Freescale Semiconductor
DOCUMENT NUMBER
9S12DP512DGV1/D
MC9S12DP512
Device Guide
V01.25
Covers also
MC9S12DT512, MC9S12DJ512,
MC9S12A512
Original Release Date: 27 Nov 2001
Revised: 05 Jul 2005
Freescale Semiconductor, Inc.
© Freescale Semiconductor, Inc., 2004. All rights reserved.
1
DOCUMENT NUMBER
9S12DP512DGV1/D
Revision History
Version Revision Effective
Number
Date
Date
V01.00
27 Nov
2001
Author
Description of Changes
11 Feb
2002
- Initial version based on DP256 V2.09.
V01.01
13 Mar
2002
13 Mar
2002
- Updated document formats.
- Removed reference to SIM in overview.
- Changed XCLKS to PE7 in signal description.
- Removed "Oscillator start-up time from POR or STOP" from Oscillator
Characterisitcs.
- Changed VDD and VDDPLL to 2.35V.
- Updated CINS.
- Updated IOL/IOH values.
- Updated input capacitance.
- Updated NVM timing characteristics.
V01.02
02 Apr
2002
02 Apr
2002
- Updated document reference (SPI, SCI).
V01.03
15 Apr
2002
15 Apr
2002
- Corrected values in device memory map (RAM start, flash protected
sector sizes).
- Updated document reference (SCI).
V01.04
06 Jun
2002
06 Jun
2002
- Changed all operating frequency references to 50MHz EXTAL and
removed references to 80 pin LQFP.
05 Jul
2002
- Preface Table "Document References": Changed to full naming for
each block.
- Table "Interrupt Vector Locations", Column "Local Enable": Corrected
several register and bit names.
- Table "Signal Properties": Added column "Internal Pull Resistor".
- Table "PLL Characteristics": Updated parameters K1 and f1
- Figure "Basic Pll functional diagram": Inserted XFC pin in diagram
- Enhanced section "XFC Component Selection"
- Added to Sections ATD, ECT and PWM: freeze mode = active BDM
mode.
V01.05
05 Jul
2002
Freescale reserves the right to make changes without further notice to any products herein to improve reliability, function or
design.Freescale does not assume any liability arising out of the application or use of any product or circuit described herein;
neither does it convey any license under its patent rights nor the rights of others.Freescale products are not designed, intended,
or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to
support or sustain life, or for any other application in which the failure of the Freescale product could create a situation where
personal injury or death may occur. Should Buyer purchase or use Freescale products for any such unintended or unauthorized
application, Buyer shall indemnify and hold Freescale and its officers, employees, subsidiaries, affiliates, and distributors harmless
against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of
personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that Freescale was
negligent regarding the design or manufacture of the part.
MC9S12DP512 Device Guide V01.25
Version Revision Effective
Number
Date
Date
V01.06
24 Jul
2002
24 Jul
2002
Author
Description of Changes
- Updated SPI electrical characteristics.
- Updated Derivative Differences table.
- Added ordering number example.
- Added Detailed Register Map.
- Changed Internal Pull Resistor column of signal table.
- Added pull device description for MODC pin.
- Corrected XCLKS figure titles. Moved table to section Modes of
Operation.
- Removed ’1/2’ from BDM in Figure Clock Connections.
- Completely reworked section Modes of Operation. Added Chip
Configuration Summary and Low Power Mode description.
- Changed classification to C for internal pull currents inTable 5V I/O
Characteristics.
- Changed input leakage to 1uA for all pins.
- Updated VREG section and layout recommendation.
- Moved Power and Gound Connection Summary table to start of
Power Supply Pins section.
- Added ROMONE to pinout
- Corrected mem map: ’MEBI map x of 3’
- Corrected mem map: KEYEN bits in FSEC.
- Added section Printed Circuit Board Layout Proposal.
- Corrected addresses in Reserved, CAN and EEP buffer map.
- Updated NVM electricals.
V01.07
29 Jul
2002
05 Aug
2002
V01.08
21 Aug
2002
21 Aug
2002
- Updated table ’Document References’
- Added section ’Oscillator (OSC) Block Description’
V01.09
24 Sep
2002
24 Sep
2002
- Section HCS12 Core Block Desciption: mentioned alternalte clock of
BDM to be equivalent to oscillator clock
- Corrected tables 0-1 and 0-2
V01.10
18 Oct
2002
18 Oct
2002
- Added derivatives to cover sheet.
- Added part ID for 1L00M maskset.
- Corrected in footnote of Table "PLL Characteristics": fOSC = 4MHz.
V01.11
29 Oct
2002
29 Oct
2002
- Renamed Preface section to Derivative Differences and Document
references.
- Added A512 derivative.
- Updated module set of DJ512 in Table 0-1.
- Added details for derivatives without CAN and/or BDLC modules.
V01.12
03 Dec
2002
03 Dec
2002
- Corrected several entries in ’Detailed Memory Map’.
- Removed footnote on input leakage current from table ’5V I/O
Characteristics’.
V01.13
08 Jan
2003
08 Jan
2003
- Updated section ’Unsecuring the Microcontroller’.
- Updated footnote 1 in table ’Operating Conditions’.
V01.14
23 Jan
2003
23 Jan
2003
- Renamed ROMONE pin to ROMCTL.
V01.15
28 Feb
2003
28 Feb
2003
- Corrected PE[1,0] pull specification in Signal Properties Summary
Table.
3
MC9S12DP512 Device Guide V01.25
Version Revision Effective
Number
Date
Date
Author
Description of Changes
V01.16
31 Mar
2003
31 Mar
2003
- Corrections in App. A ’NVM, Flash and EEPROM’:
- Number of words per flash row = 64
- Replaced ’burst programming’ with ’row programming’
- Sector erase size = 1024 bytes
- Corrected feature description ECT
- Corrected min. bus freq. in table ’Operating Conditions’
V01.17
30 May
2003
30 May
2003
- Replaced references to HCS12 Core Guide with the individual HCS12
Block guides throughout document
- Table ’Absolute Maximum Ratings’ corrected footnote on clamp of
TEST pin
V01.18
23 Jul
2003
23 Jul
2003
- Mentioned ’S12 LRAE’ bootloader in Flash section
- Document References: corrected S12 CPU document reference
V01.19
24 Jul
2003
24 Jul
2003
- Added part ID for 2L00M maskset.
V01.20
01 Sep
2003
01 Sep
2003
- Added part ID for 3L00M maskset.
- Added cycle definition to ’CPU 12 Block Description’.
- Diagram ’Clock Connections’: Connected Bus Clock to HCS12 Core.
- Corrected ’Background Debug Module’ to ’HCS12 Breakpoint’ at
address $0028 - $002F in table 1-1.
- Corrected ’Blank Check Time Flash’ value in table ’NVM Timing
Characteristics’
- Added EXTAL pin VIH, VIL and EXTAL pin hysteresis value to
’Oscillator Characteristics’. Updated oscillator description and table
note.
V01.21
08 Mar
2004
08 Mar
2004
- Added part ID for 4L00M maskset.
- Corrected pin name KWP5 in device pinout.
V01.22
23 Aug
2004
23 Aug
2004
- Updated VIH,EXTAL and VIL,EXTAL in table ’Oscillator Characteristics’
- Removed item ’Oscillator’ from table ’Operating Conditions’ as
already covered in table ’Oscillator Characteristics’
V01.23
09 Feb
2005
09 Feb
2005
- Corrected Flash Row Programming Time in NVM Timing
Characteristics
V01.24
01 Apr
2005
01 Apr
2005
- Changed TJavg and added footnote to data retention time in NVM
Reliability Characteristics
V01.25
05 Jul
2005
05 Jul
2005
- Updated NVM Reliability Characteristics
MC9S12DP512 Device Guide V01.25
Table of Contents
Section 1 Introduction
1.1
1.2
1.3
1.4
1.5
1.5.1
1.6
1.7
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19
Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22
Device Memory Map. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24
Detailed Register Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .27
Part ID Assignments. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49
Memory Size Assignments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49
Section 2 Signal Description
2.1
Device Pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .52
2.2
Signal Properties Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .53
2.3
Detailed Signal Descriptions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55
2.3.1
EXTAL, XTAL — Oscillator Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55
2.3.2
RESET — External Reset Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55
2.3.3
TEST — Test Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55
2.3.4
VREGEN — Voltage Regulator Enable Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55
2.3.5
XFC — PLL Loop Filter Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .56
2.3.6
BKGD / TAGHI / MODC — Background Debug, Tag High, and Mode Pin . . . . . . . .56
2.3.7
PAD15 / AN15 / ETRIG1 — Port AD Input Pin of ATD1 . . . . . . . . . . . . . . . . . . . . . .56
2.3.8
PAD[14:08] / AN[14:08] — Port AD Input Pins of ATD1 . . . . . . . . . . . . . . . . . . . . . .56
2.3.9
PAD7 / AN07 / ETRIG0 — Port AD Input Pin of ATD0 . . . . . . . . . . . . . . . . . . . . . . .56
2.3.10 PAD[06:00] / AN[06:00] — Port AD Input Pins of ATD0 . . . . . . . . . . . . . . . . . . . . . .56
2.3.11 PA[7:0] / ADDR[15:8] / DATA[15:8] — Port A I/O Pins . . . . . . . . . . . . . . . . . . . . . . .57
2.3.12 PB[7:0] / ADDR[7:0] / DATA[7:0] — Port B I/O Pins . . . . . . . . . . . . . . . . . . . . . . . . .57
2.3.13 PE7 / NOACC / XCLKS — Port E I/O Pin 7 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .57
2.3.14 PE6 / MODB / IPIPE1 — Port E I/O Pin 6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .58
2.3.15 PE5 / MODA / IPIPE0 — Port E I/O Pin 5 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .58
2.3.16 PE4 / ECLK — Port E I/O Pin 4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .58
2.3.17 PE3 / LSTRB / TAGLO — Port E I/O Pin 3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .59
2.3.18 PE2 / R/W — Port E I/O Pin 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .59
2.3.19 PE1 / IRQ — Port E Input Pin 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .59
5
MC9S12DP512 Device Guide V01.25
2.3.20
2.3.21
2.3.22
2.3.23
2.3.24
2.3.25
2.3.26
2.3.27
2.3.28
2.3.29
2.3.30
2.3.31
2.3.32
2.3.33
2.3.34
2.3.35
2.3.36
2.3.37
2.3.38
2.3.39
2.3.40
2.3.41
2.3.42
2.3.43
2.3.44
2.3.45
2.3.46
2.3.47
2.3.48
2.3.49
2.3.50
2.3.51
2.3.52
2.3.53
2.3.54
2.3.55
PE0 / XIRQ — Port E Input Pin 0. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .59
PH7 / KWH7 / SS2 — Port H I/O Pin 7 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .59
PH6 / KWH6 / SCK2 — Port H I/O Pin 6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .59
PH5 / KWH5 / MOSI2 — Port H I/O Pin 5 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .59
PH4 / KWH4 / MISO2 — Port H I/O Pin 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .59
PH3 / KWH3 / SS1 — Port H I/O Pin 3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .60
PH2 / KWH2 / SCK1 — Port H I/O Pin 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .60
PH1 / KWH1 / MOSI1 — Port H I/O Pin 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .60
PH0 / KWH0 / MISO1 — Port H I/O Pin 0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .60
PJ7 / KWJ7 / TXCAN4 / SCL / TXCAN0 — PORT J I/O Pin 7. . . . . . . . . . . . . . . . . .60
PJ6 / KWJ6 / RXCAN4 / SDA / RXCAN0 — PORT J I/O Pin 6 . . . . . . . . . . . . . . . . .60
PJ[1:0] / KWJ[1:0] — Port J I/O Pins [1:0] . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .60
PK7 / ECS / ROMCTL — Port K I/O Pin 7 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .60
PK[5:0] / XADDR[19:14] — Port K I/O Pins [5:0] . . . . . . . . . . . . . . . . . . . . . . . . . . . .61
PM7 / TXCAN3 / TXCAN4 — Port M I/O Pin 7 . . . . . . . . . . . . . . . . . . . . . . . . . . . . .61
PM6 / RXCAN3 / RXCAN4 — Port M I/O Pin 6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . .61
PM5 / TXCAN2 / TXCAN0 / TXCAN4 / SCK0 — Port M I/O Pin 5. . . . . . . . . . . . . . .61
PM4 / RXCAN2 / RXCAN0 / RXCAN4/ MOSI0 — Port M I/O Pin 4. . . . . . . . . . . . . .61
PM3 / TXCAN1 / TXCAN0 / SS0 — Port M I/O Pin 3 . . . . . . . . . . . . . . . . . . . . . . . .61
PM2 / RXCAN1 / RXCAN0 / MISO0 — Port M I/O Pin 2 . . . . . . . . . . . . . . . . . . . . . .61
PM1 / TXCAN0 / TXB — Port M I/O Pin 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .62
PM0 / RXCAN0 / RXB — Port M I/O Pin 0. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .62
PP7 / KWP7 / PWM7 / SCK2 — Port P I/O Pin 7 . . . . . . . . . . . . . . . . . . . . . . . . . . .62
PP6 / KWP6 / PWM6 / SS2 — Port P I/O Pin 6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . .62
PP5 / KWP5 / PWM5 / MOSI2 — Port P I/O Pin 5. . . . . . . . . . . . . . . . . . . . . . . . . . .62
PP4 / KWP4 / PWM4 / MISO2 — Port P I/O Pin 4. . . . . . . . . . . . . . . . . . . . . . . . . . .62
PP3 / KWP3 / PWM3 / SS1 — Port P I/O Pin 3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . .62
PP2 / KWP2 / PWM2 / SCK1 — Port P I/O Pin 2 . . . . . . . . . . . . . . . . . . . . . . . . . . .63
PP1 / KWP1 / PWM1 / MOSI1 — Port P I/O Pin 1. . . . . . . . . . . . . . . . . . . . . . . . . . .63
PP0 / KWP0 / PWM0 / MISO1 — Port P I/O Pin 0. . . . . . . . . . . . . . . . . . . . . . . . . . .63
PS7 / SS0 — Port S I/O Pin 7 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .63
PS6 / SCK0 — Port S I/O Pin 6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .63
PS5 / MOSI0 — Port S I/O Pin 5 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .63
PS4 / MISO0 — Port S I/O Pin 4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .63
PS3 / TXD1 — Port S I/O Pin 3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .63
PS2 / RXD1 — Port S I/O Pin 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .64
MC9S12DP512 Device Guide V01.25
2.3.56 PS1 / TXD0 — Port S I/O Pin 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .64
2.3.57 PS0 / RXD0 — Port S I/O Pin 0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .64
2.3.58 PT[7:0] / IOC[7:0] — Port T I/O Pins [7:0] . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .64
2.4
Power Supply Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .64
2.4.1
VDDX,VSSX — Power & Ground Pins for I/O Drivers . . . . . . . . . . . . . . . . . . . . . . . .65
2.4.2
VDDR, VSSR — Power & Ground Pins for I/O Drivers & Internal Voltage Regulator65
2.4.3
VDD1, VDD2, VSS1, VSS2 — Internal Logic Power Supply Pins . . . . . . . . . . . . . . .65
2.4.4
VDDA, VSSA — Power Supply Pins for ATD and VREG . . . . . . . . . . . . . . . . . . . . .65
2.4.5
VRH, VRL — ATD Reference Voltage Input Pins . . . . . . . . . . . . . . . . . . . . . . . . . . .65
2.4.6
VDDPLL, VSSPLL — Power Supply Pins for PLL . . . . . . . . . . . . . . . . . . . . . . . . . . .65
2.4.7
VREGEN — On Chip Voltage Regulator Enable . . . . . . . . . . . . . . . . . . . . . . . . . . . .66
Section 3 System Clock Description
3.1
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .67
Section 4 Modes of Operation
4.1
4.2
4.3
4.3.1
4.3.2
4.3.3
4.4
4.4.1
4.4.2
4.4.3
4.4.4
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .69
Chip Configuration Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .69
Security. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .70
Securing the Microcontroller . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .70
Operation of the Secured Microcontroller . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .70
Unsecuring the Microcontroller . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .71
Low Power Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .71
Stop . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .71
Pseudo Stop. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .71
Wait . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .71
Run. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .72
Section 5 Resets and Interrupts
5.1
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73
5.2
Vectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73
5.2.1
Vector Table. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73
5.3
Effects of Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .74
5.3.1
I/O pins. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .74
5.3.2
Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .75
Section 6 HCS12 Core Block Description
7
MC9S12DP512 Device Guide V01.25
6.1
6.1.1
6.2
6.2.1
6.3
6.3.1
6.4
6.5
6.5.1
6.6
CPU12 Block Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77
Device-specific information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77
HCS12 Module Mapping Control (MMC) Block Description . . . . . . . . . . . . . . . . . . . . . .77
Device-specific information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77
HCS12 Multiplexed External Bus Interface (MEBI) Block Description . . . . . . . . . . . . . .77
Device-specific information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77
HCS12 Interrupt (INT) Block Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77
HCS12 Background Debug (BDM) Block Description . . . . . . . . . . . . . . . . . . . . . . . . . .78
Device-specific information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .78
HCS12 Breakpoint (BKP) Block Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .78
Section 7 Clock and Reset Generator (CRG) Block Description
7.1
Device-specific information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .78
Section 8 Oscillator (OSC) Block Description
8.1
Device-specific information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .78
Section 9 Enhanced Capture Timer (ECT) Block Description
Section 10 Analog to Digital Converter (ATD) Block Description
Section 11 Inter-IC Bus (IIC) Block Description
Section 12 Serial Communications Interface (SCI) Block Description
Section 13 Serial Peripheral Interface (SPI) Block Description
Section 14 J1850 (BDLC) Block Description
Section 15 Pulse Width Modulator (PWM) Block Description
Section 16 Flash EEPROM 512K Block Description
Section 17 EEPROM 4K Block Description
Section 18 RAM Block Description
Section 19 MSCAN Block Description
MC9S12DP512 Device Guide V01.25
Section 20 Port Integration Module (PIM) Block Description
Section 21 Voltage Regulator (VREG) Block Description
Section 22 Printed Circuit Board Layout Proposal
Appendix A Electrical Characteristics
A.1 General. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .85
A.1.1
Parameter Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .85
A.1.2
Power Supply . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .85
A.1.3
Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .86
A.1.4
Current Injection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .87
A.1.5
Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .87
A.1.6
ESD Protection and Latch-up Immunity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .88
A.1.7
Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .89
A.1.8
Power Dissipation and Thermal Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . .89
A.1.9
I/O Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .91
A.1.10 Supply Currents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .92
A.2 ATD Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .95
A.2.1
ATD Operating Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .95
A.2.2
Factors influencing accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .95
A.2.3
ATD accuracy. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .97
A.3 NVM, Flash and EEPROM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .99
A.3.1
NVM timing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .99
A.3.2
NVM Reliability. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101
A.4 Voltage Regulator. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103
A.5 Reset, Oscillator and PLL. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .105
A.5.1
Startup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .105
A.5.2
Oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .106
A.5.3
Phase Locked Loop . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .107
A.6 MSCAN. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .111
A.7 SPI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113
A.7.1
Master Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113
A.7.2
Slave Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115
A.8 External Bus Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .117
A.8.1
General Muxed Bus Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .117
9
MC9S12DP512 Device Guide V01.25
Appendix B Package Information
B.1
B.2
General. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .121
112-pin LQFP package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .122
MC9S12DP512 Device Guide V01.25
List of Figures
Figure 0-1
Figure 1-1
Figure 1-2
Figure 2-1
Figure 2-2
Figure 2-3
Figure 2-4
Figure 2-5
Figure 3-1
Figure 22-1
Figure 22-2
Figure A-1
Figure A-2
Figure A-3
Figure A-4
Figure A-5
Figure A-6
Figure A-7
Figure A-8
Figure A-9
Figure A-10
Figure B-1
Order Part Number Example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
MC9S12DP512 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23
MC9S12DP512 Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .26
Pin Assignments in 112-pin LQFP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .52
PLL Loop Filter Connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .56
Colpitts Oscillator Connections (PE7=1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .57
Pierce Oscillator Connections (PE7=0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .58
External Clock Connections (PE7=0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .58
Clock Connections. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .67
Recommended PCB Layout for 112LQFP Colpitts Oscillator . . . . . . . . . . . . . . .82
Recommended PCB Layout for 112LQFP Pierce Oscillator . . . . . . . . . . . . . . . .83
ATD Accuracy Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
Typical Endurance vs Temperature. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102
Basic PLL functional diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 107
Jitter Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109
Maximum bus clock jitter approximation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109
SPI Master Timing (CPHA=0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 113
SPI Master Timing (CPHA=1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 114
SPI Slave Timing (CPHA=0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
SPI Slave Timing (CPHA=1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
General External Bus Timing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118
112-pin LQFP mechanical dimensions (case no. 987) . . . . . . . . . . . . . . . . . . 122
11
MC9S12DP512 Device Guide V01.25
MC9S12DP512 Device Guide V01.25
List of Tables
Table 0-1 Derivative Differences . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
Table 0-2 Document References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .17
Table 1-1 Device Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24
$0000 - $000F
MEBI map 1 of 3 (HCS12 Multiplexed External Bus Interface) . . . . . . . . . .27
$0010 - $0014
MMC map 1 of 4 (HCS12 Module Mapping Control) . . . . . . . . . . . . . . . . . .27
$0015 - $0016
INT map 1 of 2 (HCS12 Interrupt) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28
$0017 - $0019
Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28
$001A - $001B
Device ID Register (Table 1-3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28
$001C - $001D MMC map 3 of 4 (HCS12 Module Mapping Control, Table 1-4) . . . . . . . . .28
$001E - $001E
MEBI map 2 of 3 (HCS12 Multiplexed External Bus Interface) . . . . . . . . . .28
$001F - $001F
INT map 2 of 2 (HCS12 Interrupt) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28
$0020 - $0027
Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28
$0028 - $002F
BKP (HCS12 Breakpoint) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .29
$0030 - $0031
MMC map 4 of 4 (HCS12 Module Mapping Control) . . . . . . . . . . . . . . . . . .29
$0032 - $0033
MEBI map 3 of 3 (HCS12 Multiplexed External Bus Interface) . . . . . . . . . .29
$0034 - $003F
CRG (Clock and Reset Generator) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .29
$0040 - $007F
ECT (Enhanced Capture Timer 16 Bit 8 Channels) . . . . . . . . . . . . . . . . . .30
$0080 - $009F
ATD0 (Analog to Digital Converter 10 Bit 8 Channel) . . . . . . . . . . . . . . . . .33
$00A0 - $00C7
PWM (Pulse Width Modulator 8 Bit 8 Channel). . . . . . . . . . . . . . . . . . . . . .34
$00C8 - $00CF SCI0 (Asynchronous Serial Interface) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .36
$00D0 - $00D7 SCI1 (Asynchronous Serial Interface) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .36
$00D8 - $00DF SPI0 (Serial Peripheral Interface) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .36
$00E0 - $00E7
IIC (Inter IC Bus) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .37
$00E8 - $00EF
BDLC (Bytelevel Data Link Controller J1850) . . . . . . . . . . . . . . . . . . . . . . .37
$00F0 - $00F7
SPI1 (Serial Peripheral Interface) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .38
$00F8 - $00FF
SPI2 (Serial Peripheral Interface) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .38
$0100 - $010F
Flash Control Register (fts512k4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .38
$0110 - $011B
EEPROM Control Register (eets4k) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .39
$011C - $011F
Reserved for RAM Control Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .39
$0120 - $013F
ATD1 (Analog to Digital Converter 10 Bit 8 Channel) . . . . . . . . . . . . . . . . .40
$0140 - $017F
CAN0 (Freescale Scalable CAN - FSCAN) . . . . . . . . . . . . . . . . . . . . . . . . .41
Table 1-2 Detailed MSCAN Foreground Receive and Transmit Buffer Layout. . . . . . . . . . .42
$0180 - $01BF
CAN1 (Freescale Scalable CAN - FSCAN) . . . . . . . . . . . . . . . . . . . . . . . . .43
13
MC9S12DP512 Device Guide V01.25
$01C0 - $01FF
CAN2 (Freescale Scalable CAN - FSCAN) . . . . . . . . . . . . . . . . . . . . . . . . .44
$0200 - $023F
CAN3 (Freescale Scalable CAN - FSCAN) . . . . . . . . . . . . . . . . . . . . . . . . .45
$0240 - $027F
PIM (Port Integration Module PIM_9DP256) . . . . . . . . . . . . . . . . . . . . . . . .46
$0280 - $02BF
CAN4 (Freescale Scalable CAN - FSCAN) . . . . . . . . . . . . . . . . . . . . . . . . .48
$02C0 - $03FF
Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49
Table 1-3 Assigned Part ID Numbers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49
Table 1-4 Memory size registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49
Table 2-1 Signal Properties . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .53
Table 2-2 MC9S12DP512 Power and Ground Connection Summary . . . . . . . . . . . . . . . . . .64
Table 4-1 Mode Selection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .69
Table 4-2 Clock Selection Based on PE7 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .70
Table 4-3 Voltage Regulator VREGEN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .70
Table 5-1 Interrupt Vector Locations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73
Table 22-1 Suggested External Component Values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .81
Table A-1 Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .87
Table A-2 ESD and Latch-up Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .88
Table A-3 ESD and Latch-up Protection Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . .88
Table A-4 Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .89
Table A-5 Thermal Package Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .91
Table A-6 5V I/O Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .92
Table A-7 Supply Current Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .93
Table A-8 ATD Operating Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .95
Table A-9 ATD Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .96
Table A-10 ATD Conversion Performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .97
Table A-11 NVM Timing Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .100
Table A-12 NVM Reliability Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101
Table A-13 Voltage Regulator Recommended Load Capacitances . . . . . . . . . . . . . . . . . . . .103
Table A-14 Startup Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .105
Table A-15 Oscillator Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .106
Table A-16 PLL Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .110
Table A-17 MSCAN Wake-up Pulse Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .111
Table A-18 Measurement Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113
Table A-19 SPI Master Mode Timing Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .114
Table A-20 SPI Slave Mode Timing Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .116
Table A-21 Expanded Bus Timing Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .119
MC9S12DP512 Device Guide V01.25
Derivative Differences and Document References
Derivative Differences
Table 0-1 shows the availability of peripheral modules on the various derivatives. For details about the
compatibility within the MC9S12D-Family refer also to engineering bulletin EB386.
Table 0-1 Derivative Differences1
Modules
MC9S12DP512
MC9S12DT512
MC9S12DJ512
MC9S12A512
# of CANs
5
3
2
0
CAN0
✓
✓
✓
—
CAN1
✓
✓
—
—
CAN2
✓
—
—
—
CAN3
✓
—
—
—
CAN4
✓
✓
✓
—
J1850/BDLC
✓
—
✓
—
Package
112 LQFP
112 LQFP
112 LQFP
112 LQFP
Package
Code
PV
PV
PV
PV
Mask set
L00M
L00M
L00M
L00M
Temp Options
M, V, C
M, V, C
M, V, C
C
Notes
An errata exists
contact Sales
Office
An errata exists
contact Sales
Office
An errata exists
contact Sales
Office
An errata exists
contact Sales
Office
NOTES:
1. ✓: Available for this device, —: Not available for this device
The following figure provides an ordering number example for the MC9S12D-Family devices.
MC9S12 DP512
C PV
Package Option
Temperature Option
Device Title
Controller Family
Temperature Options
C = -40˚C to 85˚C
V = -40˚C to 105˚C
M = -40˚C to 125˚C
Package Options
FU = 80 QFP
PV = 112 LQFP
Figure 0-1 Order Part Number Example
15
MC9S12DP512 Device Guide V01.25
The following items should be considered when using a derivative (Table 0-1):
•
•
•
Registers
–
Do not write or read CAN0 registers (after reset: address range $0140 - $017F), if using a
derivative without CAN0.
–
Do not write or read CAN1registers (after reset: address range $0180 - $01BF), if using a
derivative without CAN1.
–
Do not write or read CAN2 registers (after reset: address range $01C0 - $01FF), if using a
derivative without CAN2.
–
Do not write or read CAN3 registers (after reset: address range $0200 - $023F), if using a
derivative without CAN3.
–
Do not write or read CAN4 registers (after reset: address range $0280 - $02BF), if using a
derivative without CAN4.
–
Do not write or read BDLC registers (after reset: address range $00E8 - $00EF), if using a
derivative without BDLC.
Interrupts
–
Fill the four CAN0 interrupt vectors ($FFB0 - $FFB7) according to your coding policies for
unused interrupts, if using a derivative without CAN0.
–
Fill the four CAN1 interrupt vectors ($FFA8 - $FFAF) according to your coding policies for
unused interrupts, if using a derivative without CAN1.
–
Fill the four CAN2 interrupt vectors ($FFA0 - $FFA7) according to your coding policies for
unused interrupts, if using a derivative without CAN2.
–
Fill the four CAN3 interrupt vectors ($FF98 - $FF9F) according to your coding policies for
unused interrupts, if using a derivative without CAN3.
–
Fill the four CAN4 interrupt vectors ($FF90 - $FF97) according to your coding policies for
unused interrupts, if using a derivative without CAN4.
–
Fill the BDLC interrupt vector ($FFC2, $FFC3) according to your coding policies for unused
interrupts, if using a derivative without BDLC.
Ports
–
The CAN0 pin functionality (TXCAN0, RXCAN0) is not available on port PJ7, PJ6, PM5,
PM4, PM3, PM2, PM1 and PM0, if using a derivative without CAN0.
–
The CAN1 pin functionality (TXCAN1, RXCAN1) is not available on port PM3 and PM2, if
using a derivative without CAN1.
–
The CAN2 pin functionality (TXCAN2, RXCAN2) is not available on port PM5 and PM4, if
using a derivative without CAN2.
–
The CAN3 pin functionality (TXCAN3, RXCAN3) is not available on port PM7 and PM6, if
using a derivative without CAN3.
MC9S12DP512 Device Guide V01.25
–
The CAN4 pin functionality (TXCAN4, RXCAN4) is not available on port PJ7, PJ6, PM7,
PM6, PM5 and PM4, if using a derivative without CAN0.
–
The BDLC pin functionality (TXB, RXB) is not available on port PM1 and PM0, if using a
derivative without BDLC.
–
Do not write MODRR1 and MODRR0 bits of Module Routing Register (PIM_9DP256 Block
Guide), if using a derivative without CAN0.
–
Do not write MODRR3 and MODRR2 bits of Module Routing Register (PIM_9DP256 Block
Guide), if using a derivative without CAN4.
Document References
The Device Guide provides information about the MC9S12DP512 device made up of standard HCS12
blocks and the HCS12 processor core.
This document is part of the customer documentation. A complete set of device manuals also includes the
individual Block Guides of the implemented modules. In an effort to reduce redundancy, all module
specific information is located only in the respective Block Guide. If applicable, special implementation
details of the module are given in the block description sections of this document.
See Table 0-2 for names and versions of the referenced documents throughout the Device Guide.
Table 0-2 Document References
Block Guide
Version
Document Order Number
HCS12 CPU Reference Manual
V02
S12CPUV2/D
HCS12 Module Mapping Control (MMC) Block Guide
V04
S12MMCV4/D
HCS12 Multiplexed External Bus Interface (MEBI) Block Guide
V03
S12MEBIV3/D
HCS12 Interrupt (INT) Block Guide
V01
S12INTV1/D
HCS12 Background Debug (BDM) Block Guide
V04
S12BDMV4/D
HCS12 Breakpoint (BKP) Block Guide
V01
S12BKPV1/D
Clock and Reset Generator (CRG) Block Guide
V04
S12CRGV4/D
Enhanced Capture Timer 16 Bit 8 Channel (ECT_16B8C) Block Guide
V01
S12ECT16B8V1/D
Analog to Digital Converter 10 Bit 8 Channel (ATD_10B8C) Block Guide
V02
S12ATD10B8CV2/D
Inter IC Bus (IIC) Block Guide
V02
S12IICV2/D
Asynchronous Serial Interface (SCI) Block Guide
V02
S12SCIV2/D
Serial Peripheral Interface (SPI) Block Guide
V03
S12SPIV3/D
Pulse Width Modulator 8 Bit 8 Channel (PWM_8B8C) Block Guide
V01
S12PWM8B8CV1/D
512K Byte Flash (FTS512K4) Block Guide
V01
S12FTS512K4V1/D
4K Byte EEPROM (EETS4K) Block Guide
V02
S12EETS4KV2/D
Byte Level Data Link Controller -J1850 (BDLC) Block Guide
V01
S12BDLCV1/D
Freescale Scalable CAN (MSCAN) Block Guide
V02
S12MSCANV2/D
Voltage Regulator (VREG) Block Guide
V01
S12VREGV1/D
Port Integration Module (PIM_9DP256) Block Guide1
V03
S12DP256PIMV3/D
Oscillator (OSC) Block Guide
V02
S12OSCV2/D
17
MC9S12DP512 Device Guide V01.25
NOTES:
1. Reused due to functional equivalence.
MC9S12DP512 Device Guide V01.25
Section 1 Introduction
1.1 Overview
The MC9S12DP512 microcontroller unit (MCU) is a 16-bit device composed of standard on-chip
peripherals including a 16-bit central processing unit (HCS12 CPU), 512K bytes of Flash EEPROM, 14K
bytes of RAM, 4K bytes of EEPROM, two asynchronous serial communications interfaces (SCI), three
serial peripheral interfaces (SPI), an 8-channel IC/OC enhanced capture timer, two 8-channel, 10-bit
analog-to-digital converters (ADC), an 8-channel pulse-width modulator (PWM), a digital Byte Data Link
Controller (BDLC), 29 discrete digital I/O channels (Port A, Port B, Port K and Port E), 20 discrete digital
I/O lines with interrupt and wake up capability, five CAN 2.0 A, B software compatible modules
(MSCAN12), and an Inter-IC Bus. The MC9S12DP512 has full 16-bit data paths throughout. However,
the external bus can operate in an 8-bit narrow mode so single 8-bit wide memory can be interfaced for
lower cost systems. The inclusion of a PLL circuit allows power consumption and performance to be
adjusted to suit operational requirements.
1.2 Features
•
HCS12 Core
–
16-bit HCS12 CPU
i. Upward compatible with M68HC11 instruction set
ii. Interrupt stacking and programmer’s model identical to M68HC11
iii. Instruction queue
iv. Enhanced indexed addressing
•
•
–
MEBI (Multiplexed External Bus Interface)
–
MMC (Module Mapping Control)
–
INT (Interrupt control)
–
BKP (Breakpoints)
–
BDM (Background Debug Mode)
CRG (Clock and Reset Generation)
–
Low current Colpitts oscillator or
–
Pierce oscillator
–
PLL
–
COP watchdog
–
Real Time Interrupt
–
Clock Monitor
8-bit and 4-bit ports with interrupt functionality
19
MC9S12DP512 Device Guide V01.25
•
•
•
•
•
•
•
–
Digital filtering
–
Programmable rising or falling edge trigger
Memory
–
512K Flash EEPROM
–
4K byte EEPROM
–
14K byte RAM
Two 8-channel Analog-to-Digital Converters
–
10-bit resolution
–
External conversion trigger capability
Five 1M bit per second, CAN 2.0 A, B software compatible modules
–
Five receive and three transmit buffers
–
Flexible identifier filter programmable as 2 x 32 bit, 4 x 16 bit or 8 x 8 bit
–
Four separate interrupt channels for Rx, Tx, error and wake-up
–
Low-pass filter wake-up function
–
Loop-back for self test operation
Enhanced Capture Timer
–
16-bit main counter with 7-bit prescaler
–
8 programmable input capture or output compare channels
–
Four 8-bit or two 16-bit pulse accumulators
8 PWM channels
–
Programmable period and duty cycle
–
8-bit 8-channel or 16-bit 4-channel
–
Separate control for each pulse width and duty cycle
–
Center-aligned or left-aligned outputs
–
Programmable clock select logic with a wide range of frequencies
–
Fast emergency shutdown input
–
Usable as interrupt inputs
Serial interfaces
–
Two asynchronous Serial Communications Interfaces (SCI)
–
Three Synchronous Serial Peripheral Interface (SPI)
Byte Data Link Controller (BDLC)
–
SAE J1850 Class B Data Communications Network Interface Compatible and ISO Compatible
for Low-Speed ( VDD5) is greater than IDD5, the
injection current may flow out of VDD5 and could result in external power supply going out of regulation.
Ensure external VDD5 load will shunt current greater than maximum injection current. This will be the
greatest risk when the MCU is not consuming power; e.g. if no system clock is present, or if clock rate is
very low which would reduce overall power consumption.
A.1.5 Absolute Maximum Ratings
Absolute maximum ratings are stress ratings only. A functional operation under or outside those maxima
is not guaranteed. Stress beyond those limits may affect the reliability or cause permanent damage of the
device.
This device contains circuitry protecting against damage due to high static voltage or electrical fields;
however, it is advised that normal precautions be taken to avoid application of any voltages higher than
maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused
inputs are tied to an appropriate logic voltage level (e.g., either VSS5 or VDD5).
Table A-1 Absolute Maximum Ratings1
Num
Rating
Symbol
Min
Max
Unit
1
I/O, Regulator and Analog Supply Voltage
VDD5
-0.3
6.0
V
2
Digital Logic Supply Voltage 2
VDD
-0.3
3.0
V
3
PLL Supply Voltage (2)
VDDPLL
-0.3
3.0
V
4
Voltage difference VDDX to VDDR and VDDA
∆VDDX
-0.3
0.3
V
5
Voltage difference VSSX to VSSR and VSSA
∆VSSX
-0.3
0.3
V
6
Digital I/O Input Voltage
VIN
-0.3
6.0
V
7
Analog Reference
VRH, VRL
-0.3
6.0
V
8
XFC, EXTAL, XTAL inputs
VILV
-0.3
3.0
V
9
TEST input
VTEST
-0.3
10.0
V
10
Instantaneous Maximum Current
Single pin limit for all digital I/O pins 3
ID
-25
+25
mA
11
Instantaneous Maximum Current
Single pin limit for XFC, EXTAL, XTAL4
IDL
-25
+25
mA
12
Instantaneous Maximum Current
Single pin limit for TEST 5
IDT
-0.25
0
mA
13
Storage Temperature Range
T
– 65
155
°C
stg
NOTES:
1. Beyond absolute maximum ratings device might be damaged.
87
MC9S12DP512 Device Guide V01.25
2. The device contains an internal voltage regulator to generate the logic and PLL supply out of the I/O supply.
The absolute maximum ratings apply when the device is powered from an external source.
3. All digital I/O pins are internally clamped to VSSX and VDDX, VSSR and VDDR or VSSA and VDDA.
4. Those pins are internally clamped to VSSPLL and VDDPLL.
5. This pin is clamped low to VSSX, but not clamped high. This pin must be tied low in applications.
A.1.6 ESD Protection and Latch-up Immunity
All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade
Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM), the Machine Model (MM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Table A-2 ESD and Latch-up Test Conditions
Model
Human Body
Machine
Description
Symbol
Value
Unit
Series Resistance
R1
1500
Ohm
Storage Capacitance
C
100
pF
Number of Pulse per pin
positive
negative
-
3
3
Series Resistance
R1
0
Ohm
Storage Capacitance
C
200
pF
Number of Pulse per pin
positive
negative
-
3
3
Minimum input voltage limit
-2.5
V
Maximum input voltage limit
7.5
V
Latch-up
Table A-3 ESD and Latch-up Protection Characteristics
Num C
Rating
Symbol
Min
Max
Unit
1
C Human Body Model (HBM)
VHBM
2000
-
V
2
C Machine Model (MM)
VMM
200
-
V
3
C Charge Device Model (CDM)
VCDM
500
-
V
4
Latch-up Current at TA = 125°C
C positive
negative
ILAT
+100
-100
-
mA
5
Latch-up Current at TA = 27°C
C positive
negative
ILAT
+200
-200
-
mA
MC9S12DP512 Device Guide V01.25
A.1.7 Operating Conditions
This chapter describes the operating conditions of the device. Unless otherwise noted those conditions
apply to all the following data.
NOTE:
Please refer to the temperature rating of the device (C, V, M) with regards to the
ambient temperature TA and the junction temperature TJ. For power dissipation
calculations refer to Section A.1.8 Power Dissipation and Thermal
Characteristics.
Table A-4 Operating Conditions
Rating
Symbol
Min
Typ
Max
Unit
I/O, Regulator and Analog Supply Voltage
VDD5
4.5
5
5.25
V
Digital Logic Supply Voltage 1
VDD
2.35
2.5
2.75
V
PLL Supply Voltage (1)
VDDPLL
2.35
2.5
2.75
V
Voltage Difference VDDX to VDDR and VDDA
∆VDDX
-0.1
0
0.1
V
Voltage Difference VSSX to VSSR and VSSA
∆VSSX
-0.1
0
0.1
V
fbus
0.25 2
-
25
MHz
Operating Junction Temperature Range
T
J
-40
-
100
°C
Operating Ambient Temperature Range 3
T
A
-40
27
85
°C
Operating Junction Temperature Range
TJ
-40
-
120
°C
Operating Ambient Temperature Range (3)
TA
-40
27
105
°C
Operating Junction Temperature Range
TJ
-40
-
140
°C
Operating Ambient Temperature Range (3)
TA
-40
27
125
°C
Bus Frequency (MC9S12DP512C, V, M)
MC9S12DP512C
MC9S12DP512V
MC9S12DP512M
NOTES:
1. The device contains an internal voltage regulator to generate the logic and PLL supply out of the I/O supply. The
given operating range applies when this regulator is disabled and the device is powered from an external source.
2. Some blocks e.g. ATD (conversion) and NVMs (program/erase) require higher bus frequencies for proper operation.
3. Please refer to Section A.1.8 Power Dissipation and Thermal Characteristics for more details about the relation between ambient temperature TA and device junction temperature TJ.
A.1.8 Power Dissipation and Thermal Characteristics
Power dissipation and thermal characteristics are closely related. The user must assure that the maximum
operating junction temperature is not exceeded. The average chip-junction temperature (TJ) in °C can be
obtained from:
89
MC9S12DP512 Device Guide V01.25
T J = T A + ( P D • Θ JA )
T J = Junction Temperature, [°C ]
T A = Ambient Temperature, [°C ]
P D = Total Chip Power Dissipation, [W]
Θ JA = Package Thermal Resistance, [°C/W]
The total power dissipation can be calculated from:
P D = P INT + P IO
P INT = Chip Internal Power Dissipation, [W]
Two cases with internal voltage regulator enabled and disabled must be considered:
1. Internal Voltage Regulator disabled
P INT = I DD ⋅ V DD + I DDPLL ⋅ V DDPLL + I DDA ⋅ V DDA
2
P IO =
R DSON ⋅ I IO
i
i
∑
PIO is the sum of all output currents on I/O ports associated with VDDX and VDDR.
For RDSON is valid:
V OL
R DSON = ------------ ;for outputs driven low
I OL
respectively
V DD5 – V OH
R DSON = ------------------------------------ ;for outputs driven high
I OH
2. Internal voltage regulator enabled
P INT = I DDR ⋅ V DDR + I DDA ⋅ V DDA
IDDR is the current shown in Table A-7 and not the overall current flowing into VDDR, which
additionally contains the current flowing into the external loads with output high.
2
P IO =
R DSON ⋅ I IO
i
i
∑
PIO is the sum of all output currents on I/O ports associated with VDDX and VDDR.
MC9S12DP512 Device Guide V01.25
Table A-5 Thermal Package Characteristics1
Num C
Rating
Symbol
Min
Typ
Max
Unit
1
T Thermal Resistance LQFP112, single sided PCB2
θJA
-
-
54
oC/W
2
T
Thermal Resistance LQFP112, double sided PCB
with 2 internal planes3
θJA
-
-
41
o
C/W
NOTES:
1. The values for thermal resistance are achieved by package simulations
2. PC Board according to EIA/JEDEC Standard 51-2
3. PC Board according to EIA/JEDEC Standard 51-7
A.1.9 I/O Characteristics
This section describes the characteristics of all 5V I/O pins. All parameters are not always applicable, e.g.
not all pins feature pull up/down resistances.
91
MC9S12DP512 Device Guide V01.25
Table A-6 5V I/O Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num C
1
2
Rating
Symbol
Min
Typ
Max
Unit
0.65*VDD5
-
-
V
P Input High Voltage
V
T Input High Voltage
VIH
-
-
VDD5 + 0.3
V
P Input Low Voltage
V
-
-
0.35*VDD5
V
T Input Low Voltage
VIL
VSS5 - 0.3
-
-
V
-
250
-
mV
–1
-
1
µA
VDD5 – 0.8
-
-
V
IH
IL
V
3
C Input Hysteresis
4
Input Leakage Current (pins in high impedance input
P mode)
V =V
or VSS5
in
DD5
5
Output High Voltage (pins in output mode)
P Partial Drive IOH = –2mA
Full Drive IOH = –10mA
V
6
Output Low Voltage (pins in output mode)
P Partial Drive IOL = +2mA
Full Drive IOL = +10mA
V
OL
-
-
0.8
V
7
Internal Pull Up Device Current,
P tested at V Max.
IPUL
-
-
-130
µA
Internal Pull Up Device Current,
C tested at V Min.
IPUH
-10
-
-
µA
9
Internal Pull Down Device Current,
P tested at V Min.
IH
IPDH
-
-
130
µA
10
Internal Pull Down Device Current,
C tested at V Max.
IPDL
10
-
-
µA
11
D Input Capacitance
Cin
-
6
-
pF
12
Injection current1
T Single Pin limit
Total Device Limit. Sum of all injected currents
IICS
IICP
-2.5
-25
-
2.5
25
mA
13
P Port H, J, P Interrupt Input Pulse filtered2
tPIGN
-
-
3
µs
14
P Port H, J, P Interrupt Input Pulse passed(2)
tPVAL
10
-
-
µs
IL
8
IH
IL
HYS
Iin
OH
NOTES:
1. Refer to Section A.1.4 Current Injection, for more details
2. Parameter only applies in STOP or Pseudo STOP mode.
A.1.10 Supply Currents
This section describes the current consumption characteristics of the device as well as the conditions for
the measurements.
MC9S12DP512 Device Guide V01.25
A.1.10.1 Measurement Conditions
All measurements are without output loads. Unless otherwise noted the currents are measured in single
chip mode, internal voltage regulator enabled and at 25MHz bus frequency using a 4MHz oscillator in
Colpitts mode. Production testing is performed using a square wave signal at the EXTAL input.
A.1.10.2 Additional Remarks
In expanded modes the currents flowing in the system are highly dependent on the load at the address, data
and control signals as well as on the duty cycle of those signals. No generally applicable numbers can be
given. A very good estimate is to take the single chip currents and add the currents due to the external
loads.
Table A-7 Supply Current Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num C
Rating
Symbol
Run supply currents
Single Chip, Internal regulator enabled
IDD5
1
P
2
P
P
All modules enabled, PLL on
only RTI enabled (1)
C
P
C
C
P
C
P
C
P
Pseudo Stop Current (RTI and COP disabled) 1, 2
-40°C
27°C
70°C
85°C
"C" Temp Option 100°C
105°C
"V" Temp Option 120°C
125°C
"M" Temp Option 140°C
C
C
C
C
C
C
C
Pseudo Stop Current (RTI and COP enabled) (1), (2)
-40°C
27°C
70°C
85°C
105°C
125°C
140°C
Min
Typ
-
-
-
-
Max
65
Unit
mA
Wait Supply current
3
4
IDDW
IDDPS
IDDPS
-
-
370
400
450
550
600
650
800
850
1200
570
600
650
750
850
1200
1500
40
5
mA
500
1600
µA
2100
5000
-
µA
Stop Current (2)
5
C
P
C
C
P
C
P
C
P
-40°C
27°C
70°C
85°C
"C" Temp Option 100°C
105°C
"V" Temp Option 120°C
125°C
"M" Temp Option 140°C
IDDS
-
12
25
100
130
160
200
350
400
600
100
1200
µA
1700
5000
93
MC9S12DP512 Device Guide V01.25
NOTES:
1. PLL off
2. At those low power dissipation levels TJ = TA can be assumed
MC9S12DP512 Device Guide V01.25
A.2 ATD Characteristics
This section describes the characteristics of the analog to digital converter.
A.2.1 ATD Operating Characteristics
The Table A-8 shows conditions under which the ATD operates.
The following constraints exist to obtain full-scale, full range results:
VSSA ≤ VRL ≤ VIN ≤ VRH ≤ VDDA. This constraint exists since the sample buffer amplifier can not drive
beyond the power supply levels that it ties to. If the input level goes outside of this range it will effectively
be clipped.
Table A-8 ATD Operating Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num C
Rating
Symbol
Min
Typ
Max
Unit
VRL
VRH
VSSA
VDDA/2
-
VDDA/2
VDDA
V
V
Reference Potential
1
D
Low
High
2
C Differential Reference Voltage1
VRH-VRL
4.50
5.00
5.25
V
3
D ATD Clock Frequency
fATDCLK
0.5
-
2.0
MHz
4
D
NCONV10
TCONV10
14
7
-
28
14
Cycles
µs
5
D
NCONV8
TCONV8
12
6
-
26
13
Cycles
µs
6
D Recovery Time (VDDA=5.0 Volts)
tREC
-
-
20
µs
7
P Reference Supply current 2 ATD blocks on
IREF
-
-
0.750
mA
8
P Reference Supply current 1 ATD block on
IREF
-
-
0.375
mA
ATD 10-Bit Conversion Period
Clock Cycles2
Conv, Time at 2.0MHz ATD Clock fATDCLK
ATD 8-Bit Conversion Period
Clock Cycles(2)
Conv, Time at 2.0MHz ATD Clock fATDCLK
NOTES:
1. Full accuracy is not guaranteed when differential voltage is less than 4.50V
2. The minimum time assumes a final sample period of 2 ATD clocks cycles while the maximum time assumes a final sample
period of 16 ATD clocks.
A.2.2 Factors influencing accuracy
Three factors - source resistance, source capacitance and current injection - have an influence on the
accuracy of the ATD.
A.2.2.1 Source Resistance
Due to the input pin leakage current as specified in Table A-6 in conjunction with the source resistance
there will be a voltage drop from the signal source to the ATD input. The maximum source resistance RS
95
MC9S12DP512 Device Guide V01.25
specifies results in an error of less than 1/2 LSB (2.5mV) at the maximum leakage current. If device or
operating conditions are less than worst case or leakage-induced error is acceptable, larger values of source
resistance is allowed.
A.2.2.2 Source Capacitance
When sampling an additional internal capacitor is switched to the input. This can cause a voltage drop due
to charge sharing with the external and the pin capacitance. For a maximum sampling error of the input
voltage ≤ 1LSB, then the external filter capacitor, Cf ≥ 1024 * (CINS- CINN).
A.2.2.3 Current Injection
There are two cases to consider.
1. A current is injected into the channel being converted. The channel being stressed has conversion
values of $3FF ($FF in 8-bit mode) for analog inputs greater than VRH and $000 for values less than
VRL unless the current is higher than specified as disruptive condition.
2. Current is injected into pins in the neighborhood of the channel being converted. A portion of this
current is picked up by the channel (coupling ratio K), This additional current impacts the accuracy
of the conversion depending on the source resistance.
The additional input voltage error on the converted channel can be calculated as VERR = K * RS *
IINJ, with IINJ being the sum of the currents injected into the two pins adjacent to the converted
channel.
Table A-9 ATD Electrical Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num C
Rating
Symbol
Min
Typ
Max
Unit
RS
-
-
1
KΩ
CINN
CINS
-
-
10
22
pF
1
C Max input Source Resistance
2
Total Input Capacitance
T Non Sampling
Sampling
3
C Disruptive Analog Input Current
INA
-2.5
-
2.5
mA
4
C Coupling Ratio positive current injection
Kp
-
-
10-4
A/A
5
C Coupling Ratio negative current injection
Kn
-
-
10-2
A/A
MC9S12DP512 Device Guide V01.25
A.2.3 ATD accuracy
Table A-10 specifies the ATD conversion performance excluding any errors due to current injection,
input capacitance and source resistance.
Table A-10 ATD Conversion Performance
Conditions are shown in Table A-4 unless otherwise noted
VREF = VRH - VRL = 5.12V. Resulting to one 8 bit count = 20mV and one 10 bit count = 5mV
fATDCLK = 2.0MHz
Num C
Rating
Symbol
Min
Typ
Max
Unit
1
P 10-Bit Resolution
LSB
-
5
-
mV
2
P 10-Bit Differential Nonlinearity
DNL
–1
-
1
Counts
3
P 10-Bit Integral Nonlinearity
INL
–2.5
±1.5
2.5
Counts
4
P 10-Bit Absolute Error1
AE
-3
±2.0
3
Counts
5
P 8-Bit Resolution
LSB
-
20
-
mV
6
P 8-Bit Differential Nonlinearity
DNL
–0.5
-
0.5
Counts
7
P 8-Bit Integral Nonlinearity
INL
–1.0
±0.5
1.0
Counts
8
P 8-Bit Absolute Error(1)
AE
-1.5
±1.0
1.5
Counts
NOTES:
1. These values include the quantization error which is inherently 1/2 count for any A/D converter.
For the following definitions see also Figure A-1.
Differential Non-Linearity (DNL) is defined as the difference between two adjacent switching steps.
Vi – Vi – 1
DNL ( i ) = ------------------------ – 1
1LSB
The Integral Non-Linearity (INL) is defined as the sum of all DNLs:
n
INL ( n ) =
∑
i=1
Vn – V0
DNL ( i ) = -------------------- – n
1LSB
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MC9S12DP512 Device Guide V01.25
DNL
10-Bit Absolute Error Boundary
LSB
Vi-1
Vi
$3FF
8-Bit Absolute Error Boundary
$3FE
$3FD
$3FC
$FF
$3FB
$3FA
$3F9
$3F8
$FE
$3F7
$3F6
$3F4
8-Bit Resolution
10-Bit Resolution
$3F5
$FD
$3F3
9
Ideal Transfer Curve
8
2
7
10-Bit Transfer Curve
6
5
4
1
3
8-Bit Transfer Curve
2
1
0
5
10
15
20
25
30
35
40
45
5055 5060 5065 5070 5075 5080 5085 5090 5095 5100 5105 5110 5115 5120
Vin
mV
Figure A-1 ATD Accuracy Definitions
NOTE:
Figure A-1 shows only definitions, for specification values refer to Table A-10.
MC9S12DP512 Device Guide V01.25
A.3 NVM, Flash and EEPROM
NOTE:
Unless otherwise noted the abbreviation NVM (Non Volatile Memory) is used for
both Flash and EEPROM.
A.3.1 NVM timing
The time base for all NVM program or erase operations is derived from the oscillator. A minimum
oscillator frequency fNVMOSC is required for performing program or erase operations. The NVM modules
do not have any means to monitor the frequency and will not prevent program or erase operation at
frequencies above or below the specified minimum. Attempting to program or erase the NVM modules at
a lower frequency a full program or erase transition is not assured.
The Flash and EEPROM program and erase operations are timed using a clock derived from the oscillator
using the FCLKDIV and ECLKDIV registers respectively. The frequency of this clock must be set within
the limits specified as fNVMOP.
The minimum program and erase times shown in Table A-11 are calculated for maximum fNVMOP and
maximum fbus. The maximum times are calculated for minimum fNVMOP and a fbus of 2MHz.
A.3.1.1 Single Word Programming
The programming time for single word programming is dependant on the bus frequency as a well as on
the frequency fNVMOP and can be calculated according to the following formula.
1
1
t swpgm = 9 ⋅ --------------------- + 25 ⋅ ---------f NVMOP
f bus
A.3.1.2 Row Programming
This applies only to the Flash where up to 64 words in a row can be programmed consecutively by keeping
the command pipeline filled. The time to program a consecutive word can be calculated as:
1
1
t bwpgm = 4 ⋅ --------------------- + 9 ⋅ ---------f NVMOP
f bus
The time to program a whole row is:
t brpgm = t swpgm + 63 ⋅ t bwpgm
Row programming is more than 2 times faster than single word programming.
A.3.1.3 Sector Erase
Erasing a 1024 byte Flash sector or a 4 byte EEPROM sector takes:
1
t era ≈ 4000 ⋅ --------------------f NVMOP
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MC9S12DP512 Device Guide V01.25
The setup time can be ignored for this operation.
A.3.1.4 Mass Erase
Erasing a NVM block takes:
1
t mass ≈ 20000 ⋅ --------------------f NVMOP
The setup time can be ignored for this operation.
A.3.1.5 Blank Check
The time it takes to perform a blank check on the Flash or EEPROM is dependant on the location of the
first non-blank word starting at relative address zero. It takes one bus cycle per word to verify plus a setup
of the command.
t check ≈ location ⋅ t cyc + 10 ⋅ t cyc
Table A-11 NVM Timing Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num C
Rating
Symbol
Min
Typ
Max
Unit
1
D External Oscillator Clock
fNVMOSC
0.5
-
50 1
MHz
2
D Bus frequency for Programming or Erase Operations
fNVMBUS
1
-
-
MHz
3
D Operating Frequency
fNVMOP
150
-
200
kHz
4
P Single Word Programming Time
tswpgm
46 2
-
74.5 3
µs
5
D Flash Row Programming consecutive word 4
tbwpgm
20.4 (2)
-
31 (3)
µs
6
D Flash Row Programming Time for 64 Words (4)
tbrpgm
1331.2 (2)
-
2027.5 (3)
µs
7
P Sector Erase Time
tera
20 5
-
26.7 (3)
ms
8
P Mass Erase Time
tmass
100 (5)
-
133 (3)
ms
9
D Blank Check Time Flash per block
tcheck
11 6
-
65546 7
tcyc
10
D Blank Check Time EEPROM per block
tcheck
11 (6)
-
2058 (7)
tcyc
NOTES:
1. Restrictions for oscillator in crystal mode apply!
2. Minimum Programming times are achieved under maximum NVM operating frequency fNVMOP and maximum bus frequency
fbus.
3. Maximum Erase and Programming times are achieved under particular combinations of fNVMOP and bus frequency fbus.
Refer to formulae in Sections Section A.3.1.1 Single Word Programming- Section A.3.1.4 Mass Erasefor guidance.
4. Row Programming operations are not applicable to EEPROM
5. Minimum Erase times are achieved under maximum NVM operating frequency fNVMOP.
6. Minimum time, if first word in the array is not blank
7. Maximum time to complete check on an erased block
MC9S12DP512 Device Guide V01.25
A.3.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed
Table A-12 NVM Reliability Characteristics1
Conditions are shown in Table A-4 unless otherwise noted
Num C
Rating
Symbol
Min
Typ
Max
15
1002
—
Unit
Flash Reliability Characteristics
Data retention after 10,000 program/erase cycles at
an average junction temperature of TJavg ≤ 85°C
1
C
2
Data retention with