NVMFD5C668NL
MOSFET – Power, Dual
N-Channel
60 V, 6.5 mW, 68 A
Features
•
•
•
•
•
•
Small Footprint (5x6 mm) for Compact Design
Low RDS(on) to Minimize Conduction Losses
Low QG and Capacitance to Minimize Driver Losses
NVMFD5C668NLWF − Wettable Flank Option for Enhanced Optical
Inspection
AEC−Q101 Qualified and PPAP Capable
These Devices are Pb−Free and are RoHS Compliant
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V(BR)DSS
Unit
Drain−to−Source Voltage
VDSS
60
V
Gate−to−Source Voltage
VGS
±20
V
ID
68
A
Power Dissipation
RqJC (Notes 1, 2)
Continuous Drain
Current RqJA
(Notes 1, 2, 3)
Steady
State
TC = 100°C
TC = 25°C
TC = 100°C
TA = 25°C
Power Dissipation
RqJA (Notes 1 & 2)
Pulsed Drain Current
Steady
State
ID
D1 D1
PD
W
3.0
1.5
IDM
454
A
TJ, Tstg
−55 to
+ 175
°C
IS
48
A
Single Pulse Drain−to−Source Avalanche
Energy (TJ = 25°C, IL(pk) = 3.22 A)
EAS
205
mJ
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s)
TL
260
°C
TA = 25°C, tp = 10 ms
Source Current (Body Diode)
MARKING
DIAGRAM
A
15.5
11
TA = 100°C
Operating Junction and Storage Temperature
S2
S1
W
57.5
29
TA = 100°C
TA = 25°C
G2
G1
48
PD
68 A
D2
D1
Value
TC = 25°C
9.2 mW @ 4.5 V
Dual N−Channel
Symbol
Continuous Drain
Current RqJC
(Notes 1, 2, 3)
ID MAX
6.5 mW @ 10 V
60 V
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Parameter
RDS(ON) MAX
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
1
DFN8 5x6
(SO8FL)
CASE 506BT
S1
G1
S2
G2
XXXXXX
AYWZZ
D1
D1
D2
D2
D2 D2
XXXXXX = 5C668L (NVMFD5C668NL) or
668LWF (NVMFD5C668NLWF)
A
= Assembly Location
Y
= Year
W
= Work Week
ZZ
= Lot Traceability
ORDERING INFORMATION
See detailed ordering, marking and shipping information in the
package dimensions section on page 5 of this data sheet.
THERMAL RESISTANCE MAXIMUM RATINGS
Parameter
Symbol
Value
Unit
Junction−to−Case − Steady State
RqJC
2.6
°C/W
Junction−to−Ambient − Steady State (Note 2)
RqJA
50.26
1. The entire application environment impacts the thermal resistance values shown,
they are not constants and are only valid for the particular conditions noted.
2. Surface−mounted on FR4 board using a 650 mm2, 2 oz. Cu pad.
3. Maximum current for pulses as long as 1 second is higher but is dependent
on pulse duration and duty cycle.
© Semiconductor Components Industries, LLC, 2017
July, 2019 − Rev. 0
1
Publication Order Number:
NVMFD5C668NL/D
NVMFD5C668NL
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified)
Parameter
Symbol
Test Condition
Min
Drain−to−Source Breakdown Voltage
V(BR)DSS
VGS = 0 V, ID = 250 mA
60
Drain−to−Source Breakdown Voltage
Temperature Coefficient
V(BR)DSS/
TJ
Typ
Max
Unit
OFF CHARACTERISTICS
Zero Gate Voltage Drain Current
IDSS
Gate−to−Source Leakage Current
V
28
VGS = 0 V,
VDS = 60 V
mV/°C
TJ = 25°C
10
TJ = 125°C
250
IGSS
VDS = 0 V, VGS = 20 V
VGS(TH)
VGS = VDS, ID = 50 mA
100
mA
nA
ON CHARACTERISTICS (Note 4)
Gate Threshold Voltage
Negative Threshold Temperature Coefficient
VGS(TH)/TJ
Drain−to−Source On Resistance
Forward Transconductance
RDS(on)
1.2
2.0
−5.3
VGS = 10 V
ID = 20 A
5.4
6.5
VGS = 4.5 V
ID = 20 A
7.4
9.2
gFS
VDS = 15 V, ID = 20 A
V
mV/°C
61
mW
S
CHARGES, CAPACITANCES & GATE RESISTANCE
Input Capacitance
CISS
Output Capacitance
COSS
Reverse Transfer Capacitance
CRSS
1440
VGS = 0 V, f = 1 MHz, VDS = 25 V
800
pF
14
Total Gate Charge
QG(TOT)
VGS = 4.5 V, VDS = 48 V; ID = 20 A
9.8
Total Gate Charge
QG(TOT)
VGS = 10 V, VDS = 48 V; ID = 20 A
21.3
Threshold Gate Charge
QG(TH)
Gate−to−Source Charge
QGS
Gate−to−Drain Charge
QGD
Plateau Voltage
VGP
2.9
td(ON)
10
2.5
VGS = 10 V, VDS = 48 V; ID = 20 A
nC
4.3
2.1
V
SWITCHING CHARACTERISTICS (Note 5)
Turn−On Delay Time
Rise Time
Turn−Off Delay Time
Fall Time
tr
td(OFF)
VGS = 10 V, VDS = 48 V,
ID = 20 A, RG = 1.0 W
tf
22
ns
40
7.0
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode Voltage
Reverse Recovery Time
Charge Time
Discharge Time
Reverse Recovery Charge
VSD
VGS = 0 V,
IS = 20 A
TJ = 25°C
0.85
TJ = 125°C
0.73
tRR
ta
tb
1.2
V
42
VGS = 0 V, dIS/dt = 100 A/ms,
IS = 20 A
QRR
20
ns
22
32
nC
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
4. Pulse Test: pulse width v 300 ms, duty cycle v 2%.
5. Switching characteristics are independent of operating junction temperatures.
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2
NVMFD5C668NL
TYPICAL CHARACTERISTICS
70
35
10 V to 3.6 V
ID, DRAIN CURRENT (A)
50
3.2 V
40
3.0 V
30
2.8 V
20
25
20
15
5
0
0
0.2
0.4
0.6
0.8
1.0
1.2
1.6
1.4
1.8
2.0
TJ = 25°C
TJ = −55°C
0
4
5
Figure 2. Transfer Characteristics
12
10
8
6
4
2
4
3
5
6
7
9
8
10
VGS, GATE−TO−SOURCE VOLTAGE (V)
12
11
TJ = 25°C
10
9
8
7
VGS = 4.5 V
VGS = 10 V
6
5
4
3
2
1
0
10
15
25
20
30
35
40
45
50
ID, DRAIN CURRENT (A)
Figure 3. On−Resistance vs. Gate−to−Source
Voltage
Figure 4. On−Resistance vs. Drain Current and
Gate Voltage
100K
VGS = 10 V
ID = 20 A
IDSS, LEAKAGE (nA)
RDS(on), NORMALIZED DRAIN−TO−
SOURCE RESISTANCE
3
Figure 1. On−Region Characteristics
14
1.7
2
VGS, GATE−TO−SOURCE VOLTAGE (V)
TJ = 25°C
ID = 5 A
1.9
1
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
16
2
TJ = 125°C
10
10
0
VDS = 10 V
30
RDS(on), DRAIN−TO−SOURCE RESISTANCE (mW)
RDS(on), DRAIN−TO−SOURCE RESISTANCE (mW)
ID, DRAIN CURRENT (A)
60
1.5
1.3
1.1
TJ = 150°C
10K
TJ = 125°C
1K
TJ = 85°C
100
0.9
0.7
−50
−25
0
25
50
75
100
125
150
175
10
10
15
20
25
30
35
40
45
50
55
TJ, JUNCTION TEMPERATURE (°C)
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 5. On−Resistance Variation with
Temperature
Figure 6. Drain−to−Source Leakage Current
vs. Voltage
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3
60
NVMFD5C668NL
TYPICAL CHARACTERISTICS
VGS, GATE−TO−SOURCE VOLTAGE (V)
10000
C, CAPACITANCE (pF)
CISS
1000
COSS
100
10
CRSS
VGS = 0 V
TJ = 25°C
f = 1 MHz
1
0
20
10
30
40
50
60
10
9
8
7
6
5
QGS
4
3
VDS = 48 V
ID = 20 A
TJ = 25°C
2
1
0
0
20
t, TIME (ns)
IS, SOURCE CURRENT (A)
td(off)
tf
td(on)
10
VGS = 10 V
VDS = 48 V
1
25
20
Figure 8. Gate−to−Source Voltage vs. Total
Charge
tr
VGS = 0 V
16
14
12
10
8
6
4
TJ = 125°C
TJ = 25°C TJ = −55°C
2
0
0.5
10
0.6
0.7
0.8
0.9
1.0
RG, GATE RESISTANCE (W)
VSD, SOURCE−TO−DRAIN VOLTAGE (V)
Figure 9. Resistive Switching Time Variation
vs. Gate Resistance
Figure 10. Diode Forward Voltage vs. Current
100
1000
100
IPEAK, (A)
10
10
0.1
15
Figure 7. Capacitance Variation
100
1
10
QG, TOTAL GATE CHARGE (nC)
18
ID, DRAIN CURRENT (A)
5
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
1000
1
QGD
10 ms
TC = 25°C
VGS ≤ 10 V
Single Pulse
1
RDS(on) Limit
Thermal Limit
Package Limit
0.1
1
10
TJ (initial) = 25°C
TJ (initial) = 100°C
0.5 ms
1 ms
10 ms
100
0.1
0.00001
1000
0.0001
0.001
VDS, DRAIN−TO−SOURCE VOLTAGE(V)
TIME IN AVALANCHE (s)
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
Figure 12. IPEAK vs. Time in Avalanche
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4
0.01
NVMFD5C668NL
TYPICAL CHARACTERISTICS
100
50% Duty Cycle
RqJA (°C/W)
10
1
20%
10%
5%
2%
1%
0.1
Single Pulse
0.01
0.000001
0.00001
0.0001
0.001
0.01
0.1
1
10
100
1000
PULSE TIME (sec)
Figure 13. Thermal Characteristics
DEVICE ORDERING INFORMATION
Marking
Package
Shipping†
NVMFD5C668NLT1G
5C668L
DFN8
(Pb−Free)
1500 / Tape & Reel
NVMFD5C668NLWFT1G
668LWF
DFN8
(Pb−Free, Wettable Flanks)
1500 / Tape & Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
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5
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
DFN8 5x6, 1.27P Dual Flag (SO8FL−Dual)
CASE 506BT
ISSUE F
1
2X
SCALE 2:1
0.20 C
D
A
B
D1
8
7
6
ÉÉ
ÉÉ
ÉÉ
PIN ONE
IDENTIFIER
NOTE 7
1
2
2X
0.20 C
5
DATE 23 NOV 2021
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED
BETWEEN 0.15 AND 0.30 MM FROM THE TERMINAL TIP.
4. PROFILE TOLERANCE APPLIES TO THE EXPOSED PAD AS WELL
AS THE TERMINALS.
5. DIMENSIONS D1 AND E1 DO NOT INCLUDE MOLD FLASH,
PROTRUSIONS, OR GATE BURRS.
6. SEATING PLANE IS DEFINED BY THE TERMINALS. A1 IS DEFINED
AS THE DISTANCE FROM THE SEATING PLANE TO THE LOWEST
POINT ON THE PACKAGE BODY.
7. A VISUAL INDICATOR FOR PIN 1 MUST BE LOCATED IN THIS AREA.
E1 E
4X
h
3
4
c
TOP VIEW
A1
0.10 C
A
DETAIL B
0.10 C
NOTE 4
C
SIDE VIEW
DETAIL A
D2
D3
4X
e
1
SEATING
PLANE
NOTE 6
ALTERNATE
CONSTRUCTION
DETAIL A
L
K
4
DIM
A
A1
b
b1
c
D
D1
D2
D3
E
E1
E2
e
G
h
K
K1
L
M
N
MILLIMETERS
NOM
MIN
MAX
−−−
0.90
1.10
−−−
−−−
0.05
0.33
0.42
0.51
0.33
0.42
0.51
0.20
−−−
0.33
5.15 BSC
4.70
4.90
5.10
3.90
4.10
4.30
1.50
1.70
1.90
6.15 BSC
5.70
5.90
6.10
3.90
4.15
4.40
1.27 BSC
0.45
0.55
0.65
−−−
−−−
12 _
0.51
−−−
−−−
0.56
−−−
−−−
0.48
0.61
0.71
3.25
3.50
3.75
1.80
2.00
2.20
SOLDERING FOOTPRINT*
DETAIL B
4.56
M
4X
b1
N
4X
8
G
5
8X
2X
2X
2.08
8X
E2
0.75
0.56
b
K1
BOTTOM VIEW
0.10
C A B
0.05
C
GENERIC
MARKING DIAGRAM*
1
XXXXXX
AYWZZ
NOTE 3
4.84
4X
6.59
3.70
0.70
4X
XXXXXX = Specific Device Code
A
= Assembly Location
Y
= Year
W
= Work Week
ZZ
= Lot Traceability
1.40
2.30
1.00
1.27
PITCH
5.55
DIMENSION: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “G”, may
or may not be present. Some products may
not follow the Generic Marking.
DOCUMENT NUMBER:
DESCRIPTION:
98AON50417E
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
DFN8 5X6, 1.27P DUAL FLAG (SO8FL−DUAL)
PAGE 1 OF 1
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