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NCV4275DSR4

NCV4275DSR4

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    TO263-6

  • 描述:

    IC REG LINEAR 5V 450MA D2PAK-5

  • 数据手册
  • 价格&库存
NCV4275DSR4 数据手册
NCV4275 5.0 V, 450 mA Low-Drop Voltage Regulator The NCV4275 is an integrated low dropout regulator designed for use in harsh automotive environments. It includes wide operating temperature and input voltage ranges. The output is regulated at 5.0 V and is rated to 450 mA of output current. It also provides a number of features, including overcurrent protection, overtemperature protection and a programmable microprocessor reset. The NCV4275 is available in the DPAK and D2PAK surface mount packages. The output is stable over a wide output capacitance and ESR range. Features • • • • • • • 5.0 V, ±2% Output Voltage 450 mA Output Current Very Low Current Consumption Active Reset Output Reset Low Down to VQ = 1.0 V 500 mV (max) Dropout Voltage Fault Protection ♦ +45 V Peak Transient Voltage ♦ −42 V Reverse Voltage ♦ Short Circuit ♦ Thermal Overload Pb−Free Packages are Available NCV Prefix for Automotive and Other Applications Requiring Site and Control Changes • • I Q Bandgap Reference Error Amplifier Current Limit and Saturation Sense + − http://onsemi.com MARKING DIAGRAMS 1 DPAK 5−PIN DT SUFFIX CASE 175AA 5 4275G ALYWW 1 1 5 D2PAK 5−PIN DS SUFFIX CASE 936A Pin 1. I 2. RO Tab, 3. GND* 4. D 5. Q * Tab is connected to Pin 3 on all packages A WL, L Y WW G NC V4275 AWLYWWG 1 = Assembly Location = Wafer Lot = Year = Work Week = Lead Free Indicator ORDERING INFORMATION See detailed ordering and shipping information in the dimensions section on page 12 of this data sheet. Thermal Shutdown Reset Generator D GND RO Figure 1. Block Diagram © Semiconductor Components Industries, LLC, 2010 April, 2010 − Rev. 16 1 Publication Order Number: NCV4275/D NCV4275 PIN FUNCTION DESCRIPTION ÑÑÑÑ ÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑ ÑÑÑÑÑÑÑÑÑÑ ÑÑÑÑÑÑ ÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑ ÑÑÑÑ ÑÑÑÑÑÑ ÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑ ÑÑÑÑ ÑÑÑÑÑÑ ÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑ ÑÑÑÑÑÑÑÑÑÑ ÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑ ÑÑÑÑÑÑÑÑÑÑ ÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑ Pin No. Symbol 1 I 2 RO 3 GND Description Input; Battery Supply Input Voltage. Bypass to ground with a ceramic capacitor. Reset Output; Open Collector Active Reset (accurate when I > 1.0 V). Ground; Pin 3 internally connected to tab. 4 D Reset Delay; timing capacitor to GND for Reset Delay function. 5 Q Output; ±2.0%, 450 mA output. 22 F, ESR < 5.0 Ω to ground. MAXIMUM RATINGS† Rating Symbol Min Max Unit Input Voltage VI −42 45 V Input Peak Transient Voltage VI − 45 V Output Voltage VQ −1.0 16 V Reset Output Voltage VRO −0.3 25 V Reset Output Current IRO −5.0 5.0 mA Reset Delay Voltage VD −0.3 7.0 V Reset Delay Current ID −2.0 2.0 mA Input Voltage Operating Range VI 5.5 42 V ESD Susceptibility −Human Body Model −Machine Model − − 4.0 200 − − kV V Junction Temperature TJ −40 150 °C Storage Temperature Tstg −55 150 °C Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected. LEAD TEMPERATURE SOLDERING REFLOW (Note 1) Lead Free, 60 sec−150 sec above 217 TSLD − 265 Peak °C Leaded, 60 sec−150 sec above 183 TSLD − 240 Peak °C THERMAL CHARACTERISTICS Characteristic Test Conditions (Typical Value) Unit DPAK 5−PIN PACKAGE Min Pad Board (Note 2) 1″ Pad Board (Note 3) Junction−to−Tab (psi−JLx, JLx) 4.2 4.7 C/W Junction−to−Ambient (RJA, JA) 100.9 46.8 C/W D2PAK 5−PIN PACKAGE 0.4 sq. in. Spreader Board (Note 4) 1.2 sq. in. Spreader Board (Note 5) Junction−to−Tab (psi−JLx, JLx) 3.8 4.0 C/W Junction−to−Ambient (RJA, JA) 74.8 41.6 C/W 1. PRR IPC / JEDEC J−STD−020C 2. 1 oz. copper, 0.26 inch2 (168 mm2) copper area, 0.062″ thick FR4. 3. 1 oz. copper, 1.14 inch2 (736 mm2) copper area, 0.062″ thick FR4. 4. 1 oz. copper, 0.373 inch2 (241 mm2) copper area, 0.062″ thick FR4. 5. 1 oz. copper, 1.222 inch2 (788 mm2) copper area, 0.062″ thick FR4. †During the voltage range which exceeds the maximum tested voltage of I, operation is assured, but not specified. Wider limits may apply. Thermal dissipation must be observed closely. http://onsemi.com 2 NCV4275 ELECTRICAL CHARACTERISTICS (VI = 13.5 V; −40°C < TJ < 150°C; unless otherwise noted. Refer to Figure 13 for conditions.) Characteristic Symbol Test Conditions Min Typ Max Unit 4.9 5.0 5.1 V Output Output Voltage VQ 100 A < IQ < 400 mA, 6.0 V < VI < 28 V Output Voltage VQ 100 A < IQ < 200 mA, 6.0 V < VI < 40 V 4.9 5.0 5.1 V Output Current Limitation IQ VQ = 4.5 V 450 700 − mA Quiescent Current, Iq = II − IQ Iq IQ = 1.0 mA − 150 200 A Quiescent Current, Iq = II − IQ Iq IQ = 1.0 mA, TA = 25°C − 135 150 A Quiescent Current, Iq = II − IQ Iq IQ = 250 mA − 10 15 mA Quiescent Current, Iq = II − IQ Iq IQ = 400 mA − 23 35 mA Dropout Voltage Vdr IQ = 300 mA, Vdr = VI − VQ, VI = 5.0 V − 250 500 mV Load Regulation ΔVQ IQ = 5.0 mA to 400 mA −30 15 30 mV Line Regulation ΔVQ ΔVI = 8.0 V to 32 V, IQ = 5.0 mA −15 5.0 15 mV Power Supply Ripple Rejection PSRR fr = 100 Hz, Vr = 0.5 Vpp − 60 − dB Temperature Output Voltage Drift dVQ/dt − − 0.5 − mV/k VQ,rt − 4.53 4.65 4.8 V Reset Output Low Voltage VROL Rext > 5.0 k, VQ > 1.0 V − 0.2 0.4 V Reset Output Leakage Current VROH VROH = 5.0 V − 0 10 A Reset Timing D and Output RO Reset Switching Threshold Reset Charging Current ID,C Upper Timing Threshold VDU Lower Timing Threshold VDL VD = 1.0 V 3.0 5.5 9.0 A − 1.5 1.8 2.2 V − 0.2 0.4 0.7 V Reset Delay Time trd CD = 47 nF 10 16 22 ms Reset Reaction Time trr CD = 47 nF − 1.5 4.0 s 150 − 210 °C Thermal Shutdown TSD Shutdown Temperature (Note 6) − 6. Guaranteed by design, not tested in production. TYPICAL PERFORMANCE CHARACTERISTICS 1000 10 Unstable ESR Region for CQ = 1 F 10 ESR () ESR () 100 Unstable Region Maximum ESR for CQ = 1 F Stable ESR Region 1 Stable Region Minimum ESR for CQ = 1 F 0.1 0.01 5.0 CVout = 22 F Unstable Region for CQ = 1 F 0 100 200 300 400 0 500 0 100 200 300 400 OUTPUT CURRENT (mA) OUTPUT CURRENT (mA) Figure 2. Output Stability with Output Capacitor ESR Figure 3. Output Capacitor ESR http://onsemi.com 3 500 NCV4275 12 5.2 5.1 10 VI = 13.5 V, RL = 25  8.0 VQ (V) VQ (V) 5.0 4.9 6.0 4.8 4.0 4.7 2.0 4.6 −40 0 40 Tj (°C) 80 120 0 160 Figure 4. Output Voltage VQ vs. Temperature Tj 4.0 VI (V) 6.0 8.0 10 TJ = 25°C 1.0 VI = 13.5 V 0.8 IQ (A) 800 IQ (mA) 2.0 1.2 1000 600 TJ = 125°C 0.6 400 0.4 200 0.2 0 −40 0 40 Tj (°C) 80 120 0 160 3.5 800 3.0 700 10 Vdr (mV) 2.0 1.5 20 VI (V) 30 40 50 TJ = 125°C 600 VI = 13.5 V, TJ = 25°C 2.5 0 Figure 7. Output Current IQ vs. Input Voltage VI Figure 6. Output Current IQ vs. Temperature TJ Iq (mA) 0 Figure 5. Output Voltage VQ vs. Input Voltage VI 1200 500 400 TJ = 25°C 300 1.0 200 0.5 0 RL = 25  TJ = 25°C 100 0 20 40 60 IQ (mA) 80 100 0 120 0 Figure 8. Current Consumption Iq vs. Output Current IQ 200 400 600 IQ (mA) 800 1000 Figure 9. Drop Voltage Vdr vs. Output Current IQ http://onsemi.com 4 NCV4275 8 70 7 60 6 VI = 13.5 V, TJ = 25°C 40 30 5 3 2 10 1 0 VI = 13.5 V VD = 1.0 V 4 20 0 0 100 200 300 IQ (mA) 400 500 600 −40 Figure 10. Current Consumption Iq vs. Output Current IQ 0 40 VI = 13.5 V 3.5 3.0 2.5 VDU 2.0 1.5 1.0 VDL 0.5 0 −40 0 Tj (°C) 80 120 160 Figure 11. Charge Current ID,C vs. Temperature TJ 4.0 VDU, VDL (V) Iq (mA) 50 ID,C (A) 80 40 Tj (°C) 80 120 160 Figure 12. Delay Switching Threshold VDU, VDL vs. Temperature TJ http://onsemi.com 5 NCV4275 APPLICATION INFORMATION VI II CI1 1000 μF I CI2 100 nF ID CD 47 nF 1 5 IQ Q CQ 22 μF NCV4275 D 4 2 3 RO IRO VQ Rext 5.0 k VRO GND Iq Figure 13. Test Circuit Circuit Description The NCV4275 is an integrated low dropout regulator that provides 5.0 V, 450 mA protected output and a signal for power on reset. The regulation is provided by a PNP pass transistor controlled by an error amplifier with a bandgap reference, which gives it the lowest possible drop out voltage and best possible temperature stability. The output current capability is 450 mA, and the base drive quiescent current is controlled to prevent over saturation when the input voltage is low or when the output is overloaded. The regulator is protected by both current limit and thermal shutdown. Thermal shutdown occurs above 150°C to protect the IC during overloads and extreme ambient temperatures. The delay time for the reset output is adjustable by selection of the timing capacitor. See Figure 13, Test Circuit, for circuit element nomenclature illustration. temperature constraints. A tantalum or aluminum electrolytic capacitor is best, since a film or ceramic capacitor with its almost zero ESR can cause instability. The aluminum electrolytic capacitor is the least expensive solution, but, if the circuit operates at low temperatures (−25°C to −40°C), both the capacitance and ESR of the capacitor will vary considerably. The capacitor manufacturer’s data sheet usually provides this information. The value for the output capacitor CQ shown in Figure 13, Test Circuit, should work for most applications; however, it is not necessarily the optimized solution. Stability is guaranteed for CQ w 22 F and an ESR v 5.0 . The range of stability versus capacitance, load current and capacitive ESR is illustrated in Figure 2. Reset Output The reset output is used as the power on indicator to the microcontroller. This signal indicates when the output voltage is suitable for reliable operation of the controller. It pulls low when the output is not considered to be ready. RO is pulled up to VQ by an external resistor, typically 5.0 k in value. The input and output conditions that control the Reset Output and the relative timing are illustrated in Figure 14, Reset Timing. Output voltage regulation must be maintained for the delay time before the reset output signals a valid condition. The delay for the reset output is defined as the amount of time it takes the timing capacitor on the delay pin to charge from a residual voltage of 0.0 V to the upper timing threshold voltage VDU of 1.8 V. The charging current for this is ID,C of 5.5 A and D pin voltage in steady state is typically 3.2 V. By using typical IC parameters with a 47 nF capacitor on the D pin, the following time delay is derived: tRD = CDVDU / ID,C Regulator The error amplifier compares the reference voltage to a sample of the output voltage (VQ) and drives the base of a PNP series pass transistor by a buffer. The reference is a bandgap design to give it a temperature−stable output. Saturation control of the PNP is a function of the load current and input voltage. Over saturation of the output power device is prevented, and quiescent current in the ground pin is minimized. Regulator Stability Considerations The input capacitors (CI1 and CI2) are necessary to stabilize the input impedance to avoid voltage line influences. Using a resistor of approximately 1.0  in series with CI2 can stop potential oscillations caused by stray inductance and capacitance. The output capacitor helps determine three main characteristics of a linear regulator: startup delay, load transient response and loop stability. The capacitor value and type should be based on cost, availability, size and tRD = 47 nF (1.8 V) / 5.5 A = 15.4 ms Other time delays can be obtained by changing the capacitor value. http://onsemi.com 6 NCV4275 VI t < Reset Reaction Time VQ VQ,rt t Reset Charge Current dVD + CD dt VD Upper Timing Threshold VDU Lower Timing Threshold VDL t Reset Delay Time Reset Reaction Time VRO t Power−on−Reset Thermal Shutdown Voltage Dip at Input Undervoltage Secondary Spike Figure 14. Reset Timing http://onsemi.com 7 Overload at Output NCV4275 Calculating Power Dissipation in a Single Output Linear Regulator The maximum power dissipation for a single output regulator (Figure 15) is: PD(max) + [VI(max) * VQ(min)] IQ(max) Heatsinks A heatsink effectively increases the surface area of the package to improve the flow of heat away from the IC and into the surrounding air. Each material in the heat flow path between the IC and the outside environment will have a thermal resistance. Like series electrical resistances, these resistances are summed to determine the value of RJA: (1) ) VI(max)Iq where VI(max) VQ(min) IQ(max) RJA + RJC ) RCS ) RSA is the maximum input voltage, is the minimum output voltage, is the maximum output current for the application, Iq is the quiescent current the regulator consumes at IQ(max). Once the value of PD(max) is known, the maximum permissible value of RJA can be calculated: T RJA + 150° C * A PD where RJC is the junction−to−case thermal resistance, RCS is the case−to−heatsink thermal resistance, RSA is the heatsink−to−ambient thermal resistance. RJC appears in the package section of the data sheet. Like RJA, it too is a function of package type. RCS and RSA are functions of the package type, heatsink and the interface between them. These values appear in heatsink data sheets of heatsink manufacturers. Thermal, mounting, and heatsinking considerations are discussed in the ON Semiconductor application note AN1040/D. (2) The value of RJA can then be compared with those in the package section of the data sheet. Those packages with RJA’s less than the calculated value in Equation 2 will keep the die temperature below 150°C. In some cases, none of the packages will be sufficient to dissipate the heat generated by the IC, and an external heatsink will be required. IQ II VI SMART REGULATOR® (3) VQ } Control Features Iq Figure 15. Single Output Regulator with Key Performance Parameters Labeled http://onsemi.com 8 NCV4275 Thermal Model A discussion of thermal modeling is in the ON Semiconductor web site: http://www.onsemi.com/pub/collateral/BR1487−D.PDF. Table 1. DPAK 5−Lead Thermal RC Network Models Drain Copper Area (1 oz thick) 168 mm2 (SPICE Deck Format) 736 mm2 168 mm2 Cauer Network 736 mm2 Foster Network 168 mm2 736 mm2 Units Tau Tau Units C_C1 Junction Gnd 1.00E−06 1.00E−06 W−s/C 1.36E−08 1.361E−08 sec C_C2 node1 Gnd 1.00E−05 1.00E−05 W−s/C 7.41E−07 7.411E−07 sec C_C3 node2 Gnd 6.00E−05 6.00E−05 W−s/C 1.04E−05 1.029E−05 sec C_C4 node3 Gnd 1.00E−04 1.00E−04 W−s/C 3.91E−05 3.737E−05 sec C_C5 node4 Gnd 4.36E−04 3.64E−04 W−s/C 1.80E−03 1.376E−03 sec C_C6 node5 Gnd 6.77E−02 1.92E−02 W−s/C 3.77E−01 2.851E−02 sec C_C7 node6 Gnd 1.51E−01 1.27E−01 W−s/C 3.79E+00 9.475E−01 sec C_C8 node7 Gnd 4.80E−01 1.018 W−s/C 2.65E+01 1.173E+01 sec C_C9 node8 Gnd 3.740 2.955 W−s/C 8.71E+01 8.59E+01 sec C_C10 node9 Gnd 10.322 0.438 W−s/C 168 mm2 736 mm2 sec R’s R’s R_R1 Junction node1 0.015 0.015 C/W 0.0123 0.0123 C/W R_R2 node1 node2 0.08 0.08 C/W 0.0585 0.0585 C/W R_R3 node2 node3 0.4 0.4 C/W 0.0304 0.0287 C/W R_R4 node3 node4 0.2 0.2 C/W 0.3997 0.3772 C/W R_R5 node4 node5 2.97519 2.6171 C/W 3.115 2.68 C/W R_R6 node5 node6 8.2971 1.6778 C/W 3.571 1.38 C/W R_R7 node6 node7 25.9805 7.4246 C/W 12.851 5.92 C/W R_R8 node7 node8 46.5192 14.9320 C/W 35.471 7.39 C/W R_R9 node8 node9 17.7808 19.2560 C/W 46.741 28.94 C/W R_R10 node9 Gnd 0.1 0.1758 C/W NOTE: C/W Bold face items represent the package without the external thermal system. R1 Junction C1 R2 C2 R3 C3 Rn Cn Time constants are not simple RC products. Amplitudes of mathematical solution are not the resistance values. Ambient (thermal ground) Figure 16. Grounded Capacitor Thermal Network (“Cauer” Ladder) Junction R1 C1 R2 C2 R3 C3 Rn Cn Each rung is exactly characterized by its RC−product time constant; amplitudes are the resistances. Ambient (thermal ground) Figure 17. Non−Grounded Capacitor Thermal Ladder (“Foster” Ladder) http://onsemi.com 9 NCV4275 Table 2. D2PAK 5−Lead Thermal RC Network Models Drain Copper Area (1 oz thick) 241 mm2 (SPICE Deck Format) 788 mm2 241 mm2 Cauer Network 241 mm2 788 mm2 Foster Network 653 mm2 Units Tau Tau Units C_C1 Junction Gnd 1.00E−06 1.00E−06 W−s/C 1.361E−08 1.361E−08 sec C_C2 node1 Gnd 1.00E−05 1.00E−05 W−s/C 7.411E−07 7.411E−07 sec C_C3 node2 Gnd 6.00E−05 6.00E−05 W−s/C 1.005E−05 1.007E−05 sec C_C4 node3 Gnd 1.00E−04 1.00E−04 W−s/C 3.460E−05 3.480E−05 sec C_C5 node4 Gnd 2.82E−04 2.87E−04 W−s/C 7.868E−04 8.107E−04 sec C_C6 node5 Gnd 5.58E−03 5.95E−03 W−s/C 7.431E−03 7.830E−03 sec C_C7 node6 Gnd 4.25E−01 4.61E−01 W−s/C 2.786E+00 2.012E+00 sec C_C8 node7 Gnd 9.22E−01 2.05 W−s/C 2.014E+01 2.601E+01 sec C_C9 node8 Gnd 1.73 4.88 W−s/C 1.134E+02 1.218E+02 sec C_C10 node9 Gnd 7.12 1.31 W−s/C 241 mm2 653 mm2 sec R’s R’s R_R1 Junction node1 0.015 0.0150 C/W 0.0123 0.0123 C/W R_R2 node1 node2 0.08 0.0800 C/W 0.0585 0.0585 C/W R_R3 node2 node3 0.4 0.4000 C/W 0.0257 0.0260 C/W R_R4 node3 node4 0.2 0.2000 C/W 0.3413 0.3438 C/W R_R5 node4 node5 1.85638 1.8839 C/W 1.77 1.81 C/W R_R6 node5 node6 1.23672 1.2272 C/W 1.54 1.52 C/W R_R7 node6 node7 9.81541 5.3383 C/W 4.13 3.46 C/W R_R8 node7 node8 33.1868 18.9591 C/W 6.27 5.03 C/W R_R9 node8 node9 27.0263 13.3369 C/W 60.80 29.30 C/W node9 gnd 1.13944 0.1191 C/W R_R10 NOTE: C/W Bold face items represent the package without the external thermal system. The Cauer networks generally have physical significance and may be divided between nodes to separate thermal behavior due to one portion of the network from another. The Foster networks, though when sorted by time constant (as above) bear a rough correlation with the Cauer networks, are really only convenient mathematical models. Cauer networks can be easily implemented using circuit simulating tools, whereas Foster networks may be more easily implemented using mathematical tools (for instance, in a spreadsheet program), according to the following formula: n R(t) +  Ri ǒ1−e−tńtaui Ǔ i+1 http://onsemi.com 10 110 110 100 100 90 90 80 80 70 JA (C°/W) JA (C°/W) NCV4275 1 oz 60 2 oz 70 60 1 oz 2 oz 50 50 40 40 30 150 200 250 300 350 400 450 500 550 600 650 700 750 30 150 200 250 300 350 400 450 500 550 600 650 700 750 COPPER AREA (mm2) COPPER AREA (mm2) Figure 18. qJA vs. Copper Spreader Area, DPAK 5−Lead Figure 19. qJA vs. Copper Spreader Area, D2PAK 5−Lead 100 Cu Area 167 mm2 Cu Area 736 mm2 R(t) C°/W 10 1.0 sqrt(t) 0.1 0.01 0.0000001 0.000001 0.00001 0.0001 0.001 0.01 0.1 1.0 10 100 1000 TIME (sec) Figure 20. Single−Pulse Heating Curves, DPAK 5−Lead 100 Cu Area 167 mm2 Cu Area 736 mm2 R(t) C°/W 10 1.0 0.1 0.01 0.0000001 0.000001 0.00001 0.0001 0.001 0.01 0.1 1.0 TIME (sec) Figure 21. Single−Pulse Heating Curves, D2PAK 5−Lead http://onsemi.com 11 10 100 1000 NCV4275 100 RJA 736 mm2 C°/W 50% Duty Cycle 10 1.0 20% 10% 5% 2% 1% 0.1 Non−normalized Response 0.01 0.0000001 0.000001 0.00001 0.0001 0.001 0.01 0.1 1.0 10 100 1000 10 100 1000 PULSE WIDTH (sec) Figure 22. Duty Cycle for 1” Spreader Boards, DPAK 5−Lead 100 RJA 788 mm2 C°/W 50% Duty Cycle 10 1.0 20% 10% 5% 2% 1% 0.1 Non−normalized Response 0.01 0.0000001 0.000001 0.00001 0.0001 0.001 0.01 0.1 1.0 PULSE WIDTH (sec) Figure 23. Duty Cycle for 1” Spreader Boards, D2PAK 5−Lead ORDERING INFORMATION Device NCV4275DTRK NCV4275DTRKG NCV4275DS Package DPAK DPAK (Pb−Free) 2500 Tape & Reel D2PAK NCV4275DSG D2PAK (Pb−Free) NCV4275DSR4 D2PAK NCV4275DSR4G Shipping† D2PAK (Pb−Free) 50 Units/Rail 800 Tape & Reel †For information on tape and reel specifications,including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. http://onsemi.com 12 MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS DPAK−5, CENTER LEAD CROP CASE 175AA ISSUE B DATE 15 MAY 2014 SCALE 1:1 −T− C B V NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. SEATING PLANE E R R1 Z A S 12 3 4 5 U K F J L H D G 5 PL 0.13 (0.005) M T 2.2 0.086 0.34 5.36 0.013 0.217 5.8 0.228 10.6 0.417 0.8 0.031 SCALE 4:1 mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. DOCUMENT NUMBER: DESCRIPTION: 98AON12855D INCHES MIN MAX 0.235 0.245 0.250 0.265 0.086 0.094 0.020 0.028 0.018 0.023 0.024 0.032 0.180 BSC 0.034 0.040 0.018 0.023 0.102 0.114 0.045 BSC 0.170 0.190 0.185 0.210 0.025 0.040 0.020 −−− 0.035 0.050 0.155 0.170 MILLIMETERS MIN MAX 5.97 6.22 6.35 6.73 2.19 2.38 0.51 0.71 0.46 0.58 0.61 0.81 4.56 BSC 0.87 1.01 0.46 0.58 2.60 2.89 1.14 BSC 4.32 4.83 4.70 5.33 0.63 1.01 0.51 −−− 0.89 1.27 3.93 4.32 GENERIC MARKING DIAGRAMS* RECOMMENDED SOLDERING FOOTPRINT* 6.4 0.252 DIM A B C D E F G H J K L R R1 S U V Z XXXXXXG ALYWW AYWW XXX XXXXXG IC Discrete XXXXXX A L Y WW G = Device Code = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package *This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G” or microdot “ G”, may or may not be present. Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. DPAK−5 CENTER LEAD CROP PAGE 1 OF 1 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS D2PAK 5−LEAD CASE 936A−02 ISSUE E DATE 28 JUL 2021 SCALE 1:1 GENERIC MARKING DIAGRAM* xx xxxxxxxxx AWLYWWG xxxxxx A WL Y WW G = Device Code = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package *This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G” or microdot “G”, may or may not be present. Some products may not follow the Generic Marking. DOCUMENT NUMBER: DESCRIPTION: 98ASH01006A D2PAK 5−LEAD Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 1 OF 1 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. 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