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MOSFET – Power,
N-Channel, SUPERFET) III
800 V, 450 mW, 11 A
NTPF450N80S3Z
Description
800 V SUPERFET III MOSFET is ON Semiconductor’s high
performance MOSFET family offering 800 V breakdown voltage.
New 800 V SUPERFET III MOSFET which is optimized for
primary switch of flyback converter, enables lower switching losses
and case temperature without sacrificing EMI performance thanks to
its optimized design. In addition, internal Zener Diode significantly
improves ESD capability.
This new family of 800 V SUPERFET III MOSFET enables to
make more efficient, compact, cooler and more robust applications
because of its remarkable performance in switching power
applications such as Laptop adapter, Audio, Lighting, ATX power and
industrial power supplies.
Features
•
•
•
•
•
•
V(BR)DSS
RDS(ON) MAX
ID MAX
800 V
450 mW @ VGS = 10 V
11 A
N−CHANNEL MOSFET
D
G
Typ. RDS(on) = 380 mW
Ultra Low Gate Charge (Typ. Qg = 19.3 nC)
Low Stored Energy in Output Capacitance (Eoss = 2.2 mJ @ 400 V)
100% Avalanche Tested
ESD Improved Capability with Zener Diode
RoHS Compliant
Applications
•
•
•
•
•
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S
G
D
S
Adapters / Chargers
LED Lighting
AUX Power
Audio
Industrial Power
TO−220
CASE 221D
MARKING DIAGRAM
&Z&3&K
NTPF450
N80S3Z
&Z
&3
&K
NTPF450N80S3Z
= Assembly Plant Code
= Data Code (Year & Week)
= Lot
= Specific Device Code
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
© Semiconductor Components Industries, LLC, 2019
August, 2020 − Rev. 0
1
Publication Order Number:
NTPF450N80S3Z/D
NTPF450N80S3Z
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Parameter
Symbol
VDSS
Drain−to−Source Voltage
VGS
Gate−to−Source Voltage
ID
Drain Current
Value
Unit
800
V
DC
±20
V
AC (f > 1 Hz)
±30
V
Continuous (TC = 25°C)
11*
A
Continuous (TC = 100°C)
7*
A
Pulsed (Note 1)
25*
A
32
mJ
IDM
Drain Current
EAS
Single Pulsed Avalanche Energy (Note 2)
IAS
Avalanche Current (Note 2)
1.55
A
EAR
Repetitive Avalanche Energy (Note 1)
0.295
mJ
dv/dt
MOSFET dv/dt
100
V/ns
Peak Diode Recovery dv/dt (Note 3)
10
V/ns
29.5
W
PD
Power Dissipation
TC = 25°C
Derate above 25°C
TJ, Tstg
TL
Operating Junction and Storage Temperature Range
0.236
W/°C
−55 to +150
°C
260
°C
Lead Temperature for Soldering Purposes
(1/8″ from Case for 10 seconds)
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
*Drain current limited by maximum junction temperature
1. Repetitive rating: pulse−width limited by maximum junction temperature.
2. IAS = 1.55 A, RG = 25 W, starting TJ = 25°C.
3. ISD ≤ 2.75 A, di/dt ≤ 200 A/ms, VDD ≤ 400 V, starting TJ = 25°C.
THERMAL CHARACTERISTICS
Symbol
Parameter
Value
Unit
°C/W
RqJC
Thermal Resistance, Junction−to−Case, Max.
4.23
RqJA
Thermal Resistance, Junction−to−Ambient, Max.
62.5
PACKAGE MARKING AND ORDERING INFORMATION
Part Number
Top Marking
Package
Packing Method
Reel Size
Tape Width
Quantity
NTPF450N80S3Z
NTPF450N80S3Z
TO−220F
Tube
N/A
N/A
50 Units
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2
NTPF450N80S3Z
ELECTRICAL CHARACTERISTICS
Symbol
Parameter
Test Conditions
Min
Typ
Max
Unit
VGS = 0 V, ID = 1 mA, TJ = 25°C
800
−
−
V
VGS = 0 V, ID = 1 mA, TJ = 150°C
900
−
−
V
−
1.1
−
V/_C
VDS = 800 V, VGS = 0 V
−
−
1
mA
VDS = 640 V, TC = 125°C
−
0.8
−
VGS = ±20 V, VDS = 0 V
−
−
±1
mA
VGS = VDS, ID = 0.24 mA
2.2
−
3.8
V
OFF CHARACTERISTICS
BVDSS
DBVDSS/DTJ
Drain−to−Source Breakdown Voltage
Drain−to−Source Breakdown Voltage
Temperature Coefficient
IDSS
Zero Gate Voltage Drain Current
IGSS
Gate−to−Source Leakage Current
ID = 1 mA, Reference to 25°C
ON CHARACTERISTICS
VGS(th)
Gate Threshold Voltage
RDS(on)
Static Drain−to−Source On Resistance VGS = 10 V, ID = 5.5 A
−
380
450
mW
Forward Transconductance
VDS = 20 V, ID = 5.5 A
−
11.8
−
S
VD = 400 V, VGS = 0 V,
f = 250 kHz
−
885
−
pF
−
15
−
VDS = 0 V to 400 V, VGS = 0 V
−
188
−
−
27
−
−
19.3
−
−
4.2
−
gFS
DYNAMIC CHARACTERISTICS
Ciss
Input Capacitance
Coss
Output Capacitance
Coss(eff.)
Effective Output Capacitance
Coss(er.)
Energy Related Output Capacitance
Qg(tot)
Total Gate Charge at 10 V
Qgs
Gate−to−Source Charge
Qgd
Gate−to−Drain “Miller” Charge
ESR
Equivalent Series Resistance
VDS = 400 V, ID = 5.5 A, VGS = 10 V
(Note 4)
nC
−
6.6
−
f = 1 MHz
−
4.0
−
W
VDD = 400 V, ID = 5.5 A,
VGS = 10 V, RG = 4.7 W
(Note 4)
−
13.3
−
ns
−
6.7
−
SWITCHING CHARACTERISTICS
td(on)
Turn-On Delay Time
tr
Turn−On Rise Time
td(off)
Turn-Off Delay Time
−
44.3
−
Turn-Off Fall Time
−
4.6
−
Maximum Continuous Source−to−Drain Diode Forward Current
−
−
11
A
ISM
Maximum Pulsed Source−to−Drain Diode Forward Current
−
−
25
A
VSD
Source−to−Drain Diode Forward Voltage
VGS = 0 V, ISD = 5.5 A
−
−
1.2
V
trr
Reverse Recovery Time
−
170
−
ns
Qrr
Reverse Recovery Charge
VGS = 0 V, ISD = 2.75 A, diF/
dt = 100 A/ms
−
1.5
−
mC
tf
SOURCE−TO−DRAIN DIODE CHARACTERISTICS
IS
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
4. Essentially independent of operating temperature typical characteristics.
SUPERFET is a registered trademark of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or
other countries.
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3
NTPF450N80S3Z
TYPICAL CHARACTERISTICS
10 V
7.0 V
20
5.5 V
15
5.0 V
10
4.5 V
5
0
5
10
15
10
TJ = 25°C
1
20
TJ = 150°C
2
VGS = 10 V
0.75
VGS = 20 V
0.50
0.25
10
5
15
25
20
0.1
0.01
TJ = 150°C
TJ = 25°C
0
0.2
0.4
TJ = −55°C
0.6
0.8
1.0
VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 3. On Resistance vs. Drain Current
Figure 4. Diode Forward Voltage vs. Current
VGS, GATE−TO−SOURCE VOLTAGE (V)
Ciss
100
Coss
f = 250 kHz
VGS = 0 V
Crss = Cgd
Coss = Cds + Cgd
Ciss = Cgs + Cgd (Cds = shorted)
0.1
1
ID, DRAIN CURRENT (A)
1K
0.1
VGS = 0 V
10
0.001
30
10K
1
6
Figure 2. Transfer Characteristics
1.00
10
5
Figure 1. On−Region Characteristics
1.25
0
4
VGS, GATE−TO−SOURCE VOLTAGE (V)
1.50
0
3
TJ = −55°C
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
100K
CAPACITANCE (pF)
VDS = 20 V
VGS = 20 V
ID, DRAIN CURRENT (A)
25
0
RDS(on), DRAIN−TO−SOURCE ON−RESISTANCE
100
TJ = 25°C
IS, REVERSE DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
30
1
10
Crss
100
1000
10
VDD = 130 V
ID = 5.5 A
8
VDD = 400 V
6
4
2
0
0
5
10
15
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
QG, TOTAL GATE CHARGE (nC)
Figure 5. Capacitance Characteristics
Figure 6. Gate Charge Characteristics
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4
1.2
20
NTPF450N80S3Z
1.2
3.0
ID = 10 mA
RDS(on), NORMALIZED DRAIN−TO−
SOURCE RESISTANCE
NORMALIZED DRAIN−TO−SOURCE
BREAKDOWN VOLTAGE
TYPICAL CHARACTERISTICS
1.1
1.0
0.9
0.8
−75 −50 −25
25
0
50
75
100 125
150 175
2.0
1.5
1.0
0.5
0
−75 −50 −25
0
25
50
75
100 125 150 175
TJ, JUNCTION TEMPERATURE (°C)
TJ, JUNCTION TEMPERATURE (°C)
Figure 7. Normalized BVDSS vs. Temperature
Figure 8. On−Resistance Variation vs.
Temperature
6
100
1 ms
10 ms
10
100 ms
5
10 ms
1s
4
Eoss (mJ)
ID, DRAIN CURRENT (A)
ID = 5.5 A
VGS = 10 V
2.5
DC
1
RDS(on) Limit
3
2
0.1
r(t), NORMALIZED EFFECTIVE
TRANSIENT THERMAL IMPEDANCE
0.01
1
Single Pulse
TC = 25°C
1
10
100
1000
0
0
100
200
300
400
500
600
700
800
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 9. Safe Operating Area
Figure 10. Eoss vs. Drain−to−Source Voltage
2
1
0.1
50% Duty Cycle
20%
10%
PDM
5%
2%
0.01
0.001
t1
t2
ZqJC(t) = r(t) x RqJC
RqJC = 4.23°C/W
Peak TJ = PDM x ZqJC(t) + TC
Duty Cycle, D = t1 / t2
1%
Single Pulse
0.00001
0.0001
0.001
0.01
0.1
t1, RECTANGULAR PULSE DURATION (sec)
Figure 11. Transient Thermal Impedance
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5
1
10
100
NTPF450N80S3Z
VGS
RL
Qg
VDS
VGS
Qgs
Qgd
DUT
IG = Const.
Charge
Figure 12. Gate Charge Test Circuit & Waveform
RL
VDS
VDS
90%
90%
90%
VDD
VGS
RG
VGS
DUT
VGS
10%
td(on)
10%
tr
tf
td(off)
ton
toff
Figure 13. Resistive Switching Test Circuit & Waveforms
L
E AS + 1 @ LI AS
2
VDS
BVDSS
ID
IAS
RG
VDD
DUT
VGS
2
ID(t)
VDD
VDS(t)
tp
tp
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms
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6
Time
NTPF450N80S3Z
+
DUT
VSD
−
ISD
L
Driver
RG
Same Type
as DUT
VGS
− dv/dt controlled by RG
− ISD controlled by pulse period
D+
VGS
(Driver)
VDD
Gate Pulse Width
Gate Pulse Period
10 V
IFM, Body Diode Forward Current
ISD
(DUT)
di/dt
IRM
Body Diode Reverse Current
Body Diode Recovery dv/dt
VDS
(DUT)
VDD
VSD
Body Diode
Forward Voltage Drop
Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
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7
NTPF450N80S3Z
PACKAGE DIMENSIONS
TO−220 FULLPAK
CASE 221D−03
ISSUE K
−T−
−B−
F
SEATING
PLANE
C
S
Q
U
DIM
A
B
C
D
F
G
H
J
K
L
N
Q
R
S
U
A
1 2 3
H
−Y−
K
G
N
L
D
J
R
3 PL
0.25 (0.010)
M
B
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH
3. 221D-01 THRU 221D-02 OBSOLETE, NEW
STANDARD 221D-03.
INCHES
MIN
MAX
0.617
0.635
0.392
0.419
0.177
0.193
0.024
0.039
0.116
0.129
0.100 BSC
0.118
0.135
0.018
0.025
0.503
0.541
0.048
0.058
0.200 BSC
0.122
0.138
0.099
0.117
0.092
0.113
0.239
0.271
MILLIMETERS
MIN
MAX
15.67
16.12
9.96
10.63
4.50
4.90
0.60
1.00
2.95
3.28
2.54 BSC
3.00
3.43
0.45
0.63
12.78
13.73
1.23
1.47
5.08 BSC
3.10
3.50
2.51
2.96
2.34
2.87
6.06
6.88
Y
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
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