FDZ209N

FDZ209N

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    SOD-523

  • 描述:

    导通电阻(RDS(on)@Vgs,Id):80mΩ@4A,5V 漏源电压(Vdss):60V 连续漏极电流(Id):4A

  • 数据手册
  • 价格&库存
FDZ209N 数据手册
FDZ209N 60V N-Channel PowerTrench BGA MOSFET General Description Features Combining Fairchild’s advanced PowerTrench process with state-of-the-art BGA packaging, the FDZ209N minimizes both PCB space and RDS(ON). This BGA MOSFET embodies a breakthrough in packaging technology which enables the device to combine excellent thermal transfer characteristics, high current handling capability, ultra-low profile packaging, low gate charge, and low RDS(ON). • 4 A, 60 V. RDS(ON) = 80 mΩ @ VGS = 5 V • Occupies only 5 mm2 of PCB area: only 55% of the area of SSOT-6 • Ultra-thin package: less than 0.80 mm height when mounted to PCB Applications • Outstanding thermal transfer characteristics: 4 times better than SSOT-6 • Solenoid Drivers • Ultra-low Qg x RDS(ON) figure-of-merit • High power and current handling capability Index slot D D D S S S G S S D D D D Index slot G Top Bottom Absolute Maximum Ratings Symbol VDSS VGSS ID PD TJ, TSTG S TA=25oC unless otherwise noted Parameter Drain-Source Voltage Gate-Source Voltage Drain Current – Continuous (Note 1a) – Pulsed Power Dissipation (Steady State) (Note 1a) Operating and Storage Junction Temperature Range Thermal Characteristics RθJA RθJB RθJC Thermal Resistance, Junction-to-Ambient Thermal Resistance, Junction-to-Ball Thermal Resistance, Junction-to-Case (Note 1a) (Note 1) (Note 1) Package Marking and Ordering Information Device Marking 209N 2004 Fairchild Semiconductor Corporation Device FDZ209N Reel Size 7’’ Ratings 60 ±20 4 20 2 –55 to +150 64 8 0.7 Tape width 8mm Units V V A W °C °C/W Quantity 3000 units FDZ209N Rev B2 (W) FDZ209N May 2004 Symbol TA = 25°C unless otherwise noted Parameter Test Conditions Min Typ Max Units Drain-Source Avalanche Ratings (Note 2) WDSS Drain-Source Avalanche Energy Single Pulse, IAR Drain-Source Avalanche Current ID= 4 A Off Characteristics BVDSS ∆BVDSS ∆TJ IDSS IGSS Drain–Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate–Body Leakage. On Characteristics VGS(th) ∆VGS(th) ∆TJ RDS(on) gFS VDD = 30 V, VGS = 0 V, ID = 250 µA ID = 250 µA, Referenced to 25°C 90 mJ 4 A 60 V mV/°C 59 1 ±100 µA nA 2.5 –6 3 V mV/°C VGS = 5 V, ID = 4 A VGS = 5 V, ID = 4 A, TJ=125°C VDS = 5 V, ID = 4 A 60 91 12 80 130 mΩ VDS = 30 V, f = 1.0 MHz 657 pF 76 pF 32 pF Ω VDS = 48 V, VGS = ±20 V, VGS = 0 V VDS = 0 V (Note 2) Gate Threshold Voltage Gate Threshold Voltage Temperature Coefficient Static Drain–Source On–Resistance Forward Transconductance VDS = VGS, ID = 250 µA ID = 250 µA, Referenced to 25°C 1 S Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance RG Gate Resistance Switching Characteristics V GS = 0 V, VGS = 15 mV, f = 1.0 MHz 1.5 VDD = 30 V, VGS = 5 V, ID = 1 A, RGEN = 6 Ω 18 32 4 8 ns 15 27 ns (Note 2) td(on) Turn–On Delay Time tr Turn–On Rise Time td(off) Turn–Off Delay Time tf Turn–Off Fall Time 8 16 ns Qg Total Gate Charge 6.3 9 nC Qgs Gate–Source Charge Qgd Gate–Drain Charge VDS = 30 V, VGS = 5 V ID = 4 A, 2.5 nC 2.5 nC Drain–Source Diode Characteristics and Maximum Ratings IS VSD trr Qrr Maximum Continuous Drain–Source Diode Forward Current Drain–Source Diode Forward VGS = 0 V, IS = 1.7 A Voltage Diode Reverse Recovery Time IF = 4A diF/dt = 100 A/µs Diode Reverse Recovery Charge 0.77 (Note 2) (Note 2) ns 1.7 1.2 A V 27 nS 45 nC Notes: 1. RθJA is determined with the device mounted on a 1 in² 2 oz. copper pad on a 1.5 x 1.5 in. board of FR-4 material. The thermal resistance from the junction to the circuit board side of the solder ball, RθJB, is defined for reference. For RθJC, the thermal reference point for the case is defined as the top surface of the copper chip carrier. RθJC and RθJB are guaranteed by design while RθJA is determined by the user' s board design. a) 64°C/W when mounted on a 1in2 pad of 2 oz copper, 1.5” x 1.5” x 0.062” thick PCB b) 128°C/W when mounted on a minimum pad of 2 oz copper Scale 1 : 1 on letter size paper 2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0% FDZ209N Rev B2 (W) FDZ209N Electrical Characteristics FDZ209N Dimensional Outline and Pad Layout FDZ209N Rev B2 (W) FDZ209N Typical Characteristics 1.8 VGS = 5.0V 4.8V RDS(ON), NORMALIZED DRAIN-SOURCE ON-RESISTANCE ID, DRAIN CURRENT (A) 20 4.5V 15 4.3V 10 4.0V 5 3.8V 1.6 VGS = 4.0V 1.4 4.3V 1.2 1 0.8 0 0 1 2 3 4 5 6 0 7 5 Figure 1. On-Region Characteristics. 15 20 Figure 2. On-Resistance Variation with Drain Current and Gate Voltage. 0.35 1.8 ID =2A ID = 4A VGS = 5.0V 1.6 RDS(ON), ON-RESISTANCE (OHM) RDS(ON), NORMALIZED DRAIN-SOURCE ON-RESISTANCE 10 ID, DRAIN CURRENT (A) VDS, DRAIN-SOURCE VOLTAGE (V) 1.4 1.2 1 0.8 0.6 0.4 -50 -25 0 25 50 75 100 125 0.3 0.25 0.2 0.15 TA = 125oC 0.1 TA = 25oC 0.05 0 150 3 o TJ, JUNCTION TEMPERATURE ( C) 3.5 100 25 C TA = -55 C 15 IS, REVERSE DRAIN CURRENT (A) o o 4.5 5 Figure 4. On-Resistance Variation with Gate-to-Source Voltage. 20 VDS = 5V 4 VGS, GATE TO SOURCE VOLTAGE (V) Figure 3. On-Resistance Variation with Temperature. ID, DRAIN CURRENT (A) 5.0V 4.8V 4.5V o 125 C 10 5 VGS = 0V 10 TA = 125oC 1 0.1 25oC 0.01 -55oC 0.001 0.0001 0 2 2.5 3 3.5 4 4.5 5 5.5 VGS, GATE TO SOURCE VOLTAGE (V) Figure 5. Transfer Characteristics. 0 0.2 0.4 0.6 0.8 1 1.2 VSD, BODY DIODE FORWARD VOLTAGE (V) Figure 6. Body Diode Forward Voltage Variation with Source Current and Temperature. FDZ209N Rev B2 (W) FDZ209N Typical Characteristics ID = 4A VDS = 20V 1000 30V 800 40V 5 4 3 2 CISS 600 400 COSS 200 1 CRSS 0 0 2 4 6 8 0 10 0 Qg, GATE CHARGE (nC) 10 20 30 40 50 60 VDS, DRAIN TO SOURCE VOLTAGE (V) Figure 7. Gate Charge Characteristics. Figure 8. Capacitance Characteristics. 50 100 P(pk), PEAK TRANSIENT POWER (W) RDS(ON) LIMIT 1ms 10 10ms 100ms 1 DC VGS = 5.0V SINGLE PULSE RθJA = 128oC/W 0.1 1s 10s TA = 25oC 0.01 0.1 1 10 SINGLE PULSE RθJA = 128°C/W TA = 25°C 40 30 20 10 0 0.01 100 0.1 1 VDS, DRAIN-SOURCE VOLTAGE (V) 10 100 1000 t1, TIME (sec) Figure 9. Maximum Safe Operating Area. r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE ID, DRAIN CURRENT (A) f = 1MHz VGS = 0 V 6 CAPACITANCE (pF) VGS, GATE-SOURCE VOLTAGE (V) 7 Figure 10. Single Pulse Maximum Power Dissipation. 1 D = 0.5 RθJA(t) = r(t) * RθJA RθJA = 128 °C/W 0.2 0.1 0.1 P(pk) 0.05 t1 0.02 0.01 t2 TJ - TA = P * RθJA(t) Duty Cycle, D = t1 / t2 0.01 SINGLE PULSE 0.001 0.001 0.01 0.1 1 10 100 1000 t1, TIME (sec) Figure 11. Transient Thermal Response Curve. Thermal characterization performed using the conditions described in Note 1b. Transient thermal response will change depending on the circuit board design. FDZ209N Rev B2 (W) TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. ACEx™ FAST ActiveArray™ FASTr™ Bottomless™ FPS™ CoolFET™ FRFET™ CROSSVOLT™ GlobalOptoisolator™ DOME™ GTO™ EcoSPARK™ HiSeC™ E2CMOS™ I2C™ EnSigna™ i-Lo™ FACT™ ImpliedDisconnect™ FACT Quiet Series™ ISOPLANAR™ LittleFET™ MICROCOUPLER™ MicroFET™ MicroPak™ MICROWIRE™ MSX™ MSXPro™ OCX™ OCXPro™ OPTOLOGIC Across the board. Around the world.™ OPTOPLANAR™ PACMAN™ The Power Franchise POP™ Programmable Active Droop™ Power247™ PowerSaver™ PowerTrench QFET QS™ QT Optoelectronics™ Quiet Series™ RapidConfigure™ RapidConnect™ µSerDes™ SILENT SWITCHER SMART START™ SPM™ Stealth™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic TINYOPTO™ TruTranslation™ UHC™ UltraFET VCX™ DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component is any component of a life 1. Life support devices or systems are devices or support device or system whose failure to perform can systems which, (a) are intended for surgical implant into be reasonably expected to cause the failure of the life the body, or (b) support or sustain life, or (c) whose support device or system, or to affect its safety or failure to perform when properly used in accordance with instructions for use provided in the labeling, can be effectiveness. reasonably expected to result in significant injury to the user. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only. Rev. I11
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