N-Channel UniFETTM MOSFET
500V, 16.5 A, 380 mΩ
Features
Description
UniFETTM MOSFET is ON Semiconductor’s high voltage
MOSFET family based on planar stripe and DMOS technology.
This MOSFET is tailored to reduce on-state resistance, and to
provide better switching performance and higher avalanche
energy strength. This device family is suitable for switching
power converter applications such as power factor correction
(PFC), flat panel display (FPD) TV power, ATX and electronic
lamp ballasts.
• RDS(on) = 380 mΩ (Max.) @ VGS = 10, ID = 8.3 A
• Low Gate Charge (Typ. 32 nC)
• Low Crss (Typ. 20 pF)
• 100% Avalanche Tested
Applications
• PDP TV
• Uninterruptible Power Supply
D
G
G
D
TO-3PN
S
S
Absolute Maximum Ratings
Symbol
TC = 25oC unless otherwise noted.
Parameter
VDSS
Drain-Source Voltage
ID
Drain Current
- Continuous (TC = 25°C)
- Continuous (TC = 100°C)
IDM
Drain Current
- Pulsed
VGSS
Gate-Source voltage
EAS
IAR
FDA16N50-F109
Unit
500
V
16.5
9.9
A
A
66
A
±30
V
Single Pulsed Avalanche Energy
(Note 2)
780
mJ
Avalanche Current
(Note 1)
16.5
A
EAR
Repetitive Avalanche Energy
(Note 1)
20.5
mJ
dv/dt
Peak Diode Recovery dv/dt
(Note 3)
4.5
V/ns
PD
Power Dissipation
205
2.1
W
W/°C
TJ, TSTG
Operating and Storage Temperature Range
-55 to +150
°C
TL
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
300
°C
FDA16N50-F109
Unit
(Note 1)
(TC = 25°C)
- Derate above 25°C
Thermal Characteristics
Symbol
Parameter
RθJC
Thermal Resistance, Junction-to-Case, Max.
0.6
RθJA
Thermal Resistance, Junction-to-Ambient, Max.
40
©2007 Semiconductor Components Industries, LLC.
September-2017, Rev. 3
1
°C/W
Publication Order Number:
FDA16N50-F109/D
FDA16N50-F109 — N-Channel UniFETTM MOSFET
FDA16N50-F109
Device Marking
Device
Package
Reel Size
Tape Width
Quantity
FDA16N50
FDA16N50-F109
TO-3PN
Tube
N/A
30 units
Electrical Characteristics TC = 25°C unless otherwise noted.
Symbol
Parameter
Conditions
Min.
Typ.
Max
Unit
500
--
--
V
Off Characteristics
BVDSS
Drain-Source Breakdown Voltage
VGS = 0V, ID = 250μA
ΔBVDSS
/ ΔTJ
Breakdown Voltage Temperature
Coefficient
ID = 250μA, Referenced to 25°C
--
0.5
--
V/°C
IDSS
Zero Gate Voltage Drain Current
VDS = 500V, VGS = 0V
VDS = 400V, TC = 125°C
---
---
1
10
μA
μA
IGSSF
Gate-Body Leakage Current, Forward
VGS = 30V, VDS = 0V
--
--
100
nA
IGSSR
Gate-Body Leakage Current, Reverse
VGS = -30V, VDS = 0V
--
--
-100
nA
3.0
--
5.0
V
On Characteristics
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250μA
RDS(on)
Static Drain-Source
On-Resistance
VGS = 10V, ID = 8.3A
--
0.31
0.38
Ω
gFS
Forward Transconductance
VDS = 40V, ID = 8.3A
--
23
--
S
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
VDS = 25V, VGS = 0V,
f = 1.0MHz
--
1495
1945
pF
--
235
310
pF
--
20
30
pF
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDD = 250V, ID = 16A
RG = 25Ω
(Note 4)
VDS = 400V, ID = 16A
VGS = 10V
(Note 4)
--
40
90
ns
--
150
310
ns
--
65
140
ns
--
80
170
ns
--
32
45
nC
--
8.5
--
nC
--
14
--
nC
9.2
A
Drain-Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain-Source Diode Forward Current
--
--
ISM
Maximum Pulsed Drain-Source Diode Forward Current
--
--
37
A
VSD
Drain-Source Diode Forward Voltage
VGS = 0V, IS = 16.5A
--
--
1.4
V
trr
Reverse Recovery Time
490
--
ns
Reverse Recovery Charge
VGS = 0V, IS = 16A
dIF/dt =100A/μs
--
Qrr
--
5.0
--
μC
NOTES:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 5.1mH, IAS = 16.5A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C
3. ISD ≤ 16.5A, di/dt ≤ 200A/μs, VDD ≤ BVDSS, Starting TJ = 25°C
4. Essentially Independent of Operating Temperature Typical Characteristics
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2
FDA16N50-F109 — N-Channel UniFETTM MOSFET
Package Marking and Ordering Information
Figure 1. On-Region Characteristics
VGS
15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
Bottom : 5.5 V
2
10
Top :
1
10
ID, Drain Current [A]
ID, Drain Current [A]
Figure 2. Transfer Characteristics
0
10
o
1
150 C
10
o
25 C
o
-55 C
* Notes :
1. VDS = 40V
* Notes :
1. 250μs Pulse Test
-1
10
2. 250μs Pulse Test
o
2. TC = 25 C
-1
0
10
0
10
2
1
10
10
4
6
8
10
12
VGS, Gate-Source Voltage [V]
VDS, Drain-Source Voltage [V]
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperatue
IDR, Reverse Drain Current [A]
RDS(ON) [Ω], Drain-Source On-Resistance
0.6
0.5
VGS = 10V
0.4
VGS = 20V
0.3
o
* Note : TJ = 25 C
0.2
1
10
o
150 C
o
25 C
2. 250μs Pulse Test
0
0
5
10
15
20
25
30
35
40
10
0.2
0.4
ID, Drain Current [A]
0.6
0.8
1.2
1.4
1.6
1.8
2.0
2.2
2.4
Figure 6. Gate Charge Characteristics
4000
12
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
3000
Coss
Ciss
* Note ;
1. VGS = 0 V
1000
2. f = 1 MHz
Crss
VGS, Gate-Source Voltage [V]
Crss = Cgd
2000
1.0
VSD, Source-Drain voltage [V]
Figure 5. Capacitance Characteristics
Capacitances [pF]
* Notes :
1. VGS = 0V
10
VDS = 100V
8
VDS = 400V
VDS = 250V
6
4
2
* Note : ID = 16A
0
-1
10
0
10
1
10
0
0
VDS, Drain-Source Voltage [V]
10
20
QG, Total Gate Charge [nC]
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3
30
40
FDA16N50-F109 — N-Channel UniFETTM MOSFET
Typical Characteristics
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
3.0
1.1
1.0
* Notes :
1. VGS = 0 V
0.9
2. ID = 250 μA
0.8
-100
2.5
RDS(ON), (Normalized)
Drain-Source On-Resistance
BVDSS, (Normalized)
Drain-Source Breakdown Voltage
1.2
2.0
1.5
1.0
* Notes :
1. VGS = 10 V
0.5
2. ID = 8.3 A
-50
0
50
100
150
0.0
-100
200
o
TJ, Junction Temperature [ C]
-50
0
50
100
150
200
o
TJ, Junction Temperature [ C]
Figure 9. Maximum Safe Operating Area
Figure 10. Maximum Drain Current
vs. Case Temperature
20
2
10
Operation in This Area
is Limited by R DS(on)
0
10
15
ID, Drain Current [A]
1
10
* Notes :
-1
10
o
10
5
1. TC = 25 C
o
2. TJ = 150 C
3. Single Pulse
-2
0
10
1
0
25
2
10
10
50
75
100
TC, Case Temperature [ C]
Figure 11. Transient Thermal Response Curve
10
0
D = 0 .5
10
0 .2
-1
0 .1
0 .0 5
* N o te s :
0 .0 2
0 .0 1
10
o
10
1 . Z θ J C (t) = 0 .6 C /W M a x .
2 . D u ty F a c to r, D = t 1 /t 2
3 . T J M - T C = P D M * Z θ J C (t)
s in g le p u ls e
-2
-5
10
-4
125
o
VDS, Drain-Source Voltage [V]
θJC
10
o
ZθJC
Z (t),
(t),Thermal
ThermalResponse
Response[ C/W]
ID, Drain Current [A]
10 μs
100 μs
1 ms
10 ms
100 ms
DC
10
-3
10
-2
10
-1
t 1 , S q u a re W a v e P u ls e D u ra tio n [s e c ]
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4
10
0
10
1
150
FDA16N50-F109 — N-Channel UniFETTM MOSFET
Typical Characteristics (Continued)
FDA16N50-F109 — N-Channel UniFETTM MOSFET
Figure 12. Gate Charge Test Circuit & Waveform
IG = const.
Figure 13. Resistive Switching Test Circuit & Waveforms
VDS
RG
V
10V
GS
RL
VDS
90%
VDD
VGS
DUT
VGS
10%
td(on)
tr
t on
td(off)
t off
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms
VGS
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5
tf
DUT
+
VDS
_
I SD
L
Driver
RG
VGS
VGS
( Driver )
I SD
( DUT )
Same Type
as DUT
VDD
• dv/dt controlled by RG
• ISD controlled by pulse period
Gate Pulse Width
D = -------------------------Gate Pulse Period
10V
IFM , Body Diode Forward Current
di/dt
IRM
Body Diode Reverse Current
VDS
( DUT )
Body Diode Recovery dv/dt
VSD
Body Diode
Forward Voltage Drop
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6
VDD
FDA16N50-F109 — N-Channel UniFETTM MOSFET
Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
FDA16N50-F109 — N-Channel UniFETTM MOSFET
Mechanical Dimensions
Figure 16. TO3PN, 3-Lead, Plastic, EIAJ SC-65
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