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NLSX5014MUTAG

NLSX5014MUTAG

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    UQFN12_2X1.7MM

  • 描述:

    IC XLATOR 4BIT 140MBPS 12UQFN

  • 数据手册
  • 价格&库存
NLSX5014MUTAG 数据手册
NLSX5014 4-Bit 100 Mb/s Configurable Dual-Supply Level Translator The NLSX5014 is a 4-bit configurable dual-supply autosensing bidirectional level translator that does not require a direction control pin. The I/O VCC- and I/O VL-ports are designed to track two different power supply rails, VCC and VL respectively. Both the VCC and the VL supply rails are configurable from 0.9 V to 4.5 V. This allows a logic signal on the VL side to be translated to either a higher or a lower logic signal voltage on the VCC side, and vice-versa. The NLSX5014 offers the feature that the values of the VCC and VL supplies are independent. Design flexibility is maximized because VL can be set to a value either greater than or less than the VCC supply. In contrast, the majority of competitive auto sense translators have a restriction that the value of the VL supply must be equal to less than (VCC - 0.4) V. The NLSX5014 has high output current capability, which allows the translator to drive high capacitive loads such as most high frequency EMI filters. Another feature of the NLSX5014 is that each I/O_VLn and I/O_VCCn channel can function as either an input or an output. An Output Enable (EN) input is available to reduce the power consumption. The EN pin can be used to disable both I/O ports by putting them in 3-state which significantly reduces the supply current from both VCC and VL. The EN signal is referenced to the VL supply. − VL may be greater than, equal to, or less than VCC High 100 pF Capacitive Drive Capability High−Speed with 140 Mb/s Guaranteed Date Rate for VCC, VL > 1.8 V Low Bit−to−Bit Skew Overvoltage Tolerant Enable and I/O Pins Non−preferential Powerup Sequencing Power−Off Protection Small packaging: 1.7 mm x 2.0 mm UQFN12, SOIC14, TSSOP14 These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant Typical Applications • Mobile Phones, PDAs, Other Portable Devices • ESD Protection for All Pins: HBM (Human Body Model) > 7000 V © Semiconductor Components Industries, LLC, 2014 April, 2018 − Rev. 8 1 M G AAMG G = Date Code = Pb−Free Package (Note: Microdot may be in either location) 14 SOIC−14 D SUFFIX CASE 751A 14 1 NLSX5014G AWLYWW 1 14 TSSOP−14 DT SUFFIX CASE 948G 14 NLSX 5014 ALYWG G A = Assembly Location WL, L = Wafer Lot YY, Y = Year WW, W = Work Week G or G = Pb−Free Package (Note: Microdot may be in either location) ORDERING INFORMATION Device Package Shipping† NLSX5014MUTAG UQFN12 3000/Tape & Reel (Pb−Free) NLSX5014DR2G SO−14 2500/Tape & Reel (Pb−Free) NLSX5014DTR2G TSSOP14 2500/Tape & Reel (Pb−Free) †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. Important Information ♦ UQFN12 MU SUFFIX CASE 523AE 1 • Wide VCC, VL Operating Range: 0.9 V to 4.5 V • VL and VCC are independent • • • • • • MARKING DIAGRAMS 1 Features • • www.onsemi.com 1 Publication Order Number: NLSX5014/D NLSX5014 P One−Shot VL +1.8V VCC R1 +3.6V 1k VL +1.8 V System I/O1 I/On GND OE NLSX5014 I/O VL1 N One−Shot VCC +3.6 V System I/O VCC1 I/O1 I/O VLn I/O VCCn EN GND I/On I/O VL I/O VCC P One−Shot R2 GND 1k N One−Shot Figure 1. Typical Application Circuit 2.5 V VL mC NLSX5014 VCC 3.0 V 2.5 V Temperature Sensor mC CE I/O VL1 I/O VCC1 CE SCK I/O VL2 I/O VCC2 SDO I/O VL3 SDI I/O VL4 ANO EN Figure 2. Simplified Functional Diagram (1 I/O Line) 1.8 V VL NLSX5014 VCC Temperature Sensor CE I/O VL1 I/O VCC1 CE SCK SCK I/O VL2 I/O VCC2 SCK I/O VCC3 SDI SDO I/O VL3 I/O VCC3 SDI I/O VCC4 SDO SDI I/O VL4 I/O VCC4 SDO GND ANO Figure 3. Application Example for VL < VCC EN GND Figure 4. Application Example for VL > VCC www.onsemi.com 2 NLSX5014 EN VL 1 I/O VL1 VL 1 14 EN I/O VL1 2 13 VCC 11 VCC I/O VL2 3 12 I/O VCC1 2 10 I/O VCC1 I/O VL3 4 11 I/O VCC2 I/O VL2 3 9 I/O VCC2 10 I/O VCC3 4 8 I/O VCC3 I/O VL4 5 I/O VL3 I/O VL4 5 7 I/O VCC4 NC 6 9 NC GND 7 8 I/O VCC4 12 6 GND UQFN12 (Top View) TSSOP/SOIC (Top View) Figure 1. Pin Assignments VL EN VCC GND I/O VL1 I/O VCC1 I/O VL2 I/O VCC2 I/O VL3 I/O VCC3 I/O VL4 I/O VCC4 Figure 2. Logic Diagram PIN ASSIGNMENT Pins FUNCTION TABLE EN Operating Mode VCC VCC Input Voltage Description L Hi−Z VL VL Input Voltage H I/O Buses Connected GND Ground EN Output Enable I/O VCCn I/O Port, Referenced to VCC I/O VLn I/O Port, Referenced to VL www.onsemi.com 3 NLSX5014 MAXIMUM RATINGS Symbol Parameter Value Condition Unit VCC High−side DC Supply Voltage −0.5 to +5.5 V VL Low−side DC Supply Voltage −0.5 to +5.5 V I/O VCC VCC−Referenced DC Input/Output Voltage −0.5 to +5.5 V I/O VL VL−Referenced DC Input/Output Voltage −0.5 to +5.5 V VI Enable Control Pin DC Input Voltage −0.5 to +5.5 V IIK DC Input Diode Current −50 VI < GND mA IOK DC Output Diode Current −50 VO < GND mA ICC DC Supply Current Through VCC $100 mA IL DC Supply Current Through VL $100 mA IGND DC Ground Current Through Ground Pin $100 mA TSTG Storage Temperature −65 to +150 °C 400 7000 2000 100 V V V mA ESD Rating Machine Model Human Body Model Charged Device Model LU Pass Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. RECOMMENDED OPERATING CONDITIONS Symbol Parameter Min Max Unit VCC High−side Positive DC Supply Voltage 0.9 4.5 V VL Low−side Positive DC Supply Voltage 0.9 4.5 V VI Enable Control Pin Voltage GND 4.5 V VIO Bus Input/Output Voltage GND GND 4.5 4.5 V TA Operating Temperature Range −55 +125 °C 0 10 ns Dt/DV I/O VCC I/O VL Input Transition Rise or Rate VI, VIO from 30% to 70% of VCC; VCC = 3.3 V $ 0.3 V Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. www.onsemi.com 4 NLSX5014 DC ELECTRICAL CHARACTERISTICS −405C to +855C Max Min Max Unit VCC (V) (Note 2) VL (V) (Note 3) I/O VCC Input HIGH Voltage 0.9 – 4.5 0.9 – 4.5 2/3 * VCC − − 2/3 * VCC − V VILC I/O VCC Input LOW Voltage 0.9 – 4.5 0.9 – 4.5 − − 1/3 * VCC − 1/3 * VCC V VIHL I/O VL Input HIGH Voltage 0.9 – 4.5 0.9 – 4.5 2/3 * VL − − 2/3 * VL − V VILL I/O VL Input LOW Voltage 0.9 – 4.5 0.9 – 4.5 − − 1/3 * VL − 1/3 * VL V VIH Control Pin Input HIGH Voltage TA = +25°C 1.2 – 4.5 1.2 – 4.5 2/3 * VL − − 2/3 * VL − V VIL Control Pin Input LOW Voltage TA = +25°C 1.2 – 4.5 1.2 – 4.5 − − 1/3 * VL − 1/3 * VL V VIH Control Pin Input HIGH Voltage TA = +25°C VCC < 1.2 VL < 1.2 VL − − VL − V VIL Control Pin Input LOW Voltage TA = +25°C VCC < 1.2 VL < 1.2 − − 0 − 0 V VOHC I/O VCC Output HIGH Voltage I/O VCC source current = 20 mA 0.9 – 4.5 0.9 – 4.5 0.9 * VCC − − 0.9 * VCC − V VOLC I/O VCC Output LOW Voltage I/O VCC sink current = 20 mA 0.9 – 4.5 0.9 – 4.5 − − 0.2 − 0.2 V VOHL I/O VL Output HIGH Voltage I/O VL source current = 20 mA 0.9 – 4.5 0.9 – 4.5 0.9 * VL − − 0.9 * VL − V VOLL I/O VL Output LOW Voltage I/O VL sink current = 20 mA 0.9 – 4.5 0.9 – 4.5 − − 0.2 − 0.2 V IQVCC VCC Supply Current EN = VL, IO = 0 A, (I/O VCC = 0 V or VCC, I/O VL = float) or (I/O VCC = float, I/O VL = 0 V or VL) 0.9 – 4.5 0.9 – 4.5 − − 1 − 2.5 mA 0.9 – 4.5 0.9 – 4.5 − − 1 − 2.5 mA TA = +25°C, EN = 0 V (I/O VCC = 0 V or VCC, I/O VL = float) or (I/O VCC = float, I/O VL = 0 V or VL) 0.9 – 4.5 0.9 – 4.5 − − 0.5 − 1.5 mA 0.9 – 4.5 0.9 – 4.5 − − 0.5 − 1.5 mA Symbol Parameter VIHC IQVL ITS−VCC VL Supply Current VCC Tristate Output Mode Supply Current Test Conditions (Note 1) −555C to +1255C Typ (Note 4) Min ITS−VL VL Tristate Output Mode Supply Current IOZ I/O Tristate Output Mode Leakage Current TA = +25°C, EN = 0V 0.9 – 4.5 0.9 – 4.5 − − ±1 − ±1.5 mA II Control Pin Input Current TA = +25°C 0.9 – 4.5 0.9 – 4.5 − − ±1 − ±1 mA I/O VCC = 0 to 4.5V, 0 0 − − 1 − 1.5 mA I/O VL = 0 to 4.5 V 0.9 – 4.5 0 − − 1 − 1.5 0 0.9 – 4.5 − − 1 − 1.5 IOFF Power Off Leakage Current Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 1. Normal test conditions are VI = 0 V, CIOVCC ≤ 15 pF and CIOVL ≤ 15 pF, unless otherwise specified. 2. VCC is the supply voltage associated with the I/O VCC port, and VCC ranges from +0.9 V to 4.5 V under normal operating conditions. 3. VL is the supply voltage associated with the I/O VL port, and VL ranges from +0.9 V to 4.5 V under normal operating conditions. 4. Typical values are for VCC = +2.8 V, VL = +1.8 V and TA = +25°C. All units are production tested at TA = +25°C. Limits over the operating temperature range are guaranteed by design. www.onsemi.com 5 NLSX5014 TIMING CHARACTERISTICS −555C to +1255C Symbol Parameter Test Conditions (Note 5) VCC (V) (Note 6) VL (V) (Note 7) Min Typ (Note 8) Max Unit 0.9 – 4.5 0.9 – 4.5 − − 8.5 nS 1.8 – 4.5 1.8 – 4.5 − − 3.5 0.9 – 4.5 0.9 – 4.5 − − 8.5 1.8 – 4.5 1.8 – 4.5 − − 3.5 0.9 – 4.5 0.9 – 4.5 − − 8.5 1.8 – 4.5 1.8 – 4.5 − − 3.5 0.9 – 4.5 0.9 – 4.5 − − 8.5 1.8 – 4.5 1.8 – 4.5 − − 3.5 tR−VCC I/O VCC Rise Time CIOVCC = 15 pF tF−VCC I/O VCC Fall Time CIOVCC = 15 pF tR−VL tF−VL ZOVCC ZOVL I/O VL Rise Time I/O VL Fall Time CIOVL = 15 pF CIOVL = 15 pF nS nS nS I/O VCC One−Shot Output Impedance (Note 9) 0.9 1.8 4.5 0.9 – 4.5 − − − 37 20 6.0 − − − W I/O VL One−Shot Output Impedance (Note 9) 0.9 1.8 4.5 0.9 – 4.5 − − − 37 20 6.0 − − − W CIOVCC = 15 pF 0.9 – 4.5 0.9 – 4.5 − − 35 nS 1.8 – 4.5 1.8 – 4.5 − − 10 0.9 – 4.5 0.9 – 4.5 − − 35 1.8 – 4.5 1.8 – 4.5 − − 10 1.0 – 4.5 1.0 – 4.5 − − 37 1.8 – 4.5 1.8 – 4.5 − − 11 1.2 – 4.5 1.2 – 4.5 − − 40 1.8 – 4.5 1.8 – 4.5 − − 13 0.9 – 4.5 0.9 – 4.5 − − 35 1.8 – 4.5 1.8 – 4.5 − − 10 0.9 – 4.5 0.9 – 4.5 − − 35 1.8 – 4.5 1.8 – 4.5 − − 10 1.0 – 4.5 1.0 – 4.5 − − 37 1.8 – 4.5 1.8 – 4.5 − − 11 1.2 – 4.5 1.2 – 4.5 − − 40 1.8 – 4.5 1.8 – 4.5 − − 13 tPD_VL−VCC Propagation Delay (Driving I/O VCC) CIOVCC = 30 pF CIOVCC = 50 pF CIOVCC = 100 pF tPD_VCC−VL Propagation Delay (Driving I/O VL) CIOVL = 15 pF CIOVL = 30 pF CIOVL = 50 pF CIOVL = 100 pF nS tSK Channel−to−Channel Skew CIOVCC = 15 pF, CIOVL = 15 pF (Note 9) 0.9 – 4.5 0.9 – 4.5 − − 0.15 nS IIN_PEAK Input Driver Maximum Peak Current EN = VL; I/O_VCC = 1 MHz Square Wave, Amplitude = VCC, or I/O_VL = 1 MHz Square Wave, Amplitude = VL (Note 9) 0.9 – 4.5 0.9 – 4.5 − − 5.0 mA 5. 6. 7. 8. Normal test conditions are VI = 0 V, CIOVCC ≤ 15 pF and CIOVL ≤ 15 pF, unless otherwise specified. VCC is the supply voltage associated with the I/O VCC port, and VCC ranges from +0.9 V to 4.5 V under normal operating conditions. VL is the supply voltage associated with the I/O VL port, and VL ranges from +0.9 V to 4.5 V under normal operating conditions. Typical values are for VCC = +2.8 V, VL = +1.8 V and TA = +25°C. All units are production tested at TA = +25°C. Limits over the operating temperature range are guaranteed by design. 9. Guaranteed by design. www.onsemi.com 6 NLSX5014 TIMING CHARACTERISTICS (continued) −555C to +1255C Symbol tEN−VCC tEN−VL I/O_VCC Output Enable Time I/O_VL Output Enable Time tDIS−VCC I/O_VCC Output Disable Time tDIS−VL MDR Test Conditions (Note 10) VCC (V) (Note 11) VL (V) (Note 12) Min Typ (Note 13) Max Unit tPZH CIOVCC = 15 pF, I/O_VL = VL 0.9 – 4.5 0.9 – 4.5 − − 160 nS tPZL CIOVCC = 15 pF, I/O_VL = 0 V 0.9 – 4.5 0.9 – 4.5 − − 130 tPZH CIOVL = 15 pF, I/O_VCC = VCC 0.9 – 4.5 0.9 – 4.5 − − 160 tPZL CIOVL = 15 pF, I/O_VCC = 0 V 0.9 – 4.5 0.9 – 4.5 − − 130 tPHZ CIOVCC = 15 pF, I/O_VL = VL 0.9 – 4.5 0.9 – 4.5 − − 210 tPLZ CIOVCC = 15 pF, I/O_VL = 0 V 0.9 – 4.5 0.9 – 4.5 − − 175 tPHZ CIOVL = 15 pF, I/O_VCC = VCC 0.9 – 4.5 0.9 – 4.5 − − 210 tPLZ CIOVL = 15 pF, I/O_VCC = 0 V 0.9 – 4.5 0.9 – 4.5 − − 175 CIO = 15 pF 0.9 – 4.5 0.9 – 4.5 50 − − 1.8 – 4.5 1.8 – 4.5 140 − − 0.9 – 4.5 0.9 – 4.5 40 − − 1.8 – 4.5 1.8 – 4.5 120 − − 1.0 – 4.5 1.0 – 4.5 30 − − 1.8 – 4.5 1.8 – 4.5 100 − − 1.2 – 4.5 1.2 – 4.5 20 − − 1.8 – 4.5 1.8 – 4.5 60 − − Parameter I/O_VL Output Disable Time Maximum Data Rate CIO = 30 pF CIO = 50 pF CIO = 100 pF nS nS nS mbps 10. Normal test conditions are VI = 0 V, CIOVCC ≤ 15 pF and CIOVL ≤ 15 pF, unless otherwise specified. 11. VCC is the supply voltage associated with the I/O VCC port, and VCC ranges from +0.9 V to 4.5 V under normal operating conditions. 12. VL is the supply voltage associated with the I/O VL port, and VL ranges from +0.9 V to 4.5 V under normal operating conditions. 13. Typical values are for VCC = +2.8 V, VL = +1.8 V and TA = +25°C. All units are production tested at TA = +25°C. Limits over the operating temperature range are guaranteed by design. www.onsemi.com 7 NLSX5014 DYNAMIC POWER CONSUMPTION (TA = +25°C) Symbol Parameter CPD_VL VL = Input port, VCC = Output Port VCC = Input port, VL = Output Port CPD_VCC VL = Input port, VCC = Output Port VCC = Input port, VL = Output Port Test Conditions CLoad = 0, f = 1 MHz, EN = VL (outputs enabled) CLoad = 0, f = 1 MHz, EN = VL (outputs enabled) CLoad = 0, f = 1 MHz, EN = VL (outputs enabled) CLoad = 0, f = 1 MHz, EN = VL (outputs enabled) VCC (V) (Note 14) VL (V) (Note 15) Typ (Note 16) Unit 0.9 4.5 39 pF 1.5 1.8 20 1.8 1.5 17 1.8 1.8 14 1.8 2.8 13 2.5 2.5 14 2.8 1.8 13 4.5 0.9 19 0.9 4.5 37 1.5 1.8 30 1.8 1.5 29 1.8 1.8 29 1.8 2.8 29 2.5 2.5 30 2.8 1.8 29 4.5 0.9 19 0.9 4.5 29 1.5 1.8 29 1.8 1.5 29 1.8 1.8 29 1.8 2.8 29 2.5 2.5 30 2.8 1.8 29 4.5 0.9 35 0.9 4.5 21 1.5 1.8 18 1.8 1.5 18 1.8 1.8 14 1.8 2.8 13 2.5 2.5 14 2.8 1.8 13 4.5 0.9 30 pF pF pF 14. VCC is the supply voltage associated with the I/O VCC port, and VCC ranges from +0.9 V to 4.5 V under normal operating conditions. 15. VL is the supply voltage associated with the I/O VL port, and VL ranges from +0.9 V to 4.5 V under normal operating conditions. 16. Typical values are at TA = +25°C. 17. CPD VL and CPD VCC are defined as the value of the IC’s equivalent capacitance from which the operating current can be calculated for the VL and VCC power supplies, respectively. ICC = ICC (dynamic) + ICC (static) ≈ ICC(operating) ≈ CPD x VCC x fIN x NSW where ICC = ICC_VCC + ICC VL and NSW = total number of outputs switching. www.onsemi.com 8 NLSX5014 STATIC POWER CONSUMPTION (TA = +25°C) Symbol Parameter CPD_VL VL = Input port, VCC = Output Port VCC = Input port, VL = Output Port CPD_VCC VL = Input port, VCC = Output Port VCC = Input port, VL = Output Port Test Conditions CLoad = 0, f = 1 MHz, EN = GND (outputs disabled) CLoad = 0, f = 1 MHz, EN = GND (outputs disabled) CLoad = 0, f = 1 MHz, EN = GND (outputs disabled) CLoad = 0, f = 1 MHz, EN = GND (outputs disabled) VCC (V) (Note 18) VL (V) (Note 19) Typ (Note 20) Unit 0.9 4.5 0.01 pF 1.5 1.8 0.01 1.8 1.5 0.01 1.8 1.8 0.01 1.8 2.8 0.01 2.5 2.5 0.01 2.8 1.8 0.01 4.5 0.9 0.01 0.9 4.5 0.01 1.5 1.8 0.01 1.8 1.5 0.01 1.8 1.8 0.01 1.8 2.8 0.01 2.5 2.5 0.01 2.8 1.8 0.01 4.5 0.9 0.01 0.9 4.5 0.01 1.5 1.8 0.01 1.8 1.5 0.01 1.8 1.8 0.01 1.8 2.8 0.01 2.5 2.5 0.01 2.8 1.8 0.01 4.5 0.9 0.01 0.9 4.5 0.01 1.5 1.8 0.01 1.8 1.5 0.01 1.8 1.8 0.01 1.8 2.8 0.01 2.5 2.5 0.01 2.8 1.8 0.01 4.5 0.9 0.01 18. VCC is the supply voltage associated with the I/O VCC port, and VCC ranges from +0.9 V to 4.5 V under normal operating conditions. 19. VL is the supply voltage associated with the I/O VL port, and VL ranges from +0.9 V to 4.5 V under normal operating conditions. 20. Typical values are at TA = +25°C www.onsemi.com 9 pF pF pF NLSX5014 NLSX5014 VL VCC NLSX5014 VL EN I/O VL Source VCC EN I/O VL I/O VCC I/O VCC CIOVL CIOVCC Source tRISE/FALL v 3 ns I/O VL 90% 50% 10% I/O VCC tRISE/FALL v 3 ns 90% 50% 10% tPD_VL−VCC I/O VCC tPD_VCC−VL I/O VL tPD_VL−VCC 90% 50% 10% tPD_VCC−VL 90% 50% 10% tF−VCC tR−VCC tF−VL Figure 3. Driving I/O VL Test Circuit and Timing tR−VL Figure 4. Driving I/O VCC Test Circuit and Timing VCC PULSE GENERATOR 2xVCC OPEN R1 DUT RT CL Test RL Switch tPZH, tPHZ Open tPZL, tPLZ 2 x VCC CL = 15 pF or equivalent (Includes jig and probe capacitance) RL = R1 = 50 kW or equivalent RT = ZOUT of pulse generator (typically 50 W) Figure 5. Test Circuit for Enable/Disable Time Measurement tR tF Input tPLH Output 90% 50% 10% tR EN VCC 90% 50% 10% tPHL GND VL 50% tPZL Output 50% tPZH tF Output 50% GND tPLZ tPHZ HIGH IMPEDANCE 10% VOL 90% VOH Figure 6. Timing Definitions for Propagation Delays and Enable/Disable Measurement www.onsemi.com 10 HIGH IMPEDANCE NLSX5014 IMPORTANT APPLICATIONS INFORMATION Level Translator Architecture VL pins to a high impedance state. Normal translation operation occurs when the EN pin is equal to a logic high signal. The EN pin is referenced to the VL supply and has Over−Voltage Tolerant (OVT) protection. The NLSX5014 auto−sense translator provides bi−directional logic voltage level shifting to transfer data in multiple supply voltage systems. These level translators have two supply voltages, VL and VCC, which set the logic levels on the input and output sides of the translator. When used to transfer data from the I/O VL to the I/O VCC ports, input signals referenced to the VL supply are translated to output signals with a logic level matched to VCC. In a similar manner, the I/O VCC to I/O VL translation shifts input signals with a logic level compatible to VCC to an output signal matched to VL. The NLSX5014 translator consists of bi−directional channels that independently determine the direction of the data flow without requiring a directional pin. One−shot circuits are used to detect the rising or falling input signals. In addition, the one−shots decrease the rise and fall times of the output signal for high−to−low and low−to−high transitions. Uni−Directional versus Bi−Directional Translation The NLSX5014 translator can function as a non−inverting uni−directional translator. One advantage of using the translator as a uni−directional device is that each I/O pin can be configured as either an input or output. The configurable input or output feature is especially useful in applications such as SPI that use multiple uni−directional I/O lines to send data to and from a device. The flexible I/O port of the auto sense translator simplifies the trace connections on the PCB. Power Supply Guidelines The values of the VL and VCC supplies can be set to anywhere between 0.9 and 4.5 V. Design flexibility is maximized because VL may be either greater than or less than the VCC supply. In contrast, the majority of the competitive auto sense translators has a restriction that the value of the VL supply must be equal to less than (VCC − 0.4) V. The sequencing of the power supplies will not damage the device during power−up operation. In addition, the I/O VCC and I/O VL pins are in the high impedance state if either supply voltage is equal to 0 V. For optimal performance, 0.01 to 0.1 mF decoupling capacitors should be used on the VL and VCC power supply pins. Ceramic capacitors are a good design choice to filter and bypass any noise signals on the voltage lines to the ground plane of the PCB. The noise immunity will be maximized by placing the capacitors as close as possible to the supply and ground pins, along with minimizing the PCB connection traces. The NLSX5014 translators have a power down feature that provides design flexibility. The output ports are disabled when either power supply is off (VL or VCC = 0 V). This feature causes all of the I/O pins to be in the power saving high impedance state. Input Driver Requirements Auto−sense translators such as the NLSX5014 have a wide bandwidth, but a relatively small DC output current rating. The high bandwidth of the bi−directional I/O circuit is used to quickly transform from an input to an output driver and vice versa. The I/O ports have a modest DC current output specification so that the output driver can be over driven when data is sent in the opposite direction. For proper operation, the input driver to the auto−sense translator should be capable of driving 2 mA of peak output current. The bi−directional configuration of the translator results in both input stages being active for a very short time period. Although the peak current from the input signal circuit is relatively large, the average current is small and consistent with a standard CMOS input stage. Enable Input (EN) The NLSX5014 translator has an Enable pin (EN) that provides tri−state operation at the I/O pins. Driving the Enable pin to a low logic level minimizes the power consumption of the device and drives the I/O VCC and I/O www.onsemi.com 11 MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS UQFN12 1.7x2.0, 0.4P CASE 523AE−01 ISSUE A DATE 11 JUN 2007 1 SCALE 4:1 A B D ÉÉÉ ÉÉÉ ÉÉÉ PIN 1 REFERENCE 2X 0.10 C 2X 0.10 C L1 DETAIL A E NOTE 5 TOP VIEW DETAIL B A 0.05 C 12X 0.05 C A1 A3 8X C SIDE VIEW SEATING PLANE DIM A A1 A3 b D E e K L L1 L2 MILLIMETERS MIN MAX 0.45 0.55 0.00 0.05 0.127 REF 0.15 0.25 1.70 BSC 2.00 BSC 0.40 BSC 0.20 ---0.45 0.55 0.00 0.03 0.15 REF K 5 GENERIC MARKING DIAGRAM* 7 DETAIL A e 1 12X DETAIL B OPTIONAL CONSTRUCTION NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETERS 3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED BETWEEN 0.15 AND 0.30 MM FROM TERMINAL TIP. 4. MOLD FLASH ALLOWED ON TERMINALS ALONG EDGE OF PACKAGE. FLASH 0.03 MAX ON BOTTOM SURFACE OF TERMINALS. 5. DETAIL A SHOWS OPTIONAL CONSTRUCTION FOR TERMINALS. 11 L L2 12X XXM G b 0.10 M C A B 0.05 M C BOTTOM VIEW NOTE 3 XX = Specific Device Code M = Date Code G = Pb−Free Package *This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G” or microdot “ G”, may or may not be present. MOUNTING FOOTPRINT SOLDERMASK DEFINED 2.00 1 0.40 PITCH 0.32 2.30 11X 0.22 12X 0.69 DIMENSIONS: MILLIMETERS DOCUMENT NUMBER: DESCRIPTION: 98AON23418D UQFN12 1.7 X 2.0, 0.4P Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 1 OF 1 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS SOIC−14 NB CASE 751A−03 ISSUE L 14 1 SCALE 1:1 D DATE 03 FEB 2016 A B 14 8 A3 E H L 1 0.25 B M DETAIL A 7 13X M b 0.25 M C A S B S 0.10 X 45 _ M A1 e DETAIL A h A C SEATING PLANE DIM A A1 A3 b D E e H h L M MILLIMETERS MIN MAX 1.35 1.75 0.10 0.25 0.19 0.25 0.35 0.49 8.55 8.75 3.80 4.00 1.27 BSC 5.80 6.20 0.25 0.50 0.40 1.25 0_ 7_ INCHES MIN MAX 0.054 0.068 0.004 0.010 0.008 0.010 0.014 0.019 0.337 0.344 0.150 0.157 0.050 BSC 0.228 0.244 0.010 0.019 0.016 0.049 0_ 7_ GENERIC MARKING DIAGRAM* SOLDERING FOOTPRINT* 6.50 NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETERS. 3. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE PROTRUSION SHALL BE 0.13 TOTAL IN EXCESS OF AT MAXIMUM MATERIAL CONDITION. 4. DIMENSIONS D AND E DO NOT INCLUDE MOLD PROTRUSIONS. 5. MAXIMUM MOLD PROTRUSION 0.15 PER SIDE. 14 14X 1.18 XXXXXXXXXG AWLYWW 1 1 1.27 PITCH XXXXX A WL Y WW G = Specific Device Code = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package *This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G” or microdot “G”, may or may not be present. Some products may not follow the Generic Marking. 14X 0.58 DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. STYLES ON PAGE 2 DOCUMENT NUMBER: DESCRIPTION: 98ASB42565B SOIC−14 NB Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 1 OF 2 onsemi and are trademarks of Semiconductor Components Industries, LLC dba onsemi or its subsidiaries in the United States and/or other countries. onsemi reserves the right to make changes without further notice to any products herein. onsemi makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. onsemi does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com SOIC−14 CASE 751A−03 ISSUE L DATE 03 FEB 2016 STYLE 1: PIN 1. COMMON CATHODE 2. ANODE/CATHODE 3. ANODE/CATHODE 4. NO CONNECTION 5. ANODE/CATHODE 6. NO CONNECTION 7. ANODE/CATHODE 8. ANODE/CATHODE 9. ANODE/CATHODE 10. NO CONNECTION 11. ANODE/CATHODE 12. ANODE/CATHODE 13. NO CONNECTION 14. COMMON ANODE STYLE 2: CANCELLED STYLE 3: PIN 1. NO CONNECTION 2. ANODE 3. ANODE 4. NO CONNECTION 5. ANODE 6. NO CONNECTION 7. ANODE 8. ANODE 9. ANODE 10. NO CONNECTION 11. ANODE 12. ANODE 13. NO CONNECTION 14. COMMON CATHODE STYLE 4: PIN 1. NO CONNECTION 2. CATHODE 3. CATHODE 4. NO CONNECTION 5. CATHODE 6. NO CONNECTION 7. CATHODE 8. CATHODE 9. CATHODE 10. NO CONNECTION 11. CATHODE 12. CATHODE 13. NO CONNECTION 14. COMMON ANODE STYLE 5: PIN 1. COMMON CATHODE 2. ANODE/CATHODE 3. ANODE/CATHODE 4. ANODE/CATHODE 5. ANODE/CATHODE 6. NO CONNECTION 7. COMMON ANODE 8. COMMON CATHODE 9. ANODE/CATHODE 10. ANODE/CATHODE 11. ANODE/CATHODE 12. ANODE/CATHODE 13. NO CONNECTION 14. COMMON ANODE STYLE 6: PIN 1. CATHODE 2. CATHODE 3. CATHODE 4. CATHODE 5. CATHODE 6. CATHODE 7. CATHODE 8. ANODE 9. ANODE 10. ANODE 11. ANODE 12. ANODE 13. ANODE 14. ANODE STYLE 7: PIN 1. ANODE/CATHODE 2. COMMON ANODE 3. COMMON CATHODE 4. ANODE/CATHODE 5. ANODE/CATHODE 6. ANODE/CATHODE 7. ANODE/CATHODE 8. ANODE/CATHODE 9. ANODE/CATHODE 10. ANODE/CATHODE 11. COMMON CATHODE 12. COMMON ANODE 13. ANODE/CATHODE 14. ANODE/CATHODE STYLE 8: PIN 1. COMMON CATHODE 2. ANODE/CATHODE 3. ANODE/CATHODE 4. NO CONNECTION 5. ANODE/CATHODE 6. ANODE/CATHODE 7. COMMON ANODE 8. COMMON ANODE 9. ANODE/CATHODE 10. ANODE/CATHODE 11. NO CONNECTION 12. ANODE/CATHODE 13. ANODE/CATHODE 14. COMMON CATHODE DOCUMENT NUMBER: DESCRIPTION: 98ASB42565B SOIC−14 NB Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 2 OF 2 onsemi and are trademarks of Semiconductor Components Industries, LLC dba onsemi or its subsidiaries in the United States and/or other countries. onsemi reserves the right to make changes without further notice to any products herein. onsemi makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. onsemi does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS TSSOP−14 WB CASE 948G ISSUE C 14 DATE 17 FEB 2016 1 SCALE 2:1 14X K REF 0.10 (0.004) 0.15 (0.006) T U M T U V S S S N 2X 14 L/2 0.25 (0.010) 8 M B −U− L PIN 1 IDENT. N F 7 1 0.15 (0.006) T U NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A DOES NOT INCLUDE MOLD FLASH, PROTRUSIONS OR GATE BURRS. MOLD FLASH OR GATE BURRS SHALL NOT EXCEED 0.15 (0.006) PER SIDE. 4. DIMENSION B DOES NOT INCLUDE INTERLEAD FLASH OR PROTRUSION. INTERLEAD FLASH OR PROTRUSION SHALL NOT EXCEED 0.25 (0.010) PER SIDE. 5. DIMENSION K DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.08 (0.003) TOTAL IN EXCESS OF THE K DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. TERMINAL NUMBERS ARE SHOWN FOR REFERENCE ONLY. 7. DIMENSION A AND B ARE TO BE DETERMINED AT DATUM PLANE −W−. S DETAIL E K A −V− K1 J J1 ÉÉÉ ÇÇÇ ÇÇÇ ÉÉÉ SECTION N−N −W− C 0.10 (0.004) −T− SEATING PLANE H G D DETAIL E DIM A B C D F G H J J1 K K1 L M MILLIMETERS INCHES MIN MAX MIN MAX 4.90 5.10 0.193 0.200 4.30 4.50 0.169 0.177 −−− 1.20 −−− 0.047 0.05 0.15 0.002 0.006 0.50 0.75 0.020 0.030 0.65 BSC 0.026 BSC 0.50 0.60 0.020 0.024 0.09 0.20 0.004 0.008 0.09 0.16 0.004 0.006 0.19 0.30 0.007 0.012 0.19 0.25 0.007 0.010 6.40 BSC 0.252 BSC 0_ 8_ 0_ 8_ GENERIC MARKING DIAGRAM* 14 SOLDERING FOOTPRINT XXXX XXXX ALYWG G 7.06 1 1 0.65 PITCH 14X 0.36 14X 1.26 DIMENSIONS: MILLIMETERS DOCUMENT NUMBER: 98ASH70246A DESCRIPTION: TSSOP−14 WB A L Y W G = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package (Note: Microdot may be in either location) *This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G” or microdot “G”, may or may not be present. Some products may not follow the Generic Marking. Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 1 OF 1 onsemi and are trademarks of Semiconductor Components Industries, LLC dba onsemi or its subsidiaries in the United States and/or other countries. onsemi reserves the right to make changes without further notice to any products herein. onsemi makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. onsemi does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com onsemi, , and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. 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