3.3 V Differential 1:21
Differential Fanout Clock
Driver with HCSL level
Output
NB4N121K
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Description
The NB4N121K is a Clock differential input fanout distribution 1 to
21 HCSL level differential outputs, optimized for ultra low
propagation delay variation. The NB4N121K is designed with HCSL
clock distribution for FBDIMM applications in mind.
Inputs can accept differential LVPECL, CML, or LVDS levels.
Single−ended LVPECL, CML, LVCMOS or LVTTL levels are
accepted with the proper VREFAC supply (see Figures 5, 10, 11, 12,
and 13). Clock input pins incorporate an internal 50 W on die
termination resistors.
Output drive current at IREF (Pin 1) for 1X load is selected by
connecting to GND. To drive a 2X load, connect IREF to VCC. See
Figure 9.
The NB4N121K specifically guarantees low output–to–output
skews. Optimal design, layout, and processing minimize skew within
a device and from device to device. System designers can take
advantage of the NB4N121K’s performance to distribute low skew
clocks across the backplane or the motherboard.
QFN−52
MN SUFFIX
CASE 485M
1
MARKING DIAGRAM*
52
1
NB4N
121K
AWLYYWWG
A
WL
YY
WW
G
Features
• Typical Input Clock Frequency 100, 133, 166, 200, 266, 333 and
400 MHz
• 340 ps Typical Rise and Fall Times
• 800 ps Typical Propagation Delay
• Dtpd 100 ps Maximum Propagation Delay Variation Per Each
•
•
•
•
Differential Pair
Additive Phase RMS Jitter: 1 ps Max
Operating Range: VCC = 3.0 V to 3.6 V with VEE = 0 V
Differential HCSL Output Level (700 mV Peak−to−Peak)
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
52
= Assembly Site
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
*For additional marking information, refer to
Application Note AND8002/D.
Q0
Q0
VTCLK
Q1
Q1
CLK
CLK
Q19
Q19
VTCLK
Q20
VCC
GND
RREF
IREF
Q20
Figure 1. Pin Configuration (Top View)
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 8 of this data sheet.
© Semiconductor Components Industries, LLC, 2012
May, 2021 − Rev. 7
1
Publication Order Number:
NB4N121K/D
VCC
Q0
Q0
Q1
Q1
Q2
Q2
Q3
Q3
Q4
Q4
Q5
Q5
52
51
50
49
48
47
46
45
44
43
42
41
40
NB4N121K
Exposed Pad (EP)
IREF
1
39
VCC
GND
2
38
Q6
VTCLK
3
37
Q6
CLK
4
36
Q7
CLK
5
35
Q7
VTCLK
6
34
Q8
VCC
7
33
Q8
Q20
8
32
Q9
Q20
9
31
Q9
Q19
10
30
Q10
Q19
11
29
Q10
Q18
12
28
Q11
Q18
13
27
Q11
18
19
20
21
22
23
24
25
Q15
Q15
Q14
Q14
Q13
Q13
Q12
Q12
26
17
Q16
VCC
16
15
Q17
Q16
14
Q17
NB4N121K
Figure 2. Pinout Configuration (Top View)
Table 1. PIN DESCRIPTION
Pin
Name
I/O
Description
1
IREF
Output
2
GND
−
Supply Ground. GND pin must be externally connected to power supply
to guarantee proper operation.
3, 6
VTCLK,
VTCLK
−
Internal 50 W Termination Resistor connection Pins. In the differential
configuration when the input termination pins are connected to the common termination voltage, and if no signal is applied then the device may
be susceptible to self−oscillation.
4
CLK
LVPECL Input
CLOCK Input (TRUE)
5
CLK
LVPECL Input
CLOCK Input (INVERT)
7, 26, 39, 52
VCC
−
8, 10, 12, 14, 16, 18, 20, 22,
24, 27, 29, 31, 33, 35, 37, 40,
42, 44, 46, 48, 50
Q[20−0]
HCSL Output
Output (INVERT)
9, 11, 13, 15, 17, 19, 21, 23,
25, 28, 30, 32, 34, 36, 38, 41,
43, 45, 47, 49, 51
Q[20−0]
HCSL Output
Output (TRUE)
Exposed Pad
EP
GND
Output current programming pin to select load drive. For 1X
configuration, connect IREF to GND, or for 2X configuration, connect
IREF to VCC (See Figure 9).
Positive Supply pins. VCC pins must be externally connected to a power
supply to guarantee proper operation.
Exposed Pad. The thermally exposed pad (EP) on package bottom (see
case drawing) must be attached to a sufficient heat−sinking conduit for
proper thermal operation. (Note 1)
1. The exposed pad must be connected to the circuit board ground.
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2
NB4N121K
Table 2. ATTRIBUTES
Characteristic
Value
Input Default State Resistors
None
ESD Protection
Human Body Model
Machine Model
>2 kV
400 V
Moisture Sensitivity (Note 2)
QFN−52
Level 1
Flammability Rating Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
Transistor Count
622
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
2. For additional information, see Application Note AND8003/D.
Table 3. MAXIMUM RATINGS (Note 3)
Parameter
Symbol
VCC
VI
Condition 1
Condition 2
Rating
Unit
Positive Power Supply
GND = 0 V
4.6
V
Positive Input
GND = 0 V
GND − 0.3 ≤ VI ≤ VCC
V
VCC
V
50
100
mA
mA
−40 to +70
°C
VINPP
Differential Input Voltage
|CLK − CLKb|
IOUT
Output Current
Continuous
Surge
TA
Operating Temperature Range
QFN−52
Tstg
Storage Temperature Range
−65 to +150
°C
qJA
Thermal Resistance (Junction−to−Ambient) (Note 3)
0 lfpm
500 lfpm
QFN−52
QFN−52
25
19.6
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
2S2P (Note 4)
QFN−52
21
°C/W
Tsol
Wave Solder
265
°C
Pb−Free
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
3. JEDEC standard 51−6, multilayer board − 2S2P (2 signal, 2 power).
4. JEDEC standard multilayer board − 2S2P (2 signal, 2 power) with 8 filled thermal vias under exposed pad.
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3
NB4N121K
Table 4. DC CHARACTERISTICS (VCC = 3.0 V to 3.6 V, TA = −40°C to +70°C Note 5)
Symbol
IGND
Characteristic
GND Supply Current (All Outputs Loaded)
ICC
Power Supply Current (All Outputs Loaded)
IIH
Input HIGH Current CLKx, CLKx
IIL
Input LOW Current CLKx, CLKx
Min
Typ
Max
Unit
70
98
120
mA
1X
2X
420
780
2.0
−150
mA
150
−2.0
mA
mA
DIFFERENTIAL INPUT DRIVEN SINGLE−ENDED (Figures 5 and 7)
Vth
Input Threshold Reference Voltage Range (Note 6)
1050
VCC − 150
mV
VIH
Single−Ended Input HIGH Voltage
Vth + 150
VCC
mV
VIL
Single−Ended Input LOW Voltage
GND
Vth − 150
mV
DIFFERENTIAL INPUTS DRIVEN DIFFERENTIALLY (Figures 6 and 8)
VIHD
Differential Input HIGH Voltage
1200
VCC
mV
VILD
Differential Input LOW Voltage
GND
VCC − 75
mV
VID
Differential Input Voltage (VIHD − VILD)
75
2400
mV
1163
VCC − 75
VCMR
Input Common Mode Range
HCSL OUTPUTS (Figure 4)
VOH
Output HIGH Voltage
600
740
900
mV
VOL
Output LOW Voltage
−150
0
150
mV
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm.
5. Input parameters vary 1:1 with VCC. Measurements taken with outputs in either 1X (all outputs loaded 50 W to GND) or 2X (all outputs loaded
25 W to GND) configuration, see Figure 9. For 1X configuration, connect IREF to GND, or for 2X configuration, connect IREF to VCC.
6. Vth is applied to the complementary input when operating in single ended mode.
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4
NB4N121K
Table 5. AC CHARACTERISTICS VCC = 3.0 V to 3.6 V, GND = 0 V; −40°C to +70°C (Note 7)
Symbol
VOUTPP
tPLH,
tPHL
Characteristic
Min
Output Voltage Amplitude (@ VINPPmin)
fin = 133 MHz
fin = 166 MHz
fin = 200 MHz
Propagation Delay to (See Figure 3)
CLK/CLK to Qx/Qx
550
Typ
Max
Unit
725
725
725
900
900
900
mV
800
950
ps
DtPLH,
DtPHL
Propagation Delay Variations Variation Per Each Diff Pair CLK/CLK to Qx/Qx (Note 8)
(See Figure 3)
100
ps
tSKEW
Duty Cycle Skew (Note 9)
Within−Device Skew, 1X Mode Only (Note 10)
Within−Device Skew, 2X Mode (Note 10)
Device−to−Device Skew (Note 10)
20
50
80
150
ps
ps
ps
ps
1
ps
550
mV
150
mV
700
ps
tjit(f)
Vcross
DVcross
tr, tf
Dtr, Dtf
Additive RMS Phase RMS (Note 11) fin =133 MHz to 200 MHz
Absolute Crossing Magnitude Voltage
250
Variation in Magnitude of Vcross
Absolute Magnitude in Output Risetime and Falltime
(From 175 mV to 525 mV)
Qx, Qx
Variation in Magnitude of Risetime and Falltime (Single−Ended)
(See Figure 4)
Qx, Qx
175
340
1X
2X
ps
125
150
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm.
7. Measured by forcing VINPP (MIN) from a 50% duty cycle clock source. Measurements taken with outputs in either 1X (all outputs loaded 50 W
to GND) or 2X (all outputs loaded 25 W to GND) configuration, see Figure 9. For 1X configuration, connect IREF to GND, or for 2X
configuration, connect IREF to VCC. Typical gain is 20 dB.
8. Measured from the input pair crosspoint to each single output pair crosspoint across temp and voltage ranges.
9. Duty cycle skew is measured between differential outputs using the deviations of the sum of Tpw− and Tpw+.
10. Skew is measured between outputs under identical transition @ 133 MHz.
11. Additive RMS jitter with 50% duty cycle clock signal using phase noise integrated from 12 KHz to 33 MHz
CLK
VINPP = VIH(CLK) − VIL(CLK)
= VIH(CLK) − VIL(CLK)
CLK
tPLH
tPHL
Q
VOUTPP = VOH(Q) − VOL(Q)
= VOH(Q) − VOL(Q)
Q
DtPLH
DtPHL
Figure 3. AC Reference Measurement
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5
NB4N121K
525 mV
DVCROSS
VCROSS
175 mV
tr
tf
Figure 4. HCSL Output Parameter Characteristics
CLK
CLK
CLK
CLK
Vth
Vth
Figure 5. Differential Input Driven
Single−Ended (Vth = VREFAC)
VCC
Vthmax
Figure 6. Differential Inputs Driven
Differentially
VCC
VCMmax
VIHmax
VILmax
Vth
Vthmin
GND
VIH
Vth
VIL
VCMR
VIHDmax
VILDmax
VID = VIHD − VILD
VIHDtyp
VILDtyp
VIHmin
VCMmin
VILmin
GND
Figure 7. Vth Diagram
VIHDmin
VILDmin
Figure 8. VCMR Diagram
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6
NB4N121K
Qx
RS1C
1X Load
Z0 = 50 W
Receiver
HCSL
Driver
RS2C
Z0 = 50 W
Qx
RL1B
50
RL2B
50
CL1D
2 pF
CL2D
2 pF
RREFA
2X Load Option
A. For 1X configuration, connect IREF pin
to GND or for 2X configuration, connect
IREF pin to VCC. To adjust load drive for
1X configuration, use RREF from 0 W to
1 kW, to adjust 2X load, use 20 kW to
50 kW.
B. RL1, RL2: 50 W for 1X Load
25 W for 2X Load
C. RS1, RS2: 0 W for Test and
Evaluation. Select to Minimizing Ringing.
D. CL1, CL2, CL3, CL4: Receiver Input
Simulation Load Capacitance Only
Receiver 2
CL3D
2 pF
CL4D
2 pF
Figure 9. Typical Termination Configuration for Output Driver and Device Evaluation
CLx for Test Only (Representing Receiver Input Loading); Not Added to Application
VCC = 3.3 V
VCC = 3.3 V
Z0 = 50 W
LVPECL
Driver
VCC = 3.3 V
Z0 = 50 W
NB4N121K
D
50 W*
VTCLK
LVDS
Driver
VTCLK
Z0 = 50 W
50 W*
D
NB4N121K
D
50 W*
VTCLK
VTCLK
Z0 = 50 W
50 W*
D
VTCLK = VTCLK
VTCLK = VTCLK = VCC − 2.0 V
GND
VCC = 3.3 V
GND
GND
GND
*RTIN, Internal Input Termination Resistor
*RTIN, Internal Input Termination Resistor
Figure 10. LVPECL Interface
Figure 11. LVDS Interface
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7
NB4N121K
VCC
VCC
Z0 = 50 W
VCC
CML
Driver
VCC
NB4N121K
D
50 W*
Z0 = 50 W
VTCLK
LVCMOS/
LVTTL
Driver
VTCLK
Z0 = 50 W
VCC
50 W*
D
VTCLK
VTCLK
50 W*
D
Vth
VTCLK = VTCLK = VCC
GND
NB4N121K
D
50 W*
GND
VTCLK = OPEN
VTCLK = OPEN
D = Vth
GND
*RTIN, Internal Input Termination Resistor
GND
*RTIN, Internal Input Termination Resistor
Figure 12. Standard 50 W Load CML Interface
Figure 13. LVCMOS/LVTTL Interface
VCC
VDR
INTQb
INTQ
Q
Qb
Figure 14. HCSL Output Structure
ORDERING INFORMATION
Device
Package
Shipping†
NB4N121KMNR2G
QFN−52
(Pb−Free)
2000 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
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8
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
QFN52 8x8, 0.5P
CASE 485M−01
ISSUE C
1
52
D
SCALE 2:1
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS
3. DIMENSION b APPLIES TO PLATED TERMINAL
AND IS MEASURED BETWEEN 0.25 AND 0.30
MM FROM TERMINAL.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
A
ÉÉÉÉ
ÉÉÉÉ
ÉÉÉÉ
ÉÉÉÉ
PIN ONE
REFERENCE
DATE 16 FEB 2010
B
DIM
A
A1
A2
A3
b
D
D2
E
E2
e
K
L
E
2X
0.15
C
2X
0.15 C
A2
0.10 C
GENERIC MARKING
DIAGRAM
A
0.08 C
SEATING PLANE
A3
A1
1
REF
C
XXXXXXXXX
XXXXXXXXX
AWLYYWWG
D2
14
52 X
L
26
27
13
XXXXXXXXX
A
WL
YY
WW
G
E2
39
1
52 X
K
MILLIMETERS
MIN
MAX
0.80
1.00
0.00
0.05
0.60
0.80
0.20 REF
0.18
0.30
8.00 BSC
6.50
6.80
8.00 BSC
6.50
6.80
0.50 BSC
0.20
--0.30
0.50
52
40
e
52 X
b
= Device Code
= Assembly Site
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
RECOMMENDED
SOLDERING FOOTPRINT
NOTE 3
0.10 C A B
8.30
0.05 C
52X
0.62
6.75
6.75
PKG
OUTLINE
DOCUMENT NUMBER:
DESCRIPTION:
98AON12057D
52 PIN QFN, 8X8, 0.5P
0.50
PITCH
8.30
52X
0.30
DIMENSIONS: MILLIMETERS
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
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