DM74ALS14N

Revised February 2000 DM74ALS14 Hex Inverter with Schmitt Trigger Inputs General Description Features This device contains six independent gates, each of which performs the logic INVERT function. Each input has hysteresis which increases the noise immunity and transforms a slowly changing input signal to a fast changing, jitter-free output. ■ Input hysteresis ■ Low output noise generation ■ High input noise immunity ■ Switching specification at 50 pF ■ Switching specifications guaranteed over full temperature and VCC range ■ Advanced oxide-isolated, ion-implanted Schottky TTL process ■ Functionally and pin-for-pin compatible with Schottky and low power Schottky TTL counterparts ■ Improved AC performance over low power Schottky counterpart Ordering Code: Order Number Package Number Package Description DM74ALS14M M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow DM74ALS14SJ M14D 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide DM74ALS14N N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Connection Diagram Function Table Y=A Input Output A Y L H H L H = HIGH Logic Level L = LOW Logic Level © 2000 Fairchild Semiconductor Corporation DS008773 www.fairchildsemi.com DM74ALS14 Hex Inverter with Schmitt Trigger Inputs March 1986 DM74ALS14 Absolute Maximum Ratings(Note 1) Supply Voltage 7V Input Voltage 7V −65°C to +150°C Storage Temperature Range Operating Free Air Temperature Range Note 1: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum ratings. The “Recommended Operating Conditions” table will define the conditions for actual device operation. 0°C to +70°C Typical θJA N Package 78.5°C/W M Package 109.0°C/W Recommended Operating Conditions Symbol Parameter Min Nom Max Units 4.5 5 5.5 V VCC Supply Voltage VT+ Positive-Going Input VCC = Min to Max 1.4 2 Threshold Voltage VCC = 5V 1.55 1.85 VT− HYS Negative-Going Input VCC = Min to Max 0.75 1.2 Threshold Voltage VCC = 5V 0.85 1.1 Input Hysteresis VCC = Min to Max 0.5 VCC = 5V 0.6 V V V IOH HIGH Level Output Current −0.4 mA IOL LOW Level Output Current 8 mA TA Operating Free Air Temperature Range 70 °C 0 Electrical Characteristics over recommended free air temperature range (unless otherwise noted) Symbol Parameter Test Conditions VIK Input Clamp Voltage VCC = Min, II = −18 mA VOH HIGH Level Output Voltage VCC = 4.5V to 5.5V, IOH = Max VOL LOW Level Output Voltage VCC = Min IT+ Input Current at Positive-Going Threshold Voltage VCC = 5V, VI = VT+ IT− Input Current at Negative-Going Threshold Voltage VCC = 5V, VI = VT− II Input Current at Maximum Input Voltage VCC = Max, VI = 7V IIH HIGH Level Input Current IIL Min Typ Max Units −1.5 V V VCC − 2 V IOL = 4 mA 0.25 0.4 IOL = 8 mA 0.35 0.5 V 20 µA −100 µA 100 µA VCC = Max, VI = 2.7V 20 µA LOW Level Input Current VCC = Max, VI = 0.4V −100 µA IO Output Drive Current VCC = Max, VO = 2.25V −112 mA ICCH Supply Current with Outputs HIGH VCC = Max 12 mA ICCL Supply Current with Outputs LOW VCC = Max 12 mA VOLP Quiet Output Maximum VCC = 5.0V, TA = 25°C Dynamic VOL (Figures 1, 2); (Note 2)(Note 3) VOLV VIHD VILD Quiet Output Minimum VCC = 5.0V, TA = 25°C Dynamic VOL (Figures 1, 2); (Note 2)(Note 3) Minimum HIGH Level VCC = 5.0V, TA = 25°C Dynamic Input Voltage (Note 2)(Note 4) Maximum LOW Level VCC = 5.0V, TA = 25°C Dynamic Input Voltage (Note 2)(Note 4) −30 0.16 V −0.27 V 1.44 V 1.15 V Note 2: Plastic DIP package. Note 3: n = number of device outputs, n − 1 outputs switching, each driven 0V to 3V one output @ GND. Note 4: n = number of device outputs, n outputs switching, n − 1 inputs switching 0V to 3V. Input under test switching 3V to threshold (VILD); 0V to threshold (VIHD); f = 1 MHz. www.fairchildsemi.com 2 Symbol over recommended operating free air temperature range Min Max Units tPLH Propagation Delay Time LOW-to-HIGH Level Output Parameter VCC = 4.5V to 5.5V Conditions 2 12 ns tPHL Propagation Delay Time HIGH-to-LOW Level Output RL = 500Ω, CL = 50 pF 2 10 ns ALS Noise Characteristics The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of ALS. • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. Equipment: • Monitor one of the switching outputs using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. • First increase the input LOW voltage level, VIL, until the output begins to oscillate. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input LOW voltage level at which oscillation occurs is defined as VILD. VILD and VIHD: Word Generator Printed Circuit Board Test Fixture scope Dual Trace Oscillo- Procedure: 1. Verify Test Fixture Loading: Standard Load 50 pF, 500Ω. 2. Deskew the word generator so that no two channels have greater than 150 ps skew between them. This requires that the oscilloscope be deskewed first. Swap out the channels that have more than 150 ps of skew until all channels being used are within 150 ps. It is important to deskew the word generator channels before testing. This will ensure that the outputs switch simultaneously. • Next decrease the input HIGH voltage level on the word generator, VIH until the output begins to oscillate. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input HIGH voltage level at which oscillation occurs is defined as VIHD. 3. Terminate all inputs and outputs to ensure proper loading of the outputs and that the input levels are at the correct voltage. 4. Set VCC to 5.0V. • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. 5. Set the word generator to toggle all but one output at a frequency of 1 MHz. Greater frequencies will increase DUT heating and affect the results of the measurement. 6. Set the word generator input levels at 0V LOW and 3V HIGH. Verify levels with a digital volt meter. VOLP/VOLV and VOHP/VOHV: • Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will usually be the furthest from the ground pin. Monitor the output voltages using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. VOHV and VOHP are measured with respect to VOH reference. VOLV and VOLP are measured with respect to ground reference. Input pulses have the following characteristics: f = 1 MHz, tr = 3 ns, t f = 3 ns, skew < 150 ps. FIGURE 1. Quiet Output Noise Voltage Waveforms FIGURE 2. Simultaneous Switching Test Circuit 3 www.fairchildsemi.com DM74ALS14 Switching Characteristics DM74ALS14 Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow Package Number M14A www.fairchildsemi.com 4 DM74ALS14 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M14D 5 www.fairchildsemi.com DM74ALS14 Hex Inverter with Schmitt Trigger Inputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N14A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com www.fairchildsemi.com 6