Ordering number : ENA2302
EFC6605R
N-Channel Power MOSFET
20V, 10A, 13.3mΩ, Dual EFCP
http://onsemi.com
Features
• 2.5V drive
• Protection diode in
• Halogen free compliance
• Common-drain type
• 2KV ESD HBM
Applications
• Lithium-ion battery charging and discharging switch
Specifications
Absolute Maximum Ratings at Ta = 25°C
Parameter
Symbol
Conditions
Value
Unit
Source to Source Voltage
VSSS
20
V
Gate to Source Voltage
VGSS
±10
V
Source Current (DC)
IS
10
A
Source Current (Pulse)
ISP
PW≤10μs, duty cycle≤1%
60
A
Total Dissipation
PT
When mounted on ceramic substrate (5000mm2×0.8mm)
1.6
W
Junction Temperature
Tj
150
°C
Storage Temperature
Tstg
- 55 to +150
°C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed,
damage may occur and reliability may be affected.
Thermal Resistance Ratings
Parameter
Junction to Ambient
When mounted on ceramic substrate (5000mm2×0.8mm)
Symbol
RθJA
Value
78.1
Unit
°C /W
Electrical Characteristics at Ta = 25°C
Parameter
Symbol
Value
Conditions
min
typ
Unit
max
Source to Source Breakdown Voltage
V(BR)SSS
IS=1mA, VGS=0V
Test Circuit 1
Zero-Gate Voltage Source Current
ISSS
VSS=20V, VGS=0V
Test Circuit 1
1
μA
Gate to Source Leakage Current
IGSS
VGS=±8V, VSS=0V
Test Circuit 2
±1.0
μA
Gate Threshold Voltage
VGS(th)
VSS10V, IS=1mA
Test Circuit 3
Forward Transconductance
gFS
VSS=10V, IS=3A
Test Circuit 4
RSS(on)1
IS=3A, VGS=4.5V
Test Circuit 5
8.8
11.1
13.3
mΩ
RSS(on)2
IS=3A, VGS=4.0V
Test Circuit 5
9.1
11.4
13.7
mΩ
RSS(on)3
IS=3A, VGS=3.8V
Test Circuit 5
9.3
11.6
13.9
mΩ
RSS(on)4
IS=3A, VGS=3.1V
Test Circuit 5
10.0
12.5
15.6
mΩ
RSS(on)5
IS=3A, VGS=2.5V
Test Circuit 5
11.1
13.9
17.4
mΩ
Static Source to Source On-State
Resistance
20
V
0.5
1.3
11.4
V
S
Continued on next page.
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of this data sheet.
Semiconductor Components Industries, LLC, 2014
March, 2014
32714 TKIM TC-00003101 No.A2302-1/6
EFC6605R
Continued from preceding page.
Value
Parameter
Symbol
Conditions
Unit
min
typ
max
Turn-ON Delay Time
td(on)
154
ns
Rise Time
tr
678
ns
Turn-OFF Delay Time
td(off)
44400
ns
Fall Time
tf
60800
ns
Total Gate Charge
Qg
VSS=10V, VGS=4.5V, IS=10A Test Circuit 7
19.8
nC
Forward Source to Source Voltage
VF(S-S)
IS=3A, VGS=0V
0.75
VSS=10V, VGS=4.5V, IS=3A Test Circuit 6
Test Circuit 8
1.2
V
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be
indicated by the Electrical Characteristics if operated under different conditions.
Ordering & Package Information
Device
Package
EFC6605R-TR
Packing Type: TR
EFCP
Shipping
note
5,000
pcs. / reel
Pb-Free
and
Halogen Free
Marking
Electrical Connection
4, 6
TR
ME
LOT No.
Rg
5
Rg
2
Rg=200Ω
1, 3
No.A2302-2/6
EFC6605R
Test circuits are example of measuring FET1 side
Test Circuit 2
IGSS
Test Circuit 1
ISSS
S2
S2
G2
G2
A
G1
VSS
G1
A
VGS
S1
Test Circuit 3
VGS(th)
S1
When FET1 is measured,
Gate and Source of FET2
are short-circuited.
Test Circuit 4
gFS
S2
S2
G2
G2
A
A
When FET1 is measured,
Gate and Source of FET2
are short-circuited.
VGS
VSS
G1
VSS
G1
VGS
S1
S1
Test Circuit 6
td(on), tr, td(off), tf
Test Circuit 5
RSS(on)
S2
S2
RL
IS
G2
G2
V
V
G1
G1
VGS
When FET1 is measured,
Gate and Source of FET2
are short-circuited.
VSS
S1
S1
When FET1 is measured,
Gate and Source of FET2
are short-circuited.
PG
Test Circuit 8
VF(S-S)
Test Circuit 7
Qg
S2
S2
IS
A
When FET1 is measured,
Gate and Source of FET2
are short-circuited.
G2
G2
V
IG =1mA
G1
RL
G1
S1
S1
PG
VGS=0V
VSS
When FET1 is
measured,+4.5V is added to
VGS of FET2.
When FET2 is measured, the position of FET1 and FET2 is switched.
No.A2302-3/6
EFC6605R
Source Current, IS -- A
No.A2302-4/6
EFC6605R
No.A2302-5/6
EFC6605R
Package Dimensions
EFC6605R-TR
EFCP1915-6CE-020
unit : mm
1: Source1
2: Gate1
Recommended Soldering
Footprint
3: Source1
4: Source2
5: Gate2
6: Source2
Note on usage : Since the EFC6605R is a MOSFET product, please avoid using this device in the vicinity
of highly charged objects.
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performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts.
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PS No.A2302-6/6