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NCV86603BD50R2G

NCV86603BD50R2G

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    SOIC8_150MIL

  • 描述:

    IC REG LINEAR 5V 150MA 8SOIC

  • 数据手册
  • 价格&库存
NCV86603BD50R2G 数据手册
NCV8660B LD0 Regulator - Very Low Iq, RESET, Delay Time Select 150 mA www.onsemi.com The NCV8660B is a precision very low Iq low dropout voltage regulator. Quiescent currents as low as 28 mA typical make it ideal for automotive applications requiring low quiescent current with or without a load. Integrated control features such as Reset and Delay Time Select make it ideal for powering microprocessors. It is available with a fixed output voltage of 5.0 V and 3.3 V and regulates within ±2.0%. 1 Features • • • • • • • • • • MARKING DIAGRAMS Fixed Output Voltage of 5 V and 3.3 V ±2.0% Output Voltage up to VBAT = 40 V Output Current up to 150 mA Microprocessor Compatible Control Functions: ♦ Delay Time Select ♦ RESET Output NCV Prefix for Automotive ♦ Site and Change Control ♦ AEC−Q100 Qualified Low Dropout Voltage Low Quiescent Current of 28 mA Typical Stable Under No Load Conditions Protection Features: ♦ Thermal Shutdown ♦ Short Circuit These are Pb−Free Devices 660yBxG ALYWW DPAK 5−PIN DT SUFFIX CASE 175AA 5 1 8 8 1 SOIC−8 FUSED CASE 751 1 x y A L Y WW G or G Applications 660yBx ALYWW G = 5 for 5 V Output, 3 for 3.3 V Output = 1 for 8 ms, 128 ms Reset Delay, = 2 for 8 ms, 32 ms Reset Delay = 3 for 16 ms, 64 ms Reset Delay = 4 for 32 ms, 128 ms Reset Delay = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package ORDERING INFORMATION • Automotive: See detailed ordering and shipping information in the dimensions section on page 13 of this data sheet. Body Control Module Instrument and Clusters ♦ Occupant Protection and Comfort ♦ Powertrain Battery Powered Consumer Electronics ♦ ♦ • © Semiconductor Components Industries, LLC, 2011 September, 2019 − Rev. 5 1 Publication Order Number: NCV8660B/D NCV8660B IN VBAT 13.2 V OUT NCV8660B OUT CIN 0.1 mF COUT 2.2 mF DT DT RO RO GND Figure 1. Application Diagram www.onsemi.com 2 NCV8660B PIN DESCRIPTIONS Pin DPAK SOIC−8 FUSED Symbol 1 1 IN Input Supply Voltage. 0.1 mF bypass capacitor to GND at the IC. 2 2 RO Reset Output. CMOS compatible output. Goes low when VOUT drops by more than 7% from nominal. 3, Tab 5−8 GND 4 3 DT 5 4 OUT Function Ground Reset Delay Time Select. Short to GND or connect to OUT to select time. Regulated Voltage Output. 2.2 mF to ground for typical applications. IN OUT Current Limit and Thermal Shutdown + − Vref1 GND DT − Timing Circuit + Vref2 Figure 2. Block Diagram www.onsemi.com 3 RO NCV8660B ABSOLUTE MAXIMUM RATINGS Symbol Min Max Unit Input Voltage (IN) Rating VIN −0.3 40 V Input Current IIN −1.0 − mA −0.3 −0.3 5.5 16 −1.0 Current Limited mA Output Voltage (OUT) DC Transient, t < 10 s (Note 1) VOUT V Output Current (OUT) IOUT Storage Temperature Range TSTG −55 150 °C DT (Reset Delay Time Select) Voltage (Note 2) VDT −0.3 16 V DT (Reset Delay Time Select) Current (Note 2) IDT −1.0 1.0 mA RO (Reset Output) Voltage DC Transient, t < 10 s VRO −0.3 −0.3 5.5 16 RO (Reset Output) Current IRO −1.0 1.0 mA ESD Capability, Human Body Model (Note 3) ESDHB −2.0 2.0 kV ESD Capability, Machine Model (Note 3) ESDMM −200 200 V ESD Capability, Charged Device Model (Note 3) ESDCDM −1.0 1.0 kV V ESD CAPABILITY THERMAL RESISTANCE 15 °C/W RqJA 66 °C/W RqJT 4.0 °C/W SOIC−8 FUSED RqJA 104 °C/W SOIC−8 FUSED RqJT 33 °C/W DPAK 5 SOIC−8 FUSED MSL 1 3 − Junction−to−Case (Note 4) DPAK 5 RqJC Junction−to−Ambient (Note 4) DPAK 5 Junction−to−Tab (Note 4) DPAK 5 Junction−to−Ambient (Note 4) Junction−to−Lead (pin 6) (Note 4) LEAD SOLDERING TEMPERATURE AND MSL Moisture Sensitivity Level Lead Temperature Soldering: SMD style only, Reflow (Note 5) Pb−Free Part 60 − 150 sec above 217°C, 40 sec max at peak SLD − 265 peak °C Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. The output voltage must not exceed the input voltage. 2. External resistor required to minimize current to less than 1 mA when the control voltage is above 16 V. 3. This device series incorporates ESD protection and is tested by the following methods: ESD HBM tested per AEC−Q100−002 (EIA/JESD22−A114) ESD MM tested per AEC−Q100−003 (EIA/JESD22−A115) ESD CDM tested per EIA/JESD22/C101, Field Induced Charge Model 4. Values represented typical steady−state thermal performance on 1 oz. copper FR4 PCB with 1 in2 copper area. 5. Per IPC / JEDEC J−STD−020C. OPERATING RANGE Pin Symbol, Parameter Symbol Min Max Unit VIN, Input Voltage Operating Range VIN 4.5 40 V Junction Temperature Range TJ −40 150 °C www.onsemi.com 4 NCV8660B ELECTRICAL CHARACTERISTICS 5.5 V < VIN < 40 V, −40°C ≤ TJ ≤ +150°C, unless otherwise specified Characteristic Symbol Conditions Min Typ Max Unit Iq 100mA < IOUT < 150mA, VIN = 13.2V, TJ = 25°C − 25 30 mA GENERAL Quiescent Current − − 40 Thermal Shutdown (Note 6) TSD 150 175 195 °C Thermal Hysteresis (Note 6) THYS − 25 − °C 6 V ≤ VIN ≤ 16 V, 0.1 mA ≤ IOUT ≤ 150 mA 4.9 5.0 5.1 V 6 V ≤ VIN ≤ 40 V, 0.1 mA ≤ IOUT ≤ 100 mA 4.9 5.0 5.1 5.6 V ≤ VIN ≤ 16 V, 0 mA ≤ IOUT ≤ 150 mA, −40°C ≤ TJ ≤ +125°C 4.9 5.0 5.1 5.5 V ≤ VIN ≤ 16 V, 0.1 mA ≤ IOUT ≤ 150 mA 3.234 3.3 3.366 5.5 V ≤ VIN ≤ 40 V, 0.1 mA ≤ IOUT ≤ 100 mA 3.234 3.3 3.366 OUT = 96% x VOUT nominal 205 − 525 mA OUT = 0 V 205 − 525 mA 10 40 mV 100mA < IOUT < 150mA, VIN = 13.2V, TJ ≤ 85°C OUT Output Voltage VOUT Output Voltage VOUT Output Current Limit ICL Output Current Limit, Short Circuit ISCKT Load Regulation DVOUT VIN = 13.2 V, IOUT = 0.1 mA to 150 mA −40 Line Regulation DVOUT IOUT = 5 mA, VIN = 6 V to 28 V Dropout Voltage − 5.0 V Only Output Load Capacitance Power Supply Ripple Rejection VDR V −20 0 20 mV IOUT = 100 mA, (Note 7) VDR = VIN – VOUT, (DVOUT = −100 mV) − 0.225 0.45 V IOUT = 150 mA, (Note 7) VDR = VIN – VOUT, (DVOUT = −100 mV) − 0.30 0.60 CO Output capacitance for stability 2.2 − − mF PSRR VIN = 13.2 V, 0.5 VPP, 100 Hz − 60 − dB 2 − − − − 0.8 V V DT = VOUT − − 1.0 mA VOUT decreasing 90 93 96 %VOUT − 2.0 − %VOUT DT (Reset Delay Time Select) Threshold Voltage High Low Input Current RO, Reset Output RESET Threshold RESET Threshold Hysteresis VRf VRhys RO Output Low VRL 10 kW RESET to OUT, VOUT = 4.5 V RO Output High (OUT−RO) VRH 10 kW RESET to GND Reset Reaction Time tRR VIN_RT Input Voltage Reset Threshold − 0.2 0.4 V VOUT −0.4 VOUT −0.2 VOUT V VOUT into UV to RESET Low 16 25 38 msec VIN Decreasing, VOUT > VRT − 3.8 4.25 V 5.0 10 20 40 80 8.0 16 32 64 128 11.5 23 46 92 184 RESET Delay with DT Selection Delay Time Out of RESET − 8 ms version − 16 ms version − 32 ms version − 64 ms version − 128 ms version tdRx VOUT into regulation to RO High msec 6. Not production tested, guaranteed by design. 7. Dropout at a given current level is defined as the voltage difference of VIN to VOUT with VIN decreasing until the output drops by 100 mV. www.onsemi.com 5 NCV8660B 5.0 3.315 4.995 3.310 3.305 4.99 OUTPUT VOLTAGE (V) OUTPUT VOLTAGE (V) TYPICAL OPERATING CHARACTERISTICS 4.985 4.98 4.975 4.97 4.965 60 100 120 80 3.295 3.290 3.285 3.280 3.275 3.270 3.265 Iout = 0 mA, 150 mA 3.260 −40 −20 0 20 40 140 160 Figure 4. Output Voltage vs. Temperature (OUT = 3.3 V) 4.995 3.305 4.99 4.985 4.98 −40°C 4.975 4.97 4.965 150°C 0 20 40 60 80 25°C 3.300 25°C 4.96 100 120 140 3.295 3.285 3.280 3.275 3.270 150°C 3.265 3.260 3.255 160 −40°C 3.290 0 20 40 Figure 5. Output Voltage vs. Output Current (OUT = 5 V) 80 100 120 140 160 Figure 6. Output Voltage vs. Output Current (OUT = 3.3 V) 3.5 5 3.0 OUTPUT VOLTAGE (V) 6 4 −40°C 3 60 OUTPUT CURRENT (mA) OUTPUT CURRENT (mA) OUTPUT VOLTAGE (V) 140 160 Figure 3. Output Voltage vs. Temperature (OUT = 5 V) 3.310 2 25°C 1 0 100 120 TEMPERATURE (°C) 5.0 4.955 80 60 TEMPERATURE (°C) OUTPUT VOLTAGE (V) OUTPUT VOLTAGE (V) Iout = 0 mA, 150 mA 4.96 0 20 40 −40 −20 3.300 2.5 2.0 1.5 150°C 25°C −40°C 1.0 0.5 150°C 0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5 5.5 0 6 0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5 5.5 INPUT VOLTAGE (V) INPUT VOLTAGE (V) Figure 7. Output Voltage vs. Input Voltage (RLOAD = 51 k, Iout = 100 mA, OUT = 5 V) Figure 8. Output Voltage vs. Input Voltage (RLOAD = 33 k, Iout = 100 mA, OUT = 3.3 V) www.onsemi.com 6 6 NCV8660B 380 600 370 500 DROPOUT VOLTAGE (mV) CURRENT LIMIT (mA) TYPICAL OPERATING CHARACTERISTICS 360 350 340 330 320 310 −40 −20 400 200 25°C 100 −40°C Vin = 13.2 V 0 20 40 60 80 100 120 150°C 300 0 140 160 0 25 50 TEMPERATURE (°C) Figure 9. Current Limit vs. Temperature 125 150 40 150 mA 35 500 125 mA 1 mA 400 100 mA 300 75 mA 200 50 mA 25 mA 100 10 mA 0 −40 −20 0 20 40 60 80 100 120 30 25 20 15 10 5 0 140 160 Iout = 0 mA 0 2 4 6 TEMPERATURE (°C) 8 10 12 14 16 INPUT VOLTAGE (V) Figure 11. Dropout Voltage vs. Temperature Figure 12. Quiescent Current vs. Input Voltage 35 29 QUIESCENT CURRENT (mA) 28.5 QUIESCENT CURRENT (mA) 100 Figure 10. Dropout Voltage vs. Output Current QUIESCENT CURRENT (mA) DROPOUT VOLTAGE (mV) 600 75 OUTPUT CURRENT (mA) 28 27.5 27 26.5 26 25.5 25 24.5 24 23.5 −40 −20 0 20 40 60 80 100 120 25°C 25 −40°C 20 15 10 5 0 140 160 150°C 30 0 20 40 60 80 100 120 140 160 TEMPERATURE (°C) OUTPUT CURRENT (mA) Figure 13. Quiescent Current vs. Temperature Figure 14. Quiescent Current vs. Output Current www.onsemi.com 7 NCV8660B TYPICAL OPERATING CHARACTERISTICS Figure 15. Load Transient (VIN = 13.2 V, OUT = 5 V) Figure 17. Load Transient (VIN = 13.2 V, OUT = 3.3 V) IN OUT Cout = 2.2 mF Iout = 150 mA Figure 16. Line Transient (OUT = 5 V) Figure 18. Line Transient (OUT = 3.3 V) www.onsemi.com 8 NCV8660B 80 80 70 70 60 60 MAG (dB) MAG (dB) TYPICAL OPERATING CHARACTERISTICS 50 40 30 20 0 10 100 40 30 20 VIN = 13.2 V COUT = 4.7 mF IOUT = 100 mA 10 50 VIN = 13.2 V COUT = 4.7 mF IOUT = 150 mA 10 0 1k 10 k 100 k 1M 10 M 10 100 1k FREQUENCY Figure 19. Ripple Rejection vs. Frequency (VIN = 13.2 V, IOUT = 100 mA) 10000 125°C 1M 10 M Unstable Region 125°C ESR (W) 100 10 Stable Region 10 1 Stable Region 1 0.1 0.01 25°C −40°C 1000 0 20 40 60 80 100 120 140 Vin = 13.2 V CLOAD = 2.2 mF 0.1 Vin = 13.2 V CLOAD = 2.2 mF 0.01 160 0 20 40 60 80 100 120 140 OUTPUT CURRENT (mA) OUTPUT CURRENT (mA) Figure 21. Output Capacitor ESR vs. Output Current (OUT = 5 V) Figure 22. Output Capacitor ESR vs. Output Current (OUT = 3.3 V) 5.5 5.0 4.5 OUTPUT VOLTAGE (V) ESR (W) 10000 −40°C 100 100 k Figure 20. Ripple Rejection vs. Frequency (VIN = 13.2 V, IOUT = 150 mA) Unstable Region 25°C 1000 10 k FREQUENCY Temperature Increasing 4.0 3.5 Temperature Decreasing 3.0 2.5 2.0 1.5 1.0 0.5 0 25 50 100 75 125 150 175 TEMPERATURE (°C) Figure 23. Thermal Shutdown vs. Temperature www.onsemi.com 9 160 NCV8660B DETAILED OPERATING DESCRIPTION General Current Limit The NCV8660B is a 5 V and 3.3 V linear regulator providing low drop−out voltage for 150 mA at low quiescent current levels. Also featured in this part is a reset output with selectable delay times. Delay times are selectable via part selection and control through the Delay Time Select (DT) pin. No pull−up resistor is needed on the reset output (RO). Pull−up and pull−down capability are included. Only a small bypass capacitor on the input (IN) supply pin and output (OUT) voltage pin are required for normal operation. Thermal shutdown functionality protects the IC from damage caused from excessively high temperatures appearing on the IC. Current limit is provided on OUT to protect the IC. The minimum specification is 205 mA. Current limit is specified under two conditions (OUT = 96% x OUT nominal) and (OUT = 0 V). No fold−back circuitry exists. Any measured differences can be attributed to change in die temperature. The part may be operated up to 205 mA provided thermal die temperature is considered and is kept below 150°C. Degradation of electrical parameters at this current is expected at these elevated levels. A reset (RO) will not occur with a load less than 205 mA. Reset Output A reset signal is provided on the Reset Output (RO) pin to provide feedback to the microprocessor of an out of regulation condition. This is in the form of a logic signal on RO. Output (OUT) voltage conditions below the RESET threshold cause RO to go low. The RO integrity is maintained down to OUT = 1.0 V. The Reset Output (RO) circuitry includes an active internal pullup to the output (OUT) as shown in Figure 24. No external pullup is neccessary. Output Voltage Output stability is determined by the capacitor selected from OUT to GND. The NCV8660B has been designed to work with low ESR (equivalent series resistance) ceramic capacitors. The device is extremely stable using virtually any capacitor 2.2 mF and above. Reference the Output Capacitor Stability graph in Figure 21. The output capacitor value will affect overshoot during power−up. A lower value capacitor will cause higher overshoot on the output. System evaluation should be performed with minimum loading for evaluation of overshoot. Selection of process technology for the NCV8660B allows for low quiescent current independent of loading. Quiescent current will remain flat across the entire range of loads providing a low quiescent current condition in standby and under heavy loads. This is highly beneficial to systems requiring microprocessor interrupts during standby mode as duty cycle and load changes have no impact on the standby current. Reference Figure 14 for Quiescent Current vs Output Current. OUT RO Reset Control Signal Figure 24. Reset Output Circuitry www.onsemi.com 10 NCV8660B IN t Reset Delay Time OUT t < Reset Reaction Time OUT Reset Threshold plus Hysteresis OUT Reset Threshold t RO t Reset Threshold Plus Hysteresis Thermal Shutdown Voltage Dip at Input Reset Delay Time Secondary Spike Overload at Output Reset Delay Time Thermal Shutdown minus Thermal Hysteresis Figure 25. Reset Timing During power−up (or restoring OUT voltage from a reset event), the OUT voltage must be maintained above the Reset threshold for the Reset Delay time before RO goes high. The time for Reset Delay is determined by the choice of IC and the state of the DT pin. The Delay Time select (DT) pin is logic level controlled and provides Reset Delay time per the chart. Note the DT pin is sampled only when RO is low, and changes to the DT pin when RO is high will not effect the reset delay time. Thermal Shutdown When the die temperature exceeds the Thermal Shutdown threshold, a Thermal Shutdown event is detected OUT is turned off, and RO goes low. The IC will remain in this state until the die temperature moves below the shutdown threshold (175°C typical) minus the hysteresis factor (25°C typical). The output will then turn back on and RO will go high after the RESET Delay time. Reset Delay Time Select Selection of the NCV8660B device and the state of the DT pin determines the available Reset Delay times. The part is designed for use with DT tied to ground or OUT, but may be controlled by any logic signal which provides a threshold between 0.8 V and 2 V. The default condition for an open DT pin is the slower Reset time (DT = GND condition). Times are in pairs and are highlighted in the chart below. Consult factory for availability. DT=GND DT=OUT Reset Time Reset Time NCV86601B 8 ms 128 ms NCV86602B 8 ms 32 ms NCV86603B 16 ms 64 ms NCV86604B 32 ms 128 ms Reset Reaction Time www.onsemi.com 11 NCV8660B 90 80 Theta JA curve 70 60 50 40 0 100 R(t), (°C/W) 10 1 0.1 100 200 300 400 500 600 180 1.8 170 1.6 160 1.4 150 1.2 1.0 0.8 0.6 1.2 Power curve with PCB 1 oz cu 140 130 120 110 0.4 100 0.2 90 80 0 700 1.3 MAX POWER (W) Power curve with PCB 1 oz cu MAX POWER (W) ThetaJA (°C/W) 100 2.0 ThetaJA (°C/W) 110 Theta JA curve 1.1 1.0 0.9 0.8 0 100 200 300 400 500 600 COPPER HEAT SPREADER AREA (mm2) COPPER HEAT SPREADER AREA (mm2) Figure 26. RqJA vs. PCB Copper Area (DPAK) Figure 28. RqJA vs. PCB Copper Area (SOIC−8 Fused) 0.7 700 0.5 0.2 0.1 0.05 0.02 0.01 Single Pulse 0.01 0.001 0.000001 Psi Tab−A 0.00001 0.0001 0.001 0.01 0.1 PULSE TIME (sec) 1 10 100 1000 10 100 1000 Figure 27. Transient Thermal Response (DPAK) Cu Area = 645 mm2 100 R(t), (°C/W) 0.5 0.2 10 0.1 0.05 0.02 1 0.01 Single Pulse 0.1 0.01 0.001 0.000001 Psi L−A 0.00001 0.0001 0.001 0.01 0.1 PULSE TIME (sec) 1 Figure 29. Transient Thermal Response (SOIC−8 Fused) Cu Area = 645 mm2 www.onsemi.com 12 NCV8660B ORDERING INFORMATION Reset Delay Time, DT to GND Reset Delay Time, DT to OUT NCV86601BDT50RKG 8 ms 128 ms NCV86602BDT50RKG 8 ms 32 ms NCV86603BDT50RKG 16 ms 64 ms 32 ms 128 ms 8 ms 128 ms NCV86602BD50R2G 8 ms 32 ms NCV86603BD50R2G 16 ms 64 ms NCV86604BD50R2G 32 ms 128 ms NCV86601BDT33RKG 8 ms 128 ms NCV86602BDT33RKG 8 ms 32 ms NCV86603BDT33RKG 16 ms 64 ms 32 ms 128 ms 8 ms 128 ms NCV86602BD33R2G 8 ms 32 ms NCV86603BD33R2G 16 ms 64 ms NCV86604BD33R2G 32 ms 128 ms Device NCV86604BDT50RKG NCV86601BD50R2G NCV86604BDT33RKG NCV86601BD33R2G Output Voltage 5.0 V 3.3 V Package Shipping† DPAK (Pb−Free) 2500 / Tape & Reel SOIC−8 FUSED (Pb−Free) 2500 / Tape & Reel DPAK (Pb−Free) 2500 / Tape & Reel SOIC−8 FUSED (Pb−Free) 2500 / Tape & Reel †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. www.onsemi.com 13 MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS DPAK−5, CENTER LEAD CROP CASE 175AA ISSUE B DATE 15 MAY 2014 SCALE 1:1 −T− C B V NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. SEATING PLANE E R R1 Z A S 12 3 4 5 U K F J L H D G 5 PL 0.13 (0.005) M T 2.2 0.086 0.34 5.36 0.013 0.217 5.8 0.228 10.6 0.417 0.8 0.031 SCALE 4:1 mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. DOCUMENT NUMBER: DESCRIPTION: 98AON12855D INCHES MIN MAX 0.235 0.245 0.250 0.265 0.086 0.094 0.020 0.028 0.018 0.023 0.024 0.032 0.180 BSC 0.034 0.040 0.018 0.023 0.102 0.114 0.045 BSC 0.170 0.190 0.185 0.210 0.025 0.040 0.020 −−− 0.035 0.050 0.155 0.170 MILLIMETERS MIN MAX 5.97 6.22 6.35 6.73 2.19 2.38 0.51 0.71 0.46 0.58 0.61 0.81 4.56 BSC 0.87 1.01 0.46 0.58 2.60 2.89 1.14 BSC 4.32 4.83 4.70 5.33 0.63 1.01 0.51 −−− 0.89 1.27 3.93 4.32 GENERIC MARKING DIAGRAMS* RECOMMENDED SOLDERING FOOTPRINT* 6.4 0.252 DIM A B C D E F G H J K L R R1 S U V Z XXXXXXG ALYWW AYWW XXX XXXXXG IC Discrete XXXXXX A L Y WW G = Device Code = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package *This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G” or microdot “ G”, may or may not be present. Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. DPAK−5 CENTER LEAD CROP PAGE 1 OF 1 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS SOIC−8 NB CASE 751−07 ISSUE AK 8 1 SCALE 1:1 −X− DATE 16 FEB 2011 NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A AND B DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE. 5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. 751−01 THRU 751−06 ARE OBSOLETE. NEW STANDARD IS 751−07. A 8 5 S B 0.25 (0.010) M Y M 1 4 −Y− K G C N X 45 _ SEATING PLANE −Z− 0.10 (0.004) H M D 0.25 (0.010) M Z Y S X J S 8 8 1 1 IC 4.0 0.155 XXXXX A L Y W G IC (Pb−Free) = Specific Device Code = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package XXXXXX AYWW 1 1 Discrete XXXXXX AYWW G Discrete (Pb−Free) XXXXXX = Specific Device Code A = Assembly Location Y = Year WW = Work Week G = Pb−Free Package *This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G” or microdot “G”, may or may not be present. Some products may not follow the Generic Marking. 1.270 0.050 SCALE 6:1 INCHES MIN MAX 0.189 0.197 0.150 0.157 0.053 0.069 0.013 0.020 0.050 BSC 0.004 0.010 0.007 0.010 0.016 0.050 0 _ 8 _ 0.010 0.020 0.228 0.244 8 8 XXXXX ALYWX G XXXXX ALYWX 1.52 0.060 0.6 0.024 MILLIMETERS MIN MAX 4.80 5.00 3.80 4.00 1.35 1.75 0.33 0.51 1.27 BSC 0.10 0.25 0.19 0.25 0.40 1.27 0_ 8_ 0.25 0.50 5.80 6.20 GENERIC MARKING DIAGRAM* SOLDERING FOOTPRINT* 7.0 0.275 DIM A B C D G H J K M N S mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. STYLES ON PAGE 2 DOCUMENT NUMBER: DESCRIPTION: 98ASB42564B SOIC−8 NB Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 1 OF 2 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com SOIC−8 NB CASE 751−07 ISSUE AK DATE 16 FEB 2011 STYLE 1: PIN 1. EMITTER 2. COLLECTOR 3. COLLECTOR 4. EMITTER 5. EMITTER 6. BASE 7. BASE 8. EMITTER STYLE 2: PIN 1. COLLECTOR, DIE, #1 2. COLLECTOR, #1 3. COLLECTOR, #2 4. COLLECTOR, #2 5. BASE, #2 6. EMITTER, #2 7. BASE, #1 8. EMITTER, #1 STYLE 3: PIN 1. DRAIN, DIE #1 2. DRAIN, #1 3. DRAIN, #2 4. DRAIN, #2 5. GATE, #2 6. SOURCE, #2 7. GATE, #1 8. SOURCE, #1 STYLE 4: PIN 1. ANODE 2. ANODE 3. ANODE 4. ANODE 5. ANODE 6. ANODE 7. ANODE 8. COMMON CATHODE STYLE 5: PIN 1. DRAIN 2. DRAIN 3. DRAIN 4. DRAIN 5. GATE 6. GATE 7. SOURCE 8. SOURCE STYLE 6: PIN 1. SOURCE 2. DRAIN 3. DRAIN 4. SOURCE 5. SOURCE 6. GATE 7. GATE 8. SOURCE STYLE 7: PIN 1. INPUT 2. EXTERNAL BYPASS 3. THIRD STAGE SOURCE 4. GROUND 5. DRAIN 6. GATE 3 7. SECOND STAGE Vd 8. FIRST STAGE Vd STYLE 8: PIN 1. COLLECTOR, DIE #1 2. BASE, #1 3. BASE, #2 4. COLLECTOR, #2 5. COLLECTOR, #2 6. EMITTER, #2 7. EMITTER, #1 8. COLLECTOR, #1 STYLE 9: PIN 1. EMITTER, COMMON 2. COLLECTOR, DIE #1 3. COLLECTOR, DIE #2 4. EMITTER, COMMON 5. EMITTER, COMMON 6. BASE, DIE #2 7. BASE, DIE #1 8. EMITTER, COMMON STYLE 10: PIN 1. GROUND 2. BIAS 1 3. OUTPUT 4. GROUND 5. GROUND 6. BIAS 2 7. INPUT 8. GROUND STYLE 11: PIN 1. SOURCE 1 2. GATE 1 3. SOURCE 2 4. GATE 2 5. DRAIN 2 6. DRAIN 2 7. DRAIN 1 8. DRAIN 1 STYLE 12: PIN 1. SOURCE 2. SOURCE 3. SOURCE 4. GATE 5. DRAIN 6. DRAIN 7. DRAIN 8. DRAIN STYLE 13: PIN 1. N.C. 2. SOURCE 3. SOURCE 4. GATE 5. DRAIN 6. DRAIN 7. DRAIN 8. DRAIN STYLE 14: PIN 1. N−SOURCE 2. N−GATE 3. P−SOURCE 4. P−GATE 5. P−DRAIN 6. P−DRAIN 7. N−DRAIN 8. N−DRAIN STYLE 15: PIN 1. ANODE 1 2. ANODE 1 3. ANODE 1 4. ANODE 1 5. CATHODE, COMMON 6. CATHODE, COMMON 7. CATHODE, COMMON 8. CATHODE, COMMON STYLE 16: PIN 1. EMITTER, DIE #1 2. BASE, DIE #1 3. EMITTER, DIE #2 4. BASE, DIE #2 5. COLLECTOR, DIE #2 6. COLLECTOR, DIE #2 7. COLLECTOR, DIE #1 8. COLLECTOR, DIE #1 STYLE 17: PIN 1. VCC 2. V2OUT 3. V1OUT 4. TXE 5. RXE 6. VEE 7. GND 8. ACC STYLE 18: PIN 1. ANODE 2. ANODE 3. SOURCE 4. GATE 5. DRAIN 6. DRAIN 7. CATHODE 8. CATHODE STYLE 19: PIN 1. SOURCE 1 2. GATE 1 3. SOURCE 2 4. GATE 2 5. DRAIN 2 6. MIRROR 2 7. DRAIN 1 8. MIRROR 1 STYLE 20: PIN 1. SOURCE (N) 2. GATE (N) 3. SOURCE (P) 4. GATE (P) 5. DRAIN 6. DRAIN 7. DRAIN 8. DRAIN STYLE 21: PIN 1. CATHODE 1 2. CATHODE 2 3. CATHODE 3 4. CATHODE 4 5. CATHODE 5 6. COMMON ANODE 7. COMMON ANODE 8. CATHODE 6 STYLE 22: PIN 1. I/O LINE 1 2. COMMON CATHODE/VCC 3. COMMON CATHODE/VCC 4. I/O LINE 3 5. COMMON ANODE/GND 6. I/O LINE 4 7. I/O LINE 5 8. COMMON ANODE/GND STYLE 23: PIN 1. LINE 1 IN 2. COMMON ANODE/GND 3. COMMON ANODE/GND 4. LINE 2 IN 5. LINE 2 OUT 6. COMMON ANODE/GND 7. COMMON ANODE/GND 8. LINE 1 OUT STYLE 24: PIN 1. BASE 2. EMITTER 3. COLLECTOR/ANODE 4. COLLECTOR/ANODE 5. CATHODE 6. CATHODE 7. COLLECTOR/ANODE 8. COLLECTOR/ANODE STYLE 25: PIN 1. VIN 2. N/C 3. REXT 4. GND 5. IOUT 6. IOUT 7. IOUT 8. IOUT STYLE 26: PIN 1. GND 2. dv/dt 3. ENABLE 4. ILIMIT 5. SOURCE 6. SOURCE 7. SOURCE 8. VCC STYLE 29: PIN 1. BASE, DIE #1 2. EMITTER, #1 3. BASE, #2 4. EMITTER, #2 5. COLLECTOR, #2 6. COLLECTOR, #2 7. COLLECTOR, #1 8. COLLECTOR, #1 STYLE 30: PIN 1. DRAIN 1 2. DRAIN 1 3. GATE 2 4. SOURCE 2 5. SOURCE 1/DRAIN 2 6. SOURCE 1/DRAIN 2 7. SOURCE 1/DRAIN 2 8. GATE 1 DOCUMENT NUMBER: DESCRIPTION: 98ASB42564B SOIC−8 NB STYLE 27: PIN 1. ILIMIT 2. OVLO 3. UVLO 4. INPUT+ 5. SOURCE 6. SOURCE 7. SOURCE 8. DRAIN STYLE 28: PIN 1. SW_TO_GND 2. DASIC_OFF 3. DASIC_SW_DET 4. GND 5. V_MON 6. VBULK 7. VBULK 8. VIN Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 2 OF 2 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. 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