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FDMD86100
Dual N-Channel Shielded Gate PowerTrench® MOSFET
100 V, 39 A, 10.5 mΩ
Features
General Description
Common source configuration to eliminate PCB routing
This package integrates two N-Channel devices connected
internally in common-source configuration and incorporates
Shielded Gate technology. This enables very low package
parasitics and optimized thermal path to the common source pad
on the bottom. Provides a very small footprint (5 x 6 mm) for
higher power density.
Large source pad on bottom of package for enhanced
thermals
Shielded Gate MOSFET Technology
Max rDS(on) = 10.5 mΩ at VGS = 10 V, ID = 10 A
Max rDS(on) = 17.3 mΩ at VGS = 6 V, ID = 7.8 A
Applications
Ideal for flexible layout in secondary side synchronous
rectification
Isolated DC-DC Synchronous Rectifiers
Common Ground Load Switches
Termination is Lead-free and RoHS Compliant
100% UIL tested
Top
Bottom
G1
Pin 1
Pin 1
D1
D1
G1
1
8
D2
D1
2
7
D2
D1
3
6
D2
D1
4
5
G2
D1
S1 / S2
D2
D2
D2
G2
S1,S2 to backside
Power 5 x 6
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted
Symbol
VDS
Drain to Source Voltage
Parameter
VGS
Gate to Source Voltage
Drain Current
ID
Drain Current
TJ, TSTG
±20
V
TC = 25 °C
-Continuous
TC = 100 °C
(Note 5)
24
-Continuous
TA = 25 °C
(Note 1a)
10
-Pulsed
PD
Units
V
-Continuous
Single Pulse Avalanche Energy
EAS
Power Dissipation
TC = 25 °C
Power Dissipation
TA = 25 °C
(Note 5)
Ratings
100
39
(Note 4)
299
(Note 3)
337
33
(Note 1a)
Operating and Storage Junction Temperature Range
2.2
-55 to +150
A
mJ
W
°C
Thermal Characteristics
RθJC
Thermal Resistance, Junction to Case
RθJA
Thermal Resistance, Junction to Ambient
3.7
(Note 1a)
55
°C/W
Package Marking and Ordering Information
Device Marking
FDMD86100
Device
FDMD86100
©2015 Fairchild Semiconductor Corporation
FDMD86100 Rev.C1
Package
Power 5 x 6
1
Reel Size
13 ’’
Tape Width
12 mm
Quantity
3000 units
www.fairchildsemi.com
FDMD86100 Dual N-Channel Shielded Gate PowerTrench® MOSFET
February 2015
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
Off Characteristics
BVDSS
Drain to Source Breakdown Voltage
ID = 250 μA, VGS = 0 V
ΔBVDSS
ΔTJ
Breakdown Voltage Temperature
Coefficient
ID = 250 μA, referenced to 25 °C
IDSS
Zero Gate Voltage Drain Current
VDS = 80 V, VGS = 0 V
1
μA
IGSS
Gate to Source Leakage Current
VGS = ±20 V, VDS = 0 V
±100
nA
4.0
V
100
V
7
mV/°C
On Characteristics
VGS(th)
Gate to Source Threshold Voltage
VGS = VDS, ID = 250 μA
ΔVGS(th)
ΔTJ
Gate to Source Threshold Voltage
Temperature Coefficient
ID = 250 μA, referenced to 25 °C
-10
VGS = 10 V, ID = 10 A
7.8
10.5
rDS(on)
Static Drain to Source On Resistance
VGS = 6 V, ID = 7.8 A
12
17.3
14.5
19.5
2.0
VGS = 10 V, ID = 10 A, TJ = 125 °C
gFS
Forward Transconductance
VDD = 5 V, ID = 10 A
3.0
mV/°C
26
mΩ
S
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate Resistance
VDS = 50 V, VGS = 0 V
f = 1 MHz
0.1
1469
2060
pF
321
450
pF
12
20
pF
1.3
3.3
Ω
Switching Characteristics
td(on)
Turn-On Delay Time
13
23
ns
tr
Rise Time
4.3
10
ns
td(off)
Turn-Off Delay Time
18
32
ns
tf
Fall Time
4.1
10
ns
Qg(TOT)
Total Gate Charge
VGS = 0 V to 10 V
21
30
nC
Qg(TOT)
Total Gate Charge
VGS = 0 V to 6 V
13
18
Qgs
Gate to Source Charge
Qgd
Gate to Drain “Miller” Charge
VDD = 50 V, ID = 10 A
VGS = 10 V, RGEN = 6 Ω
VDD = 50 V
ID = 10 A
nC
6.6
nC
4.1
nC
Drain-Source Diode Characteristics
VSD
Source to Drain Diode Forward Voltage
VGS = 0 V, IS = 10 A
(Note 2)
0.8
1.3
V
VSD
Source to Drain Diode Forward Voltage
VGS = 0 V, IS = 2 A
(Note 2)
0.7
1.2
V
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
IF = 10 A, di/dt = 100 A/μs
46
74
ns
46
74
nC
NOTES:
1. RθJA is determined with the device mounted on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RθCA is determined by the user's board design.
b.125 °C/W when mounted on
a minimum pad of 2 oz copper
a. 55 °C/W when mounted on
a 1 in2 pad of 2 oz copper
SS
SF
DS
DF
G
SS
SF
DS
DF
G
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %.
3. EAS of 337 mJ is based on starting TJ = 25 oC, L = 3 mH, IAS = 15 A, VDD = 100 V, VGS = 10 V. 100% tested at L = 0.1 mH, IAS = 47 A.
4. Pulsed Id please refer to Fig 11 SOA graph for more details.
5. Computed continuous current limited to Max Junction Temperature only, actual continuous current will be limited by thermal & electro-mechanical application board design.
©2015 Fairchild Semiconductor Corporation
FDMD86100 Rev.C1
2
www.fairchildsemi.com
FDMD86100 Dual N-Channel Shielded Gate PowerTrench® MOSFET
Electrical Characteristics TJ = 25 °C unless otherwise noted
150
120
VGS = 7 V
90
VGS = 6.5 V
60
VGS = 6 V
30
VGS = 5.5 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
0
0
1
2
3
4
4
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
ID, DRAIN CURRENT (A)
VGS = 10 V
VGS = 5.5 V
VGS = 6 V
3
VGS = 6.5 V
2
VGS = 7 V
1
0
5
0
30
VDS, DRAIN TO SOURCE VOLTAGE (V)
80
rDS(on), DRAIN TO
1.6
1.4
1.2
1.0
0.8
SOURCE ON-RESISTANCE (mΩ)
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
ID = 10 A
VGS = 10 V
1.8
60
40
TJ = 125 oC
20
-50
-25
0
25
50
75
0
100 125 150
4
IS, REVERSE DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
VDS = 5 V
90
TJ = 150
oC
TJ = 25 oC
30
TJ = -55 oC
3
4
5
6
7
8
6
7
8
9
9
200
100
VGS = 0 V
10
TJ = 150 oC
1
TJ = 25 oC
0.1
TJ = -55 oC
0.01
0.001
0.0
10
0.2
0.4
0.6
0.8
1.0
VGS, GATE TO SOURCE VOLTAGE (V)
VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 5. Transfer Characteristics
Figure 6. Source to Drain Diode
Forward Voltage vs Source Current
©2015 Fairchild Semiconductor Corporation
FDMD86100 Rev.C1
10
Figure 4. On-Resistance vs Gate to
Source Voltage
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
60
5
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 3. Normalized On- Resistance
vs Junction Temperature
2
150
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
ID = 10 A
TJ, JUNCTION TEMPERATURE (oC)
0
120
TJ = 25 oC
0.6
-75
120
90
Figure 2. Normalized On-Resistance
vs Drain Current and Gate Voltage
2.2
150
60
ID, DRAIN CURRENT (A)
Figure 1. On-Region Characteristics
2.0
VGS = 10 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
3
1.2
www.fairchildsemi.com
FDMD86100 Dual N-Channel Shielded Gate PowerTrench® MOSFET
Typical Characteristics TJ = 25 °C unless otherwise noted
5000
ID = 10 A
Ciss
VDD = 25 V
1000
8
CAPACITANCE (pF)
VGS, GATE TO SOURCE VOLTAGE (V)
10
VDD = 50 V
6
VDD = 75 V
4
Coss
100
Crss
10
2
0
f = 1 MHz
VGS = 0 V
0
6
12
18
1
0.1
24
1
10
100
VDS, DRAIN TO SOURCE VOLTAGE (V)
Qg, GATE CHARGE (nC)
Figure 7. Gate Charge Characteristics
Figure 8. Capacitance vs Drain
to Source Voltage
100
40
o
ID, DRAIN CURRENT (A)
IAS, AVALANCHE CURRENT (A)
RθJC = 3.7 C/W
TJ = 25 oC
TJ = 100 oC
10
TJ = 125 oC
1
0.001
0.01
0.1
1
10
32
VGS = 10 V
24
VGS = 6 V
16
8
0
25
100
50
75
100
Figure 10. Maximum Continuous Drain
Current vs Case Temperature
500
P(PK), PEAK TRANSIENT POWER (W)
20000
SINGLE PULSE
RθJC = 3.7 oC/W
ID, DRAIN CURRENT (A)
10000
100
10 μs
10
THIS AREA IS
LIMITED BY rDS(on)
100 μs
SINGLE PULSE
TJ = MAX RATED
1 ms
o
RθJC = 3.7 C/W
TC = 25 oC
0.1
0.1
150
TC, CASE TEMPERATURE ( C)
Figure 9. Unclamped Inductive
Switching Capability
1
125
o
tAV, TIME IN AVALANCHE (ms)
CURVE BENT TO
MEASURED DATA
1
10
10 ms
DC
100
300
1000
100
10
-5
10
-4
10
-3
10
-2
10
-1
10
1
10
100 1000
t, PULSE WIDTH (sec)
VDS, DRAIN to SOURCE VOLTAGE (V)
Figure 11. Forward Bias Safe
Operating Area
©2015 Fairchild Semiconductor Corporation
FDMD86100 Rev.C1
TA = 25 oC
Figure 12. Single Pulse Maximum
Power Dissipation
4
www.fairchildsemi.com
FDMD86100 Dual N-Channel Shielded Gate PowerTrench® MOSFET
Typical Characteristics TJ = 25 °C unless otherwise noted
r(t), NORMALIZED EFFECTIVE TRANSIENT
THERMAL RESISTANCE
2
1
0.1
DUTY CYCLE-DESCENDING ORDER
D = 0.5
0.2
0.1
0.05
0.02
0.01
PDM
t1
t2
NOTES:
0.01
ZθJC(t) = r(t) x RθJC
RθJC = 3.7 oC/W
Peak TJ = PDM x ZθJC(t) + TC
Duty Cycle, D = t1 / t2
SINGLE PULSE
0.001
-5
10
-4
10
-3
-2
10
10
-1
10
1
t, RECTANGULAR PULSE DURATION (sec)
Figure 13. Junction-to-Case Transient Thermal Response Curve
©2015 Fairchild Semiconductor Corporation
FDMD86100 Rev.C1
5
www.fairchildsemi.com
FDMD86100 Dual N-Channel Shielded Gate PowerTrench® MOSFET
Typical Characteristics TJ = 25 °C unless otherwise noted
5.00±0.10
0.10 C
2X
PKG
CL
8
KEEP-OUT
AREA
A
3.81
1.91
8
B
5
1.27
6
7
5
0.52 (8X)
0.72 (6X)
0.70 (2X)
1.79
CL
PKG
PIN #1
INDICATOR
6.00±0.10
1
2.88
1.72 (2X)
0.60 (2X)
0.10 C
4
1
2X
2
3
1.79
3.58
5.00
RECOMMENDED LAND PATTERN
C A B
C
0.08 C
C
0.30
0.20
0.42±.05 (6X)
1
4
0.80
0.70
0.10
0.05
1.27
3
6.22
0.10 C
SIDE VIEW
0.39 TYP
2
0.97
TOP VIEW
SEE
DETAIL A
(0.78)
2X
0.30 (2X)
4
0.05
0.00
SEATING
PLANE
0.56±.10 (6X)
1.56±.10
2X
NOTES:
(1.74)
0.30±.05
4X
3.48±.05
(1.04)
0.70 TYP
8
7
6
0.30±.05
2X
5
0.76
3.42 (2X)
3.48±.05
BOTTOM VIEW
(0.92) 2X
(SCALE: 2X)
A) PACKAGE REFERENCE :
TO JEDEC REGISTRATION, MO-240B, VARIATION AA.
B) ALL DIMENSIONS ARE IN MILLIMETERS.
C) DIMENSIONS DO NOT INCLUDE BURRS OR MOLD
FLASH. MOLD FLASH OR BURRS DOES NOT EXCEED
0.10MM.
D) DIMENSIONING AND TOLERANCING PER ASME
Y14.5M-2009
E) IT IS RECOMMENDED TO HAVE NO
TRACES OR VIAS WITHIN THE KEEP-OUT AREA
F) DRAWING FILE NAME: PQFN08OREV1
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
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