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74ACQ543SC

74ACQ543SC

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    SOIC24

  • 描述:

    IC TXRX NON-INVERT 6V 24SOP

  • 数据手册
  • 价格&库存
74ACQ543SC 数据手册
Revised August 2000 74ACQ543• 74ACTQ543 Quiet Series Octal Registered Transceiver with 3-STATE Outputs General Description Features The ACQ/ACTQ543 is a non-inverting octal transceiver containing two sets of D-type registers for temporary storage of data flowing in either direction. Separate Latch Enable and Output Enable inputs are provided for each register to permit independent input and output control in either direction of data flow. ■ Guaranteed simultaneous switching noise level and The ACQ/ACTQ utilizes Fairchild Quiet Series technology to guarantee quiet output switching and improved dynamic threshold performance FACT Quiet Series features GTO output control and undershoot corrector in addition to a split ground bus for superior performance. ■ Back-to-back registers for storage dynamic threshold performance ■ Guaranteed pin-to-pin skew AC performance ■ 8-bit octal latched transceiver ■ Separate controls for data flow in each direction ■ Outputs source/sink 24 mA ■ 300 mil slim PDIP/SOIC Ordering Code: Order Number 74ACQ543SC Package Number Package Description M24B 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 74ACQ543SPC N24C 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide 74ACTQ543SC M24B 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 74ACTQ543QSC MQA24 74ACTQ543SPC N24C 24-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150 Wide 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Device also available in Tape and Reel. Specify by appending suffix letter “X” to the order code. Connection Diagram Pin Descriptions Pin Names Description OEAB A-to-B Output Enable Input (Active LOW) OEBA B-to-A Output Enable Input (Active LOW) CEAB A-to-B Enable Input (Active LOW) CEBA B-to-A Enable Input (Active LOW) LEAB A-to-B Latch Enable Input (Active LOW) LEBA B-to-A Latch Enable Input (Active LOW) A0–A7 A-to-B Data Inputs or B-to-A 3-STATE Outputs B0–B7 B-to-A Data Inputs or A-to-B 3-STATE Outputs FACT, Quiet Series, FACT Quiet Series and GTO are trademarks of Fairchild Semiconductor Corporation. © 2000 Fairchild Semiconductor Corporation DS010154 www.fairchildsemi.com 74ACQ543• 74ACTQ543 Quiet Series Octal Registered Transceiver with 3-STATE Outputs January 1990 74ACQ543• 74ACTQ543 Logic Symbols Functional Description The ACQ/ACTQ543 contains two sets of eight D-type latches, with separate input and output controls for each set. For data flow from A to B, for example, the A-to-B Enable (CEAB) input must be LOW in order to enter data from A0–A7 or take data from B0–B7, as indicated in the Data I/O Control Table. With CEAB LOW, a LOW signal on the A-to-B Latch Enable (LEAB) input makes the A-to-B latches transparent; a subsequent LOW-to-HIGH transition of the LEAB signal puts the A latches in the storage mode and their outputs no longer change with the A inputs. With CEAB and OEAB both LOW, the 3-STATE B output buffers are active and reflect the data present at the output of the A latches. Control of data flow from B to A is similar, but using the CEBA, LEBA and OEBA inputs IEEE/IEC Data I/O Control Table Inputs Latch Status Output Buffers Latched High Z X Latched — X Transparent — X H — High Z X L — Driving CEAB LEAB OEAB H X X X H L L X L H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial A-to-B data flow shown; B-to-A flow control is the same, except using CEBA, LEBA and OEBA Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. www.fairchildsemi.com 2 Supply Voltage (VCC) Recommended Operating Conditions −0.5V to +7.0V DC Input Diode Current (IIK) VI = −0.5V −20 mA VI = VCC + 0.5V +20 mA DC Input Voltage (VI) Supply Voltage VCC −0.5V to VCC + 0.5V VO = VCC + 0.5V +20 mA 0V to VCC −40°C to +85°C Minimum Input Edge Rate ∆V/∆t ACQ Devices DC Output Source VIN from 30% to 70% of VCC ± 50 mA VCC @3.0V, 4.5V, 5.5V 125 mV/ns Minimum Input Edge Rate ∆V/∆t DC VCC or Ground Current ± 50 mA per Output Pin (ICC or IGND) Storage Temperature (TSTG) 0V to VCC Operating Temperature (TA) −0.5V to VCC + 0.5V or Sink Current (IO) 4.5V to 5.5V Output Voltage (VO) −20 mA DC Output Voltage (VO) 2.0V to 6.0V ACTQ Input Voltage (VI) DC Output Diode Current (IOK) VO = −0.5V ACQ ACTQ Devices −65°C to +150 °C VIN from 0.8V to 2.0V DC Latch-up Source or VCC @ 4.5V, 5.5V ± 300 mA Sink Current Junction Temperature (TJ) 140°C PDIP 125 mV/ns Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. Fairchild does not recommend operation of FACT circuits outside databook specifications. DC Electrical Characteristics for ACQ Symbol VIH Parameter Minimum HIGH Level Input Voltage VIL VOH VCC TA = +25°C (V) Typ 3.0 1.5 TA = −40°C to +85°C Guaranteed Limits 2.1 Units 4.5 2.25 3.15 3.15 5.5 2.75 3.85 3.85 Maximum LOW Level 3.0 1.5 0.9 0.9 Input Voltage 4.5 2.25 1.35 1.35 5.5 2.75 1.65 1.65 Minimum HIGH Level 3.0 2.99 2.9 2.9 Output Voltage 4.5 4.49 4.4 4.4 5.5 5.49 5.4 5.4 3.0 2.56 2.46 4.5 3.86 3.76 5.5 4.86 4.76 0.1 0.1 Conditions VOUT = 0.1V 2.1 V or VCC − 0.1V VOUT = 0.1V V or VCC − 0.1V V IOUT = −50 µA VIN = VIL or VIH VOL Maximum LOW Level Output Voltage 3.0 0.002 IOH = −12 mA V IOH = −24 mA IOH = −24 mA (Note 2) 4.5 0.001 0.1 0.1 5.5 0.001 0.1 0.1 V 3.0 0.36 0.44 4.5 0.36 0.44 5.5 0.36 0.44 5.5 ± 0.1 ± 1.0 µA IOUT = 50 µA VIN = VIL or VIH IOL = 12 mA V IOL = 24 mA (Note 2) IIN Maximum Input (Note 4) Leakage Current IOLD Minimum Dynamic 5.5 75 mA 5.5 −75 mA IOHD Output Current (Note 3) ICC Maximum Quiescent (Note 4) Supply Current IOZT Maximum I/O Leakage Current IOL = 24 mA 5.5 8.0 80.0 µA 5.5 ± 0.6 ± 6.0 µA VI = VCC, GND VOLD = 1.65V Max VOHD = 3.85V Min VIN = VCC or GND VI (OE) = VIL, VIH VI = VCC, GND VO = VCC, GND 3 www.fairchildsemi.com 74ACQ543• 74ACTQ543 Absolute Maximum Ratings(Note 1) 74ACQ543• 74ACTQ543 DC Electrical Characteristics for ACQ Symbol VOLP Parameter Quiet Output Maximum Dynamic VOL VOLV Quiet Output Minimum Dynamic VOL VIHD Minimum HIGH Level Dynamic Input Voltage VILD Maximum LOW Level Dynamic Input Voltage VCC (Continued) TA = +25°C TA = −40°C to +85°C Units Conditions (V) Typ Guaranteed Limits 5.0 1.1 1.5 V 5.0 −0.6 −1.2 V 5.0 3.1 3.5 V (Note 5)(Note 7) 5.0 1.9 1.5 V (Note 5)(Note 7) Figures 1, 2 (Note 5)(Note 6) Figures 1, 2 (Note 5)(Note 6) Note 2: Maximum of 8 outputs loaded; thresholds on input associated with output under test. Note 3: Maximum test duration 2.0 ms, one output loaded at a time. Note 4: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC. Note 5: Plastic DIP package. Note 6: Max number of outputs defined as (n). Data Inputs are driven 0V to 5V. One output @ GND. Note 7: Max number of Data Inputs (n) switching. (n–1) Inputs switching 0V to 5V (ACQ). Input-under-test switching: 5V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz. DC Electrical Characteristics for ACTQ Symbol VIH VIL Parameter VCC TA = +25°C (V) Typ TA = −40°C to +85°C Guaranteed Limits Minimum HIGH Level 4.5 1.5 2.0 2.0 Input Voltage 5.5 1.5 2.0 2.0 Maximum LOW Level 4.5 1.5 0.8 0.8 Input Voltage 5.5 1.5 0.8 0.8 Minimum HIGH Level 4.5 4.49 4.4 4.4 Output Voltage 5.5 5.49 5.4 5.4 3.86 3.76 Units V V 5.5 4.86 4.76 Maximum LOW Level 4.5 0.001 0.1 0.1 Output Voltage 5.5 0.001 0.1 0.1 0.36 0.44 V IOH = −24 mA IOH = −24 mA (Note 8) V IOUT = 50 µA V IOL = 24 mA VIN = VIL or VIH 4.5 Maximum Input Leakage Current Maximum I/O Leakage Current 0.36 0.44 ± 0.1 ± 1.0 µA 5.5 ±0.6 6.0 µA 1.5 mA VI = VCC − 2.1V 75 mA VOLD = 1.65V Max −75 mA VOHD = 3.85V Min 80.0 µA VIN = VCC or GND Maximum ICC/Input 5.5 IOLD Minimum Dynamic 5.5 IOHD Output Current (Note 9) 5.5 ICC Maximum Quiescent Supply Current 5.5 Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL IOL = 24 mA (Note 8) 5.5 5.5 ICCT VOLV or VCC − 0.1V IOUT = −50 µA VOL VOLP or VCC − 0.1V VOUT = 0.1V VIN = VIL or VIH 4.5 IOZT VOUT = 0.1V V VOH IIN Conditions 0.6 8.0 5.0 1.1 1.5 V 5.0 −0.6 −1.2 V VI = VCC, GND V(OE) = VIL, VIH VO = VCC, GND Figures 1, 2 (Note 10)(Note 11) Figures 1, 2 (Note 10)(Note 11) VIHD Minimum HIGH Level Dynamic Input Voltage 5.0 1.9 2.2 V (Note 10)(Note 12) VILD Maximum LOW Level Dynamic Input Voltage 5.0 1.2 0.8 V (Note 10)(Note 12) Note 8: Maximum of 8 outputs loaded; thresholds on input associated with output under test. Note 9: Maximum test duration 2.0 ms, one output loaded at a time. Note 10: DIP package Note 11: Max number of outputs defined as (n). (n−1) Data Inputs are driven 0V to 3V, one output @ GND. Note 12: Max number of Data Inputs (n) switching. (n–1) Inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to threshold (VILD), 0V to threshold (VIHD), f =1 MHz. www.fairchildsemi.com 4 Symbol Parameter VCC TA = +25°C (V) CL = 50 pF (Note 13) Min TA = −40°C to +85°C CL = 50 pF Typ Max Min Max Units tPLH Propagation Delay 3.3 1.5 8.0 11.0 1.5 11.5 tPHL Transparent Mode 5.0 1.5 5.0 7.0 1.5 7.5 ns ns An to Bn or Bn to An tPLH Propagation Delay 3.3 1.5 9.0 12.5 1.5 13.0 tPHL LEBA, LEAB to An, Bn 5.0 1.5 6.0 8.0 1.5 8.5 tPZH Output Enable Time tPZL OEBA or OEAB to An or Bn 3.3 1.5 10.5 15.0 1.5 15.5 CEBA or CEAB to An or Bn 5.0 1.5 7.0 9.5 1.5 10.0 OEBA or OEAB to An or Bn 3.3 1.0 8.0 11.0 1.0 11.5 CEBA or CEAB to An or Bn 5.0 1.0 5.0 7.0 1.0 7.5 ns Output Disable Time tPHZ tPLZ tOSHL Output to Output 3.3 1.0 1.5 1.5 tOSLH Skew (Note 14) 5.0 0.5 1.0 1.0 ns ns Note 13: Voltage Range 5.0 is 5.0V ± 0.5V Voltage Range 3.3 is 3.3V ± 0.3V Note 14: Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs within the same packaged device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design. Not tested. AC Operating Requirements for AC Symbol Parameter VCC TA = +25°C (V) CL = 50 pF (Note 15) tS tH tW Setup Time, HIGH or LOW 3.3 An or Bn to LEBA or LEAB 5.0 Hold Time, HIGH or LOW 3.3 An or Bn to LEBA or LEAB 5.0 Latch Enable 3.3 Pulse Width, LOW 5.0 Typ TA = −40°C to +85°C CL = 50 pF Units Guaranteed Minimum 3.0 3.0 ns 1.5 1.5 ns 4.0 4.0 ns Note 15: Voltage Range 5.0 is 5.0V ± 0.5V Voltage Range 3.3 is 3.0V ± 0.3V 5 www.fairchildsemi.com 74ACQ543• 74ACTQ543 AC Electrical Characteristics for AC 74ACQ543• 74ACTQ543 AC Electrical Characteristics for ACTQ Symbol Parameter tPLH Propagation Delay tPHL Transparent Mode VCC TA = +25°C (V) CL = 50 pF TA = −40°C to +85°C CL = 50 pF Units (Note 16) Min Typ Max Min Max 5.0 1.5 5.5 7.5 1.5 8.0 ns 5.0 1.5 6.5 8.5 1.5 9.0 ns 5.0 1.5 8.0 10.0 1.5 10.5 ns 5.0 1.0 5.5 7.5 1.0 8.0 ns 0.5 1.0 1.0 ns An to Bn or Bn to An tPLH Propagation Delay LEBA, LEAB tPHL to An, Bn tPZH Output Enable Time OEBA or OEAB to An or Bn tPZL CEBA or CEAB to An or Bn tPHZ Output Disable Time OEBA or OEAB to An or Bn tPLZ CEBA or CEAB to An or Bn tOSHL Output to Output tOSLH Skew (Note 17) 5.0 Note 16: Voltage Range 5.0 is 5.0V ± 0.5V Note 17: Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs within the same packaged device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design. Not tested. AC Operating Requirements for ACTQ Symbol Parameter VCC TA = +25°C (V) CL = 50 pF (Note 18) tS Setup Time, HIGH or LOW An or Bn to LEBA or LEAB tS Hold Time, HIGH or LOW An or Bn to LEBA or LEAB tW Latch Enable Pulse Width, LOW TA = −40°C to +85°C CL = 50 pF Typ 5.0 3.0 3.0 ns 5.0 1.5 1.5 ns 5.0 4.0 4.0 ns Note 18: Voltage Range 5.0 is 5.0V ± 0.5V Capacitance Symbol Parameter Typ Units Conditions CIN Input Capacitance 4.5 pF VCC = OPEN CPD Power Dissipation Capacitance 70.0 pF VCC = 5.0V www.fairchildsemi.com Units Guaranteed Minimum 6 The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of FACT. VOLP/VOLV and VOHP/VOHV: • Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will usually be the furthest from the ground pin. Monitor the output voltages using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. Equipment: Hewlett Packard Model 8180A Word Generator PC-163A Test Fixture • Measure VOLP and VOLV on the quiet output during the worst case transition for active and enable. Measure VOHP and VOHV on the quiet output during the worst case active and enable transition. Tektronics Model 7854 Oscilloscope Procedure: 1. Verify Test Fixture Loading: Standard Load 50 pF, 500Ω. • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. 2. Deskew the HFS generator so that no two channels have greater than 150 ps skew between them. This requires that the oscilloscope be deskewed first. It is important to deskew the HFS generator channels before testing. This will ensure that the outputs switch simultaneously. VILD and VIHD: • Monitor one of the switching outputs using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. 3. Terminate all inputs and outputs to ensure proper loading of the outputs and that the input levels are at the correct voltage. • First increase the input LOW voltage level, VIL, until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input LOW voltage level at which oscillation occurs is defined as VILD. 4. Set the HFS generator to toggle all but one output at a frequency of 1 MHz. Greater frequencies will increase DUT heating and effect the results of the measurement. 5. Set the HFS generator input levels at 0V LOW and 3V HIGH for ACT devices and 0V LOW and 5V HIGH for AC devices. Verify levels with an oscilloscope. • Next decrease the input HIGH voltage level, VIH, until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input HIGH voltage level at which oscillation occurs is defined as VIHD • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability on the measurements. FIGURE 1. Quiet Output Noise Voltage Waveforms Note 19: VOHVand VOLP are measured with respect to ground reference. Note 20: Input pulses have the following characteristics: f = 1 MHz, tr = 3 ns, tf = 3 ns, skew < 150 ps. FIGURE 2. Simultaneous Switching Test Circuit 7 www.fairchildsemi.com 74ACQ543• 74ACTQ543 FACT Noise Characteristics 74ACQ543• 74ACTQ543 Physical Dimensions inches (millimeters) unless otherwise noted 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Package Number M24B 24-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150 Wide Package Number MQA24 www.fairchildsemi.com 8 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N24C Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 9 www.fairchildsemi.com 74ACQ543• 74ACTQ543 Quiet Series Octal Registered Transceiver with 3-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
74ACQ543SC 价格&库存

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