DATA SHEET
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High Speed Dual-Channel,
Bi-Directional Ceramic
Digital Isolator
NCID9211
SOIC16 W
CASE 751EN
Description
The NCID9211 is a galvanically isolated full duplex, bi−directional,
high−speed dual−channel digital isolator with output enable. This
device supports isolated communications thereby allowing digital
signals to communicate between systems without conducting ground
loops or hazardous voltages.
It utilizes onsemi’s patented galvanic off−chip capacitor isolation
technology and optimized IC design to achieve high insulation and
high noise immunity, characterized by high common mode rejection
and power supply rejection specifications. The thick ceramic substrate
yields capacitors with ~25 times the thickness of thin film on−chip
capacitors and coreless transformers. The result is a combination of
the electrical performance benefits that digital isolators offer with the
safety reliability of a >0.5 mm insulator barrier similar to what has
historically been offered by optocouplers.
The device is housed in a 16−pin wide body small outline package.
MARKING DIAGRAM
AWLYWW
9211
A
WL
Y
WW
9211
= Assembly Location
= Wafer Lot / Assembly Lot
= Year
= Work Week
= Specific Device Code
Features
• Off−Chip Capacitive Isolation to Achieve Reliable High Voltage
•
•
•
•
•
•
•
•
•
Insulation
♦ DTI (Distance Through Insulation): ≥ 0.5 mm
♦ Maximum Working Insulation Voltage: 2000 Vpeak
Full Duplex, Bi−directional Communication
100 KV/ms Minimum Common Mode Rejection
High Speed:
♦ 50 Mbit/s Data Rate (NRZ)
♦ 25 ns Maximum Propagation Delay
♦ 10 ns Maximum Pulse Width Distortion
8 mm Creepage and Clearance Distance to Achieve Reliable High
Voltage Insulation.
Specifications Guaranteed Over 2.5 V to 5.5 V Supply Voltage and
−40°C to 125°C Extended Temperature Range
Over Temperature Detection
Output Enable Function (Primary and Secondary Side)
NCIV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC−Q100
Qualified and PPAP Capable (Pending)
Safety and Regulatory Approvals
♦ UL1577, 5000 VRMS for 1 Minute
♦ DIN EN/IEC 60747−17 (Pending)
Typical Applications
• Isolated PWM Control
• Industrial Fieldbus Communications
• Microprocessor System Interface (SPI, I2C, etc.)
© Semiconductor Components Industries, LLC, 2020
September, 2021 − Rev. 3
ORDERING INFORMATION
See detailed ordering and shipping information on page 10 of
this data sheet.
• Programmable Logic Control
• Isolated Data Acquisition System
• Voltage Level Translator
1
Publication Order Number:
NCID9211/D
NCID9211
PIN CONFIGURATION
BLOCK DIAGRAM
1
16
V DD 2
GND 1
2
15
GND 2
NC
3
14
NC
EN 1
4
13
EN 2
V OA
5
12
V INA
V INB
6
11
V OB
NC
7
10
NC
GND 1
8
9
ISOLATION
V DD1
GND 2
Figure 2. Functional Block Diagram
Figure 1. Pin and Channel Configuration
PIN DEFINITIONS
Pin No.
Name
Description
1
VDD1
Power Supply, Primary Side
2
GND1
Ground, Primary Side
3
NC
No Connect
4
EN1
Enable, Primary Side
5
VOA
Output, Channel A
6
VINB
Input, Channel B
7
NC
No Connect
8
GND1
Ground, Primary Side
9
GND2
Ground, Secondary Side
10
NC
No Connect
11
VOB
Output, Channel B
12
VINA
Input, Channel A
13
EN2
Enable, Secondary Side
14
NC
No Connect
15
GND2
Ground, Secondary Side
16
VDD2
Power Supply, Secondary Side
TRUTH TABLE (Note 1)
VINX
ENX
VDDI
VDDO
VOX
H
H / NC
Power Up
Power Up
H
Normal Operation
L
H / NC
Power Up
Power Up
L
Normal Operation
X
L
Power Up
Power Up
Hi−Z
X
H / NC
Power
Down
Power Up
L
Default low; VOX return to normal operation when VDDI
change to Power Up
X
H / NC
Power Up
Power
Down
Undetermined
(Note 2)
VOX return to normal operation when VDDO change to
Power Up
Comment
1. VINX = Input signal of a given channel (A or B). ENX = Enable pin for primary or secondary side (1 or 2). VOX = Output signal of a given channel
(A or B). VDDI = Input−side VDD. VDDO = Output−side VDD. X = Irrelevant. H = High level. L = Low level. NC = No Connection.
2. The outputs are in undetermined state when VDDO < VUVLO.
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2
NCID9211
SAFETY AND INSULATION RATINGS
As per DIN EN/IEC 60747−17, this digital isolator is suitable for “safe electrical insulation” only within the safety limit data. Compliance with
the safety ratings must be ensured by means of protective circuits.
Parameter
Symbol
Min.
Installation Classifications per DIN VDE 0110/1.89 Table 1
Rated Mains Voltage
Typ.
< 150 VRMS
I–IV
< 300 VRMS
I–IV
< 450 VRMS
I–IV
< 600 VRMS
I–IV
< 1000 VRMS
I–III
Climatic Classification
Max.
Units
40/125/21
Pollution Degree (DIN VDE 0110/1.89)
2
CTI
Comparative Tracking Index (DIN IEC 112/VDE 0303 Part 1)
600
VPR
Input−to−Output Test Voltage, Method b, VIORM x 1.875 = VPR, 100% Production
Test with tm = 1 s, Partial Discharge < 5 pC
3750
Vpeak
Input−to−Output Test Voltage, Method a, VIORM x 1.6 = VPR, Type and Sample
Test with tm = 10 s, Partial Discharge < 5 pC
3200
Vpeak
VIORM
Maximum Working Insulation Voltage
2000
Vpeak
VIOTM
Highest Allowable Over Voltage
8000
Vpeak
External Creepage
8.0
mm
External Clearance
8.0
mm
Insulation Thickness
0.50
mm
TCase
Safety Limit Values – Maximum Values in Failure;
Case Temperature
150
°C
PS,INPUT
Safety Limit Values – Maximum Values in Failure;
Input Power
100
mW
PS,OUTPUT
Safety Limit Values – Maximum Values in Failure;
Output Power
600
mW
Insulation Resistance at TS, VIO = 500 V
109
Ω
RIO
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise specified)
Symbol
Value
Units
TSTG
Storage Temperature
−55 to +150
°C
TOPR
Operating Temperature
−40 to +125
°C
Junction Temperature
−40 to +150
°C
260 for 10sec
°C
TJ
Parameter
TSOL
Lead Solder Temperature (Refer to Reflow Temperature Profile)
VDD
Supply Voltage (VDDx)
−0.5 to 6
V
V
Voltage (VINx, VOx, ENx)
−0.5 to 6
V
IO
Average Output Current
15
mA
PD
Power Dissipation
210
mW
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
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3
NCID9211
RECOMMENDED OPERATING CONDITIONS
Symbol
TA
VDD1 VDD2
Parameter
Min.
Max.
Unit
Ambient Operating Temperature
−40
+125
°C
Supply Voltage (Notes 3, 4)
2.5
5.5
V
0.7 x VDDI
VDDI
V
0
0.1 x VDDI
V
VINH
High Level Input Voltage
VINL
Low Level Input Voltage
VUVLO+
Supply Voltage UVLO Rising Threshold
2.2
V
VUVLO−
Supply Voltage UVLO Falling Threshold
2.0
V
Supply Voltage UVLO Hysteresis
0.1
V
IOH
High Level Output Current
−2
IOL
Low Level Output Current
−
2
mA
DR
Signaling Rate
0
50
Mbps
UVLOHYS
−
mA
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
3. During power up or down, ensure that both the input and output supply voltages reach the proper recommended operating voltages to avoid
any momentary instability at the output state.
4. For reliable operation at recommended operating conditions, VDD supply pins require at least a pair of external bypass capacitors, placed
within 2 mm from VDD pins 1 and 16 and GND pins 2 and 15. Recommended values are 0.1 mF and 1 mF.
ISOLATION CHARACTERISTICS
Apply over all recommended conditions. All typical values are measured at TA = 25°C.
Symbol
Parameter
Conditions
VISO
Input−Output Isolation Voltage
TA = 25°C, Relative Humidity < 50%,
t = 1.0 minute, II−O v 10 mA, 50 Hz
(Notes 5, 6, 7)
RISO
Isolation Resistance
VI−O = 500 V (Note 5)
CISO
Isolation Capacitance
VI−O = 0 V, Frequency = 1.0 MHz (Note 5)
Min.
Typ.
Max.
5000
Units
VRMS
1011
1
pF
5. Device is considered a two−terminal device: pins 1 to 8 are shorted together and pins 9 to 16 are shorted together.
6. 5,000 VRMS for 1−minute duration is equivalent to 6,000 VRMS for 1−second duration.
7. The input−output isolation voltage is a dielectric voltage rating per UL1577. It should not be regarded as an input−output continuous voltage
rating. For the continuous working voltage rating, refer to equipment−level safety specification or DIN EN/IEC 60747−17 Safety and Insulation
Ratings Table on page 3.
ELECTROSTATIC DISCHARGE RATINGS
Symbol
Parameter
Conditions
Ratings
Units
V
HBM
Human Body Model
JS−001−2017; AEC−Q100−002−Rev E (Note 9)
±3000
CDM
Charged Device Model
JS−002−2018; AEC−Q100−011−Rev D (Note 10)
±1000
ESDI
Contact Discharge
IEC 61000−4−2 Insulation Barrier Withstand Test (Note 8)
±8000
Air Discharge
±15000
8. Device is considered a two−terminal device: pins 1 to 8 are shorted together and pins 9 to 16 are shorted together.
9. ESD Human Body Model for NCID9211 tested per JEDEC JS−001−2017 standard; NCIV9211 tested per AEC−Q100−002−Rev E standard.
10. ESD Charged Device Model for NCID9211 tested per JEDEC JS−002−2018 standard; NCIV9211 tested per AEC−Q100−011−Rev D
standard.
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4
NCID9211
ELECTRICAL CHARACTERISTICS
Apply over all recommended conditions, TA =−40°C to +125°C, VDD1 = VDD2 = 2.5 V to 5.5 V, unless otherwise specified. All typical values
are measured at TA = 25°C.
Symbol
Parameter
Conditions
VOH
High Level Output Voltage
IOH = –4 mA
VOL
Low Level Output Voltage
IOL = 4 mA
Min.
0.11
Rising Input Voltage Threshold
VINT−
Falling Input Voltage Threshold
0.1 x VDDI
Input Threshold Voltage Hysteresis
0.1 x VDDI
IINH
High Level Input Current
VIH = VDDI
IINL
Low Level Input Current
VIL = 0 V
CMTI
CIN
Units
Figure
V
7
0.4
V
8
0.7 x VDDI
V
V
0.2 x VDDI
V
1
−1
Common Mode Transient Immunity VI = VDDI or 0 V, VCM = 1500 V
Input Capacitance
Max.
VDDO – 0.4 VDDO – 0.1
VINT+
VINT(HYS)
Typ.
100
VIN = VDDI/2 + 0.4 x sin (2pft),
f = 1MHz, VDD = 5 V
μA
μA
150
kV/ms
2
pF
12
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
SUPPLY CURRENT CHARACTERISTICS
Apply over all recommended conditions, TA =−40°C to +125°C unless otherwise specified. All typical values are measured at TA = 25°C.
Symbol
IDD1
IDD2
Parameter
DC Supply Current
Input Low
Conditions
VDD = 5 V, EN = 0 V / 5 V, VIN = 0 V
IDD2
VDD = 5 V, EN = 0 V / 5 V, VIN = 5 V
11.8
VDD = 2.5 V, EN = 0 V / 2.5 V, VIN = 2.5 V
AC Supply Current
1 Mbps
IDD2
IDD1
IDD2
AC Supply Current
10 Mbps
IDD1
IDD2
IDD1
IDD2
IDD2
IDD1
IDD2
IDD1
IDD2
6
14.5
mA
11.7
14.3
11.6
14.3
11.8
IDD1
IDD1
6.1
11.9
IDD2
IDD2
Figure
12.1
VDD = 3.3 V, EN = 0 V / 3.3 V, VIN = 3.3 V
IDD1
IDD1
4.4
4.3
IDD2
IDD2
mA
4.8
DC Supply Current
Input High
IDD1
IDD1
Units
6.3
VDD = 2.5 V, EN = 0 V / 2.5 V, VIN = 0 V
IDD2
IDD2
Max.
4.5
4.9
IDD1
IDD1
Typ.
5.0
VDD = 3.3 V, EN = 0 V / 3.3 V, VIN = 0 V
IDD1
Min.
AC Supply Current
50 Mbps
VDD = 5 V, EN = 5 V, CL = 15 pF
VIN = 5 V Square Wave
8.3
VDD = 3.3 V, EN = 3.3 V, CL = 15 pF
VIN = 3.3 V Square Wave
8.1
VDD = 2.5 V, EN = 2.5 V, CL = 15 pF
VIN = 2.5 V Square Wave
8.0
VDD = 5 V, EN = 5 V, CL = 15 pF
VIN = 5 V Square Wave
9.9
10.3
8.5
10.1
8.4
12
mA
10.2
8.9
VDD = 2.5 V, EN = 2.5 V, CL = 15 pF
VIN = 2.5 V Square Wave
8.6
VDD = 5 V, EN = 5 V, CL = 15 pF
VIN = 5 V Square Wave
14.8
VDD = 3.3 V, EN = 3.3 V, CL = 15 pF
VIN = 3.3 V Square Wave
12.1
VDD = 2.5 V, EN = 2.5 V, CL = 15 pF
VIN = 2.5 V Square Wave
11.1
5
mA
8.7
VDD = 3.3 V, EN = 3.3 V, CL = 15 pF
VIN = 3.3 V Square Wave
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10.5
11
9.3
10.5
9.0
17.5
15.2
14.3
12.6
11.6
13
mA
3,4
NCID9211
SWITCHING CHARACTERISTICS
Apply over all recommended conditions, TA =−40°C to +125°C unless otherwise specified. All typical values are measured at TA = 25°C.
Symbol
Parameter
tPHL
Propagation Delay
to Logic Low Output
(Note 8)
tPLH
PWD
tPSK(PP)
Conditions
Min.
Typ.
Max.
Units
Figure
VDD = EN = 5 V, VIN Square Wave, CL = 15 pF
17.0
25
ns
6,9
VDD = EN = 3.3 V, VIN Square Wave, CL = 15 pF
18.3
25
ns
10
ns
10
ns
VDD = EN = 2.5 V, VIN Square Wave, CL = 15 pF
20.0
Propagation Delay
VDD = EN = 5 V, VIN Square Wave, CL = 15 pF
to Logic High Output
VDD = EN = 3.3 V, VIN Square Wave, CL = 15 pF
(Note 9)
VDD = EN = 2.5 V, VIN Square Wave, CL = 15 pF
13.0
Pulse Width Distortion | tPHL – tPLH |
(Note 10)
VDD = EN = 5 V, VIN Square Wave, CL = 15 pF
3.6
VDD = EN = 3.3 V, VIN Square Wave, CL = 15 pF
3.8
VDD = EN = 2.5 V, VIN Square Wave, CL = 15 pF
3.8
Propagation Delay
Skew (Part to Part)
(Note 11)
VDD = EN = 5 V, VIN Square Wave, CL = 15 pF
14.5
16.0
−10
VDD = EN = 3.3 V, VIN Square Wave, CL = 15 pF
VDD = EN = 2.5 V, VIN Square Wave, CL = 15 pF
tR
tF
tPZL
tPLZ
tPZH
tPHZ
Output Rise Time
(10% to 90%)
Output Fall Time
(90% to 10%)
High Impedance to
Logic Low Output
Delay (Note 12)
Logic Low to High
Impedance Output
Delay (Note 13)
High Impedance to
Logic High Output
Delay (Note 14)
Logic High to High
Impedance Output
Delay (Note 15)
VDD = EN = 5 V, VIN Square Wave, CL = 15 pF
1.1
VDD = EN = 3.3 V, VIN Square Wave, CL = 15 pF
1.5
VDD = EN = 2.5 V, VIN Square Wave, CL = 15 pF
2.2
VDD = EN = 5 V, VIN Square Wave, CL = 15 pF
1.1
VDD = EN = 3.3 V, VIN Square Wave, CL = 15 pF
1.4
VDD = EN = 2.5 V, VIN Square Wave, CL = 15 pF
3.0
VDD = 5 V, RL = 1 kW
8.1
VDD = 3.3 V, RL = 1 kW
9.7
VDD = 2.5 V, RL = 1 kW
12.0
VDD = 5 V, RL = 1 kW
10.4
VDD = 3.3 V, RL = 1 kW
12.2
VDD = 2.5 V, RL = 1 kW
16.5
VDD = 5 V, RL = 1 kW
0.54
VDD = 3.3 V, RL = 1 kW
0.51
VDD = 2.5 V, RL = 1 kW
0.50
VDD = 5 V, RL = 1 kW
11.0
VDD = 3.3 V, RL = 1 kW
12.3
VDD = 2.5 V, RL = 1 kW
14.0
ns
ns
25
ns
25
ns
1
μs
25
ns
10
11
11. Propagation delay tPHL is measured from the 50% level of the falling edge of the input pulse to the 50% level of the falling edge of the VO signal.
12. Propagation delay tPLH is measured from the 50% level of the rising edge of the input pulse to the 50% level of the rising edge of the VO signal.
13. PWD is defined as | tPHL – tPLH | for any given device.
14. Part−to−part propagation delay skew is the difference between the measured propagation delay times of a specified channel of any two parts
at identical operating conditions and equal load.
15. Enable delay tPZL is measured from the 50% level of the rising edge of the EN pulse to the 50% of the falling edge of the VO signal as it
switches from high impedance state to low state.
16. Disable delay tPLZ is measured from the 50% level of the falling edge of the EN pulse to 0.5 V level of the rising edge of the VO signal as
it switches from low state to high impedance state.
17. Enable delay tPZH is measured from the 50% level of the rising edge of the EN pulse to the 50% of the rising edge of the VO signal as it switches
from high impedance state to high state.
18. Disable delay tPHZ is measured from the 50% level of the falling edge of the EN pulse to VOH − 0.5 V level of the falling edge of the VO signal
as it switches from high state to high impedance state.
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NCID9211
TYPICAL PERFORMANCE CHARACTERISTICS
20
TA = 25°C
IDD1
LOAD = No Load
IDD2
15
IDD1, IDD2 − SUPPLY CURRENT (mA)
IDD1, IDD2 − SUPPLY CURRENT (mA)
20
VDD = 3.3 V
VDD = 5 V
10
VDD = 2.5 V
5
0
0
10
20
30
40
TA = 25°C
IDD1
LOAD = 15 pF
IDD2
15
10
VDD = 2.5 V
5
0
50
0
10
20
DATA RATE (Mbps)
40
50
Figure 4. Supply Current vs. Data Rate
(Load = 15 pF)
25
3.0
tP − PROPAGATION DELAY (ns)
VUVLO − Supply Voltage UVLO Threshold (V)
30
DATA RATE (Mbps)
Figure 3. Supply Current vs. Data Rate (No Load)
2.5
VUVLO+
VUVLO−
2.0
1.5
−40
−20
0
20
40
60
80
100
5
−40
VOL − LOW LEVEL OUTPUT VOLTAGE (V)
VDD = 5 V
VDD = 3.3 V
VDD = 2.5 V
2
1
−6
−4
−2
0
20
40
60
80
100
120
Figure 6. Propagation Delay vs. Ambient
Temperature
3
−8
−20
tPLH VDD = 5 V
TA - AMBIENT TEMPERATURE (°C )
4
0
−10
tPLH VDD = 3.3 V
tPLH VDD = 2.5 V
10
120
6
5
tPHL VDD = 2.5 V
tPHL VDD = 3.3 V
15
Figure 5. Supply Voltage UVLO Threshold vs.
Ambient Temperature
TA = 25 °C
tPHL VDD = 5 V
20
TA - AMBIENT TEMPERATURE (°C)
VOH − HIGH LEVEL OUTPUT VOLTAGE (V)
VDD = 3.3 V
VDD = 5 V
0
1.0
TA = 25 °C
0.8
0.6
VDD = 2.5 V
0.4
VDD = 3.3 V
VDD = 5 V
0.2
0.0
IOH - HIGH LEVEL OUTPUT CURRENT (mA )
0
2
4
6
8
10
IOL - LOW LEVEL OUTPUT CURRENT (mA )
Figure 7. High Level Output Voltage vs. Current
Figure 8. Low Level Output Voltage vs. Current
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NCID9211
VDDI
+
−
ISOLATION
TEST CIRCUITS
V
VIN
VO
+
−
VEN
+
−
50%
VI
VDDO
tPLH
tPHL
90%
CL
50%
VO
10%
tR
tF
Figure 9. VIN to VO Propagation Delay Test Circuit and Waveform
VDDI
ISOLATION
RL
+
−
+
−
VIN
VO
VI
+
−
50%
VI
VDDO
tPZL
tPLZ
VO
CL
0.5 V
50%
VEN
VDDI
ISOLATION
Figure 10. EN to Logic Low VO Propagation Delay Test Circuit and Waveform
+
−
+
−
VIN
VO
VI
CL
+
−
VDDO
50%
VI
tPZH
RL
VO
tPHZ
50%
0.5 V
VEN
1
VDDI
2
VIN
S
0
ISOLATION
Figure 11. EN to Logic High VO Propagation Delay Test Circuit and Waveform
VO
VDDO
S at 0, V O remain consistently low
S at 1, V O remain consistently high
S at 2, V O data same as VIN data
VCM
Figure 12. Common Mode Transient Immunity Test Circuit
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NCID9211
APPLICATIONS INFORMATION
Theory of Operation
below the components, power plane below the ground plane,
signal lines and power fill on top, and signal lines and ground
fill at the bottom. The alternating polarities of the layers
creates interplane capacitances that aids the bypass
capacitors required for reliable operation at digital
switching rates.
In the layout with digital isolators, it is required that the
isolated circuits have separate ground and power planes. The
section below the device should be clear with no power,
ground or signal traces. Maintain a gap equal to or greater
than the specified minimum creepage clearance of the
device package.
NCID9211 is a dual−channel digital isolator that enables
bi−directional communication between two isolated
circuits. It uses off−chip ceramic capacitors that serve both
as the isolation barrier and as the medium of transmission for
signal switching using on−off keying (OOK) technique,
illustrated in the single channel operational block diagram
in Figure 13.
At the transmitter side, the VIN input logic state is
modulated with a high frequency carrier signal. The
resulting signal is amplified and transmitted to the isolation
barrier. The receiver side detects the barrier signal and
demodulates it using an envelope detection technique. The
output signal determines the VO output logic state when the
output enable control EN is at high. When EN is at low,
output VO is at high impedance state. VO is at default state
low when the power supply at the transmitter side is turned
off or the input VIN is disconnected.
ISOLATION
BARRIER
TRANSMITTER
VIN
TX
Amplif ier
OOK
Modulator
RX
Amplif ier
Envelope
Detec tor
No Trace
VDD1 Plane
Signal Lines / GND2 Fill
Figure 16. 4−Layer PCB for Digital Isolator
For NCID9211, it is highly advised to connect at least a
pair of low ESR supply bypass capacitors, placed within
2mm from the power supply pins 1 and 16 and ground pins
2 and 15. Recommended values are 1 mF and 0.1 mF,
respectively. Place them between the VDD pins of the device
and the via to the power planes, with the higher frequency,
lower value capacitor closer to the device pins. Directly
connect the device ground pins 1, 8, 9 and 15 by via to their
corresponding ground planes.
OFF− CHIP
CAPACITORS
OSC
VDD2 Plane
Signal Lines / GND1 Fill
VO
IO
GND2 Plane
GND1 Plane
EN
RECEIVER
Signal Lines / VDD2 Fill
Signal Lines / VDD1 Fill
Figure 13. Operational Block Diagram of
Single Channel
VIN
ISOLATION
BARRIER
VDD1
GND1
1μF 0.1μF
0.1μF 1μF
VDD2
GND2
VO
Figure 14. On−Off Keying Modulation Signals
OFF− CHIP CAPACITIVE
ISOLATION BARRIER
EN1
VOA
+
VTX
−
RX
IO
GND1
VINA
IO
TX
Figure 17. Placement of Bypass Capacitors
OSC
VINB
IO
TX
+
VTX
−
RX
GND2
EN2
Over Temperature Detection
VOB
IO
NCID9211 has a built−in Over Temperature Detection
(OTD) feature that protects the IC from thermal damage.
The output pins will automatically switch to default state
when the ambient temperature exceeds the maximum
junction temperature at threshold of approximately 160°C.
The device will return to normal operation when the
temperature decreases approximately 20°C below the OTD
threshold.
OSC
Figure 15. NCID9211 Operational Block Diagram
Layout Recommendation
Layout of the digital circuits relies on good suppression of
unwanted noise and electromagnetic interference. It is
recommended to use 4−layer FR4 PCB, with ground plane
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9
NCID9211
ORDERING INFORMATION
Grade
Package
Shipping†
NCID9211
Industrial
SOIC16 W
50 Units / Tube
NCID9211R2
Industrial
SOIC16 W
750 Units / Tape & Reel
NCIV9211* (pending)
Automotive
SOIC16 W
50 Units / Tube
NCIV9211R2* (pending)
Automotive
SOIC16 W
750 Units / Tape & Reel
Part Number
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specification Brochure, BRD8011/D.
*NCIV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q100 Qualified and PPAP
Capable.
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10
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
SOIC16 W
CASE 751EN
ISSUE A
GENERIC
MARKING DIAGRAM*
AWLYWW
XXXXXXXXXX
XXXXXXXXXX
DOCUMENT NUMBER:
DESCRIPTION:
XXXX
A
WL
Y
WW
98AON13751G
SOIC16 W
DATE 24 AUG 2021
= Specific Device Code *This information is generic. Please refer to
= Assembly Location
device data sheet for actual part marking.
= Wafer Lot
Pb−Free indicator, “G” or microdot “G”, may
= Year
or may not be present. Some products may
= Work Week
not follow the Generic Marking.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 1
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