KA336Z25BU

Date Created : 2008/03/18 Date Issued On : 2008/08/08 PCN# : Q1081203 DESIGN/PROCESS CHANGE NOTIFICATION -- FINAL This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request. If you have any questions concerning this change, please contact: Technical Contact: Name: Lee, Woonbong E-mail: Woonbong.Lee@notes.fairchildsemi.com Phone: 82326801758 PCN Originator: Name: Lee, Woonbong E-mail: Woonbong.Lee@notes.fairchildsemi.com Phone: 82326801758 Implementation of change: Expected 1st Device Shipment Date: 2008/11/16 Earliest Year/Work Week of Changed Product: 0847 Change Type Description: Bond Wire Material Composition, Lead Frame Composition, Lead Frame Dimensions (Internal and External) Description of Change (From): TO92R package assembled in AUK-D using copper leadframe and Au wire as referenced in table 1 Description of Change (To): TO92R package assembly at AUK-D will utilize Fe leadframe and Cu wire in addition to the current Copper leadframe and Au wire.(There is no difference in package dimension and electrical specification) Reason for Change : To improve product availability and manufacturing flexibility Qual/REL Plan Numbers : Q20080333 Qualification : The qualification plan is intended to meet our criteria for qualifying changed BOM(Fe LF and Cu wire) Change To Pg. 1 Results/Discussion for Qual Plan NumberQ20080333 Test: (Autoclave) Lot Q20080333AAACLV Q20080333ABACLV Q20080333ACACLV Device KA431AZ KA431AZ KA431AZ 96-HOURS 0/77 0/77 0/77 Failure Code Test: (High Temperature Op Life) Lot Q20080333AAHTOL Device KA431AZ 168-HOURS 0/77 500-HOURS 1000-HOURS Failure Code 0/77 0/77 Q20080333ABHTOL 0/77 0/77 0/77 Q20080333ACHTOL 0/77 0/77 0/77 Test: (High Temperature Storage Life) Lot Q20080333AAHTSL Device 168-HOURS 0/77 500-HOURS 1000-HOURS Failure Code 0/77 0/77 Q20080333ABHTSL 0/77 0/77 0/77 Q20080333ACHTSL 0/77 0/77 0/77 Test: (Temperature Humidity Biased Test) Lot Q20080333AATHBT Device 168-HOURS 0/77 500-HOURS 1000-HOURS Failure Code 0/77 0/77 Q20080333ABTHBT 0/77 0/77 0/77 Q20080333ACTHBT 0/77 0/77 0/77 Test: -65C, 150C (Temperature Cycle) Lot Q20080333AATMCL1 Q20080333AATMCL1 Q20080333ABTMCL1 Q20080333ABTMCL1 Q20080333ACTMCL1 Q20080333ACTMCL1 Device KA431AZ KA431AZ KA431AZ KA431AZ KA431AZ KA431AZ 200-CYCLES 0/77 500-CYCLES Failure Code 0/77 0/77 0/77 0/77 0/77 Pg. 2 Product Id Description : Affected FSIDs : FAN431AZXA FAN431LZXA FAN431ZXA KA317LZTA KA336Z25BU KA336Z5BU KA431AZBU KA431AZTA KA431AZTA_F065 KA431AZTF KA431LZTA KA431LZTA_F065 KA431LZTF KA431ZTA KA431ZTF KA75250ZTA KA75270ZTA KA75290ZTA KA75310ZTA KA75330ZTA KA75360ZTA KA75390ZTA KA75420ZTA KA75450ZTA KA76L05ZTA KA76L05ZTF KA78L05AAZTA KA78L05AZBU KA78L05AZTA KA78L05AZTF KA78L06AZTA KA78L08AZBU KA78L08AZTA KA78L08AZTF KA78L09AZBU KA78L09AZTA KA78L10AZBU KA78L10AZTA KA78L12AZBU KA78L12AZTA KA78L12AZTF KA78L15AZBU KA78L15AZTA KA78L18AZBU KA78L18AZTA KA78L24AZTA KA79L05AZTA KA79L08AZTA KA79L12AZTA KA79L15AZTA LM2931AZ5X LM2931AZ5 LM317LZTFR LM317LZXA LM317LZX LM317LZ LM336BZ50 LM336Z25X LM336Z25 LM336Z5X LM336Z5 LM431ACZXA LM431ACZX LM431ACZ LM431AIZ LM431BCZXA LM431BCZX LM431BCZ LM431BIZX LM431BIZ LM431CCZXA LM431CCZX LM431CCZ LM431CIZ LM78L05ACZXA LM78L05ACZX LM78L05ACZ LM78L12ACZXA LM78L12ACZX LM78L12ACZ LM79L05ACZX LM79L05ACZ MC78L05ABPX MC78L05ACPXA MC78L05ACPX MC78L05ACP MC78L06ACP MC78L08ACPX MC78L08ACP MC78L12ACPX MC78L12ACP MC78L15ACPXA MC78L15ACP MC78L24ACP MC79L05ACPX MC79L05ACP MC79L15ACP TL431ACLPX TL431ACLP TL431ACZ TL431CLPX TL431CLP Pg. 3