LPC2927FBD144

LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Rev. 02 — 22 June 2009 Preliminary data sheet 1. General description The LPC2927/2929 combine an ARM968E-S CPU core with two integrated TCM blocks operating at frequencies of up to 125 MHz, Full-speed USB 2.0 OTG and device controller, CAN and LIN, 56 kB SRAM, up to 768 kB flash memory, external memory interface, three 10-bit ADCs, and multiple serial and parallel interfaces in a single chip targeted at consumer, industrial, medical, and communication markets. To optimize system power consumption, the LPC2927/2929 has a very flexible Clock Generation Unit (CGU) that provides dynamic clock gating and scaling. 2. Features I ARM968E-S processor running at frequencies of up to 125 MHz maximum. I Multi-layer AHB system bus at 125 MHz with four separate layers. I On-chip memory: N Two Tightly Coupled Memories (TCM), 32 kB Instruction TCM (ITCM), 32 kB Data TCM (DTCM). N Two separate internal Static RAM (SRAM) instances; 32 kB SRAM and 16 kB SRAM. N 8 kB ETB SRAM also available for code execution and data. N Up to 768 kB high-speed flash-program memory. N 16 kB true EEPROM, byte-erasable and programmable. I Dual-master, eight-channel GPDMA controller on the AHB multi-layer matrix which can be used with the SPI interfaces and the UARTs, as well as for memory-to-memory transfers including the TCM memories. I External Static Memory Controller (SMC) with eight memory banks; up to 32-bit data bus; up to 24-bit address bus. I Serial interfaces: N USB 2.0 full-speed device/OTG controller with dedicated DMA controller and on-chip device PHY. N Two-channel CAN controller supporting FullCAN and extensive message filtering. N Two LIN master controllers with full hardware support for LIN communication. The LIN interface can be configured as UART to provide two additional UART interfaces. N Two 550 UARTs with 16-byte Tx and Rx FIFO depths, DMA support, and RS485/EIA-485 (9-bit) support. N Three full-duplex Q-SPIs with four slave-select lines; 16 bits wide; 8 locations deep; Tx FIFO and Rx FIFO. N Two I2C-bus interfaces. NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB I Other peripherals: N One 10-bit ADC with 5.0 V measurement range and eight input channels with conversion times as low as 2.44 µs per channel. N Two 10-bit ADCs, 8-channels each, with 3.3 V measurement range provide an additional 16 analog inputs with conversion times as low as 2.44 µs per channel. Each channel provides a compare function to minimize interrupts. N Multiple trigger-start option for all ADCs: timer, PWM, other ADC, and external signal input. N Four 32-bit timers each containing four capture-and-compare registers linked to I/Os. N Four six-channel PWMs (Pulse-Width Modulators) with capture and trap functionality. N Two dedicated 32-bit timers to schedule and synchronize PWM and ADC. N Quadrature encoder interface that can monitor one external quadrature encoder. N 32-bit watchdog with timer change protection, running on safe clock. I Up to 104 general-purpose I/O pins with programmable pull-up, pull-down, or bus keeper. I Vectored Interrupt Controller (VIC) with 16 priority levels. I Up to 21 level-sensitive external interrupt pins, including USB, CAN and LIN wake-up features. I Configurable clock-out pin for driving external system clocks. I Processor wake-up from power-down via external interrupt pins; CAN or LIN activity. I Flexible Reset Generator Unit (RGU) able to control resets of individual modules. I Flexible Clock-Generation Unit (CGU0) able to control clock frequency of individual modules: N On-chip very low-power ring oscillator; fixed frequency of 0.4 MHz; always on to provide a Safe_Clock source for system monitoring. N On-chip crystal oscillator with a recommended operating range from 10 MHz to 25 MHz. PLL input range 10 MHz to 25 MHz. N On-chip PLL allows CPU operation up to a maximum CPU rate of 125 MHz. N Generation of up to 11 base clocks. N Seven fractional dividers. I Second CGU (CGU1) with its own PLL generates USB clocks and a configurable clock output. I Highly configurable system Power Management Unit (PMU): N clock control of individual modules. N allows minimization of system operating power consumption in any configuration. I Standard ARM test and debug interface with real-time in-circuit emulator. I Boundary-scan test supported. I ETM/ETB debug functions with 8 kB of dedicated SRAM also accessible for application code and data storage. I Dual power supply: N CPU operating voltage: 1.8 V ± 5 %. N I/O operating voltage: 2.7 V to 3.6 V; inputs tolerant up to 5.5 V. I 144-pin LQFP package. I −40 °C to +85 °C ambient operating temperature range. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 2 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 3. Ordering information Table 1. Ordering information Package Name LPC2927FBD144 LPC2929FBD144 Description Version SOT486-1 SOT486-1 LQFP144 plastic low profile quad flat package; 144 leads; body 20 × 20 × 1.4 mm LQFP144 plastic low profile quad flat package; 144 leads; body 20 × 20 × 1.4 mm Type number 3.1 Ordering options Table 2. Part options Flash memory 512 kB 768 kB SRAM SMC USB UART OTG/ RS485 device yes yes 2 2 LIN 2.0/ UART 2 2 CAN Package Type number LPC2927FBD144 LPC2929FBD144 56 kB + 32-bit 2 × 32 kB TCM 56 kB + 32-bit 2 × 32 kB TCM 2 2 LQFP144 LQFP144 [1] Note that parts LPC2927 and LPC2929 are not fully pin compatible with parts LPC2917, LPC2919 and LPC2917/01, LPC2919/01. The MSCSS and timer blocks have a reduced pinout on the LPC2927/29. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 3 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 4. Block diagram JTAG interface LPC2927/2929 ITCM 32 kB TEST/DEBUG INTERFACE 8 kB SRAM DTCM 32 kB ARM968E-S 1 master 2 slaves master master GPDMA CONTROLLER VECTORED INTERRUPT CONTROLLER slave AHB TO DTL BRIDGE slave slave GPDMA REGISTERS master CLOCK GENERATION UNIT RESET GENERATION UNIT POWER MANAGEMENT UNIT AHB TO DTL BRIDGE power. clock, and reset subsystem slave slave USB OTG/DEVICE CONTROLLER EXTERNAL STATIC MEMORY CONTROLLER slave EMBEDDED SRAM 16 kB AHB MULTILAYER MATRIX slave EMBEDDED SRAM 32 kB slave EMBEDDED FLASH 512/768 kB slave AHB TO APB BRIDGE general subsystem SYSTEM CONTROL EVENT ROUTER CHIP FEATURE ID 16 kB EEPROM slave TIMER0/1 MTMR PWM0/1/2/3 3.3 V ADC1/2 5 V ADC0 QUADRATURE ENCODER slave CAN0/1 GLOBAL ACCEPTANCE FILTER UART/LIN0/1 I2C0/1 AHB TO APB BRIDGE networking subsystem AHB TO APB BRIDGE MSC subsystem slave AHB TO APB BRIDGE peripheral subsystem GENERAL PURPOSE I/O PORTS 0/1/2/3/5 TIMER 0/1/2/3 SPI0/1/2 RS485 UART0/1 WDT 002aae143 Grey-shaded blocks represent peripherals and memory regions accessible by the GPDMA. Fig 1. LPC2927/2929 block diagram LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 4 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 5. Pinning information 5.1 Pinning 144 109 108 73 37 72 002aae144 1 LPC2927FBD144 LPC2929FBD144 36 Fig 2. Pin configuration for SOT486-1 (LQFP144) 5.2 Pin description 5.2.1 General description The LPC2927/2929 uses five ports: port 0 with 32 pins, ports 1 and 2 with 28 pins each, port 3 with 16 pins, and port 5 with 2 pins. Port 4 is not used. The pin to which each function is assigned is controlled by the SFSP registers in the SCU. The functions combined on each port pin are shown in the pin description tables in this section. 5.2.2 LQFP144 pin assignment Table 3. Pin name LQFP144 pin assignment Pin Description Function 0 (default) TDO P2[21]/SDI2/ PCAP2[1]/D19 P0[24]/TXD1/ TXDC1/SCS2[0] P0[25]/RXD1/ RXDC1/SDO2 P0[26]/TXD1/SDI2 P0[27]/RXD1/SCK2 P0[28]/CAP0[0]/ MAT0[0] P0[29]/CAP0[1]/ MAT0[1] VDD(IO) P2[22]/SCK2/ PCAP2[2]/D20 LPC2927_29_2 Function 1 Function 2 Function 3 1[1] 2[1] 3[1] 4[1] 5[1] 6[1] 7[1] 8[1] 9 10[1] IEEE 1149.1 test data out GPIO 2, pin 21 GPIO 0, pin 24 GPIO 0, pin 25 GPIO 0, pin 26 GPIO 0, pin 27 GPIO 0, pin 28 GPIO 0, pin 29 3.3 V power supply for I/O GPIO 2, pin 22 SPI2 SCK PWM2 CAP2 EXTBUS D20 SPI2 SDI UART1 TXD UART1 RXD PWM2 CAP1 CAN1 TXD CAN1 RXD UART1 TXD UART1 RXD TIMER0 CAP0 TIMER0 CAP1 EXTBUS D19 SPI2 SCS0 SPI2 SDO SPI2 SDI SPI2 SCK TIMER0 MAT0 TIMER0 MAT1 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 5 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Table 3. Pin name LQFP144 pin assignment …continued Pin Description Function 0 (default) Function 1 SPI1 SCS0 SPI0 SCS3 SPI2 SCS1 SPI1 SCS1 SPI1 SCS2 Function 2 PWM3 CAP0 PWM1 MAT0 PWM1 MAT1 TIMER0 CAP2 TIMER0 CAP3 PWM3 CAP1 PWM3 CAP2 Function 3 EXTBUS D21 LIN1/UART TXD LIN1/UART RXD TIMER0 MAT2 TIMER0 MAT3 EXTBUS D22 EXTBUS D23 P2[23]/SCS1[0]/ PCAP3[0]/D21 P3[6]/SCS0[3]/ PMAT1[0]/TXDL1 P3[7]/SCS2[1]/ PMAT1[1]/RXDL1 P0[30]/CAP0[2]/ MAT0[2] P0[31]/CAP0[3]/ MAT0[3] P2[24]/SCS1[1]/ PCAP3[1]/D22 P2[25]/SCS1[2]/ PCAP3[2]/D23 VSS(IO) P5[19]/USB_D+ P5[18]/USB_D− VDD(IO) VDD(CORE) VSS(CORE) VSS(IO) P3[8]/SCS2[0]/ PMAT1[2] P3[9]/SDO2/ PMAT1[3] P2[26]/CAP0[2]/ MAT0[2]/EI6 P2[27]/CAP0[3]/ MAT0[3]/EI7 P1[27]/CAP1[2]/ TRAP2/PMAT3[3] P1[26]/PMAT2[0]/ TRAP3/PMAT3[2] VDD(IO) P1[25]/PMAT1[0]/ USB_VBUS/ PMAT3[1] P1[24]/PMAT0[0]/ USB_CONNECT/ PMAT3[0] P1[23]/RXD0/ USB_SSPND/CS5 11[1] 12[1] 13[1] 14[1] 15[1] 16[1] 17[1] 18 19[2] 20[2] 21 22 23 24 25[1] 26[1] 27[1] 28[1] 29[1] 30[1] 31 32[1] GPIO 2, pin 23 GPIO 3, pin 6 GPIO 3, pin 7 GPIO 0, pin 30 GPIO 0, pin 31 GPIO 2, pin 24 GPIO 2, pin 25 ground for I/O GPIO 5, pin 19 GPIO 5, pin 18 USB_D+ USB_D− - - 3.3 V power supply for I/O 1.8 V power supply for digital core ground for core ground for I/O GPIO 3, pin 8 GPIO 3, pin 9 GPIO 2, pin 26 GPIO 2, pin 27 GPIO 1, pin 27 GPIO 1, pin 26 SPI2 SCS0 SPI2 SDO TIMER0 CAP2 TIMER0 CAP3 PWM1 MAT2 PWM1 MAT3 TIMER0 MAT2 TIMER0 MAT3 EXTINT6 EXTINT7 PWM3 MAT3 PWM3 MAT2 TIMER1 CAP2, ADC2 PWM TRAP2 EXT START PWM2 MAT0 PWM TRAP3 3.3 V power supply for I/O GPIO 1, pin 25 PWM1 MAT0 USB_VBUS PWM3 MAT1 33[1] GPIO 1, pin 24 PWM0 MAT0 USB_CONNECT PWM3 MAT0 34[1] GPIO 1, pin 23 UART0 RXD USB_SSPND EXTBUS CS5 LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 6 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Table 3. Pin name LQFP144 pin assignment …continued Pin Description Function 0 (default) Function 1 UART0 TXD Function 2 USB_UP_LED Function 3 EXTBUS CS4 P1[22]/TXD0/ USB_UP_LED/ CS4 TMS TCK P1[21]/CAP3[3]/ CAP1[3]/D7 P1[20]/CAP3[2]/ SCS0[1]/D6 P1[19]/CAP3[1]/ SCS0[2]/D5 P1[18]/CAP3[0]/ SDO0/D4 P1[17]/CAP2[3]/ SDI0/D3 VSS(IO) P1[16]/CAP2[2]/ SCK0/D2 P2[0]/MAT2[0]/ TRAP3/D8 P2[1]/MAT2[1]/ TRAP2/D9 P3[10]/SDI2/ PMAT1[4] P3[11]/SCK2/ PMAT1[5]/USB_LS P1[15]/CAP2[1]/ SCS0[0]/D1 P1[14]/CAP2[0]/ SCS0[3]/D0 P1[13]/SCL1/ EI3/WE P1[12]/SDA1/ EI2/OE VDD(IO) P2[2]/MAT2[2]/ TRAP1/D10 P2[3]/MAT2[3]/ TRAP0/D11 P1[11]/SCK1/ SCL0/CS3 P1[10]/SDI1/ SDA0/CS2 P3[12]/SCS1[0]/EI4/ USB_SSPND LPC2927_29_2 35[1] GPIO 1, pin 22 36[1] 37[1] 38[1] 39[1] 40[1] 41[1] 42[1] 43 44[1] 45[1] 46[1] 47[1] 48[1] 49[1] 50[1] 51[1] 52[1] 53 54[1] 55[1] 56[1] 57[1] 58[1] IEEE 1149.1 test mode select, pulled up internally IEEE 1149.1 test clock GPIO 1, pin 21 GPIO 1, pin 20 GPIO 1, pin 19 GPIO 1, pin 18 GPIO 1, pin 17 ground for I/O GPIO 1, pin 16 GPIO 2, pin 0 GPIO 2, pin 1 GPIO 3, pin 10 GPIO 3, pin 11 GPIO 1, pin 15 GPIO 1, pin 14 GPIO 1, pin 13 GPIO 1, pin 12 TIMER2 CAP2 TIMER2 MAT0 TIMER2 MAT1 SPI2 SDI SPI2 SCK TIMER2 CAP1 TIMER2 CAP0 EXTINT3 EXTINT2 SPI0 SCK PWM TRAP3 PWM TRAP2 PWM1 MAT4 PWM1 MAT5 SPI0 SCS0 SPI0 SCS3 I2C1 SCL I2C1 SDA EXTBUS D2 EXTBUS D8 EXTBUS D9 USB_LS EXTBUS D1 EXTBUS D0 EXTBUS WE EXTBUS OE TIMER3 CAP3 TIMER3 CAP2 TIMER3 CAP1 TIMER3 CAP0 TIMER2 CAP3 TIMER1 CAP3, MSCSS PAUSE SPI0 SCS1 SPI0 SCS2 SPI0 SDO SPI0 SDI EXTBUS D7 EXTBUS D6 EXTBUS D5 EXTBUS D4 EXTBUS D3 3.3 V power supply for I/O GPIO 2, pin 2 GPIO 2, pin 3 GPIO 1, pin 11 GPIO 1, pin 10 GPIO 3, pin 12 TIMER2 MAT2 TIMER2 MAT3 SPI1 SCK SPI1 SDI SPI1 SCS0 PWM TRAP1 PWM TRAP0 I2C0 SCL I2C0 SDA EXTINT4 EXTBUS D10 EXTBUS D11 EXTBUS CS3 EXTBUS CS2 USB_SSPND © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 7 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Table 3. Pin name LQFP144 pin assignment …continued Pin Description Function 0 (default) Function 1 Function 2 Function 3 VSS(CORE) VDD(CORE) P3[13]/SDO1/ EI5/IDX0 P2[4]/MAT1[0]/ EI0/D12 P2[5]/MAT1[1]/ EI1/D13 P1[9]/SDO1/ RXDL1/CS1 VSS(IO) P1[8]/SCS1[0]/ TXDL1/CS0 59 60 61[1] 62[1] 63[1] 64[1] 65 66[1] ground for digital core 1.8 V power supply for digital core GPIO 3, pin 13 GPIO 2, pin 4 GPIO 2, pin 5 GPIO 1, pin 9 ground for I/O GPIO 1, pin 8 GPIO 1, pin 7 GPIO 1, pin 6 GPIO 2, pin 6 GPIO 1, pin 5 GPIO 1, pin 4 SPI1 SCS0 SPI1 SCS3 SPI1 SCS2 TIMER1 MAT2 SPI1 SCS1 SPI2 SCS2 LIN1 TXD/ UART TXD UART1 RXD UART1 TXD EXTINT2 PWM3 MAT5 PWM3 MAT4 EXTBUS CS0 EXTBUS A7 EXTBUS A6 EXTBUS D14 EXTBUS A5 EXTBUS A4 SPI1 SDO TIMER1 MAT0 TIMER1 MAT1 SPI1 SDO EXTINT5 EXTINT0 EXTINT1 LIN1 RXD/UART RXD QEI0 IDX EXTBUS D12 EXTBUS D13 EXTBUS CS1 P1[7]/SCS1[3]/RXD1/ 67[1] A7 P1[6]/SCS1[2]/ TXD1/A6 P2[6]/MAT1[2]/ EI2/D14 P1[5]/SCS1[1]/PMAT 3[5]/A5 P1[4]/SCS2[2]/PMAT 3[4]/A4 TRST RST VSS(OSC) XOUT_OSC XIN_OSC VDD(OSC_PLL) VSS(PLL) P2[7]/MAT1[3]/ EI3/D15 P3[14]/SDI1/ EI6/TXDC0 P3[15]/SCK1/ EI7/RXDC0 VDD(IO) P2[8]/CLK_OUT/ PMAT0[0]/SCS0[2] P2[9]/ USB_UP_LED/ PMAT0[1]/ SCS0[1] 68[1] 69[1] 70[1] 71[1] 72[1] 73[1] 74 75[3] 76[3] 77 78 79[1] 80[1] 81[1] 82 83[1] 84[1] IEEE 1149.1 test reset NOT; active LOW; pulled up internally asynchronous device reset; active LOW; pulled up internally ground for oscillator crystal out for oscillator crystal in for oscillator 1.8 V supply for oscillator and PLL ground for PLL GPIO 2, pin 7 GPIO 3, pin 14 GPIO 3, pin 15 TIMER1 MAT3 SPI1 SDI SPI1 SCK EXTINT3 EXTINT6 EXTINT7 EXTBUS D15 CAN0 TXD CAN0 RXD 3.3 V power supply for I/O GPIO 2, pin 8 GPIO 2, pin 9 CLK_OUT USB_UP_LED PWM0 MAT0 PWM0 MAT1 SPI0 SCS2 SPI0 SCS1 LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 8 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Table 3. Pin name LQFP144 pin assignment …continued Pin Description Function 0 (default) Function 1 SPI2 SCS1 SPI2 SCS3 EXTINT1 Function 2 PWM3 MAT3 PWM3 MAT2 PWM3 MAT1 Function 3 EXTBUS A3 EXTBUS A2 EXTBUS A1 P1[3]/SCS2[1]/ PMAT3[3]/A3 P1[2]/SCS2[3]/ PMAT3[2]/A2 P1[1]/EI1/ PMAT3[1]/A1 VSS(CORE) VDD(CORE) P1[0]/EI0/ PMAT3[0]/A0 P2[10]/ PMAT0[2]/ SCS0[0] P2[11]/ PMAT0[3]/SCK0 P0[0]/PHB0/ TXDC0/D24 VSS(IO) P0[1]/PHA0/ RXDC0/D25 P0[2]/CLK_OUT/ PMAT0[0]/D26 85[1] 86[1] 87[1] 88 89 90[1] 91[1] GPIO 1, pin 3 GPIO 1, pin 2 GPIO 1, pin 1 ground for digital core 1.8 V power supply for digital core GPIO 1, pin 0 GPIO 2, pin 10 EXTINT0 USB_INT PWM3 MAT0 PWM0 MAT2 EXTBUS A0 SPI0 SCS0 92[1] 93[1] 94 95[1] 96[1] GPIO 2, pin 11 GPIO 0, pin 0 ground for I/O GPIO 0, pin 1 GPIO 0, pin 2 GPIO 0, pin 3 GPIO 3, pin 0 GPIO 3, pin 1 GPIO 2, pin 12 GPIO 2, pin 13 GPIO 0, pin 4 GPIO 0, pin 5 USB_RST QEI0 PHB PWM0 MAT3 CAN0 TXD SPI0 SCK EXTBUS D24 QEI 0 PHA CLK_OUT USB_UP_LED ADC0 IN6 ADC0 IN7 ADC0 IN4 ADC0 IN5 ADC0 IN0 ADC0 IN1 CAN0 RXD PWM0 MAT0 PWM0 MAT1 PWM2 MAT0 PWM2 MAT1 PWM0 MAT4 PWM0 MAT5 PWM0 MAT2 PWM0 MAT3 EXTBUS D25 EXTBUS D26 EXTBUS D27 EXTBUS CS6 EXTBUS CS7 SPI0 SDI SPI0 SDO EXTBUS D28 EXTBUS D29 P0[3]/USB_UP_LED/ 97[1] PMAT0[1]/D27 P3[0]/IN0[6]/ PMAT2[0]/CS6 P3[1]/IN0[7/ PMAT2[1]/CS7 P2[12]/IN0[4] PMAT0[4]/SDI0 P2[13]/IN0[5] PMAT0[5]/SDO0 P0[4]/IN0[0]/ PMAT0[2]/D28 P0[5]/IN0[1]/ PMAT0[3]/D29 VDD(IO) P0[6]/IN0[2]/ PMAT0[4]/D30 P0[7]/IN0[3]/ PMAT0[5]/D31 VDDA(ADC3V3) JTAGSEL 98[1] 99[1] 100[1] 101[1] 102[1] 103[1] 104 105[1] 106[1] 107 108[1] 3.3 V power supply for I/O GPIO 0, pin 6 GPIO 0, pin 7 ADC0 IN2 ADC0 IN3 PWM0 MAT4 PWM0 MAT5 EXTBUS D30 EXTBUS D31 3.3 V power supply for ADC TAP controller select input; LOW-level selects the ARM debug mode; HIGH-level selects boundary scan; pulled up internally. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 9 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Table 3. Pin name LQFP144 pin assignment …continued Pin Description Function 0 (default) Function 1 Function 2 Function 3 VDDA(ADC5V0) VREFP VREFN P0[8]/IN1[0]/TXDL0/ A20 P0[9]/IN1[1]/ RXDL0/A21 P0[10]/IN1[2]/ PMAT1[0]/A8 P0[11]/IN1[3]/ PMAT1[1]/A9 P2[14]/SDA1/ PCAP0[0]/BLS0 P2[15]/SCL1/ PCAP0[1]/BLS1 P3[2]/MAT3[0]/ PMAT2[2]/ USB_SDA VSS(IO) P3[3]/MAT3[1]/ PMAT2[3]/ USB_SCL P0[12]/IN1[4]/ PMAT1[2]/A10 P0[13]/IN1[5]/ PMAT1[3]/A11 P0[14]/IN1[6]/ PMAT1[4]/A12 P0[15]/IN1[7]/ PMAT1[5]/A13 P0[16]IN2[0]/ TXD0/A22 P0[17]/IN2[1]/ RXD0/A23 VDD(CORE) VSS(CORE) P2[16]/TXD1/ PCAP0[2]/BLS2 P2[17]/RXD1/ PCAP1[0]/BLS3 VDD(IO) P0[18]/IN2[2]/ PMAT2[0]/A14 109 110[3] 111[3] 112[4] 113[4] 114[4] 115[4] 116[1] 117[1] 118[1] 5 V supply voltage for ADC0 and 5 V reference for ADC0. HIGH reference for ADC LOW reference for ADC GPIO 0, pin 8 GPIO 0, pin 9 GPIO 0, pin 10 GPIO 0, pin 11 GPIO 2, pin 14 GPIO 2, pin 15 GPIO 3, pin 2 ADC1 IN0 ADC1 IN1 ADC1 IN2 ADC1 IN3 I2C1 SDA I2C1 SCL TIMER3 MAT0 LIN0 TXD/ UART TXD EXTBUS A20 LIN0 RXD/ UART TXD EXTBUS A21 PWM1 MAT0 PWM1 MAT1 PWM0 CAP0 PWM0 CAP1 PWM2 MAT2 EXTBUS A8 EXTBUS A9 EXTBUS BLS0 EXTBUS BLS1 USB_SDA 119 120[1] ground for I/O GPIO 3, pin 3 TIMER3 MAT1 PWM2 MAT3 USB_SCL 121[4] 122[4] 123[4] 124[4] 125[4] 126[4] 127 128 129[1] 130[1] 131 132[4] GPIO 0, pin 12 GPIO 0, pin 13 GPIO 0, pin 14 GPIO 0, pin 15 GPIO 0, pin 16 GPIO 0, pin 17 ADC1 IN4 ADC1 IN5 ADC1 IN6 ADC1 IN7 ADC2 IN0 ADC2 IN1 PWM1 MAT2 PWM1 MAT3 PWM1 MAT4 PWM1 MAT5 UART0 TXD UART0 RXD EXTBUS A10 EXTBUS A11 EXTBUS A12 EXTBUS A13 EXTBUS A22 EXTBUS A23 1.8 V power supply for digital core ground for digital core GPIO 2, pin 16 GPIO 2, pin 17 UART1 TXD UART1 RXD PWM0 CAP2 PWM1 CAP0 EXTBUS BLS2 EXTBUS BLS3 3.3 V power supply for I/O GPIO 0, pin 18 ADC2 IN2 PWM2 MAT0 EXTBUS A14 LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 10 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Table 3. Pin name LQFP144 pin assignment …continued Pin Description Function 0 (default) Function 1 ADC2 IN3 TIMER3 MAT2 TIMER3 MAT3 SPI2 SCS1 SPI2 SCS0 ADC2 IN4 ADC2 IN5 ADC2 IN6 Function 2 PWM2 MAT1 PWM2 MAT4 PWM2 MAT5 PWM1 CAP1 PWM1 CAP2 PWM2 MAT2 PWM2 MAT3 PWM2 MAT4 Function 3 EXTBUS A15 CAN1 TXD CAN1 RXD EXTBUS D16 EXTBUS D17 EXTBUS A16 EXTBUS A17 EXTBUS A18 P0[19]/IN2[3]/ PMAT2[1]/A15 P3[4]/MAT3[2]/ PMAT2[4]/TXDC1 P3[5]/MAT3[3]/ PMAT2[5]/RXDC1 P2[18]/SCS2[1]/ PCAP1[1]/D16 P2[19]/SCS2[0]/ PCAP1[2]/D17 P0[20]/IN2[4]/ PMAT2[2]/A16 P0[21]/IN2[5]/ PMAT2[3]/A17 P0[22]/IN2[6]/ PMAT2[4]/A18 VSS(IO) P0[23]/IN2[7]/ PMAT2[5]/A19 P2[20]/ PCAP2[0]/D18 TDI [1] [2] [3] [4] 133[4] 134[1] 135[1] 136[1] 137[1] 138[4] 139[4] 140[4] 141 142[4] 143[1] 144[1] GPIO 0, pin 19 GPIO 3, pin 4 GPIO 3, pin 5 GPIO 2, pin 18 GPIO 2, pin 19 GPIO 0, pin 20 GPIO 0, pin 21 GPIO 0, pin 22 ground for I/O GPIO 0, pin 23 GPIO 2, pin 20 ADC2 IN7 SPI2 SDO PWM2 MAT5 PWM2 CAP0 EXTBUS A19 EXTBUS D18 IEEE 1149.1 data in, pulled up internally Bidirectional pad; analog port; plain input; 3-state output; slew rate control; 5 V tolerant; TTL with hysteresis; programmable pull-up / pull-down / repeater. USB pad. Analog pad; analog I/O. Analog I/O pad. 6. Functional description 6.1 Architectural overview The LPC2927/2929 consists of: • An ARM968E-S processor with real-time emulation support • An AMBA multi-layer Advanced High-performance Bus (AHB) for interfacing to the on-chip memory controllers • Two DTL buses (an universal NXP interface) for interfacing to the interrupt controller and the Power, Clock and Reset Control cluster (also called subsystem). • Three ARM Peripheral Buses (APB - a compatible superset of ARM's AMBA advanced peripheral bus) for connection to on-chip peripherals clustered in subsystems. • One ARM Peripheral Bus for event router and system control. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 11 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB The LPC2927/2929 configures the ARM968E-S processor in little-endian byte order. All peripherals run at their own clock frequency to optimize the total system power consumption. The AHB2APB bridge used in the subsystems contains a write-ahead buffer one transaction deep. This implies that when the ARM968E-S issues a buffered write action to a register located on the APB side of the bridge, it continues even though the actual write may not yet have taken place. Completion of a second write to the same subsystem will not be executed until the first write is finished. 6.2 ARM968E-S processor The ARM968E-S is a general purpose 32-bit RISC processor, which offers high performance and very low power consumption. The ARM architecture is based on Reduced Instruction Set Computer (RISC) principles, and the instruction set and related decode mechanism are much simpler than those of microprogrammed Complex Instruction Set Computers (CISC). This simplicity results in a high instruction throughput and impressive real-time interrupt response from a small and cost-effective controller core. Amongst the most compelling features of the ARM968E-S are: • Separate directly connected instruction and data Tightly Coupled Memory (TCM) interfaces • Write buffers for the AHB and TCM buses • Enhanced 16 × 32 multiplier capable of single-cycle MAC operations and 16-bit fixedpoint DSP instructions to accelerate signal-processing algorithms and applications. Pipeline techniques are employed so that all parts of the processing and memory systems can operate continuously. The ARM968E-S is based on the ARMv5TE five-stage pipeline architecture. Typically, in a three-stage pipeline architecture, while one instruction is being executed its successor is being decoded and a third instruction is being fetched from memory. In the five-stage pipeline additional stages are added for memory access and write-back cycles. The ARM968E-S processor also employs a unique architectural strategy known as THUMB, which makes it ideally suited to high-volume applications with memory restrictions or to applications where code density is an issue. The key idea behind THUMB is that of a super-reduced instruction set. Essentially, the ARM968E-S processor has two instruction sets: • Standard 32-bit ARMv5TE set • 16-bit THUMB set The THUMB set's 16-bit instruction length allows it to approach twice the density of standard ARM code while retaining most of the ARM's performance advantage over a traditional 16-bit controller using 16-bit registers. This is possible because THUMB code operates on the same 32-bit register set as ARM code. THUMB code can provide up to 65 % of the code size of ARM, and 160 % of the performance of an equivalent ARM controller connected to a 16-bit memory system. The ARM968E-S processor is described in detail in the ARM968E-S data sheet Ref. 2. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 12 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.3 On-chip flash memory system The LPC2927/2929 includes a 512 kB or 768 kB flash memory system. This memory can be used for both code and data storage. Programming of the flash memory can be accomplished via the flash memory controller or the JTAG. The flash controller also supports a 16 kB, byte-accessible on-chip EEPROM integrated on the LPC2927/2929. 6.4 On-chip static RAM In addition to the two 32 kB TCMs the LPC2927/2929 includes two static RAM memories: one of 32 kB and one of 16 kB. Both may be used for code and/or data storage. In addition, 8 kB SRAM for the ETB can be used as static memory for code and data storage. However, DMA access to this memory region is not supported. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 13 of 95 xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxx x x x xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xx xx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxx x x xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxx xxx 6.5 Memory map LPC2927/2929 0xFFFF FFFF 0xFFFF F000 0xFFFF C000 0xFFFF B000 0xFFFF A000 0xFFFF 9000 0xFFFF 8000 0xE00E 0000 0xE00C A000 0xE00C 9000 0xE00C 8000 0xE00C 7000 0xE00C 6000 0xE00C 5000 0xE00C 4000 0xE00C 3000 0xE00C 2000 0xE00C 1000 0xE00C 0000 reserved quadrature encoder PWM3 PWM2 PWM1 PWM0 ADC2 ADC1 ADC0 (5V) MSCSS timer1 MSCSS timer0 remappable to shadow area 0x2020 4000 0x2020 0000 flash controller reserved 0x200C 0000 0x2008 0000 0x2000 0000 0x2000 0000 no physical memory 0x0080 0000 0x0040 8000 0x0040 0000 0x0000 8000 0x0000 0000 32 kB ITCM 0 GB reserved 32 kB DTCM reserved 512 MB shadow area ITCM/DTCM ITCM/DTCM memory on-chip flash 0x2000 0000 1 GB 768 kB on-chip flash 512 kB on-chip flash 16 MB external static memory bank 1 reserved 16 MB external static memory bank 0 flash memory 2 GB reserved 0x6000 4000 SMC external static memory banks 7 to 2 0x4300 0000 0x4200 0000 0x4100 0000 0x4000 0000 0x2020 4000 peripherals #0 general subsystem reserved event router SCU CFID 0x0000 0000 0x6000 0000 peripherals #6 MSCSS subsystem VIC reserved CGU1 PMU RGU CGU0 PCR/VIC subsystem 4 GB Preliminary data sheet Rev. 02 — 22 June 2009 14 of 95 LPC2927_29_2 © NXP B.V. 2009. All rights reserved. NXP Semiconductors PCR/VIC control reserved DMA interface to TCM reserved ETB control 8 kB ETB SRAM DMA controller USB controller reserved peripheral subsystem #6 0xFFFF FFFF 0xFFFF 8000 0xF080 0000 0xF000 0000 0xE018 3000 0xE018 2000 0xE018 0000 0xE014 0000 0xE010 0000 0xE00E 0000 0xE00C 0000 peripherals #4 networking subsystem 0xE00A 0000 reserved LIN1 LIN0 CAN common regs CAN AF regs CAN ID LUT reserved I2C1 I2C0 CAN1 CAN0 0xE008 B000 0xE008 A000 0xE008 9000 0xE008 8000 0xE008 7000 0xE008 6000 0xE008 4000 0xE008 3000 0xE008 2000 0xE008 1000 0xE008 0000 0xE006 0000 reserved 0xE00A 0000 peripheral subsystem #4 reserved peripheral subsystem #2 reserved peripheral subsystem #0 reserved 0x8000 C000 16 kB AHB SRAM 32 kB AHB SRAM 0x8000 8000 0x8000 0000 0xE008 0000 0xE006 0000 0xE004 0000 0xE002 0000 0xE000 0000 peripherals #2 peripheral subsystem reserved 0xE005 0000 GPIO5 reserved GPIO0 - GPIO3 SPI2 SPI1 SPI0 UART1 UART0 TIMER3 TIMER2 TIMER1 TIMER0 WDT 0xE004 F000 0xE004 E000 0xE004 A000 0xE004 9000 0xE004 8000 0xE004 7000 0xE004 6000 0xE004 5000 0xE004 4000 0xE004 3000 0xE004 2000 0xE004 1000 0xE004 0000 0xE002 0000 0xE000 2000 0xE000 2000 0xE000 1000 0xE000 0000 002aae145 ARM9 microcontroller with CAN, LIN, and USB LPC2927/2929 Fig 3. LPC2927/2929 memory map NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.6 Reset, debug, test, and power description 6.6.1 Reset and power-up behavior The LPC2927/2929 contains external reset input and internal power-up reset circuits. This ensures that a reset is extended internally until the oscillators and flash have reached a stable state. See Section 8 for trip levels of the internal power-up reset circuit1. See Section 9 for characteristics of the several start-up and initialization times. Table 4 shows the reset pin. Table 4. Symbol RST Reset pin Direction IN Description external reset input, active LOW; pulled up internally At activation of the RST pin the JTAGSEL pin is sensed as logic LOW. If this is the case the LPC2927/2929 is assumed to be connected to debug hardware, and internal circuits re-program the source for the BASE_SYS_CLK to be the crystal oscillator instead of the Low-Power Ring Oscillator (LP_OSC). This is required because the clock rate when running at LP_OSC speed is too low for the external debugging environment. 6.6.2 Reset strategy The LPC2927/2929 contains a central module, the Reset Generator Unit (RGU) in the Power, Clock and Reset Subsystem (PCRSS), which controls all internal reset signals towards the peripheral modules. The RGU provides individual reset control as well as the monitoring functions needed for tracing a reset back to source. 6.6.3 IEEE 1149.1 interface pins (JTAG boundary scan test) The LPC2927/2929 contains boundary-scan test logic according to IEEE 1149.1, also referred to in this document as Joint Test Action Group (JTAG). The boundary-scan test pins can be used to connect a debugger probe for the embedded ARM processor. Pin JTAGSEL selects between boundary-scan mode and debug mode. Table 5 shows the boundary scan test pins. Table 5. Symbol JTAGSEL TRST TMS TDI TDO TCK IEEE 1149.1 boundary-scan test and debug interface Description TAP controller select input. LOW level selects ARM debug mode and HIGH level selects boundary scan and flash programming; pulled up internally test reset input; pulled up internally (active LOW) test mode select input; pulled up internally test data input, pulled up internally test data output test clock input 1. Only for 1.8 V power sources © NXP B.V. 2009. All rights reserved. LPC2927_29_2 Preliminary data sheet Rev. 02 — 22 June 2009 15 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.6.3.1 ETM/ETB The ETM provides real-time trace capability for deeply embedded processor cores. It outputs information about processor execution to a trace buffer. A software debugger allows configuration of the ETM using a JTAG interface and displays the trace information that has been captured in a format that a user can easily understand. The ETB stores trace data produced by the ETM. The ETM/ETB module has the following features: • • • • • Closely tracks the instructions that the ARM core is executing. On-chip trace data storage (ETB). All registers are programmed through JTAG interface. Does not consume power when trace is not being used. THUMB/Java instruction set support. 6.6.4 Power supply pins Table 6 shows the power supply pins. Table 6. Symbol VDD(CORE) VSS(CORE) VDD(IO) VSS(IO) VDD(OSC_PLL) VSS(OSC) VSS(PLL) VDDA(ADC3V3) VDDA(ADC5V0) Power supply pins Description digital core supply 1.8 V digital core ground (digital core, ADC0/1/2) I/O pins supply 3.3 V I/O pins ground oscillator and PLL supply oscillator ground PLL ground ADC1 and ADC2 3.3 V supply ADC0 5.0 V supply 6.7 Clocking strategy 6.7.1 Clock architecture The LPC2927/2929 contains several different internal clock areas. Peripherals like Timers, SPI, UART, CAN and LIN have their own individual clock sources called base clocks. All base clocks are generated by the Clock Generator Unit (CGU0). They may be unrelated in frequency and phase and can have different clock sources within the CGU. The system clock for the CPU and AHB Bus infrastructure has its own base clock. This means most peripherals are clocked independently from the system clock. See Figure 4 for an overview of the clock areas within the device. Within each clock area there may be multiple branch clocks, which offers very flexible control for power-management purposes. All branch clocks are outputs of the Power Management Unit (PMU) and can be controlled independently. Branch clocks derived from the same base clock are synchronous in frequency and phase. See Section 6.16 for more details of clock and power control within the device. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 16 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Two of the base clocks generated by the CGU0 are used as input into a second, dedicated CGU (CGU1). The CGU1 uses its own PLL and fractional dividers to generate two base clocks for the USB controller and one base clock for an independent clock output. BASE_SYS_CLK BA SE_ICLK0_CLK BASE_USB_CLK BASE_ICLK1_CLK branch clock BASE_USB_I2C_CLK USB CPU AHB MULTILAYER MATRIX AHB TO APB BRIDGES VIC BASE_IVNSS_CLK branch clock BASE_OUT_CLK branch clock CGU1 CLOCK OUT networking subsystem GPDMA FLASH/SRAM/SMC branch clocks CAN0/1 GLOBAL ACCEPTANCE FILTER LIN0/1 I2C0/1 BASE_PCR_CLK power control subsystem GPIO0/1/2/3/5 branch clock RESET/CLOCK GENERATION & POWER MANAGEMENT USB REGISTERS general subsytem SYSTEM CONTROL EVENT ROUTER CFID peripheral subsystem branch clocks BASE_TMR_CLK BASE_MSCSS_CLK TIMER 0/1/2/3 BASE_SPI_CLK SPI0/1/2 modulation and sampling control subsystem TIMER0/1 MTMR BASE_UART_CLK UART0/1 BASE_SAFE_CLK WDT branch clocks PWM0/1/2/3 QEI BASE_ADC_CLK branch clocks ADC0/1/2 CGU0 002aae146 Fig 4. LPC2927/2929 overview of clock areas 6.7.2 Base clock and branch clock relationship Table 7 contains an overview of all the base blocks in the LPC2927/2929 and their derived branch clocks. A short description is given of the hardware parts that are clocked with the individual branch clocks. In relevant cases more detailed information can be found in the LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 17 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB specific subsystem description. Some branch clocks have special protection since they clock vital system parts of the device and should not be switched off. See Section 6.16.5 for more details of how to control the individual branch clocks. Table 7. CGU0 base clock and branch clock overview Branch clock name CLK_SAFE CLK_SYS_CPU CLK_SYS_SYS CLK_SYS_PCRSS CLK_SYS_FMC CLK_SYS_RAM0 CLK_SYS_RAM1 CLK_SYS_SMC CLK_SYS_GESS CLK_SYS_VIC CLK_SYS_PESS CLK_SYS_GPIO0 CLK_SYS_GPIO1 CLK_SYS_GPIO2 CLK_SYS_GPIO3 CLK_SYS_GPIO5 CLK_SYS_IVNSS_A CLK_SYS_MSCSS_A CLK_SYS_DMA CLK_SYS_USB BASE_PCR_CLK BASE_IVNSS_CLK CLK_PCR_SLOW CLK_IVNSS_APB CLK_IVNSS_CANCA CLK_IVNSS_CANC0 CLK_IVNSS_CANC1 CLK_IVNSS_I2C0 CLK_IVNSS_I2C1 CLK_IVNSS_LIN0 CLK_IVNSS_LIN1 Parts of the device clocked by this branch clock watchdog timer ARM968E-S and TCMs AHB bus infrastructure AHB side of bridge in PCRSS Flash-Memory Controller Embedded SRAM Controller 0 (32 kB) Embedded SRAM Controller 1 (16 kB) External Static-Memory Controller General Subsystem Vectored Interrupt Controller Peripheral Subsystem GPIO bank 0 GPIO bank 1 GPIO bank 2 GPIO bank 3 GPIO bank 5 AHB side of bridge of IVNSS AHB side of bridge of MSCSS GPDMA USB registers PCRSS, CGU, RGU and PMU logic clock APB side of the IVNSS CAN controller Acceptance Filter CAN channel 0 CAN channel 1 I2C0 I2C1 LIN channel 0 LIN channel 1 [1][3] [2][4] Base clock BASE_SAFE_CLK BASE_SYS_CLK Remark [1] LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 18 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB CGU0 base clock and branch clock overview …continued Branch clock name CLK_MSCSS_APB CLK_MSCSS_MTMR0 CLK_MSCSS_MTMR1 CLK_MSCSS_PWM0 CLK_MSCSS_PWM1 CLK_MSCSS_PWM2 CLK_MSCSS_PWM3 Parts of the device clocked by this branch clock APB side of the MSCSS Timer 0 in the MSCSS Timer 1 in the MSCSS PWM 0 PWM 1 PWM 2 PWM 3 Remark Table 7. Base clock BASE_MSCSS_CLK CLK_MSCSS_ADC0_APB APB side of ADC 0 CLK_MSCSS_ADC1_APB APB side of ADC 1 CLK_MSCSS_ADC2_APB APB side of ADC 2 CLK_MSCSS_QEI BASE_UART_CLK BASE_ICLK0_CLK BASE_SPI_CLK CLK_UART0 CLK_UART1 CLK_SPI0 CLK_SPI1 CLK_SPI2 BASE_TMR_CLK CLK_TMR0 CLK_TMR1 CLK_TMR2 CLK_TMR3 BASE_ADC_CLK CLK_ADC0 CLK_ADC1 CLK_ADC2 reserved BASE_ICLK1_CLK [1] [2] [3] [4] Quadrature encoder UART 0 interface clock UART 1 interface clock CGU1 input clock SPI 0 interface clock SPI 1 interface clock SPI 2 interface clock Timer 0 clock for counter part Timer 1 clock for counter part Timer 2 clock for counter part Timer 3 clock for counter part Control of ADC 0, capture sample result Control of ADC 1, capture sample result Control of ADC 2, capture sample result CGU1 input clock - This clock is always on (cannot be switched off for system safety reasons). In the peripheral subsystem parts of the Timers, watchdog timer, SPI and UART have their own clock source. See Section 6.13 for details. In the Power Clock and Reset Control subsystem parts of the CGU, RGU, and PMU have their own clock source. See Section 6.16 for details. The clock should remain activated when system wake-up on timer or UART is required. Table 8. CGU1 base clock and branch clock overview Branch clock name CLK_OUT_CLK CLK_USB_CLK CLK_USB_I2C_CLK Parts of the device clocked by this branch clock clock out pin USB clock USB OTG I2C clock © NXP B.V. 2009. All rights reserved. Base clock BASE_OUT_CLK BASE_USB_CLK BASE_USB_I2C_CLK LPC2927_29_2 Remark Preliminary data sheet Rev. 02 — 22 June 2009 19 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.8 Flash memory controller The flash memory has a 128-bit wide data interface and the flash controller offers two 128-bit buffer lines to improve system performance. The flash has to be programmed initially via JTAG. In-system programming must be supported by the bootloader. Flash memory contents can be protected by disabling JTAG access. Suspension of burning or erasing is not supported. The Flash Memory Controller (FMC) interfaces to the embedded flash memory for two tasks: • Memory data transfer • Memory configuration via triggering, programming, and erasing The key features are: • • • • Programming by CPU via AHB Programming by external programmer via JTAG JTAG access protection Burn-finished and erase-finished interrupt 6.8.1 Functional description After reset, flash initialization is started, which takes tinit time (see Section 9). During this initialization, flash access is not possible and AHB transfers to flash are stalled, blocking the AHB bus. During flash initialization, the index sector is read to identify the status of the JTAG access protection and sector security. If JTAG access protection is active, the flash is not accessible via JTAG. In this case, ARM debug facilities are disabled and flash-memory contents cannot be read. If sector security is active, only the unsecured sections can be read. Flash can be read synchronously or asynchronously to the system clock. In synchronous operation, the flash goes into standby after returning the read data. Started reads cannot be stopped, and speculative reading and dual buffering are therefore not supported. With asynchronous reading, transfer of the address to the flash and of read data from the flash is done asynchronously, giving the fastest possible response time. Started reads can be stopped, so speculative reading and dual buffering are supported. Buffering is offered because the flash has a 128-bit wide data interface while the AHB interface has only 32 bits. With buffering a buffer line holds the complete 128-bit flash word, from which four words can be read. Without buffering every AHB data port read starts a flash read. A flash read is a slow process compared to the minimum AHB cycle time, so with buffering the average read time is reduced. This can improve system performance. With single buffering, the most recently read flash word remains available until the next flash read. When an AHB data-port read transfer requires data from the same flash word as the previous read transfer, no new flash read is done and the read data is given without wait cycles. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 20 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB When an AHB data port read transfer requires data from a different flash word to that involved in the previous read transfer, a new flash read is done and wait states are given until the new read data is available. With dual buffering, a secondary buffer line is used, the output of the flash being considered as the primary buffer. On a primary buffer, hit data can be copied to the secondary buffer line, which allows the flash to start a speculative read of the next flash word. Both buffer lines are invalidated after: • • • • Initialization Configuration-register access Data-latch reading Index-sector reading The modes of operation are listed in Table 9. Table 9. Flash read modes for single (non-linear) reads; one flash-word read per word read default mode of operation; most recently read flash word is kept until another flash word is required one flash-word read per word read most recently read flash word is kept until another flash word is required on a buffer miss a flash read is done, followed by at most one speculative read; optimized for execution of code with small loops (less than eight words) from flash most recently used flash word is copied into second buffer line; next flash-word read is started; highest performance for linear reads Synchronous timing No buffer line Single buffer line Asynchronous timing No buffer line Single buffer line Dual buffer line, single speculative Dual buffer line, always speculative 6.8.2 Pin description The flash memory controller has no external pins. However, the flash can be programmed via the JTAG pins, see Section 6.6.3. 6.8.3 Clock description The flash memory controller is clocked by CLK_SYS_FMC, see Section 6.7.2. 6.8.4 Flash layout The ARM processor can program the flash for ISP (In-System Programming) through the flash memory controller. Note that the flash always has to be programmed by ‘flash words’ of 128 bits (four 32-bit AHB bus words, hence 16 bytes). The flash memory is organized into eight ‘small’ sectors of 8 kB each and up to 11 ‘large’ sectors of 64 kB each. The number of large sectors depends on the device type. A sector must be erased before data can be written to it. The flash memory also has sector-wise protection. Writing occurs per page which consists of 4096 bits (32 flash words). A small sector contains 16 pages; a large sector contains 128 pages. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 21 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Table 10 gives an overview of the flash-sector base addresses. Table 10. 11 12 13 14 15 16 17 18 0 1 2 3 4 5 6 7[1] 8[1] 9[1] 10[1] [1] Flash sector overview Sector size (kB) 8 8 8 8 8 8 8 8 64 64 64 64 64 64 64 64 64 64 64 Sector base address 0x2000 0000 0x2000 2000 0x2000 4000 0x2000 6000 0x2000 8000 0x2000 A000 0x2000 C000 0x2000 E000 0x2001 0000 0x2002 0000 0x2003 0000 0x2004 0000 0x2005 0000 0x2006 0000 0x2007 0000 0x2008 0000 0x2009 0000 0x200A 0000 0x200B 0000 Sector number Availability of sector 7 to sector 10 depends on device type, see Section 3 “Ordering information”. The index sector is a special sector in which the JTAG access protection and sector security are located. The address space becomes visible by setting the FS_ISS bit and overlaps the regular flash sector’s address space. Note that the index sector, once programmed, cannot be erased. Any flash operation must be executed out of SRAM (internal or external). 6.8.5 Flash bridge wait-states To eliminate the delay associated with synchronizing flash-read data, a predefined number of wait-states must be programmed. These depend on flash-memory response time and system clock period. The minimum wait-states value can be calculated with the following formulas: Synchronous reading: t acc ( clk ) WST > ------------------ – 1 tt tclk ( sys ) (1) Asynchronous reading: t acc ( addr ) WST > --------------------- – 1 t tclk ( sys ) LPC2927_29_2 (2) © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 22 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Remark: If the programmed number of wait-states is more than three, flash-data reading cannot be performed at full speed (i.e. with zero wait-states at the AHB bus) if speculative reading is active. 6.8.6 EEPROM EEPROM is a non-volatile memory mostly used for storing relatively small amounts of data, for example for storing settings. It contains one 16 kB memory block and is byte-programmable and byte-erasable. The EEPROM can be accessed only through the flash controller. 6.9 External static memory controller The LPC2927/2929 contains an external Static Memory Controller (SMC) which provides an interface for external (off-chip) memory devices. Key features are: • Supports static memory-mapped devices including RAM, ROM, flash, burst ROM and external I/O devices • • • • • • • • • • Asynchronous page-mode read operation in non-clocked memory subsystems Asynchronous burst-mode read access to burst-mode ROM devices Independent configuration for up to eight banks, each up to 16 MB Programmable bus-turnaround (idle) cycles (one to 16) Programmable read and write wait states (up to 32), for static RAM devices Programmable initial and subsequent burst-read wait state for burst-ROM devices Programmable write protection Programmable burst-mode operation Programmable external data width: 8 bits, 16 bits or 32 bits Programmable read-byte lane enable control 6.9.1 Description The SMC simultaneously supports up to eight independently configurable memory banks. Each memory bank can be 8 bits, 16 bits or 32 bits wide and is capable of supporting SRAM, ROM, burst-ROM memory, or external I/O devices. A separate chip select output is available for each bank. The chip select lines are configurable to be active HIGH or LOW. Memory-bank selection is controlled by memory addressing. Table 11 shows how the 32-bit system address is mapped to the external bus memory base addresses, chip selects, and bank internal addresses. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 23 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB External memory-bank address bit description Symbol Description Table 11. 32-bit system address bit field 31 to 29 BA[2:0] external static-memory base address (three most significant bits); the base address can be found in the memory map; see Ref. 1. This field contains ‘010’ when addressing an external memory bank. chip select address space for eight memory banks; see Ref. 1. always ‘00’; other values are ‘mirrors’ of the 16 MB bank address. 16 MB memory banks address space 28 to 26 25 and 24 23 to 0 Table 12. CS[2:0] 000 001 010 011 100 101 110 111 CS[2:0] A[23:0] External static-memory controller banks Bank bank 0 bank 1 bank 2 bank 3 bank 4 bank 5 bank 6 bank 7 6.9.2 Pin description The external static-memory controller module in the LPC2927/2929 has the following pins, which are combined with other functions on the port pins of the LPC2927/2929. Table 13 shows the external memory controller pins. Table 13. Symbol EXTBUS CSx EXTBUS BLSy EXTBUS WE EXTBUS OE External memory controller pins Pin name CSx BLSy WE OE Direction OUT OUT OUT OUT OUT IN/OUT Description memory-bank x select, x runs from 0 to 7 byte-lane select input y, y runs from 0 to 3 write enable (active LOW) output enable (active LOW) address bus data bus EXTBUS A[23:0] A[23:0] EXTBUS D[31:0] D[31:0] 6.9.3 Clock description The External Static-Memory Controller is clocked by CLK_SYS_SMC, see Section 6.7.2. 6.9.4 External memory timing diagrams A timing diagram for reading from external memory is shown in Figure 5. The relationship between the wait-state settings is indicated with arrows. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 24 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB CLK(SYS) CS OE A D WST1 WSTOEN 002aae704 WSTOEN = 3, WST1 = 6 Fig 5. Reading from external memory A timing diagram for writing to external memory is shown In Figure 6. The relationship between wait-state settings is indicated with arrows. CLK(SYS) CS WE/BLS(1) BLS A D WST2 WSTWEN 002aae705 WSTWEN = 3, WST2 = 7 (1) BLS has the same timing as WE in configurations that use the byte lane enable signals to connect to write enable (8 bit devices). Fig 6. LPC2927_29_2 Writing to external memory © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 25 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Usage of the idle/turn-around time (IDCY) is demonstrated In Figure 7. Extra wait states are added between a read and a write cycle in the same external memory device. CLK(SYS) CS WE OE A D WST1 IDCY WSTWEN 002aae706 WST2 WSTOEN WSTOEN = 2, WSTWEN = 4, WST1 = 6, WST2 = 4, IDCY = 5 Fig 7. Reading/writing external memory Address pins on the device are shared with other functions. When connecting external memories, check that the I/O pin is programmed for the correct function. Control of these settings is handled by the SCU. 6.10 General Purpose DMA (GPDMA) controller The GPDMA controller allows peripheral-to memory, memory-to-peripheral, peripheral-to-peripheral, and memory-to-memory transactions. Each DMA stream provides unidirectional serial DMA transfers for a single source and destination. For example, a bidirectional port requires one stream for transmit and one for receives. The source and destination areas can each be either a memory region or a peripheral, and can be accessed through the same AHB master or one area by each master. The GPDMA controls eight DMA channels with hardware prioritization. The DMA controller interfaces to the system via two AHB bus masters, each with a full 32-bit data bus width. DMA operations may be set up for 8-bit, 16-bit, and 32-bit data widths, and can be either big-endian or little-endian. Incrementing or non-incrementing addressing for source and destination are supported, as well as programmable DMA burst size. Scatter or gather DMA is supported through the use of linked lists. This means that the source and destination areas do not have to occupy contiguous areas of memory. 6.10.1 DMA support for peripherals The GPDMA supports the following peripherals: SPI0/1/2 and UART0/1. The GPDMA can access both embedded SRAM blocks (16 kB and 32 kB), both TCMs, external static memory, and flash memory. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 26 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.10.2 Clock description The GPDMA controller is clocked by CLK_SYS_DMA derived from BASE_SYS_CLK, see Section 6.7.2. 6.11 USB interface The Universal Serial Bus (USB) is a 4-wire bus that supports communication between a host and one or more (up to 127) peripherals. The bus supports hot plugging and dynamic configuration of the devices. All transactions are initiated by the Host controller. The LPC2927/2929 USB interface includes a device and OTG controller with on-chip PHY for device. The OTG switching protocol is supported through the use of an external controller. Details on typical USB interfacing solutions can be found in Section 10.2. 6.11.1 USB device controller The device controller enables 12 Mbit/s data exchange with a USB Host controller. It consists of a register interface, serial interface engine, endpoint buffer memory, and a DMA controller. The serial interface engine decodes the USB data stream and writes data to the appropriate endpoint buffer. The status of a completed USB transfer or error condition is indicated via status registers. An interrupt is also generated if enabled. When enabled, the DMA controller transfers data between the endpoint buffer and the on-chip SRAM. The USB device controller has the following features: • • • • • Fully compliant with USB 2.0 specification (full speed). Supports 32 physical (16 logical) endpoints with a 2 kB endpoint buffer RAM. Supports Control, Bulk, Interrupt and Isochronous endpoints. Scalable realization of endpoints at run time. Endpoint Maximum packet size selection (up to USB maximum specification) by software at run time. • Supports SoftConnect and GoodLink features. • While USB is in the Suspend mode, the LPC2927/2929 can enter the Power-down mode and wake up on USB activity. • Supports DMA transfers with the on-chip SRAM blocks on all non-control endpoints. • Allows dynamic switching between CPU-controlled slave and DMA modes. • Double buffer implementation for Bulk and Isochronous endpoints. 6.11.2 USB OTG controller USB OTG (On-The-Go) is a supplement to the USB 2.0 specification that augments the capability of existing mobile devices and USB peripherals by adding host functionality for connection to USB peripherals. The OTG Controller integrates the device controller, and a master-only I2C interface to implement OTG dual-role device functionality. The dedicated I2C interface controls an external OTG transceiver. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 27 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB The USB OTG controller has the following features: • Fully compliant with On-The-Go supplement to the USB 2.0 Specification, Revision 1.0a. • Hardware support for Host Negotiation Protocol (HNP). • Includes a programmable timer required for HNP and Session Request Protocol (SRP). • Supports any OTG transceiver compliant with the OTG Transceiver Specification (CEA-2011), Rev. 1.0. 6.11.3 Pin description Table 14. Pin name USB_VBUS USB OTG port pins Direction I Description VBUS status input. When this function is not enabled via its corresponding PINSEL register, it is driven HIGH internally. Positive differential data Negative differential data SoftConnect control signal GoodLink LED control signal I2C I2C serial clock serial data Connection USB Connector USB_D+ USB_D− USB_CONNECT USB_UP_LED USB_SCL USB_SDA USB_LS USB_RST USB_INT USB_SSPND I/O I/O O O I/O I/O O O O O USB Connector USB Connector Control Control External OTG transceiver External OTG transceiver External OTG transceiver External OTG transceiver External OTG transceiver External OTG transceiver Low speed status (applies to host functionality only) USB reset status USB transceiver interrupt Bus suspend status 6.11.4 Clock description Access to the USB registers is clocked by the CLK_SYS_USB, derived from BASE_SYS_CLK, see Section 6.7.2. The CGU1 provides two independent base clocks to the USB block, BASE_USB_CLK and BASE_USB_I2C_CLK (see Section 6.16.3). LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 28 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.12 General subsystem 6.12.1 General subsystem clock description The general subsystem is clocked by CLK_SYS_GESS, see Section 6.7.2. 6.12.2 Chip and feature identification The Chip/Feature ID (CFID) module contains registers which show and control the functionality of the chip. It contains an ID to identify the silicon and also registers containing information about the features enabled or disabled on the chip. The key features are: • Identification of product • Identification of features enabled The CFID has no external pins. 6.12.3 System Control Unit (SCU) The system control unit contains system-related functions.The key feature is configuration of the I/O port-pins multiplexer. It defines the function of each I/O pin of the LPC2927/2929. The I/O pin configuration should be consistent with peripheral function usage. The SCU has no external pins. 6.12.4 Event router The event router provides bus-controlled routing of input events to the vectored interrupt controller for use as interrupt or wake-up signals. Key features: • Up to 20 level-sensitive external interrupt pins, including the receive pins of SPI, CAN, LIN, USB, and UART, as well as the I2C-bus SCL pins plus three internal event sources. • Input events can be used as interrupt source either directly or latched (edge-detected). • • • • • Direct events disappear when the event becomes inactive. Latched events remain active until they are explicitly cleared. Programmable input level and edge polarity. Event detection maskable. Event detection is fully asynchronous, so no clock is required. The event router allows the event source to be defined, its polarity and activation type to be selected and the interrupt to be masked or enabled. The event router can be used to start a clock on an external event. The vectored interrupt-controller inputs are active HIGH. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 29 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.12.4.1 Pin description The event router module in the LPC2927/2929 is connected to the pins listed below. The pins are combined with other functions on the port pins of the LPC2927/2929. Table 15 shows the pins connected to the event router. Table 15. Symbol EXTINT 0 - 7 CAN0 RXD CAN1 RXD I2C0_SCL I2C1_SCL LIN0 RXD LIN1 RXD SPI0 SDI SPI1 SDI SPI2 SDI UART0 RXD UART1 RXD USB_SCL Event-router pin connections Direction I I I I I I I I I I I I I n/a n/a n/a Description external interrupt input 0 - 7 CAN0 receive data input wake-up CAN1 receive data input wake-up I2C0 SCL clock input I2C1 SCL clock input LIN0 receive data input wake-up LIN1 receive data input wake-up SPI0 receive data input SPI1 receive data input SPI2 receive data input UART0 receive data input UART1 receive data input USB I2C-bus serial clock CAN interrupt (internal) VIC FIQ (internal) VIC IRQ (internal) Default polarity 1 0 0 0 0 0 0 0 0 0 0 0 0 1 1 1 6.13 Peripheral subsystem 6.13.1 Peripheral subsystem clock description The peripheral subsystem is clocked by a number of different clocks: • • • • • CLK_SYS_PESS CLK_UART0/1 CLK_SPI0/1/2 CLK_TMR0/1/2/3 CLK_SAFE see Section 6.7.2 6.13.2 Watchdog timer The purpose of the watchdog timer is to reset the ARM9 processor within a reasonable amount of time if the processor enters an error state. The watchdog generates a system reset if the user program fails to trigger it correctly within a predetermined amount of time. Key features: • Internal chip reset if not periodically triggered • Timer counter register runs on always-on safe clock • Optional interrupt generation on watchdog time-out LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 30 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB • Debug mode with disabling of reset • Watchdog control register change-protected with key • Programmable 32-bit watchdog timer period with programmable 32-bit prescaler. 6.13.2.1 Functional description The watchdog timer consists of a 32-bit counter with a 32-bit prescaler. The watchdog should be programmed with a time-out value and then periodically restarted. When the watchdog times out, it generates a reset through the RGU. To generate watchdog interrupts in watchdog debug mode the interrupt has to be enabled via the interrupt enable register. A watchdog-overflow interrupt can be cleared by writing to the clear-interrupt register. Another way to prevent resets during debug mode is via the Pause feature of the watchdog timer. The watchdog is stalled when the ARM9 is in debug mode and the PAUSE_ENABLE bit in the watchdog timer control register is set. The Watchdog Reset output is fed to the Reset Generator Unit (RGU). The RGU contains a reset source register to identify the reset source when the device has gone through a reset. See Section 6.16.4. 6.13.2.2 Clock description The watchdog timer is clocked by two different clocks; CLK_SYS_PESS and CLK_SAFE, see Section 6.7.2. The register interface towards the system bus is clocked by CLK_SYS_PESS. The timer and prescale counters are clocked by CLK_SAFE which is always on. 6.13.3 Timer The LPC2927/2929 contains six identical timers: four in the peripheral subsystem and two in the Modulation and Sampling Control SubSystem (MSCSS) located at different peripheral base addresses. This section describes the four timers in the peripheral subsystem. Each timer has four capture inputs and/or match outputs. Connection to device pins depends on the configuration programmed into the port function-select registers. The two timers located in the MSCSS have no external capture or match pins, but the memory map is identical, see Section 6.15.6. One of these timers has an external input for a pause function. The key features are: • 32-bit timer/counter with programmable 32-bit prescaler • Up to four 32-bit capture channels per timer. These take a snapshot of the timer value when an external signal connected to the TIMERx CAPn input changes state. A capture event may also optionally generate an interrupt • Four 32-bit match registers per timer that allow: – Continuous operation with optional interrupt generation on match – Stop timer on match with optional interrupt generation – Reset timer on match with optional interrupt generation • Up to four external outputs per timer corresponding to match registers, with the following capabilities: LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 31 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB – Set LOW on match – Set HIGH on match – Toggle on match – Do nothing on match • Pause input pin (MSCSS timers only) The timers are designed to count cycles of the clock and optionally generate interrupts or perform other actions at specified timer values, based on four match registers. They also include capture inputs to trap the timer value when an input signal changes state, optionally generating an interrupt. The core function of the timers consists of a 32 bit prescale counter triggering the 32 bit timer counter. Both counters run on clock CLK_TMRx (x runs from 0 to 3) and all time references are related to the period of this clock. Note that each timer has its individual clock source within the Peripheral SubSystem. In the Modulation and Sampling SubSystem each timer also has its own individual clock source. See Section 6.16.5 for information on generation of these clocks. 6.13.3.1 Pin description The four timers in the peripheral subsystem of the LPC2927/2929 have the pins described below. The two timers in the modulation and sampling subsystem have no external pins except for the pause pin on MSCSS timer 1. See Section 6.15.6 for a description of these timers and their associated pins. The timer pins are combined with other functions on the port pins of the LPC2927/2929, see Section 6.12.3. Table 16 shows the timer pins (x runs from 0 to 3). Table 16. Symbol TIMERx CAP[0] TIMERx CAP[1] TIMERx CAP[2] TIMERx CAP[3] TIMERx MAT[0] TIMERx MAT[1] TIMERx MAT[2] TIMERx MAT[3] [1] Timer pins Pin name CAPx[0] CAPx[1] CAPx[2] CAPx[3] MATx[0] MATx[1] MATx[2] MATx[3] Direction IN IN IN IN OUT OUT OUT OUT Description TIMER x capture input 0 TIMER x capture input 1 TIMER x capture input 2 TIMER x capture input 3 TIMER x match output 0 TIMER x match output 1 TIMER x match output 2 TIMER x match output 3 Note that CAP0 and CAP1 are not pinned out on Timer1. 6.13.3.2 Clock description The timer modules are clocked by two different clocks; CLK_SYS_PESS and CLK_TMRx (x = 0-3), see Section 6.7.2. Note that each timer has its own CLK_TMRx branch clock for power management. The frequency of all these clocks is identical as they are derived from the same base clock BASE_CLK_TMR. The register interface towards the system bus is clocked by CLK_SYS_PESS. The timer and prescale counters are clocked by CLK_TMRx. 6.13.4 UARTs The LPC2927/2929 contains two identical UARTs located at different peripheral base addresses. The key features are: LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 32 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB • • • • • 16-byte receive and transmit FIFOs. Register locations conform to 550 industry standard. Receiver FIFO trigger points at 1 byte, 4 bytes, 8 bytes and 14 bytes. Built-in baud rate generator. Support for RS-485/9-bit mode allows both software address detection and automatic address detection using 9-bit mode. The UART is commonly used to implement a serial interface such as RS232. The LPC2927/2929 contains two industry-standard 550 UARTs with 16-byte transmit and receive FIFOs, but they can also be put into 450 mode without FIFOs. Remark: The LIN controller can be configured to provide two additional standard UART interfaces (see Section 6.14.2). 6.13.4.1 Pin description The UART pins are combined with other functions on the port pins of the LPC2927/2929. Table 17 shows the UART pins (x runs from 0 to 1). Table 17. Symbol UARTx TXD UARTx RXD UART pins Pin name TXDx RXDx Direction OUT IN Description UART channel x transmit data output UART channel x receive data input 6.13.4.2 Clock description The UART modules are clocked by two different clocks; CLK_SYS_PESS and CLK_UARTx (x = 0-1), see Section 6.7.2. Note that each UART has its own CLK_UARTx branch clock for power management. The frequency of all CLK_UARTx clocks is identical since they are derived from the same base clock BASE_CLK_UART. The register interface towards the system bus is clocked by CLK_SYS_PESS. The baud generator is clocked by the CLK_UARTx. 6.13.5 Serial peripheral interface (SPI) The LPC2927/2929 contains three Serial Peripheral Interface modules (SPIs) to allow synchronous serial communication with slave or master peripherals. The key features are: • • • • Master or slave operation. Each SPI supports up to four slaves in sequential multi-slave operation. Supports timer-triggered operation. Programmable clock bit rate and prescale based on SPI source clock (BASE_SPI_CLK), independent of system clock. • Separate transmit and receive FIFO memory buffers; 16 bits wide, 32 locations deep. • Programmable choice of interface operation: Motorola SPI or Texas Instruments Synchronous Serial Interfaces. • Programmable data-frame size from 4 to 16 bits. • Independent masking of transmit FIFO, receive FIFO and receive overrun interrupts. • Serial clock-rate master mode: fserial_clk ≤ fclk(SPI)/2. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 33 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB • Serial clock-rate slave mode: fserial_clk = fclk(SPI)/4. • Internal loopback test mode. The SPI module can operate in: • Master mode: – Normal transmission mode – Sequential slave mode • Slave mode 6.13.5.1 Functional description The SPI module is a master or slave interface for synchronous serial communication with peripheral devices that have either Motorola SPI or Texas Instruments Synchronous Serial Interfaces. The SPI module performs serial-to-parallel conversion on data received from a peripheral device. The transmit and receive paths are buffered with FIFO memories (16 bits wide × 32 words deep). Serial data is transmitted on pins SDOx and received on pins SDIx. The SPI module includes a programmable bit-rate clock divider and prescaler to generate the SPI serial clock from the input clock CLK_SPIx. The SPI module’s operating mode, frame format, and word size are programmed through the SLVn_SETTINGS registers. A single combined interrupt request SPI_INTREQ output is asserted if any of the interrupts are asserted and unmasked. Depending on the operating mode selected, the SPI SCS outputs operate as an active-HIGH frame synchronization output for Texas Instruments synchronous serial frame format or an active-LOW chip select for SPI. Each data frame is between four and 16 bits long, depending on the size of words programmed, and is transmitted starting with the MSB. 6.13.5.2 Pin description The SPI pins are combined with other functions on the port pins of the LPC2927/2929, see Section 6.12.3. Table 18 shows the SPI pins (x runs from 0 to 2; y runs from 0 to 3). Table 18. Symbol SPIx SCSy SPIx SCK SPIx SDI SPIx SDO [1] [2] SPI pins Pin name SCSy SCKx SDIx SDOx Direction IN/OUT IN/OUT IN OUT Description SPIx chip select[1][2] SPIx clock[1] SPIx data input SPIx data output Direction of SPIx SCS and SPIx SCK pins depends on master or slave mode. These pins are output in master mode, input in slave mode. In slave mode there is only one chip select input pin, SPIx SCS0. The other chip selects have no function in slave mode. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 34 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.13.5.3 Clock description The SPI modules are clocked by two different clocks; CLK_SYS_PESS and CLK_SPIx (x = 0, 1, 2), see Section 6.7.2. Note that each SPI has its own CLK_SPIx branch clock for power management. The frequency of all clocks CLK_SPIx is identical as they are derived from the same base clock BASE_CLK_SPI. The register interface towards the system bus is clocked by CLK_SYS_PESS. The serial-clock rate divisor is clocked by CLK_SPIx. The SPI clock frequency can be controlled by the CGU. In master mode the SPI clock frequency (CLK_SPIx) must be set to at least twice the SPI serial clock rate on the interface. In slave mode CLK_SPIx must be set to four times the SPI serial clock rate on the interface. 6.13.6 General-purpose I/O The LPC2927/2929 contains four general-purpose I/O ports located at different peripheral base addresses. In the 144-pin package all four ports are available. All I/O pins are bidirectional, and the direction can be programmed individually. The I/O pad behavior depends on the configuration programmed in the port function-select registers. The key features are: • • • • 6.13.6.1 General-purpose parallel inputs and outputs Direction control of individual bits Synchronized input sampling for stable input-data values All I/O defaults to input at reset to avoid any possible bus conflicts Functional description The general-purpose I/O provides individual control over each bidirectional port pin. There are two registers to control I/O direction and output level. The inputs are synchronized to achieve stable read-levels. To generate an open-drain output, set the bit in the output register to the desired value. Use the direction register to control the signal. When set to output, the output driver actively drives the value on the output: when set to input the signal floats and can be pulled up internally or externally. 6.13.6.2 Pin description The five GPIO ports in the LPC2927/2929 have the pins listed below. The GPIO pins are combined with other functions on the port pins of the LPC2927/2929. Table 19 shows the GPIO pins. Table 19. Symbol GPIO0 pin[31:0] GPIO1 pin[27:0] GPIO2 pin[27:0] GPIO3 pin[15:0] GPIO5 pin[19:18] GPIO pins Pin name P0[31:0] P1[27:0] P2[27:0] P3[15:0] P5[19:18] Direction IN/OUT IN/OUT IN/OUT IN/OUT IN/OUT Description GPIO port x pins 31 to 0 GPIO port x pins 27 to 0 GPIO port x pins 27 to 0 GPIO port x pins 15 to 0 GPIO port x pins 19 and 18 LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 35 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.13.6.3 Clock description The GPIO modules are clocked by several clocks, all of which are derived from BASE_SYS_CLK; CLK_SYS_PESS and CLK_SYS_GPIOx (x = 0, 1, 2, 3, 5), see Section 6.7.2. Note that each GPIO has its own CLK_SYS_GPIOx branch clock for power management. The frequency of all clocks CLK_SYS_GPIOx is identical to CLK_SYS_PESS since they are derived from the same base clock BASE_SYS_CLK. 6.14 Networking subsystem 6.14.1 CAN gateway Controller Area Network (CAN) is the definition of a high-performance communication protocol for serial data communication. The two CAN controllers in the LPC2927/2929 provide a full implementation of the CAN protocol according to the CAN specification version 2.0B. The gateway concept is fully scalable with the number of CAN controllers, and always operates together with a separate powerful and flexible hardware acceptance filter. The key features are: • • • • • • • • 6.14.1.1 Supports 11-bit as well as 29-bit identifiers Double receive buffer and triple transmit buffer Programmable error-warning limit and error counters with read/write access Arbitration-lost capture and error-code capture with detailed bit position Single-shot transmission (i.e. no re-transmission) Listen-only mode (no acknowledge; no active error flags) Reception of ‘own’ messages (self-reception request) FullCAN mode for message reception Global acceptance filter The global acceptance filter provides look-up of received identifiers - called acceptance filtering in CAN terminology - for all the CAN controllers. It includes a CAN ID look-up table memory, in which software maintains one to five sections of identifiers. The CAN ID look-up table memory is 2 kB large (512 words, each of 32 bits). It can contain up to 1024 standard frame identifiers or 512 extended frame identifiers or a mixture of both types. It is also possible to define identifier groups for standard and extended message formats. 6.14.1.2 Pin description The two CAN controllers in the LPC2927/2929 have the pins listed below. The CAN pins are combined with other functions on the port pins of the LPC2927/2929. Table 20 shows the CAN pins (x runs from 0 to 1). Table 20. Symbol CANx TXD CANx RXD CAN pins Pin name TXDC0/1 RXDC0/1 Direction OUT IN Description CAN channel x transmit data output CAN channel x receive data input LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 36 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.14.2 LIN The LPC2927/2929 contain two LIN 2.0 master controllers. These can be used as dedicated LIN 2.0 master controllers with additional support for sync break generation and with hardware implementation of the LIN protocol according to spec 2.0. Remark: Both LIN channels can be also configured as UART channels. The key features are: • • • • • • • • • • 6.14.2.1 Complete LIN 2.0 message handling and transfer One interrupt per LIN message Slave response time-out detection Programmable sync-break length Automatic sync-field and sync-break generation Programmable inter-byte space Hardware or software parity generation Automatic checksum generation Fault confinement Fractional baud rate generator Pin description The two LIN 2.0 master controllers in the LPC2927/2929 have the pins listed below. The LIN pins are combined with other functions on the port pins of the LPC2927/2929. Table 21 shows the LIN pins. For more information see Ref. 1 subsection 3.43, LIN master controller. Table 21. Symbol LIN0/1 TXD LIN0/1 RXD LIN controller pins Pin name TXDL0/1 RXDL0/1 Direction OUT IN Description LIN channel 0/1 transmit data output LIN channel 0/1 receive data input 6.14.3 I2C-bus serial I/O controllers The LPC2927/2929 each contain two I2C-bus controllers. The I2C-bus is bidirectional for inter-IC control using only two wires: a serial clock line (SCL) and a serial data line (SDA). Each device is recognized by a unique address and can operate as either a receiver-only device (e.g., an LCD driver) or as a transmitter with the capability to both receive and send information (such as memory). Transmitters and/or receivers can operate in either master or slave mode, depending on whether the chip has to initiate a data transfer or is only addressed. The I2C is a multi-master bus, and it can be controlled by more than one bus master connected to it. The main features if the I2C-bus interfaces are: • I2C0/1 use standard I/O pins with bit rates of up to 400 kbit/s (Fast I2C-bus) and do not support powering off of individual devices connected to the same bus lines. • Easy to configure as master, slave, or master/slave. • Programmable clocks allow versatile rate control. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 37 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB • Bidirectional data transfer between masters and slaves. • Multi-master bus (no central master). • Arbitration between simultaneously transmitting masters without corruption of serial data on the bus. • Serial clock synchronization allows devices with different bit rates to communicate via one serial bus. • Serial clock synchronization can be used as a handshake mechanism to suspend and resume serial transfer. • The I2C-bus can be used for test and diagnostic purposes. • All I2C-bus controllers support multiple address recognition and a bus monitor mode. 6.14.3.1 Pin description Table 22. Symbol I2C SCL0/1 I2C SDA0/1 [1] I2C-bus pins[1] Pin name SCL0/1 SDA0/1 Direction I/O I/O Description I2C clock input/output I2C data input/output Note that the pins are not I2C-bus compliant open-drain pins. 6.15 Modulation and sampling control subsystem The Modulation and Sampling Control Subsystem (MSCSS) in the LPC2927/2929 includes four Pulse-Width Modulators (PWMs), three 10-bit successive approximation Analog-to-Digital Converters (ADCs) and two timers. The key features of the MSCSS are: • Two 10-bit, 400 ksamples/s, 8-channel ADCs with 3.3 V inputs and various triggerstart options • One 10-bit, 400 ksamples/s, 8-channel ADC with 5 V inputs (5 V measurement range) and various trigger-start options • Four 6-channel PWMs (Pulse-Width Modulators) with capture and trap functionality • Two dedicated timers to schedule and synchronize the PWMs and ADCs • Quadrature encoder interface 6.15.1 Functional description The MSCSS contains Pulse-Width Modulators (PWMs), Analog-to-Digital Converters (ADCs) and timers. Figure 8 provides an overview of the MSCSS. An AHB-to-APB bus bridge takes care of communication with the AHB system bus. Two internal timers are dedicated to this subsystem. MSCSS timer 0 can be used to generate start pulses for the ADCs and the first PWM. The second timer (MSCSS timer 1) is used to generate ‘carrier’ signals for the PWMs. These carrier patterns can be used, for example, in applications requiring current control. Several other trigger possibilities are provided for the ADCs (external, cascaded or following a PWM). The capture inputs of both timers can also be used to capture the start pulse of the ADCs. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 38 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB The PWMs can be used to generate waveforms in which the frequency, duty cycle and rising and falling edges can be controlled very precisely. Capture inputs are provided to measure event phases compared to the main counter. Depending on the applications, these inputs can be connected to digital sensor motor outputs or digital external signals. Interrupt signals are generated on several events to closely interact with the CPU. The ADCs can be used for any application needing accurate digitized data from analog sources. To support applications like motor control, a mechanism to synchronize several PWMs and ADCs is available (sync_in and sync_out). Note that the PWMs run on the PWM clock and the ADCs on the ADC clock, see Section 6.16.2. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 39 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB AHB-TO-APB BRIDGE MSCSS IDX0 QEI PHA0 PHB0 ADC0 start synch start MSCSS TIMER0 start start ADC1 synch ADC2 ADC0 IN[7:0] ADC1 IN[7:0] ADC2 IN[7:0] ADC2 EXT START PWM0 carrier synch carrier MSCSS TIMER1 carrier PWM1 synch PWM2 carrier synch PWM3 PWM0 MAT[5:0] PWM1 MAT[5:0] PAUSE PWM2 MAT[5:0] PWM3 MAT[5:0] PWM0 TRAP PWM0 CAP[2:0] PWM1 TRAP PWM1 CAP[2:0] PWM2 TRAP PWM2 CAP[2:0] PWM3 TRAP PWM3 CAP[2:0] 002aae243 Fig 8. Modulation and sampling control subsystem (MSCSS) block diagram LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 40 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.15.2 Pin description The pins of the LPC2927/2929 MSCSS associated with the three ADC modules are described in Section 6.15.4.2. Pins connected to the four PWM modules are described in Section 6.15.5.4, pins directly connected to the MSCSS timer 1 module are described in Section 6.15.6.1, and pins connected to the quadrature encoder interface are described in Section 6.15.7.1. 6.15.3 Clock description The MSCSS is clocked from a number of different sources: • • • • CLK_SYS_MSCSS_A clocks the AHB side of the AHB-to-APB bus bridge CLK_MSCSS_APB clocks the subsystem APB bus CLK_MSCSS_MTMR0/1 clocks the timers CLK_MSCSS_PWM0:3 clocks the PWMs. Each ADC has two clock areas; a APB part clocked by CLK_MSCSS_ADCx_APB (x = 0, 1, or 2) and a control part for the analog section clocked by CLK_ADCx = 0, 1, or 2), see Section 6.7.2. All clocks are derived from the BASE_MSCSS_CLK, except for CLK_SYS_MSCSS_A which is derived form BASE_SYS_CLK, and the CLK_ADCx clocks which are derived from BASE_CLK_ADC. If specific PWM or ADC modules are not used their corresponding clocks can be switched off. 6.15.4 Analog-to-digital converter The MSCSS in the LPC2927/2929 includes three 10-bit successive-approximation analog-to-digital converters. The key features of the ADC interface module are: • ADC0: Eight analog inputs; time-multiplexed; measurement range up to 5.0 V. • ADC1 and ADC2: Eight analog inputs; time-multiplexed; measurement range up to 3.3 V. • External reference-level inputs. • 400 ksamples per second at 10-bit resolution up to 1500 ksamples per second at 2-bit resolution. • Programmable resolution from 2-bit to 10-bit. • Single analog-to-digital conversion scan mode and continuous analog-to-digital conversion scan mode. • Optional conversion on transition on external start input, timer capture/match signal, PWM_sync or ‘previous’ ADC. • Converted digital values are stored in a register for each channel. • Optional compare condition to generate a ‘less than’ or an ‘equal to or greater than’ compare-value indication for each channel. • Power-down mode. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 41 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.15.4.1 Functional description The ADC block diagram, Figure 9, shows the basic architecture of each ADC. The ADC functionality is divided into two major parts; one part running on the MSCSS Subsystem clock, the other on the ADC clock. This split into two clock domains affects the behavior from a system-level perspective. The actual analog-to-digital conversions take place in the ADC clock domain, but system control takes place in the system clock domain. A mechanism is provided to modify configuration of the ADC and control the moment at which the updated configuration is transferred to the ADC domain. The ADC clock is limited to 4.5 MHz maximum frequency and should always be lower than or equal to the system clock frequency. To meet this constraint or to select the desired lower sampling frequency, the clock generation unit provides a programmable fractional system-clock divider dedicated to the ADC clock. Conversion rate is determined by the ADC clock frequency divided by the number of resolution bits plus one. Accessing ADC registers requires an enabled ADC clock, which is controllable via the clock generation unit, see Section 6.16.2. Each ADC has four start inputs. Note that start 0 and start 2 are captured in the system clock domain while start 1 and start 3 are captured in the ADC domain. The start inputs are connected at MSCSS level, see Section 6.15 for details. system clock ADC clock (up to 4.5 MHz) SYSTEM DOMAIN ADC DOMAIN update APB system bus IRQ scan IRQ compare ADC CONTROL AND REGISTERS conversion data configuration data IRQ 3.3 V ADC CONTROL AND REGISTERS 5V ADC0 ANALOG MUX 5 V IN ANALOG MUX 3.3 V IN ADC0 IN[7:0] 3.3 V ADC1/2 ADC1 IN[7:0] ADC2 IN[7:0] start 0 start 2 start 1 start 3 sync_out 002aae360 Fig 9. ADC block diagram 6.15.4.2 Pin description The three ADC modules in the MSCSS have the pins described below. The ADCx input pins are combined with other functions on the port pins of the LPC2927/2929. The VREFN and VREFP pins are common to all ADCs. Table 23 shows the ADC pins. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 42 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB ADC pins Pin name IN0[7:0] IN1/2[7:0] Direction Description IN IN IN IN IN [1] Table 23. Symbol ADC0 IN[7:0] ADC1/2 IN[7:0] analog input for 5.0 V ADC0, channel 7 to channel 0. analog input for 3.3 V ADC1/2, channel 7 to channel 0. ADC external start-trigger input. ADC LOW reference level. ADC HIGH reference level. 5 V high-power supply and HIGH reference for ADC0. Connect to clean 5 V as HIGH reference. May also be connected to 3.3 V if 3.3 V measurement range for ADC0 is needed.[2][3] ADC1 and ADC2 3.3 V supply (also used for ADC0).[3] ADC2_EXT_START CAP1[2] VREFN VREFP VDDA(ADC5V0) VREFN VREFP VDDA(ADC5V0) IN VDDA(ADC3V3) [1] [2] [3] VDDA(ADC3V3) IN VREFP, VREFN, VDDA(ADC3V3) must be connected for the 5 V ADC0 to operate properly. The analog inputs of ADC0 are internally multiplied by a factor of 3.3 / 5. If VDDA(ADC5V0) is connected to 3.3 V, the maximum digital result is 1024 3.3/ 5. VDDA(ADC5V0) and VDDA(ADC3V3) must be set as follows: VDDA(ADC5V0) = VDDA(ADC3V3) × 1.5. Remark: The following formula only applies to ADC0: Voltage variations on VREFP (i.e. those that deviate from voltage variations on the VDDA(ADC5V5) pin) are visible as variations in the measurement result. The following formula is used to determine the conversion result of an input voltage VI on ADC0: 1024 2V – 1V  + 1V ×  --  I -- DDA ( ADC5V 0 ) -- DDA ( ADC3V 3 ) -------------------------------------------3 2 2 V VREFP – V VREFN Remark: Note that the ADC1 and ADC2 accept an input voltage up to of 3.6 V (see Table 34) on the ADC1/2 IN pins. If the ADC is not used, the pins are 5 V tolerant. The ADC0 pins are 5 V tolerant. 6.15.4.3 Clock description The ADC modules are clocked from two different sources; CLK_MSCSS_ADCx_APB and CLK_ADCx (x = 0, 1, or 2), see Section 6.7.2. Note that each ADC has its own CLK_ADCx and CLK_MSCSS_ADCx_APB branch clocks for power management. If an ADC is unused both its CLK_MSCSS_ADCx_APB and CLK_ADCx can be switched off. The frequency of all the CLK_MSCSS_ADCx_APB clocks is identical to CLK_MSCSS_APB since they are derived from the same base clock BASE_MSCSS_CLK. Likewise the frequency of all the CLK_ADCx clocks is identical since they are derived from the same base clock BASE_ADC_CLK. The register interface towards the system bus is clocked by CLK_MSCSS_ADCx_APB. Control logic for the analog section of the ADC is clocked by CLK_ADCx, see also Figure 9. (3) LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 43 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.15.5 Pulse Width Modulator (PWM) The MSCSS in the LPC2927/2929 includes four PWM modules with the following features. • • • • • • Six pulse-width modulated output signals Double edge features (rising and falling edges programmed individually) Optional interrupt generation on match (each edge) Different operation modes: continuous or run-once 16-bit PWM counter and 16-bit prescale counter allow a large range of PWM periods A protective mode (TRAP) holding the output in a software-controllable state and with optional interrupt generation on a trap event a capture event • Three capture registers and capture trigger pins with optional interrupt generation on • Interrupt generation on match event, capture event, PWM counter overflow or trap event • A burst mode mixing the external carrier signal with internally generated PWM • Programmable sync-delay output to trigger other PWM modules (master/slave behavior) 6.15.5.1 Functional description The ability to provide flexible waveforms allows PWM blocks to be used in multiple applications; e.g. dimmer/lamp control and fan control. Pulse-width modulation is the preferred method for regulating power since no additional heat is generated, and it is energy-efficient when compared with linear-regulating voltage control networks. The PWM delivers the waveforms/pulses of the desired duty cycles and cycle periods. A very basic application of these pulses can be in controlling the amount of power transferred to a load. Since the duty cycle of the pulses can be controlled, the desired amount of power can be transferred for a controlled duration. Two examples of such applications are: • Dimmer controller: The flexibility of providing waves of a desired duty cycle and cycle period allows the PWM to control the amount of power to be transferred to the load. The PWM functions as a dimmer controller in this application. • Motor controller: The PWM provides multi-phase outputs, and these outputs can be controlled to have a certain pattern sequence. In this way the force/torque of the motor can be adjusted as desired. This makes the PWM function as a motor drive. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 44 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB sync_in transfer_enable_in APB DOMAIN update APB system bus PWM CONTROL & REGISTERS capture data PWM DOMAIN match outputs PWM, COUNTER, PRESCALE COUNTER & SHADOW REGISTERS capture inputs IRQ pwm PWM counter value IRQ capt_match config data IRQs trap input carrier inputs transfer_enable_out sync_out 002aad837 Fig 10. PWM block diagram The PWM block diagram in Figure 10 shows the basic architecture of each PWM. PWM functionality is split into two major parts, a APB domain and a PWM domain, both of which run on clocks derived from the BASE_MSCSS_CLK. This split into two domains affects behavior from a system-level perspective. The actual PWM and prescale counters are located in the PWM domain but system control takes place in the APB domain. The actual PWM consists of two counters; a 16-bit prescale counter and a 16-bit PWM counter. The position of the rising and falling edges of the PWM outputs can be programmed individually. The prescale counter allows high system bus frequencies to be scaled down to lower PWM periods. Registers are available to capture the PWM counter values on external events. Note that in the Modulation and Sampling SubSystem, each PWM has its individual clock source CLK_MSCSS_PWMx (x runs from 0 to 3). Both the prescale and the timer counters within each PWM run on this clock CLK_MSCSS_PWMx, and all time references are related to the period of this clock. See Section 6.16 for information on generation of these clocks. 6.15.5.2 Synchronizing the PWM counters A mechanism is included to synchronize the PWM period to other PWMs by providing a sync input and a sync output with programmable delay. Several PWMs can be synchronized using the trans_enable_in/trans_enable_out and sync_in/sync_out ports. See Figure 8 for details of the connections of the PWM modules within the MSCSS in the LPC2927/2929. PWM 0 can be master over PWM 1; PWM 1 can be master over PWM 2, etc. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 45 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.15.5.3 Master and slave mode A PWM module can provide synchronization signals to other modules (also called Master mode). The signal sync_out is a pulse of one clock cycle generated when the internal PWM counter (re)starts. The signal trans_enable_out is a pulse synchronous to sync_out, generated if a transfer from system registers to PWM shadow registers occurred when the PWM counter restarted. A delay may be inserted between the counter start and generation of trans_enable_out and sync_out. A PWM module can use input signals trans_enable_in and sync_in to synchronize its internal PWM counter and the transfer of shadow registers (Slave mode). 6.15.5.4 Pin description Each of the four PWM modules in the MSCSS has the following pins. These are combined with other functions on the port pins of the LPC2927/2929. Table 24 shows the PWM0 to PWM3 pins. Table 24. Symbol PWMn CAP[0] PWMn CAP[1] PWMn CAP[2] PWMn MAT[0] PWMn MAT[1] PWMn MAT[2] PWMn MAT[3] PWMn MAT[4] PWMn MAT[5] PWMn TRAP PWM pins Pin name PCAPn[0] PCAPn[1] PCAPn[2] PMATn[0] PMATn[1] PMATn[2] PMATn[3] PMATn[4] PMATn[5] TRAPn Direction IN IN IN OUT OUT OUT OUT OUT OUT IN Description PWM n capture input 0 PWM n capture input 1 PWM n capture input 2 PWM n match output 0 PWM n match output 1 PWM n match output 2 PWM n match output 3 PWM n match output 4 PWM n match output 5 PWM n trap input 6.15.5.5 Clock description The PWM modules are clocked by CLK_MSCSS_PWMx (x = 0 - 3), see Section 6.7.2. Note that each PWM has its own CLK_MSCSS_PWMx branch clock for power management. The frequency of all these clocks is identical to CLK_MSCSS_APB since they are derived from the same base clock BASE_MSCSS_CLK. Also note that unlike the timer modules in the Peripheral SubSystem, the actual timer counter registers of the PWM modules run at the same clock as the APB system interface CLK_MSCSS_APB. This clock is independent of the AHB system clock. If a PWM module is not used its CLK_MSCSS_PWMx branch clock can be switched off. 6.15.6 Timers in the MSCSS The two timers in the MSCSS are functionally identical to the timers in the peripheral subsystem, see Section 6.13.3. The features of the timers in the MSCSS are the same as the timers in the peripheral subsystem, but the capture inputs and match outputs are not available on the device pins. These signals are instead connected to the ADC and PWM modules as outlined in the description of the MSCSS, see Section 6.15.1. See Section 6.13.3 for a functional description of the timers. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 46 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.15.6.1 Pin description MSCSS timer 0 has no external pins. MSCSS timer 1 has a PAUSE pin available as external pin. The PAUSE pin is combined with other functions on the port pins of the LPC2927/2929. Table 25 shows the MSCSS timer 1 external pin. Table 25. Symbol MSCSS PAUSE MSCSS timer 1 pin Direction IN Description pause pin for MSCSS timer 1 6.15.6.2 Clock description The Timer modules in the MSCSS are clocked by CLK_MSCSS_MTMRx (x = 0 to 1), see Section 6.7.2. Note that each timer has its own CLK_MSCSS_MTMRx branch clock for power management. The frequency of all these clocks is identical to CLK_MSCSS_APB since they are derived from the same base clock BASE_MSCSS_CLK. Note that, unlike the timer modules in the Peripheral SubSystem, the actual timer counter registers run at the same clock as the APB system interface CLK_MSCSS_APB. This clock is independent of the AHB system clock. If a timer module is not used its CLK_MSCSS_MTMRx branch clock can be switched off. 6.15.7 Quadrature Encoder Interface (QEI) A quadrature encoder, also known as a 2-channel incremental encoder, converts angular displacement into two pulse signals. By monitoring both the number of pulses and the relative phase of the two signals, the user can track the position, direction of rotation, and velocity. In addition, a third channel, or index signal, can be used to reset the position counter. The quadrature encoder interface decodes the digital pulses from a quadrature encoder wheel to integrate position over time and determine direction of rotation. In addition, the QEI can capture the velocity of the encoder wheel. The QEI has the following features: • • • • • • • • • • Tracks encoder position. Increments/ decrements depending on direction. Programmable for 2x or 4x position counting. Velocity capture using built-in timer. Velocity compare function with less than interrupt. Uses 32-bit registers for position and velocity. Three position compare registers with interrupts. Index counter for revolution counting. Index compare register with interrupts. Can combine index and position interrupts to produce an interrupt for whole and partial revolution displacement. • Digital filter with programmable delays for encoder input signals. • Can accept decoded signal inputs (clk and direction). • Connected to APB. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 47 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.15.7.1 Pin description The QEI module in the MSCSS has the following pins. These are combined with other functions on the port pins of the LPC2927/2929. Table 26 shows the QEI pins. Table 26. Symbol QEI0 IDX QEI0 PHA QEI pins Pin name IDX0 PHA0 Direction IN IN Description Index signal. Can be used to reset the position. Sensor signal. Corresponds to PHA in quadrature mode and to direction in clock/direction mode. Sensor signal. Corresponds to PHB in quadrature mode and to clock signal in clock/direction mode. QEI0 PHB PHB0 IN 6.15.7.2 Clock description The QEI module is clocked by CLK_MSCSS_QEI, see Section 6.7.2. The frequency of this clock is identical to CLK_MSCSS_APB since they are derived from the same base clock BASE_MSCSS_CLK. If the QEI is not used its CLK_MSCSS_QEI branch clock can be switched off. 6.16 Power, Clock and Reset Control Subsystem (PCRSS) The Power, Clock and Reset Control Subsystem in the LPC2927/2929 includes the Clock Generator Units (CGU0 and CGU1), a Reset Generator Unit (RGU) and a Power Management Unit (PMU). Figure 11 provides an overview of the PCRSS. An AHB-to-DTL bridge controls the communication with the AHB system bus. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 48 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB CGU0 EXTERNAL OSCILLATOR PLL OUT6 OUT11 PLL LOW POWER RING OSCILLATOR FDIV[6:0] OUT0 OUT1 FDIV CGU1 PMU OUT0 OUT1 OUT2 CLOCK GATES branch clocks OUT5 OUT7 AHB master disable: grant request CGU0 REGISTERS OUT9 CLOCK ENABLE CONTROL AHB2DTL BRIDGE PMU REGISTERS wakeup_a RGU AHB_RST RGU REGISTERS SCU_RST RESET OUTPUT DELAY LOGIC WARM_RST COLD_RST PCR_RST RGU_RST POR_RST POR INPUT DEGLITCH/ SYNC reset from watchdog counter RST (device pin) 002aae244 Fig 11. PCRSS block diagram 6.16.1 Clock description The PCRSS is clocked by a number of different clocks. CLK_SYS_PCRSS clocks the AHB side of the AHB to DTL bus bridge and CLK_PCR_SLOW clocks the CGU, RGU and PMU internal logic, see Section 6.7.2. CLK_SYS_PCRSS is derived from BASE_SYS_CLK, which can be switched off in low-power modes. CLK_PCR_SLOW is derived from BASE_PCR_CLK and is always on in order to be able to wake up from low-power modes. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 49 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.16.2 Clock Generation Unit (CGU0) The key features are: • • • • • • • • • Generation of 11 base clocks, selectable from several embedded clock sources. Crystal oscillator with power-down. Control PLL with power-down. Very low-power ring oscillator, always on to provide a safe clock. Individual source selector for each base clock, with glitch-free switching. Autonomous clock-activity detection on every clock source. Protection against switching to invalid or inactive clock sources. Embedded frequency counter. Register write-protection mechanism to prevent unintentional alteration of clocks. Remark: Any clock-frequency adjustment has a direct impact on the timing of all on-board peripherals. 6.16.2.1 Functional description The clock generation unit provides 11 internal clock sources as described in Table 27. Table 27. Numbe r 0 1 2 3 4 5 6 7 8 9 10 11 [1] [2] CGU0 base clocks Name BASE_SAFE_CLK BASE_SYS_CLK BASE_PCR_CLK BASE_IVNSS_CLK BASE_MSCSS_CLK BASE_ICLK0_CLK BASE_UART_CLK BASE_SPI_CLK BASE_TMR_CLK BASE_ADC_CLK reserved BASE_ICLK1_CLK Frequency (MHz) [1] 0.4 125 0.4 [2] 125 125 125 125 50 125 4.5 125 Description base safe clock (always on) base system clock base PCR subsystem clock base IVNSS subsystem clock base MSCSS subsystem clock base internal clock 0, for CGU1 base UART clock base SPI clock base timers clock base ADCs clock base internal clock 1, for CGU1 Maximum frequency that guarantees stable operation of the LPC2927/2929. Fixed to low-power oscillator. For generation of these base clocks, the CGU consists of primary and secondary clock generators and one output generator for each base clock. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 50 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB CLOCK GENERATION UNIT (CGU0) OUT 0 BASE_SAFE_CLK FDIV0 OUT 1 400 kHz LP_OSC clkout clkout120 clkout240 BASE_SYS_CLK EXTERNAL OSCILLATOR FDIV1 OUT 2 BASE_PCR_CLK PLL OUT 3 BASE_IVNSS_CLK FDIV6 OUT 11 BASE_ICLK1_CLK FREQUENCY MONITOR CLOCK DETECTION AHB TO DTL BRIDGE 002aae147 Fig 12. Block diagram of the CGU0 (see Table 27 for all base clocks) There are two primary clock generators: a low-power ring oscillator (LP_OSC) and a crystal oscillator. See Figure 12. LP_OSC is the source for the BASE_PCR_CLK that clocks the CGU0 itself and for BASE_SAFE_CLK that clocks a minimum of other logic in the device (like the watchdog timer). To prevent the device from losing its clock source LP_OSC cannot be put into power-down. The crystal oscillator can be used as source for high-frequency clocks or as an external clock input if a crystal is not connected. Secondary clock generators are a PLL and seven fractional dividers (FDIV0:6). The PLL has three clock outputs: normal, 120° phase-shifted and 240° phase-shifted. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 51 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Configuration of the CGU0: For every output generator generating the base clocks a choice can be made from the primary and secondary clock generators according to Figure 13. LP_OSC FDIV0:6 EXTERNAL OSCILLATOR clkout clkout120 clkout240 PLL OUTPUT CONTROL clock outputs 002aad834 Fig 13. Structure of the clock generation scheme Any output generator (except for BASE_SAFE_CLK and BASE_PCR_CLK) can be connected to either a fractional divider (FDIV0:6) or to one of the outputs of the PLL or to LP_OSC/crystal oscillator directly. BASE_SAFE_CLK and BASE_PCR_CLK can use only LP_OSC as source. The fractional dividers can be connected to one of the outputs of the PLL or directly to LP_OSC/crystal Oscillator. The PLL is connected to the crystal oscillator. In this way every output generating the base clocks can be configured to get the required clock. Multiple output generators can be connected to the same primary or secondary clock source, and multiple secondary clock sources can be connected to the same PLL output or primary clock source. Invalid selections/programming - connecting the PLL to an FDIV or to one of the PLL outputs itself for example - will be blocked by hardware. The control register will not be written, the previous value will be kept, although all other fields will be written with new data. This prevents clocks being blocked by incorrect programming. Default Clock Sources: Every secondary clock generator or output generator is connected to LP_OSC at reset. In this way the device runs at a low frequency after reset. It is recommended to switch BASE_SYS_CLK to a high-frequency clock generator as one of the first steps in the boot code after verifying that the high-frequency clock generator is running. Clock Activity Detection: Clocks that are inactive are automatically regarded as invalid, and values of ‘CLK_SEL’ that would select those clocks are masked and not written to the control registers. This is accomplished by adding a clock detector to every clock LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 52 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB generator. The RDET register keeps track of which clocks are active and inactive, and the appropriate ‘CLK_SEL’ values are masked and unmasked accordingly. Each clock detector can also generate interrupts at clock activation and deactivation so that the system can be notified of a change in internal clock status. Clock detection is done using a counter running at the BASE_PCR_CLK frequency. If no positive clock edge occurs before the counter has 32 cycles of BASE_PCR_CLK the clock is assumed to be inactive. As BASE_PCR_CLK is slower than any of the clocks to be detected, normally only one BASE_PCR_CLK cycle is needed to detect activity. After reset all clocks are assumed to be ‘non-present’, so the RDET status register will be correct only after 32 BASE_PCR_CLK cycles. Note that this mechanism cannot protect against a currently-selected clock going from active to inactive state. Therefore an inactive clock may still be sent to the system under special circumstances, although an interrupt can still be generated to notify the system. Glitch-Free Switching: Provisions are included in the CGU to allow clocks to be switched glitch-free, both at the output generator stage and also at secondary source generators. In the case of the PLL the clock will be stopped and held low for long enough to allow the PLL to stabilize and lock before being re-enabled. For all non-PLL Generators the switch will occur as quickly as possible, although there will always be a period when the clock is held low due to synchronization requirements. If the current clock is high and does not go low within 32 cycles of BASE_PCR_CLK it is assumed to be inactive and is asynchronously forced low. This prevents deadlocks on the interface. 6.16.2.2 PLL functional description A block diagram of the PLL is shown in Figure 14. The input clock is fed directly to the analog section. This block compares the phase and frequency of the inputs and generates the main clock2. These clocks are either divided by 2 × P by the programmable post divider to create the output clock, or sent directly to the output. The main output clock is then divided by M by the programmable feedback divider to generate the feedback clock. The output signal of the analog section is also monitored by the lock detector to signal when the PLL has locked onto the input clock. PSEL bits P23EN bit / 2PDIV CCO P23 clkout120 clkout240 clkout input clock bypass direct / MDIV clkout 002aad833 MSEL bits Fig 14. PLL block diagram 2. Generation of the main clock is restricted by the frequency range of the PLL clock input. See Table 36, Dynamic characteristics. © NXP B.V. 2009. All rights reserved. LPC2927_29_2 Preliminary data sheet Rev. 02 — 22 June 2009 53 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Triple output phases: For applications that require multiple clock phases two additional clock outputs can be enabled by setting register P23EN to logic 1, thus giving three clocks with a 120° phase difference. In this mode all three clocks generated by the analog section are sent to the output dividers. When the PLL has not yet achieved lock the second and third phase output dividers run unsynchronized, which means that the phase relation of the output clocks is unknown. When the PLL LOCK register is set the second and third phase of the output dividers are synchronized to the main output clock CLKOUT PLL, thus giving three clocks with a 120° phase difference. Direct output mode: In normal operating mode (with DIRECT set to logic 0) the CCO clock is divided by 2, 4, 8 or 16 depending on the value on the PSEL[1:0] input, giving an output clock with a 50 % duty cycle. If a higher output frequency is needed the CCO clock can be sent directly to the output by setting DIRECT to logic 1. Since the CCO does not directly generate a 50 % duty cycle clock, the output clock duty cycle in this mode can deviate from 50 %. Power-down control: A Power-down mode has been incorporated to reduce power consumption when the PLL clock is not needed. This is enabled by setting the PD control register bit. In this mode the analog section of the PLL is turned off, the oscillator and the phase-frequency detector are stopped and the dividers enter a reset state. While in Power-down mode the LOCK output is low, indicating that the PLL is not in lock. When Power-down mode is terminated by clearing the PD control-register bit the PLL resumes normal operation, and makes the LOCK signal high once it has regained lock on the input clock. 6.16.2.3 Pin description The CGU0 module in the LPC2927/2929 has the pins listed in Table 28 below. Table 28. Symbol XOUT_OSC XIN_OSC CGU0 pins Direction OUT IN Description Oscillator crystal output Oscillator crystal input or external clock input 6.16.3 Clock generation for USB (CGU1) The CGU1 block is functionally identical to the CGU0 block and generates two clocks for the USB interface and a dedicated output clock. The CGU1 block uses its own PLL and fractional divider. The PLLs used in CGU0 and CGU1 are identical (see Section 6.16.2.2). The clock input to the CGU1 PLL is provided by one of two base clocks generated in the CGU0: BASE_ICLK0_CLK or BASE_ICLK1_CLK. The base clock not used for the PLL can be configured to drive the output clock directly. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 54 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB CLOCK GENERATION UNIT (CGU1) OUT 0 BASE_USB_CLK BASE_ICLK0_CLK BASE_ICLK1_CLK PLL clkout clkout120 clkout240 FDIV0 OUT 1 BASE_USB_I2C_CLK OUT 2 BASE_OUT_CLK AHB TO DTL BRIDGE 002aae148 Fig 15. Block diagram of the CGU1 6.16.3.1 Pin description The CGU1 module in the LPC2927/2929 has the pins listed in Table 28 below. Table 29. Symbol CLK_OUT CGU1 pins Direction OUT Description clock output 6.16.4 Reset Generation Unit (RGU) The RGU controls all internal resets. The key features of the Reset Generation Unit (RGU) are: • • • • Reset controlled individually per subsystem Automatic reset stretching and release Monitor function to trace resets back to source Register write-protection mechanism to prevent unintentional resets LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 55 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.16.4.1 Functional description Each reset output is defined as a combination of reset input sources including the external reset input pins and internal power-on reset, see Table 30. The first five resets listed in this table form a sort of cascade to provide the multiple levels of impact that a reset may have. The combined input sources are logically OR-ed together so that activating any of the listed reset sources causes the output to go active. Table 30. POR_RST RGU_RST PCR_RST COLD_RST WARM_RST SCU_RST CFID_RST FMC_RST EMC_RST SMC_RST GESS_A2V_RST PESS_A2V_RST GPIO_RST UART_RST TMR_RST SPI_RST IVNSS_A2V_RST IVNSS_CAN_RST IVNSS_LIN_RST MSCSS_A2V_RST MSCSS_PWM_RST MSCSS_ADC_RST MSCSS_TMR_RST I2C_RST QEI_RST DMA_RST USB_RST VIC_RST AHB_RST Reset output configuration Reset source power-on reset module POR_RST, RST pin RGU_RST, WATCHDOG PCR_RST COLD_RST COLD_RST COLD_RST COLD_RST COLD_RST COLD_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST WARM_RST Parts of the device reset when activated LP_OSC; is source for RGU_RST RGU internal; is source for PCR_RST PCR internal; is source for COLD_RST parts with COLD_RST as reset source below parts with WARM_RST as reset source below SCU CFID embedded Flash-Memory Controller (FMC) embedded SRAM-Memory Controller external Static-Memory Controller (SMC) GeSS AHB-to-APB bridge PeSS AHB-to-APB bridge all GPIO modules all UART modules all Timer modules in PeSS all SPI modules IVNSS AHB-to-APB bridge all CAN modules including Acceptance filter all LIN modules MSCSS AHB to APB bridge all PWM modules all ADC modules all Timer modules in MSCSS all I2C modules Quadrature encoder GPDMA controller USB controller Vectored Interrupt Controller (VIC) CPU and AHB Bus infrastructure Reset output 6.16.4.2 Pin description The RGU module in the LPC2927/2929 has the following pins. Table 31 shows the RGU pins. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 56 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB RGU pins Direction IN Description external reset input, Active LOW; pulled up internally Table 31. Symbol RST 6.16.5 Power Management Unit (PMU) This module enables software to actively control the system’s power consumption by disabling clocks not required in a particular operating mode. Using the base clocks from the CGU as input, the PMU generates branch clocks to the rest of the LPC2927/2929. Output clocks branched from the same base clock are phaseand frequency-related. These branch clocks can be individually controlled by software programming. The key features are: • • • • • • • 6.16.5.1 Individual clock control for all LPC2927/2929 sub-modules. Activates sleeping clocks when a wake-up event is detected. Clocks can be individually disabled by software. Supports AHB master-disable protocol when AUTO mode is set. Disables wake-up of enabled clocks when Power-down mode is set. Activates wake-up of enabled clocks when a wake-up event is received. Status register is available to indicate if an input base clock can be safely switched off (i.e. all branch clocks are disabled). Functional description The PMU controls all internal clocks coming out of the CGU0 for power-mode management. With some exceptions, each branch clock can be switched on or off individually under control of software register bits located in its individual configuration register. Some branch clocks controlling vital parts of the device operate in a fixed mode. Table 32 shows which mode- control bits are supported by each branch clock. By programming the configuration register the user can control which clocks are switched on or off, and which clocks are switched off when entering Power-down mode. Note that the standby-wait-for-interrupt instructions of the ARM968E-S processor (putting the ARM CPU into a low-power state) are not supported. Instead putting the ARM CPU into power-down should be controlled by disabling the branch clock for the CPU. Remark: For any disabled branch clocks to be re-activated their corresponding base clocks must be running (controlled by CGU0). Table 32 shows the relation between branch and base clocks, see also Section 6.7.1. Every branch clock is related to one particular base clock: it is not possible to switch the source of a branch clock in the PMU. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 57 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Table 32. Branch clock overview Legend: ‘1’ Indicates that the related register bit is tied off to logic HIGH, all writes are ignored ‘0’ Indicates that the related register bit is tied off to logic LOW, all writes are ignored ‘+’ Indicates that the related register bit is readable and writable Branch clock name Base clock Implemented switch on/off mechanism WAKE-UP CLK_SAFE CLK_SYS_CPU CLK_SYS CLK_SYS_PCR CLK_SYS_FMC CLK_SYS_RAM0 CLK_SYS_RAM1 CLK_SYS_SMC CLK_SYS_GESS CLK_SYS_VIC CLK_SYS_PESS CLK_SYS_GPIO0 CLK_SYS_GPIO1 CLK_SYS_GPIO2 CLK_SYS_GPIO3 CLK_SYS_IVNSS_A CLK_SYS_MSCSS_A CLK_SYS_DMA CLK_SYS_USB CLK_PCR_SLOW CLK_IVNSS_APB CLK_IVNSS_CANC0 CLK_IVNSS_CANC1 CLK_IVNSS_I2C0 CLK_IVNSS_I2C1 CLK_IVNSS_LIN0 CLK_IVNSS_LIN1 CLK_MSCSS_APB CLK_MSCSS_MTMR0 CLK_MSCSS_MTMR1 CLK_MSCSS_PWM0 CLK_MSCSS_PWM1 CLK_MSCSS_PWM2 CLK_MSCSS_PWM3 BASE_SAFE_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_SYS_CLK BASE_PCR_CLK BASE_IVNSS_CLK BASE_IVNSS_CLK BASE_IVNSS_CLK BASE_IVNSS_CLK BASE_IVNSS_CLK BASE_IVNSS_CLK BASE_IVNSS_CLK BASE_MSCSS_CLK BASE_MSCSS_CLK BASE_MSCSS_CLK BASE_MSCSS_CLK BASE_MSCSS_CLK BASE_MSCSS_CLK BASE_MSCSS_CLK 0 + + + + + + + + + + + + + + + + + + + + + + + + + + + + + + + + + + + AUTO 0 + + + + + + + + + + + + + + + + + + + + + + + + + + + + + + + + + + + RUN 1 1 1 1 + + + + + + + + + + + + + + + 1 + + + + + + + + + + + + + + + + © NXP B.V. 2009. All rights reserved. CLK_MSCSS_ADC0_APB BASE_MSCSS_CLK CLK_MSCSS_ADC1_APB BASE_MSCSS_CLK LPC2927_29_2 Preliminary data sheet Rev. 02 — 22 June 2009 58 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Table 32. Branch clock overview …continued Legend: ‘1’ Indicates that the related register bit is tied off to logic HIGH, all writes are ignored ‘0’ Indicates that the related register bit is tied off to logic LOW, all writes are ignored ‘+’ Indicates that the related register bit is readable and writable Branch clock name Base clock Implemented switch on/off mechanism WAKE-UP CLK_MSCSS_ADC2_APB BASE_MSCSS_CLK CLK_MSCSS_QEI CLK_OUT_CLK CLK_UART0 CLK_UART1 CLK_SPI0 CLK_SPI1 CLK_SPI2 CLK_TMR0 CLK_TMR1 CLK_TMR2 CLK_TMR3 CLK_ADC0 CLK_ADC1 CLK_ADC2 CLK_USB_I2C CLK_USB BASE_MSCSS_CLK BASE_OUT_CLK BASE_UART_CLK BASE_UART_CLK BASE_SPI_CLK BASE_SPI_CLK BASE_SPI_CLK BASE_TMR_CLK BASE_TMR_CLK BASE_TMR_CLK BASE_TMR_CLK BASE_ADC_CLK BASE_ADC_CLK BASE_ADC_CLK BASE_USB_I2C_CLK BASE_USB_CLK + + + + + + + + + + + + + + + + + AUTO + + + + + + + + + + + + + + + + + RUN + + + + + + + + + + + + + + + + + 6.17 Vectored Interrupt Controller (VIC) The LPC2927/2929 contains a very flexible and powerful Vectored Interrupt Controller to interrupt the ARM processor on request. The key features are: • • • • • • Level-active interrupt request with programmable polarity. 56 interrupt request inputs. Software interrupt request capability associated with each request input. Interrupt request state can be observed before masking. Software-programmable priority assignments to interrupt requests up to 15 levels. Software-programmable routing of interrupt requests towards the ARM-processor inputs IRQ and FIQ. • Fast identification of interrupt requests through vector. • Support for nesting of interrupt service routines. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 59 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 6.17.1 Functional description The Vectored Interrupt Controller routes incoming interrupt requests to the ARM processor. The interrupt target is configured for each interrupt request input of the VIC. The targets are defined as follows: • Target 0 is ARM processor FIQ (fast interrupt service). • Target 1 is ARM processor IRQ (standard interrupt service). Interrupt-request masking is performed individually per interrupt target by comparing the priority level assigned to a specific interrupt request with a target-specific priority threshold. The priority levels are defined as follows: • Priority level 0 corresponds to ‘masked’ (i.e. interrupt requests with priority 0 never lead to an interrupt). • Priority 1 corresponds to the lowest priority. • Priority 15 corresponds to the highest priority. Software interrupt support is provided and can be supplied for: • Testing RTOS (Real-Time Operating System) interrupt handling without using device-specific interrupt service routines. • Software emulation of an interrupt-requesting device, including interrupts. 6.17.2 Clock description The VIC is clocked by CLK_SYS_VIC, see Section 6.7.2. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 60 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 7. Limiting values Table 33. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Supply pins Ptot VDD(CORE) VDD(OSC_PLL) VDDA(ADC3V3) VDDA(ADC5V0) VDD(IO) IDD ISS total power dissipation core supply voltage oscillator and PLL supply voltage 3.3 V ADC analog supply voltage 5.0 V ADC analog supply voltage input/output supply voltage supply current ground current average value per supply pin average value per ground pin [2] [1] Parameter Conditions Min −0.5 −0.5 −0.5 −0.5 −0.5 - Max 1.5 +2.0 +2.0 +4.6 +6.0 +4.6 98 98 Unit W V V V V V mA mA [2] Input pins and I/O pins VXIN_OSC VI(IO) VI(ADC) voltage on pin XIN_OSC I/O input voltage ADC input voltage for ADC1/2: I/O port 0 pin 8 to pin 23. for ADC0: I/O port 0 pin 5 to pin 7; I/O port 2 pins 12 and 13; I/O port 3 pins 0 and 1. VVREFP VVREFN II(ADC) IOHS IOLS General Tstg Tamb storage temperature ambient temperature −65 −40 +150 +85 °C °C voltage on pin VREFP voltage on pin VREFN ADC input current HIGH-level short-circuit output current LOW-level short-circuit output current average value per input pin drive HIGH, output shorted to VSS(IO) drive LOW, output shorted to VDD(IO) [8] [2] [3][4][6] [4][6] −0.5 −0.5 −0.5 −0.5 +2.0 VDD(IO) + 3.0 VDDA(ADC3V3) + 0.5 VDDA(ADC5V0) + 0.5 V V V V [7][4][5][6] −0.5 −0.5 - +3.6 +3.6 35 −33 +38 V V mA mA mA Output pins and I/O pins configured as output [8] LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 61 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Table 33. Limiting values …continued In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol ESD VESD electrostatic discharge voltage on all pins human body model charged device model on corner pins charged device model [1] [2] [3] [4] [5] [6] [7] [8] [9] Based on package heat transfer, not device power consumption. Peak current must be limited at 25 times average current. For I/O Port 0, the maximum input voltage is defined by VI(ADC). Only when VDD(IO) is present. Not exceeding 6 V. Note that pull-up should be off. With pull-up do not exceed 3.6 V. For these input pins a fixed amplification of 2/3 is performed on the input voltage before feeding into the ADC0 itself. The maximum input voltage on ADC0 is VDDA(ADC5V0). 112 mA per VDD(IO) or VSS(IO) should not be exceeded. Human-body model: discharging a 100 pF capacitor via a 10 kΩ series resistor. [9] Parameter Conditions Min Max Unit −2000 −500 −750 +2000 +500 +750 V V V LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 62 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 8. Static characteristics Table 34. Static characteristics VDD(CORE) = VDD(OSC_PLL) ; VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; VDDA(ADC5V0) = 3.0 V to 5.5 V; Tvj = −40 °C to +85 °C; all voltages are measured with respect to ground; positive currents flow into the IC; unless otherwise specified.[1] Symbol Supplies Core supply VDD(CORE) IDD(CORE) core supply voltage core supply current Device state after reset; system clock at 125 MHz; Tamb = 85 °C; executing code while(1){} from flash. all clocks off I/O supply VDD(IO) IDD(IO) VDD(OSC_PLL) IDD(OSC_PLL) input/output supply voltage I/O supply current oscillator and PLL supply voltage oscillator and PLL supply current Normal mode Power-down mode [3] [2] Parameter Conditions Min Typ Max Unit 1.71 - 1.80 75 1.89 - V mA 2.7 30 0.5 1.80 3.3 5.0 - 475 3.6 3.25 1.89 1 2 3.6 5.5 1.9 4 1 1 +5.5 µA V µA V mA µA V V mA µA mA µA V Power-down mode 1.71 3.0 3.0 [5][6] Oscillator/PLL supply Analog-to-digital converter supply VDDA(ADC3V3) VDDA(ADC5V0) IDDA(ADC3V3) IDDA(ADC5V0) 3.3 V ADC analog supply voltage 5.0 V ADC analog supply voltage. 3.3 V ADC analog supply current 5.0 V ADC analog supply current. Normal mode Power-down mode Normal mode Power-down mode all port pins and VDD(IO) applied see Section 7 port 0 pins 8 to 23 when ADC1/2 is used all port pins and VDD(IO) not applied all other I/O pins, RST, TRST, TDI, JTAGSEL, TMS, TCK VIH HIGH-level input voltage all port pins, RST, TRST, TDI, JTAGSEL, TMS, TCK Rev. 02 — 22 June 2009 [6] [4] Input pins and I/O pins configured as input VI input voltage −0.5 VVREFP −0.5 −0.5 +3.6 VDD(IO) V V 2.0 - - V LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet 63 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Table 34. Static characteristics …continued VDD(CORE) = VDD(OSC_PLL) ; VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; VDDA(ADC5V0) = 3.0 V to 5.5 V; Tvj = −40 °C to +85 °C; all voltages are measured with respect to ground; positive currents flow into the IC; unless otherwise specified.[1] Symbol VIL Parameter LOW-level input voltage Conditions all port pins, RST, TRST, TDI, JTAGSEL, TMS, TCK Min Typ Max 0.8 Unit V Vhys ILIH ILIL II(pd) II(pu) hysteresis voltage HIGH-level input leakage current LOW-level input leakage current pull-down input current pull-up input current all port pins, VI = 3.3 V; VI = 5.5 V all port pins, RST, TRST, TDI, JTAGSEL, TMS: VI = 0 V; VI > 3.6 V is not allowed [7] 0.4 25 −25 50 −50 1 1 100 −115 V µA µA µA µA Ci VO VOH VOL CL input capacitance output voltage HIGH-level output voltage IOH = −4 mA LOW-level output voltage load capacitance IOL = 4 mA 0 VDD(IO) – 0.4 - 3 - 8 VDD(IO) 0.4 25 pF V V V pF Output pins and I/O pins configured as output USB pins USB_D+ and USB_D− Input characteristics VIH VIL Vhys Zo VOH HIGH-level input voltage LOW-level input voltage hysteresis voltage output impedance with 33 Ω series resistor 1.5 0.4 36.0 2.9 1.3 44.1 3.5 V V V Ω V Output characteristics HIGH-level output voltage (driven) for low-/full-speed; RL of 15 kΩ to GND LOW-level output voltage (driven) for low-/full-speed; with 1.5 kΩ resistor to 3.6 V external pull-up VOL - - 0.18 V IOH HIGH-level output current at VOH = VDD(IO) - 0.3 V; without 33 Ω external series resistor at VOH = VDD(IO) - 0.3 V; with 33 Ω external series resistor 20.8 - 41.7 mA 4.8 - 5.3 mA LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 64 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Table 34. Static characteristics …continued VDD(CORE) = VDD(OSC_PLL) ; VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; VDDA(ADC5V0) = 3.0 V to 5.5 V; Tvj = −40 °C to +85 °C; all voltages are measured with respect to ground; positive currents flow into the IC; unless otherwise specified.[1] Symbol IOL Parameter LOW-level output current Conditions at VOL = 0.3 V; without 33 Ω external series resistor at VOL = 0.3 V; with 33 Ω external series resistor IOHS IOLS Oscillator VXIN_OSC Rs(xtal) voltage on pin XIN_OSC crystal series resistance fosc = 10 MHz to 15 MHz Cxtal = 10 pF; Cext = 18 pF Cxtal = 20 pF; Cext = 39 pF fosc = 15 MHz to 20 MHz Cxtal = 10 pF; Cext = 18 pF Ci Vtrip(high) Vtrip(low) Vtrip(dif) input capacitance high trip level voltage low trip level voltage difference between high and low trip level voltage of XIN_OSC [9] [8] [8] Min 26.7 Typ - Max 57.2 Unit mA 5.0 - - 5.5 90.0 95.1 mA mA mA HIGH-level short-circuit output current LOW-level short-circuit output current drive high; pad connected to ground drive high; pad connected to VDD(IO) 0 - - 1.8 160 60 V Ω Ω 1.1 1.0 50 - 80 2 Ω pF V V mV Power-up reset [10] [10] [10] 1.4 1.3 120 1.6 1.5 180 [1] All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb = 85 °C on wafer level. Cased products are tested at Tamb = 25 °C (final testing). Both pre-testing and final testing use correlated test conditions to cover the specified temperature and power-supply voltage range. Leakage current is exponential to temperature; worst-case value is at 85 °C Tvj. All clocks off. Analog modules and FLASH powered down. VDDA(ADC3V3) must correlate with VDDA(ADC5V0): VDDA(ADC3V3) = VDDA(ADC5V0) / 1.5. VDDA(ADC5V0) must correlate with VDDA(ADC3V3): VDDA(ADC5V0) = VDDA(ADC3V3) × 1.5. Not 5 V-tolerant when pull-up is on. For I/O Port 0, the maximum input voltage is defined by VI(ADC). For Port 0, pin 0 to pin 15 add maximum 1.5 pF for input capacitance to ADC. For Port 0, pin 16 to pin 31 add maximum 1.0 pF for input capacitance to ADC. Cxtal is crystal load capacitance and Cext are the two external load capacitors. This parameter is not part of production testing or final testing, hence only a typical value is stated. Maximum and minimum values are based on simulation results. [2] [3] [4] [5] [6] [7] [8] [9] [10] The power-up reset has a time filter: VDD(CORE) must be above Vtrip(high) for 2 µs before reset is de-asserted; VDD(CORE) must be below Vtrip(low) for 11 µs before internal reset is asserted. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 65 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB Table 35. ADC static characteristics VDDA(ADC3V3) = 3.0 V to 3.6 V; Tamb = −40 °C to +85 °C unless otherwise specified; ADC frequency 4.5 MHz. Symbol VVREFN VVREFP VIA Zi Parameter voltage on pin VREFN voltage on pin VREFP analog input voltage input impedance for 3.3 V ADC1/2 between VVREFN and VVREFP between VVREFN and VDDA(ADC5V0) Cia ED EL(adj) EO EG ET Rvsi FSR [1] [2] [3] [4] [5] [6] [7] [8] Conditions Min 0 VVREFN 4.4 13.7 [1][2][3] [1][4] [1][5] [1][6] [1][7] [8] Typ - Max VVREFP − 2 VVREFP 23.6 1 ±1 ±2 ±3 ±0.5 ±4 40 10 Unit V V kΩ kΩ pF LSB LSB LSB % LSB kΩ bit VVREFN + 2 - VDDA(ADC3V3) V analog input capacitance differential linearity error integral non-linearity offset error gain error absolute error voltage source interface resistance full scale range for ADC0/1/2 for ADC0/1/2 for ADC0/1/2 for ADC0/1/2 for ADC0/1/2 for ADC0/1/2 for ADC0/1/2 for ADC0/1/2 2 Conditions: VSS(IO) = 0 V, VDDA(ADC3V3) = 3.3 V. The ADC is monotonic, there are no missing codes. The differential linearity error (ED) is the difference between the actual step width and the ideal step width. See Figure 17. The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after appropriate adjustment of gain and offset errors. See Figure 17. The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the ideal curve. See Figure 17. The gain error (EG) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset error, and the straight line which fits the ideal transfer curve. See Figure 17. The absolute error (ET) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated ADC and the ideal transfer curve. See Figure 17. See Figure 16. LPC2XXX 20 kΩ ADC IN[y]SAMPLE 3 pF 5 pF ADC IN[y] Rvsi VEXT VSS(IO), VSS(CORE) 002aae280 Fig 16. Suggested ADC interface - LPC2927/2929 ADC1/2 IN[y] pin LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 66 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB offset error EO 1023 gain error EG 1022 1021 1020 1019 1018 (2) 7 code out 6 (1) 5 (5) 4 (4) 3 (3) 2 1 1 LSB (ideal) 1018 1019 1020 1021 1022 1023 1024 0 1 offset error EO 2 3 4 5 6 7 VIA (LSBideal) 002aae703 (1) Example of an actual transfer curve. (2) The ideal transfer curve. (3) Differential linearity error (ED). (4) Integral non-linearity (EL(adj)). (5) Center of a step of the actual transfer curve. Fig 17. ADC characteristics LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 67 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 8.1 Power consumption 80 IDD(CORE) (mA) 60 002aae241 40 20 0 10 50 90 core frequency (MHz) 130 Conditions: Tamb = 25 °C; active mode entered executing code from flash; core voltage 1.8 V; all peripherals enabled but not configured to run. Fig 18. IDD(CORE) at different core frequencies (active mode) 80 IDD(CORE) (mA) 60 100 MHz 80 MHz 40 125 MHz 002aae240 40 MHz 20 10 MHz 0 1.7 1.8 core voltage (V) 1.9 Conditions: Tamb = 25 °C; active mode entered executing code from flash; all peripherals enabled but not configured to run. Fig 19. IDD(CORE) at different core voltages VDD(CORE) (active mode) LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 68 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 80 IDD(CORE) (mA) 60 125 MHz 002aae239 100 MHz 80 MHz 40 40 MHz 20 10 MHz 0 −40 −15 10 35 60 85 temperature (°C) Conditions: active mode entered executing code from flash; core voltage 1.8 V; all peripherals enabled but not configured to run. Fig 20. IDD(CORE) at different temperatures (active mode) 8.2 Electrical pin characteristics 500 VOL (mV) 400 85 °C 25 °C 0 °C −40 °C 002aae689 300 200 100 0 1.0 2.0 3.0 4.0 5.0 IOL(mA) 6.0 VDD(IO) = 3.3 V. Fig 21. Typical LOW-level output voltage versus LOW-level output current LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 69 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 3.5 VOH (V) 3.0 002aae690 85 °C 25 °C 0 °C −40 °C 2.5 2.0 1.0 2.0 3.0 4.0 5.0 IOH (mA) 6.0 VDD(IO) = 3.3 V. Fig 22. Typical HIGH-level output voltage versus HIGH-level output current 80 II(pd) (µA) 70 002aae691 60 VDD(IO) = 3.6 V 3.0 V 2.7 V 50 40 −40 −15 10 35 60 85 temperature (°C) VI = 3.3 V. Fig 23. Typical pull-down current versus temperature LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 70 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB −20 II(pu) (µA) −40 002aae692 VDD(IO) = 2.7 V 3.3 V −60 3.6 V −80 −100 −40 −15 10 35 60 85 temperature (°C) VI = 0 V. Fig 24. Typical pull-up current versus temperature LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 71 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 9. Dynamic characteristics 9.1 Dynamic characteristics: I/O and CLKOUT pins, internal clock, oscillators, PLL, and CAN Table 36. Dynamic characteristics VDD(CORE) = VDD(OSC_PLL); VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; all voltages are measured with respect to ground; positive currents flow into the IC; unless otherwise specified.[1] Symbol I/O pins tTHL tTLH CLKOUT pin fclk Internal clock fclk(sys) Tclk(sys) fref(RO) tstartup Oscillator fi(osc) oscillator input frequency maximum frequency is the clock input of an external clock source applied to the XIN_OSC pin at maximum frequency [3] [4] Parameter Conditions Min 4 4 Typ - Max 13.8 13.8 Unit ns ns HIGH to LOW transition CL = 30 pF time LOW to HIGH transition CL = 30 pF time clock frequency system clock frequency system clock period RO reference frequency start-up time at maximum frequency [3] on pin CLKOUT [2] [2] 10 8 0.4 10 0.5 6 - 40 125 100 0.6 100 MHz MHz ns MHz µs MHz Low-power ring oscillator tstartup PLL fi(PLL) fo(PLL) ta(clk) ta(A) tjit(cc)(p-p) start-up time - 500 - µs PLL input frequency PLL output frequency CCO; direct mode clock access time address access time cycle to cycle jitter (peak-to-peak value) on CAN TXDC pin [3] 10 10 156 - 0.4 25 160 320 63.4 60.3 1 MHz MHz MHz ns ns ns Jitter specification for CAN [1] All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb = 85 °C ambient temperature on wafer level. Cased products are tested at Tamb = 25 °C (final testing). Both pre-testing and final testing use correlated test conditions to cover the specified temperature and power supply voltage range. See Table 27. This parameter is not part of production testing or final testing, hence only a typical value is stated. Oscillator start-up time depends on the quality of the crystal. For most crystals it takes about 1000 clock pulses until the clock is fully stable. © NXP B.V. 2009. All rights reserved. [2] [3] [4] LPC2927_29_2 Preliminary data sheet Rev. 02 — 22 June 2009 72 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 520 fref(RO) (kHz) 510 1.9 V 1.8 V 1.7 V 002aae373 500 490 480 −40 −15 10 35 60 85 temperature (°C) Fig 25. Low-power ring oscillator thermal characteristics LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 73 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 9.2 USB interface Table 37. Dynamic characteristics: USB pins (full-speed) CL = 50 pF; Rpu = 1.5 kΩ on D+ to VDD(3V3), unless otherwise specified. Symbol tr tf tFRFM VCRS tFEOPT tFDEOP tJR1 tJR2 tEOPR1 Parameter rise time fall time differential rise and fall time matching output signal crossover voltage source SE0 interval of EOP source jitter for differential transition to SE0 transition receiver jitter to next transition receiver jitter for paired transitions EOP width at receiver 10 % to 90 % must reject as EOP; see Figure 26 must accept as EOP; see Figure 26 [1] Conditions 10 % to 90 % 10 % to 90 % tr / tf Min 8.5 7.7 1.3 Typ - Max 13.8 13.7 109 2.0 175 +5 +18.5 +9 - Unit ns ns % V ns ns ns ns ns see Figure 26 see Figure 26 160 −2 −18.5 −9 40 tEOPR2 EOP width at receiver [1] 82 - - ns [1] Characterized but not implemented as production test. Guaranteed by design. TPERIOD crossover point differential data lines crossover point extended source EOP width: tFEOPT differential data to SE0/EOP skew n × TPERIOD + tFDEOP receiver EOP width: tEOPR1, tEOPR2 002aab561 Fig 26. Differential data-to-EOP transition skew and EOP width LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 74 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 9.3 Dynamic characteristics: I2C-bus interface Table 38. Dynamic characteristic: I2C-bus pins VDD(CORE) = VDD(OSC_PLL); VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; all voltages are measured with respect to ground; positive currents flow into the IC; unless otherwise specified[1] Symbol tf(o) [1] Parameter output fall time Conditions VIH to VIL Min 20 + 0.1 × Cb[3] Typ[2] - Max - Unit ns All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb = 85 °C ambient temperature on wafer level. Cased products are tested at Tamb = 25 °C (final testing). Both pre-testing and final testing use correlated test conditions to cover the specified temperature and power supply voltage range. Typical ratings are not guaranteed. The values listed are at room temperature (25 °C), nominal supply voltages. Bus capacitance Cb in pF, from 10 pF to 400 pF. [2] [3] LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 75 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 9.4 Dynamic characteristics: SPI Table 39. Dynamic characteristics of SPI pins VDD(CORE) = VDD(OSC_PLL) ; VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; VDDA(ADC5V0) = 3.0 V to 5.5 V; Tvj = -40 °C to +85 °C; all voltages are measured with respect to ground; positive currents flow into the IC; unless otherwise specified.[1] Symbol fSPI tsu(SPI_MISO) Parameter SPI operating frequency SPI_MISO set-up time Conditions master operation slave operation Tamb = 25 °C; measured in SPI Master mode; see Figure 27 Min 1⁄ 65024fclk(SPI) 1⁄ 65024fclk(SPI) Typ 11 Max 1⁄ 1⁄ 2fclk(SPI) 4fclk(SPI) Unit MHz MHz ns - - [1] All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb = 85 °C ambient temperature on wafer level. Cased products are tested at Tamb = 25 °C (final testing). Both pre-testing and final testing use correlated test conditions to cover the specified temperature and power supply voltage range. shifting edges SCKn sampling edges SDOn SDIn tsu(SPI_MISO) 002aae695 Fig 27. SPI data input set-up time in SSP Master mode LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 76 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 9.5 Dynamic characteristics: flash memory and EEPROM Table 40. Flash characteristics Tamb = -40 °C to +85 °C; VDD(CORE) = VDD(OSC_PLL); VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; all voltages are measured with respect to ground. Symbol Nendu tret tprog ter tinit twr(pg) tfl(BIST) ta(clk) ta(A) [1] Parameter endurance retention time programming time erase time initialization time page write time flash word BIST time clock access time address access time Conditions [1] Min 10000 10 20 0.95 95 95 0.95 - Typ 1 100 100 1 38 - Max 1.05 105 105 150 1.05 70 63.4 60.3 Unit cycles years years ms ms ms µs ms ns ns ns powered unpowered word global sector Number of program/erase cycles. Table 41. EEPROM characteristics Tamb = -40 °C to +85 °C; VDD(CORE) = VDD(OSC_PLL); VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; all voltages are measured with respect to ground. Symbol fclk Nendu tret Parameter clock frequency endurance retention time powered Conditions Min 200 100000 10 Typ 375 500000 Max 400 Unit kHz cycles years LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 77 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 9.6 Dynamic characteristics: external static memory Table 42. External static memory interface dynamic characteristics VDD(CORE) = VDD(OSC_PLL); VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; all voltages are measured with respect to ground.[1] Symbol TCLCL ta(R)int ta(W)int tCSLAV tOELAV tCSLOEL tsu(DQ) th(D) tCSHOEH Parameter clock cycle time internal read access time internal write access time CS LOW to address valid time OE LOW to address valid time CS LOW to OE LOW time data input /output set-up time data input hold time CS HIGH to OE HIGH time Conditions Min 8 −5 −5 − WSTOEN × TCLCL 11 0 Typ −2.5 −2.5 − WSTOEN × TCLCL 0 + WSTOEN × TCLCL 16 2.5 0 Max Unit 100 ns 20.5 ns 24.9 ns 22 5 ns ns ns ns ns ns ns ns ns Read cycle parameters tBLSLBLSH BLS LOW to BLS HIGH time tOELOEH tBLSLAV OE LOW to OE HIGH time BLS LOW to address valid time CS HIGH to BLS HIGH time CS LOW to WE LOW time CS LOW to BLS LOW time WE LOW to data valid time CS LOW to data valid time WE LOW to WE HIGH time [4] [3] [2] (WST1 − WSTOEN +1) × TCLCL (WST1 − WSTOEN +1) × TCLCL 0 + WSTOEN × TCLCL - Write cycle parameters tCSHBLSH tCSLWEL tCSLBLSL tWELDV tCSLDV tWELWEH −0.5 0 WSTWEN × TCLCL −0.1 0.3 ns ns ns ns ns ns ns (WSTWEN + 0.5) × TCLCL (WSTWEN + 0.5) × TCLCL (WST2 − WSTWEN +1) × TCLCL (WST2 - WSTWEN +2) × TCLCL - tBLSLBLSH BLS LOW to BLS HIGH time [1] All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb = 85 °C ambient temperature on wafer level. Cased products are tested at Tamb = 25 °C (final testing). Both pre-testing and final testing use correlated test conditions to cover the specified temperature and power supply voltage range. When the byte lane select signals are used to connect the write enable input (8 bit devices), tCSHBLSH = −0.5 × TCLCL. When the byte lane select signals are used to connect the write enable input (8 bit devices), tCSLBLSL = tCSLWEL. For 16 and 32 bit devices. [2] [3] [4] LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 78 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB tCSLAV CS tCSHOEH A tsu(DQ) D tCSLOEL tOELAV, tBLSLAV OE/BLS 002aae687 th(D) tOELOEH, tBLSLBLSH Fig 28. External memory read access tCSLDV CS tCSHBLSH tBLSLBLSH BLS tCSLBLSL tCSLWEL tWELWEH WE tWELDV A tCSLDV D 002aae688 Fig 29. External memory write access LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 79 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 9.7 Dynamic characteristics: ADC Table 43. ADC dynamic characteristics VDD(CORE) = VDD(OSC_PLL); VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; all voltages are measured with respect to ground.[1] Symbol 5.0 V ADC0 fi(ADC) fs(max) ADC input frequency maximum sampling rate fi(ADC) = 4.5 MHz; fs = fi(ADC)/(n + 1) with n = resolution resolution 2 bit resolution 10 bit tconv conversion time In number of ADC clock cycles In number of bits 3.3 V ADC1/2 fi(ADC) fs(max) ADC input frequency maximum sampling rate fi(ADC) = 4.5 MHz; fs = fi(ADC)/(n + 1) with n = resolution resolution 2 bit resolution 10 bit tconv conversion time In number of ADC clock cycles In number of bits [1] [2] [2] Parameter Conditions Min 4 Typ - Max 4.5 Unit MHz 3 4 - 1500 400 11 10 4.5 ksample/s ksample/s cycles bits MHz 3 2 - 1500 400 11 10 ksample/s ksample/s cycles bits All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb = 85 °C ambient temperature on wafer level. Cased products are tested at Tamb = 25 °C (final testing). Both pre-testing and final testing use correlated test conditions to cover the specified temperature and power supply voltage range. Duty cycle clock should be as close as possible to 50 %. [2] 10. Application information 10.1 Operating frequency selection The LPC2927/2929 is specified to operate at a maximum frequency of 125 MHz, maximum temperature of 85 °C, and maximum core voltage of 1.89 V. Figure 30 and Figure 31 show that the user can achieve higher operating frequencies for the LPC2927/2929 by controlling the temperature and the core voltage accordingly. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 80 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 145 core frequency (MHz) 135 VDD(CORE) = 1.95 V VDD(CORE) = 1.8 V 002aae194 125 VDD(CORE) = 1.65 V 115 105 25 45 65 temperature (°C) 85 Fig 30. Core operating frequency versus temperature for different core voltages. 145 core frequency (MHz) 135 25 °C 45 °C 65 °C 85 °C 002aae193 125 115 105 1.65 1.75 1.85 core voltage (V) 1.95 Fig 31. Core operating frequency versus core voltage for different temperatures LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 81 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 10.2 Suggested USB interface solutions VDD(IO) USB_UP_LED USB_CONNECT LPC29xx SoftConnect switch R1 1.5 kΩ USB_VBUS USB_D+ RS = 33 Ω USB_D− VSS(IO) 002aae149 RS = 33 Ω USB-B connector Fig 32. LPC2927/2929 USB interface on a self-powered device VDD(IO) R2 LPC29xx USB_UP_LED USB_VBUS USB_D+ RS = 33 Ω USB_D− RS = 33 Ω VSS(IO) R1 1.5 kΩ USB-B connector 002aae150 Fig 33. LPC2927/2929 USB interface on a bus-powered device LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 82 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB VDD(IO) R1 R2 R3 R4 USB_RST RESET_N ADR/PSW VDD(IO) OE_N/INT_N SPEED SUSPEND VBUS ID DP 33 Ω 33 Ω ISP1302 DM Mini-AB connector LPC29xx R4 R5 R6 USB_SCL USB_SDA USB_INT USB_D+ USB_D− SCL SDA INT_N VSS(IO) 002aae151 Fig 34. LPC2927/2929 USB OTG port configuration VDD(IO) USB_UP_LED VDD(IO) USB_CONNECT LPC29xx VSS(IO) USB_D+ USB_D− USB_VBUS 33 Ω 33 Ω D+ D− VBUS USB-B connector 002aae152 Fig 35. LPC2927/2929 USB device port configuration LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 83 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 10.3 SPI signal forms SCKn (CPOL = 0) SCKn (CPOL = 1) SDOn CPHA = 1 SDIn MSB OUT DATA VALID LSB OUT MSB IN DATA VALID LSB IN SDOn CPHA = 0 MSB OUT DATA VALID LSB OUT SDIn MSB IN DATA VALID LSB IN 002aae693 Fig 36. SPI timing in master mode SCKn (CPOL = 0) SCKn (CPOL = 1) SDIn CPHA = 1 SDOn MSB IN DATA VALID LSB IN MSB OUT DATA VALID LSB OUT SDIn CPHA = 0 MSB IN DATA VALID LSB IN SDOn MSB OUT DATA VALID LSB OUT 002aae694 Fig 37. SPI timing in slave mode LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 84 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 10.4 XIN_OSC input The input voltage to the on-chip oscillators is limited to 1.8 V. If the oscillator is driven by a clock in slave mode, it is recommended that the input be coupled through a capacitor with Ci = 100 pF. To limit the input voltage to the specified range, choose an additional capacitor to ground Cg which attenuates the input voltage by a factor Ci/(Ci + Cg). In slave mode, a minimum of 200 mVrms is needed. For more details see the LPC29xx User manual UM10316. LPC29xx XIN_OSC Ci 100 pF Cg 002aae730 Fig 38. Slave mode operation of the on-chip oscillator 10.5 XIN_OSC Printed Circuit Board (PCB) layout guidelines The crystal should be connected on the PCB as close as possible to the oscillator input and output pins of the chip. Take care that the load capacitors Cx1 and Cx2, and Cx3 in case of third overtone crystal usage, have a common ground plane. The external components must also be connected to the ground plain. Loops must be made as small as possible, in order to keep the noise coupled in via the PCB as small as possible. Also parasitics should stay as small as possible. Values of Cx1 and Cx2 should be chosen smaller accordingly to the increase in parasitics of the PCB layout. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 85 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 11. Package outline LQFP144: plastic low profile quad flat package; 144 leads; body 20 x 20 x 1.4 mm SOT486-1 c y X A 108 109 73 72 ZE e E HE A A2 A1 (A 3) θ Lp L detail X wM bp pin 1 index 144 1 wM D HD ZD B vM B 36 bp vM A 37 e 0 5 scale 10 mm DIMENSIONS (mm are the original dimensions) UNIT mm A max. 1.6 A1 0.15 0.05 A2 1.45 1.35 A3 0.25 bp 0.27 0.17 c 0.20 0.09 D (1) 20.1 19.9 E (1) 20.1 19.9 e 0.5 HD HE L 1 Lp 0.75 0.45 v 0.2 w 0.08 y 0.08 Z D(1) Z E(1) 1.4 1.1 1.4 1.1 θ 7 o 0 o 22.15 22.15 21.85 21.85 Note 1. Plastic or metal protrusions of 0.25 mm maximum per side are not included. OUTLINE VERSION SOT486-1 REFERENCES IEC 136E23 JEDEC MS-026 JEITA EUROPEAN PROJECTION ISSUE DATE 00-03-14 03-02-20 Fig 39. Package outline SOT486-1 (LQFP144) LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 86 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 12. Soldering of SMD packages This text provides a very brief insight into a complex technology. A more in-depth account of soldering ICs can be found in Application Note AN10365 “Surface mount reflow soldering description”. 12.1 Introduction to soldering Soldering is one of the most common methods through which packages are attached to Printed Circuit Boards (PCBs), to form electrical circuits. The soldered joint provides both the mechanical and the electrical connection. There is no single soldering method that is ideal for all IC packages. Wave soldering is often preferred when through-hole and Surface Mount Devices (SMDs) are mixed on one printed wiring board; however, it is not suitable for fine pitch SMDs. Reflow soldering is ideal for the small pitches and high densities that come with increased miniaturization. 12.2 Wave and reflow soldering Wave soldering is a joining technology in which the joints are made by solder coming from a standing wave of liquid solder. The wave soldering process is suitable for the following: • Through-hole components • Leaded or leadless SMDs, which are glued to the surface of the printed circuit board Not all SMDs can be wave soldered. Packages with solder balls, and some leadless packages which have solder lands underneath the body, cannot be wave soldered. Also, leaded SMDs with leads having a pitch smaller than ~0.6 mm cannot be wave soldered, due to an increased probability of bridging. The reflow soldering process involves applying solder paste to a board, followed by component placement and exposure to a temperature profile. Leaded packages, packages with solder balls, and leadless packages are all reflow solderable. Key characteristics in both wave and reflow soldering are: • • • • • • Board specifications, including the board finish, solder masks and vias Package footprints, including solder thieves and orientation The moisture sensitivity level of the packages Package placement Inspection and repair Lead-free soldering versus SnPb soldering 12.3 Wave soldering Key characteristics in wave soldering are: • Process issues, such as application of adhesive and flux, clinching of leads, board transport, the solder wave parameters, and the time during which components are exposed to the wave • Solder bath specifications, including temperature and impurities LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 87 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 12.4 Reflow soldering Key characteristics in reflow soldering are: • Lead-free versus SnPb soldering; note that a lead-free reflow process usually leads to higher minimum peak temperatures (see Figure 40) than a SnPb process, thus reducing the process window • Solder paste printing issues including smearing, release, and adjusting the process window for a mix of large and small components on one board • Reflow temperature profile; this profile includes preheat, reflow (in which the board is heated to the peak temperature) and cooling down. It is imperative that the peak temperature is high enough for the solder to make reliable solder joints (a solder paste characteristic). In addition, the peak temperature must be low enough that the packages and/or boards are not damaged. The peak temperature of the package depends on package thickness and volume and is classified in accordance with Table 44 and 45 Table 44. SnPb eutectic process (from J-STD-020C) Package reflow temperature (°C) Volume (mm3) < 350 < 2.5 ≥ 2.5 Table 45. 235 220 Lead-free process (from J-STD-020C) Package reflow temperature (°C) Volume (mm3) < 350 < 1.6 1.6 to 2.5 > 2.5 260 260 250 350 to 2000 260 250 245 > 2000 260 245 245 ≥ 350 220 220 Package thickness (mm) Package thickness (mm) Moisture sensitivity precautions, as indicated on the packing, must be respected at all times. Studies have shown that small packages reach higher temperatures during reflow soldering, see Figure 40. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 88 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB temperature maximum peak temperature = MSL limit, damage level minimum peak temperature = minimum soldering temperature peak temperature time 001aac844 MSL: Moisture Sensitivity Level Fig 40. Temperature profiles for large and small components For further information on temperature profiles, refer to Application Note AN10365 “Surface mount reflow soldering description”. LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 89 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 13. Abbreviations Table 46. AHB AMBA APB BCL BDL BEL BIST CCO CISC DMA DSP DTL EOP ETB ETM FIQ GPDMA IRQ LIN LSB MAC MSB MSC PHY PLL Q-SPI RISC SFSP SCL TTL UART Abbreviations list Description Advanced High-performance Bus Advanced Microcontroller Bus Architecture ARM Peripheral Bus Buffer Control List Buffer Descriptor List Buffer Entry List Built-In Self Test Current Controlled Oscillator Complex Instruction Set Computers Direct Memory Access Digital Signal Processing Device Transaction Level End Of Packet Embedded Trace Buffer Embedded Trace Macrocell Fast Interrupt reQuest General Purpose DMA Interrupt Request Local Interconnect Network Least Significant Bit Media Access Control Most Significant Bit Modulation and Sampling Control PHYsical layer Phase-Locked Loop Queued SPI Reduced Instruction Set Computer SCU Function Select Port x,y (use without the P if there are no x,y) Slot Control List Transistor-Transistor Logic Universal Asynchronous Receiver Transmitter Abbreviation 14. References [1] [2] [3] UM10316 — LPC29xx user manual ARM — ARM web site ARM-SSP — ARM primecell synchronous serial port (PL022) technical reference manual LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 90 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB CAN — ISO 11898-1: 2002 road vehicles - Controller Area Network (CAN) - part 1: data link layer and physical signalling LIN — LIN specification package, revision 2.0 [4] [5] LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 91 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 15. Revision history Table 47. Revision history Release date 20090622 Data sheet status Preliminary data sheet Change notice Supersedes LPC2927_29_1 Document ID LPC2927_29_2 Modifications: • • • • • • • • • • Dynamic characteristics of CLKOUT pin added (Table 36). Flash/EEPROM endurance and retention characteristics updated (Table 40 and Table 41). Electrical pin characteristics added (Figure 21 to Figure 23). External static memory timing parameters and diagrams updated (Section 9.6. and Figure 5 to Figure 7). SPI signal forms added (Figure 36 and Figure 37). SPI timing parameters and diagram updated (Section 9.4). PCB layout guidelines added (Section 10.5). XIN_OSC circuit added (Section 10.4). IDD(CORE) conditions and value updated in Table 34. Editorial updates. Preliminary data sheet - LPC2927_29_1 20090115 LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 92 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 16. Legal information 16.1 Data sheet status Document status[1][2] Objective [short] data sheet Preliminary [short] data sheet Product [short] data sheet [1] [2] [3] Product status[3] Development Qualification Production Definition This document contains data from the objective specification for product development. This document contains data from the preliminary specification. This document contains the product specification. Please consult the most recently issued document before initiating or completing a design. The term ‘short data sheet’ is explained in section “Definitions”. The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 16.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. 16.3 Disclaimers General — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental 16.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. I2C-bus — logo is a trademark of NXP B.V. 17. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 93 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 18. Contents 1 2 3 3.1 4 5 5.1 5.2 5.2.1 5.2.2 6 6.1 6.2 6.3 6.4 6.5 6.6 6.6.1 6.6.2 6.6.3 6.6.3.1 6.6.4 6.7 6.7.1 6.7.2 6.8 6.8.1 6.8.2 6.8.3 6.8.4 6.8.5 6.8.6 6.9 6.9.1 6.9.2 6.9.3 6.9.4 6.10 6.10.1 6.10.2 6.11 6.11.1 6.11.2 6.11.3 6.11.4 6.12 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Ordering information . . . . . . . . . . . . . . . . . . . . . 3 Ordering options . . . . . . . . . . . . . . . . . . . . . . . . 3 Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Pinning information . . . . . . . . . . . . . . . . . . . . . . 5 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 5 General description. . . . . . . . . . . . . . . . . . . . . . 5 LQFP144 pin assignment . . . . . . . . . . . . . . . . . 5 Functional description . . . . . . . . . . . . . . . . . . 11 Architectural overview. . . . . . . . . . . . . . . . . . . 11 ARM968E-S processor . . . . . . . . . . . . . . . . . . 12 On-chip flash memory system . . . . . . . . . . . . 13 On-chip static RAM. . . . . . . . . . . . . . . . . . . . . 13 Memory map. . . . . . . . . . . . . . . . . . . . . . . . . . 14 Reset, debug, test, and power description . . . 15 Reset and power-up behavior. . . . . . . . . . . . . 15 Reset strategy. . . . . . . . . . . . . . . . . . . . . . . . . 15 IEEE 1149.1 interface pins (JTAG boundary scan test) . . . . . . . . . . . . . . . 15 ETM/ETB . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Power supply pins. . . . . . . . . . . . . . . . . . . . . . 16 Clocking strategy . . . . . . . . . . . . . . . . . . . . . . 16 Clock architecture . . . . . . . . . . . . . . . . . . . . . . 16 Base clock and branch clock relationship . . . . 17 Flash memory controller . . . . . . . . . . . . . . . . . 20 Functional description. . . . . . . . . . . . . . . . . . . 20 Pin description . . . . . . . . . . . . . . . . . . . . . . . . 21 Clock description . . . . . . . . . . . . . . . . . . . . . . 21 Flash layout. . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Flash bridge wait-states . . . . . . . . . . . . . . . . . 22 EEPROM . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 External static memory controller . . . . . . . . . . 23 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Pin description . . . . . . . . . . . . . . . . . . . . . . . . 24 Clock description . . . . . . . . . . . . . . . . . . . . . . 24 External memory timing diagrams . . . . . . . . . 24 General Purpose DMA (GPDMA) controller . . 26 DMA support for peripherals. . . . . . . . . . . . . . 26 Clock description . . . . . . . . . . . . . . . . . . . . . . 27 USB interface . . . . . . . . . . . . . . . . . . . . . . . . . 27 USB device controller . . . . . . . . . . . . . . . . . . . 27 USB OTG controller . . . . . . . . . . . . . . . . . . . . 27 Pin description . . . . . . . . . . . . . . . . . . . . . . . . 28 Clock description . . . . . . . . . . . . . . . . . . . . . . 28 General subsystem. . . . . . . . . . . . . . . . . . . . . 29 6.12.1 6.12.2 6.12.3 6.12.4 6.12.4.1 6.13 6.13.1 6.13.2 6.13.2.1 6.13.2.2 6.13.3 6.13.3.1 6.13.3.2 6.13.4 6.13.4.1 6.13.4.2 6.13.5 6.13.5.1 6.13.5.2 6.13.5.3 6.13.6 6.13.6.1 6.13.6.2 6.13.6.3 6.14 6.14.1 6.14.1.1 6.14.1.2 6.14.2 6.14.2.1 6.14.3 6.14.3.1 6.15 6.15.1 6.15.2 6.15.3 6.15.4 6.15.4.1 6.15.4.2 6.15.4.3 6.15.5 6.15.5.1 6.15.5.2 6.15.5.3 6.15.5.4 6.15.5.5 6.15.6 6.15.6.1 General subsystem clock description. . . . . . . Chip and feature identification . . . . . . . . . . . . System Control Unit (SCU) . . . . . . . . . . . . . . Event router . . . . . . . . . . . . . . . . . . . . . . . . . . Pin description . . . . . . . . . . . . . . . . . . . . . . . . Peripheral subsystem. . . . . . . . . . . . . . . . . . . Peripheral subsystem clock description . . . . . Watchdog timer . . . . . . . . . . . . . . . . . . . . . . . Functional description . . . . . . . . . . . . . . . . . . Clock description . . . . . . . . . . . . . . . . . . . . . . Timer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Pin description . . . . . . . . . . . . . . . . . . . . . . . . Clock description . . . . . . . . . . . . . . . . . . . . . . UARTs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Pin description . . . . . . . . . . . . . . . . . . . . . . . . Clock description . . . . . . . . . . . . . . . . . . . . . . Serial peripheral interface (SPI) . . . . . . . . . . . Functional description . . . . . . . . . . . . . . . . . . Pin description . . . . . . . . . . . . . . . . . . . . . . . . Clock description . . . . . . . . . . . . . . . . . . . . . . General-purpose I/O . . . . . . . . . . . . . . . . . . . Functional description . . . . . . . . . . . . . . . . . . Pin description . . . . . . . . . . . . . . . . . . . . . . . . Clock description . . . . . . . . . . . . . . . . . . . . . . Networking subsystem . . . . . . . . . . . . . . . . . . CAN gateway . . . . . . . . . . . . . . . . . . . . . . . . . Global acceptance filter . . . . . . . . . . . . . . . . . Pin description . . . . . . . . . . . . . . . . . . . . . . . . LIN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Pin description . . . . . . . . . . . . . . . . . . . . . . . . I2C-bus serial I/O controllers . . . . . . . . . . . . . Pin description . . . . . . . . . . . . . . . . . . . . . . . . Modulation and sampling control subsystem . Functional description . . . . . . . . . . . . . . . . . . Pin description . . . . . . . . . . . . . . . . . . . . . . . . Clock description . . . . . . . . . . . . . . . . . . . . . . Analog-to-digital converter . . . . . . . . . . . . . . . Functional description . . . . . . . . . . . . . . . . . . Pin description . . . . . . . . . . . . . . . . . . . . . . . . Clock description . . . . . . . . . . . . . . . . . . . . . . Pulse Width Modulator (PWM). . . . . . . . . . . . Functional description . . . . . . . . . . . . . . . . . . Synchronizing the PWM counters . . . . . . . . . Master and slave mode . . . . . . . . . . . . . . . . . Pin description . . . . . . . . . . . . . . . . . . . . . . . . Clock description . . . . . . . . . . . . . . . . . . . . . . Timers in the MSCSS. . . . . . . . . . . . . . . . . . . Pin description . . . . . . . . . . . . . . . . . . . . . . . . 29 29 29 29 30 30 30 30 31 31 31 32 32 32 33 33 33 34 34 35 35 35 35 36 36 36 36 36 37 37 37 38 38 38 41 41 41 42 42 43 44 44 45 46 46 46 46 47 continued >> LPC2927_29_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 22 June 2009 94 of 95 NXP Semiconductors LPC2927/2929 ARM9 microcontroller with CAN, LIN, and USB 47 47 48 48 48 49 50 50 53 54 54 55 55 56 56 57 57 59 60 60 61 63 68 69 72 12.4 13 14 15 16 16.1 16.2 16.3 16.4 17 18 Reflow soldering. . . . . . . . . . . . . . . . . . . . . . . Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . References . . . . . . . . . . . . . . . . . . . . . . . . . . . . Revision history . . . . . . . . . . . . . . . . . . . . . . . Legal information . . . . . . . . . . . . . . . . . . . . . . Data sheet status . . . . . . . . . . . . . . . . . . . . . . Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . Contact information . . . . . . . . . . . . . . . . . . . . Contents. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88 90 90 92 93 93 93 93 93 93 94 6.15.6.2 6.15.7 6.15.7.1 6.15.7.2 6.16 Clock description . . . . . . . . . . . . . . . . . . . . . . Quadrature Encoder Interface (QEI). . . . . . . . Pin description . . . . . . . . . . . . . . . . . . . . . . . . Clock description . . . . . . . . . . . . . . . . . . . . . . Power, Clock and Reset Control Subsystem (PCRSS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6.16.1 Clock description . . . . . . . . . . . . . . . . . . . . . . 6.16.2 Clock Generation Unit (CGU0) . . . . . . . . . . . . 6.16.2.1 Functional description. . . . . . . . . . . . . . . . . . . 6.16.2.2 PLL functional description . . . . . . . . . . . . . . . 6.16.2.3 Pin description . . . . . . . . . . . . . . . . . . . . . . . . 6.16.3 Clock generation for USB (CGU1) . . . . . . . . . 6.16.3.1 Pin description . . . . . . . . . . . . . . . . . . . . . . . . 6.16.4 Reset Generation Unit (RGU). . . . . . . . . . . . . 6.16.4.1 Functional description. . . . . . . . . . . . . . . . . . . 6.16.4.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . 6.16.5 Power Management Unit (PMU) . . . . . . . . . . . 6.16.5.1 Functional description. . . . . . . . . . . . . . . . . . . 6.17 Vectored Interrupt Controller (VIC) . . . . . . . . . 6.17.1 Functional description. . . . . . . . . . . . . . . . . . . 6.17.2 Clock description . . . . . . . . . . . . . . . . . . . . . . 7 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . 8 Static characteristics. . . . . . . . . . . . . . . . . . . . 8.1 Power consumption . . . . . . . . . . . . . . . . . . . . 8.2 Electrical pin characteristics . . . . . . . . . . . . . . 9 Dynamic characteristics . . . . . . . . . . . . . . . . . 9.1 Dynamic characteristics: I/O and CLKOUT pins, internal clock, oscillators, PLL , and CAN . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9.2 USB interface . . . . . . . . . . . . . . . . . . . . . . . . . 9.3 Dynamic characteristics: I2C-bus interface . . . 9.4 Dynamic characteristics: SPI . . . . . . . . . . . . . 9.5 Dynamic characteristics: flash memory and EEPROM . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9.6 Dynamic characteristics: external static memory . . . . . . . . . . . . . . . . . . 9.7 Dynamic characteristics: ADC . . . . . . . . . . . . 10 Application information. . . . . . . . . . . . . . . . . . 10.1 Operating frequency selection . . . . . . . . . . . . 10.2 Suggested USB interface solutions . . . . . . . . 10.3 SPI signal forms . . . . . . . . . . . . . . . . . . . . . . . 10.4 XIN_OSC input . . . . . . . . . . . . . . . . . . . . . . . . 10.5 XIN_OSC Printed Circuit Board (PCB) layout guidelines . . . . . . . . . . . . . . . . . . . . . . . 11 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 12 Soldering of SMD packages . . . . . . . . . . . . . . 12.1 Introduction to soldering . . . . . . . . . . . . . . . . . 12.2 Wave and reflow soldering . . . . . . . . . . . . . . . 12.3 Wave soldering . . . . . . . . . . . . . . . . . . . . . . . . 72 74 75 76 77 78 80 80 80 82 84 85 85 86 87 87 87 87 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2009. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com Date of release: 22 June 2009 Document identifier: LPC2927_29_2