FDMD8900

FDMD8900

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    PQFN12_5X3.3MM_EP

  • 描述:

    FDMD8900

  • 数据手册
  • 价格&库存
FDMD8900 数据手册
Is Now Part of To learn more about ON Semiconductor, please visit our website at www.onsemi.com Please note: As part of the Fairchild Semiconductor integration, some of the Fairchild orderable part numbers will need to change in order to meet ON Semiconductor’s system requirements. Since the ON Semiconductor product management systems do not have the ability to manage part nomenclature that utilizes an underscore (_), the underscore (_) in the Fairchild part numbers will be changed to a dash (-). This document may contain device numbers with an underscore (_). Please check the ON Semiconductor website to verify the updated device numbers. The most current and up-to-date ordering information can be found at www.onsemi.com. Please email any questions regarding the system integration to Fairchild_questions@onsemi.com. ON Semiconductor and the ON Semiconductor logo are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. FDMD8900 N-Channel PowerTrench® MOSFET Q1: 30 V, 66 A, 4 mΩ Q2: 30 V, 42 A, 5.5 mΩ Features General Description Q1: N-Channel This devices utilizes two optimized N-ch FETs in a dual 3.3x5mm „ Max rDS(on) = 4 mΩ at VGS = 10 V, ID = 19 A thermally enhanced power package. The HS Source and LS „ Max rDS(on) = 5 mΩ at VGS = 4.5 V, ID = 17 A drain are internally connected providing a low source inductance package, helping to provide the best FOM. „ Max rDS(on) = 6.5 mΩ at VGS = 3.8 V, ID = 15 A „ Max rDS(on) = 8.3 mΩ at VGS = 3.5 V, ID = 14 A Q2: N-Channel Applications „ Max rDS(on) = 5.5 mΩ at VGS = 10 V, ID = 17 A „ Computing „ Max rDS(on) = 6.5 mΩ at VGS = 4.5 V, ID = 15 A „ Buck, Boost and Buck/Boost Applications „ Max rDS(on) = 9 mΩ at VGS = 3.8 V, ID = 13 A „ General Purpose POL „ Max rDS(on) = 12 mΩ at VGS = 3.5 V, ID = 12 A „ Ideal for Flexible Layout in Primary Side of Bridge Topology „ Termination is Lead-free and RoHS Compliant „ 100% UIL Tested „ Kelvin High Side MOSFET Drive Pin-out Capability Pin 1 Power 3.3 x 5 D1 1 12 G1 D1 2 11 D1 3 10 D2/S1 G2 4 9 D2/S1 S2 5 8 D2/S1 S2 6 7 D2/S1 G1R MOSFET Maximum Ratings TA = 25 °C unless otherwise noted. Symbol VDS Drain to Source Voltage Parameter VGS Gate to Source Voltage Drain Current -Continuous ID TC = 25 °C TJ, TSTG Units V V ±12 ±12 (Note 5) 66 42 -Continuous TC = 100°C (Note 5) 42 26 TA = 25 °C (Note 1a) 19 17 (Note 4) 280 210 (Note 3) 73 54 27 15 -Pulsed PD Q2 30 -Continuous Single Pulse Avalanche Energy EAS Q1 30 Power Dissipation TC = 25 °C Power Dissipation TA = 25 °C (Note 1a) Operating and Storage Junction Temperature Range 2.1 -55 to +150 A mJ W °C Thermal Characteristics RθJC Thermal Resistance, Junction to Case RθJA Thermal Resistance, Junction to Ambient 4.7 (Note 1a) 8.4 60 °C/W Package Marking and Ordering Information Device Marking 8900 Device FDMD8900 ©2015 Fairchild Semiconductor Corporation FDMD8900 Rev.1.1 Package Power 3.3 x 5 1 Reel Size 13 ” Tape Width 12 mm Quantity 3000 units www.fairchildsemi.com FDMD8900 N-Channel PowerTrench® MOSFET June 2016 Symbol Parameter Test Conditions Type Min. Typ. Max. Units Off Characteristics BVDSS Drain to Source Breakdown Voltage ID = 250 μA, VGS = 0 V ID = 250 μA, VGS = 0 V Q1 Q2 30 30 V ΔBVDSS ΔTJ Breakdown Voltage Temperature Coefficient ID = 250 μA, referenced to 25 °C ID = 250 μA, referenced to 25 °C Q1 Q2 14 13 mV/°C IDSS Zero Gate Voltage Drain Current VDS = 24 V, VGS = 0 V VDS = 24 V, VGS = 0 V Q1 Q2 1 1 μA IGSS Gate to Source Leakage Current VGS = ±12 V, VDS= 0 V VGS = ±12 V, VDS= 0 V Q1 Q2 ±100 ±100 nA 2.5 2.5 mV On Characteristics VGS(th) Gate to Source Threshold Voltage VGS = VDS, ID = 250 μA VGS = VDS, ID = 250 μA Q1 Q2 0.8 1 ΔVGS(th) ΔTJ Gate to Source Threshold Voltage Temperature Coefficient ID = 250 μA, referenced to 25 °C ID = 250 μA, referenced to 25 °C Q1 Q2 -4 -4 rDS(on) gFS Drain to Source On Resistance Forward Transconductance 1.3 1.4 mV/°C Q1 3.4 4 4.3 4.6 4.6 4 5 6.5 8.3 6 VGS = 10 V, ID = 17 A VGS = 4.5 V, ID = 15 A VGS = 3.8 V, ID = 13 A VGS = 3.5 V, ID = 12 A VGS = 10 V, ID = 17 A ,TJ =125 °C Q2 4.5 5.4 6 6.6 5.8 5.5 6.5 9 12 6.9 VDS = 5 V, ID = 19 A VDS = 5 V, ID = 17 A Q1 Q2 86 80 Q1: VDS = 15 V, VGS = 0 V, f = 1 MHZ Q1 Q2 1735 1210 2605 1815 pF Q1 Q2 462 356 695 535 pF Q1 Q2 47 52 75 80 pF Q1 Q2 0.8 1.9 VGS = 10 V, ID = 19 A VGS = 4.5 V, ID = 17 A VGS = 3.8 V, ID = 15 A VGS = 3.5 V, ID = 14 A VGS = 10 V, ID = 19 A,TJ =125 °C mΩ S Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance Rg Gate Resistance Q2: VDS = 15 V, VGS = 0 V, f = 1 MHZ Ω Switching Characteristics td(on) Turn-On Delay Time tr Rise Time td(off) Turn-Off Delay Time tf Fall Time Qg Total Gate Charge Qg Total Gate Charge Qgs Gate to Source Gate Charge Qgd Gate to Drain “Miller” Charge ©2015 Fairchild Semiconductor Corporation FDMD8900 Rev.1.1 Q1: VDD = 15 V, ID = 19 A, RGEN = 6 Ω Q2: VDD = 15 V, ID = 17 A, RGEN = 6 Ω VGS = 0 V to 10 V Q1: VDD = 15 V, VGS = 0 V to 4.5 V ID = 19 A Q2: VDD = 15 V, ID = 17 A 2 Q1 Q2 8.7 7.1 17 14 ns Q1 Q2 2.3 2 10 10 ns Q1 Q2 25 22 40 35 ns Q1 Q2 2.4 2.3 10 10 ns Q1 Q2 25 19 35 27 nC Q1 Q2 12 8.8 17 12 nC Q1 Q2 3.6 2.7 nC Q1 Q2 2.7 2.6 nC www.fairchildsemi.com FDMD8900 N-Channel PowerTrench® MOSFET Electrical Characteristics TJ = 25 °C unless otherwise noted. Symbol Parameter Test Conditions Type Min. Typ. Max. Units Q1 Q2 0.8 0.8 1.2 1.2 V Q1 Q2 26 22 42 35 ns Q1 Q2 10 7.8 20 16 nC Drain-Source Diode Characteristics VSD Source to Drain Diode Forward Voltage trr Reverse Recovery Time Qrr Reverse Recovery Charge VGS = 0 V, IS = 19 A VGS = 0 V, IS = 17 A (Note 2) (Note 2) Q1: IF = 19 A, di/dt = 100 A/μs Q2: IF = 17 A, di/dt = 100 A/μs NOTES: 1. RθJA is determined with the device mounted on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RθJC is guaranteed by design while RθCA is determined by the user's board design. b. 130 °C/W when mounted on a minimum pad of 2 oz copper a. 60 °C/W when mounted on a 1 in2 pad of 2 oz copper SS SF DS DF G SS SF DS DF G 2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %. 3. Q1: EAS of 73 mJ is based on starting TJ = 25 oC, L = 3 mH, IAS = 7 A, VDD = 30 V, VGS = 10 V. 100% tested at L = 0.1 mH, IAS = 25 A. Q2: EAS of 54 mJ is based on starting TJ = 25 oC, L = 3 mH, IAS = 6 A, VDD = 30 V, VGS = 10 V. 100% tested at L = 0.1 mH, IAS = 20 A. 4. Pulse Id refers to Figure “Forward Bias Safe Operation Area”. 5. Computed continuous current limited to Max Junction Temperature only, actual continuous current will be limited by thermal & electro-mechanical application board design. ©2015 Fairchild Semiconductor Corporation FDMD8900 Rev.1.1 3 www.fairchildsemi.com FDMD8900 N-Channel PowerTrench® MOSFET Electrical Characteristics TJ = 25 °C unless otherwise noted. 80 3 NORMALIZED DRAIN TO SOURCE ON-RESISTANCE VGS = 10 V ID, DRAIN CURRENT (A) VGS = 4.5 V VGS = 3.8 V 60 40 VGS = 3.5 V VGS = 3 V 20 PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX 0 0.0 0.2 0.4 0.6 VDS, DRAIN TO SOURCE VOLTAGE (V) rDS(on), DRAIN TO 0.8 SOURCE ON-RESISTANCE (mΩ) NORMALIZED DRAIN TO SOURCE ON-RESISTANCE 1.0 -50 IS, REVERSE DRAIN CURRENT (A) ID, DRAIN CURRENT (A) 20 TJ = -55 0 0 20 40 ID, DRAIN CURRENT (A) 60 80 1 2 oC 3 15 ID = 19 A 10 TJ = 125 oC 5 TJ = 25 oC 2 4 6 8 10 VGS = 0 V 10 TJ = 150 oC 1 TJ = 25 oC 0.1 0.01 TJ = -55 oC 0.001 0.0 4 VGS, GATE TO SOURCE VOLTAGE (V) 0.2 0.4 0.6 0.8 1.0 1.2 VSD, BODY DIODE FORWARD VOLTAGE (V) Figure 5. Transfer Characteristics ©2015 Fairchild Semiconductor Corporation FDMD8900 Rev.1.1 PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX 100 TJ = 25 oC 0 0 Figure 4. On Resistance vs. Gate to Source Voltage TJ = 150 oC 40 PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX VGS, GATE TO SOURCE VOLTAGE (V) PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX VDS = 5 V 60 VGS = 10 V 0 -25 0 25 50 75 100 125 150 TJ, JUNCTION TEMPERATURE (oC) Figure 3. Normalized On Resistance vs. Junction Temperature 80 1 20 1.2 0.6 -75 VGS = 4.5 V VGS = 3.8 V Figure 2. Normalized On-Resistance vs. Drain Current and Gate Voltage ID = 19 A VGS = 10 V 1.4 VGS = 3 V VGS = 3.5 V 0.8 Figure 1. On-Region Characteristics 1.6 2 Figure 6. Source to Drain Diode Forward Voltage vs. Source Current 4 www.fairchildsemi.com FDMD8900 N-Channel PowerTrench® MOSFET Typical Characteristics (Q1 N-Channel) TJ = 25°C unless otherwise noted. 10000 ID = 19 A VDD = 10 V 8 Ciss CAPACITANCE (pF) VGS, GATE TO SOURCE VOLTAGE (V) 10 VDD = 15 V 6 VDD = 20 V 4 1000 Coss Crss 100 2 f = 1 MHz VGS = 0 V 0 0 5 10 15 20 25 10 0.1 30 1 10 30 VDS, DRAIN TO SOURCE VOLTAGE (V) Qg, GATE CHARGE (nC) Figure 7. Gate Charge Characteristics Figure 8. Capacitance vs. Drain to Source Voltage 80 100 o ID, DRAIN CURRENT (A) IAS, AVALANCHE CURRENT (A) RθJC = 4.7 C/W TJ = 25 oC 10 TJ = 100 oC TJ = 125 oC 1 0.001 0.01 0.1 1 10 60 VGS = 10 V 40 VGS = 4.5 V 20 0 25 100 50 P(PK), PEAK TRANSIENT POWER (W) ID, DRAIN CURRENT (A) 150 10000 100 10 μs THIS AREA IS LIMITED BY rDS(on) 100 μs SINGLE PULSE TJ = MAX RATED RθJC = 4.7 oC/W TC = 25 oC 0.1 0.1 125 Figure 11. Maximum Continuous Drain Current vs. Case Temperature 1000 1 100 TC, CASE TEMPERATURE ( C) Figure 9. Unclamped Inductive Figure 10. Switching Capability 10 75 o tAV, TIME IN AVALANCHE (ms) CURVE BENT TO MEASURED DATA 1 1 ms 10 ms 100 ms/DC 10 100 200 TC = 25 oC 1000 100 10 -5 10 -4 10 -3 10 -2 10 -1 10 1 t, PULSE WIDTH (sec) VDS, DRAIN to SOURCE VOLTAGE (V) Figure 12. Forward Bias Safe Operating Area ©2015 Fairchild Semiconductor Corporation FDMD8900 Rev.1.1 SINGLE PULSE RθJC = 4.7 oC/W Figure 13. Single Pulse Maximum Power Dissipation 5 www.fairchildsemi.com FDMD8900 N-Channel PowerTrench® MOSFET Typical Characteristics (Q1 N-Channel) TJ = 25°C unless otherwise noted. r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE 2 1 0.1 DUTY CYCLE-DESCENDING ORDER D = 0.5 0.2 0.1 0.05 0.02 0.01 PDM t1 t2 0.01 NOTES: SINGLE PULSE ZθJC(t) = r(t) x RθJC RθJC = 4.7 oC/W Peak TJ = PDM x ZθJC(t) + TC Duty Cycle, D = t1 / t2 0.001 -5 10 -4 10 -3 -2 10 10 -1 10 1 t, RECTANGULAR PULSE DURATION (sec) Figure 14. Junction-to-Case Transient Thermal Response Curve ©2015 Fairchild Semiconductor Corporation FDMD8900 Rev.1.1 6 www.fairchildsemi.com FDMD8900 N-Channel PowerTrench® MOSFET Typical Characteristics (Q1 N-Channel) TJ = 25°C unless otherwise noted. 4 VGS = 10 V VGS = 4.5 V VGS = 3.8 V 45 NORMALIZED DRAIN TO SOURCE ON-RESISTANCE ID, DRAIN CURRENT (A) 60 30 VGS = 3.5 V 15 VGS = 3 V 0 0.0 PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX 0.2 0.4 0.6 VDS, DRAIN TO SOURCE VOLTAGE (V) 0.8 Figure 14. On- Region Characteristics VGS = 3.5 V 2 VGS = 3.8 V 1 0 0 45 60 rDS(on), DRAIN TO 1.0 0.8 0.6 -75 -50 -25 0 25 50 75 SOURCE ON-RESISTANCE (mΩ) 1.2 PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX ID = 17 A 20 TJ = 150 oC 10 TJ = 25 oC 0 100 125 150 2 TJ, JUNCTION TEMPERATURE (oC) 4 6 8 10 VGS, GATE TO SOURCE VOLTAGE (V) Figure 17. On-Resistance vs. Gate to Source Voltage Figure 16. Normalized On-Resistance vs. Junction Temperature 60 100 IS, REVERSE DRAIN CURRENT (A) PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX ID, DRAIN CURRENT (A) 15 30 ID, DRAIN CURRENT (A) 30 ID = 17 A VGS = 10 V 1.4 VDS = 5 V 40 TJ = 150 oC TJ = 25 oC 20 TJ = -55 oC 0 VGS = 10 V VGS = 4.5 V PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX Figure 15. Normalized on-Resistance vs. Drain Current and Gate Voltage 1.6 NORMALIZED DRAIN TO SOURCE ON-RESISTANCE VGS = 3 V 3 1 2 3 TJ = 150 oC 1 0.1 TJ = 25 oC 0.01 TJ = -55 oC 0.001 0.0 4 VGS, GATE TO SOURCE VOLTAGE (V) 0.2 0.4 0.6 0.8 1.0 1.2 VSD, BODY DIODE FORWARD VOLTAGE (V) Figure 18. Transfer Characteristics ©2015 Fairchild Semiconductor Corporation FDMD8900 Rev.1.1 VGS = 0 V 10 Figure 19. Source to Drain Diode Forward Voltage vs. Source Current 7 www.fairchildsemi.com FDMD8900 N-Channel PowerTrench® MOSFET Typical Characteristics (Q2 N-Channel) TJ = 25 °C unless otherwise noted. 10000 ID = 17 A 8 Ciss VDD = 10 V 6 CAPACITANCE (pF) VGS, GATE TO SOURCE VOLTAGE (V) 10 VDD = 15 V 4 VDD = 20 V 1000 Coss Crss 100 f = 1 MHz VGS = 0 V 2 0 0 5 10 15 10 0.1 20 1 10 30 VDS, DRAIN TO SOURCE VOLTAGE (V) Qg, GATE CHARGE (nC) Figure 21. Capacitance vs. Drain to Source Voltage Figure 20. Gate Charge Characteristics 60 100 ID, DRAIN CURRENT (A) IAS, AVALANCHE CURRENT (A) o RθJC = 8.4 C/W TJ = 25 oC 10 TJ = 100 oC TJ = 125 oC 1 0.001 0.01 0.1 1 10 VGS = 10 V 40 VGS = 4.5 V 20 0 25 100 50 P(PK), PEAK TRANSIENT POWER (W) ID, DRAIN CURRENT (A) 150 2000 SINGLE PULSE RθJC = 8.4 oC/W 1000 100 10 μs THIS AREA IS LIMITED BY rDS(on) 100 μs SINGLE PULSE TJ = MAX RATED RθJC = 8.4 oC/W 1 ms 10 ms CURVE BENT TO MEASURED DATA TC = 25 oC 0.1 0.1 125 Figure 23. Maximum Continuous Drain Current vs. Case Temperature 500 1 100 TC, CASE TEMPERATURE ( C) Figure 22. Unclamped Inductive Switching Capability 10 75 o tAV, TIME IN AVALANCHE (ms) 1 10 DC 100 100 10 -5 10 -4 10 -3 10 -2 10 -1 10 1 10 100 1000 t, PULSE WIDTH (sec) VDS, DRAIN to SOURCE VOLTAGE (V) Figure 24. Forward Bias Safe Operating Area ©2015 Fairchild Semiconductor Corporation FDMD8900 Rev.1.1 TC = 25 oC Figure 25. Single Pulse Maximum Power Dissipation 8 www.fairchildsemi.com FDMD8900 N-Channel PowerTrench® MOSFET Typical Characteristics (Q2 N-Channel) TJ = 25°C unless otherwise noted. r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE 1 0.1 DUTY CYCLE-DESCENDING ORDER D = 0.5 0.2 0.1 0.05 0.02 0.01 PDM t1 SINGLE PULSE t2 NOTES: 0.01 0.001 -5 10 ZθJC(t) = r(t) x RθJC RθJC = 8.4 oC/W Peak TJ = PDM x ZθJC(t) + TC Duty Cycle, D = t1 / t2 -4 10 -3 -2 10 10 -1 10 1 10 t, RECTANGULAR PULSE DURATION (sec) Figure 26. Junction-to-Case Transient Thermal Response Curve ©2015 Fairchild Semiconductor Corporation FDMD8900 Rev.1.1 9 www.fairchildsemi.com FDMD8900 N-Channel PowerTrench® MOSFET Typical Characteristics (Q2 N-Channel) TJ = 25 °C unless otherwise noted. 0.10 C B 5.10 4.90 2X 6 KEEP-OUT AREA A 1 2.35 0.42 (12X) 0.65 6 1 0.42 0.79 (12X) 3.40 3.20 3.70 PIN#1 INDICATOR 7 1.44 0.72 0.10 C 12 0.26 7 12 0.43 SEE DETAIL 'A' 3.67 4.70 5.10 LAND PATTERN RECOMMENDATION 5.00±0.10 0.10 0.05 4.60±0.10 C A B C 0.72 7 12 R0.15 0.36 0.20 3.30±0.10 1.34±0.10 0.52 0.64 0.44 6 1 (12X) 0.37 (12X) 0.27 0.65 0.53 NOTES: UNLESS OTHERWISE SPECIFIED A) DOES NOT FULLY CONFORM TO JEDEC REGISTRATION, MO-229 DATED 8/2012 B) ALL DIMENSIONS ARE IN MILLIMETERS. C) DIMENSIONS DO NOT INCLUDE BURRS OR MOLD FLASH. MOLD FLASH OR BURRS DOES NOT EXCEED 0.10MM. 0.80 0.70 D) DIMENSIONING AND TOLERANCING PER ASME Y14.5M-1994. 0.10 C E) IT IS RECOMMENDED TO HAVE NO TRACES OR VIAS WITHIN THE KEEP OUT AREA. 0.08 C C 0.25 0.15 0.05 0.00 SCALE: 2:1 F) DRAWING FILE NAME: SEATING PLANE MKT-PQFN12BREV1 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor 19521 E. 32nd Pkwy, Aurora, Colorado 80011 USA Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada Email: orderlit@onsemi.com © Semiconductor Components Industries, LLC N. American Technical Support: 800−282−9855 Toll Free USA/Canada Europe, Middle East and Africa Technical Support: Phone: 421 33 790 2910 Japan Customer Focus Center Phone: 81−3−5817−1050 www.onsemi.com 1 ON Semiconductor Website: www.onsemi.com Order Literature: http://www.onsemi.com/orderlit For additional information, please contact your local Sales Representative www.onsemi.com
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