NXP Semiconductors
Technical Data
Document Number: A3V09H521--24S
Rev. 0, 02/2019
RF Power LDMOS Transistor
N--Channel Enhancement--Mode Lateral MOSFET
A3V09H521--24SR6
This 107 W asymmetrical Doherty RF power LDMOS transistor is designed
for cellular base station applications covering the frequency range of 720 to
960 MHz.
900 MHz
Typical Doherty Single--Carrier W--CDMA Performance: VDD = 48 Vdc,
IDQA = 800 mA, VGSB = 0.7 Vdc, Pout = 107 W Avg., Input Signal
PAR = 9.9 dB @ 0.01% Probability on CCDF.
Frequency
Gps
(dB)
D
(%)
Output PAR
(dB)
ACPR
(dBc)
920 MHz
18.6
53.6
7.6
–31.1
940 MHz
18.6
53.2
7.8
–33.3
960 MHz
18.5
53.5
7.9
–34.7
720–960 MHz, 107 W AVG., 48 V
AIRFAST RF POWER LDMOS
TRANSISTOR
Features
Advanced high performance in--package Doherty
NI--1230S--4L2L
Greater negative gate--source voltage range for improved Class C
operation
Designed for digital predistortion error correction systems
6 VBWA(1)
Carrier
RFinA/VGSA 1
5 RFoutA/VDSA
RFinB/VGSB 2
4 RFoutB/VDSB
Peaking
3 VBWB(1)
(Top View)
Figure 1. Pin Connections
1. Device cannot operate with VDD current
supplied through pin 3 and pin 6.
2019 NXP B.V.
RF Device Data
NXP Semiconductors
A3V09H521--24SR6
1
Table 1. Maximum Ratings
Symbol
Value
Unit
Drain--Source Voltage
Rating
VDSS
–0.5, +100
Vdc
Gate--Source Voltage
VGS
–6.0, +10
Vdc
Operating Voltage
VDD
55, +0
Vdc
Storage Temperature Range
Tstg
–65 to +150
C
Case Operating Temperature Range
TC
–40 to +150
C
(1,2)
TJ
–40 to +225
C
Characteristic
Symbol
Value (2,3)
Unit
RJC
0.37
C/W
Operating Junction Temperature Range
Table 2. Thermal Characteristics
Thermal Resistance, Junction to Case
Case Temperature 74C, 107 W Avg., W--CDMA, 48 Vdc, IDQA = 800 mA,
VGSB = 0.7 Vdc, 940 MHz
Table 3. ESD Protection Characteristics
Test Methodology
Class
Human Body Model (per JS--001--2017)
2
Charge Device Model (per JS--002--2014)
C3
Table 4. Electrical Characteristics (TA = 25C unless otherwise noted)
Symbol
Min
Typ
Max
Unit
Zero Gate Voltage Drain Leakage Current
(VDS = 100 Vdc, VGS = 0 Vdc)
IDSS
—
—
10
Adc
Zero Gate Voltage Drain Leakage Current
(VDS = 55 Vdc, VGS = 0 Vdc)
IDSS
—
—
1
Adc
Gate--Source Leakage Current
(VGS = 5 Vdc, VDS = 0 Vdc)
IGSS
—
—
1
Adc
Gate Threshold Voltage
(VDS = 10 Vdc, ID = 137 Adc)
VGS(th)
1.3
1.8
2.3
Vdc
Gate Quiescent Voltage
(VDD = 48 Vdc, IDA = 800 mAdc, Measured in Functional Test)
VGSA(Q)
2.0
2.5
2.8
Vdc
Drain--Source On--Voltage
(VGS = 10 Vdc, ID = 1.37 Adc)
VDS(on)
0.1
0.3
0.5
Vdc
Gate Threshold Voltage
(VDS = 10 Vdc, ID = 274 Adc)
VGS(th)
1.3
1.8
2.3
Vdc
Drain--Source On--Voltage
(VGS = 10 Vdc, ID = 2.74 Adc)
VDS(on)
0.1
0.3
0.5
Vdc
Characteristic
Off
Characteristics (4)
On Characteristics — Side A, Carrier
On Characteristics — Side B, Peaking
1.
2.
3.
4.
Continuous use at maximum temperature will affect MTTF.
MTTF calculator available at http://www.nxp.com/RF/calculators.
Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.nxp.com/RF and search for AN1955.
Each side of device measured separately.
(continued)
A3V09H521--24SR6
2
RF Device Data
NXP Semiconductors
Table 4. Electrical Characteristics (TA = 25C unless otherwise noted) (continued)
Characteristic
Symbol
Min
Typ
Max
Unit
Tests (1,2)
Functional
(In NXP Doherty Test Fixture, 50 ohm system) VDD = 48 Vdc, IDQA = 800 mA, VGSB = 0.7 Vdc, Pout = 107 W Avg.,
f = 960 MHz, Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF. ACPR measured
in 3.84 MHz Channel Bandwidth @ 5 MHz Offset.
Power Gain
Gps
17.6
18.5
20.6
dB
Drain Efficiency
D
51.0
53.5
—
%
PAR
7.4
7.9
—
dB
ACPR
—
–34.7
–31.0
dBc
Output Peak--to--Average Ratio @ 0.01% Probability on CCDF
Adjacent Channel Power Ratio
Load Mismatch (2) (In NXP Doherty Test Fixture, 50 ohm system) IDQA = 800 mA, VGSB = 0.7 Vdc, f = 940 MHz, 12 sec(on), 10% Duty
Cycle
VSWR 10:1 at 55 Vdc, 776 W Pulsed CW Output Power
(3 dB Input Overdrive from 568 W Pulsed CW Rated Power)
No Device Degradation
Typical Performance (2) (In NXP Doherty Test Fixture, 50 ohm system) VDD = 48 Vdc, IDQA = 800 mA, VGSB = 0.7 Vdc,
920–960 MHz Bandwidth
Pout @ 3 dB Compression Point (3)
P3dB
—
661
—
W
—
–21
—
VBWres
—
80
—
MHz
Gain Flatness in 40 MHz Bandwidth @ Pout = 107 W Avg.
GF
—
0.1
—
dB
Gain Variation over Temperature
(–40C to +85C)
G
—
0.01
—
dB/C
P1dB
—
0.003
—
dB/C
AM/PM
(Maximum value measured at the P3dB compression point across
the 920–960 MHz frequency range)
VBW Resonance Point
(IMD Third Order Intermodulation Inflection Point)
Output Power Variation over Temperature
(–40C to +85C)
Table 5. Ordering Information
Device
A3V09H521--24SR6
Tape and Reel Information
R6 Suffix = 150 Units, 56 mm Tape Width, 13--inch Reel
Package
NI--1230S--4L2L
1. Part internally matched both on input and output.
2. Measurement made with device in an asymmetrical Doherty configuration.
3. P3dB = Pavg + 7.0 dB where Pavg is the average output power measured using an unclipped W--CDMA single--carrier input signal where
output PAR is compressed to 7.0 dB @ 0.01% probability on CCDF.
A3V09H521--24SR6
RF Device Data
NXP Semiconductors
3
C12
VGGA
VDDA
C14
C1
C13
C2
R2
D119008
C16
C4
C3
R1
A3V09H521-24S
Rev. 0
C32
C29
C30
C20
C22*
cut out
area
C9
C6
C21
P
C8
C7
C18
C19
C
C5
Z1
C17
C15
C31
C23
C33
R3
C10
C24
C25*
C26
C 11
C27
VGGB
C28
VDDB
*C22 and C25 are mounted vertically.
aaa--033075
Figure 2. A3V09H521--24SR6 Test Circuit Component Layout
Table 6. A3V09H521--24SR6 Test Circuit Component Designations and Values
Part
Description
Part Number
Manufacturer
C1, C11, C13, C14, C16, C24,
C26, C27
10 F Chip Capacitor
C5750X7S2A106M230KB
TDK
C2, C5, C8, C10, C15, C18, C19
39 pF Chip Capacitor
ATC600F390JT250XT
ATC
C3, C30
3.3 pF Chip Capacitor
ATC600F3R3BT250XT
ATC
C4, C9
8.2 pF Chip Capacitor
ATC600F8R2BT250XT
ATC
C6
2.7 pF Chip Capacitor
ATC600F2R7BT250XT
ATC
C7
5.6 pF Chip Capacitor
ATC600F5R6BT250XT
ATC
C12, C28
470 F, 100 V Electrolytic Capacitor
MCGPR100V477M16X32
Multicomp
C17, C32
3.0 pF Chip Capacitor
ATC600F3R0BT250XT
ATC
C20, C23
4.7 pF Chip Capacitor
ATC600F4R7BT250XT
ATC
C21
4.3 pF Chip Capacitor
ATC600F4R3BT250XT
ATC
C22
22 pF Chip Capacitor
ATC100B220JT500XT
ATC
C25
39 pF Chip Capacitor
ATC100B390JT500XT
ATC
C29
1.2 pF Chip Capacitor
ATC600F1R2BT250XT
ATC
C31
1.5 pF Chip Capacitor
ATC600F1R5BT250XT
ATC
C33
110 pF Chip Capacitor
ATC100B111JT300XT
ATC
R1
50 , 4 W Chip Resistor
CW12010T0050GBK
ATC
R2, R3
6.8 , 1/4 W Chip Resistor
CRCW12066R80FKEA
Vishay
Z1
800–1000 MHz, 90, 2 dB Asymmetric Coupler
CMX09Q02
RN2 Technologies
PCB
RO4350B, 0.020, r = 3.66
D119008
MTL
A3V09H521--24SR6
4
RF Device Data
NXP Semiconductors
PACKAGE DIMENSIONS
A3V09H521--24SR6
RF Device Data
NXP Semiconductors
5
A3V09H521--24SR6
6
RF Device Data
NXP Semiconductors
PRODUCT DOCUMENTATION, SOFTWARE AND TOOLS
Refer to the following resources to aid your design process.
Application Notes
AN1908: Solder Reflow Attach Method for High Power RF Devices in Air Cavity Packages
AN1955: Thermal Measurement Methodology of RF Power Amplifiers
Engineering Bulletins
EB212: Using Data Sheet Impedances for RF LDMOS Devices
Software
Electromigration MTTF Calculator
.s2p File
Development Tools
Printed Circuit Boards
To Download Resources Specific to a Given Part Number:
1. Go to http://www.nxp.com/RF
2. Search by part number
3. Click part number link
4. Choose the desired resource from the drop down menu
REVISION HISTORY
The following table summarizes revisions to this document.
Revision
Date
0
Feb. 2019
Description
Initial release of data sheet
A3V09H521--24SR6
RF Device Data
NXP Semiconductors
7
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E 2019 NXP B.V.
A3V09H521--24SR6
Document Number: A3V09H521--24S
Rev. 0, 02/2019
8
RF Device Data
NXP Semiconductors