NTTD4401FR2G

NTTD4401FR2G

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    MSOP8

  • 描述:

    MOSFET P-CH 20V 2.4A MICRO8

  • 数据手册
  • 价格&库存
NTTD4401FR2G 数据手册
NTTD4401F FETKYt Power MOSFET and Schottky Diode −20 V, −3.3 A P−Channel with 20 V, 1.0 A Schottky Diode, Micro8t Package http://onsemi.com The FETKY product family incorporates low RDS(on), true logic level MOSFETs packaged with industry leading, low forward drop, low leakage Schottky Barrier Diodes to offer high efficiency components in a space saving configuration. Independent pinouts for TMOS and Schottky die allow the flexibility to use a single component for switching and rectification functions in a wide variety of applications. MOSFET PRODUCT SUMMARY V(BR)DSS • • ID Max 70 mW @ −4.5 V −3.3 A 100 mW @ −2.7 V −2.7 A −20 V Features • Low VF and Low Leakage Schottky Diode • Lower Component Placement and Inventory Costs along with Board RDS(on) Typ SCHOTTKY DIODE SUMMARY VR Max IF Max VF Max 20 V 2.0 A 600 mV @ IF = 2.0 A Space Savings Logic Level Gate Drive – Can be Driven by Logic ICs Pb−Free Package is Available A S Applications • • • • Buck Converter Synchronous Rectification Low Voltage Motor Control Load Management in Battery Packs, Chargers, Cell Phones, and other Portable Products G C D P−Channel MOSFET Schottky Diode MOSFET MAXIMUM RATINGS (TA = 25°C unless otherwise noted) Symbol Rating Value Unit Drain−to−Source Voltage VDSS −20 V Gate−to−Source Voltage VGS $10 V ID −3.3 A TA = 25°C Continuous Drain Current (Note 1) Power Dissipation (Note 1) TA = 100°C Steady State Continuous Drain Current (Note 2) Power Dissipation (Note 2) TA = 25°C PD 1.42 W TA = 25°C ID −2.4 A W IDM −10 A TJ, TSTG −55 to 150 °C Single Pulse Drain−to−Source Avalanche Energy Starting TA = 25°C (t v 10 s) EAS 150 mJ Lead Temperature for Soldering Purposes (1/8″ from case for 10 s) TL 260 °C Operating Junction and Storage Temperature Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. Surface−mounted on FR4 board using 1 in sq pad size (Cu area = 1.127 in sq [1 oz] including traces). 2. Surface−mounted on FR4 board using the minimum recommended pad size (Cu area = 0.172 in sq). © Semiconductor Components Industries, LLC, 2007 April, 2007 − Rev. 6 Micro8 CASE 846A 1 A AS G 0.78 t = 10 ms WW BG G G 1 −1.5 PD Pulsed Drain Current TA = 25°C C CD D 8 8 −2.1 TA = 100°C Steady State MARKING DIAGRAM & PIN ASSIGNMENT 1 BG = Specific Device Code WW = Work Week G = Pb−Free Package (Note: Microdot may be in either location) ORDERING INFORMATION Device NTTD4401FR2 NTTD4401FR2G Package Shipping† Micro8 4000/Tape & Reel Micro8 (Pb−Free) 4000/Tape & Reel †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. Publication Order Number: NTTD4401F/D NTTD4401F SCHOTTKY DIODE MAXIMUM RATINGS (TA = 25°C unless otherwise noted) Rating Symbol Value Unit V 20 V Peak Repetitive Reverse Voltage Average Forward Current (Rated VR, TA = 100°C) IO 1.0 A Peak Repetitive Forward Current (Note 3) IFRM 2.0 A Non−Repetitive Peak Surge Current (Note 4) IFSM 20 A THERMAL RESISTANCE RATINGS FET Rating Schottky Max Symbol Unit Junction−to−Ambient – Steady State (Note 5) RqJA 88 135 °C/W Junction−to−Ambient – Steady State (Note 6) RqJA 160 250 °C/W MOSFET ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) Characteristic Symbol Test Condition Min Typ Max Unit V(BR)DSS VGS = 0 V −20 − − V IDSS VGS = 0 V, VDS = −16 V − − −1.0 mA VGS = 0 V, TJ = 125°C, VDS = −16 V − − −25 IGSS VDS = 0 V, VGS = ±10 V − − ±100 OFF CHARACTERISTICS Drain−to−Source Breakdown Voltage Zero Gate Voltage Drain Current (Note 7) Gate−to−Source Leakage Current nA ON CHARACTERISTICS Gate Threshold Voltage Negative Threshold Temperature Coefficient Drain−to−Source On Resistance VGS(TH) VGS = VDS, ID = −250 mA −0.5 − −1.5 V VGS(TH)/TJ − − 2.5 − mV/°C RDS(on) VGS = −4.5 V, ID = −3.3 A − 70 90 mW VGS = −2.5 V, ID = −1.2 A − 100 150 VDS = −10 V, ID = −2.7 A − 4.2 − S − 550 750 pF − 200 300 − 50 175 Forward Transconductance gFS CHARGES, CAPACITANCES AND GATE RESISTANCE Input Capacitance CISS Output Capacitance COSS Reverse Transfer Capacitance CRSS Total Gate Charge VGS = 0 V, f = 1.0 MHz, VDS = −16 V QG(TOT) nC − 10 18 − 1.5 3.0 QGD − 5.0 10 td(ON) − 11 20 − 35 65 − 33 60 − 29 55 − −0.88 −1.0 V − 37 50 ns − 16 − − 21 − − 0.025 0.05 Gate−to−Source Gate Charge QGS Gate−to−Drain “Miller’’ Charge VGS = −4.5 V, VDS = −16 V, ID = −3.3 A SWITCHING CHARACTERISTICS Turn−On Delay Time Rise Time Turn−Off Delay Time tr td(OFF) Fall Time VGS = −4.5 V, VDD = −10 V, ID = −3.3 A, RG = 6.0 W tf ns DRAIN−SOURCE DIODE CHARACTERISTICS Forward Diode Voltage VSD Reverse Recovery Time tRR Charge Time ta Discharge Time tb Reverse Recovery Charge 3. 4. 5. 6. 7. VGS = 0 V, IS = −2.0 A VGS = 0 V, dIS/dt = 100 A/ms, IS = −3.3 A QRR − Rated VR, square wave, 20 kHz, TA = 105°C. Surge applied at rated load conditions, half−wave, single phase, 60 Hz. Surface−mounted on FR4 board using 1 inch sq pad size (Cu area = 1.127 in sq [1 oz] including traces). Surface−mounted on FR4 board using the minimum recommended pad size (Cu area = 0.172 in sq). Body diode leakage current. http://onsemi.com 2 nC NTTD4401F SCHOTTKY DIODE ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Symbol Test Condition Min Typ Reverse Breakdown Voltage BV IR = 1.0 mA Reverse Leakage Current IR Characteristic Forward Voltage VF VR = 20 V IF = 1.0 A IF = 2.0 A Voltage Rate of Change dV/dt VR = 20 V http://onsemi.com 3 Max Unit 20 − − V TA = 25°C − − 0.05 mA TA = 125°C − − 10 TA = 25°C − − 0.5 TA = 125°C − − 0.39 TA = 25°C − − 0.6 TA = 125°C − − 0.53 − 10,000 − V V/ms NTTD4401F TYPICAL ELECTRICAL CHARACTERISTICS 4 5 VGS = −10 V VGS = −4.5 V VGS = −2.5 V 3 TJ = 25°C −ID, DRAIN CURRENT (AMPS) −ID, DRAIN CURRENT (AMPS) VGS = −2.1 V VGS = −1.9 V 2 VGS = −1.7 V 1 VGS = −1.5 V 4 3 2 TJ = 25°C 1 TJ = 100°C 0 2 4 6 8 10 3 2.5 Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) −VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) 0.15 0.1 0.05 0 2 4 6 8 −VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) 0.12 TJ = 25°C 0.1 VGS = −2.7 V 0.08 VGS = −4.5 V 0.06 0.04 1 1.5 2 2.5 3 3.5 4 4.5 −ID, DRAIN CURRENT (AMPS) Figure 3. On−Resistance vs. Gate−to−Source Voltage Figure 4. On−Resistance vs. Drain Current and Gate Voltage 1.6 1000 VGS = 0 V ID = −3.3 A VGS = −4.5 V TJ = 125°C −IDSS, LEAKAGE (nA) 100 1.2 1 0.8 0.6 −50 2 −VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) TJ = 25°C 1.4 1.5 1 0.2 RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) TJ = 55°C 0 0 RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) VDS > = −10 V TJ = 100°C 10 TJ = 25°C 1 0.1 0.01 −25 50 100 125 0 25 75 TJ, JUNCTION TEMPERATURE (°C) 150 0 Figure 5. On−Resistance Variation with Temperature 4 8 12 16 −VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) Figure 6. Drain−to−Source Leakage Current vs. Voltage http://onsemi.com 4 20 NTTD4401F C, CAPACITANCE (pF) VDS = 0 V 1200 VGS = 0 V Ciss TJ = 25°C 900 Crss Ciss 600 300 Coss Crss 0 10 5 0 −VGS −VDS 5 10 15 20 5 20 18 QT 16 4 14 3 10 Q2 8 2 6 1 ID = −3.3 A TJ = 25°C VDS 2 0 0 2 4 6 8 12 10 Figure 8. Gate−to−Source and Drain−to−Source Voltage vs. Total Charge 1000 100 td (off) VDD = −10 V ID = −1.2 A VGS = −2.7 V t, TIME (ns) tr tr tf td (on) 10 tf td (off) VDD = −10 V ID = −3.3 A VGS = −4.5 V td (on) 1.0 10 10 1.0 14 Qg, TOTAL GATE CHARGE (nC) Figure 7. Capacitance Variation 100 4 0 GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS) t, TIME (ns) 12 VGS Q1 100 RG, GATE RESISTANCE (W) 1.0 10 RG, GATE RESISTANCE (W) Figure 9. Resistive Switching Time Variation vs. Gate Resistance Figure 10. Resistive Switching Time Variation vs. Gate Resistance 100 −IS, SOURCE CURRENT (AMPS) 2 1.6 VGS = 0 V TJ = 25°C di/dt IS trr 1.2 ta tb TIME 0.8 0.25 IS tp IS 0.4 0 0.4 0.5 0.6 0.7 −VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) 1500 −VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) TYPICAL ELECTRICAL CHARACTERISTICS 0.8 0.9 1 Figure 12. Diode Reverse Recovery Waveform −VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS) Figure 11. Diode Forward Voltage vs. Current http://onsemi.com 5 NTTD4401F Rthja(t), EFFECTIVE TRANSIENT THERMAL RESPONSE 1 D = 0.5 0.2 0.1 Normalized to R∅ja at Steady State (1 inch pad) 0.1 0.0125 W 0.0563 W 0.110 W 0.273 W 0.113 W 0.436 W 2.93 F 152 F 261 F 0.05 0.02 0.01 0.021 F 0.137 F 1.15 F Single Pulse 0.01 1E−03 1E−02 1E−01 1E+00 1E+03 1E+02 1E+03 t, TIME (s) Figure 13. FET Thermal Response 10 IF, INSTANTANEOUS FORWARD CURRENT (AMPS) IF, INSTANTANEOUS FORWARD CURRENT (AMPS) TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS TJ = 125°C 1.0 85°C 25°C −40 °C 0.1 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 10 TJ = 125°C 85°C 1.0 25°C 0.1 0 VF, INSTANTANEOUS FORWARD VOLTAGE (VOLTS) 0.2 0.4 0.6 0.8 1.0 1.2 VF, MAXIMUM INSTANTANEOUS FORWARD VOLTAGE (VOLTS) Figure 14. Typical Forward Voltage Figure 15. Maximum Forward Voltage http://onsemi.com 6 1.4 NTTD4401F TYPICAL SCHOTTKY ELECTRICAL CHARACTERISTICS IR, MAXIMUM REVERSE CURRENT (AMPS) IR, REVERSE CURRENT (AMPS) 1E−2 TJ = 125°C 1E−3 85°C 1E−4 1E−5 25°C 1E−6 1E−7 1E−1 TJ = 125°C 1E−2 1E−3 1E−4 25°C 1E−5 1E−6 0 5.0 10 15 20 5.0 0 VR, REVERSE VOLTAGE (VOLTS) IO , AVERAGE FORWARD CURRENT (AMPS) C, CAPACITANCE (pF) TYPICAL CAPACITANCE AT 0 V = 170 pF 100 10 15 10 20 1.6 dc 1.2 SQUARE WAVE 1.0 Ipk/Io = p 0.8 Ipk/Io = 5.0 0.6 Ipk/Io = 10 0.4 Ipk/Io = 20 0.2 0 0 20 40 60 0.6 dc SQUARE WAVE Ipk/Io = p Ipk/Io = 5.0 Ipk/Io = 10 0.3 Ipk/Io = 20 0.2 0.1 0 0 100 120 Figure 19. Current Derating 0.7 0.4 80 TA, AMBIENT TEMPERATURE (°C) Figure 18. Typical Capacitance PFO , AVERAGE POWER DISSIPATION (WATTS) FREQ = 20 kHz 1.4 VR, REVERSE VOLTAGE (VOLTS) 0.5 20 Figure 17. Maximum Reverse Current 1000 5.0 15 VR, REVERSE VOLTAGE (VOLTS) Figure 16. Typical Reverse Current 0 10 0.5 1.0 1.5 IO, AVERAGE FORWARD CURRENT (AMPS) Figure 20. Forward Power Dissipation FETKY and Micro8 are registered trademarks of International Rectifier Corporation. http://onsemi.com 7 2.0 140 160 MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS Micro8 CASE 846A−02 ISSUE K DATE 16 JUL 2020 SCALE 2:1 GENERIC MARKING DIAGRAM* 8 XXXX AYWG G 1 XXXX A Y W G = Specific Device Code = Assembly Location = Year = Work Week = Pb−Free Package (Note: Microdot may be in either location) *This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G” or microdot “G”, may or may not be present. Some products may not follow the Generic Marking. DOCUMENT NUMBER: DESCRIPTION: 98ASB14087C MICRO8 STYLE 1: PIN 1. 2. 3. 4. 5. 6. 7. 8. SOURCE SOURCE SOURCE GATE DRAIN DRAIN DRAIN DRAIN STYLE 2: PIN 1. 2. 3. 4. 5. 6. 7. 8. SOURCE 1 GATE 1 SOURCE 2 GATE 2 DRAIN 2 DRAIN 2 DRAIN 1 DRAIN 1 STYLE 3: PIN 1. 2. 3. 4. 5. 6. 7. 8. N-SOURCE N-GATE P-SOURCE P-GATE P-DRAIN P-DRAIN N-DRAIN N-DRAIN Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 1 OF 1 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com onsemi, , and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of onsemi’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. onsemi reserves the right to make changes at any time to any products or information herein, without notice. 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