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MM74HCT00MX

MM74HCT00MX

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    SOICN-14_8.65X3.9MM

  • 描述:

    IC GATE NAND 4CH 2-INP 14SOIC

  • 数据手册
  • 价格&库存
MM74HCT00MX 数据手册
Revised January 2005 MM74HCT00 Quad 2 Input NAND Gate General Description Features The MM74HCT00 is a NAND gates fabricated using advanced silicon-gate CMOS technology which provides the inherent benefits of CMOS—low quiescent power and wide power supply range. This device is input and output characteristic and pin-out compatible with standard 74LS logic families. All inputs are protected from static discharge damage by internal diodes to VCC and ground. ■ TTL, LS pin-out and threshold compatible ■ Fast switching: tPLH, tPHL=14 ns (typ) ■ Low power: 10 µW at DC ■ High fan out, 10 LS-TTL loads MM74HCT devices are intended to interface between TTL and NMOS components and standard CMOS devices. These parts are also plug-in replacements for LS-TTL devices and can be used to reduce power consumption in existing designs. Ordering Code: Order Number Package Package Description Number MM74HCT00M M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow MM74HCT00MX_NL M14A Pb-Free 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow MM74HCT00SJ M14D Pb-Free 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide MM74HCT00MTC MTC14 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide MM74HCT00MTCX_NL MTC14 Pb-Free 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide MM74HCT00N N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide MM74HCT00N_NL N14A Pb-Free 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Pb-Free package per JEDEC J-STD-020B. Connection Diagram Logic Diagram Pin Assignments for DIP, SOIC, SOP and TSSOP (1 of 4 gates) Top View © 2005 Fairchild Semiconductor Corporation DS005356 www.fairchildsemi.com MM74HCT00 Quad 2 Input NAND Gate February 1984 MM74HCT00 Absolute Maximum Ratings(Note 1) Recommended Operating Conditions (Note 2) −0.5 to +7.0V Supply Voltage (VCC) DC Input Voltage (VIN) −1.5 to VCC+1.5V DC Output Voltage (VOUT) −0.5 to VCC+0.5V Clamp Diode Current (IIK, IOK) ±20 mA DC Output Current, per pin (IOUT) ±25 mA DC VCC or GND Current, per pin (ICC) ±50 mA Storage Temperature Range (TSTG) Supply Voltage (VCC) DC Input or Output Voltage 600 mW 500 mW 5.5 Units V 0 VCC V −40 +85 °C 500 ns Input Rise or Fall Times −65°C to +150°C S.O. Package only Max 4.5 (VIN, VOUT) Operating Temperature Range (TA) (tr, tf) Power Dissipation (PD) (Note 3) Min Note 1: Absolute Maximum Ratings are those values beyond which damage to the device may occur. Note 2: Unless otherwise specified all voltages are referenced to ground. Note 3: Power Dissipation temperature derating — plastic “N” package: − 12 mW/°C from 65°C to 85°C. Lead Temperature (TL) 260°C (Soldering 10 seconds) DC Electrical Characteristics VCC = 5V ± 10% (unless otherwise specified) Symbol VIH Parameter TA = 25°C Conditions Typ Minimum HIGH Level TA = −40 to 85°C TA = -55 to 125°C Guaranteed Limits Units 2.0 2.0 2.0 V 0.8 0.8 0.8 V Input Voltage VIL Maximum LOW Level Input Voltage VOH VOL Minimum HIGH Level VIN = VIH or VIL Output Voltage |IOUT| = 20 µA VCC VCC−0.1 VCC−0.1 VCC−0.1 V |IOUT| = 4.0 mA, VCC = 4.5V 4.2 3.98 3.84 3.7 V |IOUT| = 4.8 mA, VCC = 5.5V 5.2 4.98 4.84 4.7 V Maximum LOW Level Voltage IIN ICC VIN = VIH |IOUT| = 20 µA 0 0.1 0.1 0.1 V |IOUT| = 4.0 mA, VCC = 4.5V 0.2 0.26 0.33 0.4 V |IOUT| = 4.8 mA, VCC = 5.5V 0.2 Maximum Input VIN = VCC or GND, Current VIH or VIL Maximum Quiescent VIN = VCC or GND, Supply Current IOUT = 0 µA VIN = 2.4V or 0.5V (Note 4) 0.18 Note 4: This is measured per input with all other inputs held at VCC or ground. www.fairchildsemi.com 2 0.26 0.33 0.4 V ±0.05 ±0.5 ±1.0 µA 1.0 10 40 µA 0.3 0.4 0.5 mA VCC = 5.0V, tr = tr = 6 ns, CL = 15 pF, TA = 25°C (unless otherwise noted) Symbol tPLH, tPHL Parameter Conditions Maximum Propagation Typ Guaranteed Limit Units 14 18 ns Delay AC Electrical Characteristics VCC = 5.0V ±10%, tr = tf = 6 ns, CL = 50 pF (unless otherwise noted) Symbol Parameter TA = 25°C Conditions Typ TA = −40 to 85°C TA = −55 to 125°C Guaranteed Limits Units tPLH, tPHL Maximum Propagation Delay 18 23 29 35 ns tTHL, tTLH Maximum Output Rise & Fall Time 8 15 19 22 ns CPD Power Dissipation Capacitance CIN Input Capacitance 10 10 10 pF (Note 5) 30 5 pF Note 5: CPD determines the no load dynamic power consumption, PD = CPD VCC2 f + ICC VCC, and the no load dynamic current consumption, IS = CPD VCC f + ICC. 3 www.fairchildsemi.com MM74HCT00 AC Electrical Characteristics MM74HCT00 Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow Package Number M14A www.fairchildsemi.com 4 MM74HCT00 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) Pb-Free 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M14D 5 www.fairchildsemi.com MM74HCT00 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide Package Number MTC14 www.fairchildsemi.com 6 MM74HCT00 Quad 2 Input NAND Gate Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide Package Number N14A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 7 www.fairchildsemi.com
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