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FCA76N60N
N-Channel SupreMOS® MOSFET
600 V, 76 A, 36 mΩ
Features
Description
• RDS(on) = 28 mΩ (Typ. ) @ VGS = 10 V, ID = 38 A
The SupreMOS® MOSFET is ON Semiconductor’s next
generation of high voltage super-junction (SJ) technology
• Ultra Low Gate Charge (Typ. Qg = 218 nC)
employing a deep trench filling process that differentiates it from
• Low Effective Output Capacitance (Typ. Coss(eff.) = 914 pF)
the conventional SJ MOSFETs. This advanced technology and
• 100% Avalanche Tested
precise process control provides lowest Rsp on-resistance,
superior switching performance and ruggedness. SupreMOS
• RoHS Compliant
MOSFET is suitable for high frequency switching power con-
Application
verter applications such as PFC, server/telecom power, FPD TV
power, ATX power, and industrial power applications.
• Solar Inverter
• AC-DC Power Supply
D
G
G
D
S
TO-3PN
S
MOSFET Maximum Ratings TC = 25oC unless otherwise noted.
Symbol
VDSS
Drain to Source Voltage
Parameter
VGSS
Gate to Source Voltage
- Continuous (TC = 25oC)
FCA76N60N
600
Unit
V
±30
V
76
ID
Drain Current
IDM
Drain Current
EAS
Single Pulsed Avalanche Energy
IAR
Avalanche Current
(Note 1)
76
A
EAR
Repetitive Avalanche Energy
(Note 1)
5.40
mJ
MOSFET dv/dt Ruggedness
(Note 3)
100
dv/dt
- Continuous (TC = 100oC)
- Pulsed
(Note 1)
228
A
(Note 2)
8022
mJ
Peak Diode Recovery dv/dt
12
(TC = 25oC)
PD
Power Dissipation
TJ, TSTG
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering, 1/8” from Case for 5 Seconds
TL
A
48.1
- Derate Above 25oC
V/ns
543
W
5.40
W/oC
-55 to +150
o
C
300
o
C
Thermal Characteristics
Symbol
Parameter
FCA76N60N
RθJC
Thermal Resistance, Junction to Case, Max.
RθJA
Thermal Resistance, Junction to Ambient, Max.
©2010 Semiconductor Components Industries, LLC.
FCA76N60N Rev. 1
0.23
1
40
Unit
o
C/W
www.onsemi.com
FCA76N60N — N-Channel SupreMOS® MOSFET
Sept 2017
Part Number
FCA76N60N
Top Mark
FCA76N60N
Electrical Characteristics
Symbol
Package
TO-3PN
Packing Method
Tube
Reel Size
N/A
Tape Width
N/A
Quantity
30 units
TC = 25oC unless otherwise noted.
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
600
-
-
V
-
0.73
-
V/oC
Off Characteristics
BVDSS
ΔBVDSS
/ ΔTJ
Drain to Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
IDSS
Zero Gate Voltage Drain Current
IGSS
Gate to Body Leakage Current
ID = 1 mA, VGS = 0 V,TJ = 25oC
ID = 1 mA, Referenced to
25oC
VDS = 480 V, VGS = 0 V
-
-
10
VDS = 480 V, TJ = 125oC
-
-
100
VGS = ±30 V, VDS = 0 V
-
-
±100
2.0
-
4.0
V
-
28.5
36.0
mΩ
88
-
S
μA
nA
On Characteristics
VGS(th)
RDS(on)
Gate Threshold Voltage
VGS = VDS, ID = 250 μA
Static Drain to Source On Resistance
VGS = 10 V, ID = 38 A
gFS
Forward Transconductance
VDS = 20 V, ID = 38 A
-
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Coss
VDS = 100 V, VGS = 0 V,
f = 1 MHz
-
9310
12385
pF
-
370
495
pF
-
3.1
5.0
pF
Output Capacitance
VDS = 380 V, VGS = 0 V, f = 1 MHz
-
196
-
pF
Coss(eff.)
Effective Output Capacitance
VDS = 0 V to 380 V, VGS = 0 V
-
914
-
pF
-
218
285
nC
VDS = 380 V, ID = 38 A,
VGS = 10 V
-
39
-
nC
-
66
-
nC
-
1.0
-
Ω
-
34
78
ns
-
24
58
ns
-
235
480
ns
-
32
74
ns
Qg(tot)
Total Gate Charge at 10V
Qgs
Gate to Source Gate Charge
Qgd
Gate to Drain “Miller” Charge
ESR
Equivalent Series Resistance (G-S)
(Note 4)
f = 1 MHz
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
VDD = 380 V, ID = 38 A,
VGS = 10 V, RG = 4.7 Ω
(Note 4)
Drain-Source Diode Characteristics
IS
Maximum Continuous Drain to Source Diode Forward Current
-
-
76
A
ISM
Maximum Pulsed Drain to Source Diode Forward Current
-
-
228
A
VSD
Drain to Source Diode Forward Voltage
VGS = 0 V, ISD = 38 A
-
-
1.2
V
trr
Reverse Recovery Time
613
-
ns
Qrr
Reverse Recovery Charge
VGS = 0 V, ISD = 38 A,
dIF/dt = 100 A/μs
-
16
-
μC
Notes:
1. Repetitive rating: pulse-width limited by maximum junction temperature.
2. IAS = 25.3 A, RG = 25 Ω, starting TJ = 25°C.
3. ISD ≤ 76 A, di/dt ≤ 200 A/μs, VDD ≤ 380 V, starting TJ = 25°C.
4. Essentially independent of operating temperature typical characteristics.
©2010 Semiconductor Components Industries, LLC.
FCA76N60N Rev. 1
2
www.onsemi.com
FCA76N60N — N-Channel SupreMOS® MOSFET
Package Marking and Ordering Information
Figure 1. On-Region Characteristics
Figure 2. Transfer Characteristics
1000
VGS = 15.0 V
10.0 V
6.0 V
5.5 V
5.0 V
4.5 V
100
ID, Drain Current[A]
ID, Drain Current[A]
1000
10
100
o
150 C
o
25 C
10
o
-55 C
*Notes:
1. 250μs Pulse Test
*Notes:
1. VDS = 20V
2. 250μs Pulse Test
o
2. TC = 25 C
1
0.1
1
VDS, Drain-Source Voltage[V]
10
1
20
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
4
6
VGS, Gate-Source Voltage[V]
1000
IS, Reverse Drain Current [A]
45
40
VGS = 10V
35
VGS = 20V
30
100
o
150 C
o
25 C
10
*Notes:
1. VGS = 0V
o
25
*Notes: TC = 25 C
0
50
100
150
200
ID, Drain Current [A]
250
1
0.2
300
2. 250μs Pulse Test
0.4
0.6
0.8
1.0
1.2
VSD, Body Diode Forward Voltage [V]
1.4
Figure 5. Capacitance Characteristics
Figure 6. Gate Charge Characteristics
100000
10
1000
100
10
VGS, Gate-Source Voltage [V]
Ciss
10000
Capacitances [pF]
8
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
50
RDS(ON) [mΩ],
Drain-Source On-Resistance
2
Coss
*Notes:
1. VGS = 0V
2. f = 1MHz
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
1
0.1
VDS = 300V
6
VDS = 480V
4
2
Crss
1
10
100
VDS, Drain-Source Voltage [V]
©2010 Semiconductor Components Industries, LLC.
FCA76N60N Rev. 1
VDS = 120V
8
0
600
3
*Notes: ID = 38A
0
40
80
120
160
200
Qg, Total Gate Charge [nC]
240
www.onsemi.com
FCA76N60N — N-Channel SupreMOS® MOSFET
Typical Performance Characteristics
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
3.0
RDS(on), [Normalized]
Drain-Source On-Resistance
BVDSS, [Normalized]
Drain-Source Breakdown Voltage
1.2
1.1
1.0
0.9
*Notes:
1. VGS = 0V
2. ID = 1mA
0.8
-80
-40
0
40
80
120
o
TJ, Junction Temperature [ C]
2.0
1.5
1.0
*Notes:
1. VGS = 10V
2. ID = 38A
0.5
0.0
-80
160
Figure 9. Maximum Safe Operating Area
-40
0
40
80
120
o
TJ, Junction Temperature [ C]
160
Figure 10. Maximum Drain Current
vs. Case Temperature
500
80
30μs
100
100μs
1ms
10
ID, Drain Current [A]
ID, Drain Current [A]
2.5
10ms
Operation in This Area
is Limited by R DS(on)
1
DC
*Notes:
0.1
o
1. TC = 25 C
60
40
20
o
0.01
2. TJ = 150 C
3. Single Pulse
1
10
100
VDS, Drain-Source Voltage [V]
0
25
1000
50
75
100
125
o
TC, Case Temperature [ C]
150
Figure 11. Transient Thermal Response Curve
ZθJC(t), Thermal Response [oC/W]
Thermal Response [ZθJC]
1
0.1
0.5
0.2
PDM
0.1
0.01
t1
0.05
*Notes:
0.02
o
0.01
1. ZθJC(t) = 0.23 C/W Max.
2. Duty Factor, D= t1/t2
3. TJM - TC = PDM * ZθJC(t)
Single pulse
0.005
-5
10
t2
-4
10
©2010 Semiconductor Components Industries, LLC.
FCA76N60N Rev. 1
-3
-2
-1
0
10
10
10
10
Rectangular
Pulse
Duration
t1, Rectangular
Pulse
Duration
[sec][sec]
4
1
10
2
10
www.onsemi.com
FCA76N60N — N-Channel SupreMOS® MOSFET
Typical Performance Characteristics (Continued)
FCA76N60N — N-Channel SupreMOS® MOSFET
IG = const.
Figure 12. Gate Charge Test Circuit & Waveform
VDS
RG
RL
VDS
VDD
VGS
VGS
DUT
V
10V
GS
90%
10%
td(on)
tr
t on
td(off)
tf
t off
Figure 13. Resistive Switching Test Circuit & Waveforms
VGS
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms
©2010 Semiconductor Components Industries, LLC.
FCA76N60N Rev. 1
5
www.onsemi.com
FCA76N60N — N-Channel SupreMOS® MOSFET
DUT
+
VDS
_
I SD
L
Driver
RG
Same Type
as DUT
VGS
VGS
( Driver )
VDD
• dv/dt controlled by RG
• ISD controlled by pulse period
Gate Pulse Width
D = -------------------------Gate Pulse Period
10V
IFM , Body Diode Forward Current
I SD
( DUT )
di/dt
IRM
Body Diode Reverse Current
VDS
( DUT )
Body Diode Recovery dv/dt
VSD
VDD
Body Diode
Forward Voltage Drop
Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
©2010 Semiconductor Components Industries, LLC.
FCA76N60N Rev. 1
6
www.onsemi.com
FCA76N60N — N-Channel SupreMOS® MOSFET
Mechanical Dimensions
Figure 16. TO3PN, 3-Lead, Plastic, EIAJ SC-65
Package drawings are provided as a service to customers considering our components. Drawings may change in any manner
without notice. Please note the revision and/or date on the drawing and contact a ON Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of our worldwide terms and conditions, specifically the warranty therein, which covers ON Semiconductor products.
Always visit ON Semiconductor’s online packaging area for the most recent package drawings.
©2010 Semiconductor Components Industries, LLC.
FCA76N60N Rev. 1
7
www.onsemi.com
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
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