HEF4952B

HEF4952B Dual 3-channel analog multiplexer/demultiplexer with supplementary switches Rev. 03 — 16 December 2009 Product data sheet 1. General description The HEF4952B is a dual 3-channel analog multiplexer/demultiplexer with supplementary switches and common select logic. Each switch features three independent inputs/outputs (pins nY0, nY1 and nY2) an input/output nY3 that can be connected to nY2 or VSS and an input/output (nZ) common to nY0, nY1 and nY2. Three digital select inputs (S1, S2 and S3) are common to both switches. Inputs include clamp diodes, this enables the use of current limiting resistors to interface inputs in excess of VDD. VSS and VDD are the digital control supply pins. The HEF4952B is suitable for use over the full industrial (−40 °C to +85 °C) temperature range. 2. Features Fully static operation 5 V, 10 V, and 15 V parametric ratings Schmitt-trigger action at control inputs Small signal switch Standardized symmetrical output characteristics Operates across the full industrial temperature range −40 °C to +85 °C Complies with JEDEC standard JESD 13-B 3. Applications Industrial Analog multiplexing and demultiplexing Digital multiplexing and demultiplexing Signal gating 4. Ordering information Table 1. Ordering information All types operate from −40 °C to +85 °C. Type number HEF4952BT Package Name SO16 Description plastic small outline package; 16 leads; body width 3.9 mm Version SOT109-1 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer 5. Functional diagram VDD 15 1Z 16 S1 7 14 S2 9 3-TO-5 DECODER LOGIC LEVEL CONVERTER 1Y0 1Y1 12 1Y2 S3 10 11 1Y3 VSS VEE VSS 2 2Z 1 2Y0 3 2Y1 5 2Y2 6 2Y3 VSS 001aad872 Fig 1. Functional diagram HEF4952B_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 16 December 2009 2 of 15 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer logic level converter 1Z S1 1Y0 1SY0 S2 1SY1 1Y2 1SY2 1Y1 S3 1Y3 1SY3 1SY4 VSS 2Z 2Y0 2SY0 2Y1 2SY1 2Y2 2SY2 2Y3 2SY3 2SY4 VSS 001aad873 Fig 2. Logic diagram HEF4952B_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 16 December 2009 3 of 15 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer 6. Pinning information 6.1 Pinning HEF4952B 2Y0 2Z 2Y1 VEE 2Y2 2Y3 S1 VSS 1 2 3 4 5 6 7 8 001aad871 16 1Y0 15 1Z 14 1Y1 13 VDD 12 1Y2 11 1Y3 10 S3 9 S2 Fig 3. Pin configuration 6.2 Pin description Table 2. Symbol VEE VSS S1, S2, S3 1Y0, 1Y1, 1Y2, 1Y3, 2Y0, 2Y1, 2Y2, 2Y3 1Z, 2Z VDD Pin description Pin 4 8 7, 9, 10 16, 14, 12, 11, 1, 3, 5, 6 15, 2 13 Description supply voltage ground supply voltage select input independent input or output common output or input supply voltage HEF4952B_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 16 December 2009 4 of 15 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer 7. Functional description 7.1 Function table Table 3. Input S3 L L L L H H H H [1] Function table Switch S2 L L H H L L H H S1 L H L H L H L H nSY0 open nY0 to nZ open nY0 to nZ open nY0 to nZ open open nSY1 nY1 to nZ open open open nY1 to nZ open open open nSY2 open open nY2 to nZ nY2 to nZ open open nY2 to nZ open nSY3 open open open open nY2 to nY3 nY2 to nY3 nY2 to nY3 nY2 to nY3 nSY4 nY3 to VSS nY3 to VSS nY3 to VSS nY3 to VSS open open open open H = HIGH voltage level; L = LOW voltage level. 8. Limiting values Table 4. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to VSS = 0 V (ground). Symbol VDD VEE IIK VI II/O IDD Tstg Tamb Ptot P [1] Parameter supply voltage supply voltage input clamping current input voltage input/output current supply current storage temperature ambient temperature total power dissipation power dissipation Conditions referenced to VDD pins Sn; VI < −0.5 V or VI > VDD + 0.5 V [1] Min −0.5 −18 −0.5 −65 −40 Max +18 +0.5 ±10 VDD + 0.5 ±10 50 +150 +85 500 100 Unit V V mA V mA mA °C °C mW mW Tamb = −40 °C to +85 °C per output [2] - To avoid drawing VDD current out of terminal Z, when switch current flows into terminals Y, the voltage drop across the bidirectional switch must not exceed 0.4 V. If the switch current flows into terminal Z, no VDD current will flow out of terminals Y, and in this case there is no limit for the voltage drop across the switch, but the voltages at Y and Z may not exceed VDD or VEE. For SO16 package: Ptot derates linearly with 8 mW/K above 70 °C. [2] HEF4952B_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 16 December 2009 5 of 15 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer 9. Recommended operating conditions Table 5. Symbol VDD VEE VI Tamb Recommended operating conditions Parameter supply voltage supply voltage input voltage ambient temperature in free air Conditions see Figure 4 see Figure 4 Min 5 -15 0 −40 Typ Max 15 0 VDD +85 Unit V V V °C 15 VDD − VSS (V) 10 001aad874 operating area 5 0 0 5 10 VDD − VEE (V) 15 Fig 4. Operating area as a function of the supply voltages 10. Static characteristics Table 6. Static characteristics VSS = VEE = 0 V; VI = VSS or VDD unless otherwise specified. Symbol II IS(OFF) IDD Parameter input leakage current OFF-state leakage current supply current Y port; per channel; see Figure 5 IO = 0 A Conditions VDD 15 V 15 V 5V 10 V 15 V CI input capacitance Sn inputs Tamb = −40 °C Min Max ±0.3 20 40 80 Tamb = 25 °C Min Max ±0.3 200 20 40 80 7.5 Tamb = 85 °C Min Max ±1.0 150 300 600 μA nA μA μA μA pF Unit HEF4952B_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 16 December 2009 6 of 15 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer 10.1 Test circuits VDD VDD or VSS S1 to S3 nZ Y0 nYn 1 2 switch IS VSS = VEE VI VO 001aak653 Fig 5. Test circuit for measuring OFF-state leakage current nYn port 10.2 On resistance Table 7. ON resistance Tamb = 25 °C; ISW = 200 μA; VSS = VEE = 0 V. Symbol RON Parameter ON resistance Conditions VI = 0 V; see Figure 6 and Figure 7 VI = 2.5 V; see Figure 6 and Figure 7 VI = 5.0 V; see Figure 6 and Figure 7 ΔRON ON resistance mismatch between channels VI = 2.5 V; see Figure 6 VDD − VEE 10 V 10 V 10 V 10 V Typ 45 65 110 10 Max 150 365 360 Unit Ω Ω Ω Ω 10.2.1 On resistance waveform and test circuit V VDD S1 to S3 nZ nYn VSS = VEE ISW VI VSW VDD or VSS 001aak654 RON = VSW / ISW. Fig 6. Test circuit for measuring RON HEF4952B_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 16 December 2009 7 of 15 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer 120 RON (Ω) 80 VDD = 10 V 001aad876 40 0 0 2 4 VI (V) 6 Fig 7. Typical RON as a function of input voltage 11. Dynamic characteristics Table 8. Dynamic characteristics Tamb = 25 °C; VSS = VEE = 0 V; for test circuit see Figure 10. Symbol tPHL Parameter HIGH to LOW propagation delay Conditions nYn, nZ to nZ, nYn; VI = 1.0 V; see Figure 8 VDD 5V 10 V 15 V tPLH LOW to HIGH propagation delay nYn, nZ to nZ, nYn; VI = 1.0 V; see Figure 8 5V 10 V 15 V tPZL OFF-state to LOW propagation delay Sn to nYn, nZ; VI =VEE; see Figure 9 5V 10 V 15 V tPZH OFF-state to HIGH propagation delay Sn to nYn, nZ; VI = 1.0 V; see Figure 9 5V 10 V 15 V Typ 5 3 2 5 3 2 125 50 35 125 50 35 Max 6 6 100 100 Unit ns ns ns ns ns ns ns ns ns ns ns ns HEF4952B_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 16 December 2009 8 of 15 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer 11.1 Waveforms and test circuit VI nYn or nZ input VEE tPLH VO VM tPHL nZ or nYn output VEE VM 001aak655 Measurement points are given in Table 9. Fig 8. nYn, nZ to nZ, nYn propagation delays VDD Sn input VSS tPZL nYn or nZ output LOW-to-OFF OFF-to-LOW VO 90 % VM VEE VO 10 % tPZH nYn or nZ output HIGH-to-OFF OFF-to-HIGH VEE switch ON 90 % 10 % switch OFF switch ON 001aak656 Measurement points are given in Table 9. Fig 9. Table 9. VDD Enable and disable times Measurement points Input VM 0.5VDD Output VM 0.5VDD Supply voltage 5 V to 15 V HEF4952B_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 16 December 2009 9 of 15 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer tW VI negative pulse 0V 90 % VM 10 % tf tr VI positive pulse 0V 10 % 90 % VM tW 1.0 V VDD VI PULSE GENERATOR VI VO RL S1 VM tr tf VM DUT RT CL open VSS VEE 001aak780 Test data is given in Table 10. Definitions: DUT = Device Under Test. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including test jig and probe. RL = Load resistance. Fig 10. Test circuit for measuring switching times Table 10. Input nYn, nZ VI or VEE Sn VDD or VSS tr, tf ≤ 20 ns VM 0.5VDD Test data Load CL 50 pF RL 10 kΩ S1 position tPHL, tPLH VEE tPZH VEE tPZL 1.0 V Other VEE Table 11. Dynamic power dissipation PD PD can be calculated from the formulas shown; VEE = VSS = 0 V; tr = tf ≤ 20 ns; Tamb = 25 °C. Symbol PD Parameter dynamic power dissipation VDD 5V 10 V 15 V Typical formula for PD (μW) PD = 1300 × fi + Σ(fo × CL) × VDD2 PD = 6100 × fi + Σ(fo × CL) × VDD PD = 15600 × fi + Σ(fo × CL) × 2 Where: fi = input frequency in MHz; fo = output frequency in MHz; CL = output load capacitance in pF; VDD = supply voltage in V; Σ(fo × CL) = sum of the outputs. VDD2 HEF4952B_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 16 December 2009 10 of 15 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer 11.2 Transfer characteristics Table 12. Control input characteristics VSS = VEE = 0 V unless otherwise specified. Symbol Parameter VT+ VT− VH positive-going threshold voltage negative-going threshold voltage hysteresis voltage Conditions VDD = 5 V VDD = 10 V VDD = 5 V VDD = 10 V VDD = 5 V VDD = 10 V Tamb = 25 °C Min 1.03 2.10 0.16 0.11 Max 2.90 4.37 Tamb = −40 °C to +85 °C Min 1.00 2.00 0.10 0.10 Max 3.00 4.50 V V V V V V Unit HEF4952B_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 16 December 2009 11 of 15 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer 12. Package outline SO16: plastic small outline package; 16 leads; body width 3.9 mm SOT109-1 D E A X c y HE vMA Z 16 9 Q A2 pin 1 index θ Lp 1 8 A1 (A 3) A L wM detail X e bp 0 2.5 scale 5 mm DIMENSIONS (inch dimensions are derived from the original mm dimensions) UNIT mm inches A max. 1.75 A1 0.25 0.10 A2 1.45 1.25 A3 0.25 0.01 bp 0.49 0.36 c 0.25 0.19 D (1) 10.0 9.8 E (1) 4.0 3.8 0.16 0.15 e 1.27 0.05 HE 6.2 5.8 L 1.05 Lp 1.0 0.4 0.039 0.016 Q 0.7 0.6 0.028 0.020 v 0.25 0.01 w 0.25 0.01 y 0.1 Z (1) 0.7 0.3 θ o 0.010 0.057 0.069 0.004 0.049 0.019 0.0100 0.39 0.014 0.0075 0.38 0.244 0.041 0.228 0.028 0.004 0.012 8 o 0 Note 1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included. OUTLINE VERSION SOT109-1 REFERENCES IEC 076E07 JEDEC MS-012 JEITA EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-19 Fig 11. Package outline SOT109-1 (SO16) HEF4952B_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 16 December 2009 12 of 15 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer 13. Revision history Table 13. Revision history Release date 20091216 Data sheet status Product data sheet Change notice Supersedes HEF4952B_2 Document ID HEF4952B_3 Modifications: • • • • Title changed from 8-channel analog multiplexer/demultiplexer. Section 1 “General description” modified. Section 8 “Limiting values” IIK conditions updated. Abbreviations section removed. Product data sheet Product data sheet HEF4952B_1 - HEF4952B_2 HEF4952B_1 20091002 20060320 HEF4952B_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 16 December 2009 13 of 15 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer 14. Legal information 14.1 Data sheet status Document status[1][2] Objective [short] data sheet Preliminary [short] data sheet Product [short] data sheet [1] [2] [3] Product status[3] Development Qualification Production Definition This document contains data from the objective specification for product development. This document contains data from the preliminary specification. This document contains the product specification. Please consult the most recently issued document before initiating or completing a design. The term ‘short data sheet’ is explained in section “Definitions”. The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 14.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. 14.3 Disclaimers General — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental 14.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 15. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com HEF4952B_3 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 03 — 16 December 2009 14 of 15 NXP Semiconductors HEF4952B Dual 3-channel analog multiplexer/demultiplexer 16. Contents 1 2 3 4 5 6 6.1 6.2 7 7.1 8 9 10 10.1 10.2 10.2.1 11 11.1 11.2 12 13 14 14.1 14.2 14.3 14.4 15 16 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Ordering information . . . . . . . . . . . . . . . . . . . . . 1 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 4 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 4 Functional description . . . . . . . . . . . . . . . . . . . 5 Function table . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 5 Recommended operating conditions. . . . . . . . 6 Static characteristics. . . . . . . . . . . . . . . . . . . . . 6 Test circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 On resistance . . . . . . . . . . . . . . . . . . . . . . . . . . 7 On resistance waveform and test circuit. . . . . . 7 Dynamic characteristics . . . . . . . . . . . . . . . . . . 8 Waveforms and test circuit . . . . . . . . . . . . . . . . 9 Transfer characteristics . . . . . . . . . . . . . . . . . 11 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 12 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 13 Legal information. . . . . . . . . . . . . . . . . . . . . . . 14 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 14 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Contact information. . . . . . . . . . . . . . . . . . . . . 14 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2009. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com Date of release: 16 December 2009 Document identifier: HEF4952B_3