ON Semiconductor
Is Now
To learn more about onsemi™, please visit our website at
www.onsemi.com
onsemi and and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or
subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of onsemi
product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. onsemi reserves the right to make changes at any time to any products or information herein, without
notice. The information herein is provided “as-is” and onsemi makes no warranty, representation or guarantee regarding the accuracy of the information, product features, availability, functionality,
or suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all
liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using onsemi products, including compliance with all laws,
regulations and safety requirements or standards, regardless of any support or applications information provided by onsemi. “Typical” parameters which may be provided in onsemi data sheets and/
or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application
by customer’s technical experts. onsemi does not convey any license under any of its intellectual property rights nor the rights of others. onsemi products are not designed, intended, or authorized
for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for
implantation in the human body. Should Buyer purchase or use onsemi products for any such unintended or unauthorized application, Buyer shall indemnify and hold onsemi and its officers, employees,
subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that onsemi was negligent regarding the design or manufacture of the part. onsemi is an Equal Opportunity/Affirmative
Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. Other names and brands may be claimed as the property of others.
NTMS4916N
MOSFET – Power,
N-Channel, SO-8
30 V, 11.6 A
Features
•
•
•
•
•
Low RDS(on) to Minimize Conduction Losses
Low Capacitance to Minimize Driver Losses
Optimized Gate Charge to Minimize Switching Losses
Optimized for 5 V, 12 V Gate Drives
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
http://onsemi.com
V(BR)DSS
RDS(ON) MAX
ID MAX
9 mW @ 10 V
30 V
11.6 A
12 mW @ 4.5 V
Applications
• DC−DC Converters
• Printers
N−Channel
D
MAXIMUM RATINGS (TJ = 25°C unless otherwise stated)
Parameter
Symbol
Value
Unit
Drain−to−Source Voltage
VDSS
30
V
Gate−to−Source Voltage
VGS
±20
V
ID
9.4
A
Continuous Drain
Current RqJA (Note 1)
Steady
State
TA = 25°C
Power Dissipation RqJA
(Note 1)
Steady
State
TA = 25°C
PD
1.30
W
Continuous Drain
Current RqJA (Note 2)
Steady
State
TA = 25°C
ID
7.8
A
S
7.5
TA = 70°C
6.2
1
TA = 25°C
PD
0.89
W
ID
11.6
A
Continuous Drain
Current RqJA, t v 10 s
(Note 1)
Steady
State
TA = 25°C
Power Dissipation
RqJA, t v 10 s(Note 1)
Steady
State
TA = 25°C
PD
Pulsed Drain Current
TA = 25°C, tp = 10 ms
IDM
145
A
TJ,
Tstg
−55 to
150
°C
IS
2.5
A
EAS
40.5
mJ
TL
260
°C
TA = 70°C
Operating Junction and Storage Temperature
9.3
Source Current (Body Diode)
Single Pulse Drain−to−Source Avalanche Energy
(TJ = 25°C, VDD = 30 V, VGS = 10 V,
IL = 9 Apk, L = 1.0 mH, RG = 25 W)
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s)
MARKING DIAGRAM/
PIN ASSIGNMENT
1.98
W
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
SO−8
CASE 751
STYLE 12
Source
Source
Source
Gate
1
8
4916N
AYWWG
G
Power Dissipation RqJA
(Note 2)
TA = 70°C
G
Drain
Drain
Drain
Drain
Top View
4916N = Device Code
A
= Assembly Location
Y
= Year
WW
= Work Week
G
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
Device
NTMS4916NR2G
Package
Shipping†
SO−8
(Pb−Free)
2500/Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
THERMAL RESISTANCE MAXIMUM RATINGS
Symbol
Value
Unit
Junction−to−Ambient – Steady State (Note 1)
Parameter
RqJA
96
°C/W
Junction−to−Ambient – t v 10 s (Note 1)
RqJA
63
Junction−to−Foot (Drain)
RqJF
24.5
Junction−to−Ambient – Steady State (Note 2)
RqJA
141
© Semiconductor Components Industries, LLC, 2010
June, 2019 − Rev. 0
1
Publication Order Number:
NTMS4916N/D
NTMS4916N
1. Surfacemounted on FR4 board using 1 in sq pad size, 1 oz Cu.
2. Surfacemounted on FR4 board using the minimum recommended pad size.
http://onsemi.com
2
NTMS4916N
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified)
Parameter
Symbol
Test Condition
Min
Drain−to−Source Breakdown Voltage
V(BR)DSS
VGS = 0 V, ID = 250 mA
30
Drain−to−Source Breakdown Voltage
Temperature Coefficient
V(BR)DSS/TJ
Typ
Max
Unit
OFF CHARACTERISTICS
Zero Gate Voltage Drain Current
IDSS
Gate−to−Source Leakage Current
V
16
VGS = 0 V, VDS = 30 V
mV/°C
TJ = 25°C
1.0
TJ = 125°C
10
IGSS
VDS = 0 V, VGS = ±20 V
VGS(TH)
VGS = VDS, ID = 250 mA
±100
mA
nA
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage
1.0
1.7
2.5
VGS(TH)/TJ
Drain−to−Source On Resistance
RDS(on)
VGS = 10 V, ID = 12 A
6.75
9.0
VGS = 4.5 V, ID = 10 A
9.0
12
gFS
VDS = 1.5 V, ID = 7.5 A
23
S
1376
pF
Forward Transconductance
5
V
Negative Threshold Temperature
Coefficient
mV/°C
mW
CHARGES, CAPACITANCES AND GATE RESISTANCE
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
VGS = 0 V, f = 1.0 MHz, VDS = 25 V
401
205
Total Gate Charge
QG(TOT)
15
Threshold Gate Charge
QG(TH)
2.44
Gate−to−Source Charge
QGS
Gate−to−Drain Charge
QGD
Total Gate Charge
QG(TOT)
VGS = 4.5 V, VDS = 15 V, ID = 7.5 A
nC
4
6.5
VGS = 10 V, VDS = 15 V, ID = 7.5 A
28
nC
td(on)
9.4
ns
tr
7.4
SWITCHING CHARACTERISTICS (Note 4)
Turn−On Delay Time
Rise Time
Turn−Off Delay Time
Fall Time
td(off)
VGS = 10 V, VDS = 15 V,
ID = 1.0 A, RG = 6.0 W
tf
32
15.6
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode Voltage
VSD
Reverse Recovery Time
tRR
Charge Time
ta
Discharge Time
tb
Reverse Recovery Charge
VGS = 0 V, IS = 2.0 A
TJ = 25°C
0.740
TJ = 125°C
0.570
30.7
VGS = 0 V, dIS/dt = 100 A/ms,
IS = 2.0 A
1.0
V
ns
14.3
16.4
QRR
20
nC
Source Inductance
LS
0.66
nH
Drain Inductance
LD
0.2
Gate Inductance
LG
Gate Resistance
RG
PACKAGE PARASITIC VALUES
TA = 25°C
1.5
0.77
3. Pulse Test: pulse width = 300 ms, duty cycle v 2%.
4. Switching characteristics are independent of operating junction temperatures.
http://onsemi.com
3
W
NTMS4916N
TYPICAL PERFORMANCE CURVES
10V
7V
20
50
TJ = 25°C
5V
VDS ≥ 10 V
2.8 V
ID, DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
25
4V
3.0 V
15
2.6 V
10
2.5 V
2.2 V
5
2.4 V
40
30
TJ = 125°C
20
TJ = 25°C
10
2.3 V
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
0.015
0.010
0.005
3
3.5
4
4
5
6
7
8
9
10
VGS, GATE−TO−SOURCE VOLTAGE (V)
4.5
0.01
TJ = 25°C
VGS = 4.5 V
0.009
0.008
VGS = 10 V
0.007
0.006
0.005
2
4
6
8
10
12
14
16
18
20
22
ID, DRAIN CURRENT (A)
Figure 3. On−Resistance vs. Gate−to−Source
Voltage
Figure 4. On−Resistance vs. Drain Current and
Gate Voltage
1.70
10000
VGS = 0 V
ID = 12 A
VGS = 10 V
IDSS, LEAKAGE (nA)
RDS(on), DRAIN−TO−SOURCE
RESISTANCE (NORMALIZED)
2.5
Figure 2. Transfer Characteristics
0.020
1.50
2
Figure 1. On−Region Characteristics
TJ = 25°C
ID = 12 A
1.60
1.5
VGS, GATE−TO−SOURCE VOLTAGE (V)
0.025
3
1
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
0.030
0.000
0
5
RDS(on), DRAIN−TO−SOURCE RESISTANCE (W)
RDS(on), DRAIN−TO−SOURCE RESISTANCE (W)
0
TJ = −55°C
1.40
1.30
1.20
1.10
1.00
0.90
1000
TJ = 150°C
100
TJ = 100°C
0.80
0.70
−50
−25
0
25
50
75
100
125
150
10
5
10
15
20
25
TJ, JUNCTION TEMPERATURE (°C)
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 5. On−Resistance Variation with
Temperature
Figure 6. Drain−to−Source Leakage Current
vs. Voltage
http://onsemi.com
4
30
NTMS4916N
TJ = 25°C
VGS = 0 V
Ciss
Coss
Crss
0
5
10
15
20
25
DRAIN−TO−SOURCE VOLTAGE (V)
10
QT
8
VDS
6
4
QGS
QGD
Q2
Q1
ID = 7.5 A
VGS = 10 V
TJ = 25°C
2
0
30
0
5
IS, SOURCE CURRENT (A)
t, TIME (ns)
25
30
2
VDD = 15 V
ID = 1 A
VGS = 10 V
td(off)
100
tf
tr
td(on)
10
1
10
RG, GATE RESISTANCE (W)
100
VGS = 0 V
TJ = 25°C
1.5
1
0.5
0
Figure 9. Resistive Switching Time
Variation vs. Gate Resistance
0.5
0.55
0.6
0.65
0.7
0.75
VSD, SOURCE−TO−DRAIN VOLTAGE (V)
0.8
Figure 10. Diode Forward Voltage vs. Current
45
SINGLE PULSE
TC = 25°C
10 ms
100 ms
10
1 ms
10 ms
1
0.1
0.01
0.01
RDS(on) LIMIT
THERMAL LIMIT
PACKAGE LIMIT
dc
0.1
1
10
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
EAS, SINGLE PULSE DRAIN−TO−
SOURCE AVALANCHE ENERGY (mJ)
1000
ID, DRAIN CURRENT (A)
20
Figure 8. Gate−To−Source and
Drain−To−Source Voltage vs. Total Charge
1000
100
15
QG, TOTAL GATE CHARGE (nC)
Figure 7. Capacitance Variation
1
10
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
2000
1900
1800
1700
1600
1500
1400
1300
1200
1100
1000
900
800
700
600
500
400
300
200
100
0
VGS, GATE−TO−SOURCE VOLTAGE (V)
C, CAPACITANCE (pF)
TYPICAL PERFORMANCE CURVES
100
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
40
ID = 9 A
35
30
25
20
15
10
5
0
25
50
75
100
125
TJ, STARTING JUNCTION TEMPERATURE (°C)
Figure 12. Maximum Avalanche Energy vs.
Starting Junction Temperature
http://onsemi.com
5
150
NTMS4916N
PACKAGE DIMENSIONS
SOIC−8 NB
CASE 751−07
ISSUE AK
−X−
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
6. 751−01 THRU 751−06 ARE OBSOLETE. NEW
STANDARD IS 751−07.
A
8
5
S
B
0.25 (0.010)
M
Y
M
1
4
−Y−
K
G
C
N
DIM
A
B
C
D
G
H
J
K
M
N
S
X 45 _
SEATING
PLANE
−Z−
0.10 (0.004)
H
D
0.25 (0.010)
M
Z Y
S
X
M
J
S
SOLDERING FOOTPRINT*
1.52
0.060
7.0
0.275
MILLIMETERS
MIN
MAX
4.80
5.00
3.80
4.00
1.35
1.75
0.33
0.51
1.27 BSC
0.10
0.25
0.19
0.25
0.40
1.27
0_
8_
0.25
0.50
5.80
6.20
INCHES
MIN
MAX
0.189
0.197
0.150
0.157
0.053
0.069
0.013
0.020
0.050 BSC
0.004
0.010
0.007
0.010
0.016
0.050
0 _
8 _
0.010
0.020
0.228
0.244
STYLE 12:
PIN 1. SOURCE
2. SOURCE
3. SOURCE
4. GATE
5. DRAIN
6. DRAIN
7. DRAIN
8. DRAIN
4.0
0.155
0.6
0.024
1.270
0.050
SCALE 6:1
mm Ǔ
ǒinches
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
P.O. Box 5163, Denver, Colorado 80217 USA
Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada
Email: orderlit@onsemi.com
N. American Technical Support: 800−282−9855 Toll Free
USA/Canada
Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
Japan Customer Focus Center
Phone: 81−3−5773−3850
http://onsemi.com
6
ON Semiconductor Website: www.onsemi.com
Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative
NTMS4916N/D