LV5113T-TLM-E

LV5113T-TLM-E

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    MSOP-8

  • 描述:

    IC BATT PROTECTION LI-ION 8MSOP

  • 数据手册
  • 价格&库存
LV5113T-TLM-E 数据手册
UPDATE CHANGE NOTIFICATION # 20303 Generic Copy Issue Date: 24-Jun-2014 TITLE: Update Change Notification to IPCN20303 for Assembly and Test site change of MSOP8 package. PROPOSED FIRST SHIP DATE: 24-Nov-2014 AFFECTED CHANGE CATEGORY(S): Assembly and Test site ADDITIONAL RELIABILITY DATA: Contact your local ON Semiconductor Sales Office or SAMPLES: Contact your local ON Semiconductor Sales Office or FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact your local ON Semiconductor Sales Office or NOTIFICATION TYPE: Update Change Notification to IPCN ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact . DESCRIPTION AND PURPOSE: IPCN20303 announced MSOP8 package will be transferred by closing of Kanto Sanyo Semiconductor Co., Ltd (KSS) to SGC Industries Malaysia Sdn Bhd (SBN) and will be integrated with MICRO8 package. However, as a result of having examined it again, MSOP8 will transfer it from KSS to ON Semiconductor SSMP Philippines Corporation. As for this the materials and package outline of these products will remain identical. The product name does not change, too. We apologize for any inconvenience this has caused. Qualification tests are designed to show that the reliability of transferred devices will continue to meet or exceed ON Semiconductor standards. The completed qualification and characterization data will be included in the Final Product/Process Change Notification (FPCN). Issue Date: 24-Jun-2014 Rev. 06-Jan-2010 Page 1 of 2 UPDATE CHANGE NOTIFICATION #20303 QUALIFICATION PLAN: Reliability Test was planned as below. Reliability Test Results will be provided in the FPCN. Test Items Test Condition Test Time Temperature Humidity Bias ※ Ta=85dC, RH=85%, Vcc=Recommended Temperature Cycle ※ Ta=-65dC(30min)  Ta=150dC(30min) Pressure Cooker ※ Ta=121dC, RH=100%, 205kPa High Temperature Storage Ta=150dC 1000h Resistance to Soldering heat (Reflow soldering) 255dC,10s(Peak260dC) 2times 1000h 100Cycles 96h Notices: The test items with * mark are put into operation after the reflow soldering (at 255C for 10seconds MSL3) Judgment Criteria:Judgment Criteria are due to the limits of the electrical characteristics in the detail specification. List of affected General Parts: LV5113T-TLM-E LV51130T-TLM-E LV51131T-TLM-E Issue Date: 24-Jun-2014 Rev. 06-Jan-2010 Page 2 of 2
LV5113T-TLM-E 价格&库存

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