FDB2570

FDB2570

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    SOT404

  • 描述:

    FDB2570

  • 数据手册
  • 价格&库存
FDB2570 数据手册
FDP2570/FDB2570 150V N-Channel PowerTrench MOSFET General Description Features This N-Channel MOSFET has been designed specifically for switching on the primary side in the isolated DC/DC converter application. Any application requiring a 150V MOSFETs with low on-resistance and fast switching will benefit. • 22 A, 150 V. These MOSFETs feature faster switching and lower gate charge than other MOSFETs with comparable RDS(ON) specifications. • Fast switching speed RDS(ON) = 80 mΩ @ VGS = 10 V RDS(ON) = 90 mΩ @ VGS = 6 V • Low gate charge (40nC typical) • High performance trench technology for extremely low RDS(ON) The result is a MOSFET that is easy and safer to drive (even at very high frequencies), and DC/DC power supply designs with higher overall efficiency. • 175°C maximum junction temperature rating D D G G D G S TO-220 TO-263AB FDP Series S FDB Series Absolute Maximum Ratings Symbol S TA=25oC unless otherwise noted Ratings Units VDSS Drain-Source Voltage Parameter 150 V VGSS Gate-Source Voltage ± 20 V ID Drain Current A – Continuous (Note 1) 22 – Pulsed (Note 1) 50 A 93 W PD Total Power Dissipation @ TC = 25°C TJ, TSTG Operating and Storage Junction Temperature Range Derate above 25°C 0.63 W°/C –65 to +175 °C Thermal Characteristics RθJC Thermal Resistance, Junction-to-Case 1.6 °C/W RθJA Thermal Resistance, Junction-to-Ambient 62.5 °C/W Package Marking and Ordering Information Device Marking Device Reel Size Tape width Quantity FDB2570 FDB2570 13’’ 24mm 800 units FDP2570 FDP2570 Tube n/a 45 units 2001 Fairchild Semiconductor Corporation FDP2570/FDB2570 Rev C(W) FDP2570/FDB2570 August 2001 Symbol TA = 25°C unless otherwise noted Parameter Test Conditions Min Typ Max Units Drain-Source Avalanche Ratings (Note 1) WDSS IAR Single Pulse Drain-Source Avalanche Energy Maximum Drain-Source Avalanche Current VDD = 75 V, ID = 11 A 375 mJ 11 A Off Characteristics BVDSS Drain–Source Breakdown Voltage VGS = 0 V, ID = 250 µA ∆BVDSS ∆TJ IDSS Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current ID = 250 µA, Referenced to 25°C VDS = 120 V, VGS = 0 V 1 µA IGSSF Gate–Body Leakage, Forward VGS = 20 V, VDS = 0 V 100 nA IGSSR Gate–Body Leakage, Reverse VGS = –20 V, VDS = 0 V –100 nA 4 V On Characteristics 150 V 154 mV/°C (Note 2) VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250 µA ∆VGS(th) ∆TJ RDS(on) Gate Threshold Voltage Temperature Coefficient Static Drain–Source On–Resistance ID = 250 µA, Referenced to 25°C –7 VGS = 10 V, ID = 11 A ID = 10 A VGS = 6.0 V, VGS = 10 V, ID = 11 A, TJ = 125°C 61 63 127 ID(on) On–State Drain Current VGS = 10 V, VDS = 10 V gFS Forward Transconductance VDS = 10 V, ID = 11 A VDS = 75 V, f = 1.0 MHz V GS = 0 V, 2 2.6 mV/°C 80 90 175 25 mΩ A 39 S Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance Switching Characteristics td(on) Turn–On Delay Time tr Turn–On Rise Time td(off) Turn–Off Delay Time tf Turn–Off Fall Time Qg Total Gate Charge Qgs Gate–Source Charge Qgd Gate–Drain Charge 1911 pF 106 pF 33 pF (Note 2) VDD = 75 V, VGS = 10 V, VDS = 75 V, VGS = 10 V ID = 1 A, RGEN = 6 Ω ID = 11 A, 12 22 5 10 ns ns 33 53 ns 23 37 ns 40 56 nC 7 nC 12 nC Drain–Source Diode Characteristics and Maximum Ratings IS VSD Maximum Continuous Drain–Source Diode Forward Current Drain–Source Diode Forward VGS = 0 V, IS = 11 A Voltage (Note 2) 0.83 22 A 1.3 V Notes: 1. Calculated continuous current based on maximum allowable junction temperature. 2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0% FDP2570/FDB2570 Rev C(W) FDP2570/FDB2570 Electrical Characteristics FDP2570/FDB2570 Typical Characteristics 1.6 ID, DRAIN CURRENT (A) VGS = 10V RDS(ON), NORMALIZED DRAIN-SOURCE ON-RESISTANCE 50 5.0V 4.5V 40 30 20 4.0V 10 1.4 VGS = 4.0V 4.5V 1.2 5.0V 10V 1 0.8 0 0 3 6 9 12 0 15 5 10 Figure 1. On-Region Characteristics. 20 25 30 Figure 2. On-Resistance Variation with Drain Current and Gate Voltage. 2.9 0.35 ID = 5.5 A ID = 11 A VGS = 10V 2.5 RDS(ON), ON-RESISTANCE (OHM) RDS(ON), NORMALIZED DRAIN-SOURCE ON-RESISTANCE 15 ID, DRAIN CURRENT (A) VDS, DRAIN-SOURCE VOLTAGE (V) 2.1 1.7 1.3 0.9 0.5 0.3 0.25 0.2 TA = 125oC 0.15 0.1 TA = 25oC 0.05 0.1 -65 -35 -5 25 55 85 115 145 0 175 3 o TJ, JUNCTION TEMPERATURE ( C) Figure 3. On-Resistance Variation with Temperature. 5 6 7 8 VGS, GATE TO SOURCE VOLTAGE (V) 9 10 Figure 4. On-Resistance Variation with Gate-to-Source Voltage. 100 IS, REVERSE DRAIN CURRENT (A) 50 VDS = 50V ID, DRAIN CURRENT (A) 4 40 30 20 TA = 125oC 25oC 10 -55oC 2.5 3 3.5 4 TA = 125oC 1 25oC 0.1 -55oC 0.01 0.001 0.0001 0 2 VGS = 0V 10 4.5 VGS, GATE TO SOURCE VOLTAGE (V) Figure 5. Transfer Characteristics. 5 0 0.2 0.4 0.6 0.8 1 1.2 VSD, BODY DIODE FORWARD VOLTAGE (V) Figure 6. Body Diode Forward Voltage Variation with Source Current and Temperature. FDP2570/FDB2570 Rev C(W) FDP2570/FDB2570 Typical Characteristics 3000 VDS = 25V ID = 11A 50V f = 1MHz VGS = 0 V 2500 8 CAPACITANCE (pF) VGS, GATE-SOURCE VOLTAGE (V) 10 75V 6 4 CISS 2000 1500 1000 COSS 2 500 CRSS 0 0 0 6 12 18 24 30 36 0 42 20 Figure 7. Gate Charge Characteristics. 80 100 120 P(pk), PEAK TRANSIENT POWER (W) 2000 RDS(ON) LIMIT ID, DRAIN CURRENT (A) 60 Figure 8. Capacitance Characteristics. 100 10us 100us 1ms 10ms 100ms 10 DC VGS = 10V SINGLE PULSE RθJC = 1.6oC/W 1 TA = 25oC 0.1 1 10 100 1000 SINGLE PULSE RθJA = 1.6°C/W TA = 25°C 1500 1000 500 0 0.00001 0.0001 0.001 0.01 0.1 1 t1, TIME (sec) VDS, DRAIN-SOURCE VOLTAGE (V) Figure 9. Maximum Safe Operating Area. r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE 40 VDS, DRAIN TO SOURCE VOLTAGE (V) Qg, GATE CHARGE (nC) Figure 10. Single Pulse Maximum Power Dissipation. 1 D = 0.5 RθJA(t) = r(t) * RθJC RθJC = 1.6 °C/W 0.2 0.1 P(pk) 0.1 t1 0.05 t2 TJ - TA = P * RθJC(t) Duty Cycle, D = t1 / t2 0.02 0.01 SINGLE PULSE 0.01 0.00001 0.0001 0.001 0.01 0.1 1 Figure 11. Transient Thermal Response Curve. Thermal characterization performed using the conditions described in Note 1. Transient thermal response will change depending on the circuit board design. FDP2570/FDB2570 Rev C(W) TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. ACEx™ Bottomless™ CoolFET™ CROSSVOLT™ DenseTrench™ DOME™ EcoSPARK™ E2CMOSTM EnSignaTM FACT™ FACT Quiet Series™ FAST  FASTr™ FRFET™ GlobalOptoisolator™ GTO™ HiSeC™ ISOPLANAR™ LittleFET™ MicroFET™ MICROWIRE™ OPTOLOGIC™ OPTOPLANAR™ PACMAN™ POP™ Power247™ PowerTrench  QFET™ QS™ QT Optoelectronics™ Quiet Series™ SILENT SWITCHER  SMART START™ STAR*POWER™ Stealth™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic™ TruTranslation™ UHC™ UltraFET  VCX™ STAR*POWER is used under license DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component is any component of a life 1. Life support devices or systems are devices or support device or system whose failure to perform can systems which, (a) are intended for surgical implant into be reasonably expected to cause the failure of the life the body, or (b) support or sustain life, or (c) whose support device or system, or to affect its safety or failure to perform when properly used in accordance with instructions for use provided in the labeling, can be effectiveness. reasonably expected to result in significant injury to the user. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only. Rev. H3
FDB2570 价格&库存

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