CAT25010, CAT25020,
CAT25040
EEPROM Serial 1/2/4-Kb SPI
Description
The CAT25010/20/40 are a EEPROM Serial 1/2/4−Kb SPI devices
internally organized as 128x8/256x8/512x8 bits. They feature a
16−byte page write buffer and support the Serial Peripheral Interface
(SPI) protocol. The device is enabled through a Chip Select (CS)
input. In addition, the required bus signals are a clock input (SCK),
data input (SI) and data output (SO) lines. The HOLD input may be
used to pause any serial communication with the CAT25010/20/40
device. These devices feature software and hardware write protection,
including partial as well as full array protection.
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SOIC−8
V SUFFIX
CASE 751BD
UDFN−8
HU4 SUFFIX
CASE 517AZ
Features
•
•
•
•
•
•
•
•
•
•
•
•
•
20 MHz (5 V) SPI Compatible
1.8 V to 5.5 V Supply Voltage Range
SPI Modes (0,0) & (1,1)
16−byte Page Write Buffer
Self−timed Write Cycle
Hardware and Software Protection
Block Write Protection
− Protect 1/4, 1/2 or Entire EEPROM Array
Low Power CMOS Technology
1,000,000 Program/Erase Cycles
100 Year Data Retention
Industrial and Extended Temperature Range
PDIP, SOIC, TSSOP 8−Lead and UDFN 8−Pad Packages
These Devices are Pb−Free, Halogen Free/BFR Free, and RoHS
Compliant
TSSOP−8
Y SUFFIX
CASE 948AL
PIN CONFIGURATION
CS
1
VCC
SO
HOLD
WP
SCK
VSS
SI
SOIC (V), TSSOP (Y), UDFN (HU4)
For the location of Pin 1, please consult the
corresponding package drawing.
VCC
PIN FUNCTION
Pin Name
SI
CS
WP
HOLD
CAT25010
CAT25020
CAT25040
SO
SCK
Function
CS
Chip Select
SO
Serial Data Output
WP
Write Protect
VSS
Ground
SI
Serial Data Input
VSS
SCK
Figure 1. Functional Symbol
HOLD
VCC
Serial Clock
Hold Transmission Input
Power Supply
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 10 of this data sheet.
© Semiconductor Components Industries, LLC, 2015
June, 2018 − Rev. 26
1
Publication Order Number:
CAT25010/D
CAT25010, CAT25020, CAT25040
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters
Ratings
Units
Operating Temperature
−45 to +130
°C
Storage Temperature
−65 to +150
°C
−0.5 to VCC + 0.5
V
Voltage on any Pin with Respect to Ground (Note 1)
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
Table 2. RELIABILITY CHARACTERISTICS (Note 2)
Symbol
Parameter
NEND (Note 3)
TDR
Endurance
Min
Units
1,000,000
Program / Erase Cycles
100
Years
Data Retention
Table 3. D.C. OPERATING CHARACTERISTICS
(VCC = 1.8 V to 5.5 V, TA = −40°C to +85°C and VCC = 2.5 V to 5.5 V, TA = −40°C to +125°C, unless otherwise specified.)
Symbol
ICC
Parameter
Supply Current
Test Conditions
Read, Write, VCC = 5.0 V,
SO open
ISB1
Standby Current
VIN = GND or VCC, CS = VCC,
WP = VCC, VCC = 5.0 V
ISB2
Standby Current
VIN = GND or VCC, CS = VCC,
WP = GND, VCC = 5.0 V
IL
Min
Max
Units
10 MHz / −40°C to 85°C
2
mA
5 MHz / −40°C to 125°C
2
mA
2
mA
TA = −40°C to +85°C
4
mA
TA = −40°C to +125°C
5
mA
−2
2
mA
−1
1
mA
Input Leakage Current
VIN = GND or VCC
ILO
Output Leakage
Current
CS = VCC,
VOUT = GND or VCC
−1
2
mA
VIL
Input Low Voltage
−0.5
0.3 VCC
V
VIH
Input High Voltage
0.7 VCC
VCC + 0.5
V
VOL1
Output Low Voltage
VCC > 2.5 V, IOL = 3.0 mA
0.4
V
VOH1
Output High Voltage
VCC > 2.5 V, IOH = −1.6 mA
VOL2
Output Low Voltage
VCC > 1.8 V, IOL = 150 mA
VOH2
Output High Voltage
VCC > 1.8 V, IOH = −100 mA
TA = −40°C to +85°C
TA = −40°C to +125°C
VCC − 0.8 V
V
0.2
VCC − 0.2 V
V
V
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
Table 4. PIN CAPACITANCE (Note 2) (TA = 25°C, f = 1.0 MHz, VCC = +5.0 V)
Symbol
COUT
CIN
Test
Conditions
Output Capacitance (SO)
Input Capacitance (CS, SCK, SI, WP, HOLD)
Min
Typ
Max
Units
VOUT = 0 V
8
pF
VIN = 0 V
8
pF
1. The DC input voltage on any pin should not be lower than −0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may
undershoot to no less than −1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns.
2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
3. Page Mode, VCC = 5 V, 25°C.
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2
CAT25010, CAT25020, CAT25040
Table 5. A.C. CHARACTERISTICS − Mature Product
(TA = −40°C to +85°C (Industrial) and TA = −40°C to +125°C (Extended).) (Notes 4, 8)
VCC = 1.8 V − 5.5 V / −405C to +855C
VCC = 2.5 V − 5.5 V
VCC = 2.5 V − 5.5 V / −405C to +1255C
−405C to +855C
Min
Max
Min
Max
Units
fSCK
Clock Frequency
DC
5
DC
10
MHz
tSU
Data Setup Time
40
20
ns
tH
Data Hold Time
40
20
ns
tWH
SCK High Time
75
40
ns
tWL
SCK Low Time
75
40
ns
Symbol
tLZ
Parameter
50
25
ns
tRI (Note 5)
HOLD to Output Low Z
Input Rise Time
2
2
ms
tFI (Note 5)
Input Fall Time
2
2
ms
tHD
HOLD Setup Time
0
0
ns
tCD
HOLD Hold Time
10
10
ns
tV
Output Valid from Clock Low
tHO
Output Hold Time
tDIS
Output Disable Time
75
0
40
0
ns
ns
50
20
ns
100
25
ns
tHZ
HOLD to Output High Z
tCS
CS High Time
140
70
ns
tCSS
CS Setup Time
30
15
ns
tCSH
CS Hold Time
30
15
ns
tCNS
CS Inactive Setup Time
20
15
ns
tCNH
CS Inactive Hold Time
20
15
ns
tWPS
WP Setup Time
10
10
ns
tWPH
WP Hold Time
10
10
ns
tWC (Note 7)
Write Cycle Time
5
5
ms
Table 6. POWER−UP TIMING (Notes 5, 6)
Symbol
Parameter
Max
Units
tPUR
Power−up to Read Operation
1
ms
tPUW
Power−up to Write Operation
1
ms
4. AC Test Conditions:
Input Pulse Voltages: 0.3 VCC to 0.7 VCC
Input rise and fall times: ≤ 10 ns
Input and output reference voltages: 0.5 VCC
Output load: current source IOL max/IOH max; CL = 50 pF
5. This parameter is tested initially and after a design or process change that affects the parameter.
6. tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated.
7. tWC is the time from the rising edge of CS after a valid write sequence to the end of the internal write cycle.
8. All Chip Select (CS) timing parameters are defined relative to the positive clock edge (Figure 2). tCSH timing specification is valid
for die revision D and higher. The die revision D is identified by letter “D” or a dedicated marking code on top of the package. For
previous product revision (Rev. C) the tCSH is defined relative to the negative clock edge (please refer to data sheet Doc. No.
MD−1006 Rev. U)
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CAT25010, CAT25020, CAT25040
Table 7. A.C. CHARACTERISTICS – New Product (Rev E)
(TA = −40°C to +85°C (Industrial) and TA = −40°C to +125°C (Extended), unless otherwise specified.) (Note 9)
VCC = 1.8 V − 5.5 V
−405C to +855C
Symbol
Parameter
VCC = 2.5 V − 5.5 V
−405C to +1255C
VCC = 4.5 V − 5.5 V
−405C to +855C
Min
Max
Min
Max
Min
Max
Units
5
DC
10
DC
20
MHz
fSCK
Clock Frequency
DC
tSU
Data Setup Time
20
10
5
ns
tH
Data Hold Time
20
10
5
ns
tWH
SCK High Time
75
40
20
ns
tWL
SCK Low Time
75
40
20
ns
tLZ
HOLD to Output Low Z
50
25
25
ns
tRI (Note 10)
Input Rise Time
2
2
2
ms
tFI (Note 10)
Input Fall Time
2
2
2
ms
tHD
HOLD Setup Time
0
0
0
ns
tCD
HOLD Hold Time
10
10
5
ns
tV
Output Valid from Clock Low
tHO
Output Hold Time
tDIS
Output Disable Time
tHZ
70
0
35
0
HOLD to Output High Z
20
0
ns
ns
50
20
20
ns
100
25
25
ns
tCS
CS High Time
80
40
20
ns
tCSS
CS Setup Time
30
30
15
ns
tCSH
CS Hold Time
30
30
20
ns
tCNS
CS Inactive Setup Time
20
20
15
ns
tCNH
CS Inactive Hold Time
20
20
15
ns
tWPS
WP Setup Time
10
10
10
ns
tWPH
WP Hold Time
10
tWC (Note 12)
10
Write Cycle Time
5
10
5
ns
5
ms
Min
Max
Units
Table 8. POWER−UP TIMING (Notes 10, 11)
Symbol
Parameter
tPUR
Power−up to Read Operation
0.1
1
ms
tPUW
Power−up to Write Operation
0.1
1
ms
9. AC Test Conditions:
Input Pulse Voltages: 0.3 VCC to 0.7 VCC
Input rise and fall times: ≤ 10 ns
Input and output reference voltages: 0.5 VCC
Output load: current source IOL max/IOH max; CL = 30 pF
10. This parameter is tested initially and after a design or process change that affects the parameter.
11. tPUR and tPUW are the delays required from the time VCC is stable at the operating voltage until the specified operation can be initiated.
12. tWC is the time from the rising edge of CS after a valid write sequence to the end of the internal write cycle.
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CAT25010, CAT25020, CAT25040
Pin Description
Functional Description
SI: The serial data input pin accepts op−codes, addresses
and data. In SPI modes (0,0) and (1,1) input data is latched
on the rising edge of the SCK clock input.
SO: The serial data output pin is used to transfer data out of
the device. In SPI modes (0,0) and (1,1) data is shifted out
on the falling edge of the SCK clock.
SCK: The serial clock input pin accepts the clock provided
by the host and used for synchronizing communication
between host and CAT25010/20/40.
CS: The chip select input pin is used to enable/disable the
CAT25010/20/40. When CS is high, the SO output is
tri−stated (high impedance) and the device is in Standby
Mode (unless an internal write operation is in progress).
Every communication session between host and
CAT25010/20/40 must be preceded by a high to low transition
and concluded with a low to high transition of the CS input.
WP: The write protect input pin will allow all write
operations to the device when held high. When WP pin is
tied low all write operations are inhibited.
HOLD: The HOLD input pin is used to pause transmission
between host and CAT25010/20/40, without having to
retransmit the entire sequence at a later time. To pause,
HOLD must be taken low and to resume it must be taken
back high, with the SCK input low during both transitions.
When not used for pausing, the HOLD input should be tied
to VCC, either directly or through a resistor.
The CAT25010/20/40 devices support the Serial
Peripheral Interface (SPI) bus protocol, modes (0,0) and
(1,1). The device contains an 8−bit instruction register. The
instruction set and associated op−codes are listed in Table 9.
Reading data stored in the CAT25010/20/40 is
accomplished by simply providing the READ command and
an address. Writing to the CAT25010/20/40, in addition to
a WRITE command, address and data, also requires
enabling the device for writing by first setting certain bits in
a Status Register, as will be explained later.
After a high to low transition on the CS input pin, the
CAT25010/20/40 will accept any one of the six instruction
op−codes listed in Table 9 and will ignore all other possible
8−bit combinations. The communication protocol follows
the timing from Figure 2.
Table 9. INSTRUCTION SET (Note 13)
Instruction
Opcode
WREN
0000 0110
Enable Write Operations
WRDI
0000 0100
Disable Write Operations
RDSR
0000 0101
Read Status Register
WRSR
0000 0001
Write Status Register
READ
0000 X011
Read Data from Memory
WRITE
0000 X010
Write Data to Memory
Operation
13. X = 0 for CAT25010, CAT25020. X = A8 for CAT25040
tCS
CS
tCSS
tCNH
tWH
tWL
tCNS
tCSH
SCK
tSU
tH
tRI
tFI
VALID
IN
SI
tV
tV
tDIS
tHO
SO
HI−Z
HI−Z
VALID
OUT
Figure 2. Synchronous Data Timing
Status Register
Write Enable state and when set to 0, the device is in a Write
Disable state.
The BP0 and BP1 (Block Protect) bits determine which
blocks are currently write protected. They are set by the user
with the WRSR command and are non−volatile. The user is
allowed to protect a quarter, one half or the entire memory,
by setting these bits according to Table 11. The protected
blocks then become read−only.
The Status Register, as shown in Table 10, contains a
number of status and control bits.
The RDY (Ready) bit indicates whether the device is busy
with a write operation. This bit is automatically set to 1 during
an internal write cycle, and reset to 0 when the device is ready
to accept commands. For the host, this bit is read only.
The WEL (Write Enable Latch) bit is set/reset by the
WREN/WRDI commands. When set to 1, the device is in a
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CAT25010, CAT25020, CAT25040
Table 10. STATUS REGISTER
7
6
5
4
3
2
1
0
1
1
1
1
BP1
BP0
WEL
RDY
Table 11. BLOCK PROTECTION BITS
Status Register Bits
BP1
BP0
0
0
None
No Protection
0
1
CAT25010: 060−07F, CAT25020: 0C0−0FF, CAT25040: 180−1FF
Quarter Array Protection
1
0
CAT25010: 040−07F, CAT25020: 080−0FF, CAT25040: 100−1FF
Half Array Protection
1
1
CAT25010: 000−07F, CAT25020: 000−0FF, CAT25040: 000−1FF
Full Array Protection
Array Address Protected
Protection
WRITE OPERATIONS
instruction to the CAT25010/20/40. Care must be taken to
The CAT25010/20/40 device powers up into a write
take the CS input high after the WREN instruction, as
disable state. The device contains a Write Enable Latch
(WEL) which must be set before attempting to write to the
otherwise the Write Enable Latch will not be properly set.
memory array or to the status register. In addition, the
WREN timing is illustrated in Figure 3. The WREN
address of the memory location(s) to be written must be
instruction must be sent prior to any WRITE or WRSR
outside the protected area, as defined by BP0 and BP1 bits
instruction.
from the status register.
The internal write enable latch is reset by sending the
WRDI instruction as shown in Figure 4. Disabling write
Write Enable and Write Disable
operations by resetting the WEL bit, will protect the device
The internal Write Enable Latch and the corresponding
against inadvertent writes.
Status Register WEL bit are set by sending the WREN
CS
SCK
SI
SO
0
0
0
0
0
1
1
0
HIGH IMPEDANCE
Dashed Line = mode (1, 1)
Figure 3. WREN Timing
CS
SCK
SI
SO
0
0
0
0
0
1
0
HIGH IMPEDANCE
Dashed Line = mode (1, 1)
Figure 4. WRDI Timing
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6
0
CAT25010, CAT25020, CAT25040
Byte Write
Page Write
Once the WEL bit is set, the user may execute a write
sequence, by sending a WRITE instruction, a 8−bit address
and data as shown in Figure 5. For the CAT25040, bit 3 of
the write instruction opcode contains A8 address bit.
Internal programming will start after the low to high CS
transition. During an internal write cycle, all commands,
except for RDSR (Read Status Register) will be ignored.
The RDY bit will indicate if the internal write cycle is in
progress (RDY high), or the device is ready to accept
commands (RDY low).
After sending the first data byte to the CAT25010/20/40,
the host may continue sending data, up to a total of 16 bytes,
according to timing shown in Figure 6. After each data byte,
the lower order address bits are automatically incremented,
while the higher order address bits (page address) remain
unchanged. If during this process the end of page is
exceeded, then loading will “roll over” to the first byte in the
page, thus possibly overwriting previously loaded data.
Following completion of the write cycle, the
CAT25010/20/40 is automatically returned to the write
disable state.
CS
0
1
2
3
4
5
6
7
13
8
14 15
16
17
18 19
20
21
22 23
SCK
OPCODE
SI
0
0
0
0
X*
0
DATA IN
BYTE ADDRESS
1
0
A0 D7 D6 D5 D4 D3 D2 D1 D0
A7
HIGH IMPEDANCE
SO
Dashed Line = mode (1, 1)
* X = 0 for CAT25010, CAT25020. x = A8 for CAT25040
Figure 5. Byte WRITE Timing
CS
0
1
2
3
4
5
6
7
8
13
15 16−23 24−31 16+(N−1)x8−1..16+(N−1)x8
16+Nx8−1
14
SCK
BYTEADDRESS
OPCODE
SI
SO
0
0
0
0
X*
0
1
0
A7
DATA IN
A0
Data Data Data
Byte 1 Byte 2 Byte 3
HIGH IMPEDANCE
Dashed Line = mode (1, 1)
* X = 0 for CAT25010, CAT25020. x = A8 for CAT25040
Figure 6. Page WRITE Timing
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7
Data Byte N
7..1
0
CAT25010, CAT25020, CAT25040
Write Status Register
Write Protection
The Status Register is written by sending a WRSR
instruction according to timing shown in Figure 7. Only bits
2 and 3 can be written using the WRSR command.
When WP input is low all write operations to the memory
array and Status Register are inhibited. WP going low while
CS is still low will interrupt a write operation. If the internal
write cycle has already been initiated, WP going low will
have no effect on any write operation to the Status Register
or memory array. The WP input timing is shown in Figure 8.
CS
0
1
2
3
4
5
6
7
8
9
10
11
1
7
6
5
4
12
13
14
15
2
1
0
SCK
OPCODE
SI
0
0
0
0
0
DATA IN
0
0
MSB
HIGH IMPEDANCE
SO
Dashed Line = mode (1, 1)
Figure 7. WRSR Timing
tWPS
tWPH
CS
SCK
WP
WP
Dashed Line = mode (1, 1)
Figure 8. WP Timing
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3
CAT25010, CAT25020, CAT25040
READ OPERATIONS
Read from Memory Array
Read Status Register
To read from memory, the host sends a READ instruction
followed by a 8−bit address (for the CAT25040, bit 3 of the
read instruction opcode contains A8 address bit).
After receiving the last address bit, the CAT25010/20/40
will respond by shifting out data on the SO pin (as shown in
Figure 9). Sequentially stored data can be read out by simply
continuing to run the clock. The internal address pointer is
automatically incremented to the next higher address as data
is shifted out. After reaching the highest memory address,
the address counter “rolls over” to the lowest memory
address, and the read cycle can be continued indefinitely.
The read operation is terminated by taking CS high.
To read the status register, the host simply sends a RDSR
command. After receiving the last bit of the command, the
CAT25010/20/40 will shift out the contents of the status
register on the SO pin (Figure 10). The status register may
be read at any time, including during an internal write cycle.
While the internal write cycle is in progress, the RDSR
command will output the full content of the status register
(New product, Rev. E) or the RDY (Ready) bit only (i.e.,
data out = FFh) for previous product revisions C, D (Mature
product). For easy detection of the internal write cycle
completion, both during writing to the memory array and to
the status register, we recommend sampling the RDY bit
only through the polling routine. After detecting the RDY bit
“0”, the next RDSR instruction will always output the
expected content of the status register.
CS
0
1
2
3
4
5
6
7
8
12 13
9
14 15
16
17
18 19
20
21 22
SCK
OPCODE
SI
0
0
0
0
X*
0
BYTE ADDRESS
1
1
A0
A7
DATA OUT
HIGH IMPEDANCE
SO
D7 D6 D5 D4 D3 D2 D1 D0
Dashed Line = mode (1, 1)
* X = 0 for CAT25010, CAT25020. X = A8 for CAT25040
MSB
Figure 9. READ Timing
CS
0
1
2
3
4
5
6
7
1
0
1
8
9
10
11
7
6
5
4
12
13
14
2
1
SCK
OPCODE
SI
SO
0
0
0
0
0
DATA OUT
HIGH IMPEDANCE
MSB
Dashed Line = mode (1, 1)
Figure 10. RDSR Timing
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3
0
CAT25010, CAT25020, CAT25040
Hold Operation
VCC drops below the POR trigger level. This bi−directional
POR behavior protects the device against ‘brown−out’
failure following a temporary loss of power.
The CAT25010/20/40 device powers up in a write disable
state and in a low power standby mode. A WREN instruction
must be issued prior to any writes to the device.
After power up, the CS pin must be brought low to enter
a ready state and receive an instruction. After a successful
byte/page write or status register write, the device goes into
a write disable mode. The CS input must be set high after the
proper number of clock cycles to start the internal write
cycle. Access to the memory array during an internal write
cycle is ignored and programming is continued. Any invalid
op−code will be ignored and the serial output pin (SO) will
remain in the high impedance state.
The HOLD input can be used to pause communication
between host and CAT25010/20/40. To pause, HOLD must
be taken low while SCK is low (Figure 11). During the hold
condition the device must remain selected (CS low). During
the pause, the data output pin (SO) is tri−stated (high
impedance) and SI transitions are ignored. To resume
communication, HOLD must be taken high while SCK is low.
Design Considerations
The CAT25010/20/40 devices incorporate Power−On
Reset (POR) circuitry which protects the internal logic
against powering up in the wrong state. The device will
power up into Standby mode after VCC exceeds the POR
trigger level and will power down into Reset mode when
CS
tCD
tCD
SCK
tHD
tHD
HOLD
tHZ
HIGH IMPEDANCE
SO
tLZ
Dashed Line = mode (1, 1)
Figure 11. HOLD Timing
ORDERING INFORMATION
Device Order Number
Specific
Device
Marking
(Note 14)
Package Type
Temperature Range
Lead Finish
Shipping†
CAT25010HU4I−GT3
S0U
UDFN8−EP
−40°C to +85°C
NiPdAu
3,000 Units / Tape & Reel
CAT25010VI−GT3
25010E
SOIC−8, JEDEC
−40°C to +125°C
NiPdAu
3,000 Units / Tape & Reel
CAT25010YI−GT3
S01E
TSSOP−8
−40°C to +85°C
NiPdAu
3,000 Units / Tape & Reel
CAT25020HU4I−GT3
S1U
UDFN8−EP
−40°C to +85°C
NiPdAu
3,000 Units / Tape & Reel
CAT25020VI−GT3
25020E
SOIC−8, JEDEC
−40°C to +125°C
NiPdAu
3,000 Units / Tape & Reel
CAT25020YI−GT3
S02E
TSSOP−8
−40°C to +85°C
NiPdAu
3,000 Units / Tape & Reel
CAT25040HU4I−GT3
S2U
UDFN8−EP
−40°C to +85°C
NiPdAu
3,000 Units / Tape & Reel
CAT25040VI−GT3
25040E
SOIC−8, JEDEC
−40°C to +85°C
NiPdAu
3,000 Units / Tape & Reel
CAT25040YI−GT3
S04E
TSSOP−8
−40°C to +85°C
NiPdAu
3,000 Units / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D.
14. Specific Device Marking shows the first row top marking for new product (Revision E).
15. All packages are RoHS−compliant (Lead−free, Halogen−free).
16. The standard lead finish is NiPdAu.
17. For detailed information and a breakdown of device nomenclature and numbering systems, please see the ON Semiconductor Device
Nomenclature document, TND310/D, available at www.onsemi.com
www.onsemi.com
10
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
UDFN8, 2x3 EXTENDED PAD
CASE 517AZ
ISSUE A
1
SCALE 2:1
PIN ONE
REFERENCE
0.10 C
B
A
D
L1
ÇÇ
ÇÇ
ÇÇ
DETAIL A
ALTERNATE
CONSTRUCTIONS
E
EXPOSED Cu
DETAIL B
A
0.10 C
0.08 C
1
D2
ÉÉ
ÉÉ
ÇÇ
C
MOLD CMPD
ÉÉÉ
ÉÉÉ
ÇÇÇ
A3
A1
ALTERNATE
CONSTRUCTIONS
1
L
4
5
8X
e
XXXXX
A
WL
Y
W
G
BOTTOM VIEW
b
0.10
M
C A B
0.05
M
C
MILLIMETERS
MIN
MAX
0.45
0.55
0.00
0.05
0.13 REF
0.20
0.30
2.00 BSC
1.35
1.45
3.00 BSC
1.25
1.35
0.50 BSC
0.25
0.35
−−−
0.15
GENERIC
MARKING DIAGRAM*
SEATING
PLANE
E2
8
DIM
A
A1
A3
b
D
D2
E
E2
e
L
L1
DETAIL B
A3
A1
SIDE VIEW
DETAIL A
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.15 AND 0.25MM FROM THE TERMINAL TIP.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
L
L
0.10 C TOP VIEW
NOTE 4
DATE 23 MAR 2015
XXXXX
AWLYWG
= Specific Device Code
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “ G”,
may or may not be present.
NOTE 3
RECOMMENDED
SOLDERING FOOTPRINT*
1.56
8X
0.68
1.45 3.40
1
8X
0.30
0.50
PITCH
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
DOCUMENT NUMBER:
DESCRIPTION:
98AON42552E
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
UDFN8, 2X3 EXTENDED PAD
PAGE 1 OF 1
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
© Semiconductor Components Industries, LLC, 2019
www.onsemi.com
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
SOIC 8, 150 mils
CASE 751BD−01
ISSUE O
E1
DATE 19 DEC 2008
E
SYMBOL
MIN
A
1.35
1.75
A1
0.10
0.25
b
0.33
0.51
c
0.19
0.25
D
4.80
5.00
E
5.80
6.20
E1
3.80
4.00
MAX
1.27 BSC
e
PIN # 1
IDENTIFICATION
NOM
h
0.25
0.50
L
0.40
1.27
θ
0º
8º
TOP VIEW
D
h
A1
A
θ
c
e
b
SIDE VIEW
L
END VIEW
Notes:
(1) All dimensions are in millimeters. Angles in degrees.
(2) Complies with JEDEC MS-012.
DOCUMENT NUMBER:
DESCRIPTION:
98AON34272E
SOIC 8, 150 MILS
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 1
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
© Semiconductor Components Industries, LLC, 2019
www.onsemi.com
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
TSSOP8, 4.4x3.0, 0.65P
CASE 948AL
ISSUE A
DATE 20 MAY 2022
q
q
GENERIC
MARKING DIAGRAM*
XXX
YWW
AG
XXX
Y
WW
A
G
= Specific Device Code
= Year
= Work Week
= Assembly Location
= Pb−Free Package
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “G”, may
or may not be present. Some products may
not follow the Generic Marking.
DOCUMENT NUMBER:
DESCRIPTION:
98AON34428E
TSSOP8, 4.4X3.0, 0.65P
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 1
onsemi and
are trademarks of Semiconductor Components Industries, LLC dba onsemi or its subsidiaries in the United States and/or other countries. onsemi reserves
the right to make changes without further notice to any products herein. onsemi makes no warranty, representation or guarantee regarding the suitability of its products for any particular
purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation
special, consequential or incidental damages. onsemi does not convey any license under its patent rights nor the rights of others.
© Semiconductor Components Industries, LLC, 2019
www.onsemi.com
onsemi,
, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates
and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property.
A listing of onsemi’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. onsemi reserves the right to make changes at any time to any
products or information herein, without notice. The information herein is provided “as−is” and onsemi makes no warranty, representation or guarantee regarding the accuracy of the
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