NTHD4401PT3G

NTHD4401PT3G

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    SMD8

  • 描述:

    MOSFET 2P-CH 20V 2.1A CHIPFET

  • 数据手册
  • 价格&库存
NTHD4401PT3G 数据手册
NTHD4401P Power MOSFET −20 V, −3.0 A, Dual P−Channel, ChipFETt Features • Low RDS(on) and Fast Switching Speed in a ChipFET Package • Leadless ChipFET Package 40% Smaller Footprint than TSOP−6 • ChipFET Package with Excellent Thermal Capabilities where Heat http://onsemi.com Transfer is Required V(BR)DSS • Pb−Free Package is Available RDS(on) TYP ID MAX 130 mW @ −4.5 V −20 V −3.0 A Applications 200 mW @ −2.5 V • Charge Control in Battery Chargers • Optimized for Battery and Load Management Applications in • • S1 Portable Equipment MP3 Players, Cell Phones, Digital Cameras, PDAs Buck and Boost DC−DC Converters S2 G1 G2 MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) Rating Symbol Value Unit Drain−to−Source Voltage VDSS −20 V Gate−to−Source Voltage VGS "12 V ID −2.1 A Continuous Drain Current (Note 1) Power Dissipation (Note 1) Steady State TA = 25°C TA = 85°C −1.5 tv5s TA = 25°C −3.0 Steady State TA = 25°C TA = 85°C 0.6 tv5s TA = 25°C 2.1 PD W 1.1 D1 D2 P−Channel MOSFET P−Channel MOSFET ChipFET CASE 1206A STYLE 2 PIN CONNECTIONS MARKING DIAGRAM −9.0 A D1 8 1 S1 1 TJ, Tstg −55 to 150 °C D1 7 2 G1 2 Source Current (Body Diode) IS −2.5 A D2 6 3 S2 3 Lead Temperature for Soldering Purposes (1/8″ from case for 10 s) TL 260 °C D2 5 4 G2 4 tp = 10 ms Operating Junction and Storage Temperature THERMAL RESISTANCE RATINGS Rating Symbol Value Unit Junction−to−Ambient − Steady State (Note 1) RqJA 110 °C/W Junction−to−Ambient − t v 5 s November, 2005 − Rev. 4 7 6 5 C4 = Specific Device Code M = Month Code G = Pb−Free Package ORDERING INFORMATION 60 Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected. 1. Surface Mounted on FR4 Board using 1 in sq pad size (Cu area = 1.27 in sq [1 oz] including traces). © Semiconductor Components Industries, LLC, 2005 8 C4 M G IDM Pulsed Drain Current 1 Package Shipping † NTHD4401PT1 ChipFET 3000/Tape & Reel NTHD4401PT1G ChipFET (Pb−Free) 3000/Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. Publication Order Number: NTHD4401P/D NTHD4401P ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Characteristic Symbol Test Condition Min Typ Max Unit V(Br)DSS VGS = 0 V, ID = −250 mA −20 −23 V −8.0 mV/°C OFF CHARACTERISTICS Drain−to−Source Breakdown Voltage Drain−to−Source Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate−to−Source Leakage Current V(Br)DSS/TJ IDSS VGS = 0 V TJ = 25°C −1.0 VDS = −16 V TJ = 85°C −5.0 IGSS VDS = 0 V, VGS = "12 V VGS(th) VGS = VDS, ID = −250 mA mA "100 nA −1.2 V ON CHARACTERISTICS (Note 2) Gate Threshold Voltage Gate Threshold Temperature Coefficient Drain−to−Source On Resistance Forward Transconductance VGS(th)/TJ −0.6 −0.75 2.65 RDS(on) VGS = −4.5 V, ID = −2.1 A VGS = −2.5 V, ID = −1.7 A VGS = −1.8 V, ID = −1.0 A 0.130 0.200 0.34 gFS VDS = −10 V, ID = −2.1 A 5.0 mV/°C 0.155 0.240 W S CHARGES, CAPACITANCES AND GATE RESISTANCE Input Capacitance Ciss Output Capacitance Coss 185 300 95 150 Reverse Transfer Capacitance Crss 30 50 Total Gate Charge QG(TOT) 3.0 6.0 Threshold Gate Charge QG(TH) Gate−to−Source Charge QGS Gate−to−Drain Charge QGD 0.9 td(on) 7.0 12 13 25 33 50 27 40 −0.85 −1.15 VGS = 0 V, f = 1.0 MHz, VDS = −10 V VGS = −4.5 V, VDS = −10 V, ID = −2.1 A pF 0.2 nC 0.5 SWITCHING CHARACTERISTICS (Note 3) Turn−On Delay Time Rise Time Turn−Off Delay Time Fall Time tr td(off) VGS = −4.5 V, VDD = −16 V, ID = −2.1 A, RG = 2.5 W tf ns DRAIN−SOURCE DIODE CHARACTERISTICS Forward Diode Voltage VSD Reverse Recovery Time trr Charge Time ta Discharge Time tb Reverse Recovery Charge VGS = 0 V IS = −2.5 A V 32 VGS = 0 V, dIS/dt = 90 A/ms, IS = −2.1 A QRR 10 22 15 2. Pulse Test: Pulse Width v 300 ms, Duty Cycle v 2%. 3. Switching characteristics are independent of operating junction temperatures. http://onsemi.com 2 ns nC NTHD4401P TYPICAL PERFORMANCE CURVES (TJ = 25°C unless otherwise noted) 4 TJ = 25°C VGS = −6 V to −3 V VGS = −2.4 V −2.2 V −2 V −ID, DRAIN CURRENT (AMPS) −ID, DRAIN CURRENT (AMPS) 4 3 −1.8 V 2 −1.6 V 1 −1.4 V 3 2 TC = −55°C 1 25°C 100°C −1.2 V 0 0 1 2 3 5 4 6 7 0 0.5 8 −VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) 1 1.5 2 2.5 −VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) VDS ≥ −10 V 0.5 ID = −2.1 A TJ = 25°C 0.4 0.3 0.2 0.1 0 1 2 3 4 5 6 −VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) 3 0.25 TJ = 25°C 0.225 0.2 VGS = −2.5 V 0.175 0.15 VGS = −4.5 V 0.125 0.1 0.5 1.5 2.5 3.5 4.5 −ID, DRAIN CURRENT (AMPS) Figure 4. On−Resistance vs. Drain Current and Gate Voltage Figure 3. On−Resistance vs. Gate−to−Source Voltage ID = −2.1 A VGS = −4.5 V RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) 1.6 1.4 1.2 1 0.8 0.6 −50 −25 0 25 50 75 100 125 150 ID = −1.0 A VGS = −1.8 V 1.2 1 0.8 −50 TJ, JUNCTION TEMPERATURE (°C) −25 0 25 50 75 100 125 TJ, JUNCTION TEMPERATURE (°C) Figure 5. On−Resistance Variation with Temperature Figure 6. On−Resistance Variation with Temperature http://onsemi.com 3 150 NTHD4401P TYPICAL PERFORMANCE CURVES (TJ = 25°C unless otherwise noted) 600 10000 VDS = 0 V VGS = 0 V C, CAPACITANCE (pF) −IDSS, LEAKAGE (A) 500 TJ = 150°C 1000 TJ = 100°C 100 VGS = 0 V TJ = 25°C Ciss 400 Crss 300 200 Coss 100 0 10 2 4 6 8 10 12 14 16 18 10 20 5 0 −VGS −VDS 5 10 15 20 −VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS) −VDS 5 10 QT 4 8 −VGS 3 6 Q1 2 Q2 4 1 ID = −2.1 A TJ = 25°C 0 3.5 0 0 0.5 1 1.5 2 2.5 Qg, TOTAL GATE CHARGE (nC) 2 3 100 tf td(off) t, TIME (ns) 12 Figure 8. Capacitance Variation −VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) 6 tr 10 td(on) VDD = −16 V ID = −2.1 A VGS = −4.5 V 1 1 10 Figure 10. Resistive Switching Time Variation vs. Gate Resistance 2.5 VGS = 0 V TJ = 25°C 2 1.5 1 0.5 0 0.3 100 RG, GATE RESISTANCE (OHMS) Figure 9. Gate−to−Source and Drain−to−Source Voltage vs. Total Charge −IS, SOURCE CURRENT (AMPS) −VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) Figure 7. Drain−to−Source Leakage Current vs. Voltage 0.5 0.7 0.9 −VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS) Figure 11. Diode Forward Voltage vs. Current http://onsemi.com 4 NTHD4401P r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE 1.0 D = 0.5 0.2 0.1 0.1 Normalized to θJA at 10s. 0.05 Chip 0.02 0.0175 Ω 0.0710 Ω 0.2706 Ω 0.0154 F 0.0854 F 0.3074 F 0.5776 Ω 0.7086 Ω 0.01 SINGLE PULSE 0.01 1.0E−03 1.0E−02 1.0E−01 1.0E+00 1.0E+01 1.7891 F 107.55 F Ambient 1.0E+02 1.0E+03 t, TIME (s) Figure 12. Thermal Response SOLDERING FOOTPRINT* 2.032 0.08 2.032 0.08 0.457 0.018 0.635 0.025 1.092 0.043 0.635 0.025 0.178 0.007 0.457 0.018 0.711 0.028 0.66 0.026 SCALE 20:1 mm Ǔ ǒinches 0.254 0.010 0.66 0.026 Figure 13. Basic SCALE 20:1 mm Ǔ ǒinches Figure 14. Style 2 *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. BASIC PAD PATTERNS The basic pad layout with dimensions is shown in Figure 13. This is sufficient for low power dissipation MOSFET applications, but power semiconductor performance requires a greater copper pad area, particularly for the drain leads. The minimum recommended pad pattern shown in Figure 14 improves the thermal area of the drain connections (pins 5, 6, 7, 8) while remaining within the confines of the basic footprint. The drain copper area is 0.0019 sq. in. (or 1.22 sq. mm). This will assist the power dissipation path away from the device (through the copper leadframe) and into the board and exterior chassis (if applicable) for the single device. The addition of a further copper area and/or the addition of vias to other board layers will enhance the performance still further. ChipFET is a trademark of Vishay Siliconix. http://onsemi.com 5 MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS ChipFETt CASE1206A−03 ISSUE K 8 DATE 19 MAY 2009 1 SCALE 1:1 D 8 7 q 6 L 5 HE 5 6 7 8 4 3 2 1 E 1 2 3 e1 4 b e DIM A b c D E e e1 L HE q c RESET A 0.05 (0.002) STYLE 1: PIN 1. DRAIN 2. DRAIN 3. DRAIN 4. GATE 5. SOURCE 6. DRAIN 7. DRAIN 8. DRAIN STYLE 2: PIN 1. SOURCE 1 2. GATE 1 3. SOURCE 2 4. GATE 2 5. DRAIN 2 6. DRAIN 2 7. DRAIN 1 8. DRAIN 1 STYLE 3: PIN 1. ANODE 2. ANODE 3. SOURCE 4. GATE 5. DRAIN 6. DRAIN 7. CATHODE 8. CATHODE STYLE 4: PIN 1. COLLECTOR 2. COLLECTOR 3. COLLECTOR 4. BASE 5. EMITTER 6. COLLECTOR 7. COLLECTOR 8. COLLECTOR MILLIMETERS NOM MAX 1.05 1.10 0.30 0.35 0.15 0.20 3.05 3.10 1.65 1.70 0.65 BSC 0.55 BSC 0.28 0.35 0.42 1.80 1.90 2.00 5° NOM MIN 1.00 0.25 0.10 2.95 1.55 INCHES NOM 0.041 0.012 0.006 0.120 0.065 0.025 BSC 0.022 BSC 0.014 0.011 0.071 0.075 5° NOM MIN 0.039 0.010 0.004 0.116 0.061 MAX 0.043 0.014 0.008 0.122 0.067 0.017 0.079 STYLE 6: STYLE 5: PIN 1. ANODE PIN 1. ANODE 2. DRAIN 2. ANODE 3. DRAIN 3. DRAIN 4. DRAIN 4. GATE 5. SOURCE 5. SOURCE 6. DRAIN 6. GATE 7. CATHODE 7. DRAIN 8. CATHODE 8. CATHODE / DRAIN GENERIC MARKING DIAGRAM* SOLDERING FOOTPRINT 1 NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. MOLD GATE BURRS SHALL NOT EXCEED 0.13 MM PER SIDE. 4. LEADFRAME TO MOLDED BODY OFFSET IN HORIZONTAL AND VERTICAL SHALL NOT EXCEED 0.08 MM. 5. DIMENSIONS A AND B EXCLUSIVE OF MOLD GATE BURRS. 6. NO MOLD FLASH ALLOWED ON THE TOP AND BOTTOM LEAD SURFACE. 2.032 0.08 xxx MG G 2.362 0.093 0.65 0.025 PITCH xxx = Specific Device Code M = Month Code G = Pb−Free Package (Note: Microdot may be in either location) *This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G” or microdot “ G”, may or may not be present. 8X 8X 0.66 0.026 0.457 0.018 mm Ǔ ǒinches Basic Style OPTIONAL SOLDERING FOOTPRINTS ON PAGE 2 DOCUMENT NUMBER: DESCRIPTION: 98AON03078D ChipFET Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 1 OF 2 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com ChipFETt CASE 1206A−03 ISSUE K DATE 19 MAY 2009 ADDITIONAL SOLDERING FOOTPRINTS* 1 2.032 0.08 2.032 0.08 1 4X 0.457 0.018 2X 1.092 0.043 1.727 0.068 2.362 0.093 2.362 0.093 0.65 0.025 PITCH 4X 2X 2X 0.457 0.018 0.66 0.026 mm Ǔ ǒinches Styles 1 and 4 2.032 0.08 1.118 0.044 mm Ǔ ǒinches Style 2 2.032 0.08 2X 0.66 0.026 1 2X 0.66 0.026 1 1.092 0.043 2X 0.66 0.026 1.092 0.043 2.362 0.093 2.362 0.093 0.65 0.025 PITCH 2X 0.65 0.025 PITCH 1.118 0.044 0.457 0.018 1.118 0.044 ǒ mm inches 2X Ǔ 0.457 0.018 mm Ǔ ǒinches Style 5 Style 3 *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. DOCUMENT NUMBER: DESCRIPTION: 98AON03078D ChipFET Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 2 OF 2 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com onsemi, , and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of onsemi’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. onsemi reserves the right to make changes at any time to any products or information herein, without notice. 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All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. onsemi does not convey any license under any of its intellectual property rights nor the rights of others. onsemi products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. 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