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FDD86252
N-Channel Shielded Gate PowerTrench® MOSFET
150 V, 27 A, 52 mΩ
Features
General Description
This N-Channel MOSFET is produced using Fairchild
Semiconductor‘s advanced PowerTrench® process that
incorporates Shielded Gate technology. This process has been
optimized for the on-state resistance and yet maintain superior
switching performance.
Shielded Gate MOSFET Technology
Max rDS(on) = 52 mΩ at VGS = 10 V, ID = 5 A
Max rDS(on) = 72 mΩ at VGS = 6 V, ID = 4 A
100% UIL tested
Application
RoHS Compliant
DC - DC Conversion
D
D
G
S
G
D
-P-2A52
K
TO
(T O -252)
S
MOSFET Maximum Ratings TC = 25 °C unless otherwise noted
Symbol
VDS
Drain to Source Voltage
Parameter
VGS
Gate to Source Voltage
Drain Current -Continuous
TC = 25 °C
-Continuous
TA = 25 °C
ID
-Pulsed
Single Pulse Avalanche Energy
EAS
PD
TJ, TSTG
TC = 25 °C
Power Dissipation
TA = 25 °C
Units
V
±20
V
27
(Note 1a)
5
(Note 4)
30
(Note 3)
Power Dissipation
Ratings
150
72
89
(Note 1a)
Operating and Storage Junction Temperature Range
3.1
-55 to +150
A
mJ
W
°C
Thermal Characteristics
RθJC
Thermal Resistance, Junction to Case
RθJA
Thermal Resistance, Junction to Ambient
1.4
(Note 1a)
40
°C/W
Package Marking and Ordering Information
Device Marking
FDD86252
Device
FDD86252
©2012 Fairchild Semiconductor Corporation
FDD86252 Rev.1.6
Package
D-PAK(TO-252)
1
Reel Size
13 ’’
Tape Width
16 mm
Quantity
2500 units
www.fairchildsemi.com
FDD86252 N-Channel Shielded Gate PowerTrench® MOSFET
March 2015
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
Off Characteristics
BVDSS
Drain to Source Breakdown Voltage
ID = 250 μA, VGS = 0 V
ΔBVDSS
ΔTJ
Breakdown Voltage Temperature
Coefficient
ID = 250 μA, referenced to 25 °C
IDSS
Zero Gate Voltage Drain Current
VDS = 120 V, VGS = 0 V
1
μA
IGSS
Gate to Source Leakage Current
VGS = ±20 V, VDS = 0 V
±100
nA
4.0
V
150
V
104
mV/°C
On Characteristics
VGS(th)
Gate to Source Threshold Voltage
VGS = VDS, ID = 250 μA
ΔVGS(th)
ΔTJ
Gate to Source Threshold Voltage
Temperature Coefficient
ID = 250 μA, referenced to 25 °C
-10
VGS = 10 V, ID = 5 A
41
rDS(on)
Static Drain to Source On Resistance
VGS = 6 V, ID = 4 A
49
72
VGS = 10 V, ID = 5 A,TJ = 125 °C
81
103
VDS = 10 V, ID = 5 A
15
gFS
Forward Transconductance
2.0
3.1
mV/°C
52
mΩ
S
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate Resistance
VDS = 75 V, VGS = 0 V,
f = 1 MHz
741
985
pF
78
130
pF
4.2
10
pF
Ω
0.4
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Rise Time
td(off)
Turn-Off Delay Time
tf
Fall Time
VDD = 75 V, ID = 5 A,
VGS = 10 V, RGEN = 6 Ω
Qg
Total Gate Charge
VGS = 0 V to 10 V
Qg
Total Gate Charge
VGS = 0 V to 5 V
Qgs
Gate to Source Charge
Qgd
Gate to Drain “Miller” Charge
VDD = 75 V,
ID = 5 A
8.3
17
ns
1.8
10
ns
14
25
ns
3
10
ns
11.3
16
nC
6.3
9
nC
3.4
nC
2.6
nC
Drain-Source Diode Characteristics
VSD
Source-Drain Diode Forward Voltage
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
VGS = 0 V, IS = 5 A
(Note 2)
0.80
1.3
VGS = 0 V, IS = 2.6 A
(Note 2)
0.77
1.2
IF = 5 A, di/dt = 100 A/μs
V
60
97
ns
72
115
nC
Notes:
1: RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins.
RθJC is guaranteed by design while RθJA is determined by the user’s board design.
a) 40 °C/W when mounted on a
1 in2 pad of 2 oz copper
b) 96 °C/W when mounted on
a minimum pad
2: Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%.
3: Starting TJ = 25 °C, L = 1 mH, IAS = 12 A, VDD = 135 V, VGS = 10 V.
4: Pulsed Drain current is tested at 300 μs with 2% duty cycle. For repetitive pulses, the pulse width is limited by the maximum junction temperature.
©2012 Fairchild Semiconductor Corporation
FDD86252 Rev.1.6
2
www.fairchildsemi.com
FDD86252 N-Channel Shielded Gate PowerTrench® MOSFET
Electrical Characteristics TJ = 25 °C unless otherwise noted
4
VGS = 10 V
VGS = 6 V
25
ID, DRAIN CURRENT (A)
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
30
VGS = 5.5 V
VGS = 6.5 V
20
15
VGS = 5 V
10
5
0
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
0
1
2
3
4
5
VGS = 5 V
3
VGS = 5.5 V
2
VGS = 6 V
1
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
0
0
5
10
Figure 1. On-Region Characteristics
rDS(on), DRAIN TO
1.6
1.4
1.2
1.0
0.8
0.6
SOURCE ON-RESISTANCE (mΩ)
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
1.8
-50
IS, REVERSE DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
15
TJ = 150 oC
10
TJ = 25 oC
5
TJ = -55 oC
3
4
TJ = 125 oC
100
50
TJ = 25 oC
5
6
7
8
9
5
6
10
1
TJ = 150 oC
TJ = 25 oC
0.1
TJ = -55 oC
0.01
0.001
0.0
7
VGS = 0 V
0.2
0.4
0.6
0.8
1.0
VGS, GATE TO SOURCE VOLTAGE (V)
VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 5. Transfer Characteristics
Figure 6. Source to Drain Diode
Forward Voltage vs Source Current
©2012 Fairchild Semiconductor Corporation
FDD86252 Rev.1.6
10
30
VDS = 5 V
2
150
Figure 4. On-Resistance vs Gate to
Source Voltage
20
0
200
VGS, GATE TO SOURCE VOLTAGE (V)
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
25
30
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
ID = 5 A
0
4
-25
0
25 50 75 100 125 150
TJ, JUNCTION TEMPERATURE (oC)
Figure 3. Normalized On- Resistance
vs Junction Temperature
30
25
250
2.0
0.4
-75
20
Figure 2. Normalized On-Resistance
vs Drain Current and Gate Voltage
ID = 5 A
VGS = 10 V
2.2
15
VGS = 10 V
ID, DRAIN CURRENT (A)
VDS, DRAIN TO SOURCE VOLTAGE (V)
2.4
VGS = 6.5 V
3
1.2
www.fairchildsemi.com
FDD86252 N-Channel Shielded Gate PowerTrench® MOSFET
Typical Characteristics TJ = 25 °C unless otherwise noted
1000
ID = 5 A
Ciss
VDD = 50 V
8
CAPACITANCE (pF)
VGS, GATE TO SOURCE VOLTAGE (V)
10
VDD = 75 V
6
VDD = 100 V
4
100
Coss
10
2
0
0
3
6
9
1
0.1
12
1
Figure 7. Gate Charge Characteristics
100
Figure 8. Capacitance vs Drain
to Source Voltage
30
ID, DRAIN CURRENT (A)
50
IAS, AVALANCHE CURRENT (A)
10
VDS, DRAIN TO SOURCE VOLTAGE (V)
Qg, GATE CHARGE (nC)
TJ = 25 oC
10
TJ = 100 oC
TJ = 125 oC
25
VGS = 10 V
20
VGS = 6 V
15
10
5
o
RθJC = 1.4 C/W
1
0.001
0.01
0.1
1
0
25
10
75
100
125
150
TC, CASE TEMPERATURE ( C)
Figure 9. Unclamped Inductive
Switching Capability
Figure 10. Maximum Continuous Drain
Current vs Case Temperature
5000
P(PK), PEAK TRANSIENT POWER (W)
50
10
100 μs
THIS AREA IS
LIMITED BY rDS(on)
SINGLE PULSE
TJ = MAX RATED
1
RθJC = 1.4 oC/W
1 ms
TC = 25 oC
10 ms
0.1
0.05
50
o
tAV, TIME IN AVALANCHE (ms)
ID, DRAIN CURRENT (A)
Crss
f = 1 MHz
VGS = 0 V
DC
1
10
100
400
TC = 25 oC
1000
100
50 -5
10
-4
10
-3
10
-2
10
-1
10
1
t, PULSE WIDTH (sec)
VDS, DRAIN to SOURCE VOLTAGE (V)
Figure 11. Forward BiasSafe
Operating Area
©2012 Fairchild Semiconductor Corporation
FDD86252 Rev.1.6
SINGLE PULSE
RθJC = 1.4 oC/W
Figure 12. Single Pulse Maximum
Power Dissipation
4
www.fairchildsemi.com
FDD86252 N-Channel Shielded Gate PowerTrench® MOSFET
Typical Characteristics TJ = 25 °C unless otherwise noted
2
NORMALIZED THERMAL
IMPEDANCE, ZθJC
1
0.1
DUTY CYCLE-DESCENDING ORDER
D = 0.5
0.2
0.1
0.05
0.02
0.01
PDM
t1
t2
SINGLE PULSE
NOTES:
DUTY FACTOR: D = t1/t2
PEAK TJ = PDM x ZθJC x RθJc + TC
o
RθJC = 1.4 C/W
0.01
-5
10
-4
10
-3
-2
10
10
-1
10
1
t, RECTANGULAR PULSE DURATION (sec)
Figure 13. Junction-to-Case Transient Thermal Response Curve
©2012 Fairchild Semiconductor Corporation
FDD86252 Rev.1.6
5
www.fairchildsemi.com
FDD86252 N-Channel Shielded Gate PowerTrench® MOSFET
Typical Characteristics TJ = 25 °C unless otherwise noted
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
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