FGH40N60SMD
600 V, 40 A Field Stop IGBT
Features
General Description
o
Using novel field stop IGBT technology, Fairchild®’s new series
of field stop 2nd generation IGBTs offer the optimum performance for solar inverter, UPS, welder, telecom, ESS and PFC
applications where low conduction and switching losses are
essential.
• Maximum Junction Temperature : TJ = 175 C
• Positive Temperaure Co-efficient for Easy Parallel Operating
• High Current Capability
• Low Saturation Voltage: VCE(sat) = 1.9V(Typ.) @ IC = 40 A
• High Input Impedance
• Fast Switching: EOFF = 6.5 uJ/A
• Tighten Parameter Distribution
• RoHS Compliant
Applications
• Solar Inverter, UPS, Welder, PFC, Telecom, ESS
C
E
C
G
G
COLLECTOR
(FLANGE)
E
Absolute Maximum Ratings
Symbol
Description
Ratings
Unit
VCES
Collector to Emitter Voltage
600
V
VGES
Gate to Emitter Voltage
20
V
IC
ICM (1)
IF
IFM (1)
PD
25oC
Collector Current
@ TC =
80
A
Collector Current
@ TC = 100oC
40
A
Pulsed Collector Current
@ TC = 25oC
120
A
Diode Forward Current
@ TC = 25oC
40
A
Diode Forward Current
o
20
A
120
A
@ TC = 100 C
Pulsed Diode Maximum Forward Current
o
Maximum Power Dissipation
@ TC = 25 C
349
W
Maximum Power Dissipation
@ TC = 100oC
174
W
TJ
Operating Junction Temperature
-55 to +175
o
C
Tstg
Storage Temperature Range
-55 to +175
o
C
TL
Maximum Lead Temp. for soldering
Purposes, 1/8” from case for 5 seconds
300
oC
Notes:
1: Repetitive rating: Pulse width limited by max. junction temperature
©2010 Fairchild Semiconductor Corporation
FGH40N60SMD Rev. C0
1
www.fairchildsemi.com
FGH40N60SMD 600 V, 40 A Field Stop IGBT
April 2013
Symbol
Parameter
Typ.
Max.
Unit
oC/W
RJC(IGBT)
Thermal Resistance, Junction to Case
-
0.43
RJC(Diode)
Thermal Resistance, Junction to Case
-
1.5
o
RJA
Thermal Resistance, Junction to Ambient
-
40
oC/W
C/W
Package Marking and Ordering Information
Device Marking
Device
Package
Reel Size
Tape Width
Quantity
FGH40N60SMD
FGH40N60SMD
TO-247
-
-
30
Electrical Characteristics of the IGBT
Symbol
Parameter
TC = 25°C unless otherwise noted
Test Conditions
Min.
Typ.
Max.
Unit
600
-
-
V
-
0.6
-
V/oC
Off Characteristics
BVCES
Collector to Emitter Breakdown Voltage VGE = 0V, IC = 250A
BVCES
TJ
Temperature Coefficient of Breakdown
Voltage
ICES
Collector Cut-Off Current
VCE = VCES, VGE = 0V
-
-
250
A
IGES
G-E Leakage Current
VGE = VGES, VCE = 0V
-
-
±400
nA
IC = 250A, VCE = VGE
VGE = 0V, IC = 250A
On Characteristics
VGE(th)
VCE(sat)
G-E Threshold Voltage
Collector to Emitter Saturation Voltage
3.5
4.5
6.0
V
IC = 40A, VGE = 15V
-
1.9
2.5
V
IC = 40A, VGE = 15V,
TC = 175oC
-
2.1
-
V
-
1880
-
pF
VCE = 30V, VGE = 0V,
f = 1MHz
-
180
-
pF
-
50
-
pF
-
12
16
ns
Dynamic Characteristics
Cies
Input Capacitance
Coes
Output Capacitance
Cres
Reverse Transfer Capacitance
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Rise Time
-
20
28
ns
td(off)
Turn-Off Delay Time
-
92
120
ns
tf
Fall Time
Eon
Turn-On Switching Loss
Eoff
Ets
VCC = 400V, IC = 40A,
RG = 6, VGE = 15V,
Inductive Load, TC = 25oC
-
13
17
ns
-
0.87
1.30
mJ
Turn-Off Switching Loss
-
0.26
0.34
mJ
Total Switching Loss
-
1.13
1.64
mJ
td(on)
Turn-On Delay Time
-
15
-
ns
tr
Rise Time
-
22
-
ns
td(off)
Turn-Off Delay Time
tf
Fall Time
Eon
Turn-On Switching Loss
Eoff
Turn-Off Switching Loss
Ets
Total Switching Loss
©2010 Fairchild Semiconductor Corporation
FGH40N60SMD Rev. C0
VCC = 400V, IC = 40A,
RG = 6, VGE = 15V,
Inductive Load, TC = 175oC
2
-
116
-
ns
-
16
-
ns
-
0.97
-
mJ
-
0.60
-
mJ
-
1.57
-
mJ
www.fairchildsemi.com
FGH40N60SMD 600 V, 40 A Field Stop IGBT
Thermal Characteristics
Symbol
Qg
Parameter
(Continued)
Test Conditions
Total Gate Charge
Qge
Gate to Emitter Charge
Qgc
Gate to Collector Charge
VCE = 400V, IC = 40A,
VGE = 15V
Electrical Characteristics of the Diode
Symbol
Parameter
Diode Forward Voltage
Erec
Reverse Recovery Energy
trr
Diode Reverse Recovery Time
Qrr
Diode Reverse Recovery Charge
©2010 Fairchild Semiconductor Corporation
FGH40N60SMD Rev. C0
Typ.
Max
Unit
-
119
180
nC
-
13
20
nC
-
58
90
nC
Min.
Typ.
Max
Unit
TC = 25°C unless otherwise noted
Test Conditions
o
VFM
Min.
IF = 20A
IF =20A, dIF/dt = 200A/s
TC = 25 C
-
2.3
2.8
TC = 175oC
-
1.67
-
TC = 175oC
-
48.9
-
TC = 25oC
-
36
-
TC = 175oC
-
110
-
TC = 25oC
-
46.8
-
o
-
445
-
TC = 175 C
3
V
uJ
ns
nC
www.fairchildsemi.com
FGH40N60SMD 600 V, 40 A Field Stop IGBT
Electrical Characteristics of the IGBT
Figure 1. Typical Output Characteristics
120
o
TC = 25 C
20V
15V
120
12V
o
TC = 175 C
100
10V
80
60
VGE = 8V
40
12V
10V
80
60
VGE = 8V
40
20
20
0
0
2
4
Collector-Emitter Voltage, VCE [V]
0
6
0
Figure 3. Typical Saturation Voltage
Characteristics
2
4
Collector-Emitter Voltage, VCE [V]
6
Figure 4. Transfer Characteristics
120
120
Common Emitter
VCE = 20V
Common Emitter
VGE = 15V
o
o
TC = 25 C
o
TC = 175 C
80
TC = 25 C
Collector Current, IC [A]
100
Collector Current, IC [A]
20V
15V
100
Collector Current, IC [A]
Collector Current, IC [A]
Figure 2. Typical Output Characteristics
60
40
90 T = 175oC
C
60
30
20
0
0
0
1
2
3
Collector-Emitter Voltage, VCE [V]
0
4
Figure 5. Saturation Voltage vs. Case
Temperature at Variant Current Level
Collector-Emitter Voltage, VCE [V]
Collector-Emitter Voltage, VCE [V]
20
Common Emitter
VGE = 15V
80A
2.0
40A
1.5
IC = 20A
1.0
25
FGH40N60SMD Rev. C0
12
4
Common Emitter
o
TC = -40 C
16
12
8
40A
80A
4
IC = 20A
0
50
75
100
125
150
175
o
Collector-EmitterCase Temperature, TC [ C]
©2010 Fairchild Semiconductor Corporation
4
6
8
10
Gate-Emitter Voltage,VGE [V]
Figure 6. Saturation Voltage vs. VGE
3.0
2.5
2
4
8
12
16
Gate-Emitter Voltage, VGE [V]
20
www.fairchildsemi.com
FGH40N60SMD 600 V, 40 A Field Stop IGBT
Typical Performance Characteristics
Figure 7. Saturation Voltage vs. VGE
20
20
Common Emitter
Common Emitter
o
TC = 25 C
Collector-Emitter Voltage, VCE [V]
Collector-Emitter Voltage, VCE [V]
Figure 8. Saturation Voltage vs. VGE
16
12
8
40A
80A
4
IC = 20A
0
o
TC = 175 C
16
12
8
80A
4
40A
IC = 20A
0
4
8
12
16
Gate-Emitter Voltage, VGE [V]
4
20
Figure 9. Capacitance Characteristics
8
12
16
Gate-Emitter Voltage, VGE [V]
20
Figure 10. Gate charge Characteristics
15
4000
Common Emitter
Common Emitter
VGE = 0V, f = 1MHz
Gate-Emitter Voltage, VGE [V]
o
o
TC = 25 C
Capacitance [pF]
3000
Cies
2000
1000
Coes
TC = 25 C
400V
12
VCC = 200V
300V
9
6
3
Cres
0
0.1
0
1
10
Collector-Emitter Voltage, VCE [V]
0
30
Figure 11. SOA Characteristics
40
80
Gate Charge, Qg [nC]
Figure 12. Turn-on Characteristics vs.
Gate Resistance
300
100
10s
100
tr
100s
1ms
10 ms
10
Switching Time [ns]
Collector Current, Ic [A]
120
DC
1
*Notes:
0.1
o
td(on)
10
Common Emitter
VCC = 400V, VGE = 15V
IC = 40A
1. TC = 25 C
o
TC = 25 C
o
2. TJ = 175 C
3. Single Pulse
0.01
1
10
100
Collector-Emitter Voltage, VCE [V]
©2010 Fairchild Semiconductor Corporation
FGH40N60SMD Rev. C0
o
TC = 175 C
1
1000
0
5
10
20
30
40
Gate Resistance, RG []
50
www.fairchildsemi.com
FGH40N60SMD 600 V, 40 A Field Stop IGBT
Typical Performance Characteristics
Figure 13. Turn-off Characteristics vs.
Gate Resistance
Figure 14. Turn-on Characteristics vs.
Collector Current
1000
1000
Common Emitter
VGE = 15V, RG = 6
o
TC = 25 C
100
tf
Common Emitter
VCC = 400V, VGE = 15V
IC = 40A
10
o
Switching Time [ns]
Switching Time [ns]
td(off)
TC = 175 C
100
tr
10
td(on)
o
TC = 25 C
o
TC = 175 C
1
0
10
20
30
40
1
20
50
30
40
Gate Resistance, RG []
50
60
70
80
Collector Current, IC [A]
Figure 15. Turn-off Characteristics vs.
Collector Current
Figure 16. Switching Loss vs.
Gate Resistance
1000
5
Switching Loss [mJ]
Switching Time [ns]
td(off)
100
tf
10
Common Emitter
VGE = 15V, RG = 6
o
Eon
1
Eoff
Common Emitter
VCC = 400V, VGE = 15V
IC = 40A
o
TC = 25 C
TC = 25 C
o
o
TC = 175 C
1
20
30
40
50
60
TC = 175 C
70
0.1
80
0
Collector Current, IC [A]
Figure 17. Switching Loss vs.
Collector Current
10
20
30
40
Gate Resistance, RG []
50
Figure 18. Turn off Switching
SOA Characteristics
200
6
Collector Current, IC [A]
Switching Loss [mJ]
100
Eon
1
Eoff
Common Emitter
VGE = 15V, RG = 6
o
TC = 25 C
10
Safe Operating Area
o
o
TC = 175 C
0.1
20
30
40
50
60
70
VGE = 15V, TC = 175 C
1
80
1
Collector Current, IC [A]
©2010 Fairchild Semiconductor Corporation
FGH40N60SMD Rev. C0
10
100
1000
Collector-Emitter Voltage, VCE [V]
6
www.fairchildsemi.com
FGH40N60SMD 600 V, 40 A Field Stop IGBT
Typical Performance Characteristics
Figure 19. Current Derating
Figure 20. Load Current Vs. Frequency
90
Square Wave
110
o
TJ < 175 C, D = 0.5, VCE = 400V
VGE = 15/0V, RG = 6
100
70
Collector Current, IC [A]
Collector Current, IC [A]
120
Common Emitter
VGE = 15V
80
60
50
40
30
20
90
80
o
70
Tc = 75 C
60
o
Tc = 100 C
50
40
30
20
10
10
0
25
0
1k
50
75
100
125
150
175
o
Collector-EmitterCase Temperature, TC [ C]
Figure 21. Forward Characteristics
10k
100k
Switching Frequency, f [Hz]
Figure 22. Reverse Current
1000
100
o
Reverse Currnet, ICES [A]
100
Forward Current, IF [A]
1M
o
TC = 175 C
10
o
TC = 25 C
TC = 175 C
10
o
TC = 100 C
1
0.1
o
0.01
TC = 25 C
o
TC = 25 C
o
TC = 175 C
1E-3
1
0
0.5
1.0
1.5
2.0
Forward Voltage, VF [V]
2.5
0
3.0
Figure 23. Stored Charge
200
300
VR [V]
400
500
600
Figure 24. Reverse Recovery Time
700
200
o
o
TC = 25 C
TC = 25 C
600
Reverse Recovery Time, trr [ns]
Stored Recovery Charge, Qrr [nC]
100
o
TC = 175 C
500
400
300
di/dt = 200A/s
200
di/dt = 100A/s
100
o
TC = 175 C
150
100
di/dt = 100A/s
di/dt = 200A/s
50
0
0
0
5
10
15 20 25 30 35
Forwad Current, IF [A]
©2010 Fairchild Semiconductor Corporation
FGH40N60SMD Rev. C0
40
0
45
7
5
10 15 20 25 30 35
Forward Current, IF [A]
40
45
www.fairchildsemi.com
FGH40N60SMD 600 V, 40 A Field Stop IGBT
Typical Performance Characteristics
FGH40N60SMD 600 V, 40 A Field Stop IGBT
Typical Performance Characteristics
Figure 25.Transient Thermal Impedance of IGBT
Thermal Response [Zthjc]
1
0.5
0.1
0.01
0.2
0.1
0.05
0.02
0.01
single pulse
PDM
t1
t2
Duty Factor, D = t1/t2
Peak Tj = Pdm x Zthjc + TC
0.001
-5
10
-4
10
-3
-2
10
-1
10
0
10
10
Rectangular Pulse Duration [sec]
Figure 26.Transient Thermal Impedance of Diode
Thermal Response [Zthjc]
3
1
0.5
0.2
0.1
0.1
0.05
PDM
0.02
t1
t2
0.01
single pulse
0.01 -5
10
Duty Factor, D = t1/t2
Peak Tj = Pdm x Zthjc + TC
-4
10
-3
-2
10
10
-1
10
0
10
Rectangular Pulse Duration [sec]
©2010 Fairchild Semiconductor Corporation
FGH40N60SMD Rev. C0
8
www.fairchildsemi.com
FGH40N60SMD 600 V, 40 A Field Stop IGBT
Mechanical Dimensions
TO-247A03
©2010 Fairchild Semiconductor Corporation
FGH40N60SMD Rev. C0
9
www.fairchildsemi.com
tm
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
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PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
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THEREIN, WHICH COVERS THESE PRODUCTS.
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As used here in:
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intended for surgical implant into the body or (b) support or sustain life,
and (c) whose failure to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably
expected to result in a significant injury of the user.
2.
A critical component in any component of a life support, device, or
system whose failure to perform can be reasonably expected to cause
the failure of the life support device or system, or to affect its safety or
effectiveness.
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PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative / In Design
Datasheet contains the design specifications for product development. Specifications
may change in any manner without notice.
Preliminary
First Production
Datasheet contains preliminary data; supplementary data will be published at a later
date. Fairchild Semiconductor reserves the right to make changes at any time without
notice to improve design.
No Identification Needed
Full Production
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to
make changes at any time without notice to improve the design.
Obsolete
Not In Production
Datasheet contains specifications on a product that is discontinued by Fairchild
Semiconductor. The datasheet is for reference information only.
Rev. I64
©2010 Fairchild Semiconductor Corporation
FGH40N60SMD Rev. C0
10
www.fairchildsemi.com
FGH40N60SMD 600 V, 40 A Field Stop IGBT
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