NUF4402MN

NUF4402MN Low Capacitance 4 Line EMI Filter with ESD Protection in DFN8 1.6 x 1.6 mm Package This device is a 4 line EMI filter array for wireless applications. Greater than −25 dB attenuation is obtained at frequencies from 800 MHz to 3.0 GHz. It also offers ESD protection−clamping transients from static discharges. ESD protection is provided across all capacitors. Features http://onsemi.com 1 Cd Cd 8 2 Cd Cd 7 • EMI Filtering and ESD Protection • Integration of 20 Discrete Components • Compliance with IEC61000−4−2 (Level 4) • • • • >14 kV (Contact) DFN Package, 1.6 x 1.6 mm Moisture Sensitivity Level 1 ESD Ratings: Machine Model = C Human Body Model = 3B This is a Pb−Free Device* 3 Cd Cd 6 4 Cd Cd 5 (Top View) MARKING DIAGRAM DFN8 CASE 506AK 1 F2 MG G Benefits • Reduces EMI/RFI Emmisions on a Data Line • Integrated Solution Offers Cost and Space Savings • Reduces Parasitic Inductances Which Offer a More “Ideal” Low Pass • • • • • • Filter Response Integrated Solution Improves System Reliability 1 8 F2 = Specific Device Code M = Month Code G = Pb−Free Package (Note: Microdot may be in either location) Applications PIN CONNECTIONS 8 GND 7 6 5 (Bottom View) 1 2 3 4 EMI Filtering and ESD Protection for Data Lines Wireless Phones Handheld Products Notebook Computers LCD Displays ORDERING INFORMATION Device NUF4402MNT1G Package DFN8 (Pb−Free) Shipping† 3000 / Tape & Reel *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. © Semiconductor Components Industries, LLC, 2005 1 June, 2005 − Rev. 2 Publication Order Number: NUF4402MN/D NUF4402MN MAXIMUM RATINGS Parameter ESD Discharge IEC61000−4−2 Contact Discharge Machine Model Human Body Model Operating Temperature Range Storage Temperature Range Maximum Lead Temperature for Soldering Purposes (1.8 in from case for 10 seconds) TOP TSTG TL Symbol VPP 14 0.4 8.0 −40 to 85 −55 to 150 260 °C °C °C Value Unit kV Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected. ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Parameter Maximum Reverse Working Voltage Breakdown Voltage Leakage Current Resistance Capacitance (Notes 1 and 2) Cut−Off Frequency (Note 3) Symbol VRWM VBR IR RA Cd f3dB IR = 1.0 mA VRWM = 3.3 V IR = 10 mA VR = 2.5 V, f = 1.0 MHz Above this frequency, appreciable attenuation occurs 85 10 100 12 151 6.0 7.0 Test Conditions Min Typ Max 5.0 8.0 100 115 15 Unit V V nA W pF MHz 1. Measured at 25°C. 2. Total Line Capacitance is two times the Diode Capacitance (Cd). 3. 50 W source and 50 W load termination. http://onsemi.com 2 NUF4402MN TYPICAL PERFORMANCE CURVES (TA= 25°C unless otherwise specified) 0 −5 −10 −15 S21 (dB) −20 −25 Channel 1 −30 −35 −40 −45 1.0E+6 10.0E+6 100E+6 FREQUENCY (Hz) Channel 4 Channel 2 Channel 3 1.0e+9 10.0E+9 S21 (dB) 0 −5 −10 −15 −20 −25 Channel 1 to 2 −30 −35 −40 −45 1.0E+6 10.0E+6 100E+6 FREQUENCY (Hz) 1.0e+9 10.0E+9 Channel 3 to 4 Channel 2 to 3 Figure 1. Insertion Loss Characteristic Figure 2. Insertion Loss Characteristic 2.0 NORMALIZED CAPACITANCE 110 108 106 RESISTANCE (W) 1.5 104 102 100 98 96 94 92 1.0 0.5 0 0 1.0 2.0 3.0 4.0 5.0 90 −40 −20 0 20 40 60 80 REVERSE VOLTAGE (V) TEMPERATURE (°C) Figure 3. Typical Capacitance vs. Reverse Biased Voltage (Normalized Capacitance Cd at 2.5 V) Figure 4. Typical Resistance over Temperature http://onsemi.com 3 NUF4402MN PACKAGE DIMENSIONS DFN8 CASE 506AK−01 ISSUE A NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: INCHES. 3. DIMENSION b APPLIES TO THE EXPOSED PAD AS WELL AS TEH TERMINALS. 4. DIMENSION b APPLIES TO THE EXPOSED PAD AS WELL AS THE TERMINALS. 5. EXPOSED PADS CONNECTED TO DIE FLAG. USED AS TEST CONTACTS. MILLIMETERS MIN MAX 0.80 1.00 0.00 0.05 0.20 REF 0.15 0.25 1.60 BSC 0.70 0.90 1.60 BSC 0.30 0.50 0.40 BSC 0.20 −−− 0.20 0.40 D A B PIN ONE REFERENCE 2X 0.15 C 2X 0.15 C 0.10 C 8X 0.08 C 8X L 8X K ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor P.O. Box 61312, Phoenix, Arizona 85082−1312 USA Phone: 480−829−7710 or 800−344−3860 Toll Free USA/Canada Fax: 480−829−7709 or 800−344−3867 Toll Free USA/Canada Email: orderlit@onsemi.com N. American Technical Support: 800−282−9855 Toll Free USA/Canada Japan: ON Semiconductor, Japan Customer Focus Center 2−9−1 Kamimeguro, Meguro−ku, Tokyo, Japan 153−0051 Phone: 81−3−5773−3850 ON Semiconductor Website: http://onsemi.com Order Literature: http://www.onsemi.com/litorder For additional information, please contact your local Sales Representative. ÉÉÉÉ ÉÉÉÉ ÉÉÉÉ ÉÉÉÉ D2 1 e 8 E DIM A A1 A3 b D D2 E E2 e K L TOP VIEW (A3) (A3) A SEATING PLANE SIDE VIEW A1 C 4 2X 0.25X0.4 MM NOTE 5 E2 5 8X b 0.10 C A B 0.05 C NOTE 3 BOTTOM VIEW http://onsemi.com 4 NUF4402MN/D