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or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application
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Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. Other names and brands may be claimed as the property of others.
MOSFET – Power,
N‐Channel, SUPERFET III,
FRFET
650 V, 50 mW, 58 A
NVH050N65S3F
www.onsemi.com
Description
SUPERFET III MOSFET is ON Semiconductor’s brand−new high
voltage super−junction (SJ) MOSFET family that is utilizing charge
balance technology for outstanding low on-resistance and lower gate
charge performance. This advanced technology is tailored to minimize
conduction loss, provide superior switching performance, and
withstand extreme dv/dt rate.
Consequently, SUPERFET III MOSFET is very suitable for the
various power system for miniaturization and higher efficiency.
SUPERFET III FRFET MOSFET’s optimized reverse recovery
performance of body diode can remove additional component and
improve system reliability.
VDSS
RDS(ON) MAX
ID MAX
650 V
50 mW
58 A
D
G
Features
•
•
•
•
•
•
•
700 V @ TJ = 150°C
Typ. RDS(on) = 42 mW
Ultra Low Gate Charge (Typ. Qg = 121 nC)
Low Effective Output Capacitance (Typ. Coss(eff.) = 1119 pF)
100% Avalanche Tested
AEC−Q101 Qualified and PPAP Capable
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
S
G
D
S
TO−247−3LD
CASE 340CK
Applications
• Automotive On Board Charger HEV−EV
• Automotive DC/DC Converter HEV−EV
MARKING DIAGRAM
$Y&Z&3&K
NVH
050N65S3F
$Y
&Z
&3
&K
NVH050N65S3F
= ON Semiconductor Logo
= Assembly Plant Code
= Data Code (Year & Week)
= Lot
= Specific Device Code
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
© Semiconductor Components Industries, LLC, 2020
October, 2020 − Rev. 0
1
Publication Order Number:
NVH050N65S3F/D
NVH050N65S3F
ABSOLUTE MAXIMUM RATINGS (TC = 25°C, Unless otherwise noted)
Symbol
Parameter
VDSS
Drain to Source Voltage
VGSS
Gate to Source Voltage
ID
Drain Current
Value
Unit
650
V
− DC
±30
V
− AC (f > 1 Hz)
±30
− Continuous (TC = 25°C)
58
− Continuous (TC = 100°C)
36
− Pulsed (Note 1)
A
IDM
Drain Current
145
A
EAS
Single Pulsed Avalanche Energy (Note 2)
830
mJ
IAS
Avalanche Current (Note 2)
7.5
A
EAR
Repetitive Avalanche Energy (Note 1)
4.03
mJ
dv/dt
MOSFET dv/dt
100
V/ns
Peak Diode Recovery dv/dt (Note 3)
50
PD
Power Dissipation
TJ, TSTG
TL
(TC = 25°C)
403
W
− Derate Above 25°C
3.23
W/°C
−55 to +150
°C
300
°C
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering, 1/8″ from Case for 5 seconds
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Repetitive rating: pulse−width limited by maximum junction temperature.
2. IAS = 7.5 A, RG = 25 W, starting TJ = 25°C.
3. ISD ≤ 29 A, di/dt ≤ 200 A/ms, VDD ≤ 400 V, starting TJ = 25°C.
THERMAL CHARACTERISTICS
Symbol
Parameter
RqJC
Thermal Resistance, Junction to Case, Max.
RqJA
Thermal Resistance, Junction to Ambient, Max.
Value
Unit
0.31
_C/W
40
PACKAGE MARKING AND ORDERING INFORMATION
Part Number
Top Marking
Package
Packing Method
Reel Size
Tape Width
Quantity
NVH050N65S3F
NVH050N65S3F
TO−247
Tube
N/A
N/A
30 Units
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2
NVH050N65S3F
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)
Parameter
Symbol
Test Conditions
Min
Typ
Max
Unit
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage
BVDSS
VGS = 0 V, ID = 1 mA, TJ = 25°C
650
V
Drain−to−Source Breakdown Voltage
BVDSS
VGS = 0 V, ID = 1 mA, TJ = 150°C
700
V
Breakdown Voltage Temperature
Coefficient
DBVDSS/
DTJ
ID = 10 mA, Referenced to 25_C
Zero Gate Voltage Drain Current
IDSS
VGS = 0 V, VDS = 650 V
Gate−to−Body Leakage Current
IGSS
VGS = ±30 V, VDS = 0 V
VGS(th)
VGS = VDS, ID = 1.7 mA
DVGS(th)/DTJ
VGS = VDS, ID = 1.7 mA
−8
RDS(on)
VGS = 10 V, ID = 29 A
42
gFS
VDS = 20 V, ID = 29 A
32.8
S
5404
pF
640
mV/_C
10
mA
±100
nA
5.0
V
19
VDS = 520 V, TC = 125_C
ON CHARACTERISTICS
Gate Threshold Voltage
Threshold Temperature Coefficient
Static Drain−to−Source On Resistance
Forward Transconductance
3.0
mV/_C
50
mW
DYNAMIC CHARACTERISTICS
Input Capacitance
Ciss
Output Capacitance
Coss
VGS = 0 V, VDS = 400 V, f = 1 MHz
110
Reverse Transfer Capacitance
Crss
Effective Output Capacitance
Coss(eff.)
VDS = 0 V to 400 V, VGS = 0 V
1119
pF
Energy Related Output Capacitance
Coss(er.)
VDS = 0 V to 400 V, VGS = 0 V
198
pF
Total Gate Charge at 10 V
QG(TOT)
123
nC
Threshold Gate Charge
QG(TH)
VGS = 10 V, VDS = 400 V, ID = 29 A
(Note 4)
22.9
Gate−to−Source Gate Charge
QGS
Gate−to−Drain “Miller” Charge
QGD
Equivalent Series Resistance
ESR
13
39.5
51.4
f = 1 MHz
1.7
W
38
ns
47
ns
87
ns
6
ns
SWITCHING CHARACTERISTICS
Turn-On Delay Time
td(on)
Turn-On Rise Time
tr
Turn-Off Delay Time
td(off)
Turn-Off Fall Time
VGS = 10 V, VDD = 400 V,
ID = 29 A, Rg = 2.2 W
(Note 4)
tf
SOURCE−DRAIN DIODE CHARACTERISTICS
Maximum Continuous Source−to−
Drain Diode Forward Current
IS
Maximum Pulsed Source−to−Drain
Diode Forward Current
ISM
Source−to−Drain Diode Forward
Voltage
VSD
Reverse Recovery Time
trr
Charge Time
ta
Discharge Time
tb
Reverse Recovery Charge
Qrr
VGS = 0 V
VGS = 0 V
VGS = 0 V, ISD = 29 A
133
VGS = 0 V, dIF/dt = 100 A/ms,
ISD = 29 A
58
A
145
A
1.3
V
ns
106
27
603
nC
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
4. Essentially independent of operating temperature typical characteristics.
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3
NVH050N65S3F
TYPICAL CHARACTERISTICS
200
200
VGS = 10 V
8.0 V
5.5 V
10
200
5.5 V
10
1
0.2
VDS, DRAIN−SOURCE VOLTAGE (V)
Figure 1. On−Region Characteristics
Figure 2. On−Region Characteristics
TJ = 150°C
10
TJ = −55°C
3
4
5
6
7
8
VGS, GATE−TO−SOURCE VOLTAGE (V)
80
TC = 25°C
60
VGS = 10 V
40
20
VGS = 20 V
0
40
60
80
100
120
140
160 180
Figure 4. On−Resistance Variation vs. Drain
Current and Gate Voltage
100K
1000
250 ms Pulse Test
100 VGS = 0 V
10
10K
CAPACITANCE (pF)
IS, REVERSE DRAIN CURRENT (A)
20
ID, DRAIN CURRENT (A)
Figure 3. Transfer Characteristics
TJ = 150°C
1
TJ = 25°C
0.1
Ciss
1K
Coss
100
10
0.01
0.001
20
2.0
VDS, DRAIN−SOURCE VOLTAGE (V)
TJ = 25°C
1
6.0 V
20
2.0
VGS = 10 V
8.0 V
7.0 V
6.5 V
250 ms Pulse Test
TC = 25°C
250 ms Pulse Test
VDS = 20 V
100
ID, DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
6.0 V
1
0.2
250 ms Pulse Test
TC = 150°C
100
7.0 V
6.5 V
RDS(ON), DRAIN−SOURCE ON−RESISTANCE (W)
ID, DRAIN CURRENT (A)
100
TJ = −55°C
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
1
2.0
f = 1 MHz
VGS = 0 V
0.1
Crss
1
10
100
VSD, BODY DIODE FORWARD VOLTAGE (V)
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 5. Body Diode Forward Voltage
Variation vs. Source Current and Temperature
Figure 6. Capacitance Characteristics
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4
NVH050N65S3F
VDD = 130 V
ID = 29 A
8
VDD = 400 V
6
4
2
0
0
3.0
52
26
104
78
130
1.1
1.0
0.9
0.8
−75 −50 −25
0
25
50
100 125 150 175
75
Figure 7. Gate Charge Characteristics
Figure 8. Breakdown Voltage Variation vs.
Temperature
200
100
2.0
1.5
1.0
0.5
0
−75 −50
−25
0
25
50
75
100
125 150
100 ms
10
1 ms
10 ms
Operation in this Area
is Limited by RDS(ON)
1
100 ms
0.1
0.01
175
TC = 25°C
TJ = 150°C
Single Pulse
1
10
100
1K
TJ, JUNCTION TEMPERATURE (°C)
VDS, DRAIN−SOURCE VOLTAGE (V)
Figure 9. On−Resistance Variation vs.
Temperature
Figure 10. Maximum Safe Operating Area
70
30
60
24
50
Eoss (mJ)
ID, DRAIN CURRENT (A)
VGS = 0 V
ID = 10 mA
TJ, JUNCTION TEMPERATURE (°C)
VGS = 10 V
ID = 29 A
2.5
1.2
Qg, TOTAL GATE CHARGE (nC)
ID, DRAIN CURRENT (A)
RDS(ON), DRAIN−SOURCE ON−RESISTANCE (Normalized)
VGS, GATE−SOURCE VOLTAGE (V)
10
BVDSS, DRAIN−SOURCE
BREAKDOWN VOLTAGE (Normalized)
TYPICAL CHARACTERISTICS
40
30
18
12
20
6
10
0
25
50
75
100
125
0
150
0
100
200
300
400
500
600
TC, CASE TEMPERATURE (°C)
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 11. Maximum Drain Current vs. Case
Temperature
Figure 12. EOSS vs. Drain−to−Source Voltage
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5
NVH050N65S3F
250
1.2
NORMALIZED GATE THRESHOLD
VOLTAGE
RDS(ON), DRAIN−SOURCE ON−RESISTANCE (mW)
TYPICAL CHARACTERISTICS
200
150
TA = 150°C
100
50
0
TA = 25°C
Pulse Duration = 250 ms
Duty Cycle = 0.5% Max
ID = 29 A
5
6
7
8
9
VGS = VDS
ID = 1.7 mA
1.0
0.8
0.6
−80
10
−40
0
40
80
120
160
VGS, GATE−TO−SOURCE VOLTAGE (V)
TJ, JUNCTION TEMPERATURE (°C)
Figure 13. RDS(ON) vs. Gate Voltage
Figure 14. Normalized Gate Threshold Voltage
vs. Temperature
IAS AVALANCHE CURRENT (A)
100
10
TJ(initial) = 25°C
TJ(initial) = 100°C
1
1E−06
1E−05
1E−04
1E−03
1E−02
1E−01 1E+00
tAV, TIME IN AVALANCHE (sec)
r(t), NORMALIZED EFFECTIVE TRANSIENT
THERMAL RESISTANCE
Figure 15. Unclamped Inductive Switching
Capability
10
1
Duty Cycle = 0.5
0.2
0.1
0.1
0.05
0.02
PDM
0.01 0.01
t1
Single Pulse
0.001
0.00001
0.0001
0.001
t2
0.01
t, RECTANGULAR PULSE DURATION (s)
Figure 16. Transient Thermal Response Curve
SUPERFET and FRFET are registered trademarks of Semiconductor Components Industries, LLC.
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6
ZqJC(t) = r(t) x RqJC
RqJC = 0.31°C/W
Peak TJ = PDM x ZqJC(t) + TC
Duty Cycle, D = t1 / t2
0.1
1
NVH050N65S3F
PACKAGE DIMENSIONS
TO−247−3LD SHORT LEAD
CASE 340CK
ISSUE A
A
A
E
P1
P
A2
D2
Q
E2
S
B
D
1
2
D1
E1
2
3
L1
A1
L
b4
c
(3X) b
0.25 M
(2X) b2
B A M
DIM
(2X) e
A
A1
A2
b
b2
b4
c
D
D1
D2
E
E1
E2
e
L
L1
P
P1
Q
S
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7
MILLIMETERS
MIN NOM MAX
4.58 4.70 4.82
2.20 2.40 2.60
1.40 1.50 1.60
1.17 1.26 1.35
1.53 1.65 1.77
2.42 2.54 2.66
0.51 0.61 0.71
20.32 20.57 20.82
13.08
~
~
0.51 0.93 1.35
15.37 15.62 15.87
12.81
~
~
4.96 5.08 5.20
~
5.56
~
15.75 16.00 16.25
3.69 3.81 3.93
3.51 3.58 3.65
6.60 6.80 7.00
5.34 5.46 5.58
5.34 5.46 5.58
NVH050N65S3F
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
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