FDH055N15A

FDH055N15A

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    TO-247

  • 描述:

    此 N 沟道 MOSFET 是使用先进的 PowerTrench 工艺生产的,适用于最大程度降低导通电阻,同时保持出色的开关性能。

  • 数据手册
  • 价格&库存
FDH055N15A 数据手册
MOSFET – N-Channel, POWERTRENCH 150 V, 167 A, 5.9 mW FDH055N15A Description This N−Channel MOSFET is produced using ON Semiconductor’s advanced POWERTRENCH® process that has been tai−lored to minimize the on−state resistance while maintaining superior switching performance. Features • • • • • • RDS(on) = 4.8 mW (Typ.) @ VGS = 10 V, ID = 120 A Fast Switching Speed Low Gate Charge High Performance Trench Technology for Extremely Low RDS(on) High Power and Current Handling Capability This Device is Pb−Free and is RoHS Compliant www.onsemi.com VDS RDS(ON) MAX ID MAX 150 V 5.9 mW @ 10 V 167 A Applications • • • • Synchronous Rectification for ATX / Sever / Telecom PSU Battery Protection Circuit Motor Drives and Uninterruptible Power Supplies Micro Solar Inverter N-CHANNEL MOSFET G D S TO−247−3LD CASE 340CK MARKING DIAGRAM $Y&Z&3&K FDH 055N15A $Y &Z &3 &K FDH055N15A = ON Semiconductor Logo = Assembly Plant Code = Numeric Date Code = Lot Code = Specific Device Code ORDERING INFORMATION See detailed ordering and shipping information on page 2 of this data sheet. © Semiconductor Components Industries, LLC, 2011 October, 2020 − Rev. 4 1 Publication Order Number: FDH055N15A/D FDH055N15A ABSOLUTE MAXIMUM RATINGS (TC = 25°C unless otherwise noted) Symbol Parameter VDSS Drain to Source Voltage VGSS Gate to Source Voltage ID Drain Current Value Unit 150 V − DC ±20 V − AC (f > 1 Hz) ±30 − Continuous (TC = 25°C, Silicon Limited) 167 (Note 1) − Continuous (TC = 100°C, Silicon Limited) 118 − Continuous (TC = 25°C, Package Limited) 156 − Pulsed (Note 2) 668 A IDM Drain Current EAS Single Pulsed Avalanche Energy (Note 3) 835 mJ dv/dt Peak Diode Recovery dv/dt (Note 4) 6.0 V/ns (TC = 25°C) 429 W − Derate above 25°C 2.86 W/°C −55 to + 175 °C 300 °C PD TJ, TSTG TL Power Dissipation Operating and Storage Temperature Range Maximum Lead Temperature for Soldering, 1/8″ from Case for 5 Second A Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Calculated continuous current based on maximum allowable junction temperature, Package limitation current is 156 A. 2. Repetitive Rating: Pulse width limited by maximum junction temperature. 3. Starting TJ = 25°C, L = 3 mH, IAS = 23.6 A 4. ISD ≤ 120 A, di/dt ≤ 200 A/s, VDD ≤ BVDSS, Starting TJ = 25 °C. THERMAL CHARACTERISTICS Symbol Parameter RqJC Thermal Resistance, Junction to Case, Max. RqJA Thermal Resistance, Junction to Ambient, Max. FDH055N15A Unit 0.35 °C/W 40 PACKAGE MARKING AND ORDERING INFORMATION Part Number Top Mark Package Package Method Reel Size Tape Width Quantity FDH055N15A FDH055N15A TO−247−3LD Tube N/A N/A 30 Units www.onsemi.com 2 FDH055N15A ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted) Symbol Parameter Test Condition Min. Typ. Max. Unit 150 − − V OFF CHARACTERISTICS Drain to Source Breakdown Voltage ID = 250 mA, VGS = 0 V DBVDSS / DTJ Breakdown Voltage Temperature Coefficient ID = 250 mA, Referenced to 25°C − 0.1 − V/°C IDSS Zero Gate Voltage Drain Current VDS = 120 V, VGS = 0 V − − 1 mA VDS = 120 V, TC = 150°C − − 500 VGS = ±20 V, VDS = 0 V − − ±100 BVDSS IGSS Gate to Body Leakage Current nA ON CHARACTERISTICS VGS(th) Gate Threshold Voltage VGS = VDS, ID = 250 mA 2.0 − 4.0 V RDS(on) Static Drain to Source On Resistance VGS = 10 V, ID = 120 A − 4.8 5.9 mW Forward Transconductance VDS = 10 V, ID = 120 A − 219 − S VDS = 75 V, VGS = 0 V, f = 1 MHz − 7100 9445 pF − 664 885 pF gFS DYNAMIC CHARACTERISTICS Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance − 23 35 pF Coss(er) Energy Related Output Capacitance VDS = 75 V, VGS = 0 V − 1159 − pF Qg(tot) Total Gate Charge at 10 V VDS = 75 V, ID = 120 A, VGS = 10 V (Note 5) − 92 − nC − 31 − nC Qgs Gate to Source Gate Charge Qgs2 Gate Charge Threshold to Plateau − 15 − nC Qgd Gate to Drain “Miller” Charge − 16 − nC ESR Equivalent Series Resistance(G−S) f = 1 MHz − 1.2 − W VDD = 75 V, ID = 120 A, VGS = 10 V, RG = 4.7 W (Note 5) − 35 80 ns − 67 144 ns SWITCHING CHARACTERISTICS td(on) Turn-On Delay Time tr Turn−On Rise Time td(off) Turn-Off Delay Time − 71 152 ns Turn−Off Fall Time − 21 52 ns Maximum Continuous Drain to Source Diode Forward Current − − 167 (Note 1) A ISM Maximum Pulsed Drain to Source Diode Forward Current − − 668 A VSD tf DRAIN-SOURCE DIODE CHARACTERISTICS IS Drain to Source Diode Forward Voltage VGS = 0 V, ISD = 120 A − − 1.25 V trr Reverse Recovery Time − 105 − ns Qrr Reverse Recovery Charge VGS = 0 V, ISD = 120 A, VDS = 75 V, dIF/dt = 100 A/ms − 342 − nC Qrr Reverse Recovery Charge VGS = 0 V, ISD = 30 A, VDS = 75 V, dIF/dt = 100 A/ms − 348 − nC Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 5. Essentially Independent of Operating Temperature Typical Characteristics. www.onsemi.com 3 FDH055N15A TYPICAL CHARACTERISTICS 500 VGS = 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V 100 5.5 V 5.0 V ID, Drain Current [A] ID, Drain Current [A] 500 100 1 −55°C 1 4 2 6 5 500 IS, Reverse Drain Current [A] RDS(ON) [mW], Drain−Source On−Resistance 6.5 6.0 5.5 VGS = 10 V 5.0 VGS = 20 V 4.5 100 175°C 50 25°C 10 *Note: TC = 25°C 0 1 0.2 100 150 200 250 300 350 400 450 *Notes: 1. VGS = 0 V 2. 250 ms Pulse Test 0.4 0.6 0.8 1.0 1.2 1.4 VSD, Body Diode Forward Voltage [V] ID, Drain Current [A] Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperature Figure 3. On−Resistance Variation vs. Drain Current and Gate Voltage 10000 10 VGS, Gate−Source Voltage [V] Ciss Capacitance [pF] 4 Figure 2. Transfer Characteristics Figure 1. On−Region Characteristics 1000 Coss *Notes: 100 1. VGS = 0 V 2. f = 1 MHz 10 3 VGS, Gate−Source Voltage [V] VDS, Drain−Source Voltage [V] 4.0 25°C 175°C 10 *Notes: 1. 250 ms Pulse Test 2. TC = 25°C 10 0.1 *Notes: 1. VDS = 10 V 2. 250 ms Pulse Test Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd 0.1 1 Crss 10 6 4 2 0 100 200 VDS = 30 V VDS = 75 V VDS = 120 V 8 *Note: ID = 120 A 0 25 50 75 100 QG, Total Gate Charge [nC] VDS, Drain−Source Voltage [V] Figure 6. Gate Charge Characteristics Figure 5. Capacitance Characteristics www.onsemi.com 4 FDH055N15A TYPICAL CHARACTERISTICS (continued) 2.8 RDS(ON), (Normalized) Drain−Source On−Resistance BVDSS, (Normalized) Drain−Source Breakdown Voltage 1.15 1.10 1.05 1.00 *Notes: 1. VGS = 0 V 2. ID = 250 mA 0.95 0.90 −100 −50 0 50 100 150 2.4 2.0 1.6 1.2 0.4 −100 200 *Notes: 1. VGS = 10 V 2. ID = 120 A 0.8 −50 0 50 100 150 200 TJ, Junction Temperature [°C] TJ, Junction Temperature [°C] Figure 8. On−Resistance Variation vs. Temperature Figure 7. Breakdown Voltage Variation vs. Temperature 1000 180 1 ms 10 Operation in This Area 1 is Limited by RDS(on) 10 ms DC *Notes: 1. TC = 25°C 2. TJ = 175°C 3. Single Pulse 0.1 0.01 ID, Drain Current [A] 100 ms 100 1 135 VGS = 10 V 90 Limited by Package 45 10 100 0 200 RqJC = 0.35°C/W 25 50 75 6 4 2 0 125 150 175 Figure 10. Maximum Drain Current vs. Case Temperature 8 0 100 TC, Case Temperature [°C] VDS, Drain−Source Voltage [V] Figure 9. Maximum Safe Operating Area Eoss, [mJ] ID, Drain Current [A] 10 ms 30 60 90 120 150 VDS, Drain to Source [V] Figure 11. Eoss vs. Drain to Source Voltage www.onsemi.com 5 FDH055N15A ZqJC(t), Thermal Response [°C/W] TYPICAL CHARACTERISTICS (continued) 1 0.5 0.1 0.2 0.1 0.05 0.02 0.01 0.01 Single Pulse 0.001 10−5 10−4 P DM t 1 t 2 *Notes: 1. ZqJC(t) = 0.35°C/W Max. 2. Duty Factor, D = t1/t2 3. TJM − TC = PDM * ZqJC(t) 10−3 10−2 10−1 t1, Rectangular Pulse Duration [sec] Figure 12. Transient Thermal Response Curve www.onsemi.com 6 1 FDH055N15A VGS RL Qg VDS VGS Qgs Qgd DUT IG = const. Charge Figure 13. Gate Charge Test Circuit & Waveform RL VDS VDS 90% VDD VGS RG VGS DUT VGS 10% td(on) td(off) t f tr ton toff Figure 14. Resistive Switching Test Circuit & Waveforms L E AS + 1 LI AS 2 VDS BVDSS ID IAS RG VDD DUT VGS 2 ID(t) VDD VDS(t) tp tp Figure 15. Unclamped Inductive Switching Test Circuit & Waveforms www.onsemi.com 7 Time FDH055N15A + DUT VDS − ISD L Driver RG Same Type as DUT VGS − dv/dt controlled by RG − ISD controlled by pulse period D+ VGS (Driver) VDD Gate Pulse Width Gate Pulse Period 10 V IFM, Body Diode Forward Current ISD (DUT) di/dt IRM Body Diode Reverse Current Body Diode Recovery dv/dt VDS (DUT) VDD VSD Body Diode Forward Voltage Drop Figure 16. Peak Diode Recovery dv/dt Test Circuit & Waveforms POWERTRENCH is a registered trademark of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other countries. www.onsemi.com 8 MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS TO−247−3LD SHORT LEAD CASE 340CK ISSUE A A DATE 31 JAN 2019 A E P1 P A2 D2 Q E2 S B D 1 2 D1 E1 2 3 L1 A1 L b4 c (3X) b 0.25 M (2X) b2 B A M DIM (2X) e GENERIC MARKING DIAGRAM* AYWWZZ XXXXXXX XXXXXXX XXXX = Specific Device Code A = Assembly Location Y = Year WW = Work Week ZZ = Assembly Lot Code *This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G” or microdot “G”, may or may not be present. Some products may not follow the Generic Marking. DOCUMENT NUMBER: DESCRIPTION: 98AON13851G TO−247−3LD SHORT LEAD A A1 A2 b b2 b4 c D D1 D2 E E1 E2 e L L1 P P1 Q S MILLIMETERS MIN NOM MAX 4.58 4.70 4.82 2.20 2.40 2.60 1.40 1.50 1.60 1.17 1.26 1.35 1.53 1.65 1.77 2.42 2.54 2.66 0.51 0.61 0.71 20.32 20.57 20.82 13.08 ~ ~ 0.51 0.93 1.35 15.37 15.62 15.87 12.81 ~ ~ 4.96 5.08 5.20 ~ 5.56 ~ 15.75 16.00 16.25 3.69 3.81 3.93 3.51 3.58 3.65 6.60 6.80 7.00 5.34 5.46 5.58 5.34 5.46 5.58 Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 1 OF 1 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2018 www.onsemi.com ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Email Requests to: orderlit@onsemi.com ON Semiconductor Website: www.onsemi.com ◊ TECHNICAL SUPPORT North American Technical Support: Voice Mail: 1 800−282−9855 Toll Free USA/Canada Phone: 011 421 33 790 2910 www.onsemi.com 1 Europe, Middle East and Africa Technical Support: Phone: 00421 33 790 2910 For additional information, please contact your local Sales Representative
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