MC8641THX1000GC

Freescale Semiconductor Document Number: MPC8641D Rev. 3, 05/2014 Technical Data MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications 1 Overview The MPC8641 processor family integrates either one or two Power Architecture® e600 processor cores with system logic required for networking, storage, wireless infrastructure, and general-purpose embedded applications. The MPC8641 integrates one e600 core while the MPC8641D integrates two cores. This section provides a high-level overview of the MPC8641 and MPC8641D features. When referring to the MPC8641 throughout the document, the functionality described applies to both the MPC8641 and the MPC8641D. Any differences specific to the MPC8641D are noted. Figure 1 shows the major functional units within the MPC8641 and MPC8641D. The major difference between the MPC8641 and MPC8641D is that there are two cores on the MPC8641D. Freescale reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. © 2008-2014 Freescale Semiconductor, Inc. All rights reserved. 1. 2. 3. 4. 5. 6. 7. 8. 9. 10. 11. 12. 13. 14. 15. 16. 17. 18. 19. 20. 21. 22. Contents Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . 6 Power Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 14 Input Clocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 RESET Initialization . . . . . . . . . . . . . . . . . . . . . . . . . 20 DDR and DDR2 SDRAM . . . . . . . . . . . . . . . . . . . . . 21 DUART . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management . . . . . . . . . . . . . . . . . . . . . . . . . . . .29 Ethernet Management Interface Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43 Local Bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45 JTAG . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54 I2C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 High-Speed Serial Interfaces (HSSI) . . . . . . . . . . . . 59 PCI Express . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69 Serial RapidIO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77 Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88 Signal Listings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91 Clocking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104 Thermal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108 System Design Information . . . . . . . . . . . . . . . . . . 116 Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 126 Document Revision History . . . . . . . . . . . . . . . . . . 128 Overview e600 Core Block e600 Core Block e600 Core 32-Kbyte L1 Instruction Cache 1-Mbyte L2 Cache 32-Kbyte L1 Data Cache e600 Core 32-Kbyte L1 Instruction Cache 1-Mbyte L2 Cache 32-Kbyte L1 Data Cache MPX Bus MPX Coherency Module (MCM) Platform Bus SDRAM DDR SDRAM Controller SDRAM DDR SDRAM Controller ROM, GPIO Local Bus Controller (LBC) IRQs Multiprocessor Programmable Interrupt Controller (MPIC) Serial Dual Universal Asynchronous Receiver/Transmitter (DUART) I2C I2C Controller I2C I2C Controller RMII, GMII, MII, RGMII, TBI, RTBI RMII, GMII, MII, RGMII, TBI, RTBI Enhanced TSEC Controller [ x1/x2/x4/x8 PCI Exp (4 GB/s) AND 1x/4x SRIO (2.5 GB/s) ] OR [2-x1/x2/x4/x8 PCI Express (8 GB/S) ] Enhanced TSEC Controller PCI Express Interface Enhanced TSEC Controller 10/100/1Gb RMII, GMII, MII, RGMII, TBI, RTBI OCeaN Switch Fabric Serial RapidIO Interface or PCI Express Interface 10/100/1Gb 10/100/1Gb RMII, GMII, MII, RGMII, TBI, RTBI Platform Four-Channel DMA Controller External Control Enhanced TSEC Controller 10/100/1Gb Figure 1. MPC8641 and MPC8641D MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 2 Freescale Semiconductor Overview 1.1 Key Features The following lists an overview of the MPC8641 key feature set: • Major features of the e600 core are as follows: — High-performance, 32-bit superscalar microprocessor that implements the PowerPC ISA — Eleven independent execution units and three register files – Branch processing unit (BPU) – Four integer units (IUs) that share 32 GPRs for integer operands – 64-bit floating-point unit (FPU) – Four vector units and a 32-entry vector register file (VRs) – Three-stage load/store unit (LSU) — Three issue queues, FIQ, VIQ, and GIQ, can accept as many as one, two, and three instructions, respectively, in a cycle. — Rename buffers — Dispatch unit — Completion unit — Two separate 32-Kbyte instruction and data level 1 (L1) caches — Integrated 1-Mbyte, eight-way set-associative unified instruction and data level 2 (L2) cache with ECC — 36-bit real addressing — Separate memory management units (MMUs) for instructions and data — Multiprocessing support features — Power and thermal management — Performance monitor — In-system testability and debugging features — Reliability and serviceability • MPX coherency module (MCM) — Ten local address windows plus two default windows — Optional low memory offset mode for core 1 to allow for address disambiguation • Address translation and mapping units (ATMUs) — Eight local access windows define mapping within local 36-bit address space — Inbound and outbound ATMUs map to larger external address spaces — Three inbound windows plus a configuration window on PCI Express — Four inbound windows plus a default window on serial RapidIO — Four outbound windows plus default translation for PCI Express — Eight outbound windows plus default translation for serial RapidIO with segmentation and sub-segmentation support MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 3 Overview • • • • DDR memory controllers — Dual 64-bit memory controllers (72-bit with ECC) — Support of up to a 300-MHz clock rate and a 600-MHz DDR2 SDRAM — Support for DDR, DDR2 SDRAM — Up to 16 Gbytes per memory controller — Cache line and page interleaving between memory controllers. Serial RapidIO interface unit — Supports RapidIO Interconnect Specification, Revision 1.2 — Both 1x and 4x LP-Serial link interfaces — Transmission rates of 1.25-, 2.5-, and 3.125-Gbaud (data rates of 1.0-, 2.0-, and 2.5-Gbps) per lane — RapidIO–compliant message unit — RapidIO atomic transactions to the memory controller PCI Express interface — PCI Express 1.0a compatible — Supports x1, x2, x4, and x8 link widths — 2.5 Gbaud, 2.0 Gbps lane Four enhanced three-speed Ethernet controllers (eTSECs) — Three-speed support (10/100/1000 Mbps) — Four IEEE 802.3, 802.3u, 802.3x, 802.3z, 802.3ac, 802.3ab-compatible controllers — Support of the following physical interfaces: MII, RMII, GMII, RGMII, TBI, and RTBI — — — — — — — • Support a full-duplex FIFO mode for high-efficiency ASIC connectivity TCP/IP off-load Header parsing Quality of service support VLAN insertion and deletion MAC address recognition Buffer descriptors are backward compatible with PowerQUICC II and PowerQUICC III programming models — RMON statistics support — MII management interface for control and status Programmable interrupt controller (PIC) — Programming model is compliant with the OpenPIC architecture — Supports 16 programmable interrupt and processor task priority levels — Supports 12 discrete external interrupts and 48 internal interrupts — Eight global high resolution timers/counters that can generate interrupts — Allows processors to interrupt each other with 32b messages MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 4 Freescale Semiconductor Overview • • • • • • • • — Support for PCI-Express message-shared interrupts (MSIs) Local bus controller (LBC) — Multiplexed 32-bit address and data operating at up to 133 MHz — Eight chip selects support eight external slaves Integrated DMA controller — Four-channel controller — All channels accessible by both the local and the remote masters — Supports transfers to or from any local memory or I/O port — Ability to start and flow control each DMA channel from external 3-pin interface Device performance monitor — Supports eight 32-bit counters that count the occurrence of selected events — Ability to count up to 512 counter-specific events — Supports 64 reference events that can be counted on any of the 8 counters — Supports duration and quantity threshold counting — Burstiness feature that permits counting of burst events with a programmable time between bursts — Triggering and chaining capability — Ability to generate an interrupt on overflow Dual I2C controllers — Two-wire interface — Multiple master support — Master or slave I2C mode support — On-chip digital filtering rejects spikes on the bus Boot sequencer — Optionally loads configuration data from serial ROM at reset via the I2C interface — Can be used to initialize configuration registers and/or memory — Supports extended I2C addressing mode — Data integrity checked with preamble signature and CRC DUART — Two 4-wire interfaces (SIN, SOUT, RTS, CTS) — Programming model compatible with the original 16450 UART and the PC16550D IEEE 1149.1-compatible, JTAG boundary scan Available as 1023 pin Hi-CTE flip chip ceramic ball grid array (FC-CBGA) MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 5 Electrical Characteristics 2 Electrical Characteristics This section provides the AC and DC electrical specifications and thermal characteristics for the MPC8641. The MPC8641 is currently targeted to these specifications. 2.1 Overall DC Electrical Characteristics This section covers the ratings, conditions, and other characteristics. 2.1.1 Absolute Maximum Ratings Table 1 provides the absolute maximum ratings. Table 1. Absolute Maximum Ratings1 Characteristic Symbol Absolute Maximum Value Unit Notes Cores supply voltages VDD_Core0, VDD_Core1 –0.3 to 1.21 V V 2 Cores PLL supply AVDD_Core0, AVDD_Core1 –0.3 to 1.21 V V — SVDD –0.3 to 1.21 V V — SerDes Serial I/O Supply Port 1 XVDD_SRDS1 –0.3 to 1.21V V — SerDes Serial I/O Supply Port 2 XVDD_SRDS2 –0.3 to 1.21 V V — SerDes DLL and PLL supply voltage for Port 1 and Port 2 AVDD_SRDS1, AVDD_SRDS2 –0.3 to 1.21V V — Platform Supply voltage VDD_PLAT –0.3 to 1.21V V — Local Bus and Platform PLL supply voltage AVDD_LB, AVDD_PLAT –0.3 to 1.21V V — D1_GVDD, D2_GVDD –0.3 to 2.75 V V 3 –0.3 to 1.98 V V 3 LVDD –0.3 to 3.63 V V 4 –0.3 to 2.75 V V 4 –0.3 to 3.63 V V 4 –0.3 to 2.75 V V 4 –0.3 to 3.63 V V — SerDes Transceiver Supply (Ports 1 and 2) DDR and DDR2 SDRAM I/O supply voltages eTSEC 1 and 2 I/O supply voltage eTSEC 3 and 4 I/O supply voltage Local Bus, DUART, DMA, Multiprocessor Interrupts, System Control & Clocking, Debug, Test, Power management, I2C, JTAG and Miscellaneous I/O voltage TVDD OVDD MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 6 Freescale Semiconductor Electrical Characteristics Table 1. Absolute Maximum Ratings1 (continued) Characteristic Input voltage Symbol Absolute Maximum Value Unit Notes Dn_MVIN – 0.3 to (Dn_GVDD + 0.3) V 5 Dn_MVREF – 0.3 to (Dn_GVDD/2 + 0.3) V — Three-speed Ethernet signals LVIN TVIN GND to (LVDD+ 0.3) GND to (TVDD+ 0.3) V 5 DUART, Local Bus, DMA, Multiprocessor Interrupts, System Control & Clocking, Debug, Test, Power management, I2C, JTAG and Miscellaneous I/O voltage OVIN GND to (OVDD+ 0.3) V 5 TSTG –55 to 150 °C — DDR and DDR2 SDRAM signals DDR and DDR2 SDRAM reference Storage temperature range Notes: 1. Functional and tested operating conditions are given in Table 2. Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stresses beyond those listed may affect device reliability or cause permanent damage to the device. 2. Core 1 characteristics apply only to MPC8641D. If two separate power supplies are used for VDD_Core0 and VDD_Core1, they must be kept within 100 mV of each other during normal run time. 3. The –0.3 to 2.75 V range is for DDR and –0.3 to 1.98 V range is for DDR2. 4. The 3.63V maximum is only supported when the port is configured in GMII, MII, RMII, or TBI modes; otherwise the 2.75V maximum applies. See Section 8.2, “FIFO, GMII, MII, TBI, RGMII, RMII, and RTBI AC Timing Specifications,” for details on the recommended operating conditions per protocol. 5. During run time (M,L,T,O)VIN and Dn_MVREF may overshoot/undershoot to a voltage and for a maximum duration as shown in Figure 2. 2.1.2 Recommended Operating Conditions Table 2 provides the recommended operating conditions for the MPC8641. Note that the values in Table 2 are the recommended and tested operating conditions. Proper device operation outside of these conditions is not guaranteed. For details on order information and specific operating conditions for parts, see Section 21, “Ordering Information.” Table 2. Recommended Operating Conditions Characteristic Cores supply voltages Cores PLL supply SerDes Transceiver Supply (Ports 1 and 2) Symbol VDD_Core0, VDD_Core1 AVDD_Core0, AVDD_Core1 SVDD Recommended Value Unit Notes 1.10 ± 50 mV V 1, 2, 8 1.05 ± 50 mV 1, 2, 7 0.95 ± 50 mV 1, 2, 12 1.10 ± 50 mV V 8, 13 1.05 ± 50 mV 7, 13 0.95 ± 50 mV 12, 13 1.10 ± 50 mV 1.05 ± 50 mV V 8, 11 7, 11 MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 7 Electrical Characteristics Table 2. Recommended Operating Conditions (continued) Characteristic SerDes Serial I/O Supply Port 1 Symbol Recommended Value Unit Notes XVDD_SRDS1 1.10 ± 50 mV V 8 1.05 ± 50 mV SerDes Serial I/O Supply Port 2 XVDD_SRDS2 1.10 ± 50 mV 7 V 1.05 ± 50 mV SerDes DLL and PLL supply voltage for Port 1 and Port 2 Platform Supply voltage AVDD_SRDS1, AVDD_SRDS2 1.10 ± 50 mV VDD_PLAT 1.10 ± 50 mV 7 V 1.05 ± 50 mV V 8 7 AVDD_LB, AVDD_PLAT 1.10 ± 50 mV D1_GVDD, D2_GVDD 2.5 V ± 125 mV V 9 1.8 V ± 90 mV V 9 LVDD 3.3 V ± 165 mV V 10 2.5 V ± 125 mV V 10 3.3 V ± 165 mV V 10 2.5 V ± 125 mV V 10 OVDD 3.3 V ± 165 mV V 5 Dn_MVIN GND to Dn_GVDD V 3, 6 Dn_MVREF Dn_GVDD/2 ± 1% V Three-speed Ethernet signals LVIN TVIN GND to LVDD GND to TVDD V 4, 6 DUART, Local Bus, DMA, Multiprocessor Interrupts, System Control & Clocking, Debug, Test, Power management, I2C, JTAG and Miscellaneous I/O voltage OVIN GND to OVDD V 5,6 DDR and DDR2 SDRAM I/O supply voltages eTSEC 1 and 2 I/O supply voltage eTSEC 3 and 4 I/O supply voltage Local Bus, DUART, DMA, Multiprocessor Interrupts, System Control & Clocking, Debug, Test, Power management, I2C, JTAG and Miscellaneous I/O voltage Input voltage 8 7 1.05 ± 50 mV Local Bus and Platform PLL supply voltage 8 DDR and DDR2 SDRAM signals DDR and DDR2 SDRAM reference TVDD V 1.05 ± 50 mV 8 7 MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 8 Freescale Semiconductor Electrical Characteristics Table 2. Recommended Operating Conditions (continued) Characteristic Junction temperature range Symbol Recommended Value Unit Notes TJ 0 to 105 °C — Notes: 1. Core 1 characteristics apply only to MPC8641D 2. If two separate power supplies are used for VDD_Core0 and VDD_Core1, they must be at the same nominal voltage and the individual power supplies must be tracked and kept within 100 mV of each other during normal run time. 3. Caution: Dn_MVIN must meet the overshoot/undershoot requirements for Dn_GVDD as shown in Figure 2. 4. Caution: L/TVIN must meet the overshoot/undershoot requirements for L/TVDD as shown in Figure 2 during regular run time. 5. Caution: OVIN must meet the overshoot/undershoot requirements for OVDD as shown in Figure 2 during regular run time. 6. Timing limitations for M,L,T,O)VIN and Dn_MVREF during regular run time is provided in Figure 2 7. Applies to devices marked with a core frequency of 1333 MHz and below. Refer to Table 74 Part Numbering Nomenclature to determine if the device has been marked for a core frequency of 1333 MHz and below. 8. Applies to devices marked with a core frequency above 1333 MHz. Refer to Table 74 Part Numbering Nomenclature to determine if the device has been marked for a core frequency above 1333 MHz. 9. The 2.5 V ± 125 mV range is for DDR and 1.8 V ± 90 mV range is for DDR2. 10. See Section 8.2, “FIFO, GMII, MII, TBI, RGMII, RMII, and RTBI AC Timing Specifications,” for details on the recommended operating conditions per protocol. 11. The PCI Express interface of the device is expected to receive signals from 0.175 to 1.2 V. For more information refer to Section 14.4.3, “Differential Receiver (RX) Input Specifications.” 12. Applies to Part Number MC8641xxx1000NX only. VDD_Coren = 0.95 V and VDD_PLAT = 1.05 V devices. Refer to Table 74 Part Numbering Nomenclature to determine if the device has been marked for VDD_Coren = 0.95 V. 13. This voltage is the input to the filter discussed in Section 20.2, “Power Supply Design and Sequencing,” and not necessarily the voltage at the AVDD_Coren pin, which may be reduced from VDD_Coren by the filter. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 9 Electrical Characteristics Figure 2 shows the undershoot and overshoot voltages at the interfaces of the MPC8641. L/T/Dn_G/O/X/SVDD + 20% L/T/Dn_G/O/X/SVDD + 5% VIH L/T/Dn_G/O/X/SVDD GND GND – 0.3 V VIL GND – 0.7 V Not to Exceed 10% of tCLK1 Note: 1. tCLK references clocks for various functional blocks as follows: DDRn = 10% of Dn_MCK period eTSECn = 10% of ECn_GTX_CLK125 period Local Bus = 10% of LCLK[0:2] period I2C = 10% of SYSCLK JTAG = 10% of SYSCLK Figure 2. Overshoot/Undershoot Voltage for Dn_M/O/L/TVIN The MPC8641 core voltage must always be provided at nominal VDD_Coren (See Table 2 for actual recommended core voltage). Voltage to the processor interface I/Os are provided through separate sets of supply pins and must be provided at the voltages shown in Table 2. The input voltage threshold scales with respect to the associated I/O supply voltage. OVDD and L/TVDD based receivers are simple CMOS I/O circuits and satisfy appropriate LVCMOS type specifications. The DDR SDRAM interface uses a single-ended differential receiver referenced to each externally supplied Dn_MVREF signal (nominally set to Dn_GVDD/2) as is appropriate for the (SSTL-18 and SSTL-25) electrical signaling standards. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 10 Freescale Semiconductor Electrical Characteristics 2.1.3 Output Driver Characteristics Table 3 provides information on the characteristics of the output driver strengths. The values are preliminary estimates. Table 3. Output Drive Capability Driver Type Programmable Output Impedance (Ω) Supply Voltage Notes DDR1 signal 18 36 (half strength mode) Dn_GVDD = 2.5 V 4, 9 DDR2 signal 18 36 (half strength mode) Dn_GVDD = 1.8 V 1, 5, 9 Local Bus signals 45 25 OVDD = 3.3 V 2, 6 eTSEC/10/100 signals 45 T/LVDD = 3.3 V 6 30 T/LVDD = 2.5 V 6 DUART, DMA, Multiprocessor Interrupts, System Control & Clocking, Debug, Test, Power management, JTAG and Miscellaneous I/O voltage 45 OVDD = 3.3 V 6 I2C 150 OVDD = 3.3 V 7 SRIO, PCI Express 100 SVDD = 1.1/1.05 V 3, 8 Notes: 1. See the DDR Control Driver registers in the MPC8641D reference manual for more information. 2. Only the following local bus signals have programmable drive strengths: LALE, LAD[0:31], LDP[0:3], LA[27:31], LCKE, LCS[1:2], LWE[0:3], LGPL1, LGPL2, LGPL3, LGPL4, LGPL5, LCLK[0:2]. The other local bus signals have a fixed drive strength of 45 Ω. See the POR Impedance Control register in the MPC8641D reference manual for more information about local bus signals and their drive strength programmability. 3. See Section 17, “Signal Listings,” for details on resistor requirements for the calibration of SDn_IMP_CAL_TX and SDn_IMP_CAL_RX transmit and receive signals. 4. Stub Series Terminated Logic (SSTL-25) type pins. 5. Stub Series Terminated Logic (SSTL-18) type pins. 6. Low Voltage Transistor-Transistor Logic (LVTTL) type pins. 7. Open Drain type pins. 8. Low Voltage Differential Signaling (LVDS) type pins. 9. The drive strength of the DDR interface in half strength mode is at Tj = 105C and at Dn_GVDD (min). 2.2 Power Up/Down Sequence The MPC8641 requires its power rails to be applied in a specific sequence in order to ensure proper device operation. NOTE The recommended maximum ramp up time for power supplies is 20 milliseconds. The chronological order of power up is as follows: 1. All power rails other than DDR I/O (Dn_GVDD, and Dn_MVREF). MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 11 Electrical Characteristics NOTE There is no required order sequence between the individual rails for this item (# 1). However, VDD_PLAT, AVDD_PLAT rails must reach 90% of their recommended value before the rail for Dn_GVDD, and Dn_MVREF (in next step) reaches 10% of their recommended value. AVDD type supplies must be delayed with respect to their source supplies by the RC time constant of the PLL filter circuit described in Section 20.2.1, “PLL Power Supply Filtering.” 2. Dn_GVDD, Dn_MVREF NOTE It is possible to leave the related power supply (Dn_GVDD, Dn_MVREF) turned off at reset for a DDR port that will not be used. Note that these power supplies can only be powered up again at reset for functionality to occur on the DDR port. 3. SYSCLK The recommended order of power down is as follows: 1. Dn_GVDD, Dn_MVREF 2. All power rails other than DDR I/O (Dn_GVDD, Dn_MVREF). NOTE SYSCLK may be powered down simultaneous to either of item # 1 or # 2 in the power down sequence. Beyond this, the power supplies may power down simultaneously if the preservation of DDRn memory is not a concern. See Figure 3 for more details on the Power and Reset Sequencing details. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 12 Freescale Semiconductor Electrical Characteristics Figure 3 illustrates the Power Up sequence as described above. 3.3 V L/T/OVDD DC Power Supply Voltage If 1 L/TVDD=2.5 V 2.5 V Dn_GVDD, = 1.8/2.5 V Dn_MVREF 1.8 V VDD_PLAT, AVDD_PLAT AVDD_LB, SVDD, XVDD_SRDSn AVDD_SRDSn VDD_Coren, AVDD_Coren 1.2 V 100 µs Platform PLL Relock Time 3 7 0 Power Supply Ramp Up 2 Time SYSCLK 8 (not drawn to scale) 9 HRESET (& TRST) Asserted for 100 μs after SYSCLK is functional 4 e6005 PLL Reset Configuration Pins Cycles Setup and hold Time 6 Notes: 1. Dotted waveforms correspond to optional supply values for a specified power supply. See Table 2. 2. The recommended maximum ramp up time for power supplies is 20 milliseconds. 3. Refer to Section 5, “RESET Initialization” for additional information on PLL relock and reset signal assertion timing requirements. 4. Refer to Table 11 for additional information on reset configuration pin setup timing requirements. In addition see Figure 68 regarding HRESET and JTAG connection details including TRST. 5. e600 PLL relock time is 100 microseconds maximum plus 255 MPX_clk cycles. 6. Stable PLL configuration signals are required as stable SYSCLK is applied. All other POR configuration inputs are required 4 SYSCLK cycles before HRESET negation and are valid at least 2 SYSCLK cycles after HRESET has negated (hold requirement). See Section 5, “RESET Initialization” for more information on setup and hold time of reset configuration signals. 7. VDD_PLAT, AVDD_PLAT must strictly reach 90% of their recommended voltage before the rail for Dn_GVDD, and Dn_MVREF reaches 10% of their recommended voltage. 8. SYSCLK must be driven only AFTER the power for the various power supplies is stable. 9. In device sleep mode, the reset configuration signals for DRAM types (TSEC2_TXD[4],TSEC2_TX_ER) must be valid BEFORE HRESET is asserted. Figure 3. MPC8641 Power-Up and Reset Sequence MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 13 Power Characteristics 3 Power Characteristics The power dissipation for the dual core MPC8641D device is shown in Table 4. Table 4. MPC8641D Power Dissipation (Dual Core) Power Mode Core Frequency (MHz) Platform Frequency (MHz) VDD_Coren, VDD_PLAT (Volts) Typical Thermal 1500 MHz 600 MHz 1.1 V Maximum 1333 MHz 533 MHz 1.05 V Maximum 1250 MHz 500 MHz 1, 2 43.4 1, 3 49.9 1, 4 23.9 1, 2 30.0 1, 3 34.1 1, 4 23.9 1, 2 30.0 1, 3 34.1 1, 4 23.9 1, 2 30.0 1, 3 34.1 1, 4 16.2 1, 2, 5 21.8 1, 3, 5 25.0 1, 4, 5 105 oC 105 oC 65 1000 MHz 400 MHz oC 1.05 V 105 oC Maximum Typical Maximum 32.1 105 oC Typical Thermal 65 oC 1.05 V Maximum Thermal Notes 65 oC Typical Thermal Power (Watts) 65 oC Typical Thermal Junction Temperature 65 1000 MHz 500 MHz 0.95 V, 1.05 V oC 105 oC Notes: 1. These values specify the power consumption at nominal voltage and apply to all valid processor bus frequencies and configurations. The values do not include power dissipation for I/O supplies. 2. Typical power is an average value measured at the nominal recommended core voltage (VDD_Coren) and 65°C junction temperature (see Table 2)while running the Dhrystone 2.1 benchmark and achieving 2.3 Dhrystone MIPs/MHz with one core at 100% efficiency and the second core at 65% efficiency. 3. Thermal power is the average power measured at nominal core voltage (VDD_Coren) and maximum operating junction temperature (see Table 2) while running the Dhrystone 2.1 benchmark and achieving 2.3 Dhrystone MIPs/MHz on both cores and a typical workload on platform interfaces. 4. Maximum power is the maximum power measured at nominal core voltage (VDD_Coren) and maximum operating junction temperature (see Table 2) while running a test which includes an entirely L1-cache-resident, contrived sequence of instructions which keep all the execution units maximally busy on both cores. 5. These power numbers are for Part Number MC8641Dxx1000NX only. VDD_Coren = 0.95 V and VDD_PLAT = 1.05 V. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 14 Freescale Semiconductor Power Characteristics The maximum power dissipation for individual power supplies of the MPC8641D is shown in Table 5. Table 5. MPC8641D Individual Supply Maximum Power Dissipation 1 Component Description Supply Voltage (Volts) Power (Watts) Per Core voltage Supply VDD_Core0/VDD_Core1 = 1.1 V @ 1500 MHz 21.00 Per Core PLL voltage supply AVDD_Core0/AVDD_Core1 = 1.1 V @ 1500 MHz 0.0125 Per Core voltage Supply VDD_Core0/VDD_Core1 = 1.05 V @ 1333 MHz 17.00 Per Core PLL voltage supply AVDD_Core0/AVDD_Core1 = 1.05 V @ 1333 MHz 0.0125 Per Core voltage Supply VDD_Core0/VDD_Core1 = 0.95 V @ 1000 MHz 11.50 5 Per Core PLL voltage supply AVDD_Core0/AVDD_Core1 = 0.95 V @ 1000 MHz 0.0125 5 DDR Controller I/O voltage supply Dn_GVDD = 2.5 V @ 400 MHz 0.80 2 Dn_GVDD = 1.8 V @ 533 MHz 0.68 2 Dn_GVDD = 1.8 V @ 600 MHz 0.77 2 16-bit FIFO @ 200 MHz eTsec 1&2/3&4 Voltage Supply L/TVDD = 3.3 V 0.11 2, 3 non-FIFO eTsecn Voltage Supply L/TVDD = 3.3 V 0.08 2 x8 SerDes transceiver Supply SVDD = 1.1 V 0.70 2 x8 SerDes I/O Supply XVDD_SRDSn = 1.1 V 0.66 2 SerDes PLL voltage supply Port 1 or 2 AVDD_SRDS1/AVDD_SRDS2 = 1.1 V 0.10 Platform I/O Supply OVDD = 3.3 V 0.45 Platform source Supply VDD_PLAT = 1.1 V @ 600 MHz 12.00 Platform source Supply VDD_PLAT = 1.05 Vn @ 500 MHz 9.80 Platform source Supply VDD_PLAT = 1.05 Vn @ 400 MHz 7.70 Platform, Local Bus PLL voltage Supply AVDD_PLAT, AVDD_LB = 1.1 V 0.0125 Notes 4 5 Notes: 1. This is a maximum power supply number which is provided for power supply and board design information. The numbers are based on 100% bus utilization for each component. The components listed are not expected to have 100% bus usage simultaneously for all components. Actual numbers may vary based on activity. 2. Number is based on a per port/interface value. 3. This is based on one eTSEC port used. Since 16-bit FIFO mode involves two ports, the number will need to be multiplied by two for the total. The other eTSEC protocols dissipate less than this number per port. Note that the power needs to be multiplied by the number of ports used for the protocol for the total eTSEC port power dissipation. 4.This includes Local Bus, DUART, I2C, DMA, Multiprocessor Interrupts, System Control & Clocking, Debug, Test, Power management, JTAG and Miscellaneous I/O voltage. 5. These power numbers are for Part Number MC8641xxx1000NX only. VDD_Coren = 0.95 V and VDD_PLAT = 1.05 V. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 15 Power Characteristics The power dissipation for the MPC8641 single core device is shown in Table 6. Table 6. MPC8641 Power Dissipation (Single Core) Power Mode Core Frequency (MHz) Platform Frequency (MHz) VDD_Coren, VDD_PLAT (Volts) Typical Thermal 1500 MHz 600 MHz 1.1 V Maxim 1333 MHz 533 MHz 1.05 V Typical 500 MHz 1, 2 25.2 1, 3 28.9 1, 4 16.3 1, 2 20.2 1, 3 23.2 1, 4 16.3 1, 2 20.2 1, 3 23.2 1, 4 16.3 1, 2 20.2 1, 3 23.2 1, 4 11.6 1, 2, 5 14.4 1, 3, 5 16.5 1, 4, 5 105 oC 105 oC oC 105 oC 65 oC 1000 MHz 400 MHz 1.05 V 105 oC Maximum Typical Maximum 20.3 1.05 V Typical Thermal 65 oC 65 1250 MHz Maximum Thermal Notes 65 C Maximum Thermal Power (Watts) o Typical Thermal Junction Temperature 65 1000 MHz 500 MHz 0.95 V, 1.05 V oC 105 oC Notes: 1. These values specify the power consumption at nominal voltage and apply to all valid processor bus frequencies and configurations. The values do not include power dissipation for I/O supplies. 2. Typical power is an average value measured at the nominal recommended core voltage (VDD_Coren) and 65°C junction temperature (see Table 2)while running the Dhrystone 2.1 benchmark and achieving 2.3 Dhrystone MIPs/MHz. 3. Thermal power is the average power measured at nominal core voltage (VDD_Coren) and maximum operating junction temperature (see Table 2) while running the Dhrystone 2.1 benchmark and achieving 2.3 Dhrystone MIPs/MHz and a typical workload on platform interfaces. 4. Maximum power is the maximum power measured at nominal core voltage (VDD_Coren) and maximum operating junction temperature (see Table 2) while running a test which includes an entirely L1-cache-resident, contrived sequence of instructions which keep all the execution units maximally busy. 5. These power numbers are for Part Number MC8641xx1000NX only. VDD_Coren = 0.95 V and VDD_PLAT = 1.05 V. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 16 Freescale Semiconductor Input Clocks 4 Input Clocks Table 7 provides the system clock (SYSCLK) DC specifications for the MPC8641. Table 7. SYSCLK DC Electrical Characteristics (OVDD = 3.3 V ± 165 mV) Parameter Symbol Min Max Unit High-level input voltage VIH 2 OVDD + 0.3 V Low-level input voltage VIL –0.3 0.8 V Input current (VIN 1 = 0 V or VIN = VDD) IIN — ±5 μA Note: 1. Note that the symbol VIN, in this case, represents the OVIN symbol referenced in Table 1 and Table 2. 4.1 System Clock Timing Table 8 provides the system clock (SYSCLK) AC timing specifications for the MPC8641. Table 8. SYSCLK AC Timing Specifications At recommended operating conditions (see Table 2) with OVDD = 3.3 V ± 165 mV. Parameter/Condition Symbol Min Typical Max Unit Notes SYSCLK frequency fSYSCLK 66 — 166.66 MHz 1 SYSCLK cycle time tSYSCLK 6 — — ns — SYSCLK rise and fall time tKH, tKL 0.6 1.0 1.2 ns 2 tKHK/tSYSCLK 40 — 60 % 3 — — — 150 ps 4, 5 SYSCLK duty cycle SYSCLK jitter Notes: 1. Caution: The MPX clock to SYSCLK ratio and e600 core to MPX clock ratio settings must be chosen such that the resulting SYSCLK frequency, e600 (core) frequency, and MPX clock frequency do not exceed their respective maximum or minimum operating frequencies. See Section 18.2, “MPX to SYSCLK PLL Ratio,” and Section 18.3, “e600 to MPX clock PLL Ratio,” for ratio settings. 2. Rise and fall times for SYSCLK are measured at 0.4 V and 2.7 V. 3. Timing is guaranteed by design and characterization. 4. This represents the short term jitter only and is guaranteed by design. 5. The SYSCLK driver’s closed loop jitter bandwidth should be 400 MHz, cfg_plat_freq = 1. Therefore, when operating PCI Express in x8 link width, the MPX platform frequency must be 400 MHz with cfg_plat_freq = 0 or greater than or equal to 527 MHz with cfg_plat_freq = 1. For proper Serial RapidIO operation, the MPX clock frequency must be greater than or equal to: 2 × (0.8512) × (Serial RapidIO interface frequency) × (Serial RapidIO link width) 64 4.5 Other Input Clocks For information on the input clocks of other functional blocks of the platform such as SerDes, and eTSEC, see the specific section of this document. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 19 RESET Initialization 5 RESET Initialization This section describes the AC electrical specifications for the RESET initialization timing requirements of the MPC8641. Table 11 provides the RESET initialization AC timing specifications. Table 11. RESET Initialization Timing Specifications Parameter/Condition Min Max Unit Notes 100 — μs — 3 — SYSCLKs 1 100 — μs 2 Input setup time for POR configs (other than PLL config) with respect to negation of HRESET 4 — SYSCLKs 1 Input hold time for all POR configs (including PLL config) with respect to negation of HRESET 2 — SYSCLKs 1 Maximum valid-to-high impedance time for actively driven POR configs with respect to negation of HRESET — 5 SYSCLKs 1 Required assertion time of HRESET Minimum assertion time for SRESET_0 & SRESET_1 Platform PLL input setup time with stable SYSCLK before HRESET negation Notes: 1. SYSCLK is the primary clock input for the MPC8641. 2 This is related to HRESET assertion time. Stable PLL configuration inputs are required when a stable SYSCLK is applied. See the MPC8641D Integrated Host Processor Reference Manual for more details on the power-on reset sequence. Table 12 provides the PLL lock times. Table 12. PLL Lock Times Parameter/Condition Min Max Unit Notes (Platform and E600) PLL lock times — 100 μs 1 Local bus PLL — 50 μs — Note: 1.The PLL lock time for e600 PLLs require an additional 255 MPX_CLK cycles. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 20 Freescale Semiconductor DDR and DDR2 SDRAM 6 DDR and DDR2 SDRAM This section describes the DC and AC electrical specifications for the DDR SDRAM interface of the MPC8641. Note that DDR SDRAM is Dn_GVDD(typ) = 2.5 V and DDR2 SDRAM is Dn_GVDD(typ) = 1.8 V. 6.1 DDR SDRAM DC Electrical Characteristics Table 13 provides the recommended operating conditions for the DDR2 SDRAM component(s) of the MPC8641 when Dn_GVDD(typ) = 1.8 V. Table 13. DDR2 SDRAM DC Electrical Characteristics for Dn_GVDD(typ) = 1.8 V Parameter/Condition Symbol Min Max Unit Notes I/O supply voltage Dn_GVDD 1.71 1.89 V 1 I/O reference voltage Dn_MVREF 0.49 × Dn_GVDD 0.51 × Dn_GVDD V 2 I/O termination voltage VTT Dn_MVREF – 0.0 4 Dn_MVREF + 0.04 V 3 Input high voltage VIH Dn_MVREF+ 0.1 25 Dn_GVDD + 0.3 V — Input low voltage VIL –0.3 Dn_MVREF – 0.125 V — Output leakage current IOZ –50 50 μA 4 Output high current (VOUT = 1.420 V) IOH –13.4 — mA — Output low current (VOUT = 0.280 V) IOL 13.4 — mA — Notes: 1. Dn_GVDD is expected to be within 50 mV of the DRAM Dn_GVDD at all times. 2. Dn_MVREF is expected to be equal to 0.5 × Dn_GVDD, and to track Dn_GVDD DC variations as measured at the receiver. Peak-to-peak noise on Dn_MVREF may not exceed ±2% of the DC value. 3. VTT is not applied directly to the device. It is the supply to which far end signal termination is made and is expected to be equal to Dn_MVREF. This rail should track variations in the DC level of Dn_MVREF. 4. Output leakage is measured with all outputs disabled, 0 V ≤ VOUT ≤ Dn_GVDD. Table 14 provides the DDR2 capacitance when Dn_GVDD(typ) = 1.8 V. Table 14. DDR2 SDRAM Capacitance for Dn_GVDD(typ)=1.8 V Parameter/Condition Symbol Min Max Unit Notes Input/output capacitance: DQ, DQS, DQS CIO 6 8 pF 1 Delta input/output capacitance: DQ, DQS, DQS CDIO — 0.5 pF 1 Note: 1. This parameter is sampled. Dn_GVDD = 1.8 V ± 0.090 V, f = 1 MHz, TA = 25°C, VOUT = Dn_GVDD/2, VOUT (peak-to-peak) = 0.2 V. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 21 DDR and DDR2 SDRAM Table 15 provides the recommended operating conditions for the DDR SDRAM component(s) when Dn_GVDD(typ) = 2.5 V. Table 15. DDR SDRAM DC Electrical Characteristics for Dn_GVDD (typ) = 2.5 V Symbol Min Max Unit Notes I/O supply voltage Dn_GVDD 2.375 2.625 V 1 I/O reference voltage Dn_MVREF 0.49 × Dn_GVDD 0.51 × Dn_GVDD V 2 I/O termination voltage VTT Dn_MVREF – 0.04 Dn_MVREF + 0.04 V 3 Input high voltage VIH Dn_MVREF + 0.15 Dn_GVDD + 0.3 V — Input low voltage VIL –0.3 Dn_MVREF– 0.15 V — Output leakage current IOZ –50 50 μA 4 Output high current (VOUT = 1.95 V) IOH –16.2 — mA — Output low current (VOUT = 0.35 V) IOL 16.2 — mA — Parameter/Condition Notes: 1. Dn_GVDD is expected to be within 50 mV of the DRAM Dn_GVDD at all times. 2. MVREF is expected to be equal to 0.5 × Dn_GVDD, and to track Dn_GVDD DC variations as measured at the receiver. Peak-to-peak noise on Dn_MVREF may not exceed ±2% of the DC value. 3. VTT is not applied directly to the device. It is the supply to which far end signal termination is made and is expected to be equal to Dn_MVREF. This rail should track variations in the DC level of Dn_MVREF. 4. Output leakage is measured with all outputs disabled, 0 V ≤ VOUT ≤ Dn_GVDD. Table 16 provides the DDR capacitance when Dn_GVDD (typ)=2.5 V. Table 16. DDR SDRAM Capacitance for Dn_GVDD (typ) = 2.5 V Parameter/Condition Symbol Min Max Unit Notes Input/output capacitance: DQ, DQS CIO 6 8 pF 1 Delta input/output capacitance: DQ, DQS CDIO — 0.5 pF 1 Note: 1. This parameter is sampled. Dn_GVDD = 2.5 V ± 0.125 V, f = 1 MHz, TA = 25°C, VOUT = Dn_GVDD/2, VOUT (peak-to-peak) = 0.2 V. Table 17 provides the current draw characteristics for MVREF. Table 17. Current Draw Characteristics for MVREF Parameter / Condition Current draw for MVREF Symbol Min Max Unit Note IMVREF — 500 μA 1 1. The voltage regulator for MVREF must be able to supply up to 500 μA current. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 22 Freescale Semiconductor DDR and DDR2 SDRAM 6.2 DDR SDRAM AC Electrical Characteristics This section provides the AC electrical characteristics for the DDR SDRAM interface. 6.2.1 DDR SDRAM Input AC Timing Specifications Table 18 provides the input AC timing specifications for the DDR2 SDRAM when Dn_GVDD(typ)=1.8 V. Table 18. DDR2 SDRAM Input AC Timing Specifications for 1.8-V Interface At recommended operating conditions Parameter Symbol AC input low voltage Min Max — Dn_MVREF – 0.25 Dn_MVREF – 0.20 Dn_MVREF + 0.25 Dn_MVREF + 0.20 — VIL 400, 533 MHz 600 MHz AC input high voltage VIH 400, 533 MHz 600 MHz Unit Notes V — V — Table 19 provides the input AC timing specifications for the DDR SDRAM when Dn_GVDD(typ)=2.5 V. Table 19. DDR SDRAM Input AC Timing Specifications for 2.5-V Interface At recommended operating conditions. Parameter Symbol Min Max Unit Notes AC input low voltage VIL — Dn_MVREF – 0.31 V — AC input high voltage VIH Dn_MVREF + 0.31 — V — Unit Notes ps 1, 2 Table 20 provides the input AC timing specifications for the DDR SDRAM interface. Table 20. DDR SDRAM Input AC Timing Specifications At recommended operating conditions. Parameter Symbol Min tCISKEW — 600 MHz — –240 240 — 3 533 MHz — –300 300 — 3 400 MHz — –365 365 — — Controller Skew for MDQS—MDQ/MECC Max Note: 1. tCISKEW represents the total amount of skew consumed by the controller between MDQS[n] and any corresponding bit that will be captured with MDQS[n]. This should be subtracted from the total timing budget. 2. The amount of skew that can be tolerated from MDQS to a corresponding MDQ signal is called tDISKEW.This can be determined by the following equation: tDISKEW =+/–(T/4 – abs(tCISKEW)) where T is the clock period and abs(tCISKEW) is the absolute value of tCISKEW. 3. Maximum DDR1 frequency is 400 MHz. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 23 DDR and DDR2 SDRAM Figure 4 shows the DDR SDRAM input timing for the MDQS to MDQ skew measurement (tDISKEW). MCK[n] MCK[n] tMCK MDQS[n] MDQ[x] D0 D1 tDISKEW tDISKEW Figure 4. DDR Input Timing Diagram for tDISKEW 6.2.2 DDR SDRAM Output AC Timing Specifications Table 21. DDR SDRAM Output AC Timing Specifications At recommended operating conditions. Parameter MCK[n] cycle time, MCK[n]/MCK[n] crossing MCK duty cycle Symbol 1 Min Max Unit Notes tMCK 3 10 ns 2 47.5 47 47 52.5 53 53 % tMCKH/tMCK 600 MHz 533 MHz 400 MHz ADDR/CMD output setup with respect to MCK 8 9 9 ns tDDKHAS 3 600 MHz 1.10 — 7 533 MHz 1.48 — 7 400 MHz 1.95 — ADDR/CMD output hold with respect to MCK ns tDDKHAX 3 600 MHz 1.10 — 7 533 MHz 1.48 — 7 400 MHz 1.95 — MCS[n] output setup with respect to MCK tDDKHCS ns 3 600 MHz 1.10 — 7 533 MHz 1.48 — 7 400 MHz 1.95 — MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 24 Freescale Semiconductor DDR and DDR2 SDRAM Table 21. DDR SDRAM Output AC Timing Specifications (continued) At recommended operating conditions. Symbol 1 Parameter MCS[n] output hold with respect to MCK Max tDDKHCX Unit Notes ns 3 600 MHz 1.10 — 7 533 MHz 1.48 — 7 400 MHz 1.95 — –0.6 0.6 MCK to MDQS Skew tDDKHMH MDQ/MECC/MDM output setup with respect to MDQS tDDKHDS, tDDKLDS ns 4 ps 5 600 MHz 500 — 7 533 MHz 590 — 7 400 MHz 700 — MDQ/MECC/MDM output hold with respect to MDQS MDQS preamble start Min ps tDDKHDX, tDDKLDX 5 600 MHz 500 — 7 533 MHz 590 — 7 400 MHz 700 — –0.5 × tMCK – 0.6 –0.5 × tMCK +0.6 tDDKHMP ns 6 MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 25 DDR and DDR2 SDRAM Table 21. DDR SDRAM Output AC Timing Specifications (continued) At recommended operating conditions. Parameter MDQS epilogue end Symbol 1 Min Max Unit Notes tDDKHME –0.6 0.6 ns 6 Note: 1. The symbols used for timing specifications follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. Output hold time can be read as DDR timing (DD) from the rising or falling edge of the reference clock (KH or KL) until the output went invalid (AX or DX). For example, tDDKHAS symbolizes DDR timing (DD) for the time tMCK memory clock reference (K) goes from the high (H) state until outputs (A) are setup (S) or output valid time. Also, tDDKLDX symbolizes DDR timing (DD) for the time tMCK memory clock reference (K) goes low (L) until data outputs (D) are invalid (X) or data output hold time. 2. All MCK/MCK referenced measurements are made from the crossing of the two signals ±0.1 V. 3. ADDR/CMD includes all DDR SDRAM output signals except MCK/MCK, MCS, and MDQ/MECC/MDM/MDQS. 4. Note that tDDKHMH follows the symbol conventions described in note 1. For example, tDDKHMH describes the DDR timing (DD) from the rising edge of the MCK[n] clock (KH) until the MDQS signal is valid (MH). tDDKHMH can be modified through control of the DQS override bits (called WR_DATA_DELAY) in the TIMING_CFG_2 register. This will typically be set to the same delay as the clock adjust in the CLK_CNTL register. The timing parameters listed in the table assume that these 2 parameters have been set to the same adjustment value. See the MPC8641 Integrated Processor Reference Manual for a description and understanding of the timing modifications enabled by use of these bits. 5. Determined by maximum possible skew between a data strobe (MDQS) and any corresponding bit of data (MDQ), ECC (MECC), or data mask (MDM). The data strobe should be centered inside of the data eye at the pins of the microprocessor. 6. All outputs are referenced to the rising edge of MCK[n] at the pins of the microprocessor. Note that tDDKHMP follows the symbol conventions described in note 1. 7. Maximum DDR1 frequency is 400 MHz 8. Per the JEDEC spec the DDR2 duty cycle at 600 MHz is the average low and high cycle time values that are defined as the average pulse widths calculated across any consecutive 200 pulses. Jitter can sometimes force single low and high cycle times to drift from the average values. tJIT = ±125 ps. 9. Per the JEDEC spec the DDR2 duty cycle at 400 and 533 MHz is the low and high cycle time values. NOTE For the ADDR/CMD setup and hold specifications in Table 21, it is assumed that the Clock Control register is set to adjust the memory clocks by 1/2 applied cycle. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 26 Freescale Semiconductor DDR and DDR2 SDRAM Figure 5 shows the DDR SDRAM output timing for the MCK to MDQS skew measurement (tDDKHMH). MCK[n] MCK[n] tMCK tDDKHMHmax) = 0.6 ns MDQS tDDKHMH(min) = –0.6 ns MDQS Figure 5. Timing Diagram for tDDKHMH Figure 6 shows the DDR SDRAM output timing diagram. MCK[n] MCK[n] tMCK tDDKHAS ,tDDKHCS tDDKHAX ,tDDKHCX ADDR/CMD Write A0 NOOP tDDKHMP tDDKHMH MDQS[n] tDDKHME tDDKHDS tDDKLDS MDQ[x] D0 D1 tDDKLDX tDDKHDX Figure 6. DDR SDRAM Output Timing Diagram MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 27 DUART Figure 7 provides the AC test load for the DDR bus. Z0 = 50 Ω Output Dn_GVDD/2 RL = 50 Ω Figure 7. DDR AC Test Load 7 DUART This section describes the DC and AC electrical specifications for the DUART interface of the MPC8641. 7.1 DUART DC Electrical Characteristics Table 22 provides the DC electrical characteristics for the DUART interface. Table 22. DUART DC Electrical Characteristics Parameter Symbol Min Max Unit High-level input voltage VIH 2 OVDD + 0.3 V Low-level input voltage VIL –0.3 0.8 V Input current (VIN 1 = 0 V or VIN = VDD) IIN — ±5 μA High-level output voltage (OVDD = min, IOH = –100 μA) VOH OVDD – 0.2 — V Low-level output voltage (OVDD = min, IOL = 100 μA) VOL — 0.2 V Note: 1. Note that the symbol VIN, in this case, represents the OVIN symbol referenced in Table 1 and Table 2. 7.2 DUART AC Electrical Specifications Table 23 provides the AC timing parameters for the DUART interface. Table 23. DUART AC Timing Specifications Parameter Value Unit Notes Minimum baud rate MPX clock/1,048,576 baud 1,2 Maximum baud rate MPX clock/16 baud 1,3 16 — 1,4 Oversample rate Notes: 1. Guaranteed by design. 2. MPX clock refers to the platform clock. 3. Actual attainable baud rate will be limited by the latency of interrupt processing. 4. The middle of a start bit is detected as the 8th sampled 0 after the 1-to-0 transition of the start bit. Subsequent bit values are sampled each 16th sample. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 28 Freescale Semiconductor Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management 8 Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management This section provides the AC and DC electrical characteristics for enhanced three-speed and MII management. 8.1 Enhanced Three-Speed Ethernet Controller (eTSEC) (10/100/1Gb Mbps)—GMII/MII/TBI/RGMII/RTBI/RMII Electrical Characteristics The electrical characteristics specified here apply to all gigabit media independent interface (GMII), media independent interface (MII), ten-bit interface (TBI), reduced gigabit media independent interface (RGMII), reduced ten-bit interface (RTBI), and reduced media independent interface (RMII) signals except management data input/output (MDIO) and management data clock (MDC). The RGMII and RTBI interfaces are defined for 2.5 V, while the GMII and TBI interfaces can be operated at 3.3 or 2.5 V. Whether the GMII or TBI interface is operated at 3.3 or 2.5 V, the timing is compatible with IEEE 802.3. The RGMII and RTBI interfaces follow the Reduced Gigabit Media-Independent Interface (RGMII) Specification Version 1.3 (12/10/2000). The RMII interface follows the RMII Consortium RMII Specification Version 1.2 (3/20/1998). The electrical characteristics for MDIO and MDC are specified in Section 9, “Ethernet Management Interface Electrical Characteristics.” 8.1.1 eTSEC DC Electrical Characteristics All GMII, MII, TBI, RGMII, RMII and RTBI drivers and receivers comply with the DC parametric attributes specified in Table 24 and Table 25. The potential applied to the input of a GMII, MII, TBI, RGMII, RMII or RTBI receiver may exceed the potential of the receiver’s power supply (that is, a GMII driver powered from a 3.6-V supply driving VOH into a GMII receiver powered from a 2.5-V supply). Tolerance for dissimilar GMII driver and receiver supply potentials is implicit in these specifications. The RGMII and RTBI signals are based on a 2.5-V CMOS interface voltage as defined by JEDEC EIA/JESD8-5. Table 24. GMII, MII, RMII, TBI and FIFO DC Electrical Characteristics Parameter Symbol Min Max Unit Notes Supply voltage 3.3 V LVDD TVDD 3.135 3.465 V 1, 2 Output high voltage (LVDD/TVDD = Min, IOH = –4.0 mA) VOH 2.40 — V — Output low voltage (LVDD/TVDD = Min, IOL = 4.0 mA) VOL — 0.50 V — Input high voltage VIH 2.0 — V — Input low voltage VIL — 0.90 V — Input high current (VIN = LVDD, VIN = TVDD) IIH — 40 μA 1, 2,3 MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 29 Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management Table 24. GMII, MII, RMII, TBI and FIFO DC Electrical Characteristics (continued) Parameter Input low current (VIN = GND) Symbol Min Max Unit Notes IIL –600 — μA 3 Notes: 1 LVDD supports eTSECs 1 and 2. TVDD supports eTSECs 3 and 4. 3 The symbol VIN, in this case, represents the LVIN and TVIN symbols referenced in Table 1 and Table 2. 2 Table 25. GMII, RGMII, RTBI, TBI and FIFO DC Electrical Characteristics Parameters Symbol Min Max Unit Notes LVDD/TVDD 2.375 2.625 V 1,2 Output high voltage (LVDD/TVDD = Min, IOH = –1.0 mA) VOH 2.00 — V — Output low voltage (LVDD/TVDD = Min, IOL = 1.0 mA) VOL — 0.40 V — Input high voltage VIH 1.70 — V — Input low voltage VIL — 0.90 V — Input high current (VIN = LVDD, VIN = TVDD) IIH — 10 μA 1, 2,3 Input low current (VIN = GND) IIL –15 — μA 3 Supply voltage 2.5 V Note: 1 LVDD supports eTSECs 1 and 2. TVDD supports eTSECs 3 and 4. 3 Note that the symbol V , in this case, represents the LV and TV symbols referenced in Table 1 and Table 2. IN IN IN 2 8.2 FIFO, GMII, MII, TBI, RGMII, RMII, and RTBI AC Timing Specifications The AC timing specifications for FIFO, GMII, MII, TBI, RGMII, RMII and RTBI are presented in this section. 8.2.1 FIFO AC Specifications The basis for the AC specifications for the eTSEC’s FIFO modes is the double data rate RGMII and RTBI specifications, since they have similar performance and are described in a source-synchronous fashion like FIFO modes. However, the FIFO interface provides deliberate skew between the transmitted data and source clock in GMII fashion. When the eTSEC is configured for FIFO modes, all clocks are supplied from external sources to the relevant eTSEC interface. That is, the transmit clock must be applied to the eTSECn’s TSECn_TX_CLK, while the receive clock must be applied to pin TSECn_RX_CLK. The eTSEC internally uses the transmit MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 30 Freescale Semiconductor Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management clock to synchronously generate transmit data and outputs an echoed copy of the transmit clock back out onto the TSECn_GTX_CLK pin (while transmit data appears on TSECn_TXD[7:0], for example). It is intended that external receivers capture eTSEC transmit data using the clock on TSECn_GTX_CLK as a source-synchronous timing reference. Typically, the clock edge that launched the data can be used, since the clock is delayed by the eTSEC to allow acceptable set-up margin at the receiver. Note that there is relationship between the maximum FIFO speed and the platform speed. For more information see Section 18.4.2, “Platform to FIFO Restrictions.” NOTE The phase between the output clocks TSEC1_GTX_CLK and TSEC2_GTX_CLK (ports 1 and 2) is no more than 100 ps. The phase between the output clocks TSEC3_GTX_CLK and TSEC4_GTX_CLK (ports 3 and 4) is no more than 100 ps. A summary of the FIFO AC specifications appears in Table 26 and Table 27. Table 26. FIFO Mode Transmit AC Timing Specification At recommended operating conditions with L/TVDD of 3.3 V ± 5% and 2.5 V ± 5%. Parameter/Condition Symbol Min Typ Max Unit TX_CLK, GTX_CLK clock period (GMII mode) tFIT 7.0 8.0 100 ns TX_CLK, GTX_CLK clock period (Encoded mode) tFIT 5.3 8.0 100 ns tFITH/tFIT 45 50 55 % TX_CLK, GTX_CLK peak-to-peak jitter tFITJ — — 250 ps Rise time TX_CLK (20%–80%) tFITR — — 0.75 ns Fall time TX_CLK (80%–20%) tFITF — — 0.75 ns FIFO data TXD[7:0], TX_ER, TX_EN setup time to GTX_CLK tFITDV 2.0 — — ns GTX_CLK to FIFO data TXD[7:0], TX_ER, TX_EN hold time tFITDX 0.5 — 3.0 ns TX_CLK, GTX_CLK duty cycle Table 27. FIFO Mode Receive AC Timing Specification At recommended operating conditions with L/TVDD of 3.3 V ± 5% and 2.5 V ± 5%. Parameter/Condition Symbol Min Typ Max Unit RX_CLK clock period (GMII mode) tFIR1 7.0 8.0 100 ns RX_CLK clock period (Encoded mode) tFIR 1 5.3 8.0 100 ns tFIRH/tFIR 45 50 55 % RX_CLK peak-to-peak jitter tFIRJ — — 250 ps Rise time RX_CLK (20%–80%) tFIRR — — 0.75 ns Fall time RX_CLK (80%–20%) tFIRF — — 0.75 ns RXD[7:0], RX_DV, RX_ER setup time to RX_CLK tFIRDV 1.5 — — ns RXD[7:0], RX_DV, RX_ER hold time to RX_CLK tFIRDX 0.5 — — ns RX_CLK duty cycle 1 ±100 ppm tolerance on RX_CLK frequency MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 31 Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management Timing diagrams for FIFO appear in Figure 8 and Figure 9. . tFITF tFITR tFIT GTX_CLK tFITH tFITDV tFITDX TXD[7:0] TX_EN TX_ER Figure 8. FIFO Transmit AC Timing Diagram tFIRR tFIR RX_CLK tFIRH tFIRF RXD[7:0] RX_DV RX_ER valid data tFIRDV tFIRDX Figure 9. FIFO Receive AC Timing Diagram 8.2.2 GMII AC Timing Specifications This section describes the GMII transmit and receive AC timing specifications. 8.2.2.1 GMII Transmit AC Timing Specifications Table 28 provides the GMII transmit AC timing specifications. Table 28. GMII Transmit AC Timing Specifications At recommended operating conditions with L/TVDD of 3.3 V ± 5% and 2.5 V ± 5%. Symbol 1 Min Typ Max Unit GMII data TXD[7:0], TX_ER, TX_EN setup time tGTKHDV 2.5 — — ns GTX_CLK to GMII data TXD[7:0], TX_ER, TX_EN delay tGTKHDX 0.5 — 5.0 ns GTX_CLK data clock rise time (20%-80%) tGTXR2 — — 1.0 ns Parameter/Condition MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 32 Freescale Semiconductor Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management Table 28. GMII Transmit AC Timing Specifications (continued) At recommended operating conditions with L/TVDD of 3.3 V ± 5% and 2.5 V ± 5%. Parameter/Condition GTX_CLK data clock fall time (80%-20%) Symbol 1 Min Typ Max Unit tGTXF2 — — 1.0 ns Notes: 1. The symbols used for timing specifications herein follow the pattern t(first two letters of functional block)(signal)(state) (reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tGTKHDV symbolizes GMII transmit timing (GT) with respect to the tGTX clock reference (K) going to the high state (H) relative to the time date input signals (D) reaching the valid state (V) to state or setup time. Also, tGTKHDX symbolizes GMII transmit timing (GT) with respect to the tGTX clock reference (K) going to the high state (H) relative to the time date input signals (D) going invalid (X) or hold time. Note that, in general, the clock reference symbol representation is based on three letters representing the clock of a particular functional. For example, the subscript of tGTX represents the GMII(G) transmit (TX) clock. For rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall). 2. Guaranteed by design. Figure 10 shows the GMII transmit AC timing diagram. tGTXR tGTX GTX_CLK tGTXH tGTXF TXD[7:0] TX_EN TX_ER tGTKHDX tGTKHDV Figure 10. GMII Transmit AC Timing Diagram 8.2.2.2 GMII Receive AC Timing Specifications Table 29 provides the GMII receive AC timing specifications. Table 29. GMII Receive AC Timing Specifications At recommended operating conditions with L/TVDD of 3.3 V ± 5% and 2.5 V ± 5%. Parameter/Condition Symbol 1 Min Typ tGRX3 — 8.0 — ns tGRXH/tGRX 40 — 60 ns RXD[7:0], RX_DV, RX_ER setup time to RX_CLK tGRDVKH 2.0 — — ns RXD[7:0], RX_DV, RX_ER hold time to RX_CLK tGRDXKH 0.5 — — ns — — 1.0 ns RX_CLK clock period RX_CLK duty cycle RX_CLK clock rise time (20%-80%) tGRXR 2 Max Unit MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 33 Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management Table 29. GMII Receive AC Timing Specifications (continued) At recommended operating conditions with L/TVDD of 3.3 V ± 5% and 2.5 V ± 5%. Parameter/Condition RX_CLK clock fall time (80%-20%) Symbol 1 Min Typ Max Unit tGRXF2 — — 1.0 ns Note: 1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tGRDVKH symbolizes GMII receive timing (GR) with respect to the time data input signals (D) reaching the valid state (V) relative to the tRX clock reference (K) going to the high state (H) or setup time. Also, tGRDXKL symbolizes GMII receive timing (GR) with respect to the time data input signals (D) went invalid (X) relative to the tGRX clock reference (K) going to the low (L) state or hold time. Note that, in general, the clock reference symbol representation is based on three letters representing the clock of a particular functional. For example, the subscript of tGRX represents the GMII (G) receive (RX) clock. For rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall). 2. Guaranteed by design. 3. ±100 ppm tolerance on RX_CLK frequency Figure 11 provides the AC test load for eTSEC. Z0 = 50 Ω Output RL = 50 Ω LVDD/2 Figure 11. eTSEC AC Test Load Figure 12 shows the GMII receive AC timing diagram. tGRXR tGRX RX_CLK tGRXH tGRXF RXD[7:0] RX_DV RX_ER tGRDXKH tGRDVKH Figure 12. GMII Receive AC Timing Diagram MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 34 Freescale Semiconductor Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management 8.2.3 MII AC Timing Specifications This section describes the MII transmit and receive AC timing specifications. 8.2.3.1 MII Transmit AC Timing Specifications Table 30 provides the MII transmit AC timing specifications. Table 30. MII Transmit AC Timing Specifications At recommended operating conditions with L/TVDD of 3.3 V ± 5%. Symbol 1 Min Typ Max Unit TX_CLK clock period 10 Mbps tMTX2 — 400 — ns TX_CLK clock period 100 Mbps tMTX — 40 — ns tMTXH/tMTX 35 — 65 % tMTKHDX 1 5 15 ns TX_CLK data clock rise time (20%-80%) tMTXR2 1.0 — 4.0 ns TX_CLK data clock fall time (80%-20%) tMTXF2 1.0 — 4.0 ns Parameter/Condition TX_CLK duty cycle TX_CLK to MII data TXD[3:0], TX_ER, TX_EN delay Note: 1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tMTKHDX symbolizes MII transmit timing (MT) for the time tMTX clock reference (K) going high (H) until data outputs (D) are invalid (X). Note that, in general, the clock reference symbol representation is based on two to three letters representing the clock of a particular functional. For example, the subscript of tMTX represents the MII(M) transmit (TX) clock. For rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall). 2. Guaranteed by design. Figure 13 shows the MII transmit AC timing diagram. tMTXR tMTX TX_CLK tMTXH tMTXF TXD[3:0] TX_EN TX_ER tMTKHDX Figure 13. MII Transmit AC Timing Diagram MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 35 Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management 8.2.3.2 MII Receive AC Timing Specifications Table 31 provides the MII receive AC timing specifications. Table 31. MII Receive AC Timing Specifications At recommended operating conditions with L/TVDD of 3.3 V ± 5%. Symbol 1 Min Typ Max Unit RX_CLK clock period 10 Mbps tMRX2,3 — 400 — ns RX_CLK clock period 100 Mbps tMRX3 — 40 — ns tMRXH/tMRX 35 — 65 % RXD[3:0], RX_DV, RX_ER setup time to RX_CLK tMRDVKH 10.0 — — ns RXD[3:0], RX_DV, RX_ER hold time to RX_CLK tMRDXKH 10.0 — — ns RX_CLK clock rise time (20%-80%) tMRXR2 1.0 — 4.0 ns RX_CLK clock fall time (80%-20%) tMRXF2 1.0 — 4.0 ns Parameter/Condition RX_CLK duty cycle Note: 1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tMRDVKH symbolizes MII receive timing (MR) with respect to the time data input signals (D) reach the valid state (V) relative to the tMRX clock reference (K) going to the high (H) state or setup time. Also, tMRDXKL symbolizes MII receive timing (GR) with respect to the time data input signals (D) went invalid (X) relative to the tMRX clock reference (K) going to the low (L) state or hold time. Note that, in general, the clock reference symbol representation is based on three letters representing the clock of a particular functional. For example, the subscript of tMRX represents the MII (M) receive (RX) clock. For rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall). 2. Guaranteed by design. 3. ±100 ppm tolerance on RX_CLK frequency Figure 14 provides the AC test load for eTSEC. Z0 = 50 Ω Output RL = 50 Ω LVDD/2 Figure 14. eTSEC AC Test Load Figure 15 shows the MII receive AC timing diagram. tMRXR tMRX RX_CLK tMRXH RXD[3:0] RX_DV RX_ER tMRXF Valid Data tMRDVKH tMRDXKL Figure 15. MII Receive AC Timing Diagram MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 36 Freescale Semiconductor Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management 8.2.4 TBI AC Timing Specifications This section describes the TBI transmit and receive AC timing specifications. 8.2.4.1 TBI Transmit AC Timing Specifications Table 32 provides the TBI transmit AC timing specifications. Table 32. TBI Transmit AC Timing Specifications At recommended operating conditions with L/TVDD of 3.3 V ± 5% and 2.5 V ± 5%. Symbol 1 Min Typ Max Unit TCG[9:0] setup time GTX_CLK going high tTTKHDV 2.0 — — ns TCG[9:0] hold time from GTX_CLK going high tTTKHDX 1.0 — — ns GTX_CLK rise time (20%–80%) tTTXR2 — — 1.0 ns GTX_CLK fall time (80%–20%) tTTXF2 — — 1.0 ns Parameter/Condition Notes: 1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state )(reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tTTKHDV symbolizes the TBI transmit timing (TT) with respect to the time from tTTX (K) going high (H) until the referenced data signals (D) reach the valid state (V) or setup time. Also, tTTKHDX symbolizes the TBI transmit timing (TT) with respect to the time from tTTX (K) going high (H) until the referenced data signals (D) reach the invalid state (X) or hold time. Note that, in general, the clock reference symbol representation is based on three letters representing the clock of a particular functional. For example, the subscript of tTTX represents the TBI (T) transmit (TX) clock. For rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall). 2. Guaranteed by design. Figure 16 shows the TBI transmit AC timing diagram. tTTXR tTTX GTX_CLK tTTXH tTTXF tTTXF TCG[9:0] tTTKHDV tTTXR tTTKHDX Figure 16. TBI Transmit AC Timing Diagram MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 37 Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management 8.2.4.2 TBI Receive AC Timing Specifications Table 33 provides the TBI receive AC timing specifications. Table 33. TBI Receive AC Timing Specifications At recommended operating conditions with L/TVDD of 3.3 V ± 5% and 2.5 V ± 5%. Symbol 1 Min Typ Max Unit tTRX3 — 16.0 — ns tSKTRX 7.5 — 8.5 ns tTRXH/tTRX 40 — 60 % RCG[9:0] setup time to rising PMA_RX_CLK tTRDVKH 2.5 — — ns RCG[9:0] hold time to rising PMA_RX_CLK tTRDXKH 1.5 — — ns PMA_RX_CLK[0:1] clock rise time (20%-80%) tTRXR2 0.7 — 2.4 ns PMA_RX_CLK[0:1] clock fall time (80%-20%) tTRXF2 0.7 — 2.4 ns Parameter/Condition PMA_RX_CLK[0:1] clock period PMA_RX_CLK[0:1] skew PMA_RX_CLK[0:1] duty cycle Note: 1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tTRDVKH symbolizes TBI receive timing (TR) with respect to the time data input signals (D) reach the valid state (V) relative to the tTRX clock reference (K) going to the high (H) state or setup time. Also, tTRDXKH symbolizes TBI receive timing (TR) with respect to the time data input signals (D) went invalid (X) relative to the tTRX clock reference (K) going to the high (H) state. Note that, in general, the clock reference symbol representation is based on three letters representing the clock of a particular functional. For example, the subscript of tTRX represents the TBI (T) receive (RX) clock. For rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall). For symbols representing skews, the subscript is skew (SK) followed by the clock that is being skewed (TRX). 2. Guaranteed by design. 3. ±100 ppm tolerance on PMA_RX_CLK[0:1] frequency Figure 17 shows the TBI receive AC timing diagram. tTRXR tTRX PMA_RX_CLK1 tTRXH tTRXF Valid Data RCG[9:0] Valid Data tTRDVKH tSKTRX tTRDXKH PMA_RX_CLK0 tTRDXKH tTRXH tTRDVKH Figure 17. TBI Receive AC Timing Diagram MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 38 Freescale Semiconductor Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management 8.2.5 TBI Single-Clock Mode AC Specifications When the eTSEC is configured for TBI modes, all clocks are supplied from external sources to the relevant eTSEC interface. In single-clock TBI mode, when TBICON[CLKSEL] = 1 a 125-MHz TBI receive clock is supplied on TSECn_RX_CLK pin (no receive clock is used on TSECn_TX_CLK in this mode, whereas for the dual-clock mode this is the PMA1 receive clock). The 125-MHz transmit clock is applied on the TSEC_GTX_CLK125 pin in all TBI modes. A summary of the single-clock TBI mode AC specifications for receive appears in Table 34. Table 34. TBI single-clock Mode Receive AC Timing Specification At recommended operating conditions with L/TVDD of 3.3 V ± 5% and 2.5 V ± 5%. Parameter/Condition Symbol Min Typ Max Unit tTRR1 7.5 8.0 8.5 ns tTRRH/tTRR 40 50 60 % RX_CLK peak-to-peak jitter tTRRJ — — 250 ps Rise time RX_CLK (20%–80%) tTRRR — — 1.0 ns Fall time RX_CLK (80%–20%) tTRRF — — 1.0 ns RCG[9:0] setup time to RX_CLK rising edge tTRRDVKH 2.0 — — ns RCG[9:0] hold time to RX_CLK rising edge tTRRDXKH 1.0 — — ns RX_CLK clock period RX_CLK duty cycle 1 ±100 ppm tolerance on RX_CLK frequency A timing diagram for TBI receive appears in Figure 18. . tTRRR tTRR RX_CLK tTRRH tTRRF RCG[9:0] valid data tTRRDVKH tTRRDXKH Figure 18. TBI Single-Clock Mode Receive AC Timing Diagram 8.2.6 RGMII and RTBI AC Timing Specifications Table 35 presents the RGMII and RTBI AC timing specifications. Table 35. RGMII and RTBI AC Timing Specifications At recommended operating conditions with L/TVDD of 2.5 V ± 5%. Symbol 1 Min Typ Max Unit Data to clock output skew (at transmitter) tSKRGT5 –500 0 500 ps Data to clock input skew (at receiver) 2 tSKRGT 1.0 — 2.8 ns Parameter/Condition MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 39 Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management Table 35. RGMII and RTBI AC Timing Specifications (continued) At recommended operating conditions with L/TVDD of 2.5 V ± 5%. Symbol 1 Parameter/Condition tRGT5,6 Clock period duration 3 Duty cycle for 10BASE-T and 100BASE-TX 3, 4 tRGTH/tRGT 5 Min Typ Max Unit 7.2 8.0 8.8 ns 40 50 60 % Rise time (20%–80%) tRGTR5 — — 0.75 ns Fall time (80%–20%) tRGTF5 — — 0.75 ns Notes: 1. Note that, in general, the clock reference symbol representation for this section is based on the symbols RGT to represent RGMII and RTBI timing. For example, the subscript of tRGT represents the TBI (T) receive (RX) clock. Note also that the notation for rise (R) and fall (F) times follows the clock symbol that is being represented. For symbols representing skews, the subscript is skew (SK) followed by the clock that is being skewed (RGT). 2. This implies that PC board design will require clocks to be routed such that an additional trace delay of greater than 1.5 ns will be added to the associated clock signal. 3. For 10 and 100 Mbps, tRGT scales to 400 ns ± 40 ns and 40 ns ± 4 ns, respectively. 4. Duty cycle may be stretched/shrunk during speed changes or while transitioning to a received packet's clock domains as long as the minimum duty cycle is not violated and stretching occurs for no more than three tRGT of the lowest speed transitioned between. 5. Guaranteed by characterization 6. ±100 ppm tolerance on RX_CLK frequency Figure 19 shows the RGMII and RTBI AC timing and multiplexing diagrams. tRGT tRGTH GTX_CLK (At Transmitter) tSKRGT TXD[8:5][3:0] TXD[7:4][3:0] TX_CTL TXD[3:0] TXD[8:5] TXD[7:4] TXD[4] TXEN TXD[9] TXERR tSKRGT TX_CLK (At PHY) RXD[8:5][3:0] RXD[7:4][3:0] RXD[8:5] RXD[3:0] RXD[7:4] tSKRGT RX_CTL RXD[4] RXDV RXD[9] RXERR tSKRGT RX_CLK (At PHY) Figure 19. RGMII and RTBI AC Timing and Multiplexing Diagrams MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 40 Freescale Semiconductor Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management 8.2.7 RMII AC Timing Specifications This section describes the RMII transmit and receive AC timing specifications. 8.2.7.1 RMII Transmit AC Timing Specifications The RMII transmit AC timing specifications are in Table 36. Table 36. RMII Transmit AC Timing Specifications At recommended operating conditions with L/TVDD of 3.3 V ± 5%. Symbol 1 Min Typ Max Unit tRMT — 20.0 — ns tRMTH/tRMT 35 50 65 % REF_CLK peak-to-peak jitter tRMTJ — — 250 ps Rise time REF_CLK (20%–80%) tRMTR 1.0 — 2.0 ns Fall time REF_CLK (80%–20%) tRMTF 1.0 — 2.0 ns tRMTDX 1.0 — 10.0 ns Parameter/Condition REF_CLK clock period REF_CLK duty cycle REF_CLK to RMII data TXD[1:0], TX_EN delay Note: 1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tMTKHDX symbolizes MII transmit timing (MT) for the time tMTX clock reference (K) going high (H) until data outputs (D) are invalid (X). Note that, in general, the clock reference symbol representation is based on two to three letters representing the clock of a particular functional. For example, the subscript of tMTX represents the MII(M) transmit (TX) clock. For rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall). Figure 20 shows the RMII transmit AC timing diagram. tRMTR tRMT REF_CLK tRMTH tRMTF TXD[1:0] TX_EN TX_ER tRMTDX Figure 20. RMII Transmit AC Timing Diagram MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 41 Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management 8.2.7.2 RMII Receive AC Timing Specifications Table 37. RMII Receive AC Timing Specifications At recommended operating conditions with L/TVDD of 3.3 V ± 5%. Symbol 1 Min Typ Max Unit tRMR 15.0 20.0 25.0 ns tRMRH/tRMR 35 50 65 % REF_CLK peak-to-peak jitter tRMRJ — — 250 ps Rise time REF_CLK (20%–80%) tRMRR 1.0 — 2.0 ns Fall time REF_CLK (80%–20%) tRMRF 1.0 — 2.0 ns RXD[1:0], CRS_DV, RX_ER setup time to REF_CLK rising edge tRMRDV 4.0 — — ns RXD[1:0], CRS_DV, RX_ER hold time to REF_CLK rising edge tRMRDX 2.0 — — ns Parameter/Condition REF_CLK clock period REF_CLK duty cycle Note: 1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tMRDVKH symbolizes MII receive timing (MR) with respect to the time data input signals (D) reach the valid state (V) relative to the tMRX clock reference (K) going to the high (H) state or setup time. Also, tMRDXKL symbolizes MII receive timing (GR) with respect to the time data input signals (D) went invalid (X) relative to the tMRX clock reference (K) going to the low (L) state or hold time. Note that, in general, the clock reference symbol representation is based on three letters representing the clock of a particular functional. For example, the subscript of tMRX represents the MII (M) receive (RX) clock. For rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall). Figure 21 provides the AC test load for eTSEC. Z0 = 50 Ω Output RL = 50 Ω LVDD/2 Figure 21. eTSEC AC Test Load Figure 22 shows the RMII receive AC timing diagram. tRMRR tRMR REF_CLK tRMRH RXD[1:0] CRS_DV RX_ER tRMRF Valid Data tRMRDV tRMRDX Figure 22. RMII Receive AC Timing Diagram MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 42 Freescale Semiconductor Ethernet Management Interface Electrical Characteristics 9 Ethernet Management Interface Electrical Characteristics The electrical characteristics specified here apply to MII management interface signals MDIO (management data input/output) and MDC (management data clock). The electrical characteristics for GMII, RGMII, RMII, TBI and RTBI are specified in “Section 8, “Ethernet: Enhanced Three-Speed Ethernet (eTSEC), MII Management.” 9.1 MII Management DC Electrical Characteristics The MDC and MDIO are defined to operate at a supply voltage of 3.3 V. The DC electrical characteristics for MDIO and MDC are provided in Table 38. Table 38. MII Management DC Electrical Characteristics Parameter Symbol Min Max Unit OVDD 3.135 3.465 V Output high voltage (OVDD = Min, IOH = –1.0 mA) VOH 2.10 — V Output low voltage (OVDD =Min, IOL = 1.0 mA) VOL — 0.50 V Input high voltage VIH 1.70 — V Input low voltage VIL — 0.90 V Input high current (OVDD = Max, VIN 1 = 2.1 V) IIH — 40 μA Input low current (OVDD = Max, VIN = 0.5 V) IIL –600 — μA Supply voltage (3.3 V) Note: 1. Note that the symbol VIN, in this case, represents the OVIN symbol referenced in Table 1 and Table 2. 9.2 MII Management AC Electrical Specifications Table 39 provides the MII management AC timing specifications. Table 39. MII Management AC Timing Specifications At recommended operating conditions with OVDD is 3.3 V ± 5%. Symbol 1 Min Typ Max Unit Notes MDC frequency fMDC 2.5 — 9.3 MHz 2, 4 MDC period tMDC 80 — 400 ns — MDC clock pulse width high tMDCH 32 — — ns — MDC to MDIO valid tMDKHDV 16*tMPXCLK — — ns 5 MDC to MDIO delay tMDKHDX 10 — 16*tMPXCLK ns 3, 5 MDIO to MDC setup time tMDDVKH 5 — — ns — Parameter/Condition MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 43 Ethernet Management Interface Electrical Characteristics Table 39. MII Management AC Timing Specifications (continued) At recommended operating conditions with OVDD is 3.3 V ± 5%. Symbol 1 Min Typ Max Unit Notes tMDDXKH 0 — — ns — MDC rise time tMDCR — — 10 ns 4 MDC fall time tMDHF — — 10 ns 4 Parameter/Condition MDIO to MDC hold time Notes: 1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tMDKHDX symbolizes management data timing (MD) for the time tMDC from clock reference (K) high (H) until data outputs (D) are invalid (X) or data hold time. Also, tMDDVKH symbolizes management data timing (MD) with respect to the time data input signals (D) reach the valid state (V) relative to the tMDC clock reference (K) going to the high (H) state or setup time. For rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall). 2. This parameter is dependent on the system clock speed. (The maximum frequency is the maximum platform frequency divided by 64.) 3. This parameter is dependent on the system clock speed. (That is, for a system clock of 267 MHz, the maximum frequency is 8.3 MHz and the minimum frequency is 1.2 MHz; for a system clock of 375 MHz, the maximum frequency is 11.7 MHz and the minimum frequency is 1.7 MHz.) 4. Guaranteed by design. 5. tMPXCLK is the platform (MPX) clock Figure 23 provides the AC test load for eTSEC. Z0 = 50 Ω Output RL = 50 Ω OVDD/2 Figure 23. eTSEC AC Test Load NOTE Output will see a 50-Ω load since what it sees is the transmission line. Figure 24 shows the MII management AC timing diagram. tMDCR tMDC MDC tMDCF tMDCH MDIO (Input) tMDDVKH tMDDXKH MDIO (Output) tMDKHDX Figure 24. MII Management Interface Timing Diagram MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 44 Freescale Semiconductor Local Bus 10 Local Bus This section describes the DC and AC electrical specifications for the local bus interface of the MPC8641. 10.1 Local Bus DC Electrical Characteristics Table 40 provides the DC electrical characteristics for the local bus interface operating at OVDD = 3.3 V DC. Table 40. Local Bus DC Electrical Characteristics (3.3 V DC) Parameter Symbol Min Max Unit High-level input voltage VIH 2 OVDD + 0.3 V Low-level input voltage VIL –0.3 0.8 V Input current (VIN 1 = 0 V or VIN = OVDD) IIN — ±5 μA High-level output voltage (OVDD = min, IOH = –2 mA) VOH OVDD – 0.2 — V Low-level output voltage (OVDD = min, IOL = 2 mA) VOL — 0.2 V Note: 1. Note that the symbol VIN, in this case, represents the OVIN symbol referenced in Table 1 and Table 2. 10.2 Local Bus AC Electrical Specifications Table 41 describes the timing parameters of the local bus interface at OVDD = 3.3 V with PLL enabled. For information about the frequency range of local bus see Section 18.1, “Clock Ranges.” Table 41. Local Bus Timing Parameters (OVDD = 3.3 V)m - PLL Enabled Symbol 1 Min Max Unit Notes Local bus cycle time tLBK 7.5 — ns 2 Local Bus Duty Cycle tLBKH/tLBK 45 55 % — LCLK[n] skew to LCLK[m] or LSYNC_OUT tLBKSKEW — 150 ps 7, 8 Input setup to local bus clock (except LGTA/LUPWAIT) tLBIVKH1 1.8 — ns 3, 4 LGTA/LUPWAIT input setup to local bus clock tLBIVKH2 1.7 — ns 3, 4 Input hold from local bus clock (except LGTA/LUPWAIT) tLBIXKH1 1.0 — ns 3, 4 LGTA/LUPWAIT input hold from local bus clock tLBIXKH2 1.0 — ns 3, 4 LALE output transition to LAD/LDP output transition (LATCH hold time) tLBOTOT 1.5 — ns 6 Local bus clock to output valid (except LAD/LDP and LALE) tLBKHOV1 — 2.0 ns — Local bus clock to data valid for LAD/LDP tLBKHOV2 — 2.2 ns — Local bus clock to address valid for LAD tLBKHOV3 — 2.3 ns — Parameter MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 45 Local Bus Table 41. Local Bus Timing Parameters (OVDD = 3.3 V)m - PLL Enabled (continued) Symbol 1 Min Max Unit Notes Local bus clock to LALE assertion tLBKHOV4 — 2.3 ns 3 Output hold from local bus clock (except LAD/LDP and LALE) tLBKHOX1 0.7 — ns — Output hold from local bus clock for LAD/LDP tLBKHOX2 0.7 — ns 3 Local bus clock to output high Impedance (except LAD/LDP and LALE) tLBKHOZ1 — 2.5 ns 5 Local bus clock to output high impedance for LAD/LDP tLBKHOZ2 — 2.5 ns 5 Parameter Note: 1. The symbols used for timing specifications herein follow the pattern of t(First two letters of functional block)(signal)(state) (reference)(state) for inputs and t(First two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tLBIXKH1 symbolizes local bus timing (LB) for the input (I) to go invalid (X) with respect to the time the tLBK clock reference (K) goes high (H), in this case for clock one(1). Also, tLBKHOX symbolizes local bus timing (LB) for the tLBK clock reference (K) to go high (H), with respect to the output (O) going invalid (X) or output hold time. 2. All timings are in reference to LSYNC_IN for PLL enabled and internal local bus clock for PLL bypass mode. 3. All signals are measured from OVDD/2 of the rising edge of LSYNC_IN for PLL enabled or internal local bus clock for PLL bypass mode to 0.4 × OVDD of the signal in question for 3.3-V signaling levels. 4. Input timings are measured at the pin. 5. For purposes of active/float timing measurements, the Hi-Z or off state is defined to be when the total current delivered through the component pin is less than or equal to the leakage current specification. 6. tLBOTOT is a measurement of the minimum time between the negation of LALE and any change in LAD. tLBOTOT is programmed with the LBCR[AHD] parameter. 7. Maximum possible clock skew between a clock LCLK[m] and a relative clock LCLK[n]. Skew measured between complementary signals at BVDD/2. 8. Guaranteed by design. Figure 25 provides the AC test load for the local bus. Output Z0 = 50 Ω RL = 50 Ω OVDD/2 Figure 25. Local Bus AC Test Load MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 46 Freescale Semiconductor Local Bus Figure 26 to Figure 31 show the local bus signals. LSYNC_IN tLBIXKH1 tLBIVKH1 Input Signals: LAD[0:31]/LDP[0:3] tLBIXKH2 tLBIVKH2 Input Signal: LGTA LUPWAIT Output Signals: LA[27:31]/LBCTL/LBCKE/LOE/ LSDA10/LSDWE/LSDRAS/ LSDCAS/LSDDQM[0:3] tLBKHOV1 tLBKHOZ1 tLBKHOX1 tLBKHOV2 tLBKHOZ2 tLBKHOX2 Output (Data) Signals: LAD[0:31]/LDP[0:3] tLBKHOV3 tLBKHOZ2 tLBKHOX2 Output (Address) Signal: LAD[0:31] tLBOTOT tLBKHOV4 LALE Figure 26. Local Bus Signals (PLL Enabled) NOTE PLL bypass mode is recommended when LBIU frequency is at or below 83 MHz. When LBIU operates above 83 MHz, LBIU PLL is recommended to be enabled. Table 42 describes the general timing parameters of the local bus interface at OVDD = 3.3 V with PLL bypassed. Table 42. Local Bus Timing Parameters—PLL Bypassed Symbol 1 Min Max Unit Notes Local bus cycle time tLBK 12 — ns 2 Local bus duty cycle tLBKH/tLBK 45 55 % — Internal launch/capture clock to LCLK delay tLBKHKT 2.3 3.9 ns 8 Input setup to local bus clock (except LGTA/LUPWAIT) tLBIVKH1 5.7 — ns 4, 5 LGTA/LUPWAIT input setup to local bus clock tLBIVKL2 5.6 — ns 4, 5 Input hold from local bus clock (except LGTA/LUPWAIT) tLBIXKH1 –1.8 — ns 4, 5 Parameter MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 47 Local Bus Table 42. Local Bus Timing Parameters—PLL Bypassed (continued) Symbol 1 Min Max Unit Notes LGTA/LUPWAIT input hold from local bus clock tLBIXKL2 –1.3 — ns 4, 5 LALE output transition to LAD/LDP output transition (LATCH hold time) tLBOTOT 1.5 — ns 6 Local bus clock to output valid (except LAD/LDP and LALE) tLBKLOV1 — –0.3 ns Local bus clock to data valid for LAD/LDP tLBKLOV2 — –0.1 ns 4 Local bus clock to address valid for LAD tLBKLOV3 — 0 ns 4 Local bus clock to LALE assertion tLBKLOV4 — 0 ns 4 Output hold from local bus clock (except LAD/LDP and LALE) tLBKLOX1 –3.2 — ns 4 Output hold from local bus clock for LAD/LDP tLBKLOX2 –3.2 — ns 4 Local bus clock to output high Impedance (except LAD/LDP and LALE) tLBKLOZ1 — 0.2 ns 7 Local bus clock to output high impedance for LAD/LDP tLBKLOZ2 — 0.2 ns 7 Parameter Notes: 1. The symbols used for timing specifications herein follow the pattern of t(First two letters of functional block)(signal)(state) (reference)(state) for inputs and t(First two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tLBIXKH1 symbolizes local bus timing (LB) for the input (I) to go invalid (X) with respect to the time the tLBK clock reference (K) goes high (H), in this case for clock one(1). Also, tLBKHOX symbolizes local bus timing (LB) for the tLBK clock reference (K) to go high (H), with respect to the output (O) going invalid (X) or output hold time. 2. All timings are in reference to local bus clock for PLL bypass mode. Timings may be negative with respect to the local bus clock because the actual launch and capture of signals is done with the internal launch/capture clock, which precedes LCLK by tLBKHKT. 3. Maximum possible clock skew between a clock LCLK[m] and a relative clock LCLK[n]. Skew measured between complementary signals at BVDD/2. 4. All signals are measured from BVDD/2 of the rising edge of local bus clock for PLL bypass mode to 0.4 x BVDD of the signal in question for 3.3-V signaling levels. 5. Input timings are measured at the pin. 6. The value of tLBOTOT is the measurement of the minimum time between the negation of LALE and any change in LAD 7. For purposes of active/float timing measurements, the Hi-Z or off state is defined to be when the total current delivered through the component pin is less than or equal to the leakage current specification. 8. Guaranteed by characterization. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 48 Freescale Semiconductor Local Bus Internal launch/capture clock tLBKHKT LCLK[n] tLBIVKH1 tLBIXKH1 Input Signals: LAD[0:31]/LDP[0:3] tLBIVKL2 Input Signal: LGTA tLBIXKL2 LUPWAIT tLBKLOV1 tLBKLOX1 Output Signals: LA[27:31]/LBCTL/LBCKE/LOE/ LSDA10/LSDWE/LSDRAS/ LSDCAS/LSDDQM[0:3] tLBKLOZ1 tLBKLOZ2 tLBKLOV2 Output (Data) Signals: LAD[0:31]/LDP[0:3] tLBKLOX2 tLBKLOV3 Output (Address) Signal: LAD[0:31] tLBKLOV4 tLBOTOT LALE Figure 27. Local Bus Signals (PLL Bypass Mode) NOTE In PLL bypass mode, LCLK[n] is the inverted version of the internal clock with the delay of tLBKHKT. In this mode, signals are launched at the rising edge of the internal clock and are captured at falling edge of the internal clock, with the exception of the LGTA/LUPWAIT signal, which is captured at the rising edge of the internal clock. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 49 Local Bus LSYNC_IN T1 T3 GPCM Mode Output Signals: LCS[0:7]/LWE tLBKHOV1 tLBKHOZ1 GPCM Mode Input Signal: LGTA tLBIVKH2 tLBIXKH2 UPM Mode Input Signal: LUPWAIT tLBIVKH1 Input Signals: LAD[0:31]/LDP[0:3] tLBIXKH1 tLBKHOV1 tLBKHOZ1 UPM Mode Output Signals: LCS[0:7]/LBS[0:3]/LGPL[0:5] Figure 28. Local Bus Signals, GPCM/UPM Signals for LCRR[CLKDIV] = 2 (clock ratio of 4) (PLL Enabled) MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 50 Freescale Semiconductor Local Bus Internal launch/capture clock T1 T3 LCLK tLBKLOX1 tLBKLOV1 GPCM Mode Output Signals: LCS[0:7]/LWE tLBKLOZ1 GPCM Mode Input Signal: LGTA tLBIVKL2 tLBIXKL2 UPM Mode Input Signal: LUPWAIT tLBIVKH1 Input Signals: LAD[0:31]/LDP[0:3] tLBIXKH1 UPM Mode Output Signals: LCS[0:7]/LBS[0:3]/LGPL[0:5] Figure 29. Local Bus Signals, GPCM/UPM Signals for LCRR[CLKDIV] = 2 (clock ratio of 4) (PLL Bypass Mode) MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 51 Local Bus LSYNC_IN T1 T2 T3 T4 tLBKHOV1 tLBKHOZ1 GPCM Mode Output Signals: LCS[0:7]/LWE GPCM Mode Input Signal: LGTA tLBIVKH2 tLBIXKH2 UPM Mode Input Signal: LUPWAIT tLBIVKH1 Input Signals: LAD[0:31]/LDP[0:3] tLBIXKH1 tLBKHOV1 tLBKHOZ1 UPM Mode Output Signals: LCS[0:7]/LBS[0:3]/LGPL[0:5] Figure 30. Local Bus Signals, GPCM/UPM Signals for LCRR[CLKDIV] = 4 or 8 (clock ratio of 8 or 16) (PLL Enabled) MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 52 Freescale Semiconductor Local Bus Internal launch/capture clock T1 T2 T3 T4 LCLK tLBKLOX1 tLBKLOV1 GPCM Mode Output Signals: LCS[0:7]/LWE tLBKLOZ1 GPCM Mode Input Signal: LGTA tLBIVKL2 tLBIXKL2 UPM Mode Input Signal: LUPWAIT tLBIVKH1 Input Signals: LAD[0:31]/LDP[0:3] tLBIXKH1 UPM Mode Output Signals: LCS[0:7]/LBS[0:3]/LGPL[0:5] Figure 31. Local Bus Signals, GPCM/UPM Signals for LCRR[CLKDIV] = 4 or 8 (clock ratio of 8 or 16) (PLL Bypass Mode) MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 53 JTAG 11 JTAG This section describes the DC and AC electrical specifications for the IEEE 1149.1 (JTAG) interface of the MPC8641/D. 11.1 JTAG DC Electrical Characteristics Table 43 provides the DC electrical characteristics for the JTAG interface. Table 43. JTAG DC Electrical Characteristics Parameter Symbol Min Max Unit High-level input voltage VIH 2 OVDD + 0.3 V Low-level input voltage VIL – 0.3 0.8 V Input current (VIN 1 = 0 V or VIN = VDD) IIN — ±5 μA High-level output voltage (OVDD = min, IOH = –100 μA) VOH OVDD – 0.2 — V Low-level output voltage (OVDD = min, IOL = 100 μA) VOL — 0.2 V Note: 1. Note that the symbol VIN, in this case, represents the OVIN symbol referenced in Table 1 and Table 2. 11.2 JTAG AC Electrical Specifications Table 44 provides the JTAG AC timing specifications as defined in Figure 33 through Figure 35. Table 44. JTAG AC Timing Specifications (Independent of SYSCLK) 1 At recommended operating conditions (see Table 3). Symbol 2 Min Max Unit Notes JTAG external clock frequency of operation fJTG 0 33.3 MHz — JTAG external clock cycle time t JTG 30 — ns — tJTKHKL 15 — ns — tJTGR & tJTGF 0 2 ns 6 tTRST 25 — ns 3 Boundary-scan data TMS, TDI tJTDVKH tJTIVKH 4 0 — — Boundary-scan data TMS, TDI tJTDXKH tJTIXKH 20 25 — — Boundary-scan data TDO tJTKLDV tJTKLOV 4 4 20 25 Parameter JTAG external clock pulse width measured at 1.4 V JTAG external clock rise and fall times TRST assert time Input setup times: ns Input hold times: 4 ns Valid times: 4 ns 5 MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 54 Freescale Semiconductor JTAG Table 44. JTAG AC Timing Specifications (Independent of SYSCLK) 1 (continued) At recommended operating conditions (see Table 3). Symbol 2 Min Max Boundary-scan data TDO tJTKLDX tJTKLOX 30 30 — — JTAG external clock to output high impedance: Boundary-scan data TDO tJTKLDZ tJTKLOZ 3 3 19 9 Parameter Output hold times: Unit Notes ns 5, 6 ns 5, 6 Notes: 1. All outputs are measured from the midpoint voltage of the falling/rising edge of tTCLK to the midpoint of the signal in question. The output timings are measured at the pins. All output timings assume a purely resistive 50-Ω load (see Figure 32). Time-of-flight delays must be added for trace lengths, vias, and connectors in the system. 2. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tJTDVKH symbolizes JTAG device timing (JT) with respect to the time data input signals (D) reaching the valid state (V) relative to the tJTG clock reference (K) going to the high (H) state or setup time. Also, tJTDXKH symbolizes JTAG timing (JT) with respect to the time data input signals (D) went invalid (X) relative to the tJTG clock reference (K) going to the high (H) state. Note that, in general, the clock reference symbol representation is based on three letters representing the clock of a particular functional. For rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall). 3. TRST is an asynchronous level sensitive signal. The setup time is for test purposes only. 4. Non-JTAG signal input timing with respect to tTCLK. 5. Non-JTAG signal output timing with respect to tTCLK. 6. Guaranteed by design. Figure 32 provides the AC test load for TDO and the boundary-scan outputs. Z0 = 50 Ω Output RL = 50 Ω OVDD/2 Figure 32. AC Test Load for the JTAG Interface Figure 33 provides the JTAG clock input timing diagram. JTAG External Clock VM VM VM tJTGR tJTKHKL tJTG tJTGF VM = Midpoint Voltage (OVDD/2) Figure 33. JTAG Clock Input Timing Diagram MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 55 I2 C Figure 34 provides the TRST timing diagram. TRST VM VM tTRST VM = Midpoint Voltage (OVDD/2) Figure 34. TRST Timing Diagram Figure 35 provides the boundary-scan timing diagram. JTAG External Clock VM VM tJTDVKH tJTDXKH Boundary Data Inputs Input Data Valid tJTKLDV tJTKLDX Boundary Data Outputs Output Data Valid tJTKLDZ Boundary Data Outputs Output Data Valid VM = Midpoint Voltage (OVDD/2) Figure 35. Boundary-Scan Timing Diagram 12 I2C This section describes the DC and AC electrical characteristics for the I2C interfaces of the MPC8641. 12.1 I2C DC Electrical Characteristics Table 45 provides the DC electrical characteristics for the I2C interfaces. Table 45. I2C DC Electrical Characteristics At recommended operating conditions with OVDD of 3.3 V ± 5%. Parameter Symbol Min Max Unit Notes Input high voltage level VIH 0.7 × OVDD OVDD + 0.3 V — Input low voltage level VIL –0.3 0.3 × OVDD V — Low level output voltage VOL 0 0.2 × OVDD V 1 Pulse width of spikes which must be suppressed by the input filter tI2KHKL 0 50 ns 2 Input current each I/O pin (input voltage is between 0.1 × OVDD and 0.9 × OVDD(max) II –10 10 μA 3 MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 56 Freescale Semiconductor I2 C Table 45. I2C DC Electrical Characteristics (continued) At recommended operating conditions with OVDD of 3.3 V ± 5%. Parameter Symbol Min Max Unit Notes CI — 10 pF — Capacitance for each I/O pin Notes: 1. Output voltage (open drain or open collector) condition = 3 mA sink current. 2. Refer to the MPC8641 Integrated Host Processor Reference Manual for information on the digital filter used. 3. I/O pins will obstruct the SDA and SCL lines if OVDD is switched off. 12.2 I2C AC Electrical Specifications Table 46 provides the AC timing parameters for the I2C interfaces. Table 46. I2C AC Electrical Specifications All values refer to VIH (min) and VIL (max) levels (see Table 45). Parameter SCL clock frequency Symbol 1 Min Max Unit fI2C 0 400 kHz 1.3 — μs 4 Low period of the SCL clock tI2CL High period of the SCL clock tI2CH 4 0.6 — μs Setup time for a repeated START condition tI2SVKH 4 0.6 — μs Hold time (repeated) START condition (after this period, the first clock pulse is generated) tI2SXKL 4 0.6 — μs Data setup time tI2DVKH 4 100 — ns — 02 — — μs CB5 300 ns 300 ns 3 μs tI2DXKL Data input hold time: CBUS compatible masters I2C bus devices Rise time of both SDA and SCL signals tI2CR 20 + 0.1 Fall time of both SDA and SCL signals tI2CF 20 + 0.1 Cb 5 Data output delay time tI2OVKL — 0.9 Set-up time for STOP condition tI2PVKH 0.6 — μs Bus free time between a STOP and START condition tI2KHDX 1.3 — μs VNL 0.1 × OVDD — V Noise margin at the LOW level for each connected device (including hysteresis) MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 57 I2 C Table 46. I2C AC Electrical Specifications (continued) All values refer to VIH (min) and VIL (max) levels (see Table 45). Parameter Noise margin at the HIGH level for each connected device (including hysteresis) Symbol 1 Min Max Unit VNH 0.2 × OVDD — V Note: 1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tI2DVKH symbolizes I2C timing (I2) with respect to the time data input signals (D) reach the valid state (V) relative to the tI2C clock reference (K) going to the high (H) state or setup time. Also, tI2SXKL symbolizes I2C timing (I2) for the time that the data with respect to the start condition (S) went invalid (X) relative to the tI2C clock reference (K) going to the low (L) state or hold time. Also, tI2PVKH symbolizes I2C timing (I2) for the time that the data with respect to the stop condition (P) reaching the valid state (V) relative to the tI2C clock reference (K) going to the high (H) state or setup time. For rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall). 2. As a transmitter, the MPC8641 provides a delay time of at least 300 ns for the SDA signal (referred to the Vihmin of the SCL signal) to bridge the undefined region of the falling edge of SCL to avoid unintended generation of Start or Stop condition. When MPC8641 acts as the I2C bus master while transmitting, MPC8641 drives both SCL and SDA. As long as the load on SCL and SDA are balanced, MPC8641 would not cause unintended generation of Start or Stop condition. Therefore, the 300 ns SDA output delay time is not a concern. If, under some rare condition, the 300 ns SDA output delay time is required for MPC8641 as transmitter, the following setting is recommended for the FDR bit field of the I2CFDR register to ensure both the desired I2C SCL clock frequency and SDA output delay time are achieved, assuming that the desired I2C SCL clock frequency is 400 KHz and the Digital Filter Sampling Rate Register (I2CDFSRR) is programmed with its default setting of 0x10 (decimal 16): I2C Source Clock Frequency 333 MHz 266 MHz 200 MHz 133 MHz FDR Bit Setting 0x2A 0x05 0x26 0x00 Actual FDR Divider Selected 896 704 512 384 Actual I2C SCL Frequency Generated 371 KHz 378 KHz 390 KHz 346 KHz For the detail of I2C frequency calculation, refer to the application note AN2919 “Determining the I2C Frequency Divider Ratio for SCL”. Note that the I2C Source Clock Frequency is half of the MPX clock frequency for MPC8641. 3. The maximum tI2DXKL has only to be met if the device does not stretch the LOW period (tI2CL) of the SCL signal. 4. Guaranteed by design. 5. CB = capacitance of one bus line in pF. Figure 32 provides the AC test load for the I2C. Output Z0 = 50 Ω RL = 50 Ω OVDD/2 Figure 36. I2C AC Test Load MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 58 Freescale Semiconductor High-Speed Serial Interfaces (HSSI) Figure 37 shows the AC timing diagram for the I2C bus. SDA tI2CF tI2DVKH tI2CL tI2KHKL tI2SXKL tI2CF tI2CR SCL tI2SXKL tI2CH tI2DXKL S tI2SVKH Sr tI2PVKH P S Figure 37. I2C Bus AC Timing Diagram 13 High-Speed Serial Interfaces (HSSI) The MPC8641D features two Serializer/Deserializer (SerDes) interfaces to be used for high-speed serial interconnect applications. The SerDes1 interface is dedicated for PCI Express data transfers. The SerDes2 can be used for PCI Express and/or Serial RapidIO data transfers. This section describes the common portion of SerDes DC electrical specifications, which is the DC requirement for SerDes Reference Clocks. The SerDes data lane’s transmitter and receiver reference circuits are also shown. 13.1 Signal Terms Definition The SerDes utilizes differential signaling to transfer data across the serial link. This section defines terms used in the description and specification of differential signals. Figure 38 shows how the signals are defined. For illustration purpose, only one SerDes lane is used for description. The figure shows waveform for either a transmitter output (SDn_TX and SDn_TX) or a receiver input (SDn_RX and SDn_RX). Each signal swings between A Volts and B Volts where A > B. Using this waveform, the definitions are as follows. To simplify illustration, the following definitions assume that the SerDes transmitter and receiver operate in a fully symmetrical differential signaling environment. 1. Single-Ended Swing The transmitter output signals and the receiver input signals SDn_TX, SDn_TX, SDn_RX and SDn_RX each have a peak-to-peak swing of A – B Volts. This is also referred as each signal wire’s Single-Ended Swing. 2. Differential Output Voltage, VOD (or Differential Output Swing): The Differential Output Voltage (or Swing) of the transmitter, VOD, is defined as the difference of the two complimentary output voltages: VSDn_TX – VSDn_TX. The VOD value can be either positive or negative. 3. Differential Input Voltage, VID (or Differential Input Swing): MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 59 High-Speed Serial Interfaces (HSSI) 4. 5. 6. 7. The Differential Input Voltage (or Swing) of the receiver, VID, is defined as the difference of the two complimentary input voltages: VSDn_RX – VSDn_RX. The VID value can be either positive or negative. Differential Peak Voltage, VDIFFp The peak value of the differential transmitter output signal or the differential receiver input signal is defined as Differential Peak Voltage, VDIFFp = |A – B| Volts. Differential Peak-to-Peak, VDIFFp-p Since the differential output signal of the transmitter and the differential input signal of the receiver each range from A – B to –(A – B) Volts, the peak-to-peak value of the differential transmitter output signal or the differential receiver input signal is defined as Differential Peak-to-Peak Voltage, VDIFFp-p = 2*VDIFFp = 2 * |(A – B)| Volts, which is twice of differential swing in amplitude, or twice of the differential peak. For example, the output differential peak-peak voltage can also be calculated as VTX-DIFFp-p = 2*|VOD|. Differential Waveform The differential waveform is constructed by subtracting the inverting signal (SDn_TX, for example) from the non-inverting signal (SDn_TX, for example) within a differential pair. There is only one signal trace curve in a differential waveform. The voltage represented in the differential waveform is not referenced to ground. Refer to Figure 47 as an example for differential waveform. Common Mode Voltage, Vcm The Common Mode Voltage is equal to one half of the sum of the voltages between each conductor of a balanced interchange circuit and ground. In this example, for SerDes output, Vcm_out = (VSDn_TX + VSDn_TX)/2 = (A + B) / 2, which is the arithmetic mean of the two complimentary output voltages within a differential pair. In a system, the common mode voltage may often differ from one component’s output to the other’s input. Sometimes, it may be even different between the receiver input and driver output circuits within the same component. It is also referred as the DC offset in some occasion. SDn_TX or SDn_RX A Volts Vcm = (A + B) / 2 SDn_TX or SDn_RX B Volts Differential Swing, VID or VOD = A - B Differential Peak Voltage, VDIFFp = |A - B| Differential Peak-Peak Voltage, VDIFFpp = 2*VDIFFp (not shown) Figure 38. Differential Voltage Definitions for Transmitter or Receiver MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 60 Freescale Semiconductor High-Speed Serial Interfaces (HSSI) To illustrate these definitions using real values, consider the case of a CML (Current Mode Logic) transmitter that has a common mode voltage of 2.25 V and each of its outputs, TD and TD, has a swing that goes between 2.5 V and 2.0 V. Using these values, the peak-to-peak voltage swing of each signal (TD or TD) is 500 mV p-p, which is referred as the single-ended swing for each signal. In this example, since the differential signaling environment is fully symmetrical, the transmitter output’s differential swing (VOD) has the same amplitude as each signal’s single-ended swing. The differential output signal ranges between 500 mV and –500 mV, in other words, VOD is 500 mV in one phase and –500 mV in the other phase. The peak differential voltage (VDIFFp) is 500 mV. The peak-to-peak differential voltage (VDIFFp-p) is 1000 mV p-p. 13.2 SerDes Reference Clocks The SerDes reference clock inputs are applied to an internal PLL whose output creates the clock used by the corresponding SerDes lanes. The SerDes reference clocks inputs are SDn_REF_CLK and SDn_REF_CLK for PCI Express and Serial RapidIO. The following sections describe the SerDes reference clock requirements and some application information. 13.2.1 SerDes Reference Clock Receiver Characteristics Figure 39 shows a receiver reference diagram of the SerDes reference clocks. • The supply voltage requirements for XVDD_SRDSn are specified in Table 1 and Table 2. • SerDes Reference Clock Receiver Reference Circuit Structure — The SDn_REF_CLK and SDn_REF_CLK are internally AC-coupled differential inputs as shown in Figure 39. Each differential clock input (SDn_REF_CLK or SDn_REF_CLK) has a 50-Ω termination to SGND followed by on-chip AC-coupling. — The external reference clock driver must be able to drive this termination. — The SerDes reference clock input can be either differential or single-ended. Refer to the Differential Mode and Single-ended Mode description below for further detailed requirements. • The maximum average current requirement that also determines the common mode voltage range — When the SerDes reference clock differential inputs are DC coupled externally with the clock driver chip, the maximum average current allowed for each input pin is 8 mA. In this case, the exact common mode input voltage is not critical as long as it is within the range allowed by the maximum average current of 8 mA (refer to the following bullet for more detail), since the input is AC-coupled on-chip. — This current limitation sets the maximum common mode input voltage to be less than 0.4 V (0.4 V/50 = 8 mA) while the minimum common mode input level is 0.1 V above SGND. For example, a clock with a 50/50 duty cycle can be produced by a clock driver with output driven by its current source from 0 mA to 16 mA (0–0.8 V), such that each phase of the differential input has a single-ended swing from 0 V to 800 mV with the common mode voltage at 400 mV. — If the device driving the SDn_REF_CLK and SDn_REF_CLK inputs cannot drive 50 Ω to SGND DC, or it exceeds the maximum input current limitations, then it must be AC-coupled off-chip. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 61 High-Speed Serial Interfaces (HSSI) • The input amplitude requirement — This requirement is described in detail in the following sections. 50 Ω SDn_REF_CLK Input Amp SDn_REF_CLK 50 Ω Figure 39. Receiver of SerDes Reference Clocks 13.2.2 DC Level Requirement for SerDes Reference Clocks The DC level requirement for the MPC8641D SerDes reference clock inputs is different depending on the signaling mode used to connect the clock driver chip and SerDes reference clock inputs as described below. • Differential Mode — The input amplitude of the differential clock must be between 400 mV and 1600 mV differential peak-peak (or between 200 mV and 800 mV differential peak). In other words, each signal wire of the differential pair must have a single-ended swing less than 800mV and greater than 200 mV. This requirement is the same for both external DC-coupled or AC-coupled connection. — For external DC-coupled connection, as described in Section 13.2.1, “SerDes Reference Clock Receiver Characteristics,” the maximum average current requirements sets the requirement for average voltage (common mode voltage) to be between 100 mV and 400 mV. Figure 40 shows the SerDes reference clock input requirement for DC-coupled connection scheme. — For external AC-coupled connection, there is no common mode voltage requirement for the clock driver. Since the external AC-coupling capacitor blocks the DC level, the clock driver and the SerDes reference clock receiver operate in different command mode voltages. The SerDes reference clock receiver in this connection scheme has its common mode voltage set to SGND. Each signal wire of the differential inputs is allowed to swing below and above the command mode voltage (SGND). Figure 41 shows the SerDes reference clock input requirement for AC-coupled connection scheme. • Single-ended Mode — The reference clock can also be single-ended. The SDn_REF_CLK input amplitude (single-ended swing) must be between 400 mV and 800 mV peak-peak (from Vmin to Vmax) with SDn_REF_CLK either left unconnected or tied to ground. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 62 Freescale Semiconductor High-Speed Serial Interfaces (HSSI) — The SDn_REF_CLK input average voltage must be between 200 and 400 mV. Figure 42 shows the SerDes reference clock input requirement for single-ended signaling mode. — To meet the input amplitude requirement, the reference clock inputs might need to be DC or AC-coupled externally. For the best noise performance, the reference of the clock could be DC or AC-coupled into the unused phase (SDn_REF_CLK) through the same source impedance as the clock input (SDn_REF_CLK) in use. 200 mV < Input Amplitude or Differential Peak < 800 mV SDn_REF_CLK Vmax < 800 mV 100 mV < Vcm < 400 mV Vmin > 0V SDn_REF_CLK Figure 40. Differential Reference Clock Input DC Requirements (External DC-Coupled) 200 mV < Input Amplitude or Differential Peak < 800 mV SDn_REF_CLK Vmax < Vcm + 400 mV Vcm Vmin > Vcm - 400 mV SDn_REF_CLK Figure 41. Differential Reference Clock Input DC Requirements (External AC-Coupled) 400 mV < SDn_REF_CLK Input Amplitude < 800 mV SDn_REF_CLK 0V SDn_REF_CLK Figure 42. Single-Ended Reference Clock Input DC Requirements MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 63 High-Speed Serial Interfaces (HSSI) 13.2.3 Interfacing With Other Differential Signaling Levels With on-chip termination to SGND, the differential reference clocks inputs are HCSL (High-Speed Current Steering Logic) compatible DC-coupled. Many other low voltage differential type outputs like LVDS (Low Voltage Differential Signaling) can be used but may need to be AC-coupled due to the limited common mode input range allowed (100 to 400 mV) for DC-coupled connection. LVPECL outputs can produce signal with too large amplitude and may need to be DC-biased at clock driver output first, then followed with series attenuation resistor to reduce the amplitude, in addition to AC-coupling. NOTE Figure 43 to Figure 46 below are for conceptual reference only. Due to the fact that clock driver chip's internal structure, output impedance and termination requirements are different between various clock driver chip manufacturers, it is very possible that the clock circuit reference designs provided by clock driver chip vendor are different from what is shown below. They might also vary from one vendor to the other. Therefore, Freescale Semiconductor can neither provide the optimal clock driver reference circuits, nor guarantee the correctness of the following clock driver connection reference circuits. The system designer is recommended to contact the selected clock driver chip vendor for the optimal reference circuits with the MPC8641D SerDes reference clock receiver requirement provided in this document. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 64 Freescale Semiconductor High-Speed Serial Interfaces (HSSI) Figure 43 shows the SerDes reference clock connection reference circuits for HCSL type clock driver. It assumes that the DC levels of the clock driver chip is compatible with MPC8641D SerDes reference clock input’s DC requirement. MPC8641D HCSL CLK Driver Chip CLK_Out 33 Ω SDn_REF_CLK 50 Ω SerDes Refer. CLK Receiver 100 Ω differential PWB trace Clock Driver 33 Ω SDn_REF_CLK CLK_Out Total 50 Ω. Assume clock driver’s output impedance is about 16 Ω. 50 Ω Clock driver vendor dependent source termination resistor Figure 43. DC-Coupled Differential Connection with HCSL Clock Driver (Reference Only) Figure 44 shows the SerDes reference clock connection reference circuits for LVDS type clock driver. Since LVDS clock driver’s common mode voltage is higher than the MPC8641D SerDes reference clock input’s allowed range (100 to 400 mV), AC-coupled connection scheme must be used. It assumes the LVDS output driver features 50-Ω termination resistor. It also assumes that the LVDS transmitter establishes its own common mode level without relying on the receiver or other external component. MPC8641D LVDS CLK Driver Chip CLK_Out 10 nF 50 Ω SerDes Refer. CLK Receiver 100 Ω differential PWB trace Clock Driver CLK_Out SDn_REF_CLK 10 nF SDn_REF_CLK 50 Ω Figure 44. AC-Coupled Differential Connection with LVDS Clock Driver (Reference Only) Figure 45 shows the SerDes reference clock connection reference circuits for LVPECL type clock driver. Since LVPECL driver’s DC levels (both common mode voltages and output swing) are incompatible with MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 65 High-Speed Serial Interfaces (HSSI) MPC8641D SerDes reference clock input’s DC requirement, AC-coupling has to be used. Figure 45 assumes that the LVPECL clock driver’s output impedance is 50 Ω. R1 is used to DC-bias the LVPECL outputs prior to AC-coupling. Its value could be ranged from 140 Ω to 240 Ω depending on clock driver vendor’s requirement. R2 is used together with the SerDes reference clock receiver’s 50-Ω termination resistor to attenuate the LVPECL output’s differential peak level such that it meets the MPC8641D SerDes reference clock’s differential input amplitude requirement (between 200 mV and 800 mV differential peak). For example, if the LVPECL output’s differential peak is 900 mV and the desired SerDes reference clock input amplitude is selected as 600mV, the attenuation factor is 0.67, which requires R2 = 25 Ω. Please consult clock driver chip manufacturer to verify whether this connection scheme is compatible with a particular clock driver chip. LVPECL CLK Driver Chip MPC8641D CLK_Out Clock Driver R2 10nF SDn_REF_CLK 50 Ω R1 100 Ω differential PWB trace R2 SerDes Refer. CLK Receiver 10nF SDn_REF_CLK CLK_Out R1 50 Ω Figure 45. AC-Coupled Differential Connection with LVPECL Clock Driver (Reference Only) MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 66 Freescale Semiconductor High-Speed Serial Interfaces (HSSI) Figure 46 shows the SerDes reference clock connection reference circuits for a single-ended clock driver. It assumes the DC levels of the clock driver are compatible with MPC8641D SerDes reference clock input’s DC requirement. Single-Ended CLK Driver Chip MPC8641D Total 50 Ω. Assume clock driver’s output impedance is about 16 Ω. SDn_REF_CLK 33 Ω Clock Driver CLK_Out 50 Ω SerDes Refer. CLK Receiver 100 Ω differential PWB trace 50 Ω SDn_REF_CLK 50 Ω Figure 46. Single-Ended Connection (Reference Only) MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 67 High-Speed Serial Interfaces (HSSI) 13.2.4 AC Requirements for SerDes Reference Clocks The clock driver selected should provide a high quality reference clock with low phase noise and cycle-to-cycle jitter. Phase noise less than 100 kHz can be tracked by the PLL and data recovery loops and is less of a problem. Phase noise above 15 MHz is filtered by the PLL. The most problematic phase noise occurs in the 1–15 MHz range. The source impedance of the clock driver should be 50 Ω to match the transmission line and reduce reflections which are a source of noise to the system. Table 47 describes some AC parameters common to PCI Express and Serial RapidIO protocols. Table 47. SerDes Reference Clock Common AC Parameters At recommended operating conditions with XVDD_SRDS1 or XVDD_SRDS2 = 1.1V ± 5% and 1.05V ± 5%. Parameter Symbol Min Max Unit Notes Rising Edge Rate Rise Edge Rate 1.0 4.0 V/ns 2, 3 Falling Edge Rate Fall Edge Rate 1.0 4.0 V/ns 2, 3 Differential Input High Voltage VIH +200 mV 2 Differential Input Low Voltage VIL — –200 mV 2 Rise-Fall Matching — 20 % 1, 4 Rising edge rate (SDn_REF_CLK) to falling edge rate (SDn_REF_CLK) matching Notes: 1. Measurement taken from single ended waveform. 2. Measurement taken from differential waveform. 3. Measured from –200 mV to +200 mV on the differential waveform (derived from SDn_REF_CLK minus SDn_REF_CLK). The signal must be monotonic through the measurement region for rise and fall time. The 400 mV measurement window is centered on the differential zero crossing. See Figure 47. 4. Matching applies to rising edge rate for SDn_REF_CLK and falling edge rate for SDn_REF_CLK. It is measured using a 200 mV window centered on the median cross point where SDn_REF_CLK rising meets SDn_REF_CLK falling. The median cross point is used to calculate the voltage thresholds the oscilloscope is to use for the edge rate calculations. The Rise Edge Rate of SDn_REF_CLK should be compared to the Fall Edge Rate of SDn_REF_CLK, the maximum allowed difference should not exceed 20% of the slowest edge rate. See Figure 48. Rise Edge Rate Fall Edge Rate VIH = +200 mV 0.0 V VIL = –200 mV SD_REF_CLKn – SD_REF_CLKn Figure 47. Differential Measurement Points for Rise and Fall Time MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 68 Freescale Semiconductor PCI Express SDn_REF_CLK SDn_REF_CLK SDn_REF_CLK SDn_REF_CLK Figure 48. Single-Ended Measurement Points for Rise and Fall Time Matching The other detailed AC requirements of the SerDes Reference Clocks is defined by each interface protocol based on application usage. Refer to the following sections for detailed information: • Section 14.2, “AC Requirements for PCI Express SerDes Clocks” • Section 15.2, “AC Requirements for Serial RapidIO SDn_REF_CLK and SDn_REF_CLK” 13.3 SerDes Transmitter and Receiver Reference Circuits Figure 49 shows the reference circuits for SerDes data lane’s transmitter and receiver. 50 Ω SD1_TXn or SD2_TXn SD1_RXn or SD2_RXn 50 Ω Transmitter Receiver 50 Ω SD1_TXn or SD2_TXn SD1_RXn or SD2_RXn 50 Ω Figure 49. SerDes Transmitter and Receiver Reference Circuits The DC and AC specification of SerDes data lanes are defined in each interface protocol section below (PCI Express or Serial Rapid IO) in this document based on the application usage:” • Section 14, “PCI Express” • Section 15, “Serial RapidIO” Note that external AC Coupling capacitor is required for the above two serial transmission protocols with the capacitor value defined in specification of each protocol section. 14 PCI Express This section describes the DC and AC electrical specifications for the PCI Express bus of the MPC8641. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 69 PCI Express 14.1 DC Requirements for PCI Express SDn_REF_CLK and SDn_REF_CLK For more information, see Section 13.2, “SerDes Reference Clocks.” 14.2 AC Requirements for PCI Express SerDes Clocks Table 48 lists AC requirements. Table 48. SDn_REF_CLK and SDn_REF_CLK AC Requirements Symbol Min Typical Max Units Notes REFCLK cycle time — 10 — ns — tREFCJ REFCLK cycle-to-cycle jitter. Difference in the period of any two adjacent REFCLK cycles — — 100 ps — tREFPJ Phase jitter. Deviation in edge location with respect to mean edge location –50 — 50 ps — tREF Parameter Description 14.3 Clocking Dependencies The ports on the two ends of a link must transmit data at a rate that is within 600 parts per million (ppm) of each other at all times. This is specified to allow bit rate clock sources with a +/– 300 ppm tolerance. 14.4 Physical Layer Specifications The following is a summary of the specifications for the physical layer of PCI Express on this device. For further details as well as the specifications of the Transport and Data Link layer please use the PCI EXPRESS Base Specification. REV. 1.0a document. 14.4.1 Differential Transmitter (TX) Output Table 49 defines the specifications for the differential output at all transmitters (TXs). The parameters are specified at the component pins. Table 49. Differential Transmitter (TX) Output Specifications Symbol Parameter Min Nom Max Units Comments 399.88 400 400.12 ps Each UI is 400 ps ± 300 ppm. UI does not account for Spread Spectrum Clock dictated variations. See Note 1. UI Unit Interval VTX-DIFFp-p Differential Peak-to-Peak Output Voltage 0.8 — 1.2 V VTX-DIFFp-p = 2*|VTX-D+ – VTX-D-| See Note 2. VTX-DE-RATIO De- Emphasized Differential Output Voltage (Ratio) –3.0 –3.5 –4.0 dB Ratio of the VTX-DIFFp-p of the second and following bits after a transition divided by the VTX-DIFFp-p of the first bit after a transition. See Note 2. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 70 Freescale Semiconductor PCI Express Table 49. Differential Transmitter (TX) Output Specifications (continued) Symbol Parameter Min Nom Max Units TTX-EYE Minimum TX Eye Width 0.70 — — UI The maximum Transmitter jitter can be derived as TTX-MAX-JITTER = 1 – TTX-EYE= 0.3 UI. See Notes 2 and 3. TTX-EYE-MEDIAN-to- Maximum time between the jitter median and maximum deviation from the median. — — 0.15 UI Jitter is defined as the measurement variation of the crossing points (VTX-DIFFp-p = 0 V) in relation to a recovered TX UI. A recovered TX UI is calculated over 3500 consecutive unit intervals of sample data. Jitter is measured using all edges of the 250 consecutive UI in the center of the 3500 UI used for calculating the TX UI. See Notes 2 and 3. MAX-JITTER Comments TTX-RISE, TTX-FALL D+/D– TX Output 0.125 Rise/Fall Time — — UI See Notes 2 and 5 VTX-CM-ACp RMS AC Peak Common Mode Output Voltage — — 20 mV VTX-CM-ACp = RMS(|VTXD+ + VTXD-|/2 – VTX-CM-DC) VTX-CM-DC = DC(avg) of |VTX-D+ + VTX-D-|/2 See Note 2 VTX-CM-DC-ACTIVE- Absolute Delta of DC Common Mode Voltage During L0 and Electrical Idle 0 — 100 mV |VTX-CM-DC (during L0) – VTX-CM-Idle-DC (During Electrical Idle)| 175 mV 0.4 UI = TRX-EYE-MIN Figure 51. Minimum Receiver Eye Timing and Voltage Compliance Specification 14.5.1 Compliance Test and Measurement Load The AC timing and voltage parameters must be verified at the measurement point, as specified within 0.2 inches of the package pins, into a test/measurement load shown in Figure 52. NOTE The allowance of the measurement point to be within 0.2 inches of the package pins is meant to acknowledge that package/board routing may benefit from D+ and D– not being exactly matched in length at the package pin boundary. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 76 Freescale Semiconductor Serial RapidIO D+ Package Pin C = CTX TX Silicon + Package D– Package Pin C = CTX R = 50 Ω R = 50 Ω Figure 52. Compliance Test/Measurement Load 15 Serial RapidIO This section describes the DC and AC electrical specifications for the RapidIO interface of the MPC8641, for the LP-Serial physical layer. The electrical specifications cover both single and multiple-lane links. Two transmitter types (short run and long run) on a single receiver are specified for each of three baud rates, 1.25, 2.50, and 3.125 GBaud. Two transmitter specifications allow for solutions ranging from simple board-to-board interconnect to driving two connectors across a backplane. A single receiver specification is given that will accept signals from both the short run and long run transmitter specifications. The short run transmitter specifications should be used mainly for chip-to-chip connections on either the same printed circuit board or across a single connector. This covers the case where connections are made to a mezzanine (daughter) card. The minimum swings of the short run specification reduce the overall power used by the transceivers. The long run transmitter specifications use larger voltage swings that are capable of driving signals across backplanes. This allows a user to drive signals across two connectors and a backplane. The specifications allow a distance of at least 50 cm at all baud rates. All unit intervals are specified with a tolerance of +/– 100 ppm. The worst case frequency difference between any transmit and receive clock will be 200 ppm. To ensure interoperability between drivers and receivers of different vendors and technologies, AC coupling at the receiver input must be used. 15.1 DC Requirements for Serial RapidIO SDn_REF_CLK and SDn_REF_CLK For more information, see Section 13.2, “SerDes Reference Clocks.” 15.2 AC Requirements for Serial RapidIO SDn_REF_CLK and SDn_REF_CLK Table 51 lists AC requirements. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 77 Serial RapidIO Table 51. SDn_REF_CLK and SDn_REF_CLK AC Requirements Symbol Parameter Description Min Typical Max Units Comments REFCLK cycle time — 10(8) — ns tREFCJ REFCLK cycle-to-cycle jitter. Difference in the period of any two adjacent REFCLK cycles — — 80 ps — tREFPJ Phase jitter. Deviation in edge location with respect to mean edge location –40 — 40 ps — tREF 15.3 8 ns applies only to serial RapidIO with 125-MHz reference clock Signal Definitions LP-Serial links use differential signaling. This section defines terms used in the description and specification of differential signals. Figure 53 shows how the signals are defined. The figures show waveforms for either a transmitter output (TD and TD) or a receiver input (RD and RD). Each signal swings between A Volts and B Volts where A > B. Using these waveforms, the definitions are as follows: 1. The transmitter output signals and the receiver input signals TD, TD, RD and RD each have a peak-to-peak swing of A – B Volts 2. The differential output signal of the transmitter, VOD, is defined as VTD–VTD 3. The differential input signal of the receiver, VID, is defined as VRD–VRD 4. The differential output signal of the transmitter and the differential input signal of the receiver each range from A – B to –(A – B) Volts 5. The peak value of the differential transmitter output signal and the differential receiver input signal is A – B Volts 6. The peak-to-peak value of the differential transmitter output signal and the differential receiver input signal is 2 * (A – B) Volts A Volts B Volts TD or RD TD or RD Differential Peak-Peak = 2 * (A-B) Figure 53. Differential Peak-Peak Voltage of Transmitter or Receiver To illustrate these definitions using real values, consider the case of a CML (Current Mode Logic) transmitter that has a common mode voltage of 2.25 V and each of its outputs, TD and TD, has a swing that goes between 2.5V and 2.0V. Using these values, the peak-to-peak voltage swing of the signals TD and TD is 500 mV p-p. The differential output signal ranges between 500 mV and –500 mV. The peak differential voltage is 500 mV. The peak-to-peak differential voltage is 1000 mV p-p. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 78 Freescale Semiconductor Serial RapidIO 15.4 Equalization With the use of high speed serial links, the interconnect media will cause degradation of the signal at the receiver. Effects such as Inter-Symbol Interference (ISI) or data dependent jitter are produced. This loss can be large enough to degrade the eye opening at the receiver beyond what is allowed in the specification. To negate a portion of these effects, equalization can be used. The most common equalization techniques that can be used are: • A passive high pass filter network placed at the receiver. This is often referred to as passive equalization. • The use of active circuits in the receiver. This is often referred to as adaptive equalization. 15.5 Explanatory Note on Transmitter and Receiver Specifications AC electrical specifications are given for transmitter and receiver. Long run and short run interfaces at three baud rates (a total of six cases) are described. The parameters for the AC electrical specifications are guided by the XAUI electrical interface specified in Clause 47 of IEEE 802.3ae-2002. XAUI has similar application goals to serial RapidIO, as described in Section 8.1. The goal of this standard is that electrical designs for serial RapidIO can reuse electrical designs for XAUI, suitably modified for applications at the baud intervals and reaches described herein. 15.6 Transmitter Specifications LP-Serial transmitter electrical and timing specifications are stated in the text and tables of this section. The differential return loss, S11, of the transmitter in each case shall be better than • –10 dB for (Baud Frequency)/10 < Freq(f) < 625 MHz, and • –10 dB + 10log(f/625 MHz) dB for 625 MHz ≤ Freq(f) ≤ Baud Frequency The reference impedance for the differential return loss measurements is 100 Ohm resistive. Differential return loss includes contributions from on-chip circuitry, chip packaging and any off-chip components related to the driver. The output impedance requirement applies to all valid output levels. It is recommended that the 20%–80% rise/fall time of the transmitter, as measured at the transmitter output, in each case have a minimum value 60 ps. It is recommended that the timing skew at the output of an LP-Serial transmitter between the two signals that comprise a differential pair not exceed 25 ps at 1.25 GB, 20 ps at 2.50 GB and 15 ps at 3.125 GB. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 79 Serial RapidIO Table 52. Short Run Transmitter AC Timing Specifications—1.25 GBaud Range Characteristic Symbol Unit Min Notes Max Output Voltage, VO –0.40 2.30 Volts Differential Output Voltage VDIFFPP 500 1000 mV p-p — Deterministic Jitter JD — 0.17 UI p-p — Total Jitter JT — 0.35 UI p-p — Multiple output skew SMO — 1000 ps Skew at the transmitter output between lanes of a multilane link Unit Interval UI 800 ps +/– 100 ppm 800 Voltage relative to COMMON of either signal comprising a differential pair Table 53. Short Run Transmitter AC Timing Specifications—2.5 GBaud Range Characteristic Symbol Unit Min Notes Max Output Voltage, VO –0.40 2.30 Volts Differential Output Voltage VDIFFPP 500 1000 mV p-p — Deterministic Jitter JD — 0.17 UI p-p — Total Jitter JT — 0.35 UI p-p — Multiple Output skew SMO — 1000 ps Skew at the transmitter output between lanes of a multilane link Unit Interval UI 400 ps +/– 100 ppm 400 Voltage relative to COMMON of either signal comprising a differential pair Table 54. Short Run Transmitter AC Timing Specifications—3.125 GBaud Range Characteristic Symbol Unit Min Notes Max Output Voltage, VO –0.40 2.30 Volts Voltage relative to COMMON of either signal comprising a differential pair Differential Output Voltage VDIFFPP 500 1000 mV p-p — Deterministic Jitter JD — 0.17 UI p-p — Total Jitter JT — 0.35 UI p-p — MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 80 Freescale Semiconductor Serial RapidIO Table 54. Short Run Transmitter AC Timing Specifications—3.125 GBaud (continued) Range Characteristic Symbol Unit Min Multiple output skew SMO Unit Interval UI — 320 Notes Max 1000 ps Skew at the transmitter output between lanes of a multilane link 320 ps +/– 100 ppm Table 55. Long Run Transmitter AC Timing Specifications—1.25 GBaud Range Characteristic Symbol Unit Min Notes Max Output Voltage, VO –0.40 2.30 Volts Differential Output Voltage VDIFFPP 800 1600 mV p-p — Deterministic Jitter JD — 0.17 UI p-p — Total Jitter JT — 0.35 UI p-p — Multiple output skew SMO — 1000 ps Skew at the transmitter output between lanes of a multilane link Unit Interval UI 800 ps +/– 100 ppm 800 Voltage relative to COMMON of either signal comprising a differential pair Table 56. Long Run Transmitter AC Timing Specifications—2.5 GBaud Range Characteristic Symbol Unit Min Notes Max Output Voltage, VO –0.40 2.30 Volts Differential Output Voltage VDIFFPP 800 1600 mV p-p — Deterministic Jitter JD — 0.17 UI p-p — Total Jitter JT — 0.35 UI p-p — Multiple output skew SMO — 1000 ps Skew at the transmitter output between lanes of a multilane link Unit Interval UI 400 ps +/– 100 ppm 400 Voltage relative to COMMON of either signal comprising a differential pair MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 81 Serial RapidIO Table 57. Long Run Transmitter AC Timing Specifications—3.125 GBaud Range Characteristic Symbol Unit Min Notes Max Output Voltage, VO –0.40 2.30 Volts Differential Output Voltage VDIFFPP 800 1600 mV p-p — Deterministic Jitter JD — 0.17 UI p-p — Total Jitter JT — 0.35 UI p-p — Multiple output skew SMO — 1000 ps Skew at the transmitter output between lanes of a multilane link Unit Interval UI 320 ps +/– 100 ppm 320 Voltage relative to COMMON of either signal comprising a differential pair Transmitter Differential Output Voltage For each baud rate at which an LP-Serial transmitter is specified to operate, the output eye pattern of the transmitter shall fall entirely within the unshaded portion of the Transmitter Output Compliance Mask shown in Figure 54 with the parameters specified in Table 58 when measured at the output pins of the device and the device is driving a 100 Ω +/–5% differential resistive load. The output eye pattern of an LP-Serial transmitter that implements pre-emphasis (to equalize the link and reduce inter-symbol interference) need only comply with the Transmitter Output Compliance Mask when pre-emphasis is disabled or minimized. VDIFF max VDIFF min 0 -VDIFF min -VDIFF max 0 A B 1-B 1-A 1 Time in UI Figure 54. Transmitter Output Compliance Mask MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 82 Freescale Semiconductor Serial RapidIO Table 58. Transmitter Differential Output Eye Diagram Parameters VDIFFmin (mV) VDIFFmax (mV) A (UI) B (UI) 1.25 GBaud short range 250 500 0.175 0.39 1.25 GBaud long range 400 800 0.175 0.39 2.5 GBaud short range 250 500 0.175 0.39 2.5 GBaud long range 400 800 0.175 0.39 3.125 GBaud short range 250 500 0.175 0.39 3.125 GBaud long range 400 800 0.175 0.39 Transmitter Type 15.7 Receiver Specifications LP-Serial receiver electrical and timing specifications are stated in the text and tables of this section. Receiver input impedance shall result in a differential return loss better that 10 dB and a common mode return loss better than 6 dB from 100 MHz to (0.8)*(Baud Frequency). This includes contributions from on-chip circuitry, the chip package and any off-chip components related to the receiver. AC coupling components are included in this requirement. The reference impedance for return loss measurements is 100 Ohm resistive for differential return loss and 25 Ohm resistive for common mode. Table 59. Receiver AC Timing Specifications—1.25 GBaud Range Characteristic Symbol Unit Min Notes Max Differential Input Voltage VIN 200 mV p-p Measured at receiver Deterministic Jitter Tolerance JD 0.37 — UI p-p Measured at receiver Combined Deterministic and Random Jitter Tolerance JDR 0.55 — UI p-p Measured at receiver Total Jitter Tolerance1 JT 0.65 — UI p-p Measured at receiver Multiple Input Skew SMI — 24 ns Skew at the receiver input between lanes of a multilane link Bit Error Rate BER — 10–12 Unit Interval UI 800 1600 800 — ps — +/– 100 ppm Note: 1. Total jitter is composed of three components, deterministic jitter, random jitter and single frequency sinusoidal jitter. The sinusoidal jitter may have any amplitude and frequency in the unshaded region of Figure 55. The sinusoidal jitter component is included to ensure margin for low frequency jitter, wander, noise, crosstalk and other variable system effects. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 83 Serial RapidIO Table 60. Receiver AC Timing Specifications—2.5 GBaud Range Characteristic Symbol Unit Min Notes Max Differential Input Voltage VIN 200 1600 mV p-p Measured at receiver Deterministic Jitter Tolerance JD 0.37 — UI p-p Measured at receiver Combined Deterministic and Random Jitter Tolerance JDR 0.55 — UI p-p Measured at receiver Total Jitter Tolerance1 JT 0.65 — UI p-p Measured at receiver Multiple Input Skew SMI — 24 ns Skew at the receiver input between lanes of a multilane link Bit Error Rate BER — 10–12 Unit Interval UI 400 400 — ps — +/– 100 ppm Note: 1. Total jitter is composed of three components, deterministic jitter, random jitter and single frequency sinusoidal jitter. The sinusoidal jitter may have any amplitude and frequency in the unshaded region of Figure 55. The sinusoidal jitter component is included to ensure margin for low frequency jitter, wander, noise, crosstalk and other variable system effects. Table 61. Receiver AC Timing Specifications—3.125 GBaud Range Characteristic Symbol Unit Min Notes Max Differential Input Voltage VIN 200 mV p-p Measured at receiver Deterministic Jitter Tolerance JD 0.37 — UI p-p Measured at receiver Combined Deterministic and Random Jitter Tolerance JDR 0.55 — UI p-p Measured at receiver Total Jitter Tolerance1 JT 0.65 — UI p-p Measured at receiver Multiple Input Skew SMI — 22 ns Skew at the receiver input between lanes of a multilane link Bit Error Rate BER — 10-12 Unit Interval UI 320 1600 320 — ps — +/– 100 ppm Note: 1. Total jitter is composed of three components, deterministic jitter, random jitter and single frequency sinusoidal jitter. The sinusoidal jitter may have any amplitude and frequency in the unshaded region of Figure 55. The sinusoidal jitter component is included to ensure margin for low frequency jitter, wander, noise, crosstalk and other variable system effects. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 84 Freescale Semiconductor Serial RapidIO 8.5 UI p-p Sinusoidal Jitter Amplitude 0.10 UI p-p 22.1 kHz 1.875 MHz 20 MHz Frequency Figure 55. Single Frequency Sinusoidal Jitter Limits 15.8 Receiver Eye Diagrams For each baud rate at which an LP-Serial receiver is specified to operate, the receiver shall meet the corresponding Bit Error Rate specification (Table 59, Table 60, Table 61) when the eye pattern of the receiver test signal (exclusive of sinusoidal jitter) falls entirely within the unshaded portion of the Receiver Input Compliance Mask shown in Figure 56 with the parameters specified in Table . The eye pattern of the receiver test signal is measured at the input pins of the receiving device with the device replaced with a 100 Ω +/– 5% differential resistive load. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 85 Serial RapidIO Receiver Differential Input Voltage VDIFF max VDIFF min 0 -VDIFF min -VDIFF max A 0 B 1-B 1-A 1 Time (UI) Figure 56. Receiver Input Compliance Mask Table 62. Receiver Input Compliance Mask Parameters Exclusive of Sinusoidal Jitter Receiver Type 15.9 VDIFFmin (mV) VDIFFmax (mV) A (UI) B (UI) 1.25 GBaud 100 800 0.275 0.400 2.5 GBaud 100 800 0.275 0.400 3.125 GBaud 100 800 0.275 0.400 Measurement and Test Requirements Since the LP-Serial electrical specification are guided by the XAUI electrical interface specified in Clause 47 of IEEE 802.3ae-2002, the measurement and test requirements defined here are similarly guided by Clause 47. In addition, the CJPAT test pattern defined in Annex 48A of IEEE 802.3ae-2002 is specified as the test pattern for use in eye pattern and jitter measurements. Annex 48B of IEEE 802.3ae-2002 is recommended as a reference for additional information on jitter test methods. 15.9.1 Eye Template Measurements For the purpose of eye template measurements, the effects of a single-pole high pass filter with a 3 dB point at (Baud Frequency)/1667 is applied to the jitter. The data pattern for template measurements is the MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 86 Freescale Semiconductor Serial RapidIO Continuous Jitter Test Pattern (CJPAT) defined in Annex 48A of IEEE 802.3ae. All lanes of the LP-Serial link shall be active in both the transmit and receive directions, and opposite ends of the links shall use asynchronous clocks. Four lane implementations shall use CJPAT as defined in Annex 48A. Single lane implementations shall use the CJPAT sequence specified in Annex 48A for transmission on lane 0. The amount of data represented in the eye shall be adequate to ensure that the bit error ratio is less than 10-12. The eye pattern shall be measured with AC coupling and the compliance template centered at 0 Volts differential. The left and right edges of the template shall be aligned with the mean zero crossing points of the measured data eye. The load for this test shall be 100 Ω resistive +/– 5% differential to 2.5 GHz. 15.9.2 Jitter Test Measurements For the purpose of jitter measurement, the effects of a single-pole high pass filter with a 3 dB point at (Baud Frequency)/1667 is applied to the jitter. The data pattern for jitter measurements is the Continuous Jitter Test Pattern (CJPAT) pattern defined in Annex 48A of IEEE 802.3ae. All lanes of the LP-Serial link shall be active in both the transmit and receive directions, and opposite ends of the links shall use asynchronous clocks. Four lane implementations shall use CJPAT as defined in Annex 48A. Single lane implementations shall use the CJPAT sequence specified in Annex 48A for transmission on lane 0. Jitter shall be measured with AC coupling and at 0 Volts differential. Jitter measurement for the transmitter (or for calibration of a jitter tolerance setup) shall be performed with a test procedure resulting in a BER curve such as that described in Annex 48B of IEEE 802.3ae. 15.9.3 Transmit Jitter Transmit jitter is measured at the driver output when terminated into a load of 100 Ω resistive +/– 5% differential to 2.5 GHz. 15.9.4 Jitter Tolerance Jitter tolerance is measured at the receiver using a jitter tolerance test signal. This signal is obtained by first producing the sum of deterministic and random jitter defined in Section 8.6 and then adjusting the signal amplitude until the data eye contacts the 6 points of the minimum eye opening of the receive template shown in Figure 8-4 and Table 8-11. Note that for this to occur, the test signal must have vertical waveform symmetry about the average value and have horizontal symmetry (including jitter) about the mean zero crossing. Eye template measurement requirements are as defined above. Random jitter is calibrated using a high pass filter with a low frequency corner at 20 MHz and a 20 dB/decade roll-off below this. The required sinusoidal jitter specified in Section 8.6 is then added to the signal and the test load is replaced by the receiver being tested. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 87 Package 16 Package This section details package parameters and dimensions. 16.1 Package Parameters for the MPC8641 The package parameters are as provided in the following list. The package type is 33 mm × 33 mm, 1023 pins. There are two package options: high-lead Flip Chip-Ceramic Ball Grid Array (FC-CBGA), and lead-free (FC-CBGA). For all package types: Die size Package outline Interconnects Pitch Total Capacitor count 12.1 mm × 14.7 mm 33 mm × 33 mm 1023 1 mm 43 caps; 100 nF each For high-lead FC-CBGA (package option: HCTE1 HX) Maximum module height 2.97 mm Minimum module height 2.47 mm Solder Balls 89.5% Pb 10.5% Sn 2 Ball diameter (typical ) 0.60 mm For RoHS lead-free FC-CBGA (package option: HCTE1 VU) and lead-free FC-CBGA (package option: HCTE1 VJ) Maximum module height 2.77 mm Minimum module height 2.27 mm Solder Balls 95.5% Sn 4.0% Ag 0.5% Cu 2 0.60 mm Ball diameter (typical ) 1 2 High-coefficient of thermal expansion Typical ball diameter is before reflow MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 88 Freescale Semiconductor Package 16.2 Mechanical Dimensions of the MPC8641 FC-CBGA The mechanical dimensions and bottom surface nomenclature of the MPC8641D (dual core) and MPC8641 (single core) high-lead FC-CBGA (package option: HCTE HX) and lead-free FC-CBGA (package option: HCTE VU) are shown respectfully in Figure 57 and Figure 58. Figure 57. MPC8641D High-Head FC-CBGA Dimensions NOTES for Figure 57 1. 2. 3. 4. 5. 6. 7. All dimensions are in millimeters. Dimensions and tolerances per ASME Y14.5M-1994. Maximum solder ball diameter measured parallel to datum A. Datum A, the seating plane, is defined by the spherical crowns of the solder balls. Capacitors may not be present on all devices. Caution must be taken not to short capacitors or expose metal capacitor pads on package top. All dimensions symmetrical about centerlines unless otherwise specified. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 89 Package 8. Note that for MPC8641 (single core) the solder balls for the following signals/pins are not populated in the package: VDD_Core1 (R16, R18, R20, T17, T19, T21, T23, U16, U18, U22, V17, V19, V21, V23, W16, W18, W20, W22, Y17, Y19, Y21, Y23, AA16, AA18, AA20, AA22, AB23, AC24) and SENSEVDD_Core1 (U20). Figure 58. MPC8641D Lead-Free FC-CBGA Dimensions NOTES for Figure 58 1. 2. 3. 4. 5. 6. 7. 8. All dimensions are in millimeters. Dimensions and tolerances per ASME Y14.5M-1994. Maximum solder ball diameter measured parallel to datum A. Datum A, the seating plane, is defined by the spherical crowns of the solder balls. Capacitors may not be present on all devices. Caution must be taken not to short capacitors or expose metal capacitor pads on package top. All dimensions symmetrical about centerlines unless otherwise specified. Note that for MPC8641 (single core) the solder balls for the following signals/pins are not populated in the package: VDD_Core1 (R16, R18, R20, T17, T19, T21, T23, U16, U18, U22, V17, V19, V21, V23, W16, W18, W20, W22, Y17, Y19, Y21, Y23, AA16, AA18, AA20, AA22, AB23, AC24) and SENSEVDD_Core1 (U20). MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 90 Freescale Semiconductor Signal Listings 17 Signal Listings Table 63 provides the pin assignments for the signals. Notes for the signal changes on the single core device (MPC8641) are italicized and prefixed by “S”. Table 63. MPC8641 Signal Reference by Functional Block Name1 Package Pin Number Pin Type Power Supply Notes DDR Memory Interface 1 Signals2,3 D1_MDQ[0:63] D15, A14, B12, D12, A15, B15, B13, C13, C11, D11, D9, A8, A12, A11, A9, B9, F11, G12, K11, K12, E10, E9, J11, J10, G8, H10, L9, L7, F10, G9, K9, K8, AC6, AC7, AG8, AH9, AB6, AB8, AE9, AF9, AL8, AM8, AM10, AK11, AH8, AK8, AJ10, AK10, AL12, AJ12, AL14, AM14, AL11, AM11, AM13, AK14, AM15, AJ16, AK18, AL18, AJ15, AL15, AL17, AM17 I/O D1_GVDD — D1_MECC[0:7] M8, M7, R8, T10, L11, L10, P9, R10 I/O D1_GVDD — D1_MDM[0:8] C14, A10, G11, H9, AD7, AJ9, AM12, AK16, N10 O D1_GVDD — D1_MDQS[0:8] A13, C10, H12, J7, AE8, AM9, AK13, AK17, N9 I/O D1_GVDD — D1_MDQS[0:8] D14, B10, H13, J8, AD8, AL9, AJ13, AM16, P10 I/O D1_GVDD — D1_MBA[0:2] AA8, AA10, T9 O D1_GVDD — D1_MA[0:15] Y10, W8, W9, V7, V8, U6, V10, U9, U7, U10, Y9, T6, T8, AE12, R7, P6 O D1_GVDD — D1_MWE AB11 O D1_GVDD — D1_MRAS AB12 O D1_GVDD — D1_MCAS AC10 O D1_GVDD — AB9, AD10, AC12, AD11 O D1_GVDD — P7, M10, N8, M11 O D1_GVDD 23 D1_MCK[0:5] W6, E13, AH11, Y7, F14, AG10 O D1_GVDD — D1_MCK[0:5] Y6, E12, AH12, AA7, F13, AG11 O D1_GVDD — D1_MODT[0:3] AC9, AF12, AE11, AF10 O D1_GVDD — D1_MDIC[0:1] E15, G14 IO D1_GVDD 27 DDR Port 1 reference voltage D1_GVDD /2 3 D1_MCS[0:3] D1_MCKE[0:3] D1_MVREF AM18 DDR Memory Interface 2 Signals2,3 MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 91 Signal Listings Table 63. MPC8641 Signal Reference by Functional Block (continued) Name1 Package Pin Number Pin Type Power Supply Notes D2_MDQ[0:63] A7, B7, C5, D5, C8, D8, D6, A5, C4, A3, D3, D2, A4, B4, C2, C1, E3, E1, H4, G1, D1, E4, G3, G2, J4, J2, L1, L3, H3, H1, K1, L4, AA4, AA2, AD1, AD2, Y1, AA1, AC1, AC3, AD5, AE1, AG1, AG2, AC4, AD4, AF3, AF4, AH3, AJ1, AM1, AM3, AH1, AH2, AL2, AL3, AK5, AL5, AK7, AM7, AK4, AM4, AM6, AJ7 I/O D2_GVDD — D2_MECC[0:7] H6, J5, M5, M4, G6, H7, M2, M1 I/O D2_GVDD — D2_MDM[0:8] C7, B3, F4, J1, AB1, AE2, AK1, AM5, K6 O D2_GVDD — D2_MDQS[0:8] B6, B1, F1, K2, AB3, AF1, AL1, AL6, L6 I/O D2_GVDD — D2_MDQS[0:8] A6, A2, F2, K3, AB2, AE3, AK2, AJ6, K5 I/O D2_GVDD — D2_MBA[0:2] W5, V5, P3 O D2_GVDD — D2_MA[0:15] W1, U4, U3, T1, T2, T3, T5, R2, R1, R5, V4, R4, P1, AH5, P4, N1 O D2_GVDD — D2_MWE Y4 O D2_GVDD — D2_MRAS W3 O D2_GVDD — D2_MCAS AB5 O D2_GVDD — Y3, AF6, AA5, AF7 O D2_GVDD — N6, N5, N2, N3 O D2_GVDD 23 D2_MCK[0:5] U1, F5, AJ3, V2, E7, AG4 O D2_GVDD — D2_MCK[0:5] V1, G5, AJ4, W2, E6, AG5 O D2_GVDD — D2_MODT[0:3] AE6, AG7, AE5, AH6 O D2_GVDD — D2_MDIC[0:1] F8, F7 IO D2_GVDD 27 DDR Port 2 reference voltage D2_GVDD /2 3 D2_MCS[0:3] D2_MCKE[0:3] D2_MVREF A18 High Speed I/O Interface 1 (SERDES 1)4 SD1_TX[0:7] L26, M24, N26, P24, R26, T24, U26, V24 O SVDD — SD1_TX[0:7] L27, M25, N27, P25, R27, T25, U27, V25 O SVDD — SD1_RX[0:7] J32, K30, L32, M30, T30, U32, V30, W32 I SVDD — SD1_RX[0:7] J31, K29, L31, M29, T29, U31, V29, W31 I SVDD — SD1_REF_CLK N32 I SVDD — SD1_REF_CLK N31 I SVDD — SD1_IMP_CAL_TX Y26 Analog SVDD 19 SD1_IMP_CAL_RX J28 Analog SVDD 30 SD1_PLL_TPD U28 O SVDD 13, 17 MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 92 Freescale Semiconductor Signal Listings Table 63. MPC8641 Signal Reference by Functional Block (continued) Name1 Package Pin Number Pin Type Power Supply Notes SD1_PLL_TPA T28 Analog SVDD 13, 18 SD1_DLL_TPD N28 O SVDD 13, 17 SD1_DLL_TPA P31 Analog SVDD 13, 18 High Speed I/O Interface 2 (SERDES 2)4 SD2_TX[0:3] Y24, AA27, AB25, AC27 O SVDD — SD2_TX[4:7] AE27, AG27, AJ27, AL27 O SVDD 34 SD2_TX[0:3] Y25, AA28, AB26, AC28 O SVDD — SD2_TX[4:7] AE28, AG28, AJ28, AL28 O SVDD 34 SD2_RX[0:3] Y30, AA32, AB30, AC32 I SVDD 32 SD2_RX[4:7] AH30, AJ32, AK30, AL32 I SVDD 32, 35 SD2_RX[0:3] Y29, AA31, AB29, AC31 I SVDD — SD2_RX[4:7] AH29, AJ31, AK29, AL31 I SVDD 35 SD2_REF_CLK AE32 I SVDD — SD2_REF_CLK AE31 I SVDD — SD2_IMP_CAL_TX AM29 Analog SVDD 19 SD2_IMP_CAL_RX AA26 Analog SVDD 30 SD2_PLL_TPD AF29 O SVDD 13, 17 SD2_PLL_TPA AF31 Analog SVDD 13, 18 SD2_DLL_TPD AD29 O SVDD 13, 17 SD2_DLL_TPA AD30 Analog SVDD 13, 18 Special Connection Requirement pins No Connects K24, K25, P28, P29, W26, W27, AD25, AD26 — — 13 Reserved H30, R32, V28, AG32 — — 14 Reserved H29, R31, W28, AG31 — — 15 Reserved AD24, AG26 — — 16 Ethernet Miscellaneous Signals5 EC1_GTX_CLK125 AL23 I LVDD 39 EC2_GTX_CLK125 AM23 I TVDD 39 EC_MDC G31 O OVDD — EC_MDIO G32 I/O OVDD — eTSEC Port 1 Signals5 MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 93 Signal Listings Table 63. MPC8641 Signal Reference by Functional Block (continued) Name1 Package Pin Number Pin Type Power Supply Notes AF25, AC23,AG24, AG23, AE24, AE23, AE22, AD22 O LVDD 6, 10 TSEC1_TX_EN AB22 O LVDD 36 TSEC1_TX_ER AH26 O LVDD — TSEC1_TX_CLK AC22 I LVDD 40 TSEC1_GTX_CLK AH25 O LVDD 41 TSEC1_CRS AM24 I/O LVDD 37 TSEC1_COL AM25 I LVDD — AL25, AL24, AK26, AK25, AM26, AF26, AH24, AG25 I LVDD 10 TSEC1_RX_DV AJ24 I LVDD — TSEC1_RX_ER AJ25 I LVDD — TSEC1_RX_CLK AK24 I LVDD 40 AB20, AJ23, AJ22, AD19 O LVDD 6, 10 AH23 O LVDD 6,10, 38 AH21, AG22, AG21 O LVDD 6, 10 TSEC2_TX_EN AB21 O LVDD 36 TSEC2_TX_ER AB19 O LVDD 6, 38 TSEC2_TX_CLK AC21 I LVDD 40 TSEC2_GTX_CLK AD20 O LVDD 41 TSEC2_CRS AE20 I/O LVDD 37 TSEC2_COL AE21 I LVDD — AL22, AK22, AM21, AH20, AG20, AF20, AF23, AF22 I LVDD 10 TSEC2_RX_DV AC19 I LVDD — TSEC2_RX_ER AD21 I LVDD — TSEC2_RX_CLK AM22 I LVDD 40 TSEC1_TXD[0:7]/ GPOUT[0:7] TSEC1_RXD[0:7]/ GPIN[0:7] eTSEC Port 2 TSEC2_TXD[0:3]/ GPOUT[8:15] TSEC2_TXD[4]/ GPOUT[12] TSEC2_TXD[5:7]/ GPOUT[13:15] TSEC2_RXD[0:7]/ GPIN[8:15] Signals5 eTSEC Port 3 Signals5 TSEC3_TXD[0:3] AL21, AJ21, AM20, AJ20 O TVDD 6 TSEC3_TXD[4]/ AM19 O TVDD — TSEC3_TXD[5:7] AK21, AL20, AL19 O TVDD 6 MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 94 Freescale Semiconductor Signal Listings Table 63. MPC8641 Signal Reference by Functional Block (continued) Name1 Package Pin Number Pin Type Power Supply Notes TSEC3_TX_EN AH19 O TVDD 36 TSEC3_TX_ER AH17 O TVDD — TSEC3_TX_CLK AH18 I TVDD 40 TSEC3_GTX_CLK AG19 O TVDD 41 TSEC3_CRS AE15 I/O TVDD 37 TSEC3_COL AF15 I TVDD — AJ17, AE16, AH16, AH14, AJ19, AH15, AG16, AE19 I TVDD — TSEC3_RX_DV AG15 I TVDD — TSEC3_RX_ER AF16 I TVDD — TSEC3_RX_CLK AJ18 I TVDD 40 AC18, AC16, AD18, AD17 O TVDD 6 AD16 O TVDD 25 AB18, AB17, AB16 O TVDD 6 TSEC4_TX_EN AF17 O TVDD 36 TSEC4_TX_ER AF19 O TVDD — TSEC4_TX_CLK AF18 I TVDD 40 TSEC4_GTX_CLK AG17 O TVDD 41 TSEC4_CRS AB14 I/O TVDD 37 TSEC4_COL AC13 I TVDD — AG14, AD13, AF13, AD14, AE14, AB15, AC14, AE17 I TVDD — TSEC4_RX_DV AC15 I TVDD — TSEC4_RX_ER AF14 I TVDD — TSEC4_RX_CLK AG13 I TVDD 40 TSEC3_RXD[0:7] eTSEC Port 4 TSEC4_TXD[0:3] TSEC4_TXD[4] TSEC4_TXD[5:7] TSEC4_RXD[0:7] Signals5 Local Bus Signals5 LAD[0:31] A30, E29, C29, D28, D29, H25, B29, A29, C28, L22, M22, A28, C27, H26, G26, B27, B26, A27, E27, G25, D26, E26, G24, F27, A26, A25, C25, H23, K22, D25, F25, H22 I/O OVDD 6 LDP[0:3] A24, E24, C24, B24 I/O OVDD 6, 22 LA[27:31] J21, K21, G22, F24, G21 O OVDD 6, 22 LCS[0:4] A22, C22, D23, E22, A23 O OVDD 7 B23 O OVDD 7, 9, 10 LCS[5]/DMA_DREQ[2] MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 95 Signal Listings Table 63. MPC8641 Signal Reference by Functional Block (continued) Name1 Package Pin Number Pin Type Power Supply Notes E23 O OVDD 7, 10 LCS[7]/DMA_DDONE[2] F23 O OVDD 7, 10 E21, F21, D22, E20 O OVDD 6 LBCTL D21 O OVDD — LALE E19 O OVDD — LGPL0/LSDA10 F20 O OVDD 25 LGPL1/LSDWE H20 O OVDD 25 LGPL2/LOE/ LSDRAS J20 O OVDD — LGPL3/LSDCAS K20 O OVDD 6 LGPL4/LGTA/ LUPWAIT/LPBSE L21 I/O OVDD 42 LGPL5 J19 O OVDD 6 LCKE H19 O OVDD — LCLK[0:2] G19, L19, M20 O OVDD — LSYNC_IN M19 I OVDD — LSYNC_OUT D20 O OVDD — E31, E32 I OVDD — DMA_DREQ[2]/LCS[5] B23 I OVDD 9, 10 DMA_DREQ[3]/IRQ[9] B30 I OVDD 10 D32, F30 O OVDD — DMA_DACK[2]/LCS[6] E23 O OVDD 10 DMA_DACK[3]/IRQ[10] C30 O OVDD 9, 10 F31, F32 O OVDD — DMA_DDONE[2]/LCS[7] F23 O OVDD 10 DMA_DDONE[3]/IRQ[11] D30 O OVDD 9, 10 LCS[6]/DMA_DACK[2] LWE[0:3]/ LSDDQM[0:3]/ LBS[0:3] DMA Signals5 DMA_DREQ[0:1] DMA_DACK[0:1] DMA_DDONE[0:1] Programmable Interrupt Controller Signals5 MCP_0 F17 I OVDD — MCP _1 H17 I OVDD 12, S4 IRQ[0:8] G28, G29, H27, J23, M23, J27, F28, J24, L23 I OVDD — MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 96 Freescale Semiconductor Signal Listings Table 63. MPC8641 Signal Reference by Functional Block (continued) Name1 Package Pin Number Pin Type Power Supply Notes IRQ[9]/DMA_DREQ[3] B30 I OVDD 10 IRQ[10]/DMA_DACK[3] C30 I OVDD 9, 10 IRQ[11]/DMA_DDONE[3] D30 I OVDD 9, 10 O OVDD 7, 11 IRQ_OUT J26 DUART Signals5 UART_SIN[0:1] B32, C32 I OVDD — UART_SOUT[0:1] D31, A32 O OVDD — UART_CTS[0:1] A31, B31 I OVDD — UART_RTS[0:1] C31, E30 O OVDD — I2C Signals IIC1_SDA A16 I/O OVDD 7, 11 IIC1_SCL B17 I/O OVDD 7, 11 IIC2_SDA A21 I/O OVDD 7, 11 IIC2_SCL B21 I/O OVDD 7, 11 System Control Signals5 HRESET B18 I OVDD — HRESET_REQ K18 O OVDD — SMI_0 L15 I OVDD — SMI_1 L16 I OVDD 12, S4 SRESET_0 C20 I OVDD — SRESET_1 C21 I OVDD 12, S4 CKSTP_IN L18 I OVDD — CKSTP_OUT L17 O OVDD 7, 11 READY/TRIG_OUT J13 O OVDD 10, 25 Debug Signals5 TRIG_IN J14 I OVDD — TRIG_OUT/READY J13 O OVDD 10, 25 F15, K15 O OVDD 6, 10 K14 O OVDD 10, 25 D1_MSRCID[3:4]/ LB_SRCID[3:4] H15, G15 O OVDD 10 D2_MSRCID[0:4] E16, C17, F16, H16, K16 O OVDD — D1_MSRCID[0:1]/ LB_SRCID[0:1] D1_MSRCID[2]/ LB_SRCID[2] MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 97 Signal Listings Table 63. MPC8641 Signal Reference by Functional Block (continued) Name1 Package Pin Number D1_MDVAL/LB_DVAL J16 D2_MDVAL D19 Pin Type Power Supply Notes O OVDD 10 O OVDD — O OVDD — Power Management Signals ASLEEP C19 5 System Clocking Signals5 SYSCLK G16 I OVDD — RTC K17 I OVDD 32 CLK_OUT B16 O OVDD 23 C18 I OVDD 26 C16, E17, D18, D16 I OVDD 26 Test Signals5 LSSD_MODE TEST_MODE[0:3] JTAG Signals5 TCK H18 I OVDD — TDI J18 I OVDD 24 TDO G18 O OVDD 23 TMS F18 I OVDD 24 TRST A17 I OVDD 24 J17 — — 13 GPOUT[0:7]/ TSEC1_TXD[0:7] AF25, AC23, AG24, AG23, AE24, AE23, AE22, AD22 O OVDD 6, 10 GPIN[0:7]/ TSEC1_RXD[0:7] AL25, AL24, AK26, AK25, AM26, AF26, AH24, AG25 I OVDD 10 GPOUT[8:15]/ TSEC2_TXD[0:7] AB20, AJ23, AJ22, AD19, AH23, AH21, AG22, AG21 O OVDD 10 GPIN[8:15]/ TSEC2_RXD[0:7] AL22, AK22, AM21, AH20, AG20, AF20, AF23, AF22 I OVDD 10 AA11 Thermal — — Y11 Thermal — — Miscellaneous5 Spare Additional Analog Signals TEMP_ANODE TEMP_CATHODE Sense, Power and GND Signals SENSEVDD_Core0 M14 VDD_Core0 sensing pin — 31 SENSEVDD_Core1 U20 VDD_Core1 sensing pin — 12,31, S1 MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 98 Freescale Semiconductor Signal Listings Table 63. MPC8641 Signal Reference by Functional Block (continued) Name1 Package Pin Number Pin Type Power Supply Notes SENSEVSS_Core0 P14 Core0 GND sensing pin — 31 SENSEVSS_Core1 V20 Core1 GND sensing pin — 12, 31, S3 SENSEVDD_PLAT N18 VDD_PLAT sensing pin — 28 SENSEVSS_PLAT P18 Platform GND sensing pin — 29 D1_GVDD B11, B14, D10, D13, F9, F12, H8, H11, H14, K10, K13, L8, P8, R6, U8, V6, W10, Y8, AA6, AB10, AC8, AD12, AE10, AF8, AG12, AH10, AJ8, AJ14, AK12, AL10, AL16 SDRAM 1 I/O supply D1_GVDD 2.5 - DDR 1.8 DDR2 — D2_GVDD B2, B5, B8, D4, D7, E2, F6, G4, H2, J6, K4, L2, M6, N4, P2, T4, U2, W4, Y2, AB4, AC2, AD6, AE4, AF2, AG6, AH4, AJ2, AK6, AL4, AM2 SDRAM 2 I/O supply D2_GVDD 2.5 V - DDR 1.8 V - DDR2 — OVDD B22, B25, B28, D17, D24, D27, F19, F22, F26, F29, G17, H21, H24, K19, K23, M21, AM30 DUART, Local Bus, DMA, Multiprocessor Interrupts, System Control & Clocking, Debug, Test, JTAG, Power management, I2C, JTAG and Miscellaneous I/O voltage — OVDD 3.3 V LVDD AC20, AD23, AH22 TSEC1 and TSEC2 I/O voltage LVDD 2.5/3.3 V — TVDD AC17, AG18, AK20 TSEC3 and TSEC4 I/O voltage TVDD 2.5/3.3 V — SVDD H31, J29, K28, K32, L30, M28, M31, N29, R30, T31, U29, V32, W30, Y31, AA29, AB32, AC30, AD31, AE29, AG30, AH31, AJ29, AK32, AL30, AM31 Transceiver Power Supply SerDes K26, L24, M27, N25, P26, R24, R28, T27, U25, V26 Serial I/O Power Supply for SerDes Port 1 XVDD_SRDS1 — SVDD 1.05/1.1 V XVDD_SRDS1 — 1.05/1.1 V MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 99 Signal Listings Table 63. MPC8641 Signal Reference by Functional Block (continued) Name1 Package Pin Number XVDD_SRDS2 VDD_Core0 VDD_Core1 VDD_PLAT Pin Type Power Supply Notes Serial I/O Power Supply for SerDes Port 2 XVDD_SRDS2 — L12, L13, L14, M13, M15, N12, N14, P11, P13, P15, R12, R14, T11, T13, T15, U12, U14, V11, V13, V15, W12, W14, Y12, Y13, Y15, AA12, AA14, AB13 Core 0 voltage supply VDD_Core0 R16, R18, R20, T17, T19, T21, T23, U16, U18, U22, V17, V19, V21, V23, W16, W18, W20, W22, Y17, Y19, Y21, Y23, AA16, AA18, AA20, AA22, AB23, AC24 Core 1 voltage supply AA25, AB28, AC26, AD27, AE25, AF28, AH27, AK28, AM27, W24, Y27 1.05/1.1 V — 0.95/1.05/1.1 V VDD_Core1 12, S1 0.95/1.05/1.1 V M16, M17, M18, N16, N20, N22, P17, P19, Platform supply P21, P23, R22 voltage VDD_PLAT 1.05/1.1 V — AVDD_Core0 B20 Core 0 PLL Supply AVDD_Core0 0.95/1.05/1.1 V — AVDD_Core1 A19 Core 1 PLL Supply AVDD_Core1 0.95/1.05/1.1 V 12, S2 AVDD_PLAT B19 Platform PLL supply voltage AVDD_PLAT 1.05/1.1 V — AVDD_LB A20 Local Bus PLL supply voltage AVDD_LB 1.05/1.1 V — AVDD_SRDS1 P32 SerDes Port 1 PLL & DLL Power Supply AVDD_SRDS1 — SerDes Port 2 PLL & DLL Power Supply AVDD_SRDS2 GND — AVDD_SRDS2 GND AF32 C3, C6, C9, C12, C15, C23, C26, E5, E8, E11, E14, E18, E25, E28, F3, G7, G10, G13, G20, G23, G27, G30, H5, J3, J9, J12, J15, J22, J25, K7, L5, L20, M3, M9, M12, N7, N11, N13, N15, N17, N19, N21, N23, P5, P12, P16, P20, P22, R3, R9, R11, R13, R15, R17, R19, R21, R23, T7, T12, T14, T16, T18, T20, T22, U5, U11,U13, U15, U17, U19, U21, U23, V3, V9, V12, V14, V16, V18, V22, W7, W11, W13, W15, W17, W19, W21, W23,Y5, Y14, Y16, Y18, Y20, Y22, AA3, AA9, AA13, AA15, AA17, AA19, AA21, AA23, AB7, AB24, AC5, AC11, AD3, AD9, AD15, AE7, AE13, AE18, AF5, AF11, AF21, AF24, AG3, AG9, AH7, AH13, AJ5, AJ11, AK3, AK9, AK15, AK19, AK23, AL7, AL13 1.05/1.1 V — 1.05/1.1 V — MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 100 Freescale Semiconductor Signal Listings Table 63. MPC8641 Signal Reference by Functional Block (continued) Name1 Package Pin Number Pin Type Power Supply Notes AGND_SRDS1 P30 SerDes Port 1 Ground pin for AVDD_SRDS1 — — AGND_SRDS2 AF30 SerDes Port 2 Ground pin for AVDD_SRDS2 — — SGND H28, H32, J30, K31, L28, L29, M32, N30, Ground pins for R29, T32, U30, V31, W29,Y32 AA30, AB31, SVDD AC29, AD32, AE30, AG29, AH32, AJ30, AK31, AL29, AM32 — — XGND K27, L25, M26, N24, P27, R25, T26, U24, Ground pins for V27, W25, Y28, AA24, AB27, AC25, AD28, XVDD_SRDSn AE26, AF27, AH28, AJ26, AK27, AL26, AM28 — — Reset Configuration Signals20 TSEC1_TXD[0] / cfg_alt_boot_vec AF25 — LVDD — TSEC1_TXD[1]/ cfg_platform_freq AC23 — LVDD 21 TSEC1_TXD[2:4]/ cfg_device_id[5:7] AG24, AG23, AE24 — LVDD — TSEC1_TXD[5]/ cfg_tsec1_reduce AE23 — LVDD — AE22, AD22 — LVDD — TSEC2_TXD[0:3]/ cfg_rom_loc[0:3] AB20, AJ23, AJ22, AD19 — LVDD — TSEC2_TXD[4], TSEC2_TX_ER/ cfg_dram_type[0:1] AH23, AB19 — LVDD 38 TSEC2_TXD[5]/ cfg_tsec2_reduce AH21 — LVDD — TSEC2_TXD[6:7]/ cfg_tsec2_prtcl[0:1] AG22, AG21 — LVDD — TSEC3_TXD[0:1]/ cfg_spare[0:1] AL21, AJ21 O TVDD 33 TSEC3_TXD[2]/ cfg_core1_enable AM20 O TVDD — TSEC3_TXD[3]/ cfg_core1_lm_offset AJ20 — LVDD — TSEC3_TXD[5]/ cfg_tsec3_reduce AK21 — LVDD — TSEC1_TXD[6:7]/ cfg_tsec1_prtcl[0:1] MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 101 Signal Listings Table 63. MPC8641 Signal Reference by Functional Block (continued) Name1 Package Pin Number Pin Type Power Supply Notes AL20, AL19 — LVDD — TSEC4_TXD[0:3]/ cfg_io_ports[0:3] AC18, AC16, AD18, AD17 — LVDD — TSEC4_TXD[5]/ cfg_tsec4_reduce AB18 — LVDD — AB17, AB16 — LVDD — A30, E29, C29, D28, D29, H25, B29, A29, C28, L22, M22, A28, C27, H26, G26, B27, B26, A27, E27, G25, D26, E26, G24, F27, A26, A25, C25, H23, K22, D25, F25, H22 — OVDD — LWE[0]/ cfg_cpu_boot E21 — OVDD — LWE[1]/ cfg_rio_sys_size F21 — OVDD — LWE[2:3]/ cfg_host_agt[0:1] D22, E20 — OVDD — LDP[0:3], LA[27] / cfg_core_pll[0:4] A24, E24, C24, B24, J21 — OVDD 22 LA[28:31]/ cfg_sys_pll[0:3] K21, G22, F24, G21 — OVDD 22 LGPL[3], LGPL[5]/ cfg_boot_seq[0:1] K20, J19 — OVDD — D1_MSRCID[0]/ cfg_mem_debug F15 — OVDD — D1_MSRCID[1]/ cfg_ddr_debug K15 — OVDD — TSEC3_TXD[6:7]/ cfg_tsec3_prtcl[0:1] TSEC4_TXD[6:7]/ cfg_tsec4_prtcl[0:1] LAD[0:31]/ cfg_gpporcr[0:31] MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 102 Freescale Semiconductor Signal Listings Table 63. MPC8641 Signal Reference by Functional Block (continued) Name1 Package Pin Number Pin Type Power Supply Notes Note: 1. Multi-pin signals such as D1_MDQ[0:63] and D2_MDQ[0:63] have their physical package pin numbers listed in order corresponding to the signal names. 2. Stub Series Terminated Logic (SSTL-18 and SSTL-25) type pins. 3. If a DDR port is not used, it is possible to leave the related power supply (Dn_GVDD, Dn_MVREF) turned off at reset. Note that these power supplies can only be powered up again at reset for functionality to occur on the DDR port. 4. Low Voltage Differential Signaling (LVDS) type pins. 5. Low Voltage Transistor-Transistor Logic (LVTTL) type pins. 6. This pin is a reset configuration pin and appears again in the Reset Configuration Signals section of this table. See the Reset Configuration Signals section of this table for config name and connection details. 7. Recommend a weak pull-up resistor (1–10 kΩ) be placed from this pin to its power supply. 8. Recommend a weak pull-down resistor (2–10 kΩ) be placed from this pin to ground. 9. This multiplexed pin has input status in one mode and output in another 10. This pin is a multiplexed signal for different functional blocks and appears more than once in this table. 11. This pin is open drain signal. 12. Functional only on the MPC8641D. 13. These pins should be left floating. 14. These pins should be connected to SVDD. 15. These pins should be pulled to ground with a strong resistor (270-Ω to 330-Ω). 16. These pins should be connected to OVDD. 17.This is a SerDes PLL/DLL digital test signal and is only for factory use. 18. This is a SerDes PLL/DLL analog test signal and is only for factory use. 19. This pin should be pulled to ground with a 100-Ω resistor. 20. The pins in this section are reset configuration pins. Each pin has a weak internal pull-up P-FET which is enabled only when the processor is in the reset state. This pull-up is designed such that it can be overpowered by an external 4.7-kΩ pull-down resistor. However, if the signal is intended to be high after reset, and if there is any device on the net which might pull down the value of the net at reset, then a pullup or active driver is needed. 21. Should be pulled down at reset if platform frequency is at 400 MHz. 22. These pins require 4.7-kΩ pull-up or pull-down resistors and must be driven as they are used to determine PLL configuration ratios at reset. 23. This output is actively driven during reset rather than being tri-stated during reset. 24 These JTAG pins have weak internal pull-up P-FETs that are always enabled. 25. This pin should NOT be pulled down (or driven low) during reset. 26.These are test signals for factory use only and must be pulled up (100-Ω to 1- kΩ.) to OVDD for normal machine operation. 27. Dn_MDIC[0] should be connected to ground with an 18-Ω resistor +/– 1-Ω and Dn_MDIC[1] should be connected Dn_GVDD with an 18-Ω resistor +/– 1-Ω. These pins are used for automatic calibration of the DDR IOs. 28. Pin N18 is recommended as a reference point for determining the voltage of VDD_PLAT and is hence considered as the VDD_PLAT sensing voltage and is called SENSEVDD_PLAT. 29. Pin P18 is recommended as the ground reference point for SENSEVDD_PLAT and is called SENSEVSS_PLAT. 30.This pin should be pulled to ground with a 200-Ω resistor. 31.These pins are connected to the power/ground planes internally and may be used by the core power supply to improve tracking and regulation. 32. Must be tied low if unused 33. These pins may be used as defined functional reset configuration pins in the future. Please include a resistor pull up/down option to allow flexibility of future designs. 34. Used as serial data output for SRIO 1x/4x link. 35. Used as serial data input for SRIO 1x/4x link. 36.This pin requires an external 4.7-kΩ pull-down resistor to pevent PHY from seeing a valid Transmit Enable before it is actively driven. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 103 Clocking Table 63. MPC8641 Signal Reference by Functional Block (continued) Name1 Package Pin Number Pin Type Power Supply Notes 37.This pin is only an output in FIFO mode when used as Rx Flow Control. 38.This pin functions as cfg_dram_type[0 or 1] at reset and MUST BE VALID BEFORE HRESET ASSERTION in device sleep mode. 39. Should be pulled to ground if unused (such as in FIFO, MII and RMII modes). 40. See Section 18.4.2, “Platform to FIFO Restrictions” for clock speed limitations for this pin when used in FIFO mode. 41. The phase between the output clocks TSEC1_GTX_CLK and TSEC2_GTX_CLK (ports 1 and 2) is no more than 100 ps. The phase between the output clocks TSEC3_GTX_CLK and TSEC4_GTX_CLK (ports 3 and 4) is no more than 100 ps. 42. For systems which boot from Local Bus (GPCM)-controlled flash, a pullup on LGPL4 is required. Special Notes for Single Core Device: S1. Solder ball for this signal will not be populated in the single core package. S2. The PLL filter from VDD_Core1 to AVDD_Core1 should be removed. AVDD_Core1 should be pulled to ground with a weak (2–10 kΩ) resistor. See Section 20.2.1, “PLL Power Supply Filtering” for more details. S3. This pin should be pulled to GND for the single core device. S4. No special requirement for this pin on single core device. Pin should be tied to power supply as directed for dual core. 18 Clocking This section describes the PLL configuration of the MPC8641. Note that the platform clock is identical to the MPX clock. 18.1 Clock Ranges Table 64 provides the clocking specifications for the processor cores and Table 65 provides the clocking specifications for the memory bus. Table 66 provides the clocking for the Platform/MPX bus and Table 67 provides the clocking for the Local bus. Table 64. Processor Core Clocking Specifications Maximum Processor Core Frequency Characteristic e600 core processor frequency 1000 MHz 1250MHz 1333MHz 1500 MHz Min Max Min Max Min Max Min Max 800 1000 800 1250 800 1333 800 1500 Unit Notes MHz 1, 2 Notes: 1. Caution: The MPX clock to SYSCLK ratio and e600 core to MPX clock ratio settings must be chosen such that the resulting SYSCLK frequency, e600 (core) frequency, and MPX clock frequency do not exceed their respective maximum or minimum operating frequencies. Refer to Section 18.2, “MPX to SYSCLK PLL Ratio,” and Section 18.3, “e600 to MPX clock PLL Ratio,” for ratio settings. 2. The minimum e600 core frequency is based on the minimum platform clock frequency of 400 MHz. MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 104 Freescale Semiconductor Clocking Table 65. Memory Bus Clocking Specifications Maximum Processor Core Frequency Characteristic Memory bus clock frequency 1000, 1250, 1333, 1500MHz Min Max 200 300 Unit Notes MHz 1, 2 Notes: 1. Caution: The MPX clock to SYSCLK ratio and e600 core to MPX clock ratio settings must be chosen such that the resulting SYSCLK frequency, e600 (core) frequency, and MPX clock frequency do not exceed their respective maximum or minimum operating frequencies. Refer to Section 18.2, “MPX to SYSCLK PLL Ratio,” and Section 18.3, “e600 to MPX clock PLL Ratio,” for ratio settings. 2. The memory bus clock speed is half the DDR/DDR2 data rate, hence, half the MPX clock frequency. Table 66. Platform/MPX bus Clocking Specifications Maximum Processor Core Frequency Characteristic Platform/MPX bus clock frequency 1000, 1250, 1333, 1500MHz Min Max 400 500-600 Unit Notes MHz 1, 2 Notes: 1. Caution: The MPX clock to SYSCLK ratio and e600 core to MPX clock ratio settings must be chosen such that the resulting SYSCLK frequency, e600 (core) frequency, and MPX clock frequency do not exceed their respective maximum or minimum operating frequencies. Refer to Section 18.2, “MPX to SYSCLK PLL Ratio,” and Section 18.3, “e600 to MPX clock PLL Ratio,” for ratio settings. 2. Platform/MPX frequencies between 400 and 500 MHz are not supported. Table 67. Local Bus Clocking Specifications Maximum Processor Core Frequency Characteristic Local bus clock speed (for Local Bus Controller) 1000, 1250, 1333, 1500MHz Min Max 25 133 Unit Notes MHz 1 Notes: 1. The Local bus clock speed on LCLK[0:2] is determined by MPX clock divided by the Local Bus PLL ratio programmed in LCRR[CLKDIV]. See the reference manual for the MPC8641D for more information on this. 18.2 MPX to SYSCLK PLL Ratio The MPX clock is the clock that drives the MPX bus, and is also called the platform clock. The frequency of the MPX is set using the following reset signals, as shown in Table 68: • SYSCLK input signal MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 Freescale Semiconductor 105 Clocking • Binary value on LA[28:31] at power up Note that there is no default for this PLL ratio; these signals must be pulled to the desired values. Also note that the DDR data rate is the determining factor in selecting the MPX bus frequency, since the MPX frequency must equal the DDR data rate. Table 68. MPX:SYSCLK Ratio 18.3 Binary Value of LA[28:31] Signals MPX:SYSCLK Ratio 0000 Reserved 0001 Reserved 0010 2:1 0011 3:1 0100 4:1 0101 5:1 0110 6:1 0111 Reserved 1000 8:1 1001 9:1 e600 to MPX clock PLL Ratio Table 69 describes the clock ratio between the platform and the e600 core clock. This ratio is determined by the binary value of LDP[0:3], LA[27](cfg_core_pll[0:4] - reset config name) at power up, as shown in Table 69. Table 69. e600 Core to MPX Clock Ratio Binary Value of LDP[0:3], LA[27] Signals e600 core: MPX Clock Ratio 18.4 01000 2:1 01100 2.5:1 10000 3:1 11100 3.5:1 10100 4:1 01110 4.5:1 Frequency Options MPC8641 and MPC8641D Integrated Host Processor Hardware Specifications, Rev. 3 106 Freescale Semiconductor Clocking 18.4.1 SYSCLK to Platform Frequency Options Table 70 shows some SYSCLK frequencies and the expected MPX frequency values based on the MPX clock to SYSCLK ratio. Note that frequencies between 400 MHz and 500 MHz are NOT supported on the platform. See note regarding cfg_platform_freq in Section 17, “Signal Listings,” because it is a reset configuration pin that is related to platform frequency. Table 70. Frequency Options of SYSCLK with Respect to Platform/MPX Clock Speed MPX to SYSCLK Ratio SYSCLK (MHz) 66 83 100 111 133 167 Platform/MPX Frequency (MHz)1 2 3 1 18.4.2 400 4 400 5 500 6 400 8 533 9 600 500 500 533 555 600 SYSCLK frequency range is 66-167 MHz. Platform clock/ MPX frequency range is 400 MHz, 500-600 MHz. Platform to FIFO Restrictions Please note the following FIFO maximum speed restrictions based on platform speed. For FIFO GMII mode: FIFO TX/RX clock frequency