MC74HC377A
Octal D Flip-Flop with
Common Clock and Enable
High−Performance Silicon−Gate CMOS
The MC74HC377A is identical in pinout to the LS273. The device
inputs are compatible with standard CMOS outputs; with pullup
resistors, they are compatible with LSTTL outputs.
This device consists of eight D flip−flops with common Clock and
Enable (E) inputs. Each flip−flop is loaded with a low−to−high
transition of the Clock input. Enable (E) is active low.
Features
•
•
•
•
•
•
•
•
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MARKING
DIAGRAMS
20
SOIC−20
DW SUFFIX
CASE 751D
20
Output Drive Capability: 10 LSTTL Loads
Outputs Directly Interface to CMOS, NMOS and TTL
Operating Voltage Range: 2.0 to 6.0 V
Low Input Current: 1.0 mA
High Noise Immunity Characteristic of CMOS Devices
In Compliance with the Requirements Defined by JEDEC Standard
No. 7A
Chip Complexity: 264 FETs or 66 Equivalent Gates
These are Pb−Free Devices
1
HC377A
AWLYYWWG
1
20
HC
377A
ALYWG
G
TSSOP−20
DT SUFFIX
CASE 948E
20
1
1
A
= Assembly Location
WL, L
= Wafer Lot
YY, Y
= Year
WW, W = Work Week
G
= Pb−Free Package
G
= Pb−Free Package
(Note: Microdot may be in either location)
PIN ASSIGNMENT
E
1
20
VCC
Q0
2
19
Q7
D0
3
18
D7
D1
4
17
D6
Q1
5
16
Q6
Q2
6
15
Q5
D2
7
14
D5
D3
8
13
D4
Q3
9
12
Q4
10
11
CLOCK
GND
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
© Semiconductor Components Industries, LLC, 2010
February, 2010 − Rev. 1
1
Publication Order Number:
MC74HC377A/D
MC74HC377A
D0
D1
D2
DATA
INPUTS
D3
D4
D5
D6
D7
CLOCK
E
3
2
4
5
7
6
8
9
13
12
14
15
17
16
18
19
11
Q1
Inputs
Operating
Modes
Q2
Q3
Q4
NONINVERTING
OUTPUTS
Q5
Q6
Q7
PIN 20 = VCC
PIN 10 = GND
1
Figure 1. Logic Diagram
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FUNCTION TABLE
Q0
Outputs
Clock
E
Dn
Qn
Load “1”
↑
l
h
H
Load “0”
↑
l
l
L
Hold (Do Nothing)
↑
X
h
H
X
X
No Change
No Change
H = HIGH voltage level
h = HIGH voltage level one setup time prior to the LOW−to−
HIGH CP transition
L = LOW voltage level
l = LOW voltage level one setup time prior to the LOW−to−HIGH
CP transition
↑ = LOW−to−HIGH CP transition
X = Don’t Care
Design Criteria
Value
Units
Internal Gate Count*
66
ea
Internal Gate Propagation Delay
1.5
ns
Internal Gate Power Dissipation
5.0
mW
.0075
pJ
Speed Power Product
*Equivalent to a two−input NAND gate.
ORDERING INFORMATION
Package
Shipping†
MC74HC377ADWG
SOIC−20 WIDE
(Pb−Free)
38 Units / Rail
MC74HC377ADWR2G
SOIC−20 WIDE
(Pb−Free)
1000 Tape & Reel
Device
MC74HC377ADTG
TSSOP−20*
75 Units / Rail
MC74HC377ADTR2G
TSSOP−20*
2500 Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*This package is inherently Pb−Free.
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2
MC74HC377A
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MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
–0.5 to + 7.0
V
DC Input Voltage (Referenced to GND)
–0.5 to VCC + 0.5
V
DC Output Voltage (Referenced to GND)
–0.5 to VCC + 0.5
V
VCC
DC Supply Voltage (Referenced to GND)
Vin
Vout
Iin
DC Input Current, per Pin
±20
mA
Iout
DC Output Current, per Pin
± 25
mA
ICC
DC Supply Current, VCC and GND Pins
PD
Power Dissipation in Still Air
Tstg
Storage Temperature
± 50
mA
500
450
mW
–65 to +150
°C
SOIC Package†
TSSOP Package†
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress
ratings only. Functional operation above the Recommended Operating Conditions is not implied.
Extended exposure to stresses above the Recommended Operating Conditions may affect device
reliability.
†Derating − SOIC Package: – 7 mW/°C from 65° to 125°C
TSSOP Package: − 6.1 mW/°C from 65° to 125°C
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RECOMMENDED OPERATING CONDITIONS
Symbol
VCC
Vin, Vout
Parameter
DC Supply Voltage (Referenced to GND)
DC Input Voltage, Output Voltage (Referenced to GND)
TA
Operating Temperature, All Package Types
tr, tf
Input Rise and Fall Time
(Figure 2)
VCC = 2.0 V
VCC = 4.5 V
VCC = 6.0 V
Min
Max
Unit
2.0
6.0
V
0
VCC
V
–55
+125
°C
0
0
0
1000
500
400
ns
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3
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high−impedance circuit. For proper operation, Vin and
Vout should be constrained to the
range GND v (Vin or Vout) v VCC.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or VCC).
Unused outputs must be left open.
MC74HC377A
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DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Test Conditions
VCC
V
–55 to
25°C
v 85°C
v 125°C
Unit
Symbol
Parameter
VIH
Minimum High−Level Input Voltage
Vout = VCC – 0.1 V
|Iout| ≤ 20 mA
2.0
3.0
4.5
6.0
1.5
2.1
3.15
4.2
1.5
2.1
3.15
4.2
1.5
2.1
3.15
4.2
V
VIL
Maximum Low−Level Input Voltage
Vout = 0.1 V
|Iout| ≤ 20 mA
2.0
3.0
4.5
6.0
0.5
0.9
1.35
1.8
0.5
0.9
1.35
1.8
0.5
0.9
1.35
1.8
V
VOH
Minimum High−Level Output
Voltage
Vin = VIH
|Iout| ≤ 20 mA
2.0
4.5
6.0
1.9
4.4
5.9
1.9
4.4
5.9
1.9
4.4
5.9
V
4.5
6.0
3.98
5.48
3.84
5.34
3.7
5.2
2.0
4.5
6.0
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
4.5
6.0
0.26
0.26
0.33
0.33
0.4
0.4
Vin = VIH
VOL
Maximum Low−Level Output
Voltage
|Iout| ≤ 4.0 mA
|Iout| ≤ 5.2 mA
Vin = VIL
|Iout| ≤ 20 mA
Vin = VIL
|Iout| ≤ 4.0 mA
|Iout| ≤ 5.2 mA
V
Iin
Maximum Input Leakage Current
Vin = VCC or GND
6.0
±0.1
±1.0
±1.0
mA
ICC
Maximum Quiescent Supply
Current (per Package)
Vin = VCC or GND
Iout = 0 mA
6.0
4.0
40
160
mA
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4
MC74HC377A
AC Electrical Characteristics (CL = 50 pF, Input tr, tf = 6.0 ns)
Guaranteed Limits
Symbol
Parameter
tPHL, tPLH
Maximum Propagation Delay
Clock to Qn
Figures 2, 4
Maximum Output Transition
Time
Figures 2, 4
tTHL, tTLH
tW
tsu
tsu
th
th
fmax
Cin
CPD
(Note 1)
Test Conditions
Minimum Clock Pulse Width
High or Low
Figure 2
Minimum Set−up Time
Dn to Clock
Figure 3
Minimum Set−up Time
Enable to Clock
Figure 3
Minimum Hold Time
Dn to Clock
Figure 3
Minimum Hold Time
Enable to Clock
Figure 3
Maximum Clock Pulse
Frequency (50% duty cycle)
Figures 2, 4
Maximum Input Capacitance
VCC (V)
−555C to
255
≤ 855C
≤ 1255C
Unit
2.0
160
200
240
ns
4.5
32
40
48
6.0
27
34
41
2.0
75
95
110
4.5
15
19
22
6.0
13
16
19
2.0
80
100
120
4.5
16
20
24
6.0
4
17
20
2.0
60
75
90
4.5
12
15
18
6.0
10
13
15
2.0
60
75
90
4.5
12
15
18
6.0
10
13
15
2.0
3
3
3
4.5
3
3
3
6.0
3
3
3
2.0
4
4
4
4.5
4
4
4
6.0
4
4
4
2.0
6
5
4
4.5
30
24
20
6.0
35
28
24
−
10
10
10
Typical @ 255C, VCC = 5.0 V
Power Dissipation Capacitance
35
1. CPD is defined as the value of the IC’s equivalent capacitance from which the operating current can be calculated from:
ICC(operating) [ CPD x VCC x fIN x NSW where NSW = total number of outputs switching and fIN = switching frequency.
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5
ns
ns
ns
ns
ns
ns
ns
pF
pF
MC74HC377A
SWITCHING WAVEFORMS
E
tr
CLOCK
tf
50%
50%
VCC
90%
50%
10%
tw
tsu
GND
th
VCC
50%
DATA
1/fmax
tPLH
Q
GND
tsu
tPHL
th
VCC
90%
50%
10%
CLOCK
50%
GND
tTLH
tTHL
Figure 3.
Figure 2.
C
D0
3
D
C
D1
4
D
C
D2
TEST POINT
D
C
OUTPUT
DEVICE
UNDER
TEST
7
CL*
DATA
INPUTS
D3
8
D
C
D4
13
D
C
*Includes all probe and jig capacitance
D5
14
D
C
Figure 4. Test Circuit
D6
D7
CLOCK
E
17
18
D
C
D
Q
Q
Q
Q
Q
Q
Q
Q
2
5
6
9
12
15
16
19
11
1
Figure 5. Expanded Logic Diagram
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6
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
NONINVERTING
OUTPUTS
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
SOIC−20 WB
CASE 751D−05
ISSUE H
DATE 22 APR 2015
SCALE 1:1
A
20
q
X 45 _
M
E
h
0.25
H
NOTES:
1. DIMENSIONS ARE IN MILLIMETERS.
2. INTERPRET DIMENSIONS AND TOLERANCES
PER ASME Y14.5M, 1994.
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 PER SIDE.
5. DIMENSION B DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE PROTRUSION
SHALL BE 0.13 TOTAL IN EXCESS OF B
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
11
B
M
D
1
10
20X
B
b
0.25
M
T A
S
B
DIM
A
A1
b
c
D
E
e
H
h
L
q
S
L
A
18X
e
SEATING
PLANE
A1
c
T
GENERIC
MARKING DIAGRAM*
RECOMMENDED
SOLDERING FOOTPRINT*
20
20X
20X
1.30
0.52
20
XXXXXXXXXXX
XXXXXXXXXXX
AWLYYWWG
11
1
11.00
1
XXXXX
A
WL
YY
WW
G
10
1.27
PITCH
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
DOCUMENT NUMBER:
DESCRIPTION:
MILLIMETERS
MIN
MAX
2.35
2.65
0.10
0.25
0.35
0.49
0.23
0.32
12.65
12.95
7.40
7.60
1.27 BSC
10.05
10.55
0.25
0.75
0.50
0.90
0_
7_
98ASB42343B
SOIC−20 WB
= Specific Device Code
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “G”, may
or may not be present. Some products may
not follow the Generic Marking.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 1
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MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
TSSOP−20 WB
CASE 948E
ISSUE D
DATE 17 FEB 2016
SCALE 2:1
20X
0.15 (0.006) T U
2X
L
K REF
0.10 (0.004)
S
L/2
20
M
T U
S
V
ÍÍÍÍ
ÍÍÍÍ
ÍÍÍÍ
K
K1
S
J J1
11
B
SECTION N−N
−U−
PIN 1
IDENT
0.25 (0.010)
N
1
10
M
0.15 (0.006) T U
S
A
−V−
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE MOLD
FLASH, PROTRUSIONS OR GATE BURRS.
MOLD FLASH OR GATE BURRS SHALL NOT
EXCEED 0.15 (0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE
INTERLEAD FLASH OR PROTRUSION.
INTERLEAD FLASH OR PROTRUSION
SHALL NOT EXCEED 0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08
(0.003) TOTAL IN EXCESS OF THE K
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE
DETERMINED AT DATUM PLANE −W−.
N
F
DETAIL E
−W−
C
G
D
H
DETAIL E
0.100 (0.004)
−T− SEATING
PLANE
DIM
A
B
C
D
F
G
H
J
J1
K
K1
L
M
MILLIMETERS
MIN
MAX
6.40
6.60
4.30
4.50
--1.20
0.05
0.15
0.50
0.75
0.65 BSC
0.27
0.37
0.09
0.20
0.09
0.16
0.19
0.30
0.19
0.25
6.40 BSC
0_
8_
INCHES
MIN
MAX
0.252
0.260
0.169
0.177
--0.047
0.002
0.006
0.020
0.030
0.026 BSC
0.011
0.015
0.004
0.008
0.004
0.006
0.007
0.012
0.007
0.010
0.252 BSC
0_
8_
GENERIC
MARKING DIAGRAM*
SOLDERING FOOTPRINT
7.06
XXXX
XXXX
ALYWG
G
1
0.65
PITCH
16X
0.36
16X
1.26
DOCUMENT NUMBER:
98ASH70169A
DESCRIPTION:
TSSOP−20 WB
A
L
Y
W
G
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
(Note: Microdot may be in either location)
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “ G”,
may or may not be present.
DIMENSIONS: MILLIMETERS
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 1
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