FCPF600N65S3R0L-F154 数据手册
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MOSFET – Power, N-Channel,
SUPERFET[ III, Easy Drive
650 V, 6 A, 600 mW
FCPF600N65S3R0L-F154
Description
SUPERFET III MOSFET is ON Semiconductor’s brand−new high
voltage super−junction (SJ) MOSFET family that is utilizing charge
balance technology for outstanding low on−resistance and lower gate
charge performance. This advanced technology is tailored to minimize
conduction loss, provide superior switching performance, and
withstand extreme dv/dt rate. Consequently, SUPERFET III MOSFET
Easy drive series helps manage EMI issues and allows for easier
design implementation.
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VDSS
RDS(ON) MAX
ID MAX
650 V
600 mW @ 10 V
6A
D
Features
•
•
•
•
•
•
700 V @ TJ = 150°C
Typ. RDS(on) = 474 mW
Ultra Low Gate Charge (Typ. Qg = 11 nC)
Low Effective Output Capacitance (Typ. Coss(eff.) = 127 pF)
100% Avalanche Tested
These Devices are Pb−Free and are RoHS Compliant
G
S
N-Channel MOSFET
Applications
•
•
•
•
Computing / Display Power Supplies
Telecom / Server Power Supply
Industrial Power Supplies
Lighting / Charger / Adapter
G
D
S
TO−220F Ultra Narrow Lead
CASE 221BN
MARKING DIAGRAM
$Y&Z&3&K
FCPF600
N65S3R0
$Y
&Z
&3
&K
FCPF600N65S3R0
= ON Semiconductor Logo
= Assembly Plant Code
= Numeric Date Code
= Lot Code
= Specific Device Code
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
© Semiconductor Components Industries, LLC, 2020
December, 2020 − Rev. 0
1
Publication Order Number:
FCPF600N65S3R0L−F154/D
FCPF600N65S3R0L−F154
ABSOLUTE MAXIMUM RATINGS (TC = 25°C, Unless otherwise specified)
Symbol
Parameter
VDSS
Drain to Source Voltage
VGSS
Gate to Source Voltage
ID
Drain Current
Value
Unit
650
V
DC
±30
V
AC (f > 1 Hz)
±30
V
Continuous (TC = 25°C)
6*
A
Continuous (TC = 100°C)
3.8*
Pulsed (Note 1)
IDM
Drain Current
15*
A
EAS
Single Pulsed Avalanche Energy (Note 2)
24
mJ
IAS
Avalanche Current (Note 2)
1.6
A
EAR
Repetitive Avalanche Energy (Note 1)
0.24
mJ
dv/dt
MOSFET dv/dt
100
V/ns
Peak Diode Recovery dv/dt (Note 3)
20
PD
Power Dissipation
(TC = 25°C)
24
W
0.19
W/°C
−55 to +150
°C
300
°C
Derate Above 25°C
TJ, TSTG
TL
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering, 1/8″ from Case for 5 s
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
*Drain current limited by maximum junction temperature.
1. Repetitive rating: pulse-width limited by maximum junction temperature.
2. IAS = 1.6 A, RG = 25 W, starting TJ = 25°C.
3. ISD ≤ 3 A, di/dt ≤ 200 A/ms, VDD ≤ 400 V, starting TJ = 25°C.
THERMAL CHARACTERISTICS
Symbol
Parameter
FCPF600N65S3R0L
RqJC
Thermal Resistance, Junction to Case, Max.
5.29
RqJA
Thermal Resistance, Junction to Ambient, Max.
62.5
Unit
_C/W
PACKAGE MARKING AND ORDERING INFORMATION
Part Number
Top Marking
Package
Packing Method
Reel Size
Tape Width
Quantity
FCPF600N65S3R0L
FCPF600N65S3R0
TO−220F
Tube
N/A
N/A
50 Units
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2
FCPF600N65S3R0L−F154
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)
Parameter
Symbol
Test Conditions
Min
Typ
Max
Unit
VGS = 0 V, ID = 1 mA, TJ = 25_C
650
−
−
V
VGS = 0 V, ID = 1 mA, TJ = 150_C
700
−
−
V
OFF CHARACTERISTICS
BVDSS
Drain to Source Breakdown Voltage
DBVDSS/DTJ
Breakdown Voltage Temperature
Coefficient
ID = 1 mA, Referenced to 25_C
−
0.66
−
V/_C
IDSS
Zero Gate Voltage Drain Current
VDS = 650 V, VGS = 0 V
−
−
1
mA
VDS = 520 V, TC = 125_C
−
0.3
−
IGSS
Gate to Source Leakage Current
VGS = ±30 V, VDS = 0 V
−
−
±100
nA
2.5
−
4.5
V
ON CHARACTERISTICS
VGS(th)
Gate Threshold Voltage
VGS = VDS, ID = 0.12 mA
RDS(on)
Static Drain to Source On Resistance
VGS = 10 V, ID = 3 A
−
474
600
mW
Forward Transconductance
VDS = 20 V, ID = 3 A
−
3.6
−
S
VDS = 400 V, VGS = 0 V, f = 1 MHz
−
465
−
pF
−
10
−
pF
gFS
DYNAMIC CHARACTERISTICS
Ciss
Input Capacitance
Coss
Output Capacitance
Coss(eff.)
Effective Output Capacitance
VDS = 0 V to 400 V, VGS = 0 V
−
127
−
pF
Coss(er.)
Energy Related Output Capacitance
VDS = 0 V to 400 V, VGS = 0 V
−
17
−
pF
Total Gate Charge at 10V
VDS = 400 V, ID = 3 A, VGS = 10 V
(Note 4)
−
11
−
nC
−
3
−
nC
Qg(tot)
Qgs
Gate to Source Gate Charge
Qgd
Gate to Drain “Miller” Charge
ESR
Equivalent Series Resistance
−
4.9
−
nC
f = 1 MHz
−
0.9
−
W
VDD = 400 V, ID = 3 A,
VGS = 10 V, Rg = 4.7 W
(Note 4)
−
11
−
ns
−
9
−
ns
SWITCHING CHARACTERISTICS
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
−
29
−
ns
Turn-Off Fall Time
−
14
−
ns
Maximum Continuous Source to Drain Diode Forward Current
−
−
6
A
ISM
Maximum Pulsed Source to Drain Diode Forward Current
−
−
15
A
VSD
Source to Drain Diode Forward
Voltage
VGS = 0 V, ISD = 3 A
−
−
1.2
V
trr
Reverse Recovery Time
−
198
−
ns
Qrr
Reverse Recovery Charge
VDD = 400 V, ISD = 3 A,
dIF/dt = 100 A/ms
−
1.6
−
mC
tf
SOURCE-DRAIN DIODE CHARACTERISTICS
IS
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
4. Essentially independent of operating temperature typical characteristics.
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3
FCPF600N65S3R0L−F154
TYPICAL PERFORMANCE CHARACTERISTICS
30
*Notes:
1. VDS = 20V
2. 250m s Pulse Test
10
ID, Drain Current[A]
10
ID, Drain Current[A]
20
VGS = 10.0V
8.0V
7.0V
6.5V
6.0V
5.5V
1
0.1
o
150 C
o
25 C
1
o
−55 C
*Notes:
1. 250m s Pulse Test
o
2. TC = 25 C
0.01
0.2
1
VDS, Drain−Source Voltage[V]
0.1
10
3
Figure 1. On−Region Characteristics
VGS = 20V
0.4
3
6
9
ID, Drain Current [A]
o
0.1
o
−55 C
0.01
0.001
12
Capacitances [pF]
VGS, Gate−Source Voltage [V]
Ciss
1000
100
Coss
*Note:
1. VGS = 0V
2. f = 1MHz
Ciss = C gs + Cgd (C ds = shorted)
Coss = C ds + Cgd
Crss = Cgd
1
10
100
VDS, Drain−Source Voltage [V]
Crss
0.0
0.5
1.0
VSD, Body Diode Forward Voltage [V]
1.5
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current and
Temperature
*Note: ID = 3A
8
VDS = 130V
VDS = 400V
6
4
2
0
1000
o
25 C
10
0.1
0.1
9
150 C
1
10000
1
8
2. 250m s Pulse Test
10
Figure 3. On−Resistance Variation vs.
Drain Current and Gate Voltage
10
7
*Notes:
1. VGS = 0V
VGS = 10V
0
6
100
o
*Note: TC = 25 C
0.8
0.0
5
VGS, Gate−Source Voltage[V]
Figure 2. Transfer Characteristics
IS, Reverse Drain Current [A]
RDS(ON),
Drain−Source On−Resistance W
[]
1.2
4
Figure 5. Capacitance Characteristics
0
3
6
9
Qg, Total Gate Charge [nC]
12
Figure 6. Gate Charge Characteristics
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4
FCPF600N65S3R0L−F154
TYPICAL PERFORMANCE CHARACTERISTICS (Continued)
3.0
*Notes:
1. VGS = 0V
2. ID = 10mA
1.1
RDS(on), [Normalized]
Drain−Source On−Resistance
BVDSS, [Normalized]
Drain−Source Breakdown Voltage
1.2
1.0
0.9
0.8
−50
0
50
100
2.0
1.5
1.0
0.5
0.0
150
o
TJ, Junction Temperature [ C]
2.5
100
o
150
30m s
100m s
ID, Drain Current [A]
ID, Drain Current [A]
50
8
10
1ms
10ms
1
DC
Operation in This Area
is Limited by R DS(on)
0.1 *Notes:
o
1. TC = 25 C
2. TJ = 150oC
3. Single Pulse
1
10
100
VDS, Drain−Source Voltage [V]
2.5
2.0
1.5
1.0
0.5
130
260
390
520
VDS, Drain to Source Voltage [V]
4
2
25
50
75
100
125
o
TC, Case Temperature [ C]
150
Figure 10. Maximum Drain Current vs.
Case Temperature
3.0
0
6
0
1000
Figure 9. Maximum Safe Operating Area
EOSS [m J]
0
Figure 8. On−Resistance Variation vs.
Temperature
30
0
−50
TJ, Junction Temperature [ C]
Figure 7. Breakdown Voltage Variation
vs. Temperature
0.01
*Notes:
1. VGS = 10V
2. ID = 3A
650
Figure 11. Eoss vs. Drain to Source
Voltage
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5
FCPF600N65S3R0L−F154
r(t), NORMALIZED EFFECTIVE TRANSIENT
THERMAL RESISTANCE
TYPICAL PERFORMANCE CHARACTERISTICS (Continued)
2
1
0.1
DUTY CYCLE−DESCENDING ORDER
D = 0.5
0.2
0.1
0.05
0.02
0.01
PDM
t1
t2
0.01
0.001
−5
10
NOTES:
ZqJC(t) = r(t) x RqJC
RqJC = 5.29 oC/W
Peak T J = PDM x ZqJC(t) + TC
Duty Cycle, D = t1 / t2
SINGLE PULSE
−4
10
−3
10
−2
−1
10
10
0
10
t, RECTANGULAR PULSE DURATION (sec)
Figure 12. Transient Thermal Response Curve
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6
1
10
2
10
FCPF600N65S3R0L−F154
VGS
RL
Qg
VDS
VGS
Qgs
Qgd
DUT
IG = Const.
Charge
Figure 13. Gate Charge Test Circuit & Waveform
RL
VDS
VDS
90%
90%
90%
VDD
VGS
RG
VGS
DUT
VGS
10%
td(on)
10%
tr
tf
td(off)
ton
toff
Figure 14. Resistive Switching Test Circuit & Waveforms
L
E AS + 1 @ LI AS
2
VDS
BVDSS
ID
IAS
RG
VDD
DUT
VGS
2
ID(t)
VDD
VDS(t)
tp
tp
Figure 15. Unclamped Inductive Switching Test Circuit & Waveforms
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7
Time
FCPF600N65S3R0L−F154
+
DUT
VSD
−
ISD
L
Driver
RG
Same Type
as DUT
VGS
− dv/dt controlled by RG
− ISD controlled by pulse period
D+
VGS
(Driver)
VDD
Gate Pulse Width
Gate Pulse Period
10 V
IFM, Body Diode Forward Current
ISD
(DUT)
di/dt
IRM
Body Diode Reverse Current
Body Diode Recovery dv/dt
VDS
(DUT)
VDD
VSD
Body Diode
Forward Voltage Drop
Figure 16. Peak Diode Recovery dt/dt Test Circuit & Waveforms
SUPERFET is a registered trademark of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or
other countries.
www.onsemi.com
8
FCPF600N65S3R0L−F154
PACKAGE DIMENSIONS
TO−220 FULLPACK, 3−LEAD
CASE 221BN
ISSUE O
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
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