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June 1997
NDP6030PL / NDB6030PL
P-Channel Logic Level Enhancement Mode Field Effect Transistor
General Description
Features
These P-Channel logic level enhancement mode power field
effect transistors are produced using Fairchild's proprietary,
high cell density, DMOS technology. This very high density
process is especially tailored to minimize on-state resistance.
These devices are particularly suited for low voltage
applications such as DC/DC converters and high efficiency
switching circuits where fast switching, low in-line power loss,
and resistance to transients are needed.
-30 A, -30 V. RDS(ON) = 0.042 Ω @ VGS= -4.5 V
RDS(ON) = 0.025 Ω @ VGS= -10 V.
Critical DC electrical parameters specified at elevated
temperature.
Rugged internal source-drain diode can eliminate the need
for an external Zener diode transient suppressor.
High density cell design for extremely low RDS(ON).
175°C maximum junction temperature rating.
________________________________________________________________________________
S
G
D
Absolute Maximum Ratings
T C = 25°C unless otherwise noted
Symbol
Parameter
NDP6030PL
VDSS
Drain-Source Voltage
-30
V
VGSS
Gate-Source Voltage - Continuous
±16
V
ID
Drain Current
- Continuous
-30
A
- Pulsed
-90
PD
Total Power Dissipation @ TC = 25°C
Derate above 25°C
TJ,TSTG
Operating and Storage Temperature Range
TL
Maximum lead temperature for soldering purposes,
1/8" from case for 5 seconds
TJ,TSTG
Operating and Storage Temperature Range
NDB6030PL
75
Units
W
0.5
-65 to 175
°C
275
°C
-65 to 175
°C
2
°C/W
62.5
°C/W
THERMAL CHARACTERISTICS
RθJC
Thermal Resistance, Junction-to-Case
RθJA
Thermal Resistance, Junction-to-Ambient
© 1997 Fairchild Semiconductor Corporation
NDP6030PL Rev.B1
Electrical Characteristics (TC = 25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
OFF CHARACTERISTICS
BVDSS
Drain-Source Breakdown Voltage
VGS = 0 V, ID = -250 µA
-30
V
∆BVDSS/∆TJ
Breakdown Voltage Temp. Coefficient
ID = -250 µA, Referenced to 25 C
IDSS
Zero Gate Voltage Drain Current
VDS = -24 V, VGS = 0 V
IGSSF
Gate - Body Leakage, Forward
VGS = 16 V, VDS = 0 V
IGSSR
Gate - Body Leakage, Reverse
VGS = -16 V, VDS = 0 V
-100
nA
o
TJ = 125°C
ON CHARACTERISTICS
-250
µA
1
mA
-100
nA
(Note)
∆VGS(th)/∆TJ
Gate Threshold Voltage Temp.Coefficient
ID = -250 µA, Referenced to 25 o C
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID= -250 µA
TJ = 125°C
RDS(ON)
mV/oC
-36
Static Drain-Source On-Resistance
mV/oC
2.2
-1
-1.4
-2
-0.8
-1.08
-1.6
0.037
0.042
0.053
0.075
0.021
0.025
VGS = -4.5 V, ID = -15 A
TJ = 125°C
VGS = -10 V, ID = -19 A
-20
V
Ω
ID(on)
On-State Drain Current
VGS = -4.5 V, VDS = -5 V
A
gFS
Forward Transconductance
VDS = -4.5 V, ID = -19 A
20
S
VDS = -15 V, VGS = 0 V,
f = 1.0 MHz
1570
pF
975
pF
360
pF
DYNAMIC CHARACTERISTICS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
SWITCHING CHARACTERISTICS
(Note)
tD(on)
Turn - On Delay Time
12.5
25
nS
tr
Turn - On Rise Time
60
120
nS
tD(off)
Turn - Off Delay Time
50
100
nS
tf
Turn - Off Fall Time
52
100
nS
Qg
Total Gate Charge
26
36
nC
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDD = -15 V, ID = -5 A,
VGS = -5 V, RGEN = 6 Ω
VDS= -12 V
ID = -30 A , VGS = -5 V
6.5
nC
11.5
nC
DRAIN-SOURCE DIODE CHARACTERISTICS
IS
Maximum Continuos Drain-Source Diode Forward Current
ISM
Maximum Pulsed Drain-Source Diode Forward Current
VSD
Drain-Source Diode Forward Voltage
VGS = 0 V, IS = -15 A
trr
Reverse Recovery Time
Irr
Reverse Recovery Current
VGS = 0 V, IF = -30 A
dIF/dt = 100 A/µs
(Note)
-0.92
-30
A
-100
A
-1.3
V
58
ns
-1.5
A
Note:
Pulse Test: Pulse Width < 300 µs, Duty Cycle < 2.0%.
NDP6030PL Rev.B1
V GS = -10V -7.0
1.6
-6.0
R DS(ON) , NORMALIZED
60
-5.0
-4.5
40
-4.0
-3.5
20
-3.0
0
DRAIN-SOURCE ON-RESISTANCE
-I D , DRAIN-SOURCE CURRENT (A)
Typical Electrical Characteristics
V GS= -3.5 V
1.4
-4.0
-4.5
1.2
-5.0
1
-5.5
-6.0
0.8
-7.0
-10
0.6
0.4
0
1
2
3
4
0
5
10
20
T = 25°C
I D = -15A
60
V GS = -4.5V
1.4
1.2
1
0.8
-25
ID = -15A
A
R DS(ON) , ON-RESISTANCE
R DS(ON), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE (OHMS)
50
0.12
1.8
0.6
-50
40
Figure 2. On-Resistance Variation
with Drain Current and Gate Voltage.
Figure 1. On-Region Characteristics.
1.6
30
-I D , DRAIN CURRENT (A)
-VDS , DRAIN-SOURCE VOLTAGE (V)
0
25
50
75
100
125
T , JUNCTION TEMPERATURE (°C)
150
0.1
125 °C
0.08
0.06
0.04
0.02
175
0
J
2
4
6
8
10
-VGS ,GATE TO SOURCE VOLTAGE (V)
Figure 3. On-Resistance Variation
with Temperature.
Figure 4. On Resistance Variation with
Gate-To- Source Voltage.
T = -55°C
A
-ID , DRAIN CURRENT (A)
VDS = -5V
-IS , REVERSE DRAIN CURRENT (A)
30
25°C
25
125°C
20
15
10
5
0
1
2
-V
GS
3
4
, GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics.
5
60
10
VGS = 0V
TJ = 125°C
1
25°C
0.1
-55°C
0.01
0.0001
0.2
0.4
-V
SD
0.6
0.8
1
1.2
1.4
, BODY DIODE FORWARD VOLTAGE (V)
Figure 6. Body Diode Forward Voltage
Variation with Source Current and
Temperature.
NDP6030PL Rev.B1
Typical Electrical Characteristics (continued)
5000
I D = -30A
3000
VDS = -6V
-12V
-24V
8
CAPACITANCE (pF)
-V GS , GATE-SOURCE VOLTAGE (V)
10
6
4
2000
Ciss
Coss
1000
500
2
0
150
0.1
0
10
20
30
40
Crss
f = 1 MHz
VGS = 0 V
300
0.3
1
2
5
10
20
30
-VDS , DRAIN TO SOURCE VOLTAGE (V)
50
Q g , GATE CHARGE (nC)
Figure 8.Capacitance Characteristics.
Figure 7. Gate Charge Characteristics.
150
N)
S(O
RD
50
VGS = -4.5V
SINGLE PULSE
R θJC = 2.0 °C/W
TC = 25°C
4000
3000
2000
1000
0
0.001
1
1
SINGLE PULSE
R θJC =2° C/W
TC = 25°C
5000
10m
s
100
ms
DC
10
2
6000
1m
s
30
5
7000
10µ
s
10
0µ
s
IT
LIM
POWER (W)
-ID , DRAIN CURRENT (A)
100
2
5
10
20
30
50
0.01
TRANSIENT THERMAL RESISTANCE
Figure 9. Maximum Safe Operating Area.
r(t), NORMALIZED EFFECTIVE
0.1
1
10
100
1,000
SINGLE PULSE TIME (mS)
- V DS , DRAIN-SOURCE VOLTAGE (V)
Figure 10. Single Pulse Maximum Power
Dissipation.
1
0.5
0.3
D = 0.5
R θJC (t) = r(t) * RθJC
R θJC = 2.0 °C/W
0.2
0.2
0.1
0.1
P(pk)
0.05
0.05
0.03
t1
0.02
0.01
0.02
Single Pulse
0.01
0.01
0.05
t2
TJ - TC = P * RθJC (t)
Duty Cycle, D = t1 /t2
0.1
0.5
1
5
t 1 ,TIME (ms)
10
50
100
500
1000
Figure 11. Transient Thermal Response Curve.
NDP6030PL Rev.B1
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
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