Freescale Semiconductor
Technical Data
Document Number: MC34903_4_5
Rev. 4.0, 10/2013
System Basis Chip with CAN
High Speed and LIN Interface
The 34903/4/5 is the second generation family of the System Basis
Chip (SBC). It combines several features and enhances present
module designs. The device works as an advanced power
management unit for the MCU with additional integrated circuits such
as sensors and CAN transceivers. It has a built-in enhanced high-speed
CAN interface (ISO11898-2 and -5) with local and bus failure
diagnostics, protection, and fail-safe operation modes. The SBC may
include zero or one LIN 2.1 interface with LIN output pin switches. It
includes up to four wake-up input pins that can also be configured as
output drivers for flexibility. This device is powered by SMARTMOS
technology.
This device implements multiple Low-power (LP) modes, with very
low-current consumption. In addition, the device is part of a family
concept where pin compatibility adds versatility to module design.
The 34903/4/5 also implements an innovative and advanced fail-safe
state machine and concept solution.
Features
• Voltage regulator for MCU, 5.0 or 3.3 V, part number selectable, with
possibility of usage external PNP to extend current capability and
share power dissipation
• Voltage, current, and temperature protection
• Extremely low quiescent current in LP modes
• Fully-protected embedded 5.0 V regulator for the CAN driver
• Multiple undervoltage detections to address various MCU
specifications and system operation modes (i.e. cranking)
• Auxiliary 5.0 or 3.3 V SPI configurable regulator, for additional ICs,
with overcurrent detection and undervoltage protection
• MUX output pin for device internal analog signal monitoring and
power supply monitoring
• Advanced SPI, MCU, ECU power supply, and critical pins
diagnostics and monitoring.
• Multiple wake-up sources in LP modes: CAN or LIN bus,
I/O transition, automatic timer, SPI message, and VDD overcurrent
detection.
• ISO11898-5 high-speed CAN interface compatibility for baud rates of
40 kb/s to 1.0 Mb/s
• Scalable product family of devices ranging from 0 to 1 LIN,
compatible to J2602-2 and LIN 2.1
34903/4/5
34903/
Industrial
SYSTEM BASIS CHIP
EK Suffix (Pb-free)
98ASA10556D
32-PIN SOIC
•
•
•
•
Freescale Semiconductor, Inc. reserves the right to change the detail specifications,
as may be required, to permit improvements in the design of its products.
© Freescale Semiconductor, Inc., 2013. All rights reserved.
Applications
Industrial process control
Automation
Motor control
Robotics
TABLE OF CONTENTS
TABLE OF CONTENTS
Simplified Application Diagrams ................................................................................................................. 3
Device Variations ....................................................................................................................................... 5
Internal Block Diagrams ............................................................................................................................. 6
Pin Connections ......................................................................................................................................... 8
Electrical Characteristics .......................................................................................................................... 12
Maximum Ratings .................................................................................................................................. 12
Static Electrical Characteristics ............................................................................................................. 15
Dynamic Electrical Characteristics ........................................................................................................ 23
Timing Diagrams ................................................................................................................................... 26
Functional Description .............................................................................................................................. 31
Introduction ............................................................................................................................................ 31
Functional Pin Description ..................................................................................................................... 31
Functional Device Operation .................................................................................................................... 35
Mode and State Description .................................................................................................................. 35
LP Modes .............................................................................................................................................. 36
State Diagram ........................................................................................................................................ 37
Mode Change ........................................................................................................................................ 38
Watchdog Operation .............................................................................................................................. 38
Functional Block Operation Versus Mode ............................................................................................. 40
Illustration of Device Mode Transitions. ................................................................................................. 41
Cyclic Sense Operation During LP Modes ............................................................................................ 43
Behavior at Power Up and Power Down ............................................................................................... 45
Fail-safe Operation ................................................................................................................................... 47
CAN Interface ........................................................................................................................................ 51
CAN Interface Description ..................................................................................................................... 51
CAN Bus Fault Diagnostic ..................................................................................................................... 54
LIN Block .................................................................................................................................................. 57
LIN Interface Description ....................................................................................................................... 57
LIN Operational Modes .......................................................................................................................... 57
Serial Peripheral Interface ........................................................................................................................ 59
High Level Overview .............................................................................................................................. 59
Detail Operation ..................................................................................................................................... 60
Detail of Control Bits And Register Mapping ......................................................................................... 63
Flags and Device Status ........................................................................................................................ 78
Typical Applications ................................................................................................................................. 85
Packaging ................................................................................................................................................ 90
34903/4/5
2
Analog Integrated Circuit Device Data
Freescale Semiconductor
SIMPLIFIED APPLICATION DIAGRAMS
SIMPLIFIED APPLICATION DIAGRAMS
34905S
VBAT
D1
* = Optional
(5.0 V/3.3 V)
Q2
Q1*
VBAUX VCAUX VSUP1 VAUX VE VB VDD
VSUP2
SAFE
DBG
VDD
RST
INT
GND
VSENSE
MOSI
SCLK
MISO
CS
MUX-OUT
I/O-0
I/O-1
SPI
MCU
A/D
5V-CAN
CANH
CAN Bus
VBAT
LIN Bus
SPLIT
TXD
CANL
LIN-T
RXD
TXD-L
RXD-L
LIN
I/O-3
Figure 1. 34905S Simplified Application Diagram
34904
VBAT
D1
Q2
(5.0 V/3.3 V)
* = Optional
Q1*
VBAUX VCAUX VSUP1 VAUX VE VB VDD
VSUP2
SAFE
DBG
GND
VSENSE
I/O-0
I/O-1
VDD
RST
INT
MOSI
SCLK
MISO
CS
MUX-OUT
SPI
MCU
A/D
5V-CAN
CANH
VBAT
SPLIT
CAN Bus
CANL
TXD
RXD
I/O-2
I/O-3
Figure 2. 34904 Simplified Application Diagram
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
3
SIMPLIFIED APPLICATION DIAGRAMS
VBAT
D1
34903S
VE VB
VSUP
* = Optional
Q1*
VDD
VDD
RST
SAFE
DBG
INT
GND
VSENSE
MOSI
SCLK
MISO
CS
MUX-OUT
IO-0
CANH
SPI
MCU
A/D
5V-CAN
SPLIT
VBAT
TXD
CANL
LIN-T1/I/O-2
CAN Bus
LIN Bus
RXD
TXD-L1
RXD-L1
LIN-1
I/O-3
Figure 3. 34903S Simplified Application Diagram
34903P
VBAT
D1
* = Optional
Q1*
VSUP
SAFE
DBG
GND
VSENSE
IO-0
CANH
SPLIT
CAN Bus
VDD
VDD
RST
INT
MOSI
SCLK
MISO
CS
MUX-OUT
SPI
MCU
A/D
5V-CAN
CANL
TXD
VBAT
VBAT
VE VB
RXD
I/O-2
I/O-3
Figure 4. 34903P Simplified Application Diagram
34903/4/5
4
Analog Integrated Circuit Device Data
Freescale Semiconductor
DEVICE VARIATIONS
DEVICE VARIATIONS
Table 1. MC34905 Device Variations - (All devices rated at TA = -40 TO 125 °C)
Freescale Part Number
Version
VDD Output
Voltage
C
3.3 V
LIN
Wake-up Input / LIN Master
Interface(s)
Termination
Package
VAUX
VSENSE
MUX
SOIC 32 pin
exposed pad
Yes
Yes
Yes
Package
VAUX
VSENSE
MUX
SOIC 32 pin
exposed pad
Yes
Yes
Yes
Package
VAUX
VSENSE
MUX
MC34905S (Single LIN)
MC34905CS3EK/R2
MC34905CS5EK/R2
C
5.0 V
3 Wake-up + 1 LIN terms
1
or
4 Wake-up + no LIN terms
Table 2. MC34904 Device Variations - (All devices rated at TA = -40 TO 125 °C)
Version
VDD Output
Voltage
MC34904C3EK/R2
C
3.3 V
MC34904C5EK/R2
C
5.0 V
Freescale Part Number
LIN
Wake-up Input / LIN Master
Interface(s)
Termination
MC34904
0
4 Wake-up
Table 3. MC34903 Device Variations - (All devices rated at TA = -40 TO 125 °C)
Freescale Part Number
Version
VDD Output
Voltage
C
3.3 V
LIN
Wake-up Input / LIN Master
Interface(s)
Termination
MC34903S (Single LIN)
MC34903CS3EK/R2
MC34903CS5EK/R2
C
5.0 V
1
2 Wake-up + 1 LIN terms
or
3 Wake-up + no LIN terms
SOIC 32 pin
exposed pad
No
Yes
Yes
0
3 Wake-up
SOIC 32 pin
exposed pad
No
Yes
Yes
MC34903P
MC34903CP5EK/R2
MC34903CP3EK/R2
C
5.0 V
3.3 V
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
5
INTERNAL BLOCK DIAGRAMS
INTERNAL BLOCK DIAGRAMS
VBAUX VCAUX VAUX
VSUP2
VSUP1
5 V Auxiliary
Regulator
VE VB
VDD Regulator
VDD
VS2-INT
RST
SAFE
Fail-safe
GND
INT
Power Management
DBG
VSENSE
MOSI
State Machine
Oscillator
SPI
Analog Monitoring
Signals Condition & Analog MUX
SCLK
MISO
CS
MUX-OUT
VS2-INT
I/O-0
5 V-CAN
Regulator
Configurable
Input-Output
I/O-1
I/O-3
CANH
5 V-CAN
Enhanced High Speed CAN
Physical Interface
SPLIT
CANL
TXD
RXD
VS2-INT
TXD-L
LIN Term #1
LIN-T
LIN 2.1 Interface - #1
LIN
RXD-L
34905S
Figure 5. 34905 Internal Block Diagram
VBAUX VCAUX VAUX
VSUP2
VSUP1
5 V Auxiliary
Regulator
VE VB
VDD Regulator
VDD
VS2-INT
RST
SAFE
Fail-safe
GND
VSENSE
INT
Power Management
DBG
Oscillator
State Machine
MOSI
SPI
Analog Monitoring
Signals Condition & Analog MUX
I/O-0
I/O-1
I/O-2
I/O-3
CANH
SPLIT
CANL
Configurable
Input-Output
VS2-INT
5 V-CAN
Regulator
Enhanced High Speed CAN
Physical Interface
SCLK
MISO
CS
MUX-OUT
5 V-CAN
TXD
RXD
Figure 6. 34904 Internal Block Diagram
34903/4/5
6
Analog Integrated Circuit Device Data
Freescale Semiconductor
INTERNAL BLOCK DIAGRAMS
VSUP
VS-INT
VDD
RST
Fail-safe
Oscillator
MOSI
State Machine
SPI
Analog Monitoring
Signals Condition & Analog MUX
I/O-0
I/O-2
I/O-3
CANH
SPLIT
CANL
VS-INT
SCLK
MISO
CS
Fail-safe
INT
Power Management
DBG
State Machine
Oscillator
VSENSE
MOSI
SPI
Analog Monitoring
MUX-OUT
Signals Condition & Analog MUX
VS-INT
Configurable
Input-Output
VDD
RST
SAFE
GND
VE VB
VDD Regulator
INT
Power Management
DBG
VSENSE
VSUP
VDD Regulator
SAFE
GND
VE VB
SCLK
MISO
CS
MUX-OUT
VS-INT
5 V-CAN
Regulator
Enhanced High Speed CAN
Physical Interface
34903P
5 V-CAN
I/O-0
TXD
RXD
5 V-CAN
Regulator
Configurable
Input-Output
I/O-3
CANH
Enhanced High Speed CAN
Physical Interface
SPLIT
CANL
5 V-CAN
TXD
RXD
VS-INT
LIN-T
LIN Term #1
TXD-L
LIN 2.1 Interface - #1
LIN
RXD-L
34903S
Figure 7. 34903 Internal Block Diagram
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
7
PIN CONNECTIONS
PIN CONNECTIONS
MC34905S
VSUP1
VSUP2
I/O-3
LIN-T/I/O-2
SAFE
5V-CAN
CANH
CANL
GND CAN
SPLIT
V-BAUX
V-CAUX
V-AUX
MUX-OUT
I/O-0
DBG
1
32
2
31
3
30
4
29
5
28
6
27
7
26
8
GROUND 25
9
24
10
23
11
22
12
21
13
20
14
19
15
18
16
17
MC34904
VB
VE
RXD
TXD
VDD
MISO
MOSI
SCLK
CS
INT
RST
I/O-1
VSENSE
RXD-L
TXD-L
LIN
VSUP1
VSUP2
I/O-3
I/O-2
SAFE
5V-CAN
CANH
CANL
GND CAN
SPLIT
V-BAUX
V-CAUX
V-AUX
MUX-OUT
I/O-0
DBG
1
32
2
31
3
30
4
29
5
28
6
27
7
26
8
GROUND 25
9
24
10
23
11
22
12
21
13
20
14
19
15
18
16
17
GND - LEAD FRAME
GND - LEAD FRAME
32 pin exposed package
32 pin exposed package
MC34903P
MC34903S
VB
VSUP
I/O-3
LIN-T / I/O-2
SAFE
5V-CAN
CANH
CANL
GND CAN
SPLIT
MUX-OUT
I/O-0
DBG
NC
GND
NC
1
32
2
31
3
30
4
29
5
28
6
27
7
26
8
25
GROUND
9
24
10
23
11
22
12
21
13
20
14
19
15
18
16
17
VB
VE
RXD
TXD
VDD
MISO
MOSI
SCLK
CS
INT
RST
I/O-1
VSENSE
NC
NC
NC
VE
RXD
TXD
VDD
MISO
MOSI
SCLK
CS
INT
RST
VSENSE
RXD-L
TXD-L
LIN
GND
NC
VB
VSUP
I/O-3
I/O-2
SAFE
5V-CAN
CANH
CANL
GND CAN
SPLIT
MUX-OUT
I/O-0
DBG
NC
GND
NC
1
32
2
31
3
30
4
29
5
28
6
27
7
26
8
GROUND 25
9
24
10
23
11
22
12
21
13
20
14
19
15
18
16
17
GND - LEAD FRAME
GND - LEAD FRAME
32 pin exposed package
32 pin exposed package
VE
RXD
TXD
VDD
MISO
MOSI
SCLK
CS
INT
RST
VSENSE
N/C
N/C
N/C
GND
NC
Note: MC34905D, MC34905S, MC34904 and MC34903 are footprint compatible,
Figure 8. MC34905S, MC34904 and MC34903 Pin Connections
34903/4/5
8
Analog Integrated Circuit Device Data
Freescale Semiconductor
PIN DEFINITIONS
PIN DEFINITIONS
A functional description of each pin can be found in the Functional Pin Description section beginning on page 31.
Table 4. 34903/4/5 Pin Definitions
32 Pin 32 Pin 32 Pin 32 Pin
Pin Name
34905S 34904 34903S 34903P
N/A
N/A
Pin
Function
Formal
Name
N/C
No
Connect
-
N/C
No
Connect
Definition
Connect to GND.
N/A
17, 18,
19
N/A
N/A
1
1
2
2
VSUP/1
Power
Battery
Voltage
Supply 1
Supply input for the device internal supplies, power on reset
circuitry and the VDD regulator. VSUP and VSUP1 supplies are
internally connected on part number MC34903BDEK and
MC34903BSEK
2
2
N/A
N/A
VSUP2
Power
Battery
Voltage
Supply 2
Supply input for 5 V-CAN regulator, VAUX regulator, I/O and LIN
pins. VSUP1 and VSUP2 supplies are internally connected on
part number MC34903BDEK and MC34903BSEK
3
3
3
3
I/O-3
Output
14, 16, 14, 16,
17
17, 1921
or
Input/
Output
4
4
4
4
LIN-T1
Output
or
LIN-T
or
Input/
Output
or
I/O-2
Do NOT connect the N/C pins to GND. Leave these pins
Open.
Configurable pin as an input or HS output, for connection to
LIN
Termination 2 external circuitry (switched or small load). The input can be used
as a programmable Wake-up input in (LP) mode. When used as
or
a HS, no overtemperature protection is implemented. A basic
Input/Output short to GND protection function, based on switch drain-source
3
overvoltage detection, is available.
LIN
Termination
1 or
Input/Output
2
Configurable pin as an input or HS output, for connection to
external circuitry (switched or small load). The input can be used
as a programmable Wake-up input in (LP) mode. When used as
a HS, no overtemperature protection is implemented. A basic
short to GND protection function, based on switch drain-source
overvoltage detection, is available.
Safe Output Output of the safe circuitry. The pin is asserted LOW if a fault
(Active LOW) event occurs (e.g.: software watchdog is not triggered, VDD low,
issue on the RST pin, etc.). Open drain structure.
5
5
5
5
SAFE
Output
6
6
6
6
5 V-CAN
Output
5V-CAN
7
7
7
7
CANH
Output
CAN High
CAN high output.
8
8
8
8
CANL
Output
CAN Low
CAN low output.
9
9
9
9
GND-CAN
Ground
GND-CAN
Power GND of the embedded CAN interface
10
10
10
10
SPLIT
Output
11
11
N/A
N/A
VBAUX
Output
VB Auxiliary
Output pin for external path PNP transistor base
12
12
N/A
N/A
VCAUX
Output
VCOLLECT
OR Auxiliary
Output pin for external path PNP transistor collector
13
13
N/A
N/A
VAUX
Output
VOUT
Auxiliary
Output pin for the auxiliary voltage.
14
14
11
11
MUX-OUT
Output
Multiplex
Output
Multiplexed output to be connected to an MCU A/D input.
Selection of the analog parameter available at MUX-OUT is done
via the SPI. A switchable internal pull-down resistor is integrated
for VDD current sense measurements.
Output voltage for the embedded CAN interface. A capacitor must
be connected to this pin.
SPLIT Output Output pin for connection to the middle point of the split CAN
termination
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
9
PIN DEFINITIONS
Table 4. 34903/4/5 Pin Definitions (continued)
32 Pin 32 Pin 32 Pin 32 Pin
Pin Name
34905S 34904 34903S 34903P
Pin
Function
Formal
Name
Definition
15
15
12
12
I/O-0
Input/
Output
Input/Output
0
Configurable pin as an input or output, for connection to external
circuitry (switched or small load). The voltage level can be read
by the SPI and via the MUX output pin. The input can be used as
a programmable Wake-up input in LP mode. In LP, when used as
an output, the High Side (HS) or Low Side (LS) can be activated
for a cyclic sense function.
16
16
13
13
DBG
Input
Debug
Input to activate the Debug mode. In Debug mode, no watchdog
refresh is necessary. Outside of Debug mode, connection of a
resistor between DBG and GND allows the selection of Safe
mode functionality.
N/A
N/A
15, 18
15, 18
GND
Ground
Ground
Ground of the IC.
17
N/A
19
N/A
LIN
Input/
Output
LIN bus
LIN bus input output connected to the LIN bus.
18
N/A
20
N/A
TXD-L
Input
LIN Transmit
Data
LIN bus transmit data input. Includes an internal pull-up resistor
to VDD.
19
N/A
21
N/A
RXD-L
Output
LIN Receive
Data
LIN bus receive data output.
20
20
22
22
VSENSE
Input
Sense input
Direct battery voltage input sense. A serial resistor is required to
limit the input current during high voltage transients.
21
21
N/A
N/A
I/O-1
Input/
Output
Input Output
1
Configurable pin as an input or output, for connection to external
circuitry (switched or small load). The voltage level can be read
by the SPI and the MUX output pin. The input can be used as a
programmable Wake-up input in (LP) mode. It can be used in
association with
I/O-0 for a cyclic sense function in (LP) mode.
22
22
23
23
RST
Output
Reset Output This is the device reset output whose main function is to reset the
(Active LOW) MCU. This pin has an internal pull-up to VDD. The reset input
voltage is also monitored in order to detect external reset and safe
conditions.
23
23
24
24
INT
Output
This output is asserted low when an enabled interrupt condition
Interrupt
occurs. This pin is an open drain structure with an internal pull up
Output
(Active LOW) resistor to VDD.
24
24
25
25
CS
Input
25
25
26
26
SCLK
Input
Serial Data
Clock
Clock input for the Serial Peripheral Interface (SPI) of the device
26
26
27
27
MOSI
Input
Master Out /
Slave In
SPI data received by the device
27
27
28
28
MISO
Output
Master In /
Slave Out
28
28
29
29
VDD
Output
Voltage
Digital Drain
29
29
30
30
TXD
Input
Transmit
Data
30
30
31
31
RXD
Output
31
31
32
32
VE
Chip Select Chip select pin for the SPI. When the CS is low, the device is
(Active LOW) selected. In (LP) mode with VDD ON, a transition on CS is a
Wake-up condition
SPI data sent to the MCU. When the CS is high, MISO is highimpedance
5.0 or 3.3 V output pin of the main regulator for the Microcontroller
supply.
CAN bus transmit data input. Internal pull-up to VDD
Receive Data CAN bus receive data output
Voltage
Emitter
Connection to the external PNP path transistor. This is an
intermediate current supply source for the VDD regulator
34903/4/5
10
Analog Integrated Circuit Device Data
Freescale Semiconductor
PIN DEFINITIONS
Table 4. 34903/4/5 Pin Definitions (continued)
Pin
Function
Formal
Name
Definition
VB
Output
Voltage Base
Base output pin for connection to the external PNP pass transistor
GND
Ground
Ground
32 Pin 32 Pin 32 Pin 32 Pin
Pin Name
34905S 34904 34903S 34903P
32
32
1
1
EX PAD EX PAD EX PAD EX PAD
Ground
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
11
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 5. Maximum Ratings
All voltages are referenced to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or permanent
damage to the device.
Ratings
ELECTRICAL
Symbol
Value
Unit
RATINGS(1)
Supply Voltage at VSUP/1 and VSUP2
Normal Operation (DC)
Transient Conditions (Load Dump)
V
VSUP1/2
-0.3 to 28
VSUP1/2TR
-0.3 to 40
VBUSLIN
-28 to 28
VBUSLINTR
-28 to 40
DC voltage on LIN/1
V
Normal Operation (DC)
Transient Conditions (Load Dump)
DC voltage on CANL, CANH, SPLIT
Normal Operation (DC)
Transient Conditions (Load Dump)
V
VBUS
-28 to 28
VBUSTR
-32 to 40
VSAFE
-0.3 to 28
VSAFETR
-0.3 to 40
DC Voltage at SAFE
V
Normal Operation (DC)
Transient Conditions (Load Dump)
DC Voltage at I/O-0, I/O-1, I/O-2, I/O-3 (LIN-T Pins)
Normal Operation (DC)
V
VI/O
-0.3 to 28
VI/OTR
-0.3 to 40
VDIGLIN
-0.3 to VDD +0.3
V
VDIG
-0.3 to VDD +0.3
V
DC Voltage at INT
VINT
-0.3 to 10
V
DC Voltage at RST
VRST
-0.3 to VDD +0.3
V
DC Voltage at MOSI, MSIO, SCLK and CS
VRST
-0.3 to VDD +0.3
V
DC Voltage at MUX-OUT
VMUX
-0.3 to VDD +0.3
V
DC Voltage at DBG
VDBG
-0.3 to 10
V
ILH
200
mA
VREG
-0.3 to 5.5
V
VREG
-0.3 to 40
V
VE
-0.3 to 40
V
VSENSE
-28 to 40
V
Transient Conditions (Load Dump)
DC voltage on TXD-L, TXD-L1, RXD-L, RXD-L1
DC voltage on TXD, RXD
(3)
Continuous current on CANH and CANL
DC voltage at VDD, 5V-CAN, VAUX, VCAUX
DC voltage at
VBASE(2)
DC voltage at VE
(3)
DC voltage at VSENSE
and VBAUX
Notes
1. The voltage on non-VSUP pins should never exceed the VSUP voltage at any time or permanent damage to the device may occur.
2.
3.
If the voltage delta between VSUP/1/2 and VBASE is greater than 6.0 V, the external VDD ballast current sharing functionality may be
damaged.
Potential Electrical Over Stress (EOS) damage may occur if RXD is in contact with VE while the device is ON.
34903/4/5
12
Analog Integrated Circuit Device Data
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 5. Maximum Ratings (continued)
All voltages are referenced to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or permanent
damage to the device.
Ratings
Symbol
Value
ESD Capability
Unit
V
AECQ100(4)
Human Body Model - JESD22/A114 (CZAP = 100 pF, RZAP = 1500 Ω)
VESD1-1
VESD1-2
±8000
±2000
VESD2-1
VESD2-2
±750
±500
VESD3-1
VESD3-2
VESD3-3
±15000
±15000
±15000
VESD4-1
VESD4-2
VESD4-3
±9000
±12000
±7000
Junction temperature(5)
TJ
150
°C
Ambient temperature
TA
-40 to 125
°C
Storage temperature
TST
-50 to 150
°C
RθJA
50(8)
°C/W
TPPRT
Note 7
°C
CANH and CANL. LIN1 Pins versus all GND pins
all other Pins including CANH and CANL
Charge Device Model - JESD22/C101 (CZAP = 4.0 pF)
Corner Pins (Pins 1, 16, 17, and 32)
All other Pins (Pins 2-15, 18-31)
Tested per IEC 61000-4-2 (CZAP = 150 pF, RZAP = 330 Ω)
Device unpowered, CANH and CANL pin without capacitor, versus GND
Device unpowered, LIN, LIN1 pin, versus GND
Device unpowered, VS1/VS2 (100 nF to GND), versus GND
Tested per specific OEM EMC requirements for CAN and LIN with
additional capacitor on VSUP/1/2 pins (See Typical Applications on page
85)
CANH, CANL without bus filter
LIN, LIN1 with and without bus filter
I/O with external components (22 k - 10 nF)
THERMAL RATINGS
THERMAL RESISTANCE
Thermal resistance junction to ambient(8)
Peak package reflow temperature during
reflow(6), (7)
Notes
4. ESD testing is performed in accordance with the Human Body Model (HBM) (CZAP = 100 pF, RZAP = 1500 Ω), the Charge Device Model
(CDM), and Robotic (CZAP = 4.0 pF).
5.
6.
7.
8.
To achieve high reliability over 10 years of continuous operation, the device's continuous operating junction temperature should not
exceed 125 °C.
Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may
cause malfunction or permanent damage to the device.
Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow
Temperature and Moisture Sensitivity Levels (MSL), Go to www.freescale.com, search by part number [e.g. remove prefixes/suffixes
and enter the core ID to view all orderable parts. (i.e. MC34xxxD enter 34xxx), and review parametrics.
This parameter was measured according to Figure 9:
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
13
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
PCB 100mm x 100mm
Top side, 300 sq. mm
(20mmx15mm)
Bottom side
20mm x 40mm
Bottom view
Figure 9. PCB with Top and Bottom Layer Dissipation Area (Dual Layer)
34903/4/5
14
Analog Integrated Circuit Device Data
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 6. Static Electrical Characteristics
Characteristics noted under conditions 5.5 V ≤ VSUP ≤ 28 V, - 40 °C ≤ TA ≤ 125 °C, unless otherwise noted. Typical values
noted reflect the approximate parameter means at TA = 25 °C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
Nominal DC Voltage Range(9)
VSUP1/VSUP2
5.5
Extended DC Low Voltage Range(10)
VSUP1/VSUP2
4.0
-
28
V
-
5.5
V
5.5
0.2
6.0
0.35
6.5
6.6
0.5
POWER INPUT
Undervoltage Detector Thresholds, at the VSUP/1 pin,
VS1_LOW
Low threshold (VSUP/1 ramp down)
High threshold (VSUP/1 ramp up)
Hysteresis
Note: function not active in LP mode
Undervoltage Detector Thresholds, at the VSUP2 pin:
V
VS2_LOW
Low threshold (VSUP2 ramp down)
High threshold (VSUP2 ramp up)
Hysteresis
Note: function not active in LP modes
V
5.5
0.2
6.0
0.35
6.5
6.6
0.5
VS_HIGH
16.5
17
18.5
V
Battery loss detection threshold, at the VSUP/1 pin.
BATFAIL
2.0
2.8
4.0
V
VSUP/1 to turn VDD ON, VSUP/1 rising
VSUP-TH1
-
4.1
4.5
V
VSUP-TH1HYST
150
180
-
2.0
0.05
4.0
0.85
-
2.8
-
4.5
5.0
5.5
8.0
VSUP Overvoltage Detector Thresholds, at the VSUP/1 pin:
Not active in LP modes
VSUP/1 to turn VDD ON, hysteresis (Guaranteed by design)
Supply current(11), (12)
ISUP1
- from VSUP/1
- from VSUP2, (5V-CAN VAUX, I/O OFF)
Supply current, ISUP1 + ISUP2, Normal mode, VDD ON
15
-
35
50
μA
ILPM_ON
-
20
40
-
65
85
μA
IOSC
VSUP ≤ 18 V, -40 to 125 °C
Debug mode DBG voltage range
μA
-
VSUP ≤ 18 V, -40 to 25 °C, IDD = 1.0 μA
VSUP ≤ 18 V, -40 to 25 °C, IDD = 100 μA
VSUP ≤ 18 V, 125 °C, IDD = 100 μA
LP mode, additional current for oscillator (used for: cyclic sense, forced Wakeup, and in LP VDD ON mode cyclic interruption and watchdog)
mA
ILPM_OFF
VSUP ≤ 18 V, -40 to 25 °C
VSUP ≤ 18 V, 125 °C
LP mode VDD ON (5.0 V) with VDD undervoltage and VDD
overcurrent monitoring, Wake-up from CAN, I/O-x inputs
mA
ISUP1+2
- 5 V-CAN OFF, VAUX OFF
- 5 V-CAN ON, CAN interface in Sleep mode, VAUX OFF
- 5 V-CAN OFF, Vaux ON
- 5 V-CAN ON, CAN interface in TXD/RXD mode, VAUX OFF, I/O-x disabled
LP mode VDD OFF. Wake-up from CAN, I/O-x inputs
mV
VDBG
-
5.0
9.0
8.0
-
10
V
Notes
9. All parameters in spec (ex: VDD regulator tolerance).
10.
11.
12.
Device functional, some parameters could be out of spec. VDD is active, device is not in Reset mode if the lowest VDD undervoltage reset
threshold is selected (approx. 3.4 V). CAN and I/Os are not operational.
In Run mode, CAN interface in Sleep mode, 5 V-CAN and VAUX turned OFF. IOUT at VDD < 50 mA. Ballast: turned OFF or not connected.
VSUP1 and VSUP2 supplies are internally connected on part number MC34903BDEK and MC34903BSEK. Therefore, ISUP1 and ISUP2
cannot be measured individually.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
15
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 6. Static Electrical Characteristics (continued)
Characteristics noted under conditions 5.5 V ≤ VSUP ≤ 28 V, - 40 °C ≤ TA ≤ 125 °C, unless otherwise noted. Typical values
noted reflect the approximate parameter means at TA = 25 °C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
VDD = 5.0 V, VSUP 5.5 to 28 V, IOUT 0 to 150 mA
VOUT-5.0
4.9
5.0
5.1
VDD = 3.3 V, VSUP 5.5 to 28 V, IOUT 0 to 150 mA
VOUT-3.3
3.234
3.3
3.4
Unit
VDD VOLTAGE REGULATOR, VDD PIN
Output Voltage
V
Drop voltage without external PNP pass
transistor(13)
VDROP
mV
VDD = 5.0 V, IOUT = 100 mA
-
330
450
VDD = 5.0 V, IOUT = 150 mA
-
-
500
-
350
500
VDD = 3.3 V, IOUT = 150 mA
4.0
-
-
VDD = 3.3 V, IOUT = 200 mA, external transistor implemented
4.0
-
-
K
1.5
2.0
2.5
Output Current limitation, without external transistor
ILIM
150
350
550
mA
Temperature pre-warning (Guaranteed by design)
TPW
-
140
-
°C
Thermal shutdown (Guaranteed by design)
TSD
160
-
-
°C
Range of decoupling capacitor (Guaranteed by design)(14)
CEXT
4.7
-
100
μF
LP mode VDD ON, IOUT ≤ 50 mA (time limited)
VDDLP
VDD = 5.0 V, 5.6 V ≤ VSUP ≤ 28 V
4.75
5.0
5.25
VDD = 3.3 V, 5.6 V ≤ VSUP ≤ 28 V
3.135
3.3
3.465
-
-
50
Overcurrent Wake-up threshold.
1.0
3.0
-
Hysteresis
0.1
1.0
-
Drop voltage with external transistor
(13)
VDROP-B
IOUT = 200 mA (I_BALLAST + I_INTERNAL)
VSUP/1 to maintain VDD within VOUT-3.3 specified voltage range
External ballast versus internal current ratio (I_BALLAST = K x Internal current)
LP mode VDD ON, dynamic output current capability (Limited duration. Ref. to
device description).
LP VDD ON mode:
mV
VSUP1-3.3
LP-IOUTDC
V
V
LP-ITH
mA
mA
LP mode VDD ON, drop voltage, at IOUT = 30 mA (Limited duration. Ref. to
device description) (13)
LP-VDROP
-
200
400
mV
LP mode VDD ON, min VSUP operation (Below this value, a VDD, undervoltage
reset may occur)
LP-MINVS
5.5
-
-
V
VDD_OFF
-
-
0.3
V
VDD_START UP
3.0
-
-
V
VDD when VSUP < VSUP-TH1, at I_VDD ≤ 10 μA (Guaranteed by design)
VDD when VSUP ≥ VSUP-TH1, at I_VDD ≤ 40 mA (Guaranteed with parameter
VSUP-TH1
Notes
13. For 3.3 V VDD devices, the drop-out voltage test condition leads to a VSUP below the min VSUP threshold (4.0 V). As a result, the dropout
voltage parameter cannot be specified.
14. The regulator is stable without an external capacitor. Usage of an external capacitor is recommended for AC performance.
34903/4/5
16
Analog Integrated Circuit Device Data
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 6. Static Electrical Characteristics (continued)
Characteristics noted under conditions 5.5 V ≤ VSUP ≤ 28 V, - 40 °C ≤ TA ≤ 125 °C, unless otherwise noted. Typical values
noted reflect the approximate parameter means at TA = 25 °C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
4.75
5.0
5.25
Unit
VOLTAGE REGULATOR FOR CAN INTERFACE SUPPLY, 5.0 V-CAN PIN
Output voltage, VSUP/2 = 5.5 to 40 V
IOUT 0 to 160 mA
5V-C OUT
V
Output Current limitation (15)
5V-C ILIM
160
280
-
mA
Undervoltage threshold
5V-C UV
4.1
4.5
4.7
V
5V-CTS
160
-
-
°C
CEXT-CAN
1.0
-
100
μF
VAUX = 5.0 V, VSUP = VSUP2 5.5 to 40 V, IOUT 0 to 150 mA
4.75
5.0
5.25
VAUX = 3.3 V, VSUP = VSUP2 5.5 to 40 V, IOUT 0 to 150 mA
3.135
3.3
3.465
Low Threshold
4.2
4.5
4.70
Hysteresis
0.06
-
0.12
2.75
3.0
3.135
Thermal shutdown (Guaranteed by design)
External capacitance (Guaranteed by design)
V AUXILIARY OUTPUT, 5.0 AND 3.3 V SELECTABLE PIN VB-AUX, VC-AUX, VAUX
VAUX output voltage
VAUX undervoltage detector (VAUX configured to 5.0 V)
VAUX
VAUX-UVTH
VAUX undervoltage detector (VAUX configured to 3.3 V, default value)
VAUX overcurrent threshold detector
V
V
VAUX-ILIM
mA
VAUX set to 3.3 V
250
360
450
VAUX set to 5.0 V
230
330
430
VAUX CAP
2.2
-
100
μF
VRST-TH1
4.5
4.65
4.85
V
-
-
4.90
2.75
3.0
3.135
-
-
3.135
2.95
3.2
3.45
for threshold 90% VDD, 5.0 V device
20
-
150
for threshold 70% VDD, 5.0 V device
10
-
150
10
-
150
(Note: device change to Normal Request mode). VDD 5.0 V
4.0
4.5
4.85
(Note: device change to Normal Request mode). VDD 3.3 V
2.75
3.0
3.135
External capacitance (Guaranteed by design)
UNDERVOLTAGE RESET AND RESET FUNCTION, RST PIN
VDD undervoltage threshold down - 90% VDD (VDD 5.0 V)(16), (18)
VDD undervoltage threshold up - 90% VDD (VDD 5.0 V)
VDD undervoltage threshold down - 90% VDD (VDD 3.3 V)(16), (18)
VDD undervoltage threshold up - 90% VDD (VDD 3.3 V)
VDD undervoltage reset threshold down - 70% VDD (VDD 5.0 V)(17), (18)
VRST-TH2-5
Hysteresis
VRST-HYST
V
mV
Hysteresis 3.3 V VDD
for threshold 90% VDD, 3.3 V device
VDD undervoltage reset threshold down - LP VDD ON mode
Notes
15.
16.
17.
18.
VRST-LP
V
Current limitation will be reported by setting a flag.
Generate a Reset or an INT. SPI programmable
Generate a Reset
In Non-LP modes
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
17
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 6. Static Electrical Characteristics (continued)
Characteristics noted under conditions 5.5 V ≤ VSUP ≤ 28 V, - 40 °C ≤ TA ≤ 125 °C, unless otherwise noted. Typical values
noted reflect the approximate parameter means at TA = 25 °C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
UNDERVOLTAGE RESET AND RESET FUNCTION, RST PIN (CONTINUED)
Reset VOL @ 1.5 mA, VSUP 5.5 to 28 V
VOL
-
300
500
mV
IRESET LOW
2.5
7.0
10
mA
Pull-up resistor (to VDD pin)
RPULL-UP
8.0
11
15
kΩ
VSUP to guaranteed reset low level(19)
VSUP-RSTL
2.5
-
-
V
Reset input threshold
VRST-VTH
Low threshold, VDD = 5.0 V
1.5
1.9
2.2
High threshold, VDD = 5.0 V
2.5
3.0
3.5
Low threshold, VDD = 3.3 V
0.99
1.17
1.32
High threshold, VDD = 3.3 V
1.65
2.0
2.31
VHYST
0.5
1.0
1.5
V
VI/O-0 HSDRP
-
0.5
1.4
V
Current limitation, Reset activated, VRESET = 0.9 x VDD
Reset input hysteresis
V
I/O PINS WHEN FUNCTION SELECTED IS OUTPUT
I/O-0 HS switch drop @ I = -12 mA, VSUP = 10.5 V
I/O-2 and I/O-3 HS switch drop @ I = -20 mA, VSUP = 10.5 V
VI/O-2-3 HSDRP
-
0.5
1.4
V
I/O-1, HS switch drop @ I = -400 μA, VSUP = 10.5 V
VI/O-1 HSDRP
-
0.4
1.4
V
I/O-0, I/O-1 LS switch drop @ I = 400 μA, VSUP = 10.5 V
VI/O-01 LSDRP
-
0.4
1.4
V
II/O_LEAK
-
0.1
3.0
μA
Negative threshold
VI/O_NTH
1.4
2.0
2.9
V
Positive threshold
VI/O_PTH
2.1
3.0
3.8
V
Hysteresis
Leakage current, I/O-x ≤ VSUP
I/O PINS WHEN FUNCTION SELECTED IS INPUT
VI/O_HYST
0.2
1.0
1.4
V
Input current, I/O ≤ VSUP/2
II/O_IN
-5.0
1.0
5.0
μA
I/O-0 and I/O-1 input resistor. I/O-0 (or I/O-1) selected in
RI/O-X
-
100
-
kΩ
8.1
8.6
9.0
register, 2.0 V < VI/O-X 2.0 kΩ
VOUT_MAX
Internal pull-down resistor for regulator output current sense
RMI
CMUX
Unit
0.0
-
VDD - 0.5
V
0.8
1.9
2.8
kΩ
-
-
1.0
ANALOG MUX OUTPUT
External capacitor at MUX OUTPUT(20) (Guaranteed by design)
Chip temperature sensor coefficient (Guaranteed by design and device
characterization)
TEMP-COEFF
VDD = 5.0 V
20
21
22
VDD = 3.3 V
13.2
13.9
14.6
Chip temperature: MUX-OUT voltage
VTEMP
V
VDD = 5.0 V, TA = 125 °C
3.6
3.75
3.9
VDD = 3.3 V, TA = 125 °C
2.45
2.58
2.65
Chip temperature: MUX-OUT voltage (guaranteed by design and
characterization)
VTEMP(GD)
V
TA = -40 °C, VDD = 5.0 V
0.12
0.30
0.48
TA = 25 °C, VDD = 5.0 V
1.5
1.65
1.8
TA = -40 °C, VDD = 3.3 V
0.07
0.19
0.3
TA = 25 °C, VDD = 3.3 V
1.08
1.14
1.2
VDD = 5.0 V
5.42
5.48
5.54
VDD = 3.3 V
8.1
8.2
8.3
-20
-
20
VDD = 5.0 V
5.335
5.5
5.665
VDD = 3.3 V
7.95
8.18
8.45
3.8
4.0
4.2
-
2.0
-
5.6
5.8
6.2
-
1.3
-
VDD = 5.0 V
2.45
2.5
2.55
VDD = 3.3 V
1.64
1.67
1.7
Gain for VSENSE, with external 1.0 k 1% resistor
Offset for VSENSE, with external 1.0 k 1% resistor
Divider ratio for VSUP/1
Attenuation/Gain ratio for I/O-0 and I/O-1 actual voltage:
VSENSE GAIN
VSENSE
OFFSET
VI/O RATIO
VDD = 5.0 V, (Gain, MUX-OUT register bit 3 set to 0)
VDD = 3.3 V, I/O = 16 V (Attenuation, MUX-OUT register bit 3 set to 1)
VDD = 3.3 V, (Gain, MUX-OUT register bit 3 set to 0)
Current ratio between VDD output & IOUT at MUX-OUT
mV
VSUP/1 RATIO
VDD = 5.0 V, I/O = 16 V (Attenuation, MUX-OUT register bit 3 set to 1)
Internal reference voltage
nF
mv/°C
VREF
V
IDD_RATIO
(IOUT at MUX-OUT = IDD out / IDD_RATIO)
At IOUT = 50 mA
80
97
115
62.5
97
117
VOL
0.0
0.2
1.0
V
ISAFE-IN
-
0.0
1.0
μA
I_OUT from 25 to 150 mA
SAFE OUTPUT
SAFE low level, at I = 500 μA
Safe leakage current (VDD low, or device unpowered). VSAFE 0 to 28 V.
Notes
20. When C is higher than CMUX, a serial resistor must be inserted
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
19
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 6. Static Electrical Characteristics (continued)
Characteristics noted under conditions 5.5 V ≤ VSUP ≤ 28 V, - 40 °C ≤ TA ≤ 125 °C, unless otherwise noted. Typical values
noted reflect the approximate parameter means at TA = 25 °C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
INTERRUPT
Output low voltage, IOUT = 1.5 mA
VOL
-
0.2
1.0
V
Pull-up resistor
RPU
6.5
10
14
kΩ
Output high level in LP VDD ON mode (Guaranteed by design)
VOH-LPVDDON
3.9
4.3
Leakage current INT voltage = 10 V (to allow high-voltage on MCU INT pin)
VMAX
-
35
100
μA
Sink current, VINT > 5.0 V, INT low state
I SINK
2.5
6.0
10
mA
Output low voltage, IOUT = 1.5 mA (MISO)
VOL
-
-
1.0
V
Output high voltage, IOUT = -0.25 mA (MISO)
VOH
VDD -0.9
-
Input low voltage (MOSI, SCLK,CS)
VIL
-
-
Input high voltage (MOSI, SCLK,CS)
VIH
0.7 x VDD
-
-
V
Tri-state leakage current (MISO)
IHZ
-2.0
-
2.0
μA
Pull-up current (CS)
IPU
200
370
500
μA
High Level Input Voltage
VIH
0.7 x VDD
-
VDD + 0.3
V
Low Level Input Voltage
VIL
-0.3
-
0.3 x VDD
V
VDD =5.0 V
-850
-650
-200
VDD =3.3 V
-500
-250
-175
0.0
-
0.3 x VDD
0.7 x VDD
-
VDD
V
MISO, MOSI, SCLK, CS PINS
V
0.3 x VDD
V
CAN LOGIC INPUT PINS (TXD)
Pull-up Current, TXD, VIN = 0 V
IPDWN
µA
CAN DATA OUTPUT PINS (RXD)
Low Level Output Voltage
VOUTLOW
IRXD = 5.0 mA
High Level Output Voltage
VOUTHIGH
IRX = -3.0 mA
High Level Output Current
VRXD = 0.4 V
V
IOUTHIGH
VRXD = VDD - 0.4 V
Low Level Input Current
V
mA
2.5
5.0
9.0
IOUTLOW
mA
2.5
5.0
9.0
34903/4/5
20
Analog Integrated Circuit Device Data
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 6. Static Electrical Characteristics (continued)
Characteristics noted under conditions 5.5 V ≤ VSUP ≤ 28 V, - 40 °C ≤ TA ≤ 125 °C, unless otherwise noted. Typical values
noted reflect the approximate parameter means at TA = 25 °C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
VCOM
-12
-
12
V
VCANH-VCANL
500
-
900
mV
VDIFF-HYST
50
-
-
mV
RIN
5.0
-
50
kΩ
CAN OUTPUT PINS (CANH, CANL)
Bus pins common mode voltage for full functionality
Differential input voltage threshold
Differential input hysteresis
Input resistance
Differential input resistance
RIN-DIFF
10
-
100
kΩ
RIN-MATCH
-3.0
0.0
3.0
%
TXD dominant state
2.75
3.5
4.5
TXD recessive state
2.0
2.5
3.0
TXD dominant state
0.5
1.5
2.25
TXD recessive state
2.0
2.5
3.0
TXD dominant state
1.5
2.0
3.0
TXD recessive state
-0.5
0.0
0.05
Input resistance matching
CANH output voltage (45 Ω < RBUS < 65 Ω)
CANL output voltage (45 Ω < RBUS < 65 Ω)
Differential output voltage (45 Ω < RBUS < 65 Ω)
VCANH
V
VCANL
V
VOH-VOL
V
CAN H output current capability - Dominant state
ICANH
-
-
-30
mA
CAN L output current capability - Dominant state
ICANL
30
-
-
mA
CANL overcurrent detection - Error reported in register
ICANL-OC
75
120
195
mA
CANH overcurrent detection - Error reported in register
ICANH-OC
-195
-120
-75
mA
CANH, CANL input resistance to GND, device supplied, CAN in Sleep mode,
V_CANH, V_CANL from 0 to 5.0 V
RINSLEEP
5.0
-
50
kΩ
CANL, CANH output voltage in LP VDD OFF and LP VDD ON modes
VCANLP
-0.1
0.0
0.1
V
CANH, CANL input current, VCANH, VCANL = 0 to 5.0 V, device unpowered
(VSUP, VDD, 5V-CAN: open).(21)
ICAN-UN_SUP1
-
3.0
10
µA
CANH, CANL input current, VCANH, VCANL = -2.0 to 7.0 V, device
unpowered (VSUP, VDD, 5V-CAN: open).(21)
ICAN-UN_SUP2
-
-
250
µA
Differential voltage for recessive bit detection in LP mode(22)
VDIFF-R-LP
-
-
0.4
V
Differential voltage for dominant bit detection in LP mode(22)
VDIFF-D-LP
1.15
-
-
V
CANL to GND detection threshold
VLG
1.6
1.75
2.0
V
CANH to GND detection threshold
VHG
1.6
1.75
2.0
V
CANL to VBAT detection threshold, VSUP/1 and VSUP2 > 8.0 V
VLVB
-
VSUP -2.0
-
V
CANH to VBAT detection threshold, VSUP/1 and VSUP2 > 8.0 V
VHVB
-
VSUP -2.0
-
V
CANL to VDD detection threshold
VL5
4.0
VDD -0.43
-
V
CANH to VDD detection threshold
VH5
4.0
VDD -0.43
-
V
CANH AND CANL DIAGNOSTIC INFORMATION
Notes
21. VSUP, VDD, 5V-CAN: shorted to GND, or connected to GND via a 47 k resistor instances are guaranteed by design and device
characterization.
22. Guaranteed by design and device characterization.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
21
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 6. Static Electrical Characteristics (continued)
Characteristics noted under conditions 5.5 V ≤ VSUP ≤ 28 V, - 40 °C ≤ TA ≤ 125 °C, unless otherwise noted. Typical values
noted reflect the approximate parameter means at TA = 25 °C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
SPLIT
Output voltage
VSPLIT
Loaded condition ISPLIT = ±500 µA
Unloaded condition Rmeasure > 1.0 MΩ
Leakage current
V
0.3 x VDD 0.5 x VDD
0.45 x
VDD
0.7 x VDD
0.5 x VDD 0.55 x VDD
ILSPLIT
µA
-12 V < VSPLIT < +12 V
-
0.0
5.0
-22 to -12 V < VSPLIT < +12 to +35 V
-
-
200
-
1.0
1.4
V
LIN TERMINALS (LIN-T/1)
LIN-T1 HS switch drop @ I = -20 mA, VSUP > 10.5 V
VLT_HSDRP
LIN1 34903D/5D PIN - LIN 34903S/5S PIN (Parameters guaranteed for VSUP/1, VSUP2 7.0 V ≤ VSUP ≤ 18 V)
Operating Voltage Range
VBAT
8.0
-
18
V
Supply Voltage Range
VSUP
7.0
-
18
V
40
90
200
-1.0
-
-
-
-
20
Current Limitation for Driver Dominant State
IBUS_LIM
Driver ON, VBUS = 18 V
Input Leakage Current at the receiver
IBUS_PAS_DOM
Driver off; VBUS = 0 V; VBAT = 12 V
Leakage Output Current to GND
VBAT Disconnected; VSUP_DEVICE = GND; 0 < VBUS < 18 V (Node has to
sustain the current that can flow under this condition. Bus must remain
operational under this condition). (Guaranteed by design)
mA
-1.0
-
1.0
-
-
100
IBUSNO_BAT
VBUSDOM
Receiver Recessive State
VBUSREC
µA
VSUP
-
-
0.4
0.6
-
-
0.475
0.5
0.525
-
-
0.175
VSUP
VBUS_CNT
(VTH_DOM + VTH_REC)/2
Receiver Threshold Hysteresis
µA
IBUS_NO_GND
Receiver Dominant State
Receiver Threshold Center
mA
IBUS_PAS_REC
Driver Off; 8.0 V < VBAT < 18 V; 8.0 V < VBUS < 18 V; VBUS ≥ VBAT
Control unit disconnected from ground (Loss of local ground must not affect
communication in the residual network)
GNDDEVICE = VSUP; VBAT = 12 V; 0 < VBUS < 18 V (Guaranteed by design)
mA
VSUP
VHYS
(VTH_REC - VTH_DOM)
VSUP
LIN Wake-up threshold from LP VDD ON or LP VDD OFF mode
VBUSWU
-
5.3
5.8
V
LIN Pull-up Resistor to VSUP
RSLAVE
20
30
60
kΩ
TLINSD
140
160
180
°C
TLINSD_HYS
-
10
-
°C
Overtemperature Shutdown (Guaranteed by design)
Overtemperature Shutdown Hysteresis (Guaranteed by design)
34903/4/5
22
Analog Integrated Circuit Device Data
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 7. Dynamic Electrical Characteristics
Characteristics noted under conditions 5.5 V ≤ VSUP ≤ 28 V, - 40 °C ≤ TA ≤ 125 °C, GND = 0 V, unless otherwise noted. Typical
values noted reflect the approximate parameter means at TA = 25 °C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
SPI Operation Frequency (MISO cap = 50 pF)
FREQ
0.25
-
4.0
MHz
SCLK Clock Period
tPCLK
250
-
N/A
ns
SCLK Clock High Time
tWSCLKH
125
-
N/A
ns
SCLK Clock Low Time
tWSCLKL
125
-
N/A
ns
30
550
-
N/A
N/A
SPI TIMING
Falling Edge of CS to Rising Edge of SCLK
tLEAD
“C” version
All others
ns
Falling Edge of SCLK to Rising Edge of CS
tLAG
30
-
N/A
ns
MOSI to Falling Edge of SCLK
tSISU
30
-
N/A
ns
Falling Edge of SCLK to MOSI
tSIH
30
-
N/A
ns
MISO Rise Time (CL = 50 pF)
tRSO
-
-
30
ns
MISO Fall Time (CL = 50 pF)
tFSO
-
-
30
ns
Time from Falling to MISO Low-impedance
tSOEN
-
-
30
ns
Time from Rising to MISO High-impedance
tSODIS
-
-
30
Time from Rising Edge of SCLK to MISO Data Valid
tVALID
-
-
30
1.0
-
N/A
5.5
-
N/A
tCS-TO
2.5
-
-
ms
tVS_LOW1/
30
50
100
μs
Delay between falling and rising edge on CS
CS Chip Select Low Timeout Detection
μs
tCSLOW
“C” version
All others
ns
SUPPLY, VOLTAGE REGULATOR, RESET
VSUP undervoltage detector threshold deglitcher
2_DGLT
Rise time at turn ON. VDD from 1.0 to 4.5 μV. 2.2 μF at the VDD pin.
tRISE-ON
50
250
800
μs
Deglitcher time to set RST pin low
tRST-DGLT
20
30
40
μs
RESET PULSE DURATION
VDD undervoltage (SPI selectable)
tRST-PULSE
short, default at power on when BATFAIL bit set
medium
medium long
long
Watchdog reset
ms
0.9
4.0
8.5
17
1.0
5.0
10
20
1.4
6.5
12
24
tRST-WD
0.9
1.0
1.4
ms
tIODT
19
30
41
μs
tBFT
30
-
100
μs
I/O INPUT
Deglitcher time (Guaranteed by design)
VSENSE INPUT
Undervoltage deglitcher time
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
23
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 7. Dynamic Electrical Characteristics
Characteristics noted under conditions 5.5 V ≤ VSUP ≤ 28 V, - 40 °C ≤ TA ≤ 125 °C, GND = 0 V, unless otherwise noted. Typical
values noted reflect the approximate parameter means at TA = 25 °C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
short (25 to 125 °C)
20
25
35
short (-40 °C)
long (25 to 125 °C)
20
90
25
100
40
130
long (-40 °C)
90
100
140
60
-
-
μs
-10
-
10
%
INTERRUPT
INT pulse duration (refer to SPI for selection. Guaranteed by design)
μs
tINT-PULSE
STATE DIGRAM TIMINGS
Delay for SPI Timer A, Timer B or Timer C write command after entering Normal
mode
tD_NM
(No command should occur within tD_NM.
tD_NM delay definition: from CS rising edge of “Go to Normal mode (i.e. 0x5A00)”
command to CS falling edge of “Timer write” command)
Tolerance for: watchdog period in all modes, FWU delay, Cyclic sense period tTIMING-ACC
and active time, Cyclic Interrupt period, LP mode overcurrent (unless otherwise
noted)(26)
CAN DYNAMIC CHARACTERISTICS
TXD Dominant State Timeout
tDOUT
300
600
1000
µs
Bus dominant clamping detection
tDOM
300
600
1000
µs
Propagation loop delay TXD to RXD, recessive to dominant (Fast slew rate)
tLRD
60
120
210
ns
Propagation delay TXD to CAN, recessive to dominant
tTRD
-
70
110
ns
Propagation delay CAN to RXD, recessive to dominant
tRRD
-
45
140
ns
Propagation loop delay TXD to RXD, dominant to recessive (Fast slew rate)
tLDR
100
120
200
ns
Propagation delay TXD to CAN, dominant to recessive
tTDR
-
75
150
ns
Propagation delay CAN to RXD, dominant to recessive
tRDR
-
50
140
ns
Loop time TXD to RXD, Medium Slew Rate (Selected by SPI)
tLOOP-MSL
ns
Recessive to Dominant
-
200
-
Dominant to Recessive
-
200
-
-
300
-
-
300
-
tCAN-WU1-F
0.5
2.0
5.0
μs
tCAN-WU3-F
300
-
-
ns
tCAN-WU3-TO
-
-
120
μs
Loop time TXD to RXD, Slow Slew Rate (Selected by SPI)
tLOOP-SSL
Recessive to Dominant
Dominant to Recessive
CAN Wake-up filter time, single dominant pulse detection
(23)
(See Figure 31)
(24)
CAN Wake-up filter time, 3 dominant pulses detection
CAN Wake-up filter time, 3 dominant pulses detection
Figure 32)
timeout(25)
(See
ns
Notes
23. No Wake-up for single pulse shorter than tCAN-WU1 min. Wake-up for single pulse longer than tCAN-WU1 max.
24.
Each pulse should be greater than tCAN-WU3-F min. Guaranteed by design, and device characterization.
25.
The 3 pulses should occur within tCAN-WU3-TO. Guaranteed by design, and device characterization.
26.
Guaranteed by design.
34903/4/5
24
Analog Integrated Circuit Device Data
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 7. Dynamic Electrical Characteristics
Characteristics noted under conditions 5.5 V ≤ VSUP ≤ 28 V, - 40 °C ≤ TA ≤ 125 °C, GND = 0 V, unless otherwise noted. Typical
values noted reflect the approximate parameter means at TA = 25 °C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
LIN PHYSICAL LAYER: DRIVER CHARACTERISTICS FOR NORMAL SLEW RATE - 20.0 KBIT/SEC ACCORDING TO LIN PHYSICAL
LAYER SPECIFICATION
BUS LOAD RBUS AND CBUS 1.0 NF / 1.0 KΩ, 6.8 NF / 660 Ω, 10 NF / 500 Ω. SEE Figure 14, PAGE 28.
Duty Cycle 1:
D1
THREC(MAX) = 0.744 * VSUP
THDOM(MAX) = 0.581 * VSUP
D1 = tBUS_REC(MIN)/(2 x tBIT), tBIT = 50 µs, 7.0 V ≤ VSUP ≤ 18 V
Duty Cycle 2:
0.396
-
-
-
-
0.581
D2
THREC(MIN) = 0.422 * VSUP
THDOM(MIN) = 0.284 * VSUP
D2 = tBUS_REC(MAX)/(2 x tBIT), tBIT = 50 µs, 7.6 V ≤ VSUP ≤ 18 V
LIN PHYSICAL LAYER: DRIVER CHARACTERISTICS FOR SLOW SLEW RATE - 10.4 KBIT/SEC ACCORDING TO LIN PHYSICAL LAYER
SPECIFICATION
BUS LOAD RBUS AND CBUS 1.0 NF / 1.0 KΩ, 6.8 NF / 660 Ω, 10 NF / 500 Ω. MEASUREMENT THRESHOLDS. SEE Figure 15, PAGE 29.
Duty Cycle 3:
D3
THREC(MAX) = 0.778 * VSUP
THDOM(MAX) = 0.616 * VSUP
D3 = tBUS_REC(MIN)/(2 x tBIT), tBIT = 96 µs, 7.0 V ≤ VSUP ≤ 18 V
Duty Cycle 4:
0.417
-
-
-
-
0.590
-
20
-
D4
THREC(MIN) = 0.389 * VSUP
THDOM(MIN) = 0.251 * VSUP
D4 = tBUS_REC(MAX)/(2 x tBIT), tBIT = 96 µs, 7.6 V ≤ VSUP ≤ 18 V
LIN PHYSICAL LAYER: DRIVER CHARACTERISTICS FOR FAST SLEW RATE
LIN Fast Slew Rate (Programming Mode)
SRFAST
V / μs
LIN PHYSICAL LAYER: CHARACTERISTICS AND WAKE-UP TIMINGS
VSUP FROM 7.0 TO 18 V, BUS LOAD RBUS AND CBUS 1.0 NF / 1.0 KΩ, 6.8 NF / 660 Ω, 10 NF / 500 Ω. SEE Figure 14, PAGE 28.
Propagation Delay and Symmetry (See Figure 14, page 27 and Figure 15,
page 29)
Propagation Delay of Receiver, tREC_PD = MAX (tREC_PDR, tREC_PDF)
μs
t REC_PD
-
4.2
6.0
t REC_SYM
- 2.0
-
2.0
t PROPWL
42
70
95
From LP VDD OFF mode
t WAKE_LPVDD
-
-
1500
From LP VDD ON mode
t WAKE_LPVDD
1.0
-
12
0.65
1.0
1.35
Symmetry of Receiver Propagation Delay, tREC_PDF - tREC_PDR
Bus Wake-up Deglitcher (LP VDD OFF and LP VDD ON modes) (See Figure 16,
page 28 for LP VDD OFF mode and Figure 17, page 29 for LP mode)
Bus Wake-up Event Reported
μs
μs
OFF
ON
TXD Permanent Dominant State Delay (Guaranteed by design)
t TXDDOM
s
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
25
ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
TIMING DIAGRAMS
tPCLK
CS
tWCLKH
tLEAD
tLAG
SCLK
tWCLKL
tSISU
MOSI
Undefined
tSIH
Di 0
Di n
Don’t Care
Don’t Care
tVALID
tSODIS
tSOEN
MISO
Do 0
Do n
tCSLOW
Figure 10. SPI Timings
TXD
tLRD
0.7 x VDD
tLDR
0.3 x VDD
RXD
0.3 x VDD
0.7 x VDD
Figure 11. CAN Signal Propagation Loop Delay TXD to RXD
34903/4/5
26
Analog Integrated Circuit Device Data
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
tTRD
TXD
0.7 x VDD
tTDR
0.3 x VDD
0.9 V
VDIFF
tRRD
RXD
0.5 V
tRDR
0.7 x VDD
0.3 x VDD
Figure 12. CAN Signal Propagation Delays TXD to CAN and CAN to RXD
.
12 V
10 μF
VSUP
5 V_CAN
100 nF
22 μF
CANH
Signal generator
TXD
RBUS
60 Ω
CBus
100 pF
CANL
RXD
15 pF
GND SPLIT
All pins are not shown
Figure 13. Test Circuit for CAN Timing Characteristics
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
27
ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
TXD
tBIT
tBIT
tBUS_DOM(MAX)
VLIN_REC
THREC(MAX)
74.4% VSUP
THDOM(MAX)
58.1% VSUP
tBUS_REC(MIN)
Thresholds of
receiving node 1
LIN
THREC(MIN)
THDOM(MIN)
Thresholds of
receiving node 2
42.2% VSUP
28.4% VSUP
tBUS_DOM(MIN)
tBUS_REC(MAX)
RXD
Output of receiving Node 1
tREC_PDF(1)
tREC_PDR(1)
RXD
Output of receiving Node 2
tREC_PDR(2)
tREC_PDF(2)
Figure 14. LIN Timing Measurements for Normal Slew Rate
34903/4/5
28
Analog Integrated Circuit Device Data
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
TXD
tBIT
tBIT
tBUS_DOM(MAX)
VLIN_REC
THREC(MAX)
77.8% VSUP
THDOM(MAX)
61.6% VSUP
tBUS_REC(MIN)
Thresholds of
receiving node 1
LIN
THREC(MIN)
THDOM(MIN)
Thresholds of
receiving node 2
38.9% VSUP
25.1% VSUP
tBUS_DOM(MIN)
tBUS_REC(MAX)
RXD
Output of receiving Node 1
tREC_PDF(1)
tREC_PDR(1)
RXD
Output of receiving Node 2
tREC_PDF(2)
tREC_PDR(2)
Figure 15. LIN Timing Measurements for Slow Slew Rate
V REC
V BUSWU
LIN
0.4 V SUP
Dominant level
3V
VDD
T PROPWL
T WAKE
Figure 16. LIN Wake-up LP VDD OFF Mode Timing
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
29
ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
V LIN_REC
LIN
V BUSWU
0.4 V SUP
Dominant level
IRQ
T PROPWL
T WAKE
IRQ stays low until SPI reading command
Figure 17. LIN Wake-up LP VDD ON Mode Timing
34903/4/5
30
Analog Integrated Circuit Device Data
Freescale Semiconductor
FUNCTIONAL DESCRIPTION
INTRODUCTION
FUNCTIONAL DESCRIPTION
INTRODUCTION
The MC34903_4_5 is the second generation of System
Basis Chip, combining:
- Advanced power management unit for the MCU, the
integrated CAN interface and for the additional ICs such as
sensors, CAN transceiver.
- Built in enhanced high speed CAN interface (ISO118982 and -5), with local and bus failure diagnostic, protection,
and fail-safe operation mode.
- Built in LIN interface, compliant to LIN 2.1 and J2602-2
specification, with local and bus failure diagnostic and
protection.
- Innovative hardware configurable fail-safe state machine
solution.
- Multiple LP modes, with low current consumption.
- Family concept with pin compatibility; with and without
LIN interface devices.
FUNCTIONAL PIN DESCRIPTION
POWER SUPPLY (VSUP/1 AND VSUP2)
Note: VSUP1 and VSUP2 supplies are externally available
on all devices except the 34903D, 34903S, and 34903P,
where these are connected internally.
VSUP1 is the input pin for the internal supply and the VDD
regulator. VSUP2 is the input pin for the 5 V-CAN regulator,
LIN’s interfaces and I/O functions. The VSUP block includes
over and undervoltage detections which can generate
interrupt. The device includes a loss of battery detector
connected to VSUP/1.
Loss of battery is reported through a bit (called BATFAIL).
This generates a POR (Power On Reset).
VDD VOLTAGE REGULATOR (VDD)
The regulator has two main modes of operation (Normal
mode and LP mode). It can operate with or without an
external PNP transistor.
In Normal mode, without external PNP, the max DC
capability is 150 mA. Current limitation, temperature prewarning flag and overtemperature shutdown features are
included. When VDD is turned ON, rise time from 0 to 5.0 V is
controlled. Output voltage is 5.0 V. A 3.3 V option is available
via dedicated part number.
If current higher than 150 mA is required, an external PNP
transistor must be connected to VE (PNP emitter) and VB
(PNP base) pins, in order to increase total current capability
and share the power dissipation between internal VDD
transistor and the external transistor. See External Transistor
Q1 (VE and VB). The PNP can be used even if current is less
than 150 mA, depending upon ambient temperature,
maximum supply and thermal resistance. Typically, above
100-200 mA, an external ballast transistor is recommended.
VDD REGULATOR IN LP MODE
When the device is set in LP VDD ON mode, the VDD
regulator is able to supply the MCU with a DC current below
typically 1.5 mA (LP-ITH). Transient current can also be
supplied up to a tenth of a mA. Current in excess of 1.5 mA
is detected, and this event is managed by the device logic
(Wake-up detection, timer start for overcurrent duration
monitoring or watchdog refresh).
EXTERNAL TRANSISTOR Q1 (VE AND VB)
The device has a dedicated circuit to allow usage of an
external “P” type transistor, with the objective to share the
power dissipation between the internal transistor of the VDD
regulator and the external transistor. The recommended
bipolar PNP transistor is MJD42C or BCP52-16.
When the external PNP is connected, the current is shared
between the internal path transistor and the external PNP,
with the following typical ratio: 1/3 in the internal transistor
and 2/3 in the external PNP. The PNP activation and control
is done by SPI.
The device is able to operate without an external
transistor. In this case, the VE and VB pins must remain
open.
5 V-CAN VOLTAGE REGULATOR FOR CAN AND
ANALOG MUX
This regulator is supplied from the VSUP/2 pin. A capacitor
is required at 5 V-CAN pin. Analog MUX and part of the LIN
interfaces are supplied from 5 V-CAN. Consequently, the
5 V-CAN must be ON in order to have Analog MUX operating
and to have the LIN interface operating in TXD/RXD mode.
The 5 V-CAN regulator is OFF by default and must be
turned ON by SPI. In Debug mode, the 5 V-CAN is ON by
default.
V AUXILIARY OUTPUT, 5.0 AND 3.3 V
SELECTABLE (VB-AUX, VC-AUX, AND VCAUX) Q2
The VAUX block is used to provide an auxiliary voltage
output, 5.0 or 3.3 V, selectable by the SPI. It uses an external
PNP pass transistor for flexibility and power dissipation
constraints. The external recommended bipolar transistors
are MJD42C or BCP52-16.
An overcurrent and undervoltage detectors are provided.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
31
FUNCTIONAL DESCRIPTION
FUNCTIONAL PIN DESCRIPTION
VAUX is controlled via the SPI, and can be turned ON or
OFF. VAUX low threshold detection and overcurrent
information will disable VAUX, and are reported in the SPI and
can generate INT.
VAUX is OFF by default and must be turned ON by the SPI.
UNDERVOLTAGE RESET AND RESET FUNCTION
(RST)
The RST pin is an open drain structure with an internal
pull-up resistor. The LS driver has limited current capability
when asserted low, in order to tolerate a short to 5.0 V. The
RST pin voltage is monitored in order to detect failure (e.g.
RST pin shorted to 5.0 V or GND).
The RST pin reports an undervoltage condition to the MCU
at the VDD pin, as a RST failure in the watchdog refresh
operation. VDD undervoltage reset also operates in LP VDD
ON mode.
Two VDD undervoltage thresholds are included. The upper
(typically 4.65 V, RST-TH1-5) can lead to a Reset or an
Interrupt. This is selected by the SPI. When “RST-TH2-5“is
selected, in Normal mode, an INT is asserted when VDD falls
below “RST-TH1-5“, then, when VDD falls below “RST-TH2-5” a
Reset will occur. This will allow the MCU to operate in a
degraded mode (i.e., with 4.0 V VDD).
I/O PINS (I/O-0: I/O-3)
I/Os are configurable input/output pins. They can be used
for small loads or to drive external transistors. When used as
output drivers, the I/Os are either a HS or LS type. They can
also be set to high-impedance. I/Os are controlled by the SPI
and at power on, the I/Os are set as inputs. They include
overload protection by temperature or excess of a voltage
drop.
When I/O-0/-1/-2/-3 voltage is greater than VSUP/2
voltage, the leakage current (II/O_LEAK) parameter is not
applicable
• I/O-0 and I/O-1 will have current flowing into the device
through three diodes limited by an 80 kOhm resistor (in
series).
• I/O-2 and I/O-3 will have unlimited current flowing into the
device through one diode.
In LP mode, the state of the I/O can be turned ON or OFF,
with extremely low power consumption (except when there is
a load). Protection is disabled in LP mode.
When cyclic sense is used, I/O-0 is the HS/LS switch, I/O1, -2 and -3 are the wake inputs.
I/O-2 and I/O-3 pins share the LIN Master pin function.
VSENSE INPUT (VSENSE)
This pin can be connected to the battery line (before the
reverse battery protection diode), via a serial resistor and a
capacitor to GND. It incorporates a threshold detector to
sense the battery voltage and provide a battery early
warning. It also includes a resistor divider to measure the
VSENSE voltage via the MUX-OUT pin.
MUX-OUTPUT (MUXOUT)
The MUX-OUT pin (Figure 18) delivers an analog voltage
to the MCU A/D input. The voltage to be delivered to MUXOUT is selected via the SPI, from one of the following
functions: VSUP/1, VSENSE, I/O-0, I/O-1, Internal 2.5 V
reference, die temperature sensor, VDD current copy.
Voltage divider or amplifier is inserted in the chain, as
shown in Figure 18.
For the VDD current copy, a resistor must be added to the
MUX-OUT pin, to convert current into voltage. Device
includes an internal 2.0 k resistor selectable by the SPI.
Voltage range at MUX-OUT is from GND to VDD. It is
automatically limited to VDD (max 3.3 V for 3.3 V part
numbers).
The MUX-OUT buffer is supplied from 5 V-CAN regulator,
so the 5 V-CAN regulator must be ON in order to have:
1) MUX-OUT functionality and
2) SPI selection of the analog function.
If the 5 V-CAN is OFF, the MUX-OUT voltage is near GND
and the SPI command that selects one of the analog inputs
is ignored.
Delay must be respected between SPI commands for 5 VCAN turned ON and SPI to select MUX-OUT function. The
delay depends mainly upon the 5 V-CAN capacitor and load
on 5 V-CAN.
The delay can be estimated using the following formula:
delay = C(5 V-CAN) x U (5.0 V) / I_lim 5 V-CAN.
C = cap at 5 V-CAN regulator, U = 5.0 V,
I_LIM 5 V-CAN = min current limit of 5 V-CAN regulator
(parameter 5 V-C ILIM).
34903/4/5
32
Analog Integrated Circuit Device Data
Freescale Semiconductor
FUNCTIONAL DESCRIPTION
FUNCTIONAL PIN DESCRIPTION
VBAT
D1
S_in
VSUP/1
VSENSE
VDD-I_COPY
Multiplexer
S_iddc
S_in
5 V-CAN
5 V-CAN
RSENSE 1.0 k
MCU
MUX-OUT
I/O-0
A/D in
buffer
S_in
S_g3.3
S_g5
S_I/O_att
I/O-1
S_in
Temp
VREF: 2.5 V
S_I/O_att
RMI
S_ir
RM(*)
(*)Optional
All swicthes and resistor are configured and controlled via the SPI
RM: internal resistor connected when VREG current monitor is used
S_g3.3 and S_g5 for 5.0 V or 3.3 V VDD versions
S_iddc to select VDD regulator current copy
S_in1 for LP mode resistor bridge disconnection
S_ir to switch on/off of the internal RMI resistor
S_I/O_att for I/O-0 and I/O-1 attenuation selection
Figure 18. Analog Multiplexer Block Diagram
DGB (DGB) AND DEBUG MODE
Primary Function
It is an input used to set the device in Debug mode. This is
achieved by applying a voltage between 8.0 and 10 V at the
DEBUG pin and then, powering up the device (See State
Diagram). When the device leaves the INIT Reset mode and
enters into INIT mode, it detects the voltage at the DEBUG
pin to be between a range of 8.0 to 10 V, and activates the
Debug mode.
When Debug mode is detected, no Watchdog SPI refresh
commands are necessary. This allows an easy debug of the
hardware and software routines (i.e. SPI commands).
When the device is in Debug mode it is reported by the SPI
flag. While in Debug mode, and the voltage at DBG pin falls
below the 8.0 to 10 V range, the Debug mode is left, and the
device starts the watchdog operation, and expects the proper
watchdog refresh. The Debug mode can be left by SPI. This
is recommended to avoid staying in Debug mode when an
unwanted Debug mode selection (FMEA pin) is present. The
SPI command has a higher priority than providing 8.0 to 10 V
at the DEBUG pin.
Secondary Function
The resistor connected between the DBG pin and the GND
selects the Fail-Safe mode operation. DBG pin can also be
connected directly to GND (this prevents the usage of Debug
mode).
Flexibility is provided to select SAFE output operation via
a resistor at the DBG pin or via a SPI command. The SPI
command has higher priority than the hardware selection via
Debug resistor.
When the Debug mode is selected, the SAFE modes
cannot be configured via the resistor connected at DBG pin.
SAFE
Safe Output Pin
This pin is an output and is asserted low when a fault event
occurs. The objective is to drive electrical safe circuitry and
set the ECU in a known state, independent of the MCU and
SBC, once a failure has been detected.
The SAFE output structure is an open drain, without a pullup.
INTERRUPT (INT)
The INT output pin is asserted low or generates a low
pulse when an interrupt condition occurs. The INT condition
is enabled in the INT register. The selection of low level or
pulse and pulse duration are selected by SPI.
No current will flow inside the INT structure when VDD is
low, and the device is in LP VDD OFF mode. This allows the
connection of an external pull-up resistor and connection of
an INT pin from other ICs without extra consumption in
unpowered mode.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
33
FUNCTIONAL DESCRIPTION
FUNCTIONAL PIN DESCRIPTION
INT has an internal pull-up structure to VDD. In LP VDD ON
mode, a diode is inserted in series with the pull-up, so the
high level is slightly lower than in other modes.
CANH, CANL, SPLIT, RXD, TXD
These are the pins of the high speed CAN physical
interface, between the CAN bus and the micro controller. A
detail description is provided in the document.
LIN, LIN-T, TXDL AND RXDL
The MC34903P, and MC34904 do not have a LIN
interface. However, the MC34903S/5S (S = Single) contains
1 interface.
LIN and LIN1 pins are the connection to the LIN sub buses.
LIN interfaces are connected to the MCU via the TXD,
TXD-L1, RXD, RXD-L1 pins.
The device also includes one or two HS switches to VSUP/
2 pin which can be used as a LIN master termination switch.
Pins LINT and LINT-1 pins are the same as
I/O-2 and I/O-3.
These are the pins of the LIN physical interface. Device
contains zero or 1 LIN interfaces.
34903/4/5
34
Analog Integrated Circuit Device Data
Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
MODE AND STATE DESCRIPTION
FUNCTIONAL DEVICE OPERATION
MODE AND STATE DESCRIPTION
The device has several operation modes. The transitions
and conditions to enter or leave each mode are illustrated in
the state diagram.
INIT RESET
This mode is automatically entered after the device is
“powered on”. In this mode, the RST pin is asserted low, for
a duration of typically 1.0 ms. Control bits and flags are “set”
to their default reset condition. The BATFAIL is set to indicate
the device is coming from an unpowered condition, and all
previous device configurations are lost and “reset” the default
value. The duration of the INIT reset is typically 1.0 ms.
INIT reset mode is also entered from INIT mode if the
expected SPI command does not occur in due time (Ref. INIT
mode), and if the device is not in the debug mode.
INIT
This mode is automatically entered from the INIT Reset
mode. In this mode, the device must be configured via SPI
within a time of 256 ms max.
Four registers called INIT Wdog, INIT REG, INIT LIN I/O
and INIT MISC must be, and can only be configured during
INIT mode.
Other registers can be written in this and other modes.
Once the INIT register configuration is done, a SPI
Watchdog Refresh command must be sent in order to set the
device into Normal mode. If the SPI watchdog refresh does
not occur within the 256 ms period, the device will return into
INIT Reset mode for typically 1.0 ms, and then re enter into
INIT mode.
Register read operation is allowed in INIT mode to collect
device status or to read back the INIT register configuration.
When INIT mode is left by a SPI watchdog refresh
command, it is only possible to re-enter the INIT mode using
a secured SPI command. In INIT mode, the CAN, LIN1,
VAUX, I/O_x and Analog MUX functions are not operating.
The 5 V-CAN is also not operating, except if the Debug mode
is detected.
RESET
In this mode, the RST pin is asserted low. Reset mode is
entered from Normal mode, Normal Request mode, LP VDD
on mode and from the Flash mode when the watchdog is not
triggered, or if a VDD low condition is detected.
The duration of reset is typically 1.0 ms by default. You
can define a longer Reset pulse activation only when the
Reset mode is entered following a VDD low condition. Reset
pulse is always 1.0 ms, when reset mode is entered due to
wrong watchdog refresh command.
Reset mode can be entered via the secured SPI
command.
NORMAL REQUEST
This mode is automatically entered after RESET mode, or
after a Wake-up from LP VDD ON mode.
A watchdog refresh SPI command is necessary to
transition to NORMAL mode. The duration of the Normal
request mode is 256 ms when Normal Request mode is
entered after RESET mode. Different durations can be
selected by SPI when normal request is entered from LP VDD
ON mode.
If the watchdog refresh SPI command does not occur
within the 256 ms (or the shorter user defined time out), then
the device will enter into RESET mode for a duration of
typically 1.0 ms.
Note: in init reset, init, reset and normal request modes as
well as in LP modes, the VDD external PNP is disabled.
NORMAL
In this mode, all device functions are available. This mode
is entered by a SPI watchdog refresh command from Normal
Request mode, or from INIT mode.
During Normal mode, the device watchdog function is
operating, and a periodic watchdog refresh must occur.
When an incorrect or missing watchdog refresh command is
initiated, the device will enter into Reset mode.
While in Normal mode, the device can be set to LP modes
(LP VDD ON or LP VDD OFF) using the SPI command.
Dedicated, secured SPI commands must be used to enter
from Normal mode to Reset mode, INIT mode or Flash mode.
FLASH
In this mode, the software watchdog period is extended up
to typically 32 seconds. This allow programming of the MCU
flash memory while minimizing the software over head to
refresh the watchdog. The flash mode is entered by Secured
SPI command and is left by SPI command. Device will enter
into Reset mode. When an incorrect or missing watchdog
refresh command device will enter into Reset mode. An
interrupt can be generated at 50% of the watchdog period.
CAN interface operates in Flash mode to allow flash via
CAN bus, inside the vehicle.
DEBUG
Debug is a special operation mode of the device which
allows for easy software and hardware debugging. The
debug operation is detected after power up if the DBG pin is
set to 8.0 to 10 V range.
When debug is detected, all the software watchdog
operations are disabled: 256 ms of INIT mode, watchdog
refresh of Normal mode and Flash mode, Normal Request
time out (256 ms or user defined value) are not operating and
will not lead to transition into INIT reset or Reset mode.
When the device is in Debug mode, the SPI command can
be sent without any time constraints with respect to the
watchdog operation and the MCU program can be “halted” or
“paused” to verify proper operation.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
35
FUNCTIONAL DEVICE OPERATION
LP MODES
Debug can be left by removing 8 to 10 V from the DEBUG
pin, or by the SPI command (Ref. to MODE register).
The 5 V-CAN regulator is ON by default in Debug mode.
LP MODES
The device has two main LP modes: LP mode with VDD
OFF, and LP mode with VDD ON.
Prior to entering into LP mode, I/O and CAN Wake-up
flags must be cleared (Ref. to mode register). If the Wake-up
flags are not cleared, the device will not enter into LP mode.
In addition, the CAN failure flags (i.e. CAN_F and CAN_UF)
must be cleared, in order to meet the LP current consumption
specification.
LP - VDD OFF
In this mode, VDD is turned OFF and the MCU connected
to VDD is unsupplied. This mode is entered using SPI. It can
also be entered by an automatic transition due to fail-safe
management. 5 V-CAN and VAUX regulators are also turned
OFF.
When the device is in LP VDD OFF mode, it monitors
external events to Wake-up and leave the LP mode. The
Wake-up events can occur from:
• CAN
• LIN interface, depending upon device part number
• Expiration of an internal timer
• I/O-0, and I/O-1 inputs, and depending upon device part
number and configuration, I/O-2 and/or -3 input
• Cyclic sense of I/O-1 input, associated by I/O-0
activation, and depending upon device part number and
configuration, cyclic sense of I/O-2 and -3 input,
associated by I/O-0 activation
When a Wake-up event is detected, the device enters into
Reset mode and then into Normal Request mode. The Wakeup sources are reported to the device SPI registers. In
summary, a Wake-up event from LP VDD OFF leads to the
VDD regulator turned ON, and the MCU operation restart.
LP - VDD ON
In this mode, the voltage at the VDD pin remains at 5.0 V
(or 3.3 V, depending upon device part number). The
objective is to maintain the MCU powered, with reduced
consumption. In such mode, the DC output current is
expected to be limited to 100 μA or a few mA, as the ECU is
in reduced power operation mode.
During this mode, the 5 V-CAN and VAUX regulators are
OFF. The optional external PNP at VDD will also be
automatically disabled when entering this mode.
The same Wake-up events as in LP VDD OFF mode (CAN,
LIN, I/O, timer, cyclic sense) are available in LP VDD on
mode.
In addition, two additional Wake-up conditions are
available.
• Dedicated SPI command. When device is in LP VDD ON
mode, the Wake-up by SPI command uses a write to
“Normal Request mode”, 0x5C10.
• Output current from VDD exceeding LP-ITH threshold.
In LP VDD ON mode, the device is able to source several
tenths of mA DC. The current source capability can be time
limited, by a selectable internal timer. Timer duration is up to
32 ms, and is triggered when the output current exceed the
output current threshold typically 1.5 mA.
This allows for instance, a periodic activation of the MCU,
while the device remains in LP VDD on mode. If the duration
exceed the selected time (ex 32 ms), the device will detect a
Wake-up.
Wake-up events are reported to the MCU via a low level
pulse at INT pulse. The MCU will detect the INT pulse and
resume operation.
Watchdog Function in LP VDD ON Mode
It is possible to enable the watchdog function in LP VDD
ON mode. In this case, the principle is timeout.
Refresh of the watchdog is done either by:
• a dedicated SPI command (different from any other SPI
command or simple CS activation which would Wakeup - Ref. to the previous paragraph)
• or by a temporary (less than 32 ms max) VDD over
current Wake-up (IDD > 1.5 mA typically).
As long as the watchdog refresh occurs, the device
remains in LP VDD on mode.
Mode Transitions
Mode transitions are either done automatically (i.e. after a
timeout expired or voltage conditions), or via a SPI command,
or by an external event such as a Wake-up. Some mode
changes are performed using the Secured SPI commands.
34903/4/5
36
Analog Integrated Circuit Device Data
Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
STATE DIAGRAM
STATE DIAGRAM
VSUP/1 rise > VSUP-TH1
& VDD > VDD_UVTH
VSUP fall
POWER DOWN
INIT Reset
start T_IR
(T_IR = 1.0 ms)
T_INIT expired
or VDD no Wake-up
I/O-1 deglitcher time
(typically 30 us)
Cyclic sense active time
NORMAL MODE
LP MODE
RESET or NORMAL REQUEST MODE
Wake-up event detected
Wake-up detected.
R
R
R
R
R
R
I/O-0
I/O-0
I/O-1
I/O-1
S1
S1
I/O-2
I/O-2
S2
S2
I/O-3
S3
Upon entering in LP mode, all 3
contact switches are closed.
S3
I/O-3
In LP mode, 1 contact switch is open.
High level is detected on I/O-x, and device wakes up.
Figure 22. Cyclic Sense Operation - Switch to GND, Wake-up by Open Switch
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
43
FUNCTIONAL DEVICE OPERATION
CYCLIC INT OPERATION DURING LP VDD ON MODE
CYCLIC INT OPERATION DURING LP VDD ON MODE
Principle
This function can be used only in LP VDD ON mode (LP
VDD ON).
When Cyclic INT is selected and device is in LP VDD ON
mode, the device will generate a periodic INT pulse.
Upon reception of the INT pulse, the MCU must
acknowledge the INT by sending SPI commands before the
end of the next INT period in order to keep the process going.
When Cyclic INT is selected and operating, the device
remains in LP VDD ON mode, assuming the SPI commands
are issued properly. When no/improper SPI commands are
sent, the device will cease Cyclic INT operation and leave LP
VDD ON mode by issuing a reset. The device will then enter
into Normal Request mode.
VDD current capability and VDD regulator behavior is
similar as in LP VDD ON mode.
Operation
Cyclic INT period selection: register timer B
SPI command in hex 0x56xx [example; 0x560E for 512ms
cyclic Interrupt period (SPI command without parity bit)].
This command must be send while the device is in Normal
mode.
Prepare LP VDD ON
with Cyclic INT
SPI commands to acknowledge INT: (2 commands)
- read the Random code via the watchdog register address
using the following command: MOSI 0x1B00 device report on
MISO second byte the RNDM code (MISO bit 0-7).
- write watchdog refresh command using the random code
inverted: 0x5A RNDb.
These commands can occur at any time within the period.
Initial entry in LP mode with Cyclic INT: after the device is
set in LP VDD ON mode, with cyclic INT enable, no SPI
command is necessary until the first INT pulse occurs. The
acknowledge process must start only after the 1st INT pulse.
Leave LP mode with Cyclic INT:
This is done by a SPI Wake-up command, similar to SPI
Wake-up from LP VDD ON mode: 0x5C10. The device will
enter into Normal Request mode.
Improper SPI command while Cyclic INT operates:
When no/improper SPI commands are sent, while the
device is in LP VDD ON mode with Cyclic INT enable, the
device will cease Cyclic INT operation and leave LP VDD ON
mode by issuing a reset. The device will then enter into
Normal Request mode.
The figure below (Figure 23) describes the complete
Cyclic Interrupt operation.
Leave LP
VDD ON Mode
In LP VDD ON with Cyclic INT
INT
LP VDD
ON mode
SPI
Timer B
Cyclic INT period
1st period
Cyclic INT period
NORMAL MODE
2nd period
Cyclic INT period
3rd period
Cyclic INT period
NORMAL
REQUEST
MODE
LP VDD ON MODE
Legend for SPI commands
Leave LP VDD ON and Cyclic INT due to improper operation
Write Timer B, select Cyclic INT period (ex: 512 ms, 0x560E)
Write Device mode: LP VDD ON with Cyclic INT enable (example: 0x5C90)
Read RNDM code
INT
SPI
Improper or no
acknowledge SPI command
Write RNDM code inv.
SPI Wake-up: 0x5C10
RST
Cyclic INT period
LP VDD ON MODE
RESET and
NORMAL
REQUEST
MODE
Figure 23. Cyclic Interrupt Operation
34903/4/5
44
Analog Integrated Circuit Device Data
Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
BEHAVIOR AT POWER UP AND POWER DOWN
BEHAVIOR AT POWER UP AND POWER DOWN
DEVICE POWER UP
This section describe the device behavior during ramp up,
and ramp down of VSUP/1, and the flexibility offered mainly by
the Crank bit and the two VDD undervoltage reset thresholds.
The figures below illustrate the device behavior during
VSUP/1 ramp up. As the Crank bit is by default set to 0, VDD is
enabled when VSUP/1 is above VSUP TH 1 parameters.
VSUP_NOMINAL (ex 12 V)
VDD NOMINAL (ex 5.0 V)
VSUP slew rate
VBAT
D1
VDD_UV TH (typically 4.65 V)
VSUP/1
VDD
VSUP_TH1
3490X
VDD_START UP
I_VDD
90% VDD_START UP
VSUP/1
Gnd
10% VDD_START UP
VDD
VDD_OFF
RST
1.0 ms
Figure 24. VDD Start-up Versus VSUP/1 Tramp
DEVICE POWER DOWN
The figures below illustrate the device behavior during
VSUP/1 ramp down, based on Crank bit configuration, and
VDD undervoltage reset selection.
Crank Bit Reset (INIT Watchdog Register, Bit 0 =0)
Bit 0 = 0 is the default state for this bit.
During VSUP/1 ramp down, VDD remain ON until device
enters in Reset mode due to a VDD undervoltage condition
(VDD < 4.6 V or VDD < 3.2 V typically, threshold selected by
the SPI). When device is in Reset, if VSUP/1 is below
“VSUP_TH1”, VDD is turned OFF.
Crank Bit Set (INIT Watchdog Register, Bit 0 =1)
The bit 0 is set by SPI write. During VSUP/1 ramp down,
VDD remains ON until device detects a POR and set
BATFAIL. This occurs for a VSUP/1 approx 3.0 V.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
45
FUNCTIONAL DEVICE OPERATION
BEHAVIOR AT POWER UP AND POWER DOWN
VBAT
VSUP_NOMINAL
(ex 12 V)
VBAT
VSUP_NOMINAL
(ex 12 V)
VSUP/1
VSUP/1
VDD (5.0 V)
VSUP_TH1 (4.1 V)
VDD (5.0 V)
VDD_UV TH (typically 4.65 V)
VDD_UV TH (typically 4.65 V)
VDD
VDD
RST
RST
Case 1: “VDD UV TH 4.6V”, with bit Crank = 0 (default value)
VBAT
VSUP_NOMINAL
(ex 12 V)
BATFAIL (3.0 V)
Case 2: “VDD UV 4.6V”, with bit Crank = 1
VBAT
VSUP_NOMINAL
(ex 12 V)
VSUP/1
VSUP/1
VSUP_TH1 (4.1 V)
VDD (5.0 V)
VDD (5.0 V)
VDD_UV TH (typically 4.65 V)
VDD_UV TH (typically 4.65 V)
VDD
VDD
VDD_UV TH2 (typically 3.2 V)
BATFAIL (3.0 V)
VDD_UV TH2 (typically 3.2 V)
(2)
INT
RST
INT
(1)
RST
(1) reset then (2) VDD turn OFF
Case 1: “VDD UV TH 3.2V”, with bit Crank = 0 (default value)
Case 2: “VDD UV 3.2V”, with bit Crank = 1
Figure 25. VDD Behavior During VSUP/1 Ramp Down
34903/4/5
46
Analog Integrated Circuit Device Data
Freescale Semiconductor
FAIL-SAFE OPERATION
BEHAVIOR AT POWER UP AND POWER DOWN
FAIL-SAFE OPERATION
OVERVIEW
Fail-safe mode is entered when specific fail conditions
occur. The “Safe state” condition is defined by the resistor
connected at the DGB pin. Safe mode is entered after
additional event or conditions are met: time out for CAN
communication and state at I/O-1 pin.
Exiting the safe state is always possible by a Wake-up
event: in the safe state, the device can automatically be
awakened by CAN and I/O (if configured as inputs). Upon
Wake-up, the device operation is resumed: enter in Reset
mode.
FAIL-SAFE FUNCTIONALITY
Upon dedicated event or issue detected at a device pin
(i.e. RST short to VDD), the Safe mode can be entered. In
this mode, the SAFE pin is active low.
Description
Upon activation of the SAFE pin, and if the failure
condition that make the SAFE pin activated have not
recovered, the device can help to reduce ECU consumption,
assuming that the MCU is not able to set the whole ECU in LP
mode. Two main cases are available:
Mode A
to properly control the device and properly refresh the
watchdog).
Modes B1, B2 and B3
Upon SAFE activation, the system continues to monitor
external event, and disable the MCU supply (turn VDD OFF).
The external events monitored are: CAN traffic, I/O-1 low
level or both of them. 3 sub cases exist, B1, B2 and B3.
Note: no CAN traffic indicates that the ECU of the vehicle
are no longer active, thus that the car is being parked and
stopped. The I/O low level detection can also indicate that the
vehicle is being shutdown, if the I/O-1 pin is connected for
instance to a switched battery signal (ignition key on/off
signal).
The selection of the monitored events is done by
hardware, via the resistor connected at DBG pin, but can be
over written by software, via a specific SPI command.
By default, after power up the device detect the resistor
value at DBG pin (upon transition from INIT to Normal mode),
and, if no specific SPI command related to Debug resistor
change is send, operates according to the detected resistor.
The INIT MISC register allow you to verify and change the
device behavior, to either confirm or change the hardware
selected behavior. Device will then operate according to the
SAFE mode configured by the SPI.
Table 9 illustrates the complete options available:
Upon SAFE activation, the MCU remains powered (VDD
stays ON), until the failure condition recovers (i.e. S/W is able
Table 9. Fail-safe Options
Resistor at
DBG pin
SPI coding - register INIT MISC bits [2,1,0]
(higher priority that Resistor coding)
Safe mode
code
VDD status
safe state B3
CAN bus idle time
I/O-1
I/O-1 high to low transition
step 1: Failure illustration
step 3: Consequences for VDD
VDD
failure event, i.e. watchdog
VDD
8th
2nd
1st
RST
SAFE
RST
SAFE
OFF state ON state
8 x 256 ms delay time to enter in SAFE mode
to evaluate resistor at the DBG pin
and monitor ECU external events
failure event, VDD low
If VDD failure recovered
VDD
VDD_UV TH
VDD
GND
If Reset s/c GND recovered
failure event, Reset s/c GND
VDD
VDD
2.5 V
RST
OFF state
100 ms
ak
eup
and monitor ECU external events
W
100 ms
E
m CU
et e
=> xte
V rna
D
l
D
di c on
sa d
bl itio
e
n
SAFE
OFF state ON state
100 ms delay time to enter in SAFE mode
to evaluate resistor at DBG pin
SAFE
VDD OFF
RST
RST
SAFE
VDD < VDD_UV TH
GND
VDD OFF
RST
ON state
SAFE
100 ms deglitcher time to activate SAFE and
enter in SAFE mode to evaluate resistor at DBG pin
and monitor ECU external events
Figure 28. SAFE Modes B1, B2, or B3 Behavior Illustration
34903/4/5
50
Analog Integrated Circuit Device Data
Freescale Semiconductor
CAN INTERFACE
CAN INTERFACE DESCRIPTION
CAN INTERFACE
CAN INTERFACE DESCRIPTION
internal 2.5 V reference provides the 2.5 V recessive levels
via the matched RIN resistors. The resistors can be switched
to GND in CAN Sleep mode. A dedicated split buffer provides
a low-impedance 2.5 V to the SPLIT pin, for recessive level
stabilization.
The figure below is a high level schematic of the CAN
interface. It exist in a LS driver between CANL and GND, and
a HS driver from CANH to 5 V-CAN. Two differential
receivers are connected between CANH and CANL to detect
a bus state and to Wake-up from CAN Sleep mode. An
VSUP/2
Pattern
SPI & State machine
Detection
Wake-up
Receiver
5 V-CAN
Driver
QH
RIN
2.5 V
CANH
Differential
Receiver
RXD
RIN
CANL
5 V-CAN
TXD
Driver
SPI & State machine
SPI & State machine
Thermal
QL
5 V-CAN
Failure Detection
Buffer
SPLIT
& Management
Figure 29. CAN Interface Block Diagram
Can Interface Supply
The supply voltage for the CAN driver is the 5 V-CAN pin.
The CAN interface also has a supply pass from the battery
line through the VSUP/2 pin. This pass is used in CAN Sleep
mode to allow Wake-up detection.
During CAN communication (transmission and reception),
the CAN interface current is sourced from the 5 V-CAN pin.
During CAN LP mode, the current is sourced from the VSUP/
2 pin.
TXD/RXD Mode
In TXD/RXD mode, both the CAN driver and the receiver
are ON. In this mode, the CAN lines are controlled by the TXD
pin level and the CAN bus state is reported on the RXD pin.
The 5 V-CAN regulator must be ON. It supplies the CAN
driver and receiver.The SPLIT pin is active and a 2.5 V
biasing is provided on the SPLIT output pin.
Receive Only Mode
This mode is used to disable the CAN driver, but leave the
CAN receiver active. In this mode, the device is only able to
report the CAN state on the RXD pin. The TXD pin has no
effect on CAN bus lines. The 5 V-CAN regulator must be ON.
The SPLIT pin is active and a 2.5 V biasing is provided on the
SPLIT output pin.
Operation in TXD/RXD Mode
The CAN driver will be enabled as soon as the device is in
Normal mode and the TXD pin is recessive.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
51
CAN INTERFACE
CAN INTERFACE DESCRIPTION
When the CAN interface is in Normal mode, the driver has
two states: recessive or dominant. The driver state is
controlled by the TXD pin. The bus state is reported through
the RXD pin.
When TXD is high, the driver is set in the recessive state,
and CANH and CANL lines are biased to the voltage set with
5 V-CAN divided by 2, or approx. 2.5 V.
When TXD is low, the bus is set into the dominant state,
and CANL and CANH drivers are active. CANL is pulled low
and CANH is pulled high.
The RXD pin reports the bus state: CANH minus the CANL
voltage is compared versus an internal threshold (a few
hundred mV).
If “CANH minus CANL” is below the threshold, the bus is
recessive and RXD is set high.
If “CANH minus CANL” is above the threshold, the bus is
dominant and RXD is set low.
The SPLIT pin is active and provides a 2.5 V biasing to the
SPLIT output.
TXD/RXD Mode and Slew Rate Selection
The CAN signal slew rate selection is done via the SPI. By
default and if no SPI is used, the device is in the fastest slew
rate. Three slew rates are available. The slew rate controls
the recessive to dominant, and dominant to recessive
transitions. This also affects the delay time from the TXD pin
to the bus and from the bus to the RXD. The loop time is thus
affected by the slew rate selection.
Minimum Baud Rate
The minimum baud rate is determined by the shortest TXD
permanent dominant timing detection. The maximum number
of consecutive dominant bits in a frame is 12 (6 bits of active
error flag and its echo error flag).
The shortest TXD dominant detection time of 300 μs lead
to a single bit time of: 300 μs / 12 = 25 μs.
So the minimum Baud rate is 1 / 25 μs = 40 kBaud.
Sleep Mode
Sleep mode is a reduced current consumption mode.
CANH and CANL drivers are disabled and CANH and CANL
lines are terminated to GND via the RIN resistor, the SPLIT
pin is high-impedance. In order to monitor bus activities, the
CAN Wake-up receiver can be enabled. It is supplied
internally from VSUP/2.
Wake-up events occurring on the CAN bus pin are
reporting by dedicated flags in SPI and by INT pulse, and
results in a device Wake-up if the device was in LP mode.
When the device is set back into Normal mode, CANH and
CANL are set back into the recessive level. This is illustrated
in Figure 30.
.
TXD
Dominant state
Recessive state
CANH-DOM
CANH
2.5 V
CANL
CANL/CANH-REC
CANH-CANL
CANL-DOM
High ohmic termination (50 kohm) to GND
RXD
SPLIT
2.5 V
Bus Driver
Receiver
(bus dominant set by other IC)
Normal or Listen Only mode
High-impedance
Go to sleep,
Sleep or Stand-by mode Normal or Listen Only mode
Figure 30. Bus Signal in TXD/RXD and LP Mode
Wake-up
When the CAN interface is in Sleep mode with Wake-up
enabled, the CAN bus traffic is detected. The CAN bus Wake-
up is a pattern Wake-up. The Wake-up by the CAN is enabled
or disabled via the SPI.
34903/4/5
52
Analog Integrated Circuit Device Data
Freescale Semiconductor
CAN INTERFACE
CAN INTERFACE DESCRIPTION
CAN
bus
CANH
Dominant
Pulse # 1
Dominant
Pulse # 2
CANL
Internal differential Wake-up receiver signal
Internal Wake-up signal
Can Wake-up detected
tCAN WU1-F
Figure 31. Single Dominant Pulse Wake-up
Pattern Wake-up
In order to Wake-up the CAN interface, the Wake-up
receiver must receive a series of three consecutive valid
dominant pulses, by default when the CANWU bit is low.
CANWU bit can be set high by SPI and the Wake-up will occur
after a single pulse duration of 2.0 μs (typically).
A valid dominant pulse should be longer than 500 ns. The
three pulses should occur in a time frame of 120 μs, to be
considered valid. When three pulses meet these conditions,
the wake signal is detected. This is illustrated by the following
figure.
.
CAN
bus
Dominant
Pulse # 1
CANH
Dominant
Pulse # 3
Dominant
Pulse # 2
CANL
Dominant
Pulse # 4
Internal differential Wake-up receiver signal
Internal Wake-up signal
Can Wake-up detected
tCAN WU3-F
tCAN WU3-F
tCAN WU3-F
tCAN WU3-TO
Dominant Pulse # n: duration 1 or multiple dominant bits
Figure 32. Pattern Wake-up - Multiple Dominant Detection
BUS TERMINATION
The device supports the two main types of bus
terminations:
• Differential termination resistors between CANH and
CANL lines.
• SPLIT termination concept, with the mid point of the
differential termination connected to GND through a
capacitor and to the SPLIT pin.
• In application, the device can also be used without
termination.
• Figure 33 illustrates some of the most common
terminations.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
53
CAN INTERFACE
CAN BUS FAULT DIAGNOSTIC
CANH
SPLIT
CANH
No
connect
120
CANL
No
connect
SPLIT
CAN bus
CAN bus
CANL
ECU connector
ECU connector
No termination
Standard termination
CANH
60
SPLIT
CAN bus
60
CANL
ECU connector
Figure 33. Bus Termination Options
CAN BUS FAULT DIAGNOSTIC
The device includes diagnostic of bus short-circuit to GND,
VBAT, and internal ECU 5.0 V. Several comparators are
implemented on CANH and CANL lines. These comparators
Vr5
H5
Hb
TXD
Hg
Logic
Diag
Lg
VBAT (12-14 V)
Vrvb
VDD
Vrg
L5
VRVB (VSUP-2.0 V)
CANH
CANL
Vrg
Lb
monitor the bus level in the recessive and dominant states.
The information is then managed by a logic circuitry to
properly determine the failure and report it.
VDD (5.0 V)
VR5 (VDD-.43 V)
CANH dominant level (3.6 V)
Recessive level (2.5 V)
VRG (1.75 V)
Vrvb
CANL dominant level (1.4 V)
Vr5
GND (0.0 V)
Figure 34. CAN Bus Simplified Structure Truth Table for Failure Detection
The following table indicates the state of the comparators when there is a bus failure, and depending upon the driver state.
Table 10. Failure Detection Truth Table
Failure Description
Driver Recessive State
Driver Dominant State
Lg (threshold 1.75 V)
Hg (threshold 1.75 V)
Lg (threshold 1.75 V)
Hg (threshold 1.75 V)
No failure
1
1
0
1
CANL to GND
0
0
0
1
CANH to GND
0
0
0
0
Lb (threshold VSUP -2.0 V)
Hb (threshold VSUP -2.0 V)
Lb (threshold VSUP -2.0 V)
Hb (threshold VSUP -2.0 V)
No failure
0
0
0
0
CANL to VBAT
1
1
1
1
CANH to VBAT
1
1
0
1
34903/4/5
54
Analog Integrated Circuit Device Data
Freescale Semiconductor
CAN INTERFACE
CAN BUS FAULT DIAGNOSTIC
Table 10. Failure Detection Truth Table
Driver Recessive State
Failure Description
Driver Dominant State
Lg (threshold 1.75 V)
Hg (threshold 1.75 V)
Lg (threshold 1.75 V)
Hg (threshold 1.75 V)
L5 (threshold VDD -0.43 V)
H5 (threshold VDD -0.43 V)
L5 (threshold VDD -0.43 V)
H5 (threshold VDD -0.43 V)
No failure
0
0
0
0
CANL to 5.0 V
1
1
1
1
CANH to 5.0 V
1
1
0
1
DETECTION PRINCIPLE
In the recessive state, if one of the two bus lines are
shorted to GND, VDD (5.0 V), or VBAT, the voltage at the
other line follows the shorted line, due to the bus termination
resistance. For example: if CANL is shorted to GND, the
CANL voltage is zero, the CANH voltage measured by the Hg
comparator is also close to zero.
In the recessive state, the failure detection to GND or
VBAT is possible. However, it is not possible with the above
implementation to distinguish which of the CANL or CANH
lines are shorted to GND or VBAT. A complete diagnostic is
possible once the driver is turned on, and in the dominant
state.
Number of Samples for Proper Failure Detection
The failure detector requires at least one cycle of the
recessive and dominant states to properly recognize the bus
failure. The error will be fully detected after five cycles of the
recessive-dominant states. As long as the failure detection
circuitry has not detected the same error for five recessivedominant cycles, the error is not reported.
BUS CLAMPING DETECTION
If the bus is detected to be in dominant for a time longer
than (TDOM), the bus failure flag is set and the error is
reported in the SPI.
TXD
This condition could occur when the CANH line is shorted
to a high-voltage. In this case, current will flow from the highvoltage short-circuit, through the bus termination resistors
(60 Ω), into the SPLIT pin (if used), and into the device CANH
and CANL input resistors, which are terminated to internal
2.5 V biasing or to GND (Sleep mode).
Depending upon the high-voltage short-circuit, the number
of nodes, usage of the SPLIT pin, RIN actual resistor and
mode state (Sleep or Active) the voltage across the bus
termination can be sufficient to create a positive dominant
voltage between CANH and CANL, and the RXD pin will be
low. This would prevent start of any CAN communication and
thus, proper failure identification requires five pulses on TXD.
The bus dominant clamp circuit will help to determine such
failure situation.
RXD Permanent Recessive Failure (does not apply
to “C version”)
The aim of this detection is to diagnose an external
hardware failure at the RXD output pin and ensure that a
permanent failure at RXD does not disturb the network
communication. If RXD is shorted to a logic high signal, the
CAN protocol module within the MCU will not recognize any
incoming message. In addition, it will not be able to easily
distinguish the bus idle state and can start communication at
any time. In order to prevent this, RXD failure detection is
necessary. When a failure is detected, the RXD high flag is
set and CAN switches to receive only mode.
CANL&H
Diag
TXD driver
Logic
Diff output
VDD/2
VDD
Sampling
VDD
Rxsense
RXD
RXD output
CANH
RXD driver
Diff
60
CANL
Sampling
RXD short to VDD
RXD flag latched
RXD flag
Prop delay
The RXD flag is not the RXPR bit in the LPC register, and neither is the CANF in the INTR register.
Figure 35. RXD Path Simplified Schematic, RXD Short to VDD Detection
Implementation for Detection
The implementation senses the RXD output voltage at
each low to high transition of the differential receiver.
Excluding the internal propagation delay, the RXD output
should be low when the differential receiver is low. When an
external short to VDD at the RXD output, RXD will be tied to
a high level and can be detected at the next low to high
transition of the differential receiver.
As soon as the RXD permanent recessive is detected, the
RXD driver is deactivated.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
55
CAN INTERFACE
CAN BUS FAULT DIAGNOSTIC
Once the error is detected the driver is disabled and the
error is reported via SPI in CAN register.
Recovery Condition
The internal recovery is done by sampling a correct low
level at TXD as shown in the following illustration.
CANL&H
Diff output
Sampling
RXD output
Sampling
RXD short to VDD
RXD flag latched
RXD no longer shorted to VDD
RXD flag
The RXD flag is not the RXPR bit in the LPC register, and neither is the CANF in the INTR register.
Figure 36. RXD Path Simplified Schematic, RXD Short to VDD Detection
TXD PERMANENT DOMINANT
Principle
If the TXD is set to a permanent low level, the CAN bus is
set into dominant level, and no communication is possible.
The device has a TXD permanent timeout detector. After the
timeout (TDOUT), the bus driver is disabled and the bus is
released into a recessive state. The TXD permanent flag is
set.
Recovery
The TXD permanent dominant is used and activated when
there is a TXD short to RXD. The recovery condition for a
TXD permanent dominant (recovery means the re-activation
of the CAN drivers) is done by entering into a Normal mode
controlled by the MCU or when TXD is recessive while RXD
change from recessive to dominant.
TXD TO RXD SHORT-CIRCUIT
low and drives CANH and CANL into a dominant state. Thus
the bus is stuck in dominant. No further communication is
possible.
Detection and Recovery
The TXD permanent dominant timeout will be activated and
release the CANL and CANH drivers. However, at the next
incoming dominant bit, the bus will then be stuck in dominant
again. The recovery condition is same as the TXD dominant
failure
IMPORTANT INFORMATION FOR BUS DRIVER
REACTIVATION
The driver stays disabled until the failure is/are removed
(TXD and/or RXD is no longer permanent dominant or
recessive state or shorted) and the failure flags cleared
(read). The CAN driver must be set by SPI in TXD/RXD mode
in order to re enable the CAN bus driver.
Principle
When TXD is shorted to RXD during incoming dominant
information, RXD is set to low. Consequently, the TXD pin is
34903/4/5
56
Analog Integrated Circuit Device Data
Freescale Semiconductor
LIN BLOCK
LIN INTERFACE DESCRIPTION
LIN BLOCK
LIN INTERFACE DESCRIPTION
The physical interface is dedicated to automotive LIN subbus applications.
The interface has 20 kbps and 10 kbps baud rates, and
includes as well as a fast baud rate for test and programming
modes. It has excellent ESD robustness and immunity
against disturbance, and radiated emission performance. It
has safe behavior when a LIN bus short-to-ground, or a LIN
bus leakage during LP mode.
Digital inputs are related to the device VDD pin.
POWER SUPPLY PIN (VSUP/2)
The VSUP/2 pin is the supply pin for the LIN interface. To
avoid a false bus message, an undervoltage on VSUP/2
disables the transmission path (from TXD to LIN) when
VSUP/2 falls below 6.1 V.
GROUND PIN (GND)
When there is a ground disconnection at the module level,
the LIN interface do not have significant current consumption
on the LIN bus pin when in the recessive state.
LIN BUS PIN (LIN AND LIN1)
The LIN pin represents the single-wire bus transmitter and
receiver. It is suited for automotive bus systems, and is
compliant to the LIN bus specification 2.1 and SAEJ2602-2.
The LIN interface is only active during Normal mode.
Driver Characteristics
The LIN driver is a LS MOSFET with internal overcurrent
thermal shutdown. An internal pull-up resistor with a serial
diode structure is integrated so no external pull-up
components are required for the application in a slave node.
An additional pull-up resistor of 1.0 kΩ must be added when
the device is used in the master node. The 1.0 kΩ pull-up
resistor can be connected to the LIN pin or to the ECU battery
supply.
The LIN pin exhibits no reverse current from the LIN bus
line to VSUP/2, even in the event of a GND shift or VSUP/2
disconnection.
The transmitter has a 20 kbps, 10 kbps and fast baud rate,
which are selected by SPI.
Receiver Characteristics
The receiver thresholds are ratiometric with the device
VSUP/2 voltage.
If the VSUP/2 voltage goes below typically 6.1 V, the LIN
bus enters into a recessive state even if communication is
sent on TXD.
If LIN driver temperature reaches the overtemperature
threshold, the transceiver and receiver are disabled. When
the temperature falls below the overtemperature threshold,
LIN driver and receiver will be automatically enabled.
DATA INPUT PIN (TXD-L, TXD-L1)
The TXD-L and TXD-L1 input pin are the MCU interface to
control the state of the LIN output. When TXD-L is LOW
(dominant), LIN output is LOW. When TXD-L is HIGH
(recessive), the LIN output transistor is turned OFF.
This pin has an internal pull-up current source to VDD to
force the recessive state if the input pin is left floating.
If the pin stays low (dominant sate) more than t TXDDOM,
the LIN transmitter goes automatically in recessive state. This
is reported by flag in LIN register.
DATA OUTPUT PIN (RXD-L AND RXD-L1)
This output pin is the MCU interface, which reports the
state of the LIN bus voltage.
LIN HIGH (recessive) is reported by a high voltage on
RXD, LIN LOW (dominant) is reported by a low voltage on
RXD.
LIN OPERATIONAL MODES
The LIN interface have two operational modes, Transmit
receiver and LIN disable modes.
TRANSMIT RECEIVE
In the TXD/RXD mode, the LIN bus can transmit and
receive information.
When the 20 kbps baud rate is selected, the slew rate and
timing are compatible with LIN protocol specification 2.1.
When the 10 kbps baud rate is selected, the slew rate and
timing are compatible with J2602-2.
When the fast baud rate is selected, the slew rate and
timing are much faster than the above specification and allow
fast data transition. The LIN interface can be set by the SPI
command in TXD/RXD mode, only when TXD-L is at a high
level. When the SPI command is send while TXD-L is low, the
command is ignored.
SLEEP MODE
This mode is selected by SPI, and the transmission path is
disabled. Supply current for LIN block from VSUP/2 is very low
(typically 3.0 μA). LIN bus is monitor to detect Wake-up
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
57
LIN BLOCK
LIN OPERATIONAL MODES
event. In the Sleep mode, the internal 725 kOhm pull-up
resistor is connected and the 30 kOhm disconnected.
The LIN block can be awakened from Sleep mode by
detection of LIN bus activity.
LIN Bus Activity Detection
The LIN bus Wake-up is recognized by a recessive to
dominant transition, followed by a dominant level with a
duration greater than 70 μs, followed by a dominant to
recessive transition. This is illustrated in Figures 16 and 17.
Once the Wake-up is detected, the event is reported to the
device state machine. An INT is generated if the device is in
LP VDD ON mode, or VDD will restart if the device was in LP
VDDOFF mode.
The Wake-up can be enable or disable by the SPI.
Fail-safe Features
Table 11 describes the LIN block behavior when there is a
failure.
Table 11. LIN Block Failure
FAULT
FUNCTIONNAL
MODE
LIN supply undervoltage
TXD Pin Permanent
Dominant
LIN Thermal Shutdown
TXD RXD
TXD RXD
CONDITION
CONSEQUENCE
RECOVERY
LIN supply voltage < 6.0 V (typically)
LIN transmitter in recessive State
Condition gone
TXD pin low for more than t TXDDOM
LIN transmitter in recessive State
Condition gone
LIN driver temperature > 160 °C
(typically)
LIN transmitter and receiver disabled
HS turned off
Condition gone
34903/4/5
58
Analog Integrated Circuit Device Data
Freescale Semiconductor
SERIAL PERIPHERAL INTERFACE
HIGH LEVEL OVERVIEW
SERIAL PERIPHERAL INTERFACE
HIGH LEVEL OVERVIEW
The device uses a 16 bits SPI, with the following
arrangements:
MOSI, Master Out Slave In bits:
• bits 15 and 14 (called C1 and C0) are control bits to
select the SPI operation mode (write control bit to
device register, read back of the control bits, read of
device flag).
• bit 13 to 9 (A4 to A0) to select the register address.
• bit 8 (P/N) has two functions: parity bit in write mode
(optional, = 0 if not used), Next bit ( = 1) in read mode.
Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9
MOSI
C1
C0
A4
S15
S14
A2
A1
A0
register address
control bits
MISO
A3
S13
S12
S11
S10
• bit 7 to 0 (D7 to D0): control bits
MISO, Master In Slave Out bits:
• bits 15 to 8 (S15 to S8) are device status bits
• bits 7 to 0 (Do7 to Do0) are either extended device
status bits, device internal control register content or
device flags.
The SPI implementation does not support daisy chain
capability.
Figure 37 is an overview of the SPI implementation.
Bit 8
Bit 7 Bit 6
P/N
D7
S9
S8
Bit 4 Bit 3
Bit 2
Bit 1
Bit 0
D4
D2
D1
D0
Do2
Do1
Do0
D3
data
Do7
Do6
Do5 Do4
Do3
Extended Device Status, Register Control bits or Device Flags
CS active low. Must rise at end of 16 clocks,
for write commands, MOSI bits [15, 14] = [0, 1]
CS
SCLK
MISO Tri-state
D5
Parity (optional) or
Next bit = 1
Device Status
MOSI Don’t Care
D6
Bit 5
SCLK signal is low outside of CS active
C1
S15
C0
D0
S14
Do0
Don’t Care
Tri-state
MOSI and MISO data changed at SCLK rising edge
and sampled at falling edge. Msb first.
MISO tri-state outside of CS active
SPI Wave Form, and Signals Polarity
Figure 37. SPI Overview
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
59
SERIAL PERIPHERAL INTERFACE
DETAIL OPERATION
DETAIL OPERATION
SPI Operation Deviation (does not apply to “C” version)
When the previous steps are implemented, the device will
operate as follows:
For a given SPI write command (named SPI write ‘n’):
• In case the SPI write command ‘n’ is not accepted, the
following SPI command (named SPI ‘n+1’) will finish the
write process of the SPI write ‘n’, thanks to step 2
(tLAG > 550 ns) and step 3 (which is the additional SPI
command ‘n+1’).
• By applying steps 1, 2, and 3, no SPI command is ignored.
Worst case, the SPI write ‘n’ is executed at the time the
SPI ‘n+1’ is sent. This will lead to a delay in device
operation (delay between SPI command ‘n’ and ‘n+1’).
Note: Occurrence of an incorrect command is reduced,
thanks to step 1 (extension of tCSLOW duration to >5.5 μs).
Sequence examples:
Example 1:
• 0x60C0 (CAN interface control) – in case this command is
missed, next write command will complete it
• 0x66C0 (LIN interface control) – in case this command is
missed, next read command will complete it
• 0x2580 (read device ID) – Additional command to
complete previous LIN command, in case it was missed
Example 2:
• 0x60C0 (CAN interface control) - in case this command is
missed, next write command will complete it
• 0x66C0 (LIN interface control) - in case this command is
missed, next read command will complete it
• 0x2100 (read CAN register content) – this command will
complete previous one, in case it was missed
• 0x2700 (read LIN register content)
In some cases, the SPI write command is not properly
interpreted by the device. This results in either a “non
received SPI command” or a “corrupted SPI command”.
Important: Due to this, the tLEAD and tCSLOW parameters
must be carefully acknowledged.
Only SPI write commands (starting with bits 15,14 = 01)
are affected. The SPI read commands (starting with bits
15,14 = 00 or 11) are not affected.
The occurrence of this issue is extremely low and is
caused by the synchronization between internal and external
signals. In order to guarantee proper operation, the following
steps must be taken.
1. Ensure the duration of the Chip Select Low (tCSLOW)
state is >5.5 μs.
Note: In data sheet revisions prior to 7.0, this parameter is
not specified and is indirectly defined by the sum of 3
parameters, tLEAD + 16 x tPCLK + tLAG (sum = 4.06 μs).
2. Ensure SPI timing parameter tLEAD is a min. of
550 ns.
Note: In data sheet revisions prior to 7.0, the tLEAD
parameter is a min of 30 ns.
3. Make sure to include a SPI read command after a
SPI write command.
In case a series of SPI write commands is used, only one
additional SPI read is necessary. The recommended SPI
read command is “device ID read: 0x2580” so device
operation is not affected (ex: clear flag). Other SPI read
commands may also be used.
BITS 15, 14, AND 8 FUNCTIONS
Table 12 summarizes the various SPI operation, depending upon bit 15, 14, and 8.
Table 12. SPI Operations (bits 8, 14, & 15)
Parity/Next
MOSI[8] P/N
Control Bits MOSI[15-14], C1-C0
Type of Command
00
Read back of register
content and block (CAN,
I/O, INT, LINs) real time
state. See Table 38.
1
Bit 8 must be set to 1, independently of the parity function
selected or not selected.
01
Write to register
address, to control the
device operation
0
If bit 8 is set to “0”: means parity not selected OR
10
Reserved
11
Read of device flags
form a register address
Note for Bit 8 P/N
parity is selected AND parity = 0
1
if bit 8 is set to “1”: means parity is selected AND parity = 1
1
Bit 8 must be set to 1, independently of the parity function
selected or not selected.
34903/4/5
60
Analog Integrated Circuit Device Data
Freescale Semiconductor
SERIAL PERIPHERAL INTERFACE
DETAIL OPERATION
BITS 13-9 FUNCTIONS
Device Status on MISO
The device contains several registers coded on five bits
(bits 13 to 9).
Each register controls or reports part of the device’s
function. Data can be written to the register to control the
device operation or to set the default value or behavior.
When a write operation is performed to store data or
control bits into the device, the MISO pin reports a 16 bit fixed
device status composed of 2 bytes: Device Fixed Status (bits
15 to 8) + extended Device Status (bits 7 to 0). In a read
operation, MISO will report the Fixed device status (bits 15 to
8) and the next eight bits will be the content of the selected
register.
Every register can also be read back in order to ensure
that it’s content (default setting or value previously written) is
correct.
In addition, some of the registers are used to report device
flags.
REGISTER ADRESS TABLE
Table 13 is a list of device registers and addresses, coded
with bits 13 to 9.
Table 13. Device Registers with Corresponding Address
Address
MOSI[13-9]
A4...A0
Description
Quick Ref.
Name
0_0000
Analog Multiplexer
MUX
1) Write “device control bits” to register address.
2) Read back register “control bits”
0_0001
Memory byte A
RAM_A
0_0010
Memory byte B
RAM_B
1) Write “data byte” to register address.
2) Read back “data byte” from register address
0_0011
Memory byte C
RAM_C
Functionality
0_0100
Memory byte D
RAM_D
0_0101
Initialization Regulators
Init REG
0_0110
Initialization Watchdog
Init watchdog
0_0111
Initialization LIN and I/O
Init LIN I/O
0_1000
Initialization Miscellaneous functions
Init MISC
0_1001
Specific modes
SPE_MODE
1) Write to register to select device Specific mode, using “Inverted
Random Code”.
2) Read “Random Code”
0_1010
Timer_A: watchdog & LP MCU consumption
TIM_A
0_1011
Timer_B: Cyclic Sense & Cyclic Interrupt
TIM_B
1) Write “timing values” to register address.
2) Read back register “timing values”
0_1100
Timer_C: watchdog LP & Forced Wake-up
TIM_C
0_1101
Watchdog Refresh
watchdog
Watchdog Refresh Commands
0_1110
Mode register
MODE
1) Write to register to select LP mode, with optional “Inverted Random
code” and select Wake-up functionality
2) Read operations:
Read back device “Current mode”
Read “Random Code”,
Leave “Debug mode”
0_1111
Regulator Control
REG
1_0000
CAN interface control
CAN
1_0001
Input Output control
I/O
1_0010
Interrupt Control
Interrupt
1_0011
LIN1 interface control
LIN1
1) Write “device initialization control bits” to register address.
2) Read back “initialization control bits” from register address
1) Write “device control bits” to register address, to select device
operation.
2) Read back register “control bits”.
3) Read device flags from each of the register addresses.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
61
SERIAL PERIPHERAL INTERFACE
DETAIL OPERATION
COMPLETE SPI OPERATION
Table 14 is a compiled view of all the SPI capabilities and
options. Both MOSI and MISO information are described.
Table 14. SPI Capabilities with Options
Type of Command
Read back of “device control bits” (MOSI bit 7 = 0)
OR
Read specific device information (MOSI bit 7 = 1)
MOSI/
MISO
Control bits
[15-14]
Address
[13-9]
Parity/Next
bits [8]
Bit 7
Bits [6-0]
MOSI
00
address
1
0
000 0000
MISO
MOSI
MISO
Write device control bit to address selected by bits
(13-9).
MISO return 16 bits device status
MOSI
Reserved
MOSI
MISO
Device Fixed Status (8 bits)
00
address
1
MISO
MOSI
MISO
MOSI
1
000 0000
Device Fixed Status (8 bits)
01
address
Device ID and I/Os state
(note)
Control bits
Device Fixed Status (8 bits)
Device Extended Status (8 bits)
10
Reserved
MISO
Read device flags and Wake-up flags, from
register address (bit 13-9), and sub address (bit 7).
MISO return fixed device status (bit 15-8) + flags
from the selected address and sub-address.
Register control bits content
Reserved
11
address
Reserved
0
Read of device flags form a register address,
and sub address LOW (bit 7)
1
Read of device flags form a register address,
and sub address HIGH (bit 7)
Device Fixed Status (8 bits)
11
address
1
Flags
Device Fixed Status (8 bits)
Note: P = 0 if parity bit is not selected or parity = 0. P = 1 if parity
is selected and parity = 1.
PARITY BIT 8
Calculation
The parity is used for the write-to-register command (bit
15,14 = 01). It is calculated based on the number of logic one
contained in bits 15-9,7-0 sequence (this is the entire 16 bits
of the write command except bit 8).
Bit 8 must be set to 0 if the number of 1 is odd.
Bit 8 must be set to 1if the number of 1 is even.
Examples 1:
MOSI [bit 15-0] = 01 00 011 P 01101001, P should be 0,
because the command contains 7 bits with logic 1.
Flags
Thus the Exact command will then be:
MOSI [bit 15-0] = 01 00 011 0 01101001
Examples 2:
MOSI [bit 15-0] = 01 00 011 P 0100 0000, P should be 1,
because the command contains 4 bits with logic 1.
Thus the Exact command will then be:
MOSI [bit 15-0] = 01 00 011 1 0100 0000
Parity Function Selection
All SPI commands and examples do not use parity
functions.
The parity function is optional. It is selected by bit 6 in INIT
MISC register.
If parity function is not selected (bit 6 of INIT MISC = 0),
then Parity bits in all SPI commands (bit 8) must be “0”.
34903/4/5
62
Analog Integrated Circuit Device Data
Freescale Semiconductor
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
DETAIL OF CONTROL BITS AND REGISTER MAPPING
The following tables contain register bit meaning arranged by register address, from address 0_000 to address 1_0100
MUX AND RAM REGISTERS
Table 15. MUX Register(32)
MOSI First Byte [15-8]
[b_15 b_14] 0_0000 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 00 _ 000 P
MUX_2
MUX_1
MUX_0
Int 2K
I/O-att
0
0
0
Default state
0
0
0
0
0
0
0
0
Condition for default
POR, 5 V-CAN off, any mode different from Normal
Bits
Description
b7 b6 b5
MUX_2, MUX_1, MUX_0 - Selection of external input signal or internal signal to be measured at MUX-OUT pin
000
All functions disable. No output voltage at MUX-OUT pin
001
VDD regulator current recopy. Ratio is approx 1/97. Requires an external resistor or selection of Internal 2.0 K (bit 3)
010
Device internal voltage reference (approx 2.5 V)
011
Device internal temperature sensor voltage
100
Voltage at I/O-0. Attenuation or gain is selected by bit 3.
101
Voltage at I/O-1. Attenuation or gain is selected by bit 3.
110
Voltage at VSUP/1 pin. Refer to electrical table for attenuation ratio (approx 5)
111
Voltage at VSENSE pin. Refer to electrical table for attenuation ratio (approx 5)
b4
INT 2k - Select device internal 2.0 kohm resistor between AMUX and GND. This resistor allows the measurement of a voltage proportional
to the VDD output current.
0
Internal 2.0 kohm resistor disable. An external resistor must be connected between AMUX and GND.
1
Internal 2.0 kohm resistor enable.
b3
I/O-att - When I/O-0 (or I/O-1) is selected with b7,b6,b5 = 100 (or 101), b3 selects attenuation or gain
between I/O-0 (or I/O-1) and MUX-OUT pin
0
Gain is approx 2 for device with VDD = 5.0 V (Ref. to electrical table for exact gain value)
Gain is approx 1.3 for device with VDD = 3.3 V (Ref. to electrical table for exact gain value)
1
Attenuation is approx 4 for device with VDD = 5.0 V (Ref. to electrical table for exact attenuation value)
Attenuation is approx 6 for device with VDD = 3.3 V (Ref. to electrical table for exact attenuation value)
Notes
32. The MUX register can be written and read only when the 5V-CAN regulator is ON. If the MUX register is written or read while
5V-CAN is OFF, the command is ignored, and the MXU register content is reset to default state (all control bits = 0).
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
63
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
Table 16. Internal Memory Registers A, B, C, and D, RAM_A, RAM_B, RAM_C, and RAM_D
MOSI Second Byte, bits 7-0
MOSI First Byte [15-8]
[b_15 b_14] 0_0xxx [P/N]
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
01 00 _ 001 P
Ram a7
Ram a6
Ram a5
Ram a4
Ram a3
Ram a2
Ram a1
Ram a0
Default state
0
0
0
0
0
0
0
0
Condition for default
POR
01 00 _ 010 P
Ram b7
Ram b6
Ram b5
Ram b4
Ram b3
Ram b2
Ram b1
Ram b0
Default state
0
0
0
0
0
0
0
0
Ram c3
Ram c2
Ram c1
Ram c0
0
0
0
0
Condition for default
POR
01 00 _ 011 P
Ram c7
Ram c6
Ram c5
Ram c4
Default state
0
0
0
0
Condition for default
POR
01 00 _ 100 P
Ram d7
Ram d6
Ram d5
Ram d4
Ram d3
Ram d2
Ram d1
Ram d0
Default state
0
0
0
0
0
0
0
0
Condition for default
POR
INIT REGISTERS
Note: these registers can be written only in INIT mode
Table 17. Initialization Regulator Registers, INIT REG (note: register can be written only in INIT mode)
MOSI First Byte [15-8]
[b_15 b_14] 0_0101 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 00 _ 101 P
I/O-x sync
VDDL rst[1]
VDDL rst[0]
VDD rstD[1]
VDD rstD[0]
VAUX5/3
Cyclic on[1]
Cyclic on[0]
Default state
1
0
0
0
0
0
0
0
Condition for default
POR
Bit
Description
b7
I/O-x sync - Determine if I/O-1 is sensed during I/O-0 activation, when cyclic sense function is selected
0
I/O-1 sense anytime
1
I/O-1 sense during I/O-0 activation
b6, b5
VDDL RST[1] VDDL RST[0] - Select the VDD undervoltage threshold, to activate RST pin and/or INT
00
Reset at approx 0.9 VDD.
01
INT at approx 0.9 VDD, Reset at approx 0.7 VDD
10
Reset at approx 0.7 VDD
11
Reset at approx 0.9 VDD.
b4, b3
VDD RSTD[1] VDD RSTD[0] - Select the RST pin low lev duration, after VDD rises above the VDD undervoltage threshold
00
1.0 ms
01
5.0 ms
10
10 ms
11
20 ms
b2
[VAUX 5/3] - Select Vauxilary output voltage
0
VAUX = 3.3 V
34903/4/5
64
Analog Integrated Circuit Device Data
Freescale Semiconductor
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
Bit
Description
1
VAUX = 5.0 V
b1, b0
Cyclic on[1] Cyclic on[0] - Determine I/O-0 activation time, when cyclic sense function is selected
00
200 μs (typical value. Ref. to dynamic parameters for exact value)
01
400 μs (typical value. Ref. to dynamic parameters for exact value)
10
800 μs (typical value. Ref. to dynamic parameters for exact value)
11
1600 μs (typical value. Ref. to dynamic parameters for exact value)
Table 18. Initialization Watchdog Registers, INIT watchdog (note: register can be written only in INIT mode)
MOSI First Byte [15-8]
[b_15 b_14] 0_0110 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 00 _ 110 P
WD2INT
MCU_OC
OC-TIM
WD Safe
WD_spi[1]
WD_spi[0]
WD N/Win
Crank
Default state
0
1
0
0
0
1
0
Condition for default
POR
Bit
Description
b7
WD2INT - Select the maximum time delay between INT occurrence and INT source read SPI command
0
Function disable. No constraint between INT occurrence and INT source read.
1
INT source read must occur before the remaining of the current watchdog period plus 2 complete watchdog periods.
b6, b5
MCU_OC, OC-TIM - In LP VDD ON, select watchdog refresh and VDD current monitoring functionality. VDD_OC_LP threshold is defined in device
electrical parameters (approx 1.5 mA)
In LP mode, when watchdog is not selected
no watchdog
+ 00
In LP VDD ON mode, VDD overcurrent has no effect
no watchdog
+ 01
In LP VDD ON mode, VDD overcurrent has no effect
no watchdog
+ 10
In LP VDD ON mode, VDD current > VDD_OC_LP threshold for a time > 100 μs (typically) is a wake-up event
no watchdog In LP VDD ON mode, VDD current > VDD_OC_LP threshold for a time > I_mcu_OC is a wake-up event. I_mcu_OC time is selected in Timer register
+ 11
(selection range from 3.0 to 32 ms)
In LP mode when watchdog is selected
watchdog +
00
In LP VDD ON mode, VDD current > VDD_OC_LP threshold has no effect. watchdog refresh must occur by SPI command.
watchdog +
01
In LP VDD ON mode, VDD current > VDD_OC_LP threshold has no effect. watchdog refresh must occur by SPI command.
watchdog +
10
In LP VDD ON mode, VDD overcurrent for a time > 100 μs (typically) is a wake-up event.
watchdog +
11
In LP VDD ON mode, VDD current > VDD_OC_LP threshold for a time < I_mcu_OC is a watchdog refresh condition. VDD current > VDD_OC_LP
threshold for a time > I_mcu_OC is a wake-up event. I_mcu_OC time is selected in Timer register (selection range from 3.0 to 32 ms)
b4
WD Safe - Select the activation of the SAFE pin low, at first or second consecutive RESET pulse
0
SAFE pin is set low at the time of the RST pin low activation
1
SAFE pin is set low at the second consecutive time RST pulse
b3, b2
WD_spi[1] WD_spi[0] - Select the Watchdog (watchdog) Operation
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
65
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
Bit
Description
00
Simple Watchdog selection: watchdog refresh done by a 8 bits or 16 bits SPI
01
Enhanced 1: Refresh is done using the Random Code, and by a single 16 bits.
10
Enhanced 2: Refresh is done using the Random Code, and by two 16 bits command.
11
Enhanced 4: Refresh is done using the Random Code, and by four 16 bits command.
b1
WD N/Win - Select the Watchdog (watchdog) Window or Timeout operation
0
Watchdog operation is TIMEOUT, watchdog refresh can occur anytime in the period
1
Watchdog operation is WINDOW, watchdog refresh must occur in the open window (second half of period)
b0
Crank - Select the VSUP/1 threshold to disable VDD, while VSUP1 is falling toward GND
0
VDD disable when VSUP/1 is below typically 4.0 V (parameter VSUP-TH1), and device in Reset mode
1
VDD kept ON when VSUP/1 is below typically 4.0 V (parameter VSUP_TH1)
Table 19. Initialization LIN and I/O Registers, INIT LIN I/O (note: register can be written only in INIT mode)
MOSI First Byte [15-8]
[b_15 b_14] 0_0111 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 00 _ 111 P
I/O-1 ovoff
LIN_T2[1]
LIN_T2[0]
LIN_T/1[1]
LIN_T/1[0]
I/O-1 out-en
I/O-0 out-en
Cyc_Inv
Default state
0
0
0
0
0
0
0
Condition for default
POR
Bit
Description
b7
I/O-1 ovoff - Select the deactivation of I/O-1 when VDD or VAUX overvoltage condition is detected
0
Disable I/O-1 turn off.
1
Enable I/O-1 turn off, when VDD or VAUX overvoltage condition is detected.
b6, b5
LIN_T2[1], LIN_T2[0] - Select pin operation for I/O
00
pin is OFF
01
Reserved configuration. Do not use
10
pin operation as I/O: HS switch and Wake-up input
11
N/A
b4, b3
LIN_T/1[1], LIN_T/1[0] - Select pin operation as LIN Master pin switch or I/O
00
pin is OFF
01
pin operation as LIN Master pin switch
10
pin operation as I/O: HS switch and Wake-up input
11
N/A
b2
I/O-1 out-en- Select the operation of the I/O-1 as output driver (HS, LS)
0
Disable HS and LS drivers of pin I/O-1. I/O-1 can only be used as input.
1
Enable HS and LS drivers of pin I/O-1. Pin can be used as input and output driver.
b1
I/O-0 out-en - Select the operation of the I/O-0 as output driver (HS, LS)
34903/4/5
66
Analog Integrated Circuit Device Data
Freescale Semiconductor
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
Bit
Description
0
Disable HS and LS drivers of I/O-0 can only be used as input.
1
Enable HS and LS drivers of the I/O-0 pin. Pin can be used as input and output drivers.
b0
Cyc_Inv - Select I/O-0 operation in device LP mode, when cyclic sense is selected
0
During cyclic sense active time, I/O is set to the same state prior to entering in to LP mode. During cyclic sense off time, I/O-0 is disable (HS and
LS drivers OFF).
1
During cyclic sense active time, I/O is set to the same state prior to entering in to LP mode. During cyclic sense off time, the opposite driver of I/
O_0 is actively set. Example: If I/0_0 HS is ON during active time, then I/O_O LS is turned ON at expiration of the active time, for the duration of
the cyclic sense period.
Table 20. Initialization Miscellaneous Functions, INIT MISC (Note: Register can be written only in INIT mode)
MOSI First Byte [15-8]
[b_15 b_14] 0_1000 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 01_ 000 P
LPM w RNDM
SPI parity
INT pulse
INT width
INT flash
Dbg Res[2]
Dbg Res[1]
Dbg Res[0]
Default state
0
0
0
0
0
0
0
Condition for default
POR
Bit
Description
b7
LPM w RNDM - This enables the usage of random bits 2, 1 and 0 of the MODE register to enter into LP VDD OFF or LP VDD ON.
0
Function disable: the LP mode can be entered without usage of Random Code
1
Function enabled: the LP mode is entered using the Random Code
b6
SPI parity - Select usage of the parity bit in SPI write operation
0
Function disable: the parity is not used. The parity bit must always set to logic 0.
1
Function enable: the parity is used, and parity must be calculated.
b5
INT pulse -Select INT pin operation: low level pulse or low level
0
INT pin will assert a low level pulse, duration selected by bit [b4]
1
INT pin assert a permanent low level (no pulse)
b4
INT width - Select the INT pulse duration
0
INT pulse duration is typically 100 μs. Ref. to dynamic parameter table for exact value.
1
INT pulse duration is typically 25 μs. Ref. to dynamic parameter table for exact value.
b3
INT flash - Select INT pulse generation at 50% of the Watchdog Period in Flash mode
Function disable
Function enable: an INT pulse will occur at 50% of the Watchdog Period when device in Flash mode.
b2, b1, b0
Dbg Res[2], Dbg Res[1], Dbg Res[0] - Allow verification of the external resistor connected at DBG pin. Ref. to parametric table for resistor range
value.(33)
0xx
Function disable
100
100 verification enable: resistor at DBG pin is typically 68 kohm (RB3) - Selection of SAFE mode B3
101
101 verification enable: resistor at DBG pin is typically 33 kohm (RB2 - Selection of SAFE mode B2
110
110 verification enable: resistor at DBG pin is typically 15 kohm (RB1) - Selection of SAFE mode B1
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
67
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
Bit
Description
111
111 verification enable: resistor at DBG pin is typically 0 kohm (RA) - Selection of SAFE mode A
Notes
33. Bits b2,1 and 0 allow the following operation:
First, check the resistor device has detected at the DEBUG pin. If the resistor is different, bit 5 (Debug resistor) is set in INTerrupt
register (Ref. to device flag table).
Second, over write the resistor decoded by device, to set the SAFE mode operation by SPI. Once this function is selected by bit 2 = 1,
this selection has higher priority than “hardware”, and device will behave according to b2,b1 and b0 setting
SPECIFIC MODE REGISTER
Table 21. Specific Mode Register, SPE_MODE
MOSI First Byte [15-8]
[b_15 b_14] 01_001 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 01_ 001 P
Sel_Mod[1]
Sel_Mod[0]
Rnd_C5b
Rnd_C4b
Rnd_C3b
Rnd_C2b
Rnd_C1b
Rnd_C0b
Default state
0
0
0
0
0
0
0
Condition for default
POR
Bit
Description
b7, b6
Sel_Mod[1], Sel_Mod[0] - Mode selection: these 2 bits are used to select which mode the device will enter upon a SPI command.
00
RESET mode
01
INIT mode
10
FLASH mode
11
N/A
b5....b0
[Rnd_C4b... Rnd_C0b] - Random Code inverted, these six bits are the inverted bits obtained from the SPE MODE Register read command.
The SPE MODE Register is used for the Following
Operation
- Set the device in RESET mode, to exercise or test the
RESET functions.
- Go to INIT mode, using the Secure SPi command.
- Go to FLASH mode (in this mode the watchdog timer can
be extended up to 32 s).
- Activate the SAFE pin by S/W.
This mode (called Special mode) is accessible from the
secured SPI command, which consist of 2 commands:
1) reading a random code and
2) then write the inverted random code plus mode
selection or SAFE pin activation:
Return to INIT mode is done as follow (this is done from
Normal mode only):
1) Read random code:
MOSI : 0001 0011 0000 0000 [Hex:0x 13 00]
MISO report 16 bits, random code are bits (5-0)
miso = xxxx xxxx xxR5 R4 R3 R2 R1 R0 (RXD = 6 bits
random code)
2) Write INIT mode + random code inverted
MOSI : 0101 0010 01 Ri5 Ri4 Ri3 Ri2 Ri1 Ri0 [Hex 0x 52
HH] (RIX = random code inverted)
MISO : xxxx xxxx xxxx xxxx (don’t care)
SAFE pin activation: SAFE pin can be set low, only in INIT
mode, with following commands:
1) Read random code:
MOSI : 0001 0011 0000 0000 [Hex:0x 13 00]
MISO report 16 bits, random code are bits (5-0)
miso = xxxx xxxx xxR5 R4 R3 R2 R1 R0 (RXD = 6 bits
random code)
2) Write INIT mode + random code bits 5:4 not inverted
and random code bits 3:0 inverted
MOSI : 0101 0010 01 R5 R4 Ri3 Ri2 Ri1 Ri0 [Hex 0x 52
HH] (RIX = random code inverted)
MISO : xxxx xxxx xxxx xxxx (don’t care)
Return to Reset or Flash mode is done similarly to the go
to INIT mode, except that the b7 and b6 are set according to
the table above (b7, b6 = 00 - go to reset, b7, b6 = 10 - go to
Flash).
34903/4/5
68
Analog Integrated Circuit Device Data
Freescale Semiconductor
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
TIMER REGISTERS
Table 22. Timer Register A, LP VDD Overcurrent & Watchdog Period Normal mode, TIM_A
MOSI Second Byte, bits 7-0
MOSI First Byte [15-8]
[b_15 b_14] 01_010 [P/N]
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 01_ 010 P
I_mcu[2]
I_mcu[1]
I_mcu[1]
watchdog
Nor[4]
W/D_N[4]
W/D_Nor[3]
W/D_N[2]
W/D_Nor[0]
Default state
0
0
0
1
1
1
1
0
Condition for default
POR
LP VDD Overcurrent (ms)
b6, b5
b7
00
01
10
11
0
3 (def)
6
12
24
1
4
8
16
32
Watchdog Period in Device Normal Mode (ms)
b2, b1, b0
b4, b3
000
001
010
011
100
101
110
111
00
2.5
5
10
20
40
80
160
320
01
3
6
12
24
48
96
192
384
10
3.5
7
14
28
56
112
224
448
11
4
8
16
32
64
128
256 (def)
512
Table 23. Timer Register B, Cyclic Sense and Cyclic INT, in Device LP Mode, TIM_B
MOSI First Byte [15-8]
[b_15 b_14] 01_011 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 01_ 011 P
Cyc-sen[3]
Cyc-sen[2]
Cyc-sen[1]
Cyc-sen[0]
Cyc-int[3]
Cyc-int[2]
Cyc-int[1]
Cyc-int[0]
Default state
0
0
0
0
0
0
0
0
Condition for default
POR
Cyclic Sense (ms)
b6, b5, b4
b7
000
001
010
011
100
101
110
111
0
3
6
12
24
48
96
192
384
1
4
8
16
32
64
128
256
512
Cyclic Interrupt (ms)
b2, b1, b0
b3
000
001
010
011
100
101
110
111
0
6 (def)
12
24
48
96
192
384
768
1
8
16
32
64
128
258
512
1024
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
69
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
Table 24. Timer Register C, Watchdog LP Mode or Flash Mode and Forced Wake-up Timer, TIM_C
MOSI First Byte [15-8]
[b_15 b_14] 01_100 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 01_ 100 P
WD-LP-F[3]
WD-LP-F[2]
WD-LP-F[1]
WD-LP-F[0]
FWU[3]
FWU[2]
FWU[1]
FWU[0]
Default state
0
0
0
0
0
0
0
0
Condition for default
POR
Table 25. Typical Timing Values
Watchdog in LP VDD ON Mode (ms)
b6, b5, b4
b7
000
001
010
011
100
101
110
111
0
12
24
48
96
192
384
768
1536
1
16
32
64
128
256
512
1024
2048
Watchdog in Flash Mode (ms)
b6, b5, b4
b7
000
001
010
011
100
101
110
111
0
48 (def)
96
192
384
768
1536
3072
6144
1
256
512
1024
2048
4096
8192
16384
32768
Forced Wake-up (ms)
b2, b1, b0
b3
000
001
010
011
100
101
110
111
0
48 (def)
96
192
384
768
1536
3072
6144
1
64
128
258
512
1024
2048
4096
8192
WATCHDOG AND MODE REGISTERS
Table 26. Watchdog Refresh Register, watchdog(34)
MOSI First Byte [15-8]
[b_15 b_14] 01_101 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 01_ 101 P
0
0
0
0
0
0
0
0
Default state
0
0
0
0
0
0
0
0
Condition for default
POR
Notes
34. The Simple Watchdog Refresh command is in hexadecimal: 5A00. This command is used to refresh the watchdog and also to
transition from INIT mode to Normal mode, and from Normal Request mode to Normal mode (after a wake-up of a reset)
.
Table 27. MODE Register, MODE
MOSI First Byte [15-8]
[b_15 b_14] 01_110 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 01_ 110 P
mode[4]
mode[3]
mode[2]
mode[1]
mode[0]
Rnd_b[2]
Rnd_b[1]
Rnd_b[0]
Default state
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
34903/4/5
70
Analog Integrated Circuit Device Data
Freescale Semiconductor
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
Table 28. LP VDD OFF Selection and FWU / Cyclic Sense Selection
b7, b6, b5, b4, b3
FWU
Cyclic Sense
0 1100
OFF
OFF
0 1101
OFF
ON
0 1110
ON
OFF
0 1111
ON
ON
Table 29. LP VDD ON Selection and Operation Mode
b7, b6, b5, b4, b3
FWU
Cyclic Sense
Cyclic INT
Watchdog
1 0000
OFF
OFF
OFF
OFF
1 0001
OFF
OFF
OFF
ON
1 0010
OFF
OFF
ON
OFF
1 0011
OFF
OFF
ON
ON
1 0100
OFF
ON
OFF
OFF
1 0101
OFF
ON
OFF
ON
1 0110
OFF
ON
ON
OFF
1 0111
OFF
ON
ON
ON
1 1000
ON
OFF
OFF
OFF
1 1001
ON
OFF
OFF
ON
1 1010
ON
OFF
ON
OFF
1 1011
ON
OFF
ON
ON
1 1100
ON
ON
OFF
OFF
1 1101
ON
ON
OFF
ON
1 1110
ON
ON
ON
OFF
1 1111
ON
ON
ON
ON
b2, b1, b0
Random Code inverted, these 3bits are the inverted bits obtained from the previous SPI command.
The usage of these bits are optional and must be previously selected in the INIT MISC register [See
bit 7 (LPM w RNDM) in Table 20]
Prior to enter in LP VDD ON or LP VDD OFF, the Wake-up
flags must be cleared or read.
This is done by the following SPI commands (See Table
38, Device Flag, I/O Real Time and Device Identification):
0xE100 for CAN Wake-up clear
0xE380 for I/O Wake-up clear
0xE700 for LIN1 Wake-up clear
If Wake-up flags are not cleared, the device will enter into
the selected LP mode and immediately Wake-up. In addition,
the CAN failure flags (i.e. CAN_F and CAN_UF) must be
cleared in order to meet the low power current consumption
specification. This is done by the following SPI command:
0xE180 (read CAN failure flags)
When the device is in LP VDD ON mode, the Wake-up by
a SPI command uses a write to “Normal Request mode”,
0x5C10.
Mode Register Features
The mode register includes specific functions and a “global
SPI command” that allow the following:
- read device current mode
- read device Debug status
- read state of SAFE pin
- leave Debug state
- release or turn off SAFE pin
- read a 3 bit Random Code to enter in LP mode
These global commands are built using the MODE register
address bit [13-9], along with several combinations of bit [1514] and bit [7]. Note, bit [8] is always set to 1.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
71
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
Entering into LP Mode Using Random Code
1. in hex: 0x5C60 to enter in LP VDD OFF mode without
using the 3 random code bits.
- LP mode using Random Code must be selected in INIT
mode via bit 7 of the INIT MISC register.
- In Normal mode, read the Random Code using 0x1D00 or
0x1D80 command. The 3 Random Code bits are available on
MISO bits 2,1 and 0.
- Write LP mode by inverting the 3 random bits.
Example - Select LP VDD OFF without cyclic sense and
FWU:
2. if Random Code is selected, the commands are:
- Read Random Code: 0x1D00 or 0x1D80,
MISO report in binary: bits 15-8, bits 7-3, Rnd_[2], Rnd_[1],
Rnd_[0].
- Write LP VDD OFF mode, using Random Code inverted:
in binary: 0101 1100 0110 0 Rnd_b[2], Rnd_b[1], Rnd_b[0].
Table 30 summarizes these commands
Table 30. Device Modes
Global commands and effects
Read device current mode, Leave debug mode.
Keep SAFE pin as is.
MOSI in hexadecimal: 1D 00
MOSI
bits 15-14
bits 13-9
bit 8
bit 7
bits 6-0
00
01 110
1
0
000 0000
MISO
MOSI
Read device current mode
Release SAFE pin (turn OFF).
MOSI in hexadecimal: 1D 80
Read device current mode, Keep DEBUG mode
Release SAFE pin (turn OFF).
MOSI in hexadecimal: DD 80
MISO reports Debug and SAFE state (bits 1,0)
MOSI
bit 2-0
Fix Status
device current mode
Random code
bits 13-9
bit 8
bit 7
bits 6-0
00
01 110
1
1
000 0000
bit 15-8
bit 7-3
bit 2-0
Fix Status
device current mode
Random code
bits 15-14
bits 13-9
bit 8
bit 7
bits 6-0
11
01 110
1
0
000 0000
MISO
MOSI
bit 7-3
bits 15-14
MISO
Read device current mode, Leave debug mode.
Keep SAFE pin as is.
MOSI in hexadecimal: DD 00
MISO reports Debug and SAFE state (bits 1,0)
bit 15-8
bit 15-8
bit 7-3
bit 2
bit 1
bit 0
Fix Status
device current mode
X
SAFE
DEBUG
bits 15-14
bits 13-9
bit 8
bit 7
bits 6-0
11
01 110
1
1
000 0000
MISO
Table 31 describes MISO bits 7-0, used to decode the
device’s current mode.
bit 15-8
bit 7-3
bit 2
bit 1
bit 0
Fix Status
device current mode
X
SAFE
DEBUG
Table 32. SAFE and DEBUG status
SAFE and DEBUG bits
Table 31. MISO bits 7-3
b1
description
0
SAFE pin OFF, not activated
1
SAFE pin ON, driver activated.
b0
description
Device current mode, any of the above commands
b7, b6, b5, b4, b3
MODE
0 0000
INIT
0 0001
FLASH
0 0010
Normal Request
0 0011
Normal mode
1 XXXX
Low Power mode (Table 29)
0
Debug mode OFF
1
Debug mode Active
Table 32 describes the SAFE and DEBUG bit decoding.
34903/4/5
72
Analog Integrated Circuit Device Data
Freescale Semiconductor
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
REGULATOR, CAN, I/O, INT AND LIN REGISTERS
Table 33. Regulator Register
MOSI First Byte [15-8]
[b_15 b_14] 01_111 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 01_ 111 P
VAUX[1]
VAUX[0]
-
5V-can[1]
5V-can[0]
VDD bal en
VDD bal auto
VDD OFF en
Default state
0
0
N/A
0
0
N/A
N/A
N/A
Condition for default
POR
Bits
b7 b6
POR
Description
VAUX[1], VAUX[0] - Vauxilary regulator control
00
Regulator OFF
01
Regulator ON. Undervoltage (UV) and Overcurrent (OC) monitoring flags not reported. VAUX is disabled when UV or OC
detected after 1.0 ms blanking time.
10
Regulator ON. Undervoltage (UV) and overcurrent (OC) monitoring flags active. VAUX is disabled when UV or OC detected after
1.0 ms blanking time.
11
Regulator ON. Undervoltage (UV) and overcurrent (OC) monitoring flags active. VAUX is disabled when UV or OC detected after
25 μs blanking time.
b4 b3
5 V-can[1], 5 V-can[0] - 5V-CAN regulator control
00
Regulator OFF
01
Regulator ON. Thermal protection active. Undervoltage (UV) and overcurrent (OC) monitoring flags not reported. 1.0 ms
blanking time for UV and OC detection. Note: by default when in Debug mode
10
Regulator ON. Thermal protection active. Undervoltage (UV) and overcurrent (OC) monitoring flags active. 1.0 ms blanking time
for UV and OC detection.
11
Regulator ON. Thermal protection active. Undervoltage (UV) and overcurrent (OC) monitoring flags active after 25 μs blanking
time.
b2
VDD bal en - Control bit to Enable the VDD external ballast transistor
0
External VDD ballast disable
1
External VDD ballast Enable
b1
VDD bal auto - Control bit to automatically Enable the VDD external ballast transistor, if VDD is > typically 60 mA
0
Disable the automatic activation of the external ballast
1
Enable the automatic activation of the external ballast, if VDD > typically 60 mA
b0
VDD OFF en - Control bit to allow transition into LP VDD OFF mode (to prevent VDD turn OFF)
0
Disable Usage of LP VDD OFF mode
1
Enable Usage of LP VDD OFF mode
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
73
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
Table 34. CAN Register(35)
MOSI First byte [15-8]
[b_15 b_14] 10_000 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 10_ 000P
CAN mod[1]
CAN mod[0]
Slew[1]
Slew[0]
Wake-up 1/3
-
-
CAN int
Default state
1
0
0
0
0
-
-
0
Condition for default
note
POR
Bits
b7 b6
POR
POR
Description
CAN mod[1], CAN mod[0] - CAN interface mode control, Wake-up enable / disable
00
CAN interface in Sleep mode, CAN Wake-up disable.
01
CAN interface in receive only mode, CAN driver disable.
10
CAN interface is in Sleep mode, CAN Wake-up enable. In device LP mode,
CAN Wake-up is reported by device Wake-up. In device Normal mode, CAN Wake-up reported by INT.
11
CAN interface in transmit and receive mode.
b5 b4
Slew[1] Slew[0] - CAN driver slew rate selection
00/11
FAST
01
MEDIUM
10
SLOW
b3
Wake-up 1/3 - Selection of CAN Wake-up mechanism
0
3 dominant pulses Wake-up mechanism
1
Single dominant pulse Wake-up mechanism
b0
CAN INT - Select the CAN failure detection reporting
0
Select INT generation when a bus failure is fully identified and decoded (i.e. after 5 dominant pulses on TxCAN)
1
Select INT generation as soon as a bus failure is detected, event if not fully identified
Notes
35. The first time the device is set to Normal mode, the CAN is in Sleep Wake-up enabled (bit7 = 1, bit 6 =0). The next time the device is
set in Normal mode, the CAN state is controlled by bits 7 and 6.
34903/4/5
74
Analog Integrated Circuit Device Data
Freescale Semiconductor
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
Table 35. I/O Register
MOSI First byte [15-8]
[b_15 b_14] 10_001 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 10_ 001P
I/O-3 [1]
I/O-3 [0]
I/O-2 [1]
I/O-2 [0]
I/O-1 [1]
I/O-1 [0]
I/O-0 [1]
I/O-0 [0]
Default state
0
0
0
0
0
0
0
0
Condition for default
Bits
b7 b6
Description
I/O-3 [1], I/O-3 [0] - I/O-3 pin operation
00
I/O-3 driver disable, Wake-up capability disable
01
I/O-3 driver disable, Wake-up capability enable.
10
I/O-3 HS driver enable.
11
I/O-3 HS driver enable.
b5 b4
I/O-2 [1], I/O-2 [0] - I/O-2 pin operation
00
I/O-2 driver disable, Wake-up capability disable
01
I/O-2 driver disable, Wake-up capability enable.
10
I/O-2 HS driver enable.
11
I/O-2 HS driver enable.
b3 b2
I/O-1 [1], I/O-1 [0] - I/O-1 pin operation
00
I/O-1 driver disable, Wake-up capability disable
01
I/O-1 driver disable, Wake-up capability enable.
10
I/O-1 LS driver enable.
11
I/O-1 HS driver enable.
b1 b0
POR
I/O-0 [1], I/O-0 [0] - I/O-0 pin operation
00
I/O-0 driver disable, Wake-up capability disable
01
I/O-0 driver disable, Wake-up capability enable.
10
I/O-0 LS driver enable.
11
I/O-0 HS driver enable.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
75
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
Table 36. INT Register
MOSI First byte [15-8]
[b_15 b_14] 10_010 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 10_ 010P
CAN failure
MCU req
0
LIN1fail
I/O
SAFE
-
Vmon
Default state
0
0
0
0
0
0
0
0
Condition for default
POR
Bits
Description
b7
CAN failure - control bit for CAN failure INT (CANH/L to GND, VDD or VSUP, CAN overcurrent, Driver Overtemp, TXD-PD,
RXD-PR, RX2HIGH, and CANBUS Dominate clamp)
0
INT disable
1
INT enable.
b6
MCU req - Control bit to request an INT. INT will occur once when the bit is enable
0
INT disable
1
INT enable.
b4
LIN/1 fail - Control bit to enable INT when of failure on LIN1 interface
0
INT disable
1
INT enable.
b3
I/O - Bit to control I/O interruption: I/O failure
0
INT disable
1
INT enable.
b2
SAFE - Bit to enable INT when of: Vaux overvoltage, VDD overvoltage, VDD Temp pre-warning, VDD undervoltage(36), SAFE
resistor mismatch, RST terminal short to VDD, MCU request INT.(37)
0
INT disable
1
INT enable.
b0
VMON - enable interruption by voltage monitoring of one of the voltage regulator: VAUX, 5 V-CAN, VDD (IDD Overcurrent, VSUV,
VSOV, VSENSELOW, 5V-CAN low or thermal shutdown, VAUX low or VAUX overcurrent
0
INT disable
1
INT enable.
Notes
36. If VDD undervoltage is set to 70% of VDD, see bits b6 and b5 in Table 15 on page 64.
37. Bit 2 is used in conjunction with bit 6. Both bit 6 and bit 2 must be set to 1 to activate the MCU INT request.
34903/4/5
76
Analog Integrated Circuit Device Data
Freescale Semiconductor
SERIAL PERIPHERAL INTERFACE
DETAIL OF CONTROL BITS AND REGISTER MAPPING
Table 37. LIN/1 Register(39)
MOSI First byte [15-8]
[b_15 b_14] 10_010 [P/N]
MOSI Second Byte, bits 7-0
bit 7
bit 6
bit 5
bit 4
bit 3
bit 2
bit 1
bit 0
01 10_ 011P
LIN mode[1]
LIN mode[0]
Slew rate[1]
Slew rate[0]
-
LIN T/1 on
-
VSUP ext
Default state
0
0
0
0
0
0
0
0
Condition for default
Bits
b7 b6
Description
LIN mode [1], LIN mode [0] - LIN/1 interface mode control, Wake-up enable / disable
00
LIN/1 disable, Wake-up capability disable
01
not used
10
LIN/1 disable, Wake-up capability enable
11
LIN/1 Transmit Receive mode(38)
b5 b4
Slew rate[1], Slew rate[0] LIN/1 slew rate selection
00
Slew rate for 20 kbit/s baud rate
01
Slew rate for 10 kbit/s baud rate
10
Slew rate for fast baud rate
11
Slew rate for fast baud rate
b2
LIN T/1 on
0
LIN/1 termination OFF
1
LIN/1 termination ON
b0
POR
VSUP ext
0
LIN goes recessive when device VSUP/2 is below typically 6.0 V. This is to meet J2602 specification
1
LIN continues operation below VSUP/2 6.0 V, until 5 V-CAN is disabled.
Notes
38. The LIN interface can be set in TXD/RXD mode only when the TXD-L input signal is in recessive state. An attempt to set TXD/RXD
mode, while TXD-L is low, will be ignored and the LIN interface remains disabled.
39. In order to use the LIN interface, the 5V-CAN regulator must be set to ON.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
77
SERIAL PERIPHERAL INTERFACE
FLAGS AND DEVICE STATUS
FLAGS AND DEVICE STATUS
DESCRIPTION
• - [0 0] for I/O real time status, device identification and
CAN LIN driver receiver real time state.
• bit 13 to 9 are the register address from which the flags is
to be read.
• bit 8 = 1 (this is not parity bit function, as this is a read
command).
When a failure event occurs, the respective flag is set and
remains latched until it is cleared by a read command
(provided the failure event has recovered).
The table below is a summary of the device flags, I/O real
time level, device Identification, and includes examples of
SPI commands (SPI commands do not use parity functions).
They are obtained using the following commands.
This command is composed of the following:
bits 15 and 14:
• [1 1] for failure flags
Table 38. Device Flag, I/O Real Time and Device Identification
Bits
15-14
13-9
8
7
6
5
4
3
2
1
0
bit 1
bit 0
IDD-OCNORMAL
MODE
MOSI bits 15-7
MOSI
MISO
REG
bits [15,
14]
Address
[13-9]
bit 8
MISO bits [7-0], device response on MISO pin
8 Bits Device Fixed Status
(bits 15...8)
11
0_1111
REG
1
11
Next 7 MOSI bits (bits 6.0) should be “000_0000”
bit
7
0
1
bit 7
bit 6
VAUX_LOW
-
bit 5
bit 4
bit 3
bit 2
VAUX_overCUR
5V-CAN_
RENT
THERMAL
SHUTDOWN
5V-CAN_
5V-CAN_
VSENSE_
VSUP_
UV
overCURRENT
LOW
underVOLTAGE
-
-
RST_LOW
(2.0 ms
SPI Wake-up
FWU
VSUP/2-UV
VSUP/1-OV I/O_O thermal
watchdog
flash mode
50%
INT service LP VDD OFF Reset request Hardware
Timeout
Leave Debug
Hexa SPI commands to get I/O Flags and I/O Wake-up: MOSI 0x E3 00, and MOSI 0x E3 80
00
1_0001
I/O
1
1
I/O_3
state
I/O_2
state
I/O_1 state
I/O_0 state
Hexa SPI commands to get I/O real time level: MOSI 0x 23 80
SAFE
11
1_0010
SAFE
1
0
INT request
RST high
DBG resistor
VDD temp
Pre-warning
VDD UV
1
-
-
-
VDD low
>100 ms
VDD low RST
VDD
VAUX_overVOL
Overvoltage
TAGE
RST low
>100 ms
-
multiple
Resets
watchdog
refresh
failure
id1
id0
Hexa SPI commands to get INT and RST Flags: MOSI 0x E5 00, and MOSI 0x E5 80
00
1_0010
SAFE
1
1
VDD (5.0 V or
3.3 V)
device
p/n 1
device
p/n 0
id4
id3
id2
Hexa SPI commands to get device Identification: MOSI 0x 2580
example: MISO bit [7-0] = 1011 0100: MC34904, 5.0 V version, silicon Rev. C (Pass 3.3)
34903/4/5
78
Analog Integrated Circuit Device Data
Freescale Semiconductor
SERIAL PERIPHERAL INTERFACE
FLAGS AND DEVICE STATUS
Table 38. Device Flag, I/O Real Time and Device Identification (continued)
LIN/1
11
1_0011
LIN 1
1
0
-
LIN1
Wake-up
LIN1 Term
short to GND
LIN 1
Overtemp
RXD1 low
RXD1 high
TXD1 dom
LIN1 bus
dom clamp
-
-
-
Hexa SPI commands to get LIN 2 Flags: MOSI 0x E7 00
00
1_0011
LIN 1
1
1
LIN1 State
LIN1 WU
en/dis
-
-
-
Hexa SPI commands to get LIN1 real time status: MOSI 0x 27 80
Notes
40. Not available on “C” versions
Table 39. Flag Descriptions
Flag
Description
REG
VAUX_LOW
Description
Reports that VAUX regulator output voltage is lower than the VAUX_UV threshold.
Set / Reset condition
Set: VAUX below threshold for t >100 μs typically. Reset: VAUX above threshold and flag read (SPI)
VAUX_overCUR
Description
Report that current out of VAUX regulator is above VAUX_OC threshold.
RENT
Set / Reset condition
Set: Current above threshold for t >100 μs. Reset: Current below threshold and flag read by SPI.
5 V-CAN_
Description
Report that the 5 V-CAN regulator has reached overtemperature threshold.
THERMAL
Set / Reset condition
Set: 5 V-CAN thermal sensor above threshold. Reset: thermal sensor below threshold and flag read
(SPI)
Description
Reports that 5 V-CAN regulator output voltage is lower than the 5 V-CAN UV threshold.
Set / Reset condition
Set: 5V-CAN below 5V-CAN UV for t >100 μs typically. Reset: 5V-CAN > threshold and flag read (SPI)
5V-can_
Description
Report that the CAN driver output current is above threshold.
overcurrent
Set / Reset condition
Set: 5V-CAN current above threshold for t>100 μs. Reset: 5V-CAN current below threshold and flag
read (SPI)
VSENSE_
Description
Reports that VSENSE pin is lower than the VSENSE LOW threshold.
LOW
Set / Reset condition
Set: VSENSE below threshold for t >100 μs typically. Reset: VSENSE above threshold and flag read
(SPI)
VSUP_
Description
Reports that VSUP/1 pin is lower than the VS1_LOW threshold.
underVOLTAGE
Set / Reset condition
Set: VSUP/1 below threshold for t >100 μs typically. Reset: VSUP/1 above threshold and flag read (SPI)
SHUTDOWN
5V-CAN_UV
IDD-OC-
Description
Report that current out of VDD pin is higher that IDD-OC threshold, while device is in Normal mode.
NORMAL MODE
Set / Reset condition
Set: current above threshold for t>100 μs typically. Reset; current below threshold and flag read (SPI)
VDD_
Description
Report that the VDD has reached overtemperature threshold, and was turned off.
THERMAL
Set / Reset condition
Set: VDD OFF due to thermal condition. Reset: VDD recover and flag read (SPI)
RST_LOW
Description
Report that the RST pin has detected a low level, shorter than 100 ms
(100 μs typically. Reset; current below threshold and flag read (SPI)
SHUTDOWN
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
79
SERIAL PERIPHERAL INTERFACE
FLAGS AND DEVICE STATUS
Table 39. Flag Descriptions
Flag
Description
CAN
CAN driver
state
Description
Report real time CAN bus driver state: 1 if Driver is enable, 0 if driver disable
Set / Reset condition
Set: CAN driver is enable. Reset: CAN driver is disable. Driver can be disable by SPI command (ex
CAN set in RXD only mode) or following a failure event (ex: TXD Dominant). Flag read SPI command
(0x2180) do not clear the flag, as it is “real time” information.
CAN receiver
state
Description
Report real time CAN bus receiver state: 1 if Enable, 0 if disable
Set / Reset condition
Set: CAN bus receiver is enable. Reset: CAN bus receiver is disable. Receiver disable by SPI
command (ex: CAN set in sleep mode). Flag read SPI command (0x2180) do not clear the flag, as it
is “real time” information.
CAN WU
enable
Description
Report real time CAN bus Wake-up receiver state: 1 if WU receiver is enable, 0 if disable
Set / Reset condition
Set: CAN Wake-up receiver is enable. Reset: CAN Wake-up receiver is disable. Wake-up receiver is
controlled by SPI, and is active by default after device Power ON. SPI command (0x2180) do not
change flag state.
CAN
Description
Report that Wake-up source is CAN
Wake-up
Set / Reset condition
Set: after CAN wake detected. Reset: Flag read (SPI)
CAN
Overtemp
Description
Report that the CAN interface has reach overtemperature threshold.
Set / Reset condition
Set: CAN thermal sensor above threshold. Reset: thermal sensor below threshold and flag read (SPI)
RXD low(41)
Description
Report that RXD pin is shorted to GND.
Set / Reset condition
Set: RXD low failure detected. Reset: failure recovered and flag read (SPI)
Description
Report that RXD pin is shorted to recessive voltage.
Set / Reset condition
Set: RXD high failure detected. Reset: failure recovered and flag read (SPI)
Description
Report that TXD pin is shorted to GND.
Rxd high
TXD dom
Set / Reset condition
Set: TXD low failure detected. Reset: failure recovered and flag read (SPI)
Bus Dom
clamp
Description
Report that the CAN bus is dominant for a time longer than tDOM
Set / Reset condition
Set: Bus dominant clamp failure detected. Reset: failure recovered and flag read (SPI)
CAN
Overcurrent
Description
Report that the CAN current is above CAN overcurrent threshold.
Set / Reset condition
Set: CAN current above threshold. Reset: current below threshold and flag read (SPI)
CAN_UF
Description
Report that the CAN failure detection has not yet identified the bus failure
Set / Reset condition
Set: bus failure pre detection. Reset: CAN bus failure recovered and flag read
Description
Report that the CAN failure detection has identified the bus failure
CAN_F
Set / Reset condition
Set: bus failure complete detetction.Reset: CAN bus failure recovered and flag read
CANL
Description
Report CAN L short to VBAT failure
to VBAT
Set / Reset condition
Set: failure detected. Reset failure recovered and flag read (SPI)
CANL to VDD
Description
Report CANL short to VDD
Set / Reset condition
Set: failure detected. Reset failure recovered and flag read (SPI)
CANL to GND Description
Report CAN L short to GND failure
Set / Reset condition
Set: failure detected. Reset failure recovered and flag read (SPI)
CANH
Description
Report CAN H short to VBAT failure
to VBAT
Set / Reset condition
Set: failure detected. Reset failure recovered and flag read (SPI)
CANH to VDD
Description
Report CANH short to VDD
Set / Reset condition
Set: failure detected. Reset failure recovered and flag read (SPI)
Description
Report CAN H short to GND failure
Set / Reset condition
Set: failure detected. Reset failure recovered and flag read (SPI)
CANH to
GND
Notes
41. Not available on “C” versions
34903/4/5
80
Analog Integrated Circuit Device Data
Freescale Semiconductor
SERIAL PERIPHERAL INTERFACE
FLAGS AND DEVICE STATUS
Table 39. Flag Descriptions
Flag
Description
I/O
HS3 short to
GND
Description
Report I/O-3 HS switch short to GND failure
Set / Reset condition
Set: failure detected. Reset failure recovered and flag read (SPI)
HS2 short to
GND
Description
Report I/O-2 HS switch short to GND failure
Set / Reset condition
Set: failure detected. Reset failure recovered and flag read (SPI)
SPI parity
error
Description
Report SPI parity error was detected.
Set / Reset condition
Set: failure detected. Reset: flag read (SPI)
CSB low
>2.0 ms
Description
Report SPI CSB was low for a time longer than typically 2.0 ms
Set / Reset condition
Set: failure detected. Reset: flag read (SPI)
Description
Report that VSUP/2 is below VS2_LOW threshold.
Set / Reset condition
Set VSUP/2 below VS2_LOW thresh. Reset VSUP/2 > VS2_LOW thresh and flag read (SPI)
Description
Report that VSUP/1 is above VS_HIGH threshold.
Set / Reset condition
Set VSUP/1 above VS_HIGH threshold. Reset VSUP/1 < VS_HIGH thresh and flag read (SPI)
Description
Report that the I/O-0 HS switch has reach overtemperature threshold.
Set / Reset condition
Set: I/O-0 HS switch thermal sensor above threshold. Reset: thermal sensor below threshold and flag
read (SPI)
Description
Report that the watchdog period has reach 50% of its value, while device is in Flash mode.
Set / Reset condition
Set: watchdog period > 50%. Reset: flag read
VSUP/2-UV
VSUP/1-OV
I/O-0 thermal
watchdog
flash mode
50%
I/O-1-3 Wake- Description
up
Set / Reset condition
Report that Wake-up source is I/O-1 or I/O-3
I/O-0-2 Wake- Description
up
Set / Reset condition
Report that Wake-up source is I/O-0 or I/O-2
SPI Wake-up
Description
Report that Wake-up source is SPI command, in LP VDD ON mode.
Set / Reset condition
Set: after SPI Wake-up detected. Reset: Flag read (SPI)
Description
Report that Wake-up source is forced Wake-up
FWU
Set: after I/O-1 or I/O-3 wake detected. Reset: Flag read (SPI)
Set: after I/O-0 or I/O-2 wake detected. Reset: Flag read (SPI)
Set / Reset condition
Set: after Forced Wake-up detected. Reset: Flag read (SPI)
INT service
Timeout
Description
Report that INT timeout error detected.
Set / Reset condition
Set: INT service timeout expired. Reset: flag read.
LP VDD OFF
Description
Report that LP VDD OFF mode was selected, prior Wake-up occurred.
Set / Reset condition
Set: LP VDD OFF selected. Reset: Flag read (SPI)
Description
Report that RST source is an request from a SPI command (go to RST mode).
Set / Reset condition
Set: After reset occurred due to SPI request. Reset: flag read (SPI)
Description
Report that the device left the Debug mode due to hardware cause (voltage at DBG pin lower than
typically 8.0 V).
Set / Reset condition
Set: device leave debug mode due to hardware cause. Reset: flag read.
Reset request
Hardware
Leave Debug
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
81
SERIAL PERIPHERAL INTERFACE
FLAGS AND DEVICE STATUS
Table 39. Flag Descriptions
Flag
Description
INT
INT request
RST high
DBG resistor
Description
Report that INT source is an INT request from a SPI command.
Set / Reset condition
Set: INT occurred. Reset: flag read (SPI)
Description
Report that RST pin is shorted to high voltage.
Set / Reset condition
Set: RST failure detection. Reset: flag read.
Description
Report that the resistor at DBG pin is different from expected (different from SPI register content).
Set / Reset condition
Set: failure detected. Reset: correct resistor and flag read (SPI).
VDD TEMP PRE- Description
Report that the VDD has reached overtemperature pre-warning threshold.
WARNING
Set / Reset condition
Set: VDD thermal sensor above threshold. Reset: VDD thermal sensor below threshold and flag read
(SPI)
VDD UV
Description
Reports that VDD pin is lower than the VDDUV threshold.
Set / Reset condition
Set: VDD below threshold for t >100 μs typically. Reset: VDD above threshold and flag read (SPI)
Description
Reports that VDD pin is higher than the typically VDD + 0.6 V threshold. I/O-1 can be turned OFF if
this function is selected in INIT register.
Set / Reset condition
Set: VDD above threshold for t >100 μs typically. Reset: VDD below threshold and flag read (SPI)
Description
Reports that VAUX pin is higher than the typically VAUX + 0.6 V threshold. I/O-1 can be turned OFF if
this function is selected in INIT register.
Set / Reset condition
Set: VAUX above threshold for t >100 μs typically. Reset: VAUX below threshold and flag read (SPI)
VDD LOW
>100 ms
Description
Reports that VDD pin is lower than the VDDUV threshold for a time longer than 100 ms
Set / Reset condition
Set: VDD below threshold for t >100 ms typically. Reset: VDD above threshold and flag read (SPI)
VDD LOW
Description
Report that VDD is below VDD undervoltage threshold.
Set / Reset condition
Set: VDD below threshold. Reset: fag read (SPI)
Description
0: mean 3.3 V VDD version
VDD
overVOLTAGE
VAUX_overVOL
TAGE
VDD (5.0 V or
3.3 V)
Device P/N1
and 0
1: mean 5.0 V VDD version
Set / Reset condition
N/A
Description
Describe the device part number:
00: MC34903
01: MC34904
10: MC34905S
11: MC343905D
Device id 4 to
0
Set / Reset condition
N/A
Description
Describe the silicon revision number
10010: silicon revision A (Pass 3.1)
10011: silicon revision B (Pass 3.2)
10100: silicon revision C (Pass 3.3)
Set / Reset condition
N/A
RST low
>100 ms
Description
Report that the RST pin has detected a low level, longer than 100 ms (Reset permanent low)
Set / Reset condition
Set: after detection of reset low pulse. Reset: Reset pulse terminated and flag read (SPI)
Multiple
Resets
Description
Report that the more than 8 consecutive reset pulses occurred, due to missing or wrong watchdog
refresh.
Set / Reset condition
Set: after detection of multiple reset pulses. Reset: flag read (SPI)
Description
Report that a wrong or missing watchdog failure occurred.
Set / Reset condition
Set: failure detected. reset: flag read (SPI)
watchdog
refresh failure
34903/4/5
82
Analog Integrated Circuit Device Data
Freescale Semiconductor
SERIAL PERIPHERAL INTERFACE
FLAGS AND DEVICE STATUS
Table 39. Flag Descriptions
Flag
Description
LIN/1/2
LIN/1 bus
dom clamp
Description
Report that the LIN/1 bus is dominant for a time longer than tDOM
Set / Reset condition
Set: Bus dominant clamp failure detected. Reset: failure recovered and flag read (SPI)
LIN/1 State
Description
Report real time LIN interface TXD/RXD mode. 1 if LIN is in TXD/RXD mode. 0 is LIN is not in TXD/
RXD mode.
Set / Reset condition
Set: LIN in TXD RXD mode. Reset: LIN not in TXD/RXD mode. LIN not in TXD/RXD mode by SPI
command (ex LIN set in Sleep mode) or following a failure event (ex: TxL Dominant). Flag read SPI
command (0x2780) do not clear it, as it is “real time” flag.
Description
Report real time LIN Wake-up receiver state. 1 if LIN Wake-up is enable, 0 if LIN Wake-up is disable
(means LIN signal will not be detected and will not Wake-up the device).
Set / Reset condition
Set: LIN WU enable (LIN interface set in Sleep mode Wake-up enable). Reset: LIN Wake-up disable
(LIN interface set in Sleep mode Wake-up disable). Flag read SPI command (0x2780) do not clear
the flag, as it is “real time” information.
LIN/1
Description
Report that Wake-up source is LIN/1
Wake-up
Set / Reset condition
Set: after LIN/1 wake detected. Reset: Flag read (SPI)
LIN/1 Term
short to GND
Description
Report LIN/1 short to GND failure
Set / Reset condition
Set: failure detected. Reset failure recovered and flag read (SPI)
LIN/1
Description
Report that the LIN/1 interface has reach overtemperature threshold.
Overtemp
Set / Reset condition
Set: LIN/1 thermal sensor above threshold. Reset: sensor below threshold and flag read (SPI)
RXD-L/1 low
Description
Report that RXD/1 pin is shorted to GND.
Set / Reset condition
Set: RXD low failure detected. Reset: failure recovered and flag read (SPI)
Description
Report that RXD/1 pin is shorted to recessive voltage.
Set / Reset condition
Set: RXD high failure detected. Reset: failure recovered and flag read (SPI)
Description
Report that TXD/1 pin is shorted to GND.
Set / Reset condition
Set: TXD low failure detected. Reset: failure recovered and flag read (SPI)
LIN/1 WU
RXD-L/1 high
TXD-L/1 dom
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
83
SERIAL PERIPHERAL INTERFACE
FLAGS AND DEVICE STATUS
FIX AND EXTENDED DEVICE STATUS
One Byte
Fix Status: when a device read operation is performed
(MOSI bits 15-14, bits C1 C0 = 00 or 11).
For every SPI command, the device response on MISO is
fixed status information. This information is either:
Two Bytes
Fix Status + Extended Status: when a device write
command is used (MOSI bits 15-14, bits C1 C0 = 01)
Table 40. Status Bits Description
Bits
15
14
13
12
11
10
MISO
INT
WU
RST
CAN-G
LIN-G
I/O-G
9
8
7
SAFE-G VREG-G CAN-BUS
Bits
6
5
4
3
CAN-LOC
0
LIN1
I/O-1
2
1
I/O-0 VREG-1
0
VREG-0
Description
INT
Indicates that an INT has occurred and that INT flags are pending to be read.
WU
Indicates that a Wake-up has occurred and that Wake-up flags are pending to be read.
RST
Indicates that a reset has occurred and that the flags that report the reset source are pending to be read.
CAN-G
The INT, WU, or RST source is CAN interface. CAN local or CAN bus source.
LIN-G
The INT, WU, or RST source is LIN1 interface
I/O-G
The INT, WU, or RST source is I/O interfaces.
SAFE-G
The INT, WU, or RST source is from a SAFE condition
VREG-G
The INT, WU, or RST source is from a Regulator event, or voltage monitoring event
CAN-LOC
The INT, WU, or RST source is CAN interface. CAN local source.
CAN-BUS
The INT, WU, or RST source is CAN interface. CAN bus source.
LIN/LIN1
The INT, WU, or RST source is LIN1 interface
I/O-0
The INT, WU, or RST source is I/O interface, flag from I/O sub adress Low (bit 7 = 0)
I/O-1
The INT, WU, or RST source is I/O interface, flag from I/O sub adress High (bit 7 = 1)
VREG-1
The INT, WU, or RST source is from a Regulator event, flag from REG register sub adress high (bit 7 = 1)
VREG-0
The INT, WU, or RST source is from a Regulator event, flag from REG register sub adress low (bit 7 = 0)
34903/4/5
84
Analog Integrated Circuit Device Data
Freescale Semiconductor
TYPICAL APPLICATIONS
FLAGS AND DEVICE STATUS
TYPICAL APPLICATIONS
5.0 V (3.3 V)
Q2
>2.2 μF
1.0 μF
22 k 100 nF
VSUP
VDD
5V-CAN
VSENSE
I/O-0
4.7 nF
INT
MUX
A/D
TXD
RXD
CANH
60
INT
I/O-3
4.7 k *
CAN
LIN1
RXD-L1
SPLIT
MCU
SPI
TXD-L1
60
VDD
RST
I/O-1
VSUP
>4.7 μF
RST
MOSI
SCLK
MISO
CS
100 nF
CAN BUS
Q1*
VB
VSUP1
DBG
CANL
LIN TERM1
VSUP1/2
1.0 k
LIN BUS 1
VE
RF module
Switch Detection Interface
eSwitch
Safing Micro Controller
CAN xcvr
1.0 k
option 1
option 2
LIN1
GND
SAFE
VSUP
VSUP
Safe Circuitry
Notes
42. Tested per specific OEM EMC requirements for CAN and LIN with additional
capacitor > 10 μF on VSUP1/VSUP2 pins
Figure 38. 34905S Typical Application Schematic
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
85
TYPICAL APPLICATIONS
FLAGS AND DEVICE STATUS
* Optional
5V (3.3 V)
Q2
RF module
Switch Detection Interface
eSwitch
Safing Micro Controller
CAN xcvr
>2.2 μF
1.0 μF
1.0 k
100nF
VSUP
22 k
VSUP2
VB
VSUP1
VDD
VDD
>4.7 μF
DBG
5V-CAN
VSENSE
RST
RST
INT
INT
MUX
A/D
MOSI
SCLK
MISO
CS
I/O-0
100 nF
I/O-1
VBAT
22 k
4.7 k *
MCU
SPI
TXD
RXD
I/O-2
VSUP
Q1*
100 nF
CAN
I/O-3
N/C
CANH
60
CAN BUS
60
SPLIT
4.7 nF
CANL
GND
SAFE
VSUP
VSUP
OR
function
Safe Circuitry
Notes
43. Tested per specific OEM EMC requirements for CAN and LIN with additional
capacitor > 10 μF on VSUP1/VSUP2 pins
Figure 39. 34904 Typical Application Schematic
34903/4/5
86
Analog Integrated Circuit Device Data
Freescale Semiconductor
TYPICAL APPLICATIONS
FLAGS AND DEVICE STATUS
VBAT
Q1*
D1
VSUP
22 μF
VSUP
100 nF
1.0 k
VBAT
22 k
VSUP
>1.0 μF
100 nF
100 nF
VE
5V-CAN
IO-0
4.7 nF
CAN BUS
SPLIT
INT
MUX
A/D
4.7 k (optional)
SPI
MCU
CAN
TXD-L
RXD-L
CANL
LIN
LIN-T
VSUP
1.0 k
LIN BUS
RST
TXD
RXD
60
VDD
INT
MOSI
SCLK
MISO
CS
CANH
>4.7 μF
RST
VSENSE
IO-3
60
VB
VDD
DBG
* = Optional
N/C
1.0 k
option2
option1
LIN
GND
SAFE
VSUP
VSUP
Safe Circuitry
Notes
44. Tested per specific OEM EMC requirements for CAN and LIN with additional
capacitor > 10 μF on VSUP pin
45. Leave N/C pins open.
Figure 40. 34903S Typical Application Schematic
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
87
TYPICAL APPLICATIONS
FLAGS AND DEVICE STATUS
VBAT
Q1*
D1
VSUP
22 μF
VBAT
VSUP
100 nF
>1.0 μF
1.0 k
22 k
100 nF
100 nF
VE
5V-CAN
IO-0
I/O-2
100 nF
VDD
RST
INT
INT
MUX
A/D
MOSI
SCLK
MISO
CS
22 k
>4.7 μF
RST
VSENSE
VBAT
VSUP
VB
VDD
DBG
* = Optional
4.7 k (optional)
SPI
TXD
RXD
MCU
CAN
IO-3
CANH
60
CAN BUS
60
4.7 nF
SPLIT
N/C
CANL
GND
SAFE
VSUP
VSUP
Safe Circuitry
Notes
46. Tested per specific OEM EMC requirements for CAN and LIN with additional
capacitor > 10 μF on VSUP pin
47. Leave N/C pins open.
Figure 41. 34903P Typical Application Schematic
34903/4/5
88
Analog Integrated Circuit Device Data
Freescale Semiconductor
TYPICAL APPLICATIONS
FLAGS AND DEVICE STATUS
The following figure illustrates the application case
where two reverse battery diodes can be used for
optimization of the filtering and buffering capacitor at the
VDD pin. This allows using a minimum value capacitor at
the VDD pin to guarantee reset-free operation of the MCU
during the cranking pulse and temporary (50 ms) loss of the
VBAT supply.
Applications without an external ballast on VDD and
without using the VAUX regulator are illustrated as well.
Q2
5.0 V/3.3 V
Q2
VBAT
5.0 V/3.3 V
D2
VBAT
VBAUX VCAUX
D1
C2
VAUX
VSUP2
VE
VSUP1
VB
Q1
VBAUX VCAUX VAUX
VSUP2
D1
VE
VSUP1
VB
C1
VDD
Q1
VDD
Partial View
Partial View
ex2: Split VSUP Supply
ex1: Single VSUP Supply
Optimized solution for cranking pulses.
C1 is sized for MCU power supply buffer only.
Q2
5.0 V/3.3 V
VBAT
VBAT
D1
VBAUX VCAUX VAUX
D1
VSUP2
VE
VSUP2
VSUP1
VBAUX VCAUX VAUX
VE
VSUP1
VB
VB
VDD
VDD
Partial View
Partial View
ex 3: No External Transistor, VDD ~100 mA Capability
delivered by internal path transistor.
ex 4: No External Transistor - No VAUX
Figure 42. Application Options
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
89
PACKAGING
SOIC 32 PACKAGE DIMENSIONS
PACKAGING
SOIC 32 PACKAGE DIMENSIONS
For the most current package revision, visit www.freescale.com and perform a keyword search using the “98A” listed below.
EK SUFFIX (PB-FREE)
32-PIN SOIC WIDE BODY
EXPOSED PAD
98ASA10556D
REVISION D
34903/4/5
90
Analog Integrated Circuit Device Data
Freescale Semiconductor
PACKAGING
SOIC 32 PACKAGE DIMENSIONS
EK SUFFIX (PB-FREE)
32-PIN SOIC WIDE BODY
EXPOSED PAD
98ASA10556D
REVISION D
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
91
PACKAGING
SOIC 32 PACKAGE DIMENSIONS
EK SUFFIX (PB-FREE)
32-PIN SOIC WIDE BODY
EXPOSED PAD
98ASA10556D
REVISION D
34903/4/5
92
Analog Integrated Circuit Device Data
Freescale Semiconductor
REVISION HISTORY
REVISION HISTORY
REVISION
DATE
DESCRIPTION OF CHANGES
1.0
7/2013
•
Initial Release based on the the MC33903_4_5 data sheet
2.0
8/2013
•
•
Update TA for industrial market applications.
Corrected document title
3.0
9/2013
•
•
Added Applications to page one
Corrected blank fields.
4.0
10/2013
•
Upgraded temperature to 125 °C to support additional industrial applications.
34903/4/5
Analog Integrated Circuit Device Data
Freescale Semiconductor
93
How to Reach Us:
Information in this document is provided solely to enable system and software implementers to use Freescale products.
Home Page:
freescale.com
There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits based
Web Support:
freescale.com/support
Freescale reserves the right to make changes without further notice to any products herein. Freescale makes no
on the information in this document.
warranty, representation, or guarantee regarding the suitability of its products for any particular purpose, nor does
Freescale assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any
and all liability, including without limitation consequential or incidental damages. “Typical” parameters that may be
provided in Freescale data sheets and/or specifications can and do vary in different applications, and actual performance
may vary over time. All operating parameters, including “typicals,” must be validated for each customer application by
customer’s technical experts. Freescale does not convey any license under its patent rights nor the rights of others.
Freescale sells products pursuant to standard terms and conditions of sale, which can be found at the following address:
freescale.com/SalesTermsandConditions.
Freescale and the Freescale logo, are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off.
SMARTMOS is a trademark of Freescale Semiconductor, Inc. All other product or service names are the property of their
respective owners.
© 2013 Freescale Semiconductor, Inc.
Document Number: MC34903_4_5
Rev. 4.0
10/2013
工商网监
湘ICP备2023018690号
