HEF4511B
BCD to 7-segment latch/decoder/driver
Rev. 7 — 11 November 2011
Product data sheet
1. General description
The HEF4511B is a BCD to 7-segment latch/decoder/driver with four address inputs
(D0 to D3), an active HIGH latch enable input (LE), an active LOW ripple blanking input
(BL), an active LOW lamp test input (LT), and seven active HIGH NPN bipolar transistor
segment outputs (Qa to Qg).
When LE is LOW and BL is HIGH, the state of the segment outputs (Qa to Qg) is
determined by the data on D0 to D3. When LE goes HIGH, the last data present on D0 to
D3 is stored in the latches and the segment outputs remain unchanged. When LT is LOW,
all of the segment outputs are HIGH independent of all other input conditions. With LT
HIGH, a LOW on BL forces all segment outputs LOW. The inputs LT and BL do not affect
the latch circuit.
It operates over a recommended VDD power supply range of 3 V to 15 V referenced to VSS
(usually ground). Unused inputs must be connected to VDD, VSS, or another input.
2. Features and benefits
Fully static operation
5 V, 10 V, and 15 V parametric ratings
Standardized symmetrical output characteristics
Specified from 40 C to +85 C and 40 C to +125 C
Complies with JEDEC standard JESD 13-B
3. Ordering information
Table 1.
Ordering information
All types operate from 40 C to +125 C.
Type number
Package
Name
Description
Version
HEF4511BP
DIP16
plastic dual in-line package; 16 leads (300 mil)
SOT38-4
HEF4511BT
SO16
plastic small outline package; 16 leads; body width 3.9 mm
SOT109-1
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
4. Functional diagram
7
1
2
6
D0
D1
D2
D3
5 LE
LATCHES
4 BL
DECODER
3 LT
DRIVERS
Qg
Qf
Qe
Qd
Qc
Qb
Qa
14
15
9
10
11
12
13
001aae675
Fig 1.
Functional diagram
VDD
driver
logic
IOH
+
VOH
−
VSS
Fig 2.
001aae677
Schematic diagram of output stage
HEF4511B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
2 of 20
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D1
D
Q
D2
D
Q
D
latch
CP 2
latch
CP 1
Q
D3
Q
Q
BL
D
latch
CP 3
NXP Semiconductors
HEF4511B
Product data sheet
D0
Q
latch
CP 4
Q
Q
LE
Rev. 7 — 11 November 2011
Qf
Qe
Qd
Qc
Qb
Qa
3 of 20
© NXP B.V. 2011. All rights reserved.
001aae679
Fig 3.
Logic diagram
HEF4511B
Qg
BCD to 7-segment latch/decoder/driver
All information provided in this document is subject to legal disclaimers.
LT
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
5. Pinning information
5.1 Pinning
HEF4511B
D1
1
16 VDD
D2
2
15 Qf
LT
3
14 Qg
BL
4
13 Qa
LE
5
12 Qb
D3
6
11 Qc
D0
7
10 Qd
VSS
8
9
Qe
001aae676
Fig 4.
Pin configuration DIP16 and SO16
5.2 Pin description
Table 2.
Pin description
Symbol
Pin
Description
LT
3
lamp test input (active LOW)
BL
4
ripple blanking input (active LOW)
LE
5
latch enable input (active HIGH)
D0 to D3
7, 1, 2, 6
address (data) input
VSS
8
ground supply voltage
Qa to Qg
13, 12, 11, 10, 9, 15, 14
segment output
VDD
16
supply voltage
HEF4511B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
4 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
6. Functional description
Function table[1]
Table 3.
Inputs
Outputs
Display
LE
BL
LT
D3
D2
D1
D0
Qa
Qb
Qc
Qd
Qe
Qf
Qg
X
X
L
X
X
X
X
H
H
H
H
H
H
H
X
L
H
X
X
X
X
L
L
L
L
L
L
L
blank
L
H
H
L
L
L
L
H
H
H
H
H
H
L
0
L
H
H
L
L
L
H
L
H
H
L
L
L
L
1
L
H
H
L
L
H
L
H
H
L
H
H
L
H
2
L
H
H
L
L
H
H
H
H
H
H
L
L
H
3
L
H
H
L
H
L
L
L
H
H
L
L
H
H
4
L
H
H
L
H
L
H
H
L
H
H
L
H
H
5
L
H
H
L
H
H
L
L
L
H
H
H
H
H
6
L
H
H
L
H
H
H
H
H
H
L
L
L
L
7
L
H
H
H
L
L
L
H
H
H
H
H
H
H
8
L
H
H
H
L
L
H
H
H
H
L
L
H
H
9
L
H
H
H
L
H
X
L
L
L
L
L
L
L
blank
L
H
H
H
H
X
X
L
L
L
L
L
L
L
blank
H
H
H
X
X
X
X
N.C.
N.C.
N.C.
N.C.
N.C.
N.C.
N.C.
N.C.
[1]
8
H = HIGH voltage level; L = LOW voltage level; X = don’t care; N.C. = no change.
a
f
e
g
d
b
c
001aaj494
Fig 5.
Seven segment digital display with segment designation
HEF4511B
Product data sheet
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Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
5 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
7. Limiting values
Table 4.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
VDD
supply voltage
IIK
input clamping current
VI
input voltage
IOK
output clamping current
II/O
input/output current
Conditions
VI < 0.5 V or VI > VDD + 0.5 V
VO < 0.5 V or VO > VDD + 0.5 V
Min
Max
Unit
0.5
+18
V
-
10
mA
0.5
VDD + 0.5
V
-
10
mA
-
10
mA
IOH
HIGH-level output current
25
-
mA
IDD
supply current
-
50
mA
Tstg
storage temperature
65
+150
C
Tamb
ambient temperature
40
+125
C
Ptot
total power dissipation
P
[1]
Tamb = 125 C
power dissipation
DIP16 package
[2]
-
750
mW
SO16 package
[3]
-
500
mW
-
100
mW
per output
[1]
A destructive high current mode may occur if VI and VO are not constrained to the range VSS VI or VO VDD.
[2]
For DIP16 package: Ptot derates linearly with 12 mW/K above 70 C.
[3]
For SO16 package: Ptot derates linearly with 8 mW/K above 70 C.
8. Recommended operating conditions
Table 5.
Recommended operating conditions
Symbol
Parameter
VDD
supply voltage
3
VI
input voltage
0
Tamb
ambient temperature
in free air
40
t/V
input transition rise and fall rate
VDD = 5 V
-
HEF4511B
Product data sheet
Conditions
Min
Typ
Max
Unit
-
15
V
-
VDD
V
-
+125
C
-
3.75
s/V
VDD = 10 V
-
-
0.5
s/V
VDD = 15 V
-
-
0.08
s/V
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
6 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
9. Static characteristics
Table 6.
Static characteristics
VSS = 0 V; VI = VSS or VDD; unless otherwise specified.
Symbol Parameter
VIH
VIL
HIGH-level
input voltage
LOW-level
input voltage
Conditions
IO < 1 A
HIGH-level
output voltage
see Table 7
VOL
LOW-level
output voltage
IO < 1 A
IOL
HIGH-level
output current
LOW-level
output current
II
input leakage
current
IDD
supply current
CI
input
capacitance
HEF4511B
Product data sheet
Tamb = 40 C Tamb = +25 C
Tamb = +85 C
Tamb = +125 C Unit
Min
Max
Min
Max
Min
Max
Min
Max
5V
3.5
-
3.5
-
3.5
-
3.5
-
V
10 V
7.0
-
7.0
-
7.0
-
7.0
-
V
15 V
11.0
-
11.0
-
11.0
-
11.0
-
V
5V
-
1.5
-
1.5
-
1.5
-
1.5
V
10 V
-
3.0
-
3.0
-
3.0
-
3.0
V
15 V
-
4.0
-
4.0
-
4.0
-
4.0
V
-
-
-
-
-
-
-
-
-
-
IO < 1 A
VOH
IOH
VDD
5V
-
0.05
-
0.05
-
0.05
-
0.05
V
10 V
-
0.05
-
0.05
-
0.05
-
0.05
V
15 V
-
0.05
-
0.05
-
0.05
-
0.05
V
5V
-
1.7
-
1.4
-
1.1
-
1.1
mA
VO = 2.5 V
VO = 4.6 V
5V
-
0.64
-
0.5
-
0.36
-
0.36
mA
VO = 9.5 V
10 V
-
1.6
-
1.3
-
0.9
-
0.9
mA
VO = 13.5 V 15 V
-
4.2
-
3.4
-
2.4
-
2.4
mA
VO = 0.4 V
5V
0.64
-
0.5
-
0.36
-
0.36
-
mA
VO = 0.5 V
10 V
1.6
-
1.3
-
0.9
-
0.9
-
mA
VO = 1.5 V
15 V
4.2
-
3.4
-
2.4
-
2.4
-
mA
15 V
-
0.1
-
0.1
-
1.0
-
1.0
A
5V
-
5
-
5
-
150
-
150
A
10 V
-
10
-
10
-
300
-
300
A
15 V
-
20
-
20
-
600
-
600
A
-
-
-
-
7.5
-
-
-
-
pF
IO = 0 A
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Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
7 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
Table 7.
Static characteristics for VOH
VSS = 0 V.
Symbol
Parameter
VOH
HIGH-level
output voltage
VDD
Tamb = 40 C
mA
V
Min
Min
0
5V
4.10
4.10
10 V
9.10
15 V
IOH
5
10
15
20
25
Tamb = +25 C
Tamb = +85 C
Tamb = +125 C
Typ
Min
Min
4.40
4.10
4.10
V
9.10
9.90
9.10
9.10
V
14.10
14.10
14.40
14.10
14.10
V
Unit
5V
-
-
4.30
-
-
V
10 V
-
-
9.30
-
-
V
15 V
-
-
14.30
-
-
V
5V
3.60
3.60
4.25
3.30
3.20
V
10 V
8.75
8.75
9.25
8.45
8.35
V
15 V
13.75
13.75
14.30
13.45
13.35
V
5V
-
-
4.20
-
-
V
10 V
-
-
9.20
-
-
V
15 V
-
-
14.20
-
-
V
5V
2.80
2.80
4.20
2.50
2.30
V
10 V
8.10
8.10
9.20
7.80
7.60
V
15 V
13.10
13.10
14.20
12.80
12.60
V
5V
-
-
4.15
-
-
V
10 V
-
-
9.20
-
-
V
15 V
-
-
14.20
-
-
V
10. Dynamic characteristics
Table 8.
Dynamic characteristics
VSS = 0 V; Tamb = 25 C; for test circuit see Figure 8.
Extrapolation formula[1]
Min
Typ
Max
5V
128 ns + (0.55 ns/pF)CL
-
155
310
ns
10 V
49 ns + (0.23 ns/pF)CL
-
60
120
ns
15 V
32 ns + (0.16 ns/pF)CL
-
40
80
ns
5V
133 ns + (0.55 ns/pF)CL
-
160
320
ns
10 V
49 ns + (0.23 ns/pF)CL
-
60
120
ns
15 V
37 ns + (0.16 ns/pF)CL
-
45
90
ns
5V
93 ns + (0.55 ns/pF)CL
-
120
240
ns
10 V
39 ns + (0.23 ns/pF)CL
-
50
100
ns
15 V
27 ns + (0.16 ns/pF)CL
-
35
70
ns
5V
52 ns + (0.55 ns/pF)CL
-
80
160
ns
10 V
19 ns + (0.23 ns/pF)CL
-
30
60
ns
15 V
12 ns + (0.16 ns/pF)CL
-
20
40
ns
Symbol
Parameter
Conditions
VDD
tPHL
HIGH to LOW
propagation delay
Dn Qn;
see Figure 6
LE Qn;
see Figure 6
BL Qn;
see Figure 6
LT Qn;
see Figure 6
HEF4511B
Product data sheet
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Rev. 7 — 11 November 2011
Unit
© NXP B.V. 2011. All rights reserved.
8 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
Table 8.
Dynamic characteristics …continued
VSS = 0 V; Tamb = 25 C; for test circuit see Figure 8.
Symbol
Parameter
Conditions
tPLH
LOW to HIGH
propagation delay
Dn Qn;
see Figure 6
LE Qn;
see Figure 6
BL Qn;
see Figure 6
LT Qn;
see Figure 6
HIGH to LOW output see Figure 6
transition time
tTHL
LOW to HIGH output see Figure 6
transition time
tTLH
set-up time
tsu
hold time
th
pulse width
tW
[1]
Extrapolation formula[1]
Min
Typ
Max
Unit
5V
108 ns + (0.55 ns/pF)CL
-
135
270
ns
10 V
44 ns + (0.23 ns/pF)CL
-
55
110
ns
15 V
32 ns + (0.16 ns/pF)CL
-
40
80
ns
5V
133 ns + (0.55 ns/pF)CL
-
160
320
ns
10 V
59 ns + (0.23 ns/pF)CL
-
70
140
ns
15 V
42 ns + (0.16 ns/pF)CL
-
50
100
ns
VDD
Dn LE;
see Figure 7
Dn LE;
see Figure 7
LE input LOW;
minimum width;
see Figure 7
5V
78 ns + (0.55 ns/pF)CL
-
105
210
ns
10 V
29 ns + (0.23 ns/pF)CL
-
40
80
ns
15 V
22 ns + (0.16 ns/pF)CL
-
30
60
ns
5V
33 ns + (0.55 ns/pF)CL
-
60
120
ns
10 V
19 ns + (0.23 ns/pF)CL
-
30
60
ns
15 V
17 ns + (0.16 ns/pF)CL
-
25
50
ns
5V
10 ns + (1.00 ns/pF)CL
-
60
120
ns
10 V
9 ns + (0.42 ns/pF)CL
-
30
60
ns
15 V
6 ns + (0.28 ns/pF)CL
-
20
40
ns
5V
20 ns + (1.00 ns/pF)CL
-
25
50
ns
10 V
13 ns + (0.06 ns/pF)CL
-
16
32
ns
15 V
10 ns + (0.06 ns/pF)CL
-
13
26
ns
5V
50
25
-
ns
10 V
25
12
-
ns
15 V
20
9
-
ns
5V
60
30
-
ns
10 V
30
15
-
ns
15 V
25
12
-
ns
5V
80
40
-
ns
10 V
40
20
-
ns
15 V
35
17
-
ns
The typical values of the propagation delay and transition times are calculated from the extrapolation formulas shown (CL in pF).
Table 9.
Dynamic power dissipation PD
PD can be calculated from the formulas shown. VSS = 0 V; tr = tf 20 ns; Tamb = 25 C.
Symbol
PD
Parameter
dynamic power
dissipation
VDD
Typical formula for PD (W)
where:
5V
PD = 1000 fi + (fo CL) VDD
2
10 V
PD = 4000 fi + (fo CL) VDD
2
15 V
PD = 10000 fi + (fo CL)
VDD2
fi = input frequency in MHz;
fo = output frequency in MHz;
CL = output load capacitance in pF;
VDD = supply voltage in V;
(fo CL) = sum of the outputs.
HEF4511B
Product data sheet
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Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
9 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
11. Waveforms
VI
LE
VM
VM
VSS
VI
VM
D2
VSS
VI
LT
VSS
tPHL
VI
VM
BL
VSS
tPLH
tPHL
VOH
tPLH
tPHL
tPLH
tPLH
tPHL
90 %
VM
Qg
10 %
VOL
tTHL
tTLH
001aaj495
Conditions: D3 = LOW and D0 = D1 = HIGH.
Measurement points are given in Table 10.
Fig 6.
Propagation delays and output transition times
HEF4511B
Product data sheet
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Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
10 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
VI
VM
LE input
VSS
tW
VI
D2 input
VM
VSS
tsu
th
VOH
Qg output
VOL
001aae682
The shaded area indicates where the input is permitted to change for predictable output performance.
Conditions: D3 = LOW and D0 = D1 = BL = LT = HIGH.
Measurement points are given in Table 10.
Fig 7.
Waveforms showing minimum LE pulse width, set-up, and hold time for Dn to LE
HEF4511B
Product data sheet
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Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
11 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
tW
VI
90 %
90 %
negative
pulse
VM
VM
10 %
0V
10 %
tf
tr
tr
tf
VI
90 %
positive
pulse
90 %
VM
VM
10 %
0V
10 %
tW
001aaj781
a. Input waveforms
VDD
VI
VO
G
DUT
RT
CL
001aag182
b. Test circuit
Test data is given in Table 10.
Definitions for test circuit:
DUT = Device Under Test.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
Fig 8.
Test circuit for measuring switching times
Table 10.
Measurement points and test data
Supply voltage
5 V to 15 V
HEF4511B
Product data sheet
Input
Load
VI
VM
tr, tf
CL
VDD
0.5VI
20 ns
50 pF
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Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
12 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
12. Application information
•
•
•
•
•
Driving LED displays
Driving incandescent displays
Driving fluorescent displays
Driving LCD displays
Driving gas discharge displays
common anode
LED
VDD
VDD
≈ 1.7 V
common cathode
LED
≈ 1.7 V
VSS
VSS
001aae683
Fig 9.
Connection to common cathode LED display
readout
001aae684
Fig 10. Connection to common anode LED display
readout
VDD
VDD
VDD
direct
(low brightness)
(1)
to
filament
supply
VSS
VSS
VSS
001aae685
001aae686
(1) A filament pre-warm resistor is recommended to
reduce filament thermal shock and increase the effective
cold resistance of the filament.
Fig 11. Connection to incandescent display readout
HEF4511B
Product data sheet
Fig 12. Connection to fluorescent display readout
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Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
13 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
VDD
appropriate
voltage
exitation
VDD
(square wave;
VSS to VDD)
1/4 HEF4070B
VSS
VSS
001aae687
001aae688
Direct DC drive of LCDs not recommended for life of
LCD readouts.
Fig 13. Connection to gas discharge display readout
HEF4511B
Product data sheet
Fig 14. Connection to LCD readout
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Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
14 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
13. Package outline
DIP16: plastic dual in-line package; 16 leads (300 mil)
SOT38-4
ME
seating plane
D
A2
A
A1
L
c
e
Z
w M
b1
(e 1)
b
b2
MH
9
16
pin 1 index
E
1
8
0
5
10 mm
scale
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
UNIT
A
max.
A1
min.
A2
max.
b
b1
b2
c
D (1)
E (1)
e
e1
L
ME
MH
w
Z (1)
max.
mm
4.2
0.51
3.2
1.73
1.30
0.53
0.38
1.25
0.85
0.36
0.23
19.50
18.55
6.48
6.20
2.54
7.62
3.60
3.05
8.25
7.80
10.0
8.3
0.254
0.76
inches
0.17
0.02
0.13
0.068
0.051
0.021
0.015
0.049
0.033
0.014
0.009
0.77
0.73
0.26
0.24
0.1
0.3
0.14
0.12
0.32
0.31
0.39
0.33
0.01
0.03
Note
1. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included.
OUTLINE
VERSION
REFERENCES
IEC
JEDEC
JEITA
EUROPEAN
PROJECTION
ISSUE DATE
95-01-14
03-02-13
SOT38-4
Fig 15. Package outline SOT38-4 (DIP16)
HEF4511B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
15 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
SO16: plastic small outline package; 16 leads; body width 3.9 mm
SOT109-1
D
E
A
X
c
y
HE
v M A
Z
16
9
Q
A2
A
(A 3)
A1
pin 1 index
θ
Lp
1
L
8
e
0
detail X
w M
bp
2.5
5 mm
scale
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
UNIT
A
max.
A1
A2
A3
bp
c
D (1)
E (1)
e
HE
L
Lp
Q
v
w
y
Z (1)
mm
1.75
0.25
0.10
1.45
1.25
0.25
0.49
0.36
0.25
0.19
10.0
9.8
4.0
3.8
1.27
6.2
5.8
1.05
1.0
0.4
0.7
0.6
0.25
0.25
0.1
0.7
0.3
0.01
0.019 0.0100 0.39
0.014 0.0075 0.38
0.039
0.016
0.028
0.020
inches
0.010 0.057
0.069
0.004 0.049
0.16
0.15
0.05
0.244
0.041
0.228
0.01
0.01
0.028
0.004
0.012
θ
8o
o
0
Note
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.
REFERENCES
OUTLINE
VERSION
IEC
JEDEC
SOT109-1
076E07
MS-012
JEITA
EUROPEAN
PROJECTION
ISSUE DATE
99-12-27
03-02-19
Fig 16. Package outline SOT109-1 (SO16)
HEF4511B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
16 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
14. Revision history
Table 11.
Revision history
Document ID
Release date
Data sheet status
Change notice
Supersedes
HEF4511B v.7
20111111
Product data sheet
-
HEF4511B v.6
Modifications:
•
•
Section Applications removed
Table 6: IOH minimum values changed to maximum
HEF4511B v.6
20091207
Product data sheet
-
HEF4511B v.5
HEF4511B v.5
20090813
Product data sheet
-
HEF4511B v.4
HEF4511B v.4
20090305
Product data sheet
-
HEF4511B_CNV v.3
HEF4511B_CNV v.3
19950101
Product specification
-
HEF4511B_CNV v.2
HEF4511B_CNV v.2
19950101
Product specification
-
-
HEF4511B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
17 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
15. Legal information
15.1 Data sheet status
Document status[1][2]
Product status[3]
Definition
Objective [short] data sheet
Development
This document contains data from the objective specification for product development.
Preliminary [short] data sheet
Qualification
This document contains data from the preliminary specification.
Product [short] data sheet
Production
This document contains the product specification.
[1]
Please consult the most recently issued document before initiating or completing a design.
[2]
The term ‘short data sheet’ is explained in section “Definitions”.
[3]
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
15.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to offer functions and qualities beyond those described in the
Product data sheet.
15.3 Disclaimers
Limited warranty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liability for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and operation of their applications
and products using NXP Semiconductors products, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suitable and fit for the customer’s applications and
products planned, as well as for the planned application and use of
customer’s third party customer(s). Customers should provide appropriate
design and operating safeguards to minimize the risks associated with their
applications and products.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party customer(s). Customer is responsible for doing all necessary
testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individual agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
No offer to sell or license — Nothing in this document may be interpreted or
construed as an offer to sell products that is open for acceptance or the grant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property rights.
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
HEF4511B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
18 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
Non-automotive qualified products — Unless this data sheet expressly
states that this specific NXP Semiconductors product is automotive qualified,
the product is not suitable for automotive use. It is neither qualified nor tested
in accordance with automotive testing or application requirements. NXP
Semiconductors accepts no liability for inclusion and/or use of
non-automotive qualified products in automotive equipment or applications.
NXP Semiconductors’ specifications such use shall be solely at customer’s
own risk, and (c) customer fully indemnifies NXP Semiconductors for any
liability, damages or failed product claims resulting from customer design and
use of the product for automotive applications beyond NXP Semiconductors’
standard warranty and NXP Semiconductors’ product specifications.
In the event that customer uses the product for design-in and use in
automotive applications to automotive specifications and standards, customer
(a) shall use the product without NXP Semiconductors’ warranty of the
product for such automotive applications, use and specifications, and (b)
whenever customer uses the product for automotive applications beyond
15.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
16. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
HEF4511B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 11 November 2011
© NXP B.V. 2011. All rights reserved.
19 of 20
HEF4511B
NXP Semiconductors
BCD to 7-segment latch/decoder/driver
17. Contents
1
2
3
4
5
5.1
5.2
6
7
8
9
10
11
12
13
14
15
15.1
15.2
15.3
15.4
16
17
General description . . . . . . . . . . . . . . . . . . . . . . 1
Features and benefits . . . . . . . . . . . . . . . . . . . . 1
Ordering information . . . . . . . . . . . . . . . . . . . . . 1
Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2
Pinning information . . . . . . . . . . . . . . . . . . . . . . 4
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 4
Functional description . . . . . . . . . . . . . . . . . . . 5
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 6
Recommended operating conditions. . . . . . . . 6
Static characteristics. . . . . . . . . . . . . . . . . . . . . 7
Dynamic characteristics . . . . . . . . . . . . . . . . . . 8
Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Application information. . . . . . . . . . . . . . . . . . 13
Package outline . . . . . . . . . . . . . . . . . . . . . . . . 15
Revision history . . . . . . . . . . . . . . . . . . . . . . . . 17
Legal information. . . . . . . . . . . . . . . . . . . . . . . 18
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 18
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Contact information. . . . . . . . . . . . . . . . . . . . . 19
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
© NXP B.V. 2011.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 11 November 2011
Document identifier: HEF4511B