EFC4C002NLTDG

EFC4C002NLTDG

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    WLCSP8_6X2.5MM

  • 描述:

    此 N 沟道功率 MOSFET 是使用安森美半导体的沟槽技术生产的,专门用于最大程度减小门极电荷,实现超低导通电阻。此器件适用于无人机或笔记本电脑应用。

  • 数据手册
  • 价格&库存
EFC4C002NLTDG 数据手册
MOSFET – Power, Dual, N-Channel, for 3-Cells Lithium-ion Battery Protection, WLCSP8 30 V, 2.6 mW, 30 A EFC4C002NL www.onsemi.com T h i s N −C h a n n e l P o w e r M O S F E T i s p r o d u c e d u s i n g ON Semiconductor’s trench technology, which is specifically designed to minimize gate charge and ultra low on resistance. This device is suitable for applications of Drone or Notebook PC. VSSS RSS(on) Max IS Max 2.6 mW @ 10 V 30 V 30 A 3.3 mW @ 8 V 5.1 mW @ 4.5 V Features • • • • Ultra Low On−Resistance Low Gate Charge Common−Drain Type These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant ELECTRICAL CONNECTION N−Channel 6, 8 7 Applications • 3−Cells Lithium−ion Battery Charging and Discharging Switch 1. Source 1 2. Gate 1 3. Source 1 4. Drain 5. Drain 6. Source 2 7. Gate 2 8. Source 2 4, 5 SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS at TA = 25_C (Note 1) Parameter Symbol Value Unit Source to Source Voltage VSSS 30 V Gate to Source Voltage VGSS ±20 V Source Current (DC) IS 30 A Source Current (Pulse) PW ≤ 10 μs, Duty Cycle ≤ 1% ISP 120 A Total Dissipation (Note 1) PT 2.6 W Junction Temperature Tj 150 _C Storage Temperature Tstg −55 to +150 _C 1, 3 2 PIN ASSIGNMENT Pin1:S1 Pin3:S1 Pin2:G1 Pin4:D Pin6:S2 Pin8:S2 Pin7:G2 Pin5:D (Bottom View) WLCSP8 CASE 567MC Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. MARKING DIAGRAM THERMAL RESISTANCE RATINGS Parameter Junction to Ambient (Note 1) Symbol Value Unit RθJA 48 _C/W 1. Surface mounted on ceramic substrate (5000 mm2 × 0.8 mm). 4C2 AAYWWZ G 4C2 AA Y WW Z G = Specific Device Code = Assembly Location = Year = Work Week = Lot Traceability = Pb−Free Package ORDERING INFORMATION See detailed ordering and shipping information on page 6 of this data sheet. © Semiconductor Components Industries, LLC, 2016 January, 2021 − Rev. 1 1 Publication Order Number: EFC4C002NL/D EFC4C002NL ELECTRICAL CHARACTERISTICS at TA = 25_C Value Parameter Source to Source Breakdown Voltage Symbol Conditions Min Typ Max Unit V(BR)SSS IS = 1 mA, VGS = 0 V Test Circuit 1 Zero−Gate Voltage Source Current ISSS VSS = 24 V, VGS = 0 V Test Circuit 1 1 μA Gate to Source Leakage Current IGSS VGS = 20 V, VSS = 0 V Test Circuit 2 200 nA VGS(th) VSS = 10 V, IS = 1 mA Test Circuit 3 2.2 V gFS VSS = 10 V, IS = 10 A Test Circuit 4 RSS(on) VGS = 10 V, IS = 10 A Test Circuit 5 1.5 2.0 2.6 mW VGS = 8 V, IS = 10 A Test Circuit 5 1.6 2.1 3.3 mW VGS = 4.5 V, IS = 10 A Test Circuit 5 2.2 2.9 5.1 mW Gate Threshold Voltage Forward Transconductance Static Source to Source On−State Resistance Static Drain to Source On−State Resistance Gate Resistance Turn−ON Delay Time Rise Time Turn−OFF Delay Time Fall Time RDS(on) V 1.3 16 S 10 mW 3 W 40 ns 750 ns td(off) 280 ns tf 105 ns 6.200 pF 45 nC RG td(on) tr Input Capacitance Ciss Total Gate Charge Qg Forward Source to Source Voltage VGS = 10 V, IS = 1 A 30 VF(S−S) VSS = 15 V, VGS= 10 V IS = 10 A Test Circuit 6 VSS = 15 V, VGS= 0 V, f = 1 MHz VSS = 15 V, VGS = 4.5 V, IS = 15 A Test Circuit 7 IS = 10 A, VGS = 0 V Test Circuit 8 0.75 1.2 V Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. www.onsemi.com 2 EFC4C002NL Test circuits are example of measuring FET1 side. IGSS VSSS/ISSS S2 S2 G2 G2 A G1 VSS G1 A S1 S1 When FET1 is measured, Gate and Source of FET2 are short−circuited. Figure 2. Test Circuit 2 Figure 1. Test Circuit 1 gFS VGS(th) S2 S2 G2 G2 A A When FET1 is measured, Gate and Source of FET2 are short−circuited. VGS G1 VSS G1 VGS S1 VSS S1 Figure 4. Test Circuit 4 Figure 3. Test Circuit 3 td(on), tr, td(off), tf RSS(on) S2 S2 IS RL G2 G2 V V G1 VGS When FET1 is measured, Gate and Source of FET2 are short−circuited. G1 VSS S1 S1 PG Figure 6. Test Circuit 6 Figure 5. Test Circuit 5 VF(S−S) Qg S2 When FET1 is measured, Gate and Source of FET2 are short−circuited. When FET1 is measured, Gate and Source of FET2 are short−circuited. S2 A G2 G2 G1 G1 IS V IG = 1 mA RL S1 PG S1 VGS = 0 V VSS Figure 8. Test Circuit 8 Figure 7. Test Circuit 7 NOTES: When FET2 is measured, the position of FET1 and FET2 is switched. www.onsemi.com 3 When FET1 is measured,+10 V is added to VGS of FET2. EFC4C002NL TYPICAL CHARACTERISTICS 20 TA = 25°C Single Pulse 50 8V 10 V VGS = 4.5 V 40 VSS = 10 V Single Pulse 18 6V IS, SOURCE CURRENT (A) IS, SOURCE CURRENT (A) 60 12 V 30 20 10 16 14 25°C 12 TA = 75°C 10 8 6 4 −25°C 2 0 0.02 0.04 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2 0 0.5 1.0 1.5 2.5 2.0 VSS, SOURCE−TO−SOURCE VOLTAGE (V) VGS, GATE−TO−SOURCE VOLTAGE (V) Figure 9. On−Region Characteristics Figure 10. Transfer Characteristics 8 RSS(on), STATIC SOURCE−TO−SOURCE ON−STATE RESISTANCE (mW) 0 IS = 10 A Single Pulse 6 4 25°C 75°C 2 TA = −25°C 0 3 5 7 9 11 13 15 5.0 VGS = 4.5 V 4.0 3.5 VGS = 8 V 3.0 2.5 VGS = 10 V 2.0 1.5 1.0 0.5 0 −60 −30 0 30 60 90 120 150 VGS, GATE−TO−SOURCE VOLTAGE (V) TA, AMBIENT TEMPERATURE (°C) Figure 12. On−Resistance vs. Temperature 2 VSS = 10 V Single Pulse 10 2 TA = −25°C 75°C 7 5 25°C 3 2 1.0 0.1 2 3 5 7 1.0 2 3 5 7 10 10 7 5 180 VGS = 0 V Single Pulse TA = 75°C 3 2 25°C −25°C 1.0 7 5 3 2 0.1 0.2 2 3.0 IS = 10 A Single Pulse 4.5 Figure 11. On−Resistance vs. Gate−to−Source Voltage IS, SOURCE CURRENT (A) gFS, FORWARD TRANSCONDUCTANCE (S) RSS(on), STATIC SOURCE−TO−SOURCE ON−STATE RESISTANCE (mW) 0 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 VF(S−S), FORWARD SOURCE−TO−SOURCE VOLTAGE (V) IS, SOURCE CURRENT (A) Figure 14. Forward Source−to−Source Voltage vs. Current Figure 13. Forward Transconductance vs. Current www.onsemi.com 4 SW, SWITCHING TIME (ns) 10000 VGS, GATE−TO−SOURCE VOLTAGE (V) EFC4C002NL VSS = 15 V VGS = 10 V 1000 tf td(off) 100 td(on) tr 0.1 IS, SOURCE CURRENT (A) 100 2 3 5 7 1.0 2 5 3.0 2.5 2.0 1.5 1.0 0.5 0 0 10 5 15 20 25 30 35 40 45 QG, TOTAL GATE CHARGE (nC) Figure 16. Gate−to−Source Voltage vs. Total Gate Charge ISP = 120 A (PW ≤ 10 ms) IS = 30 A 3.0 10 ms 100 ms 1 ms 10 ms 1.0 3.5 IS, SOURCE CURRENT (A) Operation in this area is limited by RSS(on) 100 ms DC Operation TA = 25°C Single Pulse Surface mounted on ceramic substrate (5000 mm2 x 0.8 mm) 0.01 0.01 2 3 5 7 0.1 2 3 5 7 1.0 2 3 5 7 10 RqJA, THERMAL RESISTANCE (°C/W) 2 7 10 VSS = 15 V IS = 15 A 4.0 Figure 15. Switching Time vs. Current 10 0.1 3 PT, TOTAL DISSIPATION (W) 10 4.5 2 3 Surface mounted on ceramic substrate (5000 mm2 x 0.8 mm) 2.5 2.0 1.5 1.0 0.5 0 5 0 25 50 75 100 125 TA, AMBIENT TEMPERATURE (°C) Figure 17. Safe Operating Area Figure 18. Total Dissipation vs. Temperature Duty Cycle = 0.5 0.2 0.1 0.05 0.02 1.0 0.01 Surface mounted on ceramic substrate (5000 mm2 x 0.8 mm) Single Pulse 0.1 0.00001 150 VSS, SOURCE−TO−SOURCE VOLTAGE (V) 100 10 50 0.0001 0.001 0.01 PT, PULSE TIME (sec) Figure 19. Thermal Response www.onsemi.com 5 0.1 1.0 10 EFC4C002NL ORDERING INFORMATION Device EFC4C002NLTDG Marking Package Shipping (Qty / Packing)† NP WLCSP8 6.00x2.50 (Pb−Free / Halogen Free) 5000 / Tape & Reel †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. www.onsemi.com 6 MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS WLCSP8, 6.00x2.50 / EFCP6025−8EGJ−021 CASE 567MC ISSUE O SCALE 2:1 D PIN A1 REFERENCE 2X ÈÈÈÈ ÈÈÈÈ A NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETERS. B DIM A b b1 D D1 D2 E e e1 L E 0.05 C 2X 0.05 C TOP VIEW A C SIDE VIEW b e 0.05 D1 1 D2 2 3 4 MILLIMETERS MIN MAX 0.23 0.19 0.22 0.28 0.32 0.38 5.95 6.05 0.305 BSC 1.740 BSC 2.45 2.55 1.375 BSC 1.25 BSC 1.97 2.03 SEATING PLANE 4X e DATE 22 JUL 2015 M C A B e1/2 e1 b1 C A B 4X 0.05 M 8 4X 0.05 M 7 L 6 5 RECOMMENDED SOLDERING FOOTPRINT* PACKAGE OUTLINE 4X 1.375 C A B 1.375 1.74 0.25 BOTTOM VIEW 1.25 4X 0.35 1 4X 2.00 DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. DOCUMENT NUMBER: DESCRIPTION: 98AON00386G Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. WLCSP8, 6.00X2.50 / EFCP6025−8EGJ−021 PAGE 1 OF 1 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com onsemi, , and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of onsemi’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. onsemi reserves the right to make changes at any time to any products or information herein, without notice. The information herein is provided “as−is” and onsemi makes no warranty, representation or guarantee regarding the accuracy of the information, product features, availability, functionality, or suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using onsemi products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by onsemi. “Typical” parameters which may be provided in onsemi data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. onsemi does not convey any license under any of its intellectual property rights nor the rights of others. onsemi products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use onsemi products for any such unintended or unauthorized application, Buyer shall indemnify and hold onsemi and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that onsemi was negligent regarding the design or manufacture of the part. onsemi is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. 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