CAT25040L

CAT25010/20/40 1K/2K/4K SPI Serial CMOS EEPROM FEATURES ■ 1,000,000 program/erase cycles ■ 10 MHz SPI compatible ■ 100 year data retention ■ 1.8 to 5.5 volt operation ■ Self-timed write cycle ■ Hardware and software protection ■ 8-Pin DIP/SOIC, 8-Pin TSSOP and 8-Pin MSOP ■ Low power CMOS technology ■ 16-byte page write buffer ■ SPI modes (0,0 & 1,1) ■ Block write protection ■ Commercial, industrial, automotive and extended – Protect 1/4, 1/2 or all of EEPROM array temperature ranges DESCRIPTION The CAT25010/20/40 is a 1K/2K/4K Bit SPI Serial CMOS EEPROM internally organized as 128x8/256x8/ 512x8 bits. Catalyst’s advanced CMOS Technology substantially reduces device power requirements. The CAT25010/20/40 features a 16-byte page write buffer. The device operates via the SPI bus serial interface and is enabled though a Chip Select (CS). In addition to the Chip Select, the clock input (SCK), data in (SI) and data out (SO) are required to access the device. The HOLD pin may be used to suspend any serial communication without resetting the serial sequence. The CAT25010/ 20/40 is designed with software and hardware write protection features including Block Write protection. The device is available in 8-pin DIP, 8-pin SOIC, 8-pin MSOP and 8-pin TSSOP packages. PIN CONFIGURATION BLOCK DIAGRAM SOIC Package (S, V, GV) CS 1 8 SO 2 3 4 7 6 5 WP VSS VCC HOLD SCK 8 7 6 5 8 7 6 5 SENSE AMPS SHIFT REGISTERS VCC HOLD SCK SI WORD ADDRESS BUFFERS TSSOP Package (U, Y, GY) VCC HOLD SCK SI 1 2 3 4 CS SO WP VSS 1 2 3 8 7 6 4 5 VCC HOLD SCK SI PIN FUNCTIONS Pin Name Function SO Serial Data Output SCK Serial Clock WP Write Protect VCC +1.8V to +5.5V Power Supply VSS Ground CS Chip Select SI Serial Data Input HOLD Suspends Serial Input NC No Connect © 2005 by Catalyst Semiconductor, Inc. Characteristics subject to change without notice SO SI CS WP HOLD SCK I/O CONTROL SPI CONTROL LOGIC BLOCK PROTECT LOGIC CONTROL LOGIC 1 2 3 4 CS SO WP VSS SI DIP Package (P, L, GL) CS SO WP VSS MSOP Package (R, Z, GZ) XDEC COLUMN DECODERS E2PROM ARRAY DATA IN STORAGE HIGH VOLTAGE/ TIMING CONTROL STATUS REGISTER 1 25C128 F02 Doc. No. 1006, Rev. M CAT25010/20/40 ABSOLUTE MAXIMUM RATINGS* *COMMENT Temperature Under Bias ................. –55°C to +125°C Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. Storage Temperature ....................... –65°C to +150°C Voltage on any Pin with Respect to VSS(1) .................. –2.0V to +VCC +2.0V VCC with Respect to VSS ................................ –2.0V to +7.0V Package Power Dissipation Capability (Ta = 25°C) ................................... 1.0W Lead Soldering Temperature (10 secs) ............ 300°C Output Short Circuit Current(2) ........................ 100 mA RELIABILITY CHARACTERISTICS Symbol Parameter NEND(3) Endurance TDR(3) VZAP (3) ILTH(3)(4) Min. Typ. Max. Units 1,000,000 Cycles/Byte Data Retention 100 Years ESD Susceptibility 2000 Volts Latch-up 100 mA D.C. OPERATING CHARACTERISTICS VCC = +1.8V to +5.5V, unless otherwise specified. Limits Symbol Parameter Min. Typ. Max. Units Test Conditions ICC1 Power Supply Current (Operating Write) 5 mA VCC = 5V @ 5MHz SO=open; CS=Vss ICC2 Power Supply Current (Operating Read) 3 mA VCC = 5.5V FCLK = 5MHz ISB(6) Power Supply Current (Standby) 1 µA CS = VCC VIN = VSS or VCC ILI Input Leakage Current 2 µA VIN = VSS or VCC ILO Output Leakage Current 3 µA VOUT = 0V to VCC, CS = 0V VIL(5) Input Low Voltage -1 VCC x 0.3 V VIH(5) Input High Voltage VCC x 0.7 VCC + 0.5 V VOL1 Output Low Voltage 0.4 V VOH1 Output High Voltage VOL2 Output Low Voltage VOH2 Output High Voltage VCC - 0.8 V 0.2 VCC-0.2 2.7V≤VCC