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onsemi and and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or
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regulations and safety requirements or standards, regardless of any support or applications information provided by onsemi. “Typical” parameters which may be provided in onsemi data sheets and/
or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application
by customer’s technical experts. onsemi does not convey any license under any of its intellectual property rights nor the rights of others. onsemi products are not designed, intended, or authorized
for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for
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subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that onsemi was negligent regarding the design or manufacture of the part. onsemi is an Equal Opportunity/Affirmative
Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. Other names and brands may be claimed as the property of others.
MOSFET - Power,
N-Channel, UniFETt II,
Ultra FRFETt
500 V, 2 A, 3 W
FDT4N50NZU
www.onsemi.com
Description
UniFET II MOSFET is ON Semiconductor’s high voltage
MOSFET family based on advanced planar stripe and DMOS
technology. This advanced MOSFET family has the smallest on−state
resistance among the planar MOSFET, and also provides superior
switching performance and higher avalanche energy strength. In
addition, internal gate−source ESD diode allows UniFET II MOSFET
to withstand over 2 kV HBM surge stress. UniFET II Ultra FRFET
MOSFET has much superior body diode reverse recovery
performance. Its trr is less than 50 nsec and the reverse dv/dt immunity
is 20 V/nsec while normal planar MOSFETs have over 200 nsec and
4.5 V/nsec respectively. Therefore UniFET II Ultra FRFET MOSFET
can remove additional component and improve system reliability in
certain applications that require performance improvement of the
MOSFET’s body diode. This device family is suitable for switching
power converter applications such as power factor correction (PFC),
flat panel display (FPD) TV power, ATX and electronic lamp ballasts.
VDSS
RDS(ON) MAX
ID MAX
500 V
3 @ 10 V
2A
D
G
S
POWER MOSFET
D
Features
•
•
•
•
Typ. RDS(on) = 2.42
Ultra Low Gate Charge (Typ. Qg = 9.1 nC)
100% Avalanche Tested
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
Applications
• Computing / Display Power Supplies
• Industrial Power Supplies
• Consumer Power Supplies
G
D
S
SOT−223
(TO−261)
CASE 318E
MARKING DIAGRAM
D
AYW
4N50U
G
A
Y
W
4N50U
D
S
= Assembly Location
= Year
= Work Week
= Device Code
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
© Semiconductor Components Industries, LLC, 2019
February, 2021 − Rev. 1
1
Publication Order Number:
FDT4N50NZU/D
FDT4N50NZU
ABSOLUTE MAXIMUM RATINGS (TC = 25°C, Unless otherwise noted)
Symbol
Parameter
Value
Unit
500
V
±25
V
− Continuous (TC = 25°C)
2
A
− Continuous (TC = 100°C)
1.2
VDSS
Drain to Source Voltage
VGSS
Gate to Source Voltage
− DC
Drain Current
ID
IDM
Drain Current
EAS
IAS
6
A
Single Pulsed Avalanche Energy (Note 2)
46
mJ
Avalanche Current (Note 2)
2
A
EAR
Repetitive Avalanche Energy (Note 1)
2
mJ
dv/dt
Peak Diode Recovery dv/dt (Note 3)
20
V/ns
2
W
0.02
W/°C
−55 to +150
°C
300
°C
PD
− Pulsed (Note 1)
Power Dissipation
(TC = 25°C)
− Derate Above 25°C
TJ, TSTG
TL
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering, 1/8″ from Case for 5 seconds
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
NOTE: Drain current limited by maximum junction temperature.
1. Repetitive rating: pulse−width limited by maximum junction temperature.
2. IAS = 2 A, RG = 25 , starting TJ = 25°C.
3. ISD ≤ 3 A, di/dt ≤ 100 A/s, VDD ≤ 400 V, starting TJ = 25°C.
THERMAL CHARACTERISTICS
Symbol
RJA
Parameter
Thermal Resistance, Junction to Ambient, (1 in2 Pad of 2 oz. Copper) Max.
Value
Unit
60
_C/W
PACKAGE MARKING AND ORDERING INFORMATION
Part Number
FDT4N50NZU
Top Marking
FDT4N50NZU
Package
Packing Method
SOT−223
Tape &
Reel†
Reel Size
Tape Width
Quantity
330 mm
12 mm
4000 Units
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
www.onsemi.com
2
FDT4N50NZU
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)
Parameter
Symbol
Test Conditions
Min.
Typ.
Max.
Unit
OFF CHARACTERISTICS
Drain to Source Breakdown Voltage
VGS = 0 V, ID = 250 A, TJ = 25_C
BVDSS / TJ
Breakdown Voltage Temperature
Coefficient
ID = 1 mA, Referenced to 25_C
IDSS
Zero Gate Voltage Drain Current
VDS = 500 V, VGS = 0 V
BVDSS
500
0.55
Gate to Body Leakage Current
V/_C
1
A
±10
A
5.5
V
3
4.6
VDS = 400 V, TC = 125_C
IGSS
V
VGS = ±25 V, VDS = 0 V
ON CHARACTERISTICS
VGS(th)
Gate Threshold Voltage
VGS = VDS, ID = 250 A
RDS(on)
Static Drain to Source On Resistance
VGS = 10 V, ID = 1 A
2.42
Forward Transconductance
VDS = 20 V, ID = 1 A
1
S
gFS
3.5
DYNAMIC CHARACTERISTICS
VDS = 25 V, VGS = 0 V, f = 1 MHz
Ciss
Input Capacitance
476
pF
Coss
Output Capacitance
43
pF
Crss
Reverse Transfer Capacitance
2.7
pF
9.1
nC
2.9
nC
3.3
nC
16
ns
16
ns
Qg(tot)
Total Gate Charge at 10 V
Qgs
Gate to Source Gate Charge
Qgd
Gate to Drain “Miller” Charge
VDS = 400 V, ID = 3 A, VGS = 10 V
(Note 4)
SWITCHING CHARACTERISTICS
VDD = 250 V, ID = 3 A, VGS = 10 V,
Rg = 25
(Note 4)
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
34
ns
Turn-Off Fall Time
15
ns
tf
SOURCE-DRAIN DIODE CHARACTERISTICS
IS
Maximum Continuous Source to Drain Diode Forward Current
ISM
Maximum Pulsed Source to Drain Diode Forward Current
VSD
Source to Drain Diode Forward Voltage
VGS = 0 V, ISD = 1 A
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
VDD = 400 V, ISD = 3 A, dIF/
dt = 100 A/s
2
A
6
A
1.2
V
24
ns
18
nC
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
4. Essentially independent of operating temperature typical characteristics.
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3
FDT4N50NZU
TYPICAL CHARACTERISTICS
15 V
7.0 V
10 V
4
6.5 V
8.0 V
2
0
ID, DRAIN CURRENT (A)
VGS = 20 V
6.0 V
2
4
6
8
10
12
14
16
18
3.0
2.8
2.6
2.4
2.2
1
3
4
5
1
2
3
4
5
6
10
6
7
8
7
9
TJ = 150°C
TJ = 25°C
1
0.1
0.01
0.001
VGS = 0 V
0
0.5
1.0
1.5
2.0
ID, DRAIN CURRENT (A)
VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 3. On−Resistance Variation vs. Drain
Current and Gate Voltage
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current and Temperature
1000
10
Ciss
100
Coss
10
VDD = 250 V
VDD = 400 V
6
4
2
f = 1 MHz
VGS = 0 V
0.1
VDD = 100 V
8
VGS (V)
CAPACITANCE (pF)
TJ = 25°C
Figure 2. Transfer Characteristics
3.2
1
TJ = 150°C
2
Figure 1. On−Region Characteristics
VGS = 10 V
TJ = 25°C
0
3
VGS, GATE−TO−SOURCE VOLTAGE (V)
3.4
2.0
4
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
3.8
3.6
VDS = 20 V
5
0
20
IS, REVERSE DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
6
RDS(ON), DRAIN−TO−SOURCE ON−RESISTANCE
6
250 s Pulse Test
TC = 25°C
Crss
1
10
ID = 3 A
0
100
0
2
4
6
8
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
CHARGE (nC)
Figure 5. Capacitance Characteristics
Figure 6. Gate Charge Characteristics
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4
10
FDT4N50NZU
2.00
1.2
RDS(ON), NORMALIZED DRAIN−TO−
SOURCE ON−RESISTANCE
NORMALIZED DRAIN−TO−SOURCE
BREAKDOWN VOLTAGE
TYPICAL CHARACTERISTICS
ID = 250 A
VGS = 0 V
1.1
1.0
0.9
0.8
−75
−25
25
75
125
175
1.00
0.75
0.50
0
25
50
75
100
125
150
Figure 7. Breakdown Voltage Variation vs.
Temperature
Figure 8. On−Resistance Variation vs.
Temperature
1 ms
1
10 ms
0.1
TC = 25°C
TJ = 150°C
Single Pulse
1
175
2.5
ID, DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
ZJA(t), NORMALIZED THERMAL RESPONSE
1.25
TJ, JUNCTION TEMPERATURE (°C)
100 s
100 ms
DC
100
10
1000
2.0
1.5
1.0
0.5
0
25
50
75
100
125
150
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
TC, CASE TEMPERATURE (°C)
Figure 9. Maximum Safe Operating Area
Figure 10. Maximum Drain Current vs. Case
Temperature
10
1
1.50
TJ, AMBIENT TEMPERATURE (°C)
Operation in this area
10 is limited by RDS(on)
0.01
ID = 1 A
VGS = 10 V
1.75
Duty Cycle = 0.5
0.2
0.1
0.05
0.1
0.02
0.01
0.01
1E−03
P DM
1E−04
t1
1E−05 Single Pulse
1E−06
1E−06
1E−05
t2
0.0001
0.001
0.01
0.1
t, SQUARE WAVE PULSE DURATION (sec)
Figure 11. Transient Thermal Response
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5
1
Notes:
ZJA(t) = 60°C/W Max.
TJM − TC = PDM x ZJC(t)
Duty Factor, D = t1/t2
10
100
1000
FDT4N50NZU
VGS
RL
Qg
VDS
VGS
Qgs
Qgd
DUT
IG = Const.
Charge
Figure 12. Gate Charge Test Circuit & Waveform
RL
VDS
VDS
90%
90%
90%
VDD
VGS
RG
VGS
DUT
VGS
10%
td(on)
10%
tr
td(off)
ton
tf
toff
Figure 13. Resistive Switching Test Circuit & Waveforms
L
E AS + 1 @ LI AS
2
VDS
BVDSS
ID
IAS
RG
VDD
DUT
VGS
2
ID(t)
VDD
VDS(t)
tp
tp
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms
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6
Time
FDT4N50NZU
+
DUT
VDS
−
ISD
L
Driver
RG
Same Type
as DUT
VGS
− dv/dt controlled by RG
− ISD controlled by pulse period
D+
VGS
(Driver)
VDD
Gate Pulse Width
Gate Pulse Period
10 V
IFM, Body Diode Forward Current
ISD
(DUT)
di/dt
IRM
Body Diode Reverse Current
Body Diode Recovery dv/dt
VDS
(DUT)
VDD
VSD
Body Diode
Forward Voltage Drop
Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
Ultra FRFET and UniFET are trademarks of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other countries.
www.onsemi.com
7
FDT4N50NZU
PACKAGE DIMENSIONS
SOT−223 (TO−261)
CASE 318E−04
ISSUE R
q
q
www.onsemi.com
8
FDT4N50NZU
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Email Requests to: orderlit@onsemi.com
ON Semiconductor Website: www.onsemi.com
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Phone: 011 421 33 790 2910
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