NTTFS4928N
MOSFET – Power, Single,
N-Channel, m8FL
30 V, 37 A
Features
•
•
•
•
Low RDS(on) to Minimize Conduction Losses
Low Capacitance to Minimize Driver Losses
Optimized Gate Charge to Minimize Switching Losses
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
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V(BR)DSS
RDS(on) MAX
ID MAX
9.0 mW @ 10 V
30 V
37 A
13.5 mW @ 4.5 V
Applications
•
•
•
•
DC−DC Converters
Power Load Switch
Notebook Battery Management
Motor Control
N−Channel MOSFET
D (5−8)
MAXIMUM RATINGS (TJ = 25°C unless otherwise stated)
Parameter
Symbol
Value
Unit
Drain−to−Source Voltage
VDSS
30
V
Gate−to−Source Voltage
VGS
±20
V
ID
11.8
A
Continuous Drain
Current RqJA (Note 1)
TA = 25°C
Power Dissipation RqJA
(Note 1)
TA = 25°C
PD
2.12
Continuous Drain
Current RqJA ≤ 10 s
(Note 1)
TA = 25°C
ID
15.9
Power Dissipation
RqJA ≤ 10 s (Note 1)
Continuous Drain
Current RqJA (Note 2)
TA = 85°C
W
A
11.5
TA = 25°C
PD
3.86
W
TA = 25°C
ID
7.3
A
TA = 85°C
5.2
Power Dissipation
RqJA (Note 2)
TA = 25°C
PD
0.81
W
Continuous Drain
Current RqJC (Note 1)
TC = 25°C
ID
37
A
Power Dissipation
RqJC (Note 1)
TC = 25°C
PD
20.8
W
TA = 25°C, tp = 10 ms
IDM
160
A
TJ,
Tstg
−55 to
+150
°C
Pulsed Drain Current
TC = 85°C
Operating Junction and Storage Temperature
Source Current (Body Diode)
Drain to Source dV/dt
© Semiconductor Components Industries, LLC, 2012
June, 2019 − Rev. 2
S (1,2,3)
MARKING DIAGRAM
8.5
TA = 85°C
Steady
State
G (4)
1
S
S
S
G
1
WDFN8
(m8FL)
CASE 511AB
4928
A
Y
WW
G
4928
AYWWG
G
D
D
D
D
= Specific Device Code
= Assembly Location
= Year
= Work Week
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
27
IS
20
A
dV/dt
6.0
V/ns
1
Device
Package
Shipping†
NTTFS4928NTAG
WDFN8
(Pb−Free)
1500 / Tape &
Reel
NTTFS4928NTWG
WDFN8
(Pb−Free)
5000 / Tape &
Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
Publication Order Number:
NTTFS4928N/D
NTTFS4928N
MAXIMUM RATINGS (TJ = 25°C unless otherwise stated)
Parameter
Symbol
Value
Unit
Single Pulse Drain−to−Source Avalanche Energy
(TJ = 25°C, VDD = 50 V, VGS = 10 V,
IL = 20 Apk, L = 0.1 mH, RG = 25 W)
EAS
20
mJ
TL
260
°C
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s)
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. Surface−mounted on FR4 board using 1 sq−in pad, 1 oz Cu.
2. Surface−mounted on FR4 board using the minimum recommended pad size.
THERMAL RESISTANCE MAXIMUM RATINGS
Symbol
Value
Unit
Junction−to−Case (Drain)
Parameter
RqJC
6
°C/W
Junction−to−Ambient – Steady State (Note 3)
RqJA
59.1
Junction−to−Ambient – Steady State (Note 4)
RqJA
154.5
Junction−to−Ambient – (t ≤ 10 s) (Note 3)
RqJA
32.4
3. Surface−mounted on FR4 board using 1 sq−in pad, 1 oz Cu.
4. Surface−mounted on FR4 board using the minimum recommended pad size (40 mm2, 1 oz. Cu).
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified)
Parameter
Symbol
Test Condition
Min
Drain−to−Source Breakdown Voltage
V(BR)DSS
VGS = 0 V, ID = 250 mA
30
Drain−to−Source Breakdown Voltage
Temperature Coefficient
V(BR)DSS/TJ
Typ
Max
Unit
OFF CHARACTERISTICS
Zero Gate Voltage Drain Current
Gate−to−Source Leakage Current
IDSS
V
24
VGS = 0 V,
VDS = 24 V
mV/°C
TJ = 25°C
1.0
TJ = 125°C
10
IGSS
VDS = 0 V, VGS = ±20 V
VGS(TH)
VGS = VDS, ID = 250 mA
mA
±100
nA
2.2
V
ON CHARACTERISTICS (Note 5)
Gate Threshold Voltage
Negative Threshold Temperature
Coefficient
VGS(TH)/TJ
Drain−to−Source On Resistance
RDS(on)
gFS
1.6
3.7
VGS = 10 V
VGS = 4.5 V
Forward Transconductance
1.2
ID = 20 A
5.4
ID = 10 A
5.3
ID = 20 A
8.9
ID = 10 A
8.5
VDS = 1.5 V, ID = 15 A
mV/°C
9.0
mW
13.5
40
S
913
pF
CHARGES AND CAPACITANCES
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
108
Total Gate Charge
QG(TOT)
8.0
Threshold Gate Charge
QG(TH)
Gate−to−Source Charge
QGS
Gate−to−Drain Charge
QGD
VGS = 0 V, f = 1.0 MHz, VDS = 15 V
VGS = 4.5 V, VDS = 15 V, ID = 20 A
366
1.6
3.1
3.1
5. Pulse Test: pulse width = 300 ms, duty cycle v 2%.
6. Switching characteristics are independent of operating junction temperatures.
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2
nC
NTTFS4928N
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified)
Parameter
Symbol
Test Condition
QG(TOT)
VGS = 10 V, VDS = 15 V, ID = 20 A
Min
Typ
Max
Unit
CHARGES AND CAPACITANCES
Total Gate Charge
16
nC
9.2
ns
SWITCHING CHARACTERISTICS (Note 6)
Turn−On Delay Time
Rise Time
Turn−Off Delay Time
Fall Time
Turn−On Delay Time
Rise Time
Turn−Off Delay Time
Fall Time
td(on)
tr
td(off)
VGS = 4.5 V, VDS = 15 V,
ID = 15 A, RG = 3.0 W
25.5
14
tf
4.4
td(on)
6.5
tr
td(off)
VGS = 10 V, VDS = 15 V,
ID = 15 A, RG = 3.0 W
tf
ns
21
18
3.0
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode Voltage
Reverse Recovery Time
VSD
TJ = 25°C
0.87
TJ = 125°C
0.76
tRR
Charge Time
ta
Discharge Time
tb
Reverse Recovery Charge
VGS = 0 V,
IS = 20 A
21.4
VGS = 0 V, dIS/dt = 100 A/ms,
IS = 20 A
1.1
V
ns
10.5
10.9
QRR
8.4
nC
Source Inductance
LS
0.38
nH
Drain Inductance
LD
Gate Inductance
LG
Gate Resistance
RG
PACKAGE PARASITIC VALUES
TA = 25°C
0.054
1.3
0.9
5. Pulse Test: pulse width = 300 ms, duty cycle v 2%.
6. Switching characteristics are independent of operating junction temperatures.
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3
W
NTTFS4928N
TYPICAL CHARACTERISTICS
4.5 V
TJ = 25°C
ID, DRAIN CURRENT (A)
80
4.0 V
60
3.5 V
50
40
3.0 V
30
20
VGS = 2.5 V
0
1
2
3
4
30
20
1
2
3
4
5
0.011
0.010
0.009
0.008
0.007
0.006
4
5
6
7
8
9
10
RDS(on), DRAIN−TO−SOURCE RESISTANCE (W)
Figure 2. Transfer Characteristics
0.012
0.019
T = 25°C
0.017
0.015
0.013
VGS = 4.5 V
0.011
0.009
0.007
VGS = 10 V
0.005
0.003
10
20
30
50
40
60
70
80
90 100
VGS (V)
ID, DRAIN CURRENT (A)
Figure 3. On−Resistance vs. VGS
Figure 4. On−Resistance vs. Drain Current and
Gate Voltage
10,000
1.7
ID = 20 A
VGS = 10 V
TJ = 150°C
IDSS, LEAKAGE (nA)
RDS(on), DRAIN−TO−SOURCE
RESISTANCE (NORMALIZED)
50
40
Figure 1. On−Region Characteristics
0.013
1.5
TJ = 125°C
VDS = 10 V
60
VGS, GATE−TO−SOURCE VOLTAGE (V)
ID = 20 A
1.6
TJ = 25°C
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
0.014
3
80
70
10
0
5
0.015
0.005
0.004
TJ = −55°C
90
70
10
0
RDS(on), DRAIN−TO−SOURCE RESISTANCE (W)
100
10 V
90
ID, DRAIN CURRENT (A)
100
1.4
1.3
1.2
1.1
1.0
0.9
TJ = 125°C
1,000
100
TJ = 85°C
0.8
0.7
0.6
−50
−25
0
25
50
75
100
125
150
10
VGS = 0 V
5
10
15
20
25
TJ, JUNCTION TEMPERATURE (°C)
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 5. On−Resistance Variation with
Temperature
Figure 6. Drain−to−Source Leakage Current
vs. Voltage
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4
30
NTTFS4928N
TYPICAL CHARACTERISTICS
C, CAPACITANCE (pF)
TJ = 25°C
VGS = 0 V
Ciss
1000
VGS, GATE−TO−SOURCE VOLTAGE (V)
1200
800
600
Coss
400
Crss
200
0
0
5
10
15
20
25
30
7
6
5
Qgd
Qgs
4
TJ = 25°C
3
VGS = 10 V
VDD = 15 V
ID = 20 A
2
1
0
0
2
4
6
8
10
12
14
Figure 7. Capacitance Variation
Figure 8. Gate−to−Source and
Drain−to−Source Voltage vs. Total Charge
VGS = 10 V
VDD = 15 V
ID = 15 A
IS, SOURCE CURRENT (A)
t, TIME (ns)
8
Qg, TOTAL GATE CHARGE (nC)
td(off)
tf
tr
td(on)
10
1
10
16
VGS = 0 V
25
TJ = 25°C
20
15
10
5
0
100
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
RG, GATE RESISTANCE (W)
VSD, SOURCE−TO−DRAIN VOLTAGE (V)
Figure 9. Resistive Switching Time Variation
vs. Gate Resistance
Figure 10. Diode Forward Voltage vs. Current
0 V < VGS < 20 V
Single Pulse
TC = 25°C
10 ms
100 ms
10
1 ms
10 ms
1
0.1
RDS(on) Limit
Thermal Limit
Package Limit
0.01
0.1
dc
1
10
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
EAS, SINGLE PULSE DRAIN−TO−
SOURCE AVALANCHE ENERGY (mJ)
1000
ID, DRAIN CURRENT (A)
QT
9
30
100
100
10
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
1000
1
11
100
22
ID = 20 A
20
18
16
14
12
10
8
6
4
2
0
25
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
50
75
100
125
TJ, STARTING JUNCTION TEMPERATURE (°C)
Figure 12. Maximum Avalanche Energy vs.
Starting Junction Temperature
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5
1.0
15
NTTFS4928N
TYPICAL CHARACTERISTICS
100
D = 0.5
r(t)
(°C/W)
10
1
0.2
0.1
0.05
0.02
0.01
0.1
SINGLE PULSE
0.01
0.000001
0.00001
0.0001
0.001
0.01
0.1
t, TIME (s)
Figure 13. Thermal Response
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6
1
10
100
1000
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
WDFN8 3.3x3.3, 0.65P
CASE 511AB
ISSUE D
1
SCALE 2:1
DATE 23 APR 2012
2X
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION D1 AND E1 DO NOT INCLUDE MOLD FLASH
PROTRUSIONS OR GATE BURRS.
0.20 C
D
A
D1
B
2X
0.20 C
8 7 6 5
4X
E1 E
q
c
1 2 3 4
A1
TOP VIEW
0.10 C
A
e
SIDE VIEW
0.10
8X b
C A B
0.05
C
4X
DETAIL A
8X
e/2
1
0.42
4
INCHES
NOM
0.030
−−−
0.012
0.008
0.130 BSC
0.116
0.120
0.078
0.083
0.130 BSC
0.116
0.120
0.058
0.063
0.009
0.012
0.026 BSC
0.012
0.016
0.026
0.032
0.012
0.017
0.002
0.005
0.055
0.059
0_
−−−
MIN
0.028
0.000
0.009
0.006
MAX
0.031
0.002
0.016
0.010
0.124
0.088
0.124
0.068
0.016
0.020
0.037
0.022
0.008
0.063
12 _
0.65
PITCH
PACKAGE
OUTLINE
4X
0.66
M
E3
8
5
D2
BOTTOM VIEW
1
3.60
L1
GENERIC
MARKING DIAGRAM*
XXXXX
A
Y
WW
G
MILLIMETERS
MIN
NOM
MAX
0.70
0.75
0.80
0.00
−−−
0.05
0.23
0.30
0.40
0.15
0.20
0.25
3.30 BSC
2.95
3.05
3.15
1.98
2.11
2.24
3.30 BSC
2.95
3.05
3.15
1.47
1.60
1.73
0.23
0.30
0.40
0.65 BSC
0.30
0.41
0.51
0.65
0.80
0.95
0.30
0.43
0.56
0.06
0.13
0.20
1.40
1.50
1.60
0_
−−−
12 _
SOLDERING FOOTPRINT*
L
G
SEATING
PLANE
DETAIL A
K
E2
C
6X
0.10 C
DIM
A
A1
b
c
D
D1
D2
E
E1
E2
E3
e
G
K
L
L1
M
q
XXXXX
AYWWG
G
0.75
2.30
0.57
0.47
2.37
3.46
DIMENSION: MILLIMETERS
= Specific Device Code
= Assembly Location
= Year
= Work Week
= Pb−Free Package
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
*This information is generic. Please refer
to device data sheet for actual part
marking.
Pb−Free indicator, “G” or microdot “ G”,
may or may not be present.
DOCUMENT NUMBER:
DESCRIPTION:
98AON30561E
WDFN8 3.3X3.3, 0.65P
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 1
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