max 0.5 A1 0.05 0.00 b 0.35 0.15 D 2.1 1.9 E 3.1 2.9 e 0.5 e1 1.5 L 0.5 0.3 L1 0.15 0.05 L2 0.6 0.4 v 0.1 w 0.05 y 0.05 y1 0.1 OUTLINE VERSION SOT996-2 REFERENCES IEC --JEDEC JEITA --- EUROPEAN PROJECTION ISSUE DATE 07-12-18 07-12-21 Fig 13. Package outline SOT996-2 (XSON8U) 74LVC2G00_8 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 08 — 26 October 2009 12 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate XQFN8U: plastic extremely thin quad flat package; no leads; 8 terminals; UTLP based; body 1.6 x 1.6 x 0.5 mm SOT902-1 D terminal 1 index area B A E A A1 detail X L1 L e 4 e ∅v M C A B ∅w M C 5 C y1 C y 3 metal area not for soldering 2 6 b e1 e1 7 1 terminal 1 index area 8 X 0 1 scale 2 mm DIMENSIONS (mm are the original dimensions) UNIT mm A max 0.5 A1 0.05 0.00 b 0.25 0.15 D 1.65 1.55 E 1.65 1.55 e 0.55 e1 0.5 L 0.35 0.25 L1 0.15 0.05 v 0.1 w 0.05 y 0.05 y1 0.05 OUTLINE VERSION SOT902-1 REFERENCES IEC --JEDEC MO-255 JEITA --- EUROPEAN PROJECTION ISSUE DATE 05-11-25 07-11-14 Fig 14. Package outline SOT902-1 (XQFN8U) 74LVC2G00_8 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 08 — 26 October 2009 13 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate 14. Abbreviations Table 11. Acronym CMOS DUT ESD HBM MM TTL Abbreviations Description Complementary Metal-Oxide Semiconductor Device Under Test ElectroStatic Discharge Human Body Model Machine Model Transistor-Transistor Logic 15. Revision history Table 12. Revision history Release date 20091026 Data sheet status Product data sheet Product data sheet Product data sheet Product data sheet Product data sheet Product specification Product specification Product specification Change notice Supersedes 74LVC2G00_7 74LVC2G00_6 74LVC2G00_5 74LVC2G00_4 74LVC2G00_3 74LVC2G00_2 74LVC2G00_1 Document ID 74LVC2G00_8 Modifications: 74LVC2G00_7 74LVC2G00_6 74LVC2G00_5 74LVC2G00_4 74LVC2G00_3 74LVC2G00_2 74LVC2G00_1 • Section 4 “Marking”: marking code for 74LVC2G00DP changed from V00 into V2G00 20080610 20080220 20070904 20060515 20050201 20040923 20031117 74LVC2G00_8 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 08 — 26 October 2009 14 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate 16. Legal information 16.1 Data sheet status Document status[1][2] Objective [short] data sheet Preliminary [short] data sheet Product [short] data sheet [1] [2] [3] Product status[3] Development Qualification Production Definition This document contains data from the objective specification for product development. This document contains data from the preliminary specification. This document contains the product specification. Please consult the most recently issued document before initiating or completing a design. The term ‘short data sheet’ is explained in section “Definitions”. The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 16.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. 16.3 Disclaimers General — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental 16.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 17. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com 74LVC2G00_8 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 08 — 26 October 2009 15 of 16 NXP Semiconductors 74LVC2G00 Dual 2-input NAND gate 18. Contents 1 2 3 4 5 6 6.1 6.2 7 8 9 10 11 12 13 14 15 16 16.1 16.2 16.3 16.4 17 18 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 3 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3 Functional description . . . . . . . . . . . . . . . . . . . 4 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4 Recommended operating conditions. . . . . . . . 5 Static characteristics. . . . . . . . . . . . . . . . . . . . . 5 Dynamic characteristics . . . . . . . . . . . . . . . . . . 7 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 14 Legal information. . . . . . . . . . . . . . . . . . . . . . . 15 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 15 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Contact information. . . . . . . . . . . . . . . . . . . . . 15 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2009. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com Date of release: 26 October 2009 Document identifier: 74LVC2G00_8