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MDE6IC9120NR1

MDE6IC9120NR1

  • 厂商:

    NXP(恩智浦)

  • 封装:

    TO-270-16

  • 描述:

    MOSFET N-CH RF 900MHZ TO-270-16

  • 数据手册
  • 价格&库存
MDE6IC9120NR1 数据手册
Freescale Semiconductor Technical Data Document Number: MDE6IC9120N Rev. 0, 11/2009 RF LDMOS Wideband Integrated Power Amplifiers The MDE6IC9120N/GN wideband integrated circuit is designed with on - chip matching that makes it usable from 920 to 960 MHz. This multi - stage structure is rated for 26 to 32 Volt operation and covers all typical cellular base station modulation formats. • Typical Doherty Single - Carrier W - CDMA Performance: VDD = 28 Volts, IDQ1A = IDQ1B = 90 mA, IDQ2A = 550 mA, VG2B = 1.6 Vdc, Pout = 25 Watts Avg., IQ Magnitude Clipping, Channel Bandwidth = 3.84 MHz, Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF. Frequency Gps (dB) PAE (%) Output PAR (dB) ACPR (dBc) 920 MHz 32.5 38.4 6.6 - 39.0 940 MHz 32.0 38.0 6.7 - 40.4 960 MHz 31.3 37.7 7.0 - 39.6 MDE6IC9120NR1 MDE6IC9120GNR1 920 - 960 MHz, 25 W AVG., 28 V SINGLE W - CDMA RF LDMOS WIDEBAND INTEGRATED POWER AMPLIFIERS CASE 1866 - 02 TO - 270 WBL - 16 PLASTIC MDE6IC9120NR1 • Capable of Handling 10:1 VSWR, @ 32 Vdc, 940 MHz, 146 Watts CW Output Power (3 dB Input Overdrive from Rated Pout), Designed for Enhanced Ruggedness • Stable into a 5:1 VSWR. All Spurs Below - 60 dBc @ 100 mW to 120 Watts CW Pout • Typical Pout @ 1 dB Compression Point ] 120 Watts CW Features • Production Tested in a Symmetrical Doherty Configuration • 100% PAR Tested for Guaranteed Output Power Capability • Characterized with Series Equivalent Large - Signal Impedance Parameters and Common Source S - Parameters • On - Chip Matching (50 Ohm Input, DC Blocked) • Integrated Quiescent Current Temperature Compensation with Enable/Disable Function (1) • Integrated ESD Protection • 225°C Capable Plastic Package • RoHS Compliant • In Tape and Reel. R1 Suffix = 500 Units per 44 mm, 13 inch Reel VGS1A CARRIER (2) RFinA RFout1/VDS2A VGS2A Quiescent Current Temperature Compensation (1) VDS1A VDS1B VGS2B PEAKING (2) RFinB RFout2/VDS2B VGS1A GND RFinA GND GND VGS2A VDS1A VDS1B VGS2B GND GND RFinB GND VGS1B CASE 1867 - 02 TO - 270 WBL - 16 GULL PLASTIC MDE6IC9120GNR1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 16 15 RFout1/VDS2A RFout2/VDS2B (Top View) VGS1B Quiescent Current Temperature Compensation (1) Figure 1. Functional Block Diagram Note: Exposed backside of the package is the source terminal for the transistors. Figure 2. Pin Connections 1. Refer to AN1977, Quiescent Current Thermal Tracking Circuit in the RF Integrated Circuit Family and to AN1987, Quiescent Current Control for the RF Integrated Circuit Device Family. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1977 or AN1987. 2. Peaking and Carrier orientation is determined by the test fixture design. © Freescale Semiconductor, Inc., 2009. All rights reserved. RF Device Data Freescale Semiconductor MDE6IC9120NR1 MDE6IC9120GNR1 1 Table 1. Maximum Ratings Rating Symbol Value Unit Drain- Source Voltage VDSS - 0.5, +66 Vdc Gate- Source Voltage VGS - 0.5, +10 Vdc Operating Voltage VDD 32, +0 Vdc Storage Temperature Range Tstg - 65 to +150 °C Case Operating Temperature TC 150 °C Operating Junction Temperature (1,2) TJ 225 °C Input Power Pin 30 dBm Symbol Value (2,3) Unit Table 2. Thermal Characteristics Characteristic Final Doherty Application RθJC Thermal Resistance, Junction to Case Case Temperature 80°C, Pout = 30 W CW Stage 1A, 27 Vdc, IDQ1A = 90 mA Stage 1B, 27 Vdc, IDQ1B = 90 mA Stage 2A, 27 Vdc, IDQ2A = 550 mA Stage 2B, 27 Vdc, VG2B = 2.5 Vdc °C/W 6.0 4.9 1.3 0.95 Table 3. ESD Protection Characteristics Test Methodology Class Human Body Model (per JESD22 - A114) 1B (Minimum) Machine Model (per EIA/JESD22 - A115) A (Minimum) Charge Device Model (per JESD22 - C101) III (Minimum) Table 4. Moisture Sensitivity Level Test Methodology Per JESD22 - A113, IPC/JEDEC J - STD - 020 Rating Package Peak Temperature Unit 3 260 °C 1. Continuous use at maximum temperature will affect MTTF. 2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF calculators by product. 3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955. MDE6IC9120NR1 MDE6IC9120GNR1 2 RF Device Data Freescale Semiconductor Table 5. Electrical Characteristics (TA = 25°C unless otherwise noted) Symbol Min Typ Max Unit Zero Gate Voltage Drain Leakage Current (VDS = 66 Vdc, VGS = 0 Vdc) IDSS — — 10 μAdc Zero Gate Voltage Drain Leakage Current (VDS = 28 Vdc, VGS = 0 Vdc) IDSS — — 1 μAdc Gate- Source Leakage Current (VGS = 1.5 Vdc, VDS = 0 Vdc) IGSS — — 1 μAdc Gate Threshold Voltage (VDS = 10 Vdc, ID = 20 μAdc) VGS(th) 1 1.7 3 Vdc Gate Quiescent Voltage (VDS = 28 Vdc, IDQ1A = IDQ1B = 90 mA) VGS(Q) — 2.5 — Vdc Fixture Gate Quiescent Voltage (VDD = 28 Vdc, IDQ1A = IDQ1B = 90 mA, Measured in Functional Test) VGG(Q) 7.4 8.1 8.8 Vdc Zero Gate Voltage Drain Leakage Current (VDS = 66 Vdc, VGS = 0 Vdc) IDSS — — 10 μAdc Zero Gate Voltage Drain Leakage Current (VDS = 28 Vdc, VGS = 0 Vdc) IDSS — — 1 μAdc Gate- Source Leakage Current (VGS = 1.5 Vdc, VDS = 0 Vdc) IGSS — — 1 μAdc Gate Threshold Voltage (VDS = 10 Vdc, ID = 160 μAdc) VGS(th) 1 1.7 3 Vdc Gate Quiescent Voltage (VDS = 28 Vdc, IDQ2A = 550 mA) VGS(Q) — 2.1 — Vdc Fixture Gate Quiescent Voltage (VDD = 28 Vdc, IDQ2A = 550 mA, Measured in Functional Test) VGG(Q) 5.8 6.5 7.2 Vdc Drain- Source On - Voltage (VGS = 10 Vdc, ID = 407 mA) VDS(on) 0.15 0.3 0.8 Vdc Characteristic Stage 1 — Off Characteristics (1) Stage 1 — On Characteristics (1) Stage 2 — Off Characteristics (1) Stage 2 — On Characteristics (1) Functional Tests (2,3,4) (In Freescale Doherty Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ1A = IDQ1B = 90 mA, IDQ2A = 550 mA, VG2B = 1.6 Vdc, Pout = 25 W Avg., f = 940 MHz, Single- Carrier W - CDMA, IQ Magnitude Clipping, Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF. ACPR measured in 3.84 MHz Channel Bandwidth @ ±5 MHz Offset. Power Gain Gps 30.0 32.0 36.0 dB Power Added Efficiency PAE 36.0 38.0 — % PAR 5.8 6.7 — dB ACPR — - 40.4 - 36.0 dBc Output Peak - to - Average Ratio @ 0.01% Probability on CCDF Adjacent Channel Power Ratio Typical Broadband Performance (3) (In Freescale Doherty Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ1A = IDQ1B = 90 mA, IDQ2A = 550 mA, VG2B = 1.6 Vdc, Pout = 25 W Avg., Single - Carrier W - CDMA, IQ Magnitude Clipping, Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF. ACPR measured in 3.84 MHz Channel Bandwidth @ ±5 MHz Offset 1. 2. 3. 4. Frequency Gps (dB) PAE (%) Output PAR (dB) ACPR (dBc) 920 MHz 32.5 38.4 6.6 - 39.0 940 MHz 32.0 38.0 6.7 - 40.4 960 MHz 31.3 37.7 7.0 - 39.6 Each side of device measured separately. Part internally matched both on input and output. Measurement made with device in a Symmetrical Doherty configuration. Measurement made with device in straight lead configuration before any lead forming operation is applied. (continued) MDE6IC9120NR1 MDE6IC9120GNR1 RF Device Data Freescale Semiconductor 3 Table 5. Electrical Characteristics (TA = 25°C unless otherwise noted) (continued) Symbol Characteristic Min Typ Max Unit Typical Performances (1) (In Freescale Doherty Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ1A = IDQ1B = 90 mA, IDQ2A = 550 mA, VG2B = 1.6 Vdc, 920 - 960 MHz Bandwidth Pout @ 1 dB Compression Point, CW P1dB — 120 — — 8 — W IMD Symmetry @ 90 W PEP, Pout where IMD Third Order Intermodulation ` 30 dBc (Delta IMD Third Order Intermodulation between Upper and Lower Sidebands > 2 dB) IMDsym VBW Resonance Point (IMD Third Order Intermodulation Inflection Point) VBWres — 50 — MHz ΔIQT — — 0.02 0.03 — — % Gain Flatness in 40 MHz Bandwidth @ Pout = 25 W Avg. GF — 1.2 — dB Gain Variation over Temperature ( - 30°C to +85°C) ΔG — 0.04 — dB/°C ΔP1dB — 0.02 — dBm/°C Quiescent Current Accuracy over Temperature (2) with 4.3 kΩ Gate Feed Resistors ( - 30 to 85°C) Output Power Variation over Temperature ( - 30°C to +85°C) Stage 1 Stage 2 MHz 1. Measurement made with device in a Symmetrical Doherty configuration. 2. Refer to AN1977, Quiescent Current Thermal Tracking Circuit in the RF Integrated Circuit Family and to AN1987, Quiescent Current Control for the RF Integrated Circuit Device Family. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1977 or AN1987. MDE6IC9120NR1 MDE6IC9120GNR1 4 RF Device Data Freescale Semiconductor R3 MDE6IC9120N Rev 2A VG1 C3 C19 VD2 C13 C27 VG2 Coupler 1 C11 C6 C7 R1 C12 C10 C8 R6 VD1 C1 CUT OUT AREA R5 C9 C5 VD1 C17 C21 C23 C25 C26 C24 C22 VG2 C2 C28 C18 C14 R4 VG1 C4 VD2 C20 Note: Component numbers C15, C16 and R2 are not used. Figure 3. MDE6IC9120NR1(GNR1) Test Circuit Component Layout Table 6. MDE6IC9120NR1(GNR1) Test Circuit Component Designations and Values Part Description Part Number Manufacturer C1, C2, C5, C6, C7, C8 0.01 μF, 50 V Chip Capacitors GCM2195C1H103JA16D Murata C3, C4, C9, C10, C11, C12 1.0 μF, 35 V Chip Capacitors GRM32RR71H105KA01K Murata C13, C14, C27, C28 39.0 pF Chip Capacitors ATC600F390JT250XT ATC C17, C18 10.0 μF, 35 V Chip Capacitors GRM55DR61H106KA88L Murata C19, C20 220 μF, 50 V Electrolytic Capacitors EMVY500ADA221MJA0G Nippon Chemi - Con C21, C22 15.0 pF Chip Capacitors ATC600F150GT250XT ATC C23, C24 1.6 pF Chip Capacitors ATC600F1R6JT250XT ATC C25, C26 2.7 pF Chip Capacitors ATC600F2R7JT250XT ATC Coupler 1 50 Ω, 3 dB Hybrid Coupler GSC362- HYB0900 Soshin R1 50 Ω, 10 W Termination RFP - 060120A15Z50- 2 Anaren R3, R4, R5, R6 4.3 KΩ, 1/4 W Chip Resistors CRCW12064K30FKEA Vishay PCB 0.020″, εr = 3.50 RO4350B Rogers MDE6IC9120NR1 MDE6IC9120GNR1 RF Device Data Freescale Semiconductor 5 Single−ended l 4 l 4 l 2 Quadrature combined l 4 Doherty l 2 Push−pull Figure 4. Possible Circuit Topologies MDE6IC9120NR1 MDE6IC9120GNR1 6 RF Device Data Freescale Semiconductor 35 VDD = 28 Vdc, Pout = 25 W (Avg.) 30 PAE 30 Gps 25 20 IDQ1A = IDQ1B = 90 mA, IDQ2A = 550 mA VG2B = 1.6 Vdc, Single−Carrier W−CDMA, 3.84 MHz Channel Bandwidth, Input Signal PAR = 7.5 dB 10 @ 0.01% Probability on CCDF −30 20 PARC 15 −40 ACPR 10 800 825 850 875 900 925 950 0 −50 1000 975 −1 −2 PARC (dB) 40 PAE, POWER ADDED EFFICIENCY (%) 40 ACPR (dBc) Gps, POWER GAIN (dB) TYPICAL CHARACTERISTICS −3 f, FREQUENCY (MHz) IMD, INTERMODULATION DISTORTION (dBc) Figure 5. Output Peak - to - Average Ratio Compression (PARC) Broadband Performance @ Pout = 25 Watts Avg. −10 VDD = 28 Vdc, Pout = 90 W (PEP), IDQ1A = IDQ1B = 90 mA IDQ2A = 550 mA, VG2B = 1.6 Vdc, Two−Tone Measurements (f1 + f2)/2 = Center Frequency of 940 MHz −20 IM3−U −30 IM3−L −40 IM5−U IM5−L −50 IM7−L −60 IM7−U −70 10 1 100 TWO−TONE SPACING (MHz) Figure 6. Intermodulation Distortion Products versus Two - Tone Spacing 35 30 25 20 0 PAE 50 ACPR −1 dB = 33.01 W −1 40 −2 dB = 50.78 W −2 −3 dB = 67.13 W Gps −3 −4 −5 10 PARC Single−Carrier W−CDMA, 3.84 MHz Channel Bandwidth, Input Signal PAR = 7.5 dB @ 0.01% PARC Probability on CCDF 20 30 40 50 60 70 80 −20 60 VDD = 28 Vdc, IDQ1A = IDQ1B = 90 mA, IDQ2A = 550 mA VG2B = 1.6 Vdc, f = 940 MHz 90 30 20 10 0 −25 −30 −35 ACPR (dBc) 40 OUTPUT COMPRESSION AT 0.01% PROBABILITY ON CCDF (dB) Gps, POWER GAIN (dB) 45 1 PAE, POWER ADDED EFFICIENCY (%) 50 −40 −45 −50 100 Pout, OUTPUT POWER (WATTS) Figure 7. Output Peak - to - Average Ratio Compression (PARC) versus Output Power MDE6IC9120NR1 MDE6IC9120GNR1 RF Device Data Freescale Semiconductor 7 TYPICAL CHARACTERISTICS 920 MHz 940 MHz 960 MHz 34 PAE 40 3.84 MHz Channel Bandwidth Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF 920 MHz 33 32 30 Gps 960 MHz 31 20 10 940 MHz ACPR 30 50 940 MHz 960 MHz −25 −30 −35 −40 −45 −50 0 100 10 1 PAE, POWER ADDED EFFICIENCY (%) Gps, POWER GAIN (dB) 35 −20 60 VDD = 28 Vdc, IDQ1A = IDQ1B = 90 mA, IDQ2A = 550 mA VG2B = 1.6 Vdc, Single−Carrier, W−CDMA ACPR (dBc) 36 Pout, OUTPUT POWER (WATTS) AVG. Figure 8. Single - Carrier W - CDMA Power Gain, Power Added Efficiency and ACPR versus Output Power 5 40 Gain 35 0 −5 −10 25 VDD = 28 Vdc, Pin = 0 dBm IDQ1A = IDQ1B = 90 mA IDQ2A = 550 mA, VG2B = 1.6 Vdc 20 15 −15 IRL (dB) GAIN (dB) 30 −20 −25 10 IRL −30 5 0 600 700 800 1000 900 1100 −35 1200 f, FREQUENCY (MHz) Figure 9. Broadband Frequency Response W - CDMA TEST SIGNAL 100 10 0 −10 Input Signal −30 0.1 0.01 W−CDMA. ACPR Measured in 3.84 MHz Channel Bandwidth @ ±5 MHz Offset. Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF 0.001 0.0001 0 1 2 3 4 5 6 −50 +ACPR in 3.84 MHz Integrated BW −ACPR in 3.84 MHz Integrated BW −70 −80 7 8 9 Figure 10. CCDF W - CDMA IQ Magnitude Clipping, Single - Carrier Test Signal MDE6IC9120NR1 MDE6IC9120GNR1 −40 −60 PEAK−TO−AVERAGE (dB) 8 3.84 MHz Channel BW −20 1 (dB) PROBABILITY (%) 10 10 −90 −100 −9 −7.2 −5.4 −3.6 −1.8 0 1.8 3.6 5.4 7.2 9 f, FREQUENCY (MHz) Figure 11. Single - Carrier W - CDMA Spectrum RF Device Data Freescale Semiconductor VDD = 28 Vdc, IDQ1A = IDQB = 90 mA, IDQ2A = 550 mA, VG2B = 1.6 Vdc, Pout = 25 W Avg. f MHz Zin W Zload W 820 56.02 - j0.10 3.61 + j1.78 840 57.03 - j2.95 3.11 + j1.50 860 57.27 - j6.01 2.65 + j1.56 880 57.45 - j8.80 2.28 + j1.81 900 57.56 - j12.21 2.07 + j2.11 920 56.66 - j15.98 1.87 + j2.40 940 55.81 - j19.90 1.77 + j2.64 960 53.45 - j23.91 1.75 + j2.89 980 51.34 - j27.40 1.58 + j3.12 Note: Measured with Peaking side open. Zin = Device input impedance as measured from gate to ground. Zload = Test circuit impedance as measured from drain to ground. Output Matching Network Device Under Test Z Z in load Figure 12. Series Equivalent Input and Load Impedance — Carrier Side VDD = 28 Vdc, IDQ1A = IDQB = 90 mA, IDQ2A = 550 mA, VG2B = 1.6 Vdc, Pout = 25 W Avg. f MHz Zin W Zload W 820 56.02 - j0.10 2.56 - j3.47 840 57.03 - j2.95 2.36 - j2.95 860 57.27 - j6.01 2.15 - j2.39 880 57.45 - j8.80 2.02 - j1.85 900 57.56 - j12.21 1.90 - j1.32 920 56.66 - j15.98 1.72 - j0.85 940 55.81 - j19.90 1.60 - j0.39 960 53.45 - j23.91 1.47 + j0.12 980 51.34 - j27.40 1.30 + j0.66 Note: Measured with Carrier side open. Zin = Device input impedance as measured from gate to ground. Zload = Test circuit impedance as measured from drain to ground. Output Matching Network Device Under Test Z in Z load Figure 13. Series Equivalent Input and Load Impedance — Peaking Side MDE6IC9120NR1 MDE6IC9120GNR1 RF Device Data Freescale Semiconductor 9 ALTERNATIVE PEAK TUNE LOAD PULL CHARACTERISTICS VDD = 28 Vdc, IDQ1A = 90 mA, IDQ2A = 550 mA, Pulsed CW, 10 μsec(on), 10% Duty Cycle 56 Pout, OUTPUT POWER (dBm) 55 Ideal 54 53 52 920 MHz 51 Actual 50 920 MHz 49 940 MHz 48 960 MHz 940 MHz 960 MHz 47 46 45 9 10 11 12 14 13 15 16 18 17 19 20 Pin, INPUT POWER (dBm) NOTE: Load Pull Test Fixture Tuned for Peak P1dB Output Power @ 28 V P1dB P3dB f (MHz) Watts dBm Watts dBm 920 98.4 49.9 123 50.9 940 98.9 50.0 123 50.9 960 95.5 49.8 118 50.7 Test Impedances per Compression Level f (MHz) Zsource Ω Zload Ω 920 P1dB 49.53 - j0.96 1.59 - j0.84 940 P1dB 48.85 - j0.63 1.75 - j0.53 960 P1dB 51.26 - j0.82 1.72 - j0.33 Figure 14. Pulsed CW Output Power versus Input Power @ 28 V NOTE: Measurement made on the Class AB, carrier side of the device. MDE6IC9120NR1 MDE6IC9120GNR1 10 RF Device Data Freescale Semiconductor PACKAGE DIMENSIONS MDE6IC9120NR1 MDE6IC9120GNR1 RF Device Data Freescale Semiconductor 11 MDE6IC9120NR1 MDE6IC9120GNR1 12 RF Device Data Freescale Semiconductor MDE6IC9120NR1 MDE6IC9120GNR1 RF Device Data Freescale Semiconductor 13 MDE6IC9120NR1 MDE6IC9120GNR1 14 RF Device Data Freescale Semiconductor MDE6IC9120NR1 MDE6IC9120GNR1 RF Device Data Freescale Semiconductor 15 MDE6IC9120NR1 MDE6IC9120GNR1 16 RF Device Data Freescale Semiconductor PRODUCT DOCUMENTATION Refer to the following documents to aid your design process. Application Notes • AN1955: Thermal Measurement Methodology of RF Power Amplifiers • AN1977: Quiescent Current Thermal Tracking Circuit in the RF Integrated Circuit Family • AN1987: Quiescent Current Control for the RF Integrated Circuit Device Family Engineering Bulletins • EB212: Using Data Sheet Impedances for RF LDMOS Devices Software • Electromigration MTTF Calculator • RF High Power Model • .s2p File For Software and Tools, do a Part Number search at http://www.freescale.com, and select the “Part Number” link. Go to the Software & Tools tab on the part’s Product Summary page to download the respective tool. REVISION HISTORY The following table summarizes revisions to this document. Revision Date 0 Nov. 2009 Description • Initial Release of Data Sheet MDE6IC9120NR1 MDE6IC9120GNR1 RF Device Data Freescale Semiconductor 17 How to Reach Us: Home Page: www.freescale.com Web Support: http://www.freescale.com/support USA/Europe or Locations Not Listed: Freescale Semiconductor, Inc. Technical Information Center, EL516 2100 East Elliot Road Tempe, Arizona 85284 1 - 800- 521- 6274 or +1 - 480- 768- 2130 www.freescale.com/support Europe, Middle East, and Africa: Freescale Halbleiter Deutschland GmbH Technical Information Center Schatzbogen 7 81829 Muenchen, Germany +44 1296 380 456 (English) +46 8 52200080 (English) +49 89 92103 559 (German) +33 1 69 35 48 48 (French) www.freescale.com/support Japan: Freescale Semiconductor Japan Ltd. Headquarters ARCO Tower 15F 1 - 8 - 1, Shimo - Meguro, Meguro - ku, Tokyo 153 - 0064 Japan 0120 191014 or +81 3 5437 9125 support.japan@freescale.com Asia/Pacific: Freescale Semiconductor China Ltd. Exchange Building 23F No. 118 Jianguo Road Chaoyang District Beijing 100022 China +86 10 5879 8000 support.asia@freescale.com For Literature Requests Only: Freescale Semiconductor Literature Distribution Center 1 - 800- 441- 2447 or +1 - 303- 675- 2140 Fax: +1 - 303- 675- 2150 LDCForFreescaleSemiconductor@hibbertgroup.com Information in this document is provided solely to enable system and software implementers to use Freescale Semiconductor products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits or integrated circuits based on the information in this document. Freescale Semiconductor reserves the right to make changes without further notice to any products herein. Freescale Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Freescale Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters that may be provided in Freescale Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals”, must be validated for each customer application by customer’s technical experts. Freescale Semiconductor does not convey any license under its patent rights nor the rights of others. Freescale Semiconductor products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the Freescale Semiconductor product could create a situation where personal injury or death may occur. Should Buyer purchase or use Freescale Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold Freescale Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that Freescale Semiconductor was negligent regarding the design or manufacture of the part. Freescalet and the Freescale logo are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. © Freescale Semiconductor, Inc. 2009. All rights reserved. MDE6IC9120NR1 MDE6IC9120GNR1 Document Number: MDE6IC9120N Rev. 0, 11/2009 18 RF Device Data Freescale Semiconductor
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