NBA3N206SDG

NBA3N206S 3.3 V Automotive Grade M-LVDS Driver Receiver Description The NBA3N206S is a 3.3 V supply differential Multipoint Low Voltage (M−LVDS) line Driver and Receiver for automotive applications. NBA3N206S offers the Type 2 receiver threshold at 0.1 V. The NBA3N206S has Type−2 receivers that detect the bus state with as little as 50 mV of differential input voltage over a common−mode voltage range of −1 V to 3.4 V. Type−2 receivers include an offset threshold to provide a detectable voltage under open−circuit, idle−bus, and other faults conditions. NBA3N206S supports Simplex or Half Duplex bus configurations. Features • Low−Voltage Differential 30 W to 55 W Line Drivers and Receivers for Signaling Rates Up to 200 Mbps • Type−2 Receivers Provide an Offset (100 mV) Threshold to Detect • • • • • • • • Open−Circuit and Idle−Bus Conditions Controlled Driver Output Voltage Transition Times for Improved Signal Quality −1 V to 3.4 V Common−Mode Voltage Range Allows Data Transfer With up to 2 V of Ground Noise Bus Pins High Impedance When Disabled or VCC ≤ 1.5 V M−LVDS Bus Power Up/Down Glitch Free Operating range: VCC = 3.3 ±10% V( 3.0 to 3.6 V) Operation from –40°C to +125°C. AEC−Q100 Qualified and PPAP Capable These are Pb−Free Devices www.onsemi.com MARKING DIAGRAM 8 8 1 SOIC−8 D SUFFIX CASE 751 NA206 AYWW G 1 NA206 A Y WW G or G = Specific Device Code = Assembly Location = Year = Work Week = Pb−Free Package ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 17 of this data sheet. Applications • • • • • • Low−Power High−Speed Short−Reach Alternative to TIA/EIA−485 Backplane or Cabled Multipoint Data and Clock Transmission Cellular Base Stations Central−Office Switches Network Switches and Routers Automotive © Semiconductor Components Industries, LLC, 2015 October, 2015 − Rev. 3 1 Publication Order Number: NBA3N206S/D NBA3N206S R 1 8 VCC RE 2 7 B DE 3 6 A D 4 5 GND SOIC−8 Figure 1. Logic Diagram Figure 2. Pinout Diagram (Top View) Table 1. PIN DESCRIPTION Number Name I/O Type Open Default Description 1 R LVCMOS Output 2 RE LVCMOS Input High Receiver Enable Input Pin (LOW = Active, HIGH = High Z Output) 3 DE LVCMOS Input Low Driver Enable Input Pin (LOW = High Z Output, HIGH=Active) 4 D LVCMOS Input 5 GND 6 A M−LVDS Input /Output Transceiver True Input /Output Pin 7 B M−LVDS Input /Output Transceiver Invert Input /Output Pin 8 VCC Receiver Output Pin Driver Input Pin Ground Supply pin. Pin must be connected to power supply to guarantee proper operation. Power Supply pin. Pin must be connected to power supply to guarantee proper operation. Table 2. DEVICE FUNCTION TABLE Inputs TYPE 2 Receiver DRIVER Output VID = VA − VB RE R VID w 150 mV L H 50 mV < VID < 150 mV L ? VID ≤ 50 mV L L X H Z X Open Z Open L L Input Enable Output D DE A/Y B/Z L H L H H H H L Open H L H X Open Z Z X L Z Z H = High, L = Low, Z = High Impedance, X = Don’t Care, ? = Indeterminate www.onsemi.com 2 NBA3N206S Table 3. ATTRIBUTES (Note 1) Characteristics ESD Protection Value Human Body Model (JEDEC Standard 22, Method A114−A) A, B All Pins ±6 kV ±2 kV Machine Model All Pins ±200 V Charged –Device Model (JEDEC Standard 22, Method C101) All Pins ±1500 V Moisture Sensitivity, Indefinite Time Out of Drypack (Note 1) Level 1 Flammability Rating Oxygen Index UL−94 code V−0 A 1/8” 28 to 34 Transistor Count 917 Devices Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test 1. For additional information, see Application Note AND8003/D. Table 4. MAXIMUM RATINGS Symbol Parameter VCC Supply Voltage VIN Input Voltage IOUT Condition 1 Rating Unit −0.5 ≤ VCC ≤ 4.0 V D, DE, RE −0.5 ≤ VIN ≤ 4.0 V A, B −1.8 ≤ VIN ≤ 4.0 R A, B −0.3 ≤ IOUT ≤ 4.0 −1.8 ≤ IOUT ≤ 4.0 V −40 to ≤ +125 °C −65 to +150 °C Output Voltage Condition 2 TA Operating Temperature Range, Industrial Tstg Storage Temperature Range θJA Thermal Resistance (Junction−to−Ambient) 0 lfpm 500 lfpm SOIC−8 190 130 °C/W °C/W θJC Thermal Resistance (Junction−to−Case) (Note 2) SOIC−8 41 to 44 °C/W Tsol Wave Solder 265 °C PD Power Dissipation (Continuous) 725 5.8 377 mW mW/°C mW TA = 25°C 25°C < TA < 125°C TA = 125°C Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 2. JEDEC standard multilayer board − 2S2P (2 signal, 2 power). www.onsemi.com 3 NBA3N206S Table 5. DC CHARACTERISTICS VCC = 3.3 ±10% V( 3.0 to 3.6 V), GND = 0 V, TA = −40°C to +125°C (See Notes 4, 5) Characteristic Symbol ICC Min Power Supply Current Receiver Disabled Driver Enabled RE and DE at VCC, RL = 50 W, All others open Driver and Receiver Disabled RE at VCC, DE at 0 V, RL = No Load, All others open Driver and Receiver Enabled RE at 0 V, DE at VCC, RL = 50 W, All others open Receiver Enabled Driver Disabled RE at 0 V, DE at 0 V, RL = 50 W, All others open Typ Max 13 1 16 22 4 24 13 Unit mA VIH Input HIGH Voltage 2 VCC V VIL Input LOW Voltage GND 0.8 V VBUS Voltage at any bus terminal VA, VB, VY or VZ −1.4 3.8 V |VID| Magnitude of differential input voltage 0.05 VCC Differential output voltage magnitude (see Figure 4) 440 690 mV D|VAB| Change in Differential output voltage magnitude between logic states (see Figure 4) −50 50 mV VOS(SS) Steady state common mode output voltage (see Figure 5) 0.8 1.2 V Change in Steady state common mode output voltage between logic states (see Figure 5) −50 50 mV 150 mV 2.4 V DRIVER |VAB| DVOS(SS) VOS(PP) Peak−to−peak common−mode output voltage (see Figure 5) VAOC Maximum steady−state open−circuit output voltage (see Figure 9) 0 VBOC Maximum steady−state open−circuit output voltage (see Figure 9) 0 VP(H) Voltage overshoot, low−to−high level output (see Figure 7) VP(L) Voltage overshoot, high−to−low level output (see Figure 7) 2.4 V 1.2 VSS V −0.2 VSS V IIH High−level input current (D, DE) VIH = 2 V 0 10 uA IIL Low−level input current (D, DE) VIL = 0.8 V 0 10 uA JIOSJ 24 mA IOZ Differential short−circuit output current magnitude (see Figure 6) High−impedance state output current (driver only) −1.4 V ≤ (VA or VB) ≤ 3.8 V, other output at 1.2 V −15 10 uA IO(OFF) Power−off output current (0 V ≤ VCC ≤ 1.5 V) −1.4 V ≤ (VA or VB) ≤ 3.8 V, other output at 1.2 V −10 10 uA RECEIVER VIT+ Positive−going Differential Input voltage Threshold (See Figure 11 & Table 8) mV Type 2 VIT− Negative−going Differential Input voltage Threshold (See Figure 11 & Table 8) mV Type 2 VHYS 150 50 Differential Input Voltage Hysteresis (See Figure 11 and Table 2) mV Type 2 0 VOH High−level output voltage (IOH = –8 mA VOL Low−level output voltage (IOL = 8 mA) IIH RE High-level input current (VIH = 2 V) −10 IIL RE Low-level input current (VIL = 0.8 V) IOZ High−impedance state output current (VO = 0 V of 3.6 V) CA / CB 2.4 V 0 mA −10 0 mA −10 15 mA Input Capacitance VI = 0.4 sin(30E6πt) + 0.5 V, other outputs at 1.2 V using HP4194A impedance analyzer (or equivalent) CAB Differential Input Capacitance VAB = 0.4 sin(30E6πt) V, other outputs at 1.2 V using HP4194A impedance analyzer (or equivalent) CA/B Input Capacitance Balance, (CA/CB) 3 99 www.onsemi.com 4 V 0.4 pF 2.5 pF 101 % NBA3N206S Table 5. DC CHARACTERISTICS VCC = 3.3 ±10% V( 3.0 to 3.6 V), GND = 0 V, TA = −40°C to +125°C (See Notes 4, 5) Symbol Characteristic Typ (Note 4) Min Max Unit BUS INPUT AND OUTPUT IA Input Current Receiver or Transceiver with Driver Disabled uA VA = 3.8 V, VB = 1.2 V VA = 0.0 V or 2.4 V, VB = 1.2 V VA = −1.4 V, VB = 1.2 V IB IAB IA(OFF) IB(OFF) IAB(OFF) 0 −20 −32 32 20 0 VB = 3.8 V, VA = 1.2 V VB = 0.0 V or 2.4 V, VA = 1.2 V VB = −1.4 V, VA = 1.2 V 0 −20 −32 32 20 0 Differential Input Current Receiver or Transceiver with driver disabled (IA−IB) VA = VB , −1.4 ≤ VA ≤ 3.8 V −4 4 Input Current Receiver or Transceiver Power Off 0V ≤ VCC ≤ 1.5 and: VA = 3.8 V, VB = 1.2 V VA = 0.0 V or 2.4 V, VB = 1.2 V VA = −1.4 V, VB = 1.2 V 0 −20 −32 32 20 0 Input Current Receiver or Transceiver Power Off 0V ≤ VCC ≤ 1.5 and: VB = 3.8 V, VA = 1.2 V VB = 0.0 V or 2.4 V, VA = 1.2 V VB = −1.4 V, VA = 1.2 V 0 −20 −32 32 20 0 Receiver Input or Transceiver Input/Output Power Off Differential Input Current; (IA−IB) VA = VB , 0 ≤ VCC ≤ 1.5 V, −1.4 ≤ VA ≤ 3.8 V −4 4 Input Current Receiver or Transceiver with Driver Disabled uA uA uA uA uA CA Transceiver Input Capacitance with Driver Disabled VA = 0.4 sin(30E6πt) + 0.5 V using HP4194A impedance analyzer (or equivalent); VB = 1.2 V 5 pF CB Transceiver Input Capacitance with Driver Disabled VB = 0.4 sin(30E6πt) + 0.5 V using HP4194A impedance analyzer (or equivalent); VA = 1.2 V 5 pF CAB Transceiver Differential Input Capacitance with Driver Disabled VA = 0.4 sin(30E6pt) + 0.5 V using HP4194A impedance analyzer (or equivalent); VB = 1.2 V CA/B Transceiver Input Capacitance Balance with Driver Disabled, (CA/CB) 99 3.0 pF 101 % NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. 3. See Figure 3. DC Measurements reference. 4. Typ value at 25°C and 3.3 VCC supply voltage. Table 6. DRIVER AC CHARACTERISTICS VCC = 3.3 ±10% V( 3.0 to 3.6 V), GND = 0 V, TA = −40°C to +125°C (Note 5) Symbol Characteristic Min Typ Max Unit 1.0 1.5 2.4 ns tPLH / tPHL Propagation Delay (See Figure 7) tPHZ / tPLZ Disable Time HIGH or LOW state to High Impedance (See Figure 8) 7 ns tPZH / tPZL Enable Time High Impedance to HIGH or LOW state (See Figure 8) 7 ns 150 ps 1 ns tSK(P) Pulse Skew (|tPLH − tPHL|) (See Figure 7) 0 tSK(PP) Device to Device Skew similar path and conditions (See Figure 7) tJIT(PER) Period Jitter RMS, 100 MHz (Source tr/tf 0.5 ns, 10 and 90 % points, 30k samples. Source jitter de−embedded from Output values ) (See Figure 10) 2 3.5 ps tJIT(PP) Peak−to−peak Jitter, 200 Mbps 215−1 PRBS (Source tr/tf 0.5 ns, 10 and 90% points, 100k samples. Source jitter de−embedded from Output values) (See Figure 10) 30 150 ps 1.6 ns tr / tf Differential Output rise and fall times (See Figure 7) 0.9 NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. 5. Typ value at 25°C and 3.3 VCC supply voltage. www.onsemi.com 5 NBA3N206S Table 7. RECEIVER AC CHARACTERISTICS VCC = 3.3 ±10% V( 3.0 to 3.6 V), GND = 0 V, TA = −40°C to +125°C (Note 6) Symbol Characteristic Min Typ Max Unit 2 4 6 ns Disable Time HIGH or LOW state to High Impedance (See Figure 13) 10 ns Enable Time High Impedance to HIGH or LOW state (See Figure 13) 18 ns tPLH / tPHL Propagation Delay (See Figure 12) tPHZ / tPLZ tPZH / tPZL tSK(P) Pulse Skew (|tPLH − tPHL|) (See Figure 14) CL = 5 pF ps 300 Type 2 tSK(PP) Device to Device Skew similar path and conditions (See Figure 12) CL = 5 pF tJIT(PER) Period Jitter RMS, 100 MHz (Source: VID = 200 mVpp, VID = 400 mVpp, VCM =1 V, tr/tf 0.5 ns, 10 and 90 % points, 30k samples. Source jitter de−embedded from Output values ) (See Figure 14) tJIT(PP) Peak−to−peak Jitter, 200 Mbps 215−1 PRBS (Source tr/tf 0.5 ns, 10% and 90% points, 100k samples. Source jitter de−embedded from Output values) (See Figure 14) Type 2 tr / tf Differential Output rise and fall times (See Figure 14) CL = 15 pF 6. Typ value at 25°C and 3.3 VCC supply voltage. . Figure 3. Driver Voltage and Current Definitions A. All resistors are 1% tolerance. Figure 4. Differential Output Voltage Test Circuit www.onsemi.com 6 4 500 1 ns 8 ps ps 450 1 900 2.3 ns NBA3N206S A. All input pulses are supplied by a generator having the following characteristics: tr or tf ≤ 1 ns, pulse frequency = 500 kHz, duty cycle = 50 ± 5%. B. C1, C2 and C3 include instrumentation and fixture capacitance within 2 cm of the D.U.T. and are 20% tolerance. C. R1 and R2 are metal film, surface mount, 1% tolerance, and located within 2 cm of the D.U.T. D. The measurement of VOS(PP) is made on test equipment with a –3 dB bandwidth of at least 1 GHz. Figure 5. Test Circuit and Definitions for the Driver Common−Mode Output Voltage Figure 6. Driver Short−Circuit Test Circuit A. All input pulses are supplied by a generator having the following characteristics: tr or tf≤ 1 ns, frequency = 500 kHz, duty cycle = 50 ±5%. B. C1, C2, and C3 include instrumentation and fixture capacitance within 2 cm of the D.U.T. and are 20%. C. R1 is a metal film, surface mount, and 1% tolerance and located within 2 cm of the D.U.T. D. The measurement is made on test equipment with a −3 dB bandwidth of at least 1 GHz. Figure 7. Driver Test Circuit, Timing, and Voltage Definitions for the Differential Output Signal www.onsemi.com 7 NBA3N206S A. All input pulses are supplied by a generator having the following characteristics: tr or tf≤ 1 ns, frequency = 500 kHz, duty cycle = 50 ±5%. B. C1, C2, C3, and C4 includes instrumentation and fixture capacitance within 2 cm of the D.U.T. and are 20%. C. R1 and R2 are metal film, surface mount, and 1% tolerance and located within 2 cm of the D.U.T. D. The measurement is made on test equipment with a −3 dB bandwidth of at least 1 GHz. Figure 8. Driver Enable and Disable Time Circuit and Definitions VA or VB Figure 9. Maximum Steady State Output Voltage www.onsemi.com 8 NBA3N206S A. All input pulses are supplied by an Agilent 8304A Stimulus System. B. The measurement is made on a TEK TDS6604 running TDSJIT3 application software C. Period jitter is measured using a 100 MHz 50 ±1% duty cycle clock input. D. Peak−to−peak jitter is measured using a 200 Mbps 215−1 PRBS input. Figure 10. Driver Jitter Measurement Waveforms Figure 11. Receiver Voltage and Current Definitions www.onsemi.com 9 NBA3N206S A. All input pulses are supplied by a generator having the following characteristics: tr or tf ≤ 1 ns, frequency = 50 MHz, duty cycle = 50 ±5%. CL is a combination of a 20%−tolerance, low−loss ceramic, surface−mount capacitor and fixture capacitance within 2 cm of the D.U.T. B. The measurement is made on test equipment with a –3 dB bandwidth of at least 1 GHz. Figure 12. Receiver Timing Test Circuit and Waveforms www.onsemi.com 10 NBA3N206S A. All input pulses are supplied by a generator having the following characteristics: tr or tf≤ 1 ns, frequency = 500 kHz, duty cycle = 50 ±5%. B. RL is 1% tolerance, metal film, surface mount, and located within 2 cm of the D.U.T. C. CL is the instrumentation and fixture capacitance within 2 cm of the DUT and 20%. Figure 13. Receiver Enable/Disable Time Test Circuit and Waveforms www.onsemi.com 11 NBA3N206S A. All input pulses are supplied by an Agilent 8304A Stimulus System. B. The measurement is made on a TEK TDS6604 running TDSJIT3 application software C. Period jitter is measured using a 100 MHz 50 ±1% duty cycle clock input. D. Peak−to−peak jitter is measured using a 200 Mbps 215−1 PRBS input. Figure 14. Receiver Jitter Measurement Waveforms Table 8. TYPE−2 RECEIVER INPUT THRESHOLD TEST VOLTAGES Applied Voltages Resulting Differential Input Voltage Resulting Common− Mode Input Voltage VIA VIB VID VIC Receiver Output (Note ) 2.400 0.000 2.400 1.200 H 0.000 2.400 –2.400 1.200 L 3.800 3.650 0.150 3.725 H 3.800 3.750 0.050 3.775 L –1.250 –1.400 0.150 –1.325 H –1.350 –1.400 0.050 –1.375 L H = high level, L = low level, output state assumes receiver is enabled (RE = L) www.onsemi.com 12 NBA3N206S A or B Figure 15. Equivalent Input and Output Schematic Diagrams www.onsemi.com 13 NBA3N206S APPLICATION INFORMATION Receiver Input Threshold (Failsafe) Type 2 receivers have their differential input voltage thresholds offset from zero volts to detect the absence of a voltage difference. The impact to receiver output by the offset input can be seen in Table 9 and Figure 16. The MLVDS standard defines a type 1 and type 2 receiver. Type 1 receivers include no provisions for failsafe and have their differential input voltage thresholds near zero volts. Table 9. RECEIVER INPUT VOLTAGE THRESHOLD REQUIREMENTS Receiver Type Output Low Output High Type 1 –2.4 V ≤ VID ≤ –0.05 V 0.05 V ≤ VID ≤ 2.4 V Type 2 –2.4 V ≤ VID ≤ 0.05 V 0.15 V ≤ VID ≤ 2.4 V NBA3N206S Figure 16. Receiver Differential Input Voltage Showing Transition Regions by Type LIVE INSERTION/GLITCH−FREE POWER UP/DOWN Figure 17 shows the performance of the receiver output pin, R (CHANNEL 2), as VCC (CHANNEL 1) is ramped. The glitch on the R pin is independent of the RE voltage. Any complications or issues from this glitch are easily resolved in power sequencing or system requirements that suspend operation until VCC has reached a steady state value. The NBA3N206S provides a glitch−free power up/down feature that prevents the M−LVDS outputs of the device from turning on during a power up or power down event. This is especially important in live insertion applications, when a device is physically connected to an M−LVDS multipoint bus and VCC is ramping. While the M−LVDS interface for these devices is glitch free on power up/down, the receiver output structure is not. www.onsemi.com 14 NBA3N206S Figure 17. M−LVDS Receiver Output: VCC (CHANNEL 1), R Pin (CHANNEL 2) Simplex Theory Configurations: Data flow is unidirectional and Point−to−Point from one Driver to one Receiver. NBA3N206S devices provide a high signal current allowing long drive runs and high noise immunity. Single terminated interconnects yield high amplitude levels. Parallel terminated interconnects yield typical MLVDS amplitude levels and minimizes reflections. See Figures 18 and 19. A NBA3N206S can be used as the driver or as a receiver. Figure 19. Parallel−Terminated Simplex Figure 18. Point−to−Point Simplex Single Termination Simplex Multidrop Theory Configurations: Data flow is unidirectional from one Driver with one or more Receivers Multiple boards required. Single terminated interconnects yield high amplitude levels. Parallel terminated interconnects yield typical MLVDS amplitude levels and minimizes reflections. On the Evaluation Test Board, Headers P1, P2, and P3 may be used as need to interconnect transceivers to a each other or a bus. See Figures 20 and 21. A NBA3N206S can be used as the driver or as a receiver. www.onsemi.com 15 NBA3N206S Figure 20. Multidrop or Distributed Simplex with Single Termination Figure 21. Multidrop or Distributed Simplex with Double Termination levels and minimizes reflections. Parallel terminated interconnects yield typical LMVDS amplitude levels and minimizes reflections. On the Test Board, Headers P1, P2, and P3 may be used as need to interconnect transceivers to each other or a bus. See Figure 22. A NBA3N206SDG can be used as the driver or as a receiver. Half Duplex Multinode Multipoint Theory Configurations: Data flow is unidirectional and selected from one of multiple possible Drivers to multiple Receivers. One “Two Node” multipoint connection can be accomplished with a single evaluation test board. More than Two Nodes requires multiple evaluation test boards. Parallel terminated interconnects yield typical MLVDS amplitude Figure 22. Multinode Multipoint Half Duplex (requires Double Termination) Figure 23. www.onsemi.com 16 NBA3N206S ORDERING INFORMATION Receiver Pin 1 Quadrant Package Shipping† NBA3N206SDG Type 2 Q1 SOIC*8 (Pb−Free) 98 Units / Rail NBA3N206SDR2G Type 2 Q1 SOIC*8 (Pb−Free) 2500 / Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. www.onsemi.com 17 MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS SOIC−8 NB CASE 751−07 ISSUE AK 8 1 SCALE 1:1 −X− DATE 16 FEB 2011 NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A AND B DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE. 5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. 751−01 THRU 751−06 ARE OBSOLETE. NEW STANDARD IS 751−07. A 8 5 S B 0.25 (0.010) M Y M 1 4 −Y− K G C N X 45 _ SEATING PLANE −Z− 0.10 (0.004) H M D 0.25 (0.010) M Z Y S X J S 8 8 1 1 IC 4.0 0.155 XXXXX A L Y W G IC (Pb−Free) = Specific Device Code = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package XXXXXX AYWW 1 1 Discrete XXXXXX AYWW G Discrete (Pb−Free) XXXXXX = Specific Device Code A = Assembly Location Y = Year WW = Work Week G = Pb−Free Package *This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G” or microdot “G”, may or may not be present. Some products may not follow the Generic Marking. 1.270 0.050 SCALE 6:1 INCHES MIN MAX 0.189 0.197 0.150 0.157 0.053 0.069 0.013 0.020 0.050 BSC 0.004 0.010 0.007 0.010 0.016 0.050 0 _ 8 _ 0.010 0.020 0.228 0.244 8 8 XXXXX ALYWX G XXXXX ALYWX 1.52 0.060 0.6 0.024 MILLIMETERS MIN MAX 4.80 5.00 3.80 4.00 1.35 1.75 0.33 0.51 1.27 BSC 0.10 0.25 0.19 0.25 0.40 1.27 0_ 8_ 0.25 0.50 5.80 6.20 GENERIC MARKING DIAGRAM* SOLDERING FOOTPRINT* 7.0 0.275 DIM A B C D G H J K M N S mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. STYLES ON PAGE 2 DOCUMENT NUMBER: DESCRIPTION: 98ASB42564B SOIC−8 NB Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 1 OF 2 onsemi and are trademarks of Semiconductor Components Industries, LLC dba onsemi or its subsidiaries in the United States and/or other countries. onsemi reserves the right to make changes without further notice to any products herein. onsemi makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. onsemi does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com SOIC−8 NB CASE 751−07 ISSUE AK DATE 16 FEB 2011 STYLE 1: PIN 1. EMITTER 2. COLLECTOR 3. COLLECTOR 4. EMITTER 5. EMITTER 6. BASE 7. BASE 8. EMITTER STYLE 2: PIN 1. COLLECTOR, DIE, #1 2. COLLECTOR, #1 3. COLLECTOR, #2 4. COLLECTOR, #2 5. BASE, #2 6. EMITTER, #2 7. BASE, #1 8. EMITTER, #1 STYLE 3: PIN 1. DRAIN, DIE #1 2. DRAIN, #1 3. DRAIN, #2 4. DRAIN, #2 5. GATE, #2 6. SOURCE, #2 7. GATE, #1 8. SOURCE, #1 STYLE 4: PIN 1. ANODE 2. ANODE 3. ANODE 4. ANODE 5. ANODE 6. ANODE 7. ANODE 8. COMMON CATHODE STYLE 5: PIN 1. DRAIN 2. DRAIN 3. DRAIN 4. DRAIN 5. GATE 6. GATE 7. SOURCE 8. SOURCE STYLE 6: PIN 1. SOURCE 2. DRAIN 3. DRAIN 4. SOURCE 5. SOURCE 6. GATE 7. GATE 8. SOURCE STYLE 7: PIN 1. INPUT 2. EXTERNAL BYPASS 3. THIRD STAGE SOURCE 4. GROUND 5. DRAIN 6. GATE 3 7. SECOND STAGE Vd 8. FIRST STAGE Vd STYLE 8: PIN 1. COLLECTOR, DIE #1 2. BASE, #1 3. BASE, #2 4. COLLECTOR, #2 5. COLLECTOR, #2 6. EMITTER, #2 7. EMITTER, #1 8. COLLECTOR, #1 STYLE 9: PIN 1. EMITTER, COMMON 2. COLLECTOR, DIE #1 3. COLLECTOR, DIE #2 4. EMITTER, COMMON 5. EMITTER, COMMON 6. BASE, DIE #2 7. BASE, DIE #1 8. EMITTER, COMMON STYLE 10: PIN 1. GROUND 2. BIAS 1 3. OUTPUT 4. GROUND 5. GROUND 6. BIAS 2 7. INPUT 8. GROUND STYLE 11: PIN 1. SOURCE 1 2. GATE 1 3. SOURCE 2 4. GATE 2 5. DRAIN 2 6. DRAIN 2 7. DRAIN 1 8. DRAIN 1 STYLE 12: PIN 1. SOURCE 2. SOURCE 3. SOURCE 4. GATE 5. DRAIN 6. DRAIN 7. DRAIN 8. DRAIN STYLE 13: PIN 1. N.C. 2. SOURCE 3. SOURCE 4. GATE 5. DRAIN 6. DRAIN 7. DRAIN 8. DRAIN STYLE 14: PIN 1. N−SOURCE 2. N−GATE 3. P−SOURCE 4. P−GATE 5. P−DRAIN 6. P−DRAIN 7. N−DRAIN 8. N−DRAIN STYLE 15: PIN 1. ANODE 1 2. ANODE 1 3. ANODE 1 4. ANODE 1 5. CATHODE, COMMON 6. CATHODE, COMMON 7. CATHODE, COMMON 8. CATHODE, COMMON STYLE 16: PIN 1. EMITTER, DIE #1 2. BASE, DIE #1 3. EMITTER, DIE #2 4. BASE, DIE #2 5. COLLECTOR, DIE #2 6. COLLECTOR, DIE #2 7. COLLECTOR, DIE #1 8. COLLECTOR, DIE #1 STYLE 17: PIN 1. VCC 2. V2OUT 3. V1OUT 4. TXE 5. RXE 6. VEE 7. GND 8. ACC STYLE 18: PIN 1. ANODE 2. ANODE 3. SOURCE 4. GATE 5. DRAIN 6. DRAIN 7. CATHODE 8. CATHODE STYLE 19: PIN 1. SOURCE 1 2. GATE 1 3. SOURCE 2 4. GATE 2 5. DRAIN 2 6. MIRROR 2 7. DRAIN 1 8. MIRROR 1 STYLE 20: PIN 1. SOURCE (N) 2. GATE (N) 3. SOURCE (P) 4. GATE (P) 5. DRAIN 6. DRAIN 7. DRAIN 8. DRAIN STYLE 21: PIN 1. CATHODE 1 2. CATHODE 2 3. CATHODE 3 4. CATHODE 4 5. CATHODE 5 6. COMMON ANODE 7. COMMON ANODE 8. CATHODE 6 STYLE 22: PIN 1. I/O LINE 1 2. COMMON CATHODE/VCC 3. COMMON CATHODE/VCC 4. I/O LINE 3 5. COMMON ANODE/GND 6. I/O LINE 4 7. I/O LINE 5 8. COMMON ANODE/GND STYLE 23: PIN 1. LINE 1 IN 2. COMMON ANODE/GND 3. COMMON ANODE/GND 4. LINE 2 IN 5. LINE 2 OUT 6. COMMON ANODE/GND 7. COMMON ANODE/GND 8. LINE 1 OUT STYLE 24: PIN 1. BASE 2. EMITTER 3. COLLECTOR/ANODE 4. COLLECTOR/ANODE 5. CATHODE 6. CATHODE 7. COLLECTOR/ANODE 8. COLLECTOR/ANODE STYLE 25: PIN 1. VIN 2. N/C 3. REXT 4. GND 5. IOUT 6. IOUT 7. IOUT 8. IOUT STYLE 26: PIN 1. GND 2. dv/dt 3. ENABLE 4. ILIMIT 5. SOURCE 6. SOURCE 7. SOURCE 8. VCC STYLE 29: PIN 1. BASE, DIE #1 2. EMITTER, #1 3. BASE, #2 4. EMITTER, #2 5. COLLECTOR, #2 6. COLLECTOR, #2 7. COLLECTOR, #1 8. COLLECTOR, #1 STYLE 30: PIN 1. DRAIN 1 2. DRAIN 1 3. GATE 2 4. SOURCE 2 5. SOURCE 1/DRAIN 2 6. SOURCE 1/DRAIN 2 7. SOURCE 1/DRAIN 2 8. GATE 1 DOCUMENT NUMBER: DESCRIPTION: 98ASB42564B SOIC−8 NB STYLE 27: PIN 1. ILIMIT 2. OVLO 3. UVLO 4. INPUT+ 5. SOURCE 6. SOURCE 7. SOURCE 8. DRAIN STYLE 28: PIN 1. SW_TO_GND 2. DASIC_OFF 3. DASIC_SW_DET 4. GND 5. V_MON 6. VBULK 7. VBULK 8. VIN Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. 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