NX5L2750CGU
Analog switch with negative swing audio capability
Rev. 2.1 — 12 February 2020
1
Product data sheet
General description
The NX5L2750CGU is a dual low-ohmic single-pole double-throw analog switch suitable
for use as an analog or digital 2 : 1 multiplexer/demultiplexer. Each switch has a digital
select input (nS), two independent inputs/outputs (nY0 and nY1) and a common input/
output (nZ).
The NX5L2750CGU is capable of switching audio signals with negative swing without the
need of a coupling capacitor.
Schmitt trigger action at the digital inputs makes the circuit tolerant to slower input
rise and fall times. Low threshold digital inputs allows this device to be driven by 1.8 V
logic levels in 3.3 V applications without significant increase in supply current ICC. This
makes it possible for the NX5L2750CGU to switch 5 V audio signals with a 1.8 V digital
controller, eliminating the need for logic level translation.
2
Features and benefits
•
•
•
•
•
•
•
Supply voltage range from 1.8 V to 5.0 V
0.8 Ω typical ON resistance
100 MHz typical bandwidth or data frequency
CMOS low-power consumption
1.8 V control logic at VCC = 3.6 V
Break-before-make switching
ESD protection:
– HBM JESD22-A114F Class 3A exceeds 4000 V
– CDM AEC-Q100-011 revision B exceeds 1000 V
• Latch-up performance exceeds 100 mA per JESD 78 Class II Level A
• Specified from -40 °C to +85 °C
3
Applications
• Cellular phones, PDA
• Portable media players
• Personal media players
NX5L2750CGU
NXP Semiconductors
Analog switch with negative swing audio capability
4
Ordering information
Table 1. Ordering information
Type number
NX5L2750CGU
Topside
marking
Package
Name
Description
Version
LA
XQFN10
plastic, extremely thin quad flat package; no
leads; 10 terminals; body 1.40 x 1.80 x 0.50
mm
SOT1160-1
4.1 Ordering options
Table 2. Ordering options
Type number
Orderable part
number
Package
Packing method Minimum order
quantity
Temperature
NX5L2750CGU
NX5L2750CGUX
XQFN10
REEL 7" Q1 NDP 4000
Tamb = -40 °C to +85 °C
5
Functional diagram
1Y0
2Y0
1S
2S
1Z
2Z
1Y1
2Y1
001aaj085
Figure 1. Logic symbol
6
Pinning information
8 1S
terminal 1
index area
9 1Z
10 1Y1
6.1 Pinning
6 GND
2Y0 5
2Y1 2
2S 4
7 1Y0
2Z 3
VCC 1
aaa-008538
Transparent top view
Figure 2. Pin configuration SOT1160-1 (XQFN10)
NX5L2750CGU
Product data sheet
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NXP Semiconductors
Analog switch with negative swing audio capability
6.2 Pin description
Table 3. Pin description
Symbol
Pin
Description
VCC
1
supply voltage
2Y0, 1Y0
5, 7
independent input or output
2Z, 1Z
3, 9
common output or input
2S, 1S
4, 8
select input
GND
6
ground (0 V)
2Y1, 1Y1
2, 10
independent input or output
7
Functional description
Table 4. Function table
[1]
Input
Channel on
nS
L
nY0 = nZ
H
nY1 = nZ
[1]
H = HIGH voltage level; L = LOW voltage level.
8
Limiting values
Table 5. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to GND (ground = 0 V).
Symbol
Parameter
VCC
supply voltage
Conditions
[1]
pins nS
Min
Max
Unit
-0.5
+5.5
V
-0.5
+5.5
V
-4.0
VCC + 0.5 V
VI
input voltage
VSW
switch voltage
IIK
input clamping current
VI < -0.5 V
-50
-
mA
ISK
switch clamping current
VI < -4.0 V or VI > VCC + 0.5 V
-
±50
mA
ISW
switch current
Tamb = 25 °C
-
±250
mA
Tamb = 25 °C; peak current (pulsed at 1 ms
duration; < 10 % duty cycle)
-
±500
mA
ICC
supply current
-
+50
mA
Tstg
storage temperature
-65
+150
°C
Ptot
total power dissipation
-
250
mW
[1]
Tamb = -40 °C to +85 °C
The minimum input voltage rating may be exceeded if the input current rating is observed.
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Product data sheet
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NXP Semiconductors
Analog switch with negative swing audio capability
9
Recommended operating conditions
Table 6. Recommended operating conditions
Symbol
Parameter
VCC
supply voltage
VI
input voltage
VSW
switch voltage
Tamb
ambient temperature
[1]
Conditions
pins nS
[1]
Min
Max
Unit
1.8
5.0
V
0
5.0
V
-2.5
VCC
V
-40
+85
°C
The voltage across the switch should be < 5.5 V.
10 Static characteristics
Table 7. Static characteristics
At recommended operating conditions; voltages are referenced to GND (ground 0 V).
Symbol
Parameter
Conditions
Tamb = -40 °C to +85 °C
Min
Typ
[1]
Unit
Max
HIGH-level input
voltage
VCC = 2.7 V to 4.3 V
1.4
-
-
V
VCC = 4.3 V to 5.0 V
1.5
-
-
V
LOW-level input
voltage
VCC = 2.7 V to 4.3 V
-
-
0.6
V
VCC = 4.3 V to 5.0 V
-
-
0.6
V
VIK
input clamping
voltage
VCC = 3.0 V; II = -18 mA
-
-
-1.2
V
II
input leakage
current
pins nS; VI = 0 V to VCC; VCC = 0 V to
4.3 V
-
-
±1
μA
IS(OFF)
OFF-state leakage VCC = 2.7 V; VI = -2.5 V or 2.5 V; VO
current
= 2.5 V or -2.5 V; see Figure 3
-
-
±250
nA
ICC
supply current
VI = VCC or GND; VSW = GND or VCC;
VCC = 2.7 V
2
μA
ΔICC
additional supply
current
VI = 2.6 V; VSW = GND or VCC; VCC =
4.3 V
-
-
10
μA
VI = 1.8 V; VSW = GND or VCC; VCC =
4.3 V
-
-
15
μA
VIH
VIL
CI
input capacitance
pins nS
-
1.5
-
pF
CS(OFF)
OFF-state
capacitance
pins nY0 and nY1; VCC = 3.3 V; VI = 0
V to 3.3 V
-
35
-
pF
CS(ON)
ON-state
capacitance
pins nZ; VCC = 3.3 V; VI = 0 V to 3.3 V
-
75
-
pF
[1]
Typical values are measured at Tamb = 25 °C and VCC = 3.3 V.
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Product data sheet
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Analog switch with negative swing audio capability
10.1 Test circuits
VCC
nS
VIL or VIH
nY0 1
nZ
IS
switch
nS
1
VIH
2
VIL
switch
nY1 2
GND
VO
VI
aaa-008539
Figure 3. Test circuit for measuring OFF-state leakage current
10.2 ON resistance
Table 8. ON resistance
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
Symbol
Parameter
Conditions
[1]
-40 °C to +85 °C
Min
Typ
[2]
Unit
Max
RON
ON resistance
VI = VCC-4.5 V to VCC; ISW = 100 mA; VCC = 2.7 V;
see Figure 4
-
0.8
1.3
Ω
RON(flat)
ON resistance
(flatness)
VI = VCC-4.5 V to VCC; ISW = 100 mA; VCC = 2.7 V;
see Figure 4
-
0.3
-
Ω
ΔRON
ON resistance
VI = VCC-4.5 V; ISW = 100 mA; VCC = 2.7 V; see
mismatch between Figure 4
channels
-
0.1
-
Ω
[1]
[2]
Measured at identical VCC, temperature and input voltage.
Typical values are measured at Tamb = 25 °C.
10.3 ON resistance test circuit and graphs
VSW
VCC
nS
VIL or VIH
nZ
V
nY0 1
nS
1
VIL
2
VIH
switch
nY1 2
GND
VI
switch
ISW
aaa-008533
RON = VSW / ISW.
Figure 4. Test circuit for measuring ON resistance
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Product data sheet
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NXP Semiconductors
Analog switch with negative swing audio capability
11 Dynamic characteristics
Table 9. Dynamic characteristics
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); for test circuit see Figure 7.
Symbol
Parameter
Conditions
Tamb = -40 °C to +85 °C
Min
ten
[1]
[2]
[3]
[4]
Max
VCC = 2.7 V to 3.6 V
[2]
-
80
160
ns
VCC = 3.6 V to 4.3 V
[3]
-
70
120
ns
VCC = 2.7 V to 3.6 V
[2]
-
25
50
ns
VCC = 3.6 V to 4.3 V
[3]
-
25
50
ns
VCC = 2.7 V to 3.6 V
15
55
-
ns
VCC = 3.6 V to 4.3 V
12
45
-
ns
nS to nZ; see Figure 5
disable time
tb-m
Unit
nS to nZ; see Figure 5
enable time
tdis
Typ
[1]
[4]
see Figure 6
break-before-make time
Typical values are measured at Tamb = 25 °C.
Typical values are measured at VCC = 3.3 V.
Typical values are measured at VCC = 4.3 V.
Guaranteed by design.
11.1 Waveform and test circuits
VI
VM
nS input
GND
ten
nY1 connected to VEXT
nZ output
OFF to HIGH
HIGH to OFF
VOH
tdis
VX
VX
GND
tdis
nY0 connected to VEXT
nZ output
HIGH to OFF
OFF to HIGH
VOH
ten
VX
VX
001aak762
GND
Measurement points are given in Table 10.
Logic level: VOH and VOLare typical output voltage levels that occur with the output load.
Figure 5. Enable and disable times
Table 10. Measurement points
Supply voltage
Input
VCC
VM
VI
VX
2.7 V to 4.3 V
0.5VCC
VCC
0.9VOH
NX5L2750CGU
Product data sheet
Output
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NXP Semiconductors
Analog switch with negative swing audio capability
VCC
nS
nY0
nZ
G
V
VI
VO
RL
nY1
VEXT = 1.5 V
CL
GND
012aaa004
a. Test circuit.
VI
0.5VI
0.9VO
0.9VO
VO
tb-m
001aag572
b. Input and output measurement points
Figure 6. Test circuit for measuring break-before-make timing
VCC
G
VI
V
VO
RL
nS
nY0
1
nZ
nY1
2
switch
VEXT = 1.5 V
CL
GND
012aaa005
Test data is given in Table 11.
Definitions test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
VEXT = External voltage for measuring switching times.
Figure 7. Test circuit for measuring switching times
Table 11. Test data
Supply voltage
Input
VCC
VI
tr, tf
CL
RL
2.7 V to 4.3 V
VCC
≤ 2.5 ns
35 pF
50 Ω
NX5L2750CGU
Product data sheet
Load
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NXP Semiconductors
Analog switch with negative swing audio capability
11.2 Additional dynamic characteristics
Table 12. Additional dynamic characteristics
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); VI = GND or VCC (unless otherwise
specified); tr = tf ≤ 2.5 ns; Tamb = 25 °C.
Symbol Parameter
Conditions
THD
fi = 20 Hz to 20 kHz; RL = 32 Ω; see Figure 8
f(-3dB)
αiso
total harmonic
distortion
Min
Unit
-
0.07
-
%
VCC = 4.3 V; VI = 2 V (p-p)
-
0.03
-
%
-
100
-
MHz
-
-60
-
dB
-
-60
-
dB
VCC = 2.7 V
-
3
-
pC
VCC = 3.3 V
-
4
-
pC
VCC = 4.3 V
-
5
-
pC
-3 dB frequency
response
RL = 50 Ω; see Figure 9
isolation (OFF-state)
fi = 100 kHz; RL = 50 Ω; see Figure 10
VCC = 2.7 V to 4.3 V
between switches; fi = 100 kHz; RL = 50 Ω; see
Figure 11
crosstalk
VCC = 2.7 V to 4.3 V
Qinj
Max
VCC = 2.7 V; VI = 2 V (p-p)
VCC = 2.7 V to 4.3 V
Xtalk
Typ
fi = 1 MHz; CL = 0.1 nF; RL = 1 MΩ; Vgen = 0 V; Rgen
= 0 Ω; see Figure 12
charge injection
11.3 Test circuits
VCC
nS
VIL or VIH
nZ
nY0 1
switch
nY1 2
switch
nS
1
VIL
2
VIH
GND
RL
fi
D
aaa-008534
Figure 8. Test circuit for measuring total harmonic distortion
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Analog switch with negative swing audio capability
VCC
nS
VIL or VIH
nY0 1
nZ
switch
nY1 2
switch
nS
1
VIL
2
VIH
GND
RL
fi
dB
aaa-008535
Adjust fi voltage to obtain 0 dBm level at output. Increase fi frequency until dB meter reads -3 dB.
Figure 9. Test circuit for measuring the frequency response when channel is in ON-state
VCC
nS
VIL or VIH
nY0 1
nZ
switch
nY1 2
switch
nS
1
VIH
2
VIL
GND
RL
RL
fi
dB
aaa-008536
Adjust fi voltage to obtain 0 dBm level at input.
Figure 10. Test circuit for measuring isolation (OFF-state)
nY0 or nZ
CHANNEL
ON
nZ or nY0
50 Ω
fi
RL
V
VO1
V
VO2
nS
VIL
nY0 or nZ
nZ or nY0
CHANNEL
OFF
Ri
50 Ω
RL
aaa-008537
20 log10 (VO2 / VO1) or 20 log10 (VO1 / VO2).
Figure 11. Test circuit for measuring crosstalk between switches
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Analog switch with negative swing audio capability
VCC
nS
nY0 1
nZ
nY1 2
switch
Rgen
VI
G
VO
RL
CL
Vgen
GND
012aaa011
a. Test circuit
logic
(nS) off
input
on
VO
off
ΔVO
012aaa012
b. Input and output pulse definitions
Definition: Qinj = ΔVO × CL.
ΔVO = output voltage variation.
Rgen = generator resistance.
Vgen = generator voltage.
Figure 12. Test circuit for measuring charge injection
NX5L2750CGU
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Analog switch with negative swing audio capability
12 Package outline
XQFN10: plastic, extremely thin quad flat package; no leads;
10 terminals; body 1.40 x 1.80 x 0.50 mm
SOT1160-1
X
D
B
A
terminal 1
index area
E
A
A1
A3
detail X
e1
e
v
w
b
3
5
C
C A B
C
y1 C
y
L
2
6
1
7
e2
terminal 1
index area
10
L1
8
0
1
Dimensions
Unit(1)
max
nom
min
mm
2 mm
scale
A
A1
0.5
0.05
A3
b
0.25
0.127 0.20
0.00
0.15
D
E
e
e1
e2
1.5
1.4
1.3
1.9
1.8
1.7
0.4
0.8
0.4
L
L1
0.45 0.55
0.40 0.50
0.35 0.45
v
0.1
w
y
y1
0.05 0.05 0.05
Note
1. Plastic or metal protrusions of 0.075 mm maximum per side are not included.
References
Outline
version
IEC
JEDEC
JEITA
SOT1160-1
---
---
---
sot1160-1_po
European
projection
Issue date
09-12-28
09-12-29
Figure 13. Package outline SOT1160-1 (XQFN10)
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Analog switch with negative swing audio capability
13 Abbreviations
Table 13. Abbreviations
Acronym
Description
CDM
Charged Device Model
CMOS
Complementary Metal-Oxide Semiconductor
ESD
ElectroStatic Discharge
HBM
Human Body Model
MM
Machine Model
TTL
Transistor-Transistor Logic
UART
Universal Asynchronous Receiver/Transmitter
USB
Universal Serial Bus
14 Revision history
Table 14. Revision history
Document ID
Release date
Data sheet status
Change notice
Supersedes
NX5L2750CGU v.2.1
20200212
Product data sheet
-
NX5L2750C v.2
Modifications:
• Section 4: Updated look and feel
• NX5L2750C renamed NX5L2750CGU throughout data sheet
NX5L2750C v.2
20140507
Modifications:
Updated by adding the following values:
• Table 7: minimum VIH level added at VCC = 4.3 V to 5.0 V
• Table 7: minimum VIL level added at VCC = 4.3 V to 5.0 V
NX5L2750C v.1
20130906
NX5L2750CGU
Product data sheet
Product data sheet
Product data sheet
-
-
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Rev. 2.1 — 12 February 2020
NX5L2750C v.1
-
© NXP B.V. 2020. All rights reserved.
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NXP Semiconductors
Analog switch with negative swing audio capability
15 Legal information
15.1 Data sheet status
Document status
[1][2]
Product status
[3]
Definition
Objective [short] data sheet
Development
This document contains data from the objective specification for product
development.
Preliminary [short] data sheet
Qualification
This document contains data from the preliminary specification.
Product [short] data sheet
Production
This document contains the product specification.
[1]
[2]
[3]
Please consult the most recently issued document before initiating or completing a design.
The term 'short data sheet' is explained in section "Definitions".
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple
devices. The latest product status information is available on the Internet at URL http://www.nxp.com.
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
15.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences
of use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is
intended for quick reference only and should not be relied upon to contain
detailed and full information. For detailed and full information see the
relevant full data sheet, which is available on request via the local NXP
Semiconductors sales office. In case of any inconsistency or conflict with the
short data sheet, the full data sheet shall prevail.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product
is deemed to offer functions and qualities beyond those described in the
Product data sheet.
15.3 Disclaimers
Limited warranty and liability — Information in this document is believed
to be accurate and reliable. However, NXP Semiconductors does not
give any representations or warranties, expressed or implied, as to the
accuracy or completeness of such information and shall have no liability
for the consequences of use of such information. NXP Semiconductors
takes no responsibility for the content in this document if provided by an
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Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to
make changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
NX5L2750CGU
Product data sheet
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors and its suppliers accept no liability for
inclusion and/or use of NXP Semiconductors products in such equipment or
applications and therefore such inclusion and/or use is at the customer’s own
risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes
no representation or warranty that such applications will be suitable
for the specified use without further testing or modification. Customers
are responsible for the design and operation of their applications and
products using NXP Semiconductors products, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suitable and fit for the customer’s applications
and products planned, as well as for the planned application and use of
customer’s third party customer(s). Customers should provide appropriate
design and operating safeguards to minimize the risks associated with
their applications and products. NXP Semiconductors does not accept any
liability related to any default, damage, costs or problem which is based
on any weakness or default in the customer’s applications or products, or
the application or use by customer’s third party customer(s). Customer is
responsible for doing all necessary testing for the customer’s applications
and products using NXP Semiconductors products in order to avoid a
default of the applications and the products or of the application or use by
customer’s third party customer(s). NXP does not accept any liability in this
respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those
given in the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individual agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
All information provided in this document is subject to legal disclaimers.
Rev. 2.1 — 12 February 2020
© NXP B.V. 2020. All rights reserved.
13 / 16
NX5L2750CGU
NXP Semiconductors
Analog switch with negative swing audio capability
No offer to sell or license — Nothing in this document may be interpreted
or construed as an offer to sell products that is open for acceptance or
the grant, conveyance or implication of any license under any copyrights,
patents or other industrial or intellectual property rights.
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
Non-automotive qualified products — Unless this data sheet expressly
states that this specific NXP Semiconductors product is automotive qualified,
the product is not suitable for automotive use. It is neither qualified nor
tested in accordance with automotive testing or application requirements.
NXP Semiconductors accepts no liability for inclusion and/or use of nonautomotive qualified products in automotive equipment or applications. In
the event that customer uses the product for design-in and use in automotive
applications to automotive specifications and standards, customer (a) shall
use the product without NXP Semiconductors’ warranty of the product for
NX5L2750CGU
Product data sheet
such automotive applications, use and specifications, and (b) whenever
customer uses the product for automotive applications beyond NXP
Semiconductors’ specifications such use shall be solely at customer’s own
risk, and (c) customer fully indemnifies NXP Semiconductors for any liability,
damages or failed product claims resulting from customer design and use
of the product for automotive applications beyond NXP Semiconductors’
standard warranty and NXP Semiconductors’ product specifications.
Translations — A non-English (translated) version of a document is for
reference only. The English version shall prevail in case of any discrepancy
between the translated and English versions.
15.4 Trademarks
Notice: All referenced brands, product names, service names and
trademarks are the property of their respective owners.
All information provided in this document is subject to legal disclaimers.
Rev. 2.1 — 12 February 2020
© NXP B.V. 2020. All rights reserved.
14 / 16
NX5L2750CGU
NXP Semiconductors
Analog switch with negative swing audio capability
Tables
Tab. 1.
Tab. 2.
Tab. 3.
Tab. 4.
Tab. 5.
Tab. 6.
Tab. 7.
Ordering information ..........................................2
Ordering options ................................................2
Pin description ...................................................3
Function table ....................................................3
Limiting values .................................................. 3
Recommended operating conditions ................. 4
Static characteristics ......................................... 4
Tab. 8.
Tab. 9.
Tab. 10.
Tab. 11.
Tab. 12.
Tab. 13.
Tab. 14.
ON resistance ................................................... 5
Dynamic characteristics .................................... 6
Measurement points ..........................................6
Test data ........................................................... 7
Additional dynamic characteristics .................... 8
Abbreviations ...................................................12
Revision history ...............................................12
Fig. 8.
Test circuit for measuring total harmonic
distortion ............................................................ 8
Test circuit for measuring the frequency
response when channel is in ON-state ..............9
Test circuit for measuring isolation (OFFstate) ................................................................. 9
Test circuit for measuring crosstalk between
switches .............................................................9
Test circuit for measuring charge injection ...... 10
Package outline SOT1160-1 (XQFN10) .......... 11
Figures
Fig. 1.
Fig. 2.
Fig. 3.
Fig. 4.
Fig. 5.
Fig. 6.
Fig. 7.
Logic symbol ..................................................... 2
Pin configuration SOT1160-1 (XQFN10) ...........2
Test circuit for measuring OFF-state
leakage current ................................................. 5
Test circuit for measuring ON resistance .......... 5
Enable and disable times ..................................6
Test circuit for measuring break-beforemake timing .......................................................7
Test circuit for measuring switching times .........7
NX5L2750CGU
Product data sheet
Fig. 9.
Fig. 10.
Fig. 11.
Fig. 12.
Fig. 13.
All information provided in this document is subject to legal disclaimers.
Rev. 2.1 — 12 February 2020
© NXP B.V. 2020. All rights reserved.
15 / 16
NX5L2750CGU
NXP Semiconductors
Analog switch with negative swing audio capability
Contents
1
2
3
4
4.1
5
6
6.1
6.2
7
8
9
10
10.1
10.2
10.3
11
11.1
11.2
11.3
12
13
14
15
General description ............................................ 1
Features and benefits .........................................1
Applications .........................................................1
Ordering information .......................................... 2
Ordering options ................................................ 2
Functional diagram ............................................. 2
Pinning information ............................................ 2
Pinning ............................................................... 2
Pin description ................................................... 3
Functional description ........................................3
Limiting values .................................................... 3
Recommended operating conditions ................ 4
Static characteristics .......................................... 4
Test circuits ....................................................... 5
ON resistance ....................................................5
ON resistance test circuit and graphs ................5
Dynamic characteristics .....................................6
Waveform and test circuits ................................ 6
Additional dynamic characteristics .....................8
Test circuits ....................................................... 8
Package outline .................................................11
Abbreviations .................................................... 12
Revision history ................................................ 12
Legal information .............................................. 13
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section 'Legal information'.
© NXP B.V. 2020.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 12 February 2020
Document identifier: NX5L2750CGU
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