KAI-4011-AAA-CR-AE

KAI-4011 2048 (H) x 2048 (V) Interline CCD Image Sensor Description The KAI−4011 Image Sensor is a high-performance 4-million pixel sensor designed for a wide range of medical, scientific and machine vision applications. The 7.4 mm square pixels with microlenses provide high sensitivity and the large full well capacity results in high dynamic range. The two high-speed outputs and binning capabilities allow for 16−50 frames per second (fps) video rate for the progressively scanned images. The vertical overflow drain structure provides antiblooming protection and enables electronic shuttering for precise exposure control. Other features include low dark current, negligible lag and low smear. www.onsemi.com Table 1. GENERAL SPECIFICATIONS Parameter Typical Value Architecture Interline CCD, Progressive Scan Total Number of Pixels 2112 (H) × 2072 (V) Number of Effective Pixels 2056 (H) × 2062 (V) Number of Active Pixels 2048 (H) × 2048 (V) Features Pixel Size 7.4 mm (H) × 7.4 mm (V) Active Image Size 15.15 mm (H) × 15.15 mm (V), 21.43 mm (Diagonal), Aspect Ratio 1:1 Number of Outputs 1 or 2 Saturation Signal 40,000 e− Peak Quantum Efficiency −ABA −CBA (BGR) 55% 45%, 42%, 35% • • • • • • • Total System Noise 40 MHz 20 MHz 40 e− 23 e− Dark Current < 0.5 nA/cm2 Dark Current Doubling Temperature 7°C Dynamic Range 60 dB Charge Transfer Efficiency > 0.99999 Blooming Suppression 300X Smear 80 dB Image Lag < 10 e− Maximum Data Rate 40 MHz Package 34-pin, cerDIP Cover Glass AR Coated, 2 Sides Figure 1. KAI−4011 Interline CCD Image Sensor High Resolution High Sensitivity High Dynamic Range Low Noise Architecture High Frame Rate Binning Capability for Higher Frame Rate Electronic Shutter Applications • Machine Vision ORDERING INFORMATION See detailed ordering and shipping information on page 2 of this data sheet. NOTE: All parameters above are specified at T = 40°C. © Semiconductor Components Industries, LLC, 2014 March, 2017 − Rev. 2 1 Publication Order Number: KAI−4011/D KAI−4011 ORDERING INFORMATION Table 2. ORDERING INFORMATION − KAI−4011 IMAGE SENSOR Part Number Description KAI−4011−AAA−CR−BA Monochrome, No Microlens, CERDIP Package (Sidebrazed), Taped Clear Cover Glass with AR Coating (2 Sides), Standard Grade KAI−4011−AAA−CR−AE Monochrome, No Microlens, CERDIP Package (Sidebrazed), Taped Clear Cover Glass with AR Coating (2 Sides), Engineering Sample KAI−4011−ABA−CD−BA Monochrome, Telecentric Microlens, CERDIP Package (Sidebrazed), Clear Cover Glass with AR Coating (Both Sides), Standard Grade KAI−4011−ABA−CD−AE Monochrome, Telecentric Microlens, CERDIP Package (Sidebrazed), Clear Cover Glass with AR Coating (Both Sides), Engineering Sample KAI−4011−ABA−CR−BA Monochrome, Telecentric Microlens, CERDIP Package (Sidebrazed), Taped Clear Cover Glass with AR Coating (2 Sides), Standard Grade KAI−4011−ABA−CR−AE Monochrome, Telecentric Microlens, CERDIP Package (Sidebrazed), Taped Clear Cover Glass with AR Coating (2 Sides), Engineering Sample KAI−4011−CBA−CD−BA* Color (Bayer RGB), Telecentric Microlens, CERDIP Package (Sidebrazed), Clear Cover Glass with AR Coating (Both Sides), Standard Grade KAI−4011−CBA−CD−AE* Color (Bayer RGB), Telecentric Microlens, CERDIP Package (Sidebrazed), Clear Cover Glass with AR Coating (Both Sides), Engineering Sample Marking Code KAI−4011 Serial Number KAI−4011M Serial Number KAI−4011CM Serial Number *Not recommended for new designs. Table 3. ORDERING INFORMATION − EVALUATION SUPPORT Part Number Description KAI−4011−10−40−A−EVK Evaluation Board, (Complete Kit) KAI−4021−10−40−A−EVK Evaluation Board, (Complete Kit) See the ON Semiconductor Device Nomenclature document (TND310/D) for a full description of the naming convention used for image sensors. For reference documentation, including information on evaluation kits, please visit our web site at www.onsemi.com. www.onsemi.com 2 KAI−4011 DEVICE DESCRIPTION Architecture Single or Dual Output G R 2048 (H) x 2048 (H) Active Pixels 28 Dark Columns B G G R 4 Buffer Columns B G B G G R 12 Dummy Pixels Pixel 1,1 12 Dummy Pixels Video L B G G R 8 Buffer Rows 4Buffer Rows 4 Buffer Columns 28 Dark Columns B G G R B G G R B G G R B G G R 6 Buffer Rows 10 Dark Rows 12 28 4 12 28 4 2048 1024 1024 4 28 12 4 28 12 Video R Figure 2. Sensor Architecture out Video R. Each row consists of 12 empty pixels followed by 28 light shielded pixels followed by 1028 photosensitive pixels. When reconstructing the image, data from Video R will have to be reversed in a line buffer and appended to the Video L data. There are no dark reference rows at the top and 10 dark rows at the bottom of the image sensor. The 10 dark rows are not entirely dark and so should not be used for a dark reference level. Use the 28 dark columns on the left or right side of the image sensor as a dark reference. Of the 28 dark columns, the first and last dark columns should not be used for determining the zero signal level. Some light does leak into the first and last dark columns. Only use the center 26 columns of the 28 column dark reference. There are 10 light shielded rows followed 2062 photoactive rows. The first 6 and the last 8 photoactive rows are buffer rows giving a total of 2048 lines of image data. In the single output mode all pixels are clocked out of the Video L output in the lower left corner of the sensor. The first 12 empty pixels of each line do not receive charge from the vertical shift register. The next 28 pixels receive charge from the left light−shielded edge followed by 2056 photo−sensitive pixels and finally 28 more light shielded pixels from the right edge of the sensor. The first and last 4 photosensitive pixels are buffer pixels giving a total of 2048 pixels of image data. In the dual output mode the clocking of the right half of the horizontal CCD is reversed. The left half of the image is clocked out Video L and the right half of the image is clocked www.onsemi.com 3 KAI−4011 Pixel ÉÉÉÉÉÉÉÉÉ ËËËËË ÉÉÉÉÉÉÉÉÉ ËËËËË ÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉ ËËËËË ÉÉÉÉÉÉÉÉÉ ËËËËË ÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉ Top View Direction of Charge Transfer Cross Section Down Through VCCD V1 7.4 mm V1 Photodiode Transfer Gate V2 ÉÉ ÉÉ ÉÉ ÉÉ n− V2 V1 n− ÉÉ ÉÉ n− n p Well (GND) Direction of Charge Transfer 7.4 mm n Substrate True Two Phase Burried Channel VCCD Lightshield over VCCD not shown Cross Section Through Photodiode and VCCD Phase 1 É É p Photodiode Cross Section Through Photodiode and VCCD Phase 2 at Transfer Gate Light Shield ÉÉÏÏÏÏÏÏÏÉ ÉÉ ÉÉÏÏÏÏÏÏÏÉ ÉÉ V1 p+ n p n Gate Light Shield ÏÏÏÏÏÏÉÉ ÏÏÏÏÏÏÉÉ V2 p+ p p p Transfer n n p p p n Substrate n Substrate NOTE: Drawings not scale. p Cross Section Showing Lenslet Lenslet Red Color Filter Light Shield Light Shield VCCD VCCD Photodiode Figure 3. Pixel Architecture An electronic representation of an image is formed when incident photons falling on the sensor plane create electron−hole pairs within the individual silicon photodiodes. These photoelectrons are collected locally by the formation of potential wells at each photosite. Below photodiode saturation, the number of photoelectrons collected at each pixel is linearly dependent upon light level and exposure time and non−linearly dependent on wavelength. When the photodiodes charge capacity is reached, excess electrons are discharged into the substrate to prevent blooming. www.onsemi.com 4 KAI−4011 Vertical to Horizontal Transfer ÉÉÉÉÉÉÉÉÉÉ ËËËËËË ÉÉÉÉÉÉÉÉÉÉ ËËËËËË ÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉ ËËËËËË ÉÉÉÉÉÉÉÉÉÉ ËËËËËË ÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉ ËËËËËË ÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉ ËËËËËË ÉÉÉÉÉÉÉÉÉÉ ËËËËËË ÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉ ÉÉÉÉÉÉ ËË ËË ËË ËË ËË ËË ËË ËË ËË ËË ËË ËË ËË ËË Top View Direction of Vertical Charge Transfer V1 Photodiode Transfer Gate V2 V1 Fast Line Dump V2 H2B H2S H1B Lightshield Not Shown H1S Direction of Horizontal Charge Transfer Figure 4. Vertical to Horizontal Transfer Architecture When the V1 and V2 timing inputs are pulsed, charge in every pixel of the VCCD is shifted one row towards the HCCD. The last row next to the HCCD is shifted into the HCCD. When the VCCD is shifted, the timing signals to the HCCD must be stopped. H1 must be stopped in the high state and H2 must be stopped in the low state. The HCCD clocking may begin THD ms after the falling edge of the V1 and V2 pulse. Charge is transferred from the last vertical CCD phase into the H1S horizontal CCD phase. Refer to Figure 36 for an example of timing that accomplishes the vertical to horizontal transfer of charge. If the fast line dump is held at the high level (FDH) during a vertical to horizontal transfer, then the entire line is removed and not transferred into the horizontal register. www.onsemi.com 5 KAI−4011 Horizontal Register to Floating Diffusion RD R n+ n OG n+ H2S H2B H1S n− H1B H2S n− H2B H1S n− n (burried channel) Floating Diffusion p (GND) n (SUB) Figure 5. Horizontal Register to Floating Diffusion Architecture When the HCCD is shifting valid image data, the timing inputs to the electronic shutter (SUB), VCCD (V1, V2), and fast line dump (FD) should be not be pulsed. This prevents unwanted noise from being introduced. The HCCD is a type of charge coupled device known as a pseudo−two phase CCD. This type of CCD has the ability to shift charge in two directions. This allows the entire image to be shifted out to the video L output, or to the video R output (left/right image reversal). The HCCD is split into two equal halves of 1068 pixels each. When operating the sensor in single output mode the two halves of the HCCD are shifted in the same direction. When operating the sensor in dual output mode the two halves of the HCCD are shifted in opposite directions. The direction of charge transfer in each half is controlled by the H1BL, H2BL, H1BR, and H2BR timing inputs. The HCCD has a total of 2124 pixels. The 2112 vertical shift registers (columns) are shifted into the center 2112 pixels of the HCCD. There are 12 pixels at both ends of the HCCD, which receive no charge from a vertical shift register. The first 12 clock cycles of the HCCD will be empty pixels (containing no electrons). The next 28 clock cycles will contain only electrons generated by dark current in the VCCD and photodiodes. The next 2056 clock cycles will contain photo−electrons (image data). Finally, the last 28 clock cycles will contain only electrons generated by dark current in the VCCD and photodiodes. Of the 28 dark columns, the first and last dark columns should not be used for determining the zero signal level. Some light does leak into the first and last dark columns. Only use the center 26 columns of the 28 column dark reference. www.onsemi.com 6 KAI−4011 Horizontal Register Split H1 H2 H2 H1 H1 H2 H2 H1BL H2SL H2BL H1SL H1BL H2SL H1BR Pixel 1068 H1 H1SR H1 H2 H2BR H2SR Pixel 1069 Single Output H1 H2 H2 H1 H1 H2 H1 H1 H2 H2 H1BL H2SL H2BL H1SL H1BL H2SL H1BR H1SR H2BR H2SR Pixel 1068 Pixel 1069 Dual Output Figure 6. Horizontal Register Dual Output Operation In dual output mode the connections to the H1BR and H2BR pins are swapped from the single output mode to change the direction of charge transfer of the right side horizontal shift register. In dual output mode both VDDL and VDDR (pins 11, 24) should be connected to 15 V. The H1 timing from the timing diagrams should be applied to H1SL, H1BL, H1SR, H1BR, and the H2 timing should be applied to H2SL, H2BL, H2SR, and H2BR. The clock driver generating the H1 timing should be connected to pins 16, 15, 19, and 20. The clock driver generating the H2 timing should be connected to pins 17, 14, 18, and 21. The horizontal CCD should be clocked for 12 empty pixels plus 28 light shielded pixels plus 1028 photoactive pixels for a total of 1068 pixels. If the camera is to have the option of dual or single output mode, the clock driver signals sent to H1BR and H2BR may be swapped by using a relay. Another alternative is to have two extra clock drivers for H1BR and H2BR and invert the signals in the timing logic generator. If two extra clock drivers are used, care must be taken to ensure the rising and falling edges of the H1BR and H2BR clocks occur at the same time (within 3 ns) as the other HCCD clocks. Single Output Operation When operating the sensor in single output mode all pixels of the image sensor will be shifted out the Video L output (pin 12). To conserve power and lower heat generation the output amplifier for Video R may be turned off by connecting VDDR (pin 24) and VOUTR (pin 23) to GND (zero volts). The H1 timing from the timing diagrams should be applied to H1SL, H1BL, H1SR, H2BR, and the H2 timing should be applied to H2SL, H2BL, H2SR, and H1BR. In other words, the clock driver generating the H1 timing should be connected to pins 16, 15, 19, and 21. The clock driver generating the H2 timing should be connected to pins 17, 14, 18, and 20. The horizontal CCD should be clocked for 12 empty pixels plus 28 light shielded pixels plus 2056 photoactive pixels plus 28 light shielded pixels for a total of 2124 pixels. www.onsemi.com 7 KAI−4011 Output H2B H2S HCCD Charge Transfer H1B H1S H2B H2S VDD OG R RD Floating Diffusion VOUT Source Follower #1 Source Follower #2 Source Follower #3 Figure 7. Output Architecture are generated in the binned or summed interlaced modes then the output amplifier output will have to swing 1,280 mV. The output amplifier does not have enough bandwidth (slew rate) to handle 1,280 mV at 40 MHz. Hence, the pixel rate will have to be reduced to 20 MHz if the full dynamic range of 80,000 electrons is desired. The charge handling capacity of the output amplifier is also set by the reset clock voltage levels. The reset clock driver circuit is very simple, if an amplitude of 5 V is used. But the 5 V amplitude restricts the output amplifier charge capacity to 40,000 electrons. If the full dynamic range of 80,000 electrons is desired then the reset clock amplitude will have to be increased to 7 V. If you only want a maximum signal of 40,000 electrons in binned or summed interlaced modes, then a 40 MHz pixel rate with a 5 V reset clock may be used. The output of the amplifier will be unpredictable above 40,000 electrons so be sure to set the maximum input signal level of your analog to digital converter to the equivalent of 40,000 electrons (640 mV). Charge packets contained in the horizontal register are dumped pixel by pixel onto the floating diffusion (FD) output node whose potential varies linearly with the quantity of charge in each packet. The amount of potential charge is determined by the expression DVFD = DQ / CFD. A three-stage source-follower amplifier is used to buffer this signal voltage off chip with slightly less than unity gain. The translation from the charge domain to the voltage domain is quantified by the output sensitivity or charge to voltage conversion in terms of microvolts per electron (mV/e−). After the signal has been sampled off chip, the reset clock (R) removes the charge from the floating diffusion and resets its potential to the reset drain voltage (RD). When the image sensor is operated in the binned or summed interlaced modes there will be more than 40,000 e− in the output signal. The image sensor is designed with a 16 mV/e− charge to voltage conversion on the output. This means a full signal of 40,000 electrons will produce a 640 mV change on the output amplifier. The output amplifier was designed to handle an output swing of 640 mV at a pixel rate of 40 MHz. If 80,000 electron charge packets www.onsemi.com 8 KAI−4011 ESD Protection D2 D2 RL D2 H1SL D2 H2SL D2 H1BL D2 H2BL OGL ESD D1 VSUB D2 D2 RR D2 H1SR D2 H2SR D2 H1BR D2 H2BR OGR Figure 8. ESD Protection to forward bias these junctions then diodes D1 and D2 should be added to protect the image sensor. Put one diode D1 between the ESD and VSUB pins. Put one diode D2 on each pin that may forward bias the base−emitter junction. The diodes will prevent large currents from flowing through the image sensor. Note that external diodes D1 and D2 are optional and are only needed if it is possible to forward bias any of the junctions. Note that diodes D1 and D2 are added external to the KAI−4011. The ESD protection on the KAI−4011 is implemented using bipolar transistors. The substrate (VSUB) forms the common collector of all the ESD protection transistors. The ESD pin is the common base of all the ESD protection transistors. Each protected pin is connected to a separate emitter as shown in Figure 8. The ESD circuit turns on if the base−emitter junction voltage exceeds 17 V. Care must be taken while operating the image sensor, especially during the power on sequence, to not forward bias the base−emitter or base−collector junctions. If it is possible for the camera power up sequence www.onsemi.com 9 KAI−4011 Pin Description and Physical Orientation SUB 1 34 GND V2E 2 33 V2E V2O 3 32 V2O V1E 4 31 V1E V1O 5 30 V1O ESD 6 29 SUB GND 7 28 FD OGL 8 27 OGR GND 9 26 GND RDL 10 25 RDR VDDL 11 24 VDDR VOUTL 12 23 VOUTR RL 13 22 RR H2BL 14 21 H2BR H1BL 15 20 H1BR H1SL 16 19 H1SR H2SL 17 18 H2SR Pixel 1,1 Figure 9. Package Pin Designations − Top View Table 4. PIN DESCRIPTION Pin Name Substrate 18 H2SR H2 Storage, Right Vertical Clock, Phase 2, Even 19 H1SR H1 Storage, Right V2O Vertical Clock, Phase 2, Odd 20 H1BR H1 Barrier, Right V1E Vertical Clock, Phase 1, Even 21 H2BR H2 Barrier, Right 5 V1O Vertical Clock, Phase 1, Odd 22 RR Reset Gate, Right 6 ESD ESD 23 VOUTR 7 GND Ground 24 VDDR 8 OGL Output Gate, Left 25 RDR Reset Drain, Right Pin Name 1 SUB 2 V2E 3 4 Description Description Video Output, Right VDD, Right 9 GND Ground 26 GND Ground 10 RDL Reset Drain, Left 27 OGR Output Gate, Right 11 VDDL VDD, Left 28 FD Video Output, Left 29 SUB Substrate V1O Vertical Clock, Phase 1, Odd Fast Line Dump Gate 12 VOUTL 13 RL Reset Gate, Left 30 14 H2BL H2 Barrier, Left 31 V1E Vertical Clock, Phase 1, Even 15 H1BL H1 Barrier, Left 32 V2O Vertical Clock, Phase 2, Odd 16 H1SL H1 Storage, Left 33 V2E Vertical Clock, Phase 2, Even 17 H2SL H2 Storage, Left 34 GND Ground NOTE: The pins are on a 0.070″ spacing. www.onsemi.com 10 KAI−4011 IMAGING PERFORMANCE Table 5. TYPICAL OPERATIONAL CONDITIONS (Unless otherwise noted, the Imaging Performance Specifications are measured using the following conditions.) Condition Description Notes Frame Time 538 ms 1 Horizontal Clock Frequency 10 MHz Light Source Continuous Red, Green and Blue LED Illumination Centered at 450, 530 and 650 nm Operation Nominal Operating Voltages and Timing 2, 3 1. Electronic shutter is not used. Integration time equals frame time. 2. LEDs used: Blue: Nichia NLPB500, Green: Nichia NSPG500S and Red: HP HLMP−8115. 3. For monochrome sensor, only green LED used. Specifications Table 6. PERFORMANCE SPECIFICATIONS Temperature Tested at (5C) Min. Nom. Max. Units Sampling Plan Dark Center Non-Uniformity N/A N/A 1 mVrms Die 27, 40 Dark Global Non-Uniformity N/A N/A 5.0 mVpp Die 27, 40 Global Non-Uniformity (Note 1) N/A 2.5 5.0 % rms Die 27, 40 N/A 10 20 % pp Die 27, 40 N/A 1.0 2.0 % rms Die 27, 40 Description Symbol ALL CONFIGURATIONS Global Peak to Peak Non-Uniformity (Note 1) PRNU Center Non-Uniformity (Note 1) Maximum Photoresponse Non-Linearity (Notes 2, 3) NL N/A 2 % Design Maximum Gain Difference between Outputs (Notes 2, 3) DG N/A 10 % Design Maximum Signal Error due to Non-Linearity Dif. (Notes 2, 3) DNL N/A 1 % Design Horizontal CCD Charge Capacity HNe 100 ke− Design Vertical CCD Charge Capacity VNe 50 60 ke− Die Photodiode Charge Capacity PNe 38 40 ke− Die Horizontal CCD Charge Transfer Efficiency HCTE 0.99999 N/A Design Vertical CCD Charge Transfer Efficiency VCTE 0.99999 N/A Design Photodiode Dark Current IPD N/A N/A 40 0.01 350 0.1 e/p/s nA/cm2 Die Vertical CCD Dark Current IVD N/A N/A 400 0.12 1711 0.5 e/p/s nA/cm2 Die Image Lag Lag N/A < 10 50 e− Design Anti-Blooming Factor XAB 100 300 N/A Vertical Smear Smr N/A −80 −75 dB Total Noise (Note 4) ne−T 23 e− rms Design Total Noise (Note 5) ne−T 40 e− rms Design Dynamic Range (Notes 5, 6) DR 60 dB Design V Die Output Amplifier DC Offset VODC 4 8.5 www.onsemi.com 11 14 KAI−4011 Table 6. PERFORMANCE SPECIFICATIONS (continued) Description Symbol Min. Nom. Max. Units Sampling Plan MHz Design W Die mV/e− Design ALL CONFIGURATIONS Output Amplifier Bandwidth f−3DB Output Amplifier Impedance ROUT Output Amplifier Sensitivity 140 100 130 200 16 DV/DN KAI−4011−ABA CONFIGURATION Peak Quantum Efficiency Peak Quantum Efficiency Wavelength QEMAX 45 55 N/A % Design lQE N/A 500 N/A nm Design − − − 35 42 45 N/A N/A N/A % Design − − − 620 540 470 N/A N/A N/A nm Design KAI−4011−CBA CONFIGURATION* Peak Quantum Efficiency Red Green Blue Peak Quantum Efficiency Wavelength Red Green Blue QEMAX lQE NOTE: N/A = Not Applicable. *Not recommended for new designs. 1. Per color. 2. Value is over the range of 10% to 90% of photodiode saturation. 3. Value is for the sensor operated without binning. 4. Includes system electronics noise, dark pattern noise and dark current shot noise at 20 MHz. 5. Includes system electronics noise, dark pattern noise and dark current shot noise at 40 MHz. 6. Uses 20LOG (PNe / ne−T). www.onsemi.com 12 Temperature Tested at (5C) KAI−4011 TYPICAL PERFORMANCE CURVES Quantum Efficiency Monochrome with Microlens Absolute Quantum Efficiency 0.60 0.50 Measured with glass 0.40 0.30 0.20 0.10 0.00 300 400 500 600 700 800 900 Wavelength (nm) Figure 10. Monochrome with Microlens Quantum Efficiency Monochrome without Microlens 0.12 Absolute Quantum Efficiency 0.10 0.08 0.06 0.04 0.02 0.00 240 340 440 540 640 740 840 Wavelength (nm) Figure 11. Monochrome without Microlens Quantum Efficiency www.onsemi.com 13 940 1000 KAI−4011 Color (Bayer RGB) with Microlens* 0.50 0.45 Measured with Glass Absolute Quantum Efficiency 0.40 Red 0.35 Green Blue 0.30 0.25 0.20 0.15 0.10 0.05 0.00 400 500 600 700 800 Wavelength (nm) Figure 12. Color Quantum Efficiency *Not recommended for new designs. www.onsemi.com 14 900 1000 KAI−4011 Angular Quantum Efficiency For the curves marked “Horizontal”, the incident light angle is varied in a plane parallel to the HCCD. For the curves marked “Vertical”, the incident light angle is varied in a plane parallel to the VCCD. Monochrome with Microlens 100 Relative Quantum Efficiency (%) 90 Vertical 80 70 60 50 Horizontal 40 30 20 10 0 0 5 10 15 20 25 30 Angle (degress) Figure 13. Angular Quantum Efficiency Dark Current vs. Temperature 100,000 10,000 Electrons/Second VCCD 1,000 100 Photodiodes 10 1 1000/T(K) 2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 T (C) 97 84 72 60 50 40 30 21 Figure 14. Dark Current vs. Temperature www.onsemi.com 15 KAI−4011 Power-Estimated Right Output Disabled 400 Output Power One Output (mW) 350 Vertical Power (mW) Horizonatl Power (mW) Power (mW) 300 Total Power One Output (mW) 250 200 150 100 50 0 0 5 10 15 20 25 30 Horizontal Clock Frequency (MHz) Figure 15. Power Frame Rates 30 25 Dual 2x2 binning Frame Rate (fps) 20 15 Dual output or Single 2x2 binning 10 Single output 5 0 10 15 20 25 Pixel Clock (MHz) Figure 16. Frame Rates www.onsemi.com 16 30 35 40 KAI−4011 DEFECT DEFINITIONS Table 7. DEFECT DEFINITIONS Definition Maximum Temperature(s) Tested at (5C) Notes Major Dark Field Defective Pixel Defect ≥ 74 mV 40 27, 40 1 Major Bright Field Defective Pixel Defect ≥ 10% 40 27, 40 1 Minor Dark Field Defective Pixel Defect ≥ 38 mV 400 27, 40 Defect ≥ 80% 5 27, 40 1 Description Dead Pixel Starurated Pixel Defect ≥ 170 mV 10 27, 40 1 Cluster Defect A group of 2 to 10 contiguous major defective pixels, but no more than 2 adjacent defects horizontally. 8 27, 40 1 Column Defect A group of more than 10 contiguous major defective pixels along a single column. 0 27, 40 1 1. There will be at least two non-defective pixels separating any two major defective pixels or clusters. Defect Map The defect map supplied with each sensor is based upon testing at an ambient (27°C) temperature. Minor point defects are not included in the defect map. All defective pixels are reference to pixel (1, 1) in the defect maps. www.onsemi.com 17 KAI−4011 TEST DEFINITIONS Test Regions of Interest Active Area ROI: Center 100 by 100 ROI: Overclocking The test system timing is configured such that the sensor is overclocked in both the vertical and horizontal directions. See Figure 17 for a pictorial representation of the regions. Pixel (1, 1) to Pixel (2048, 2048) Pixel (974, 974) to Pixel (1073, 1073) Only the active pixels are used for performance and defect tests. H Horizontal Overclock Pixel 1,1 V Vertical Overclock Figure 17. Overclock Regions of Interest Tests Dark Field Center Non-Uniformity This test is performed under dark field conditions. Only the center 100 by 100 pixels of the sensor are used for this test − pixel (974, 974) to pixel (1073, 1073). Dark Field Center Uniformity + Standard Deviation of Center 100 by 100 Pixels in mW Units: mV rms calculated as the maximum signal found minus the minimum signal level found. Dark Field Global Non-Uniformity This test is performed under dark field conditions. The sensor is partitioned into 256 sub regions of interest, each of which is 128 by 128 pixels in size. The average signal level of each of the 256 sub regions of interest is calculated. The signal level of each of the sub regions of interest is calculated using the following formula: Global Non-Uniformity This test is performed with the imager illuminated to a level such that the output is at 70% of saturation (approximately 448 mV). Prior to this test being performed the substrate voltage has been set such that the charge capacity of the sensor is 640 mV. Global non−uniformity is defined as: Signal of ROI[i] + (ROI Average in ADU * * Horizontal Overclock Average in ADU) @ @ mV per Count Global Non−Uniformity + 100 @ Units : mVpp (millivolts Peak to Peak) ǒ Active Area Standard Deviation Active Area Signal Units : % rms Active Area Signal = Active Area Average − − Horizontal Overclock Average Where i = 1 to 256. During this calculation on the 256 sub regions of interest, the maximum and minimum signal levels are found. The dark field global non−uniformity is then www.onsemi.com 18 Ǔ KAI−4011 Global Peak to Peak Non-Uniformity This test is performed with the imager illuminated to a level such that the output is at 70% of saturation (approximately 448 mV). Prior to this test being performed the substrate voltage has been set such that the charge capacity of the sensor is 640 mV. The sensor is partitioned into 256 sub regions of interest, each of which is 128 by 128 pixels in size. The average signal level of each of the 256 sub regions of interest (ROI) is calculated. The signal level of each of the sub regions of interest is calculated using the following formula: Bright Field Defect Test This test is performed with the imager illuminated to a level such that the output is at 70% of saturation (approximately 28,000 electrons). Prior to this test being performed the substrate voltage has been set such that the charge capacity of the sensor is 40,000 electrons. The average signal level of all active pixels is found. The bright and dark thresholds are set as: A[i] + (ROI Average * Horizontal Overclock Average) The sensor is then partitioned into 256 sub regions of interest, each of which is 128 by 128 pixels in size. In each region of interest, the average value of all pixels is found. For each region of interest, a pixel is marked defective if it is greater than or equal to the median value of that region of interest plus the bright threshold specified or if it is less than or equal to the median value of that region of interest minus the dark threshold specified. Example for major bright field defective pixels: • Average value of all active pixels is found to be 448 mV (28,000 electrons). • Dark defect threshold: 448 mV ⋅ 15% = 67.2 mV. • Bright defect threshold: 448 mV ⋅ 15% = 67.2 mV. • Region of interest #1 selected. This region of interest is pixels 1, 1 to pixels 128, 128. ♦ Median of this region of interest is found to be 448 mV. ♦ Any pixel in this region of interest that is ≥ (448 + 67.2 mV) 515.2 mV in intensity will be marked defective. ♦ Any pixel in this region of interest that is ≤ (448 − 67.2 mV) 380.8 mV in intensity will be marked defective. • All remaining 255 sub regions of interest are analyzed for defective pixels in the same manner. Dark Defect Threshold = Active Area Signal @ Threshold Bright Defect Threshold = Active Area Signal @ Threshold Where i = 1 to 256. During this calculation on the 256 sub regions of interest, the maximum and minimum average signal levels are found. The global peak to peak non−uniformity is then calculated as: Global NonUniformity + 100 @ A[i] Max. Signal * A[i] Min. Signal Active Area Signal Units : % pp Active Area Signal = Active Area Average − − Horizontal Overclock Average Center Non-Uniformity This test is performed with the imager illuminated to a level such that the output is at 70% of saturation (approximately 448 mV). Prior to this test being performed the substrate voltage has been set such that the charge capacity of the sensor is 640 mV. Defects are excluded for the calculation of this test. This test is performed on the center 100 by 100 pixels (see Test Regions of Interest) of the sensor. Center non−uniformity is defined as: Center ROI Non−Uniformity + + 100 @ ǒ Center ROI Standard Deviation Center ROI Signal Ǔ Units : % rms Center ROI Signal = Center ROI Average − − Horizontal Overclock Average Dark Field Defect Test This test is performed under dark field conditions. The sensor is partitioned into 256 sub regions of interest, each of which is 128 by 128 pixels in size. In each region of interest, the median value of all pixels is found. For each region of interest, a pixel is marked defective if it is greater than or equal to the median value of that region of interest plus the defect threshold specified in “Defect Definitions” section. www.onsemi.com 19 KAI−4011 OPERATION Absolute Maximum Ratings Absolute maximum rating is defined as a level or condition that should not be exceeded at any time per the description. If the level or the condition is exceeded, the device will be degraded and may be damaged. Table 8. ABSOLUTE MAXIMUM RATINGS Description Symbol Minimum Maximum Units Notes Operating Temperature TOP −50 70 °C 1 Humidity RH 5 90 % 2 Output Bias Current IOUT 0.0 10 mA 3 10 pF 4 Off-Chip Load CL Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Noise performance will degrade at higher temperatures. 2. T = 25°C. Excessive humidity will degrade MTTF. 3. Each output. See Figure 18: Output Amplifier. Note that the current bias affects the amplifier bandwidth. 4. With total output load capacitance of CL = 10 pF between the outputs and AC ground. Table 9. MAXIMUM VOLTAGE RATINGS BETWEEN PINS Description Minimum Maximum Units RL, RR, H1S, H2S, H1BL, H2BL, H1BR, H2BR, OGR, OGL to ESD 0 17 V −17 17 V 0 25 V Pin to Pin with ESD Protection VDDL, VDDR to GND Notes 1 1. Pins with ESD protection are: RL, RR, H1S, H2S, H1BL, H2BL, H1BR, H2BR, OGL, and OGR. Table 10. DC BIAS OPERATING CONDITIONS Symbol Min. Nom. Max. Units Maximum DC Current Output Gate OG −4.0 −3.5 −3.0 V 1 mA Reset Drain RD 11.5 12.0 12.5 V 1 mA Output Amplifier Supply VDD 14.5 15.0 15.5 V 1 mA Ground GND 0.0 0.0 0.0 V Substrate SUB 8.0 VAB 17.0 V 1, 5 ESD Protection ESD −9.5 −9.0 −8.0 V 2 Output Bias Current IOUT 0.0 5.0 10.0 mA 4 Description Notes 3 1. The operating value of the substrate voltage, VAB, will be marked on the shipping container for each device. The value VAB is set such that the photodiode charge capacity is 40,000 electrons. 2. VESD must be equal to FDL and more negative than H1L, H2L and RL during sensors operation AND during camera power turn on. 3. One output, unloaded. The maximum DC current is for one output unloaded and is shown as Iss in Figure 18. This is the maximum current that the first two stages of one output amplifier will draw. This value is with Vout disconnected. 4. One output. 5. Refer to Application Note Using Interline CCD Image Sensors in High Intensity Visible Lighting Conditions. www.onsemi.com 20 KAI−4011 VDD Idd Floating Diffusion Iout VOUT Iss Source Follower #1 Source Follower #2 Figure 18. Output Amplifier www.onsemi.com 21 Source Follower #3 KAI−4011 AC Operating Conditions Table 11. CLOCK LEVELS Description Symbol Min. Nom. Max. Unit V2H 8.5 9.0 9.5 V Vertical CCD Clocks Midlevel V1M, V2M −0.2 0.0 0.2 V Vertical CCD Clocks Low V1L, V2L −9.5 −9.0 −8.5 V Horizontal CCD Clocks High H1H, H2H 0.0 0.5 1.0 V Horizontal CCD Clocks Low H1L, H2L −5.0 −4.5 −4.0 V Vertical CCD Clock High Reset Clock Amplitude RH V 1 Reset Clock Low RL −3.5 −3.0 −2.5 V 2 VSHUTTER 44 48 52 V 3 Fast Dump High FDH 4 5 5 V Fast Dump Low FDL −9.5 −9 −8 V Electronic Shutter Voltage 5.0 Notes 1. Reset amplitude must be set to 7.0 V for 80,000 electrons output in summed interlaced or binning modes. 2. Reset low level must be set to –5.0 V for 80,000 electrons output in summed interlaced or binning modes. 3. Refer to Application Note Using Interline CCD Image Sensors in High Intensity Visible Lighting Conditions. Clock Line Capacitances V1E H1SL+H1BL 5nF 20nF 50pF 25pF V1O H2SL+H2BL 20nF 5nF 20nF 5nF 50pF V2E H1SR+H1BR 50pF 25pF V2O H2SR+H2BR 5nF 20nF 50pF GND GND Reset SUB FD 10pF GND 4nF GND 40pF GND Figure 19. Clock Line Capacitances www.onsemi.com 22 KAI−4011 TIMING Table 12. TIMING REQUIREMENTS Description Symbol Min. Nom. Max. Units HCCD Delay tHD 1.3 1.5 10.0 ms VCCD Transfer Time tVCCD 1.3 1.5 20.0 ms Photodiode Transfer Time tV3rd 3.0 5.0 15.0 ms VCCD Pedestal Time t3P 50.0 60.0 80.0 ms VCCD Delay t3D 10.0 20.0 80.0 Reset Pulse Time tR 2.5 5.0 Shutter Pulse Time tS 3.0 4.0 10.0 ms Shutter Pulse Delay tSD 1.0 1.5 10.0 ms HCCD Clock Period tH 25.0 50.0 200.0 ns VCCD Rise/Fall Time tVR 0.0 0.1 1.0 ms Fast Dump Gate Delay tFD 0.5 Vertical Clock Edge Alignment tVE 0.0 100.0 ns ms ns ms Timing Modes Progressive Scan Photodiode CCD Shift Register 7 6 5 4 3 2 1 0 Output HCCD Figure 20. Progressive Scan Operation In progressive scan read out every pixel in the image sensor is read out simultaneously. Each charge packet is transferred from the photodiode to the neighboring vertical CCD shift register simultaneously. The maximum useful signal output is limited by the photodiode charge capacity to 40,000 electrons. www.onsemi.com 23 KAI−4011 Vertical Frame Timing Line Timing Repeat for 2072 Lines Figure 21. Progressive Scan Flow Chart Summed Interlaced Scan 7 7 6 6 5 5 4 4 3 3 2 2 1 1 0 0 even field odd field Figure 22. Summed Interlaced Scan Operation (equivalent to binning). To recover the full resolution of the image sensor two fields, even and odd, are read out. In the even field rows 0+1, 2+3, 4+5, … are summed together. In the odd field rows 1+2, 3+4, 5+6, … are summed together. The modulation transfer function (MTF) of the summed interlaced scan mode is less in the vertical direction than the progressive scan. But the dynamic range is twice that of progressive scan. The vertical MTF is better than a simple binning operation. In this mode the VCCD needs to be clocked for only 1037 rows to read out each field. In the summed interlaced scan read out mode, charge from two photodiodes is summed together inside the vertical CCD. The clocking of the VCCD is such that one pixel occupies the space equivalent to two pixels in the progressive scan mode. This allows the VCCD to hold twice as many electrons as in progressive scan mode. Now the maximum useful signal is limited by the charge capacity of two photodiodes at 80,000 electrons. If only one field is read out of the image sensor the apparent vertical resolution will be 1024 rows instead of the 2048 rows in progressive scan www.onsemi.com 24 KAI−4011 Summed Interlaced Even Frame Timing Summed Interlaced Odd Frame Timing Interlaced Line Timing Interlaced Line Timing Repeat for 1037 Lines Repeat for 1037 Lines Figure 23. Summed Interlaced Scan Flow Chart Non−Summed Interlaced Scan 7 7 6 6 5 5 4 4 3 3 2 2 1 1 0 0 even field odd field Figure 24. Non−Summed Interlaced Scan Operation maximum usable signal is still only 40,000 electrons. The large extra capacity of the VCCD causes the anti−blooming protection to be increased dramatically compared to the progressive scan. The vertical MTF is the same between the non−summed interlaced scan and progressive scan. There will be motion related artifacts in the images read out in the interlaced modes because the two fields are acquired at different times. In the non−summed interlaced scan mode only half the photodiode are read out in each field. In the even field rows 0, 2, 4, … are transferred to the VCCD. In the odd field rows 1, 3, 5, … are transferred to the VCCD. When the charge packet is transferred from a photodiode is occupies the equivalent of two rows in progressive scan mode. This allows the VCCD to hold twice as much charge a progressive scan mode. However, since only one photodiode for each row is transferred to the VCCD the www.onsemi.com 25 KAI−4011 Non−Summed Interlaced Even Frame Timing Non−Summed Interlaced Odd Frame Timing Interlaced Line Timing Interlaced Line Timing Repeat for 1037 Lines Repeat for 1037 Lines Figure 25. Non−Summed Interlaced Scan Flow Chart www.onsemi.com 26 KAI−4011 Frame Timing Frame Timing without Binning − Progressive Scan V1 tL tV3rd tL V2 Line 2071 Line 2072 t3P t3D Line 1 H1 H2 Figure 26. Frame Timing without Binning Frame Timing for Vertical Binning by 2 − Progressive Scan V1 tL tV3rd tL 3 × tVCCD V2 Line 1035 Line 1036 t3P t3D H1 H2 Figure 27. Frame Timing for Vertical Binning by 2 www.onsemi.com 27 Line 1 KAI−4011 Frame Timing Non−Summed Interlaced Scan (Even) V1M V1E V1L V2H V2M V2E V2L V1M V1O V1L V2M V2O V2L ÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉ t V3rd H2 last odd line readout t V3rd t V3rd t VCCD horizontal retrace even frame timing vertical retrace Figure 28. Non−Summed Interlaced Scan Even Frame Timing www.onsemi.com 28 ÉÉÉÉ ÉÉÉÉ ÉÉÉÉ first even line readout KAI−4011 Frame Timing Non−Summed Interlaced Scan (Odd) V1M V1E V1L V2M V2E V2L V1M V1O V1L V2H V2O V2M V2L t V3rd t V3rd t V3rd t ÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉ VCCD H2 last even line readout horizontal retrace odd frame timing vertical retrace Figure 29. Non−Summed Interlaced Scan Odd Frame Timing www.onsemi.com 29 ÉÉÉÉ ÉÉÉÉ ÉÉÉÉ first odd line readout KAI−4011 Frame Timing Summed Interlaced Scan (Even) V1M V1E V1L V2H V2M V2E V2L V1M V1O V1L V2H V2O V2M V2L t H2 3P t V3rd t 3D t VCCD t VCCD t VCCD t VCCD t VCCD t VCCD t VCCD ÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉ last odd line readout ÉÉÉÉ ÉÉÉÉ horizontal retrace even frame timing vertical retrace Figure 30. Summed Interlaced Scan Even Frame Timing www.onsemi.com 30 first even line readout KAI−4011 Frame Timing Summed Interlaced Scan (Odd) V1M V1E V1L V2H V2M V2E V2L V1M V1O V1L V2H V2O V2M V2L t 3P t V3rd t 3D t VCCD t VCCD t VCCD t VCCD t VCCD t VCCD t VCCD ÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉ ÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉ H2 last even line readout odd frame timing vertical retrace horizontal retrace ÉÉÉÉ ÉÉÉÉ first odd line readout Figure 31. Summed Interlaced Scan Odd Frame Timing Frame Timing Edge Alignment V1M V1 V1L V2H V2M V2 tVE V2L Figure 32. Frame Timing Edge Alignment www.onsemi.com 31 KAI−4011 Line Timing Line Timing Single Output − Progressive Scan tL V1 tVCCD V2 tHD H1 H2 2122 2123 2124 1067 1068 2098 1063 1065 2097 1062 2095 2096 1061 2094 2093 44 43 42 41 39 40 14 13 11 12 1 Pixel Count 2 R Figure 33. Line Timing Single Output Line Timing Dual Output − Progressive Scan tL V1 tVCCD V2 tHD H1 H2 Figure 34. Line Timing Dual Output www.onsemi.com 32 1064 1060 1059 1058 44 43 42 41 40 39 14 13 12 11 1 Pixel Count 2 R KAI−4011 Line Timing Vertical Binning by 2 − Progressive Scan tL V1 3 × tVCCD V2 tHD H1 H2 Figure 35. Line Timing Vertical Binning by 2 Line Timing Detail − Progressive Scan V1 tVCCD V2 1/2 tH tHD H1 H2 R Figure 36. Line Timing Detail www.onsemi.com 33 2124 2123 2122 2098 2097 2096 2095 2094 2093 44 43 42 41 39 40 14 13 11 12 1 Pixel Count 2 R KAI−4011 Line Timing Binning by 2 Detail − Progressive Scan V1 V2 1/2 tH tVCCD tVCCD tVCCD H1 H2 R Figure 37. Line Timing Binning by 2 Detail Line Timing Interlaced Modes V1E V2E V1O V2O H2 t VCCD Figure 38. Line Timing Interlaced Modes www.onsemi.com 34 tHD KAI−4011 Line Timing Edge Alignment tVCCD V1 V2 tVE tVE NOTE: Applies to all modes. Figure 39. Line Timing Edge Alignment www.onsemi.com 35 KAI−4011 Pixel Timing V1 V2 H1 H2 Pixel Count 11 1 12 13 39 40 41 R Vout Dummy Pixels Light Shielded Pixels Photosensitive Pixels Figure 40. Pixel Timing Pixel Timing Detail tR RH R RL H1H H1 H1L H2H H2 H2L VOUT Figure 41. Pixel Timing Detail www.onsemi.com 36 KAI−4011 Fast Line Dump Timing fFD fV1 fV2 tFD tVCCD tFD tVCCD fH1 fH2 Figure 42. Fast Line Dump Timing www.onsemi.com 37 KAI−4011 Electronic Shutter Electronic Shutter Line Timing fV1 tVCCD fV2 tHD VSHUTTER tS VSUB tSD fH1 fH2 fR Figure 43. Electronic Shutter Line Timing Electronic Shutter − Integration Time Definition fV2 Integration Time VSHUTTER VSUB Figure 44. Integration Time Definition Electronic Shutter − DC and AC Bias Definition The figure below shows the DC bias (VSUB) and AC clock (VES) applied to the SUB pin. Both the DC bias and AC clock are referenced to ground. VSHUTTER SUB GND GND Figure 45. DC Bias and AC Clock Applied to the SUB Pin www.onsemi.com 38 KAI−4011 Large Signal Output Electronic Shutter Description The voltage on the substrate (SUB) determines the charge capacity of the photodiodes. When SUB is 8 V the photodiodes will be at their maximum charge capacity. Increasing VSUB above 8 V decreases the charge capacity of the photodiodes until 48 V when the photodiodes have a charge capacity of zero electrons. Therefore, a short pulse on SUB, with a peak amplitude greater than 48 V, empties all photodiodes and provides the electronic shuttering action. It may appear the optimal substrate voltage setting is 8 V to obtain the maximum charge capacity and dynamic range. While setting VSUB to 8 V will provide the maximum dynamic range, it will also provide the minimum anti-blooming protection. The KAI−4011 VCCD has a charge capacity of 60,000 electrons (60 ke−). If the SUB voltage is set such that the photodiode holds more than 60 ke−, then when the charge is transferred from a full photodiode to VCCD, the VCCD will overflow. This overflow condition manifests itself in the image by making bright spots appear elongated in the vertical direction. The size increase of a bright spot is called blooming when the spot doubles in size. The blooming can be eliminated by increasing the voltage on SUB to lower the charge capacity of the photodiode. This ensures the VCCD charge capacity is greater than the photodiode capacity. There are cases where an extremely bright spot will still cause blooming in the VCCD. Normally, when the photodiode is full, any additional electrons generated by photons will spill out of the photodiode. The excess electrons are drained harmlessly out to the substrate. There is a maximum rate at which the electrons can be drained to the substrate. If that maximum rate is exceeded, (for example, by a very bright light source) then it is possible for the total amount of charge in the photodiode to exceed the VCCD capacity. This results in blooming. The amount of anti-blooming protection also decreases when the integration time is decreased. There is a compromise between photodiode dynamic range (controlled by VSUB) and the amount of anti-blooming protection. A low VSUB voltage provides the maximum dynamic range and minimum (or no) anti-blooming protection. A high VSUB voltage provides lower dynamic range and maximum anti-blooming protection. The optimal setting of VSUB is written on the container in which each KAI−4011 is shipped. The given VSUB voltage for each sensor is selected to provide anti-blooming protection for bright spots at least 100 times saturation, while maintaining at least 40 ke− of dynamic range. The electronic shutter provides a method of precisely controlling the image exposure time without any mechanical components. If an integration time of tINT is desired, then the substrate voltage of the sensor is pulsed to at least 40 V tINT seconds before the photodiode to VCCD transfer pulse on V2. Use of the electronic shutter does not have to wait until the previously acquired image has been completely read out of the VCCD. When the image sensor is operated in the binned or summed interlaced modes there will be more than 40,000 electrons in the output signal. The image sensor is designed with a 16 mV/e charge to voltage conversion on the output. This means a full signal of 40,000 electrons will produce a 640 mV change on the output amplifier. The output amplifier was designed to handle an output swing of 640 mV at a pixel rate of 40 MHz. If 80,000 electron charge packets are generated in the binned or summed interlaced modes then the output amplifier output will have to swing 1,280 mV. The output amplifier does not have enough bandwidth (slew rate) to handle 1,280 mV at 40 MHz. Hence, the pixel rate will have to be reduced to 20 MHz if the full dynamic range of 80,000 electrons is desired. The charge handling capacity of the output amplifier is also set by the reset clock voltage levels. The reset clock driver circuit is very simple if an amplitude of 5 V is used. But the 5 V amplitude restricts the output amplifier charge capacity to 40,000 electrons. If the full dynamic range of 80,000 electrons is desired then the reset clock amplitude will have to be increased to 7 V. If you only want a maximum signal of 40,000 electrons in binned or summed interlaced modes, then a 40 MHz pixel rate with a 5 V reset clock may be used. The output of the amplifier will be unpredictable above 40,000 electrons so be sure to set the maximum input signal level of your analog to digital converter to the equivalent of 40,000 electrons (640 mV). www.onsemi.com 39 KAI−4011 STORAGE AND HANDLING Table 13. STORAGE CONDITIONS Description Symbol Minimum Maximum Unit Notes Storage Temperature TST −55 80 °C 1 Humidity RH 5 90 % 2 1. Long-term exposure toward the maximum temperature will accelerate color filter degradation. 2. T = 25°C. Excessive humidity will degrade MTTF. For information on ESD and cover glass care and cleanliness, please download the Image Sensor Handling and Best Practices Application Note (AN52561/D) from www.onsemi.com. For quality and reliability information, please download the Quality & Reliability Handbook (HBD851/D) from www.onsemi.com. For information on device numbering and ordering codes, please download the Device Nomenclature technical note (TND310/D) from www.onsemi.com. For information on environmental exposure, please download the Using Interline CCD Image Sensors in High Intensity Lighting Conditions Application Note (AND9183/D) from www.onsemi.com. For information on Standard terms and Conditions of Sale, please download Terms and Conditions from www.onsemi.com. For information on soldering recommendations, please download the Soldering and Mounting Techniques Reference Manual (SOLDERRM/D) from www.onsemi.com. www.onsemi.com 40 KAI−4011 MECHANICAL DRAWINGS Completed Assembly Notes: 1. See Ordering Information for marking code. 2. The cover glass is manually placed and aligned. Dimensions Units: IN [MM] Figure 46. Completed Assembly www.onsemi.com 41 KAI−4011 Die to Package Alignment Notes: 1. Center of image is offset from center of package by coordinates (−0.157, 0.000) mm nominal. 2. Die is aligned within ±1 degree of any package cavity edge. Dimensions Units: IN [MM] Figure 47. Die to Package Alignment www.onsemi.com 42 KAI−4011 Glass Notes: 1. Materials: Substrate − Schott D236T eco or equivalent 2. Epoxy − NCO−150HB Thickness: 0.002” − 0.005” 3. Dust, Scratch Specification − 10 microns max. 4. Multi−Layer Anti−Reflective Coating on 2 Sides: a.) Double Sided Reflectance: b.) Range (nm) 420−435 nm < 2.0% 435−630 nm < 0.8% 630−680 nm < 2.0% Units: IN [MM] Tolerance: Unless otherwise specified ±1% no less than 0.004″ Figure 48. Glass Drawing www.onsemi.com 43 KAI−4011 Glass Transmission 100 90 80 Transmission (%) 70 60 50 40 30 20 10 0 200 300 400 500 600 700 800 900 Wavelength (nm) Figure 49. Glass Transmission ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. 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ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor 19521 E. 32nd Pkwy, Aurora, Colorado 80011 USA Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada Email: orderlit@onsemi.com ◊ N. American Technical Support: 800−282−9855 Toll Free USA/Canada Europe, Middle East and Africa Technical Support: Phone: 421 33 790 2910 Japan Customer Focus Center Phone: 81−3−5817−1050 www.onsemi.com 44 ON Semiconductor Website: www.onsemi.com Order Literature: http://www.onsemi.com/orderlit For additional information, please contact your local Sales Representative KAI−4011/D